WO2008123432A1 - 測定により場を取得する装置および方法 - Google Patents
測定により場を取得する装置および方法 Download PDFInfo
- Publication number
- WO2008123432A1 WO2008123432A1 PCT/JP2008/056137 JP2008056137W WO2008123432A1 WO 2008123432 A1 WO2008123432 A1 WO 2008123432A1 JP 2008056137 W JP2008056137 W JP 2008056137W WO 2008123432 A1 WO2008123432 A1 WO 2008123432A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- magnetic force
- tertiary
- expression
- tertiary field
- image
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/10—Plotting field distribution ; Measuring field distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/04—Display or data processing devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/50—MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/0206—Three-component magnetometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/038—Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices
- G01R33/0385—Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices in relation with magnetic force measurements
Abstract
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009509223A JP4878063B2 (ja) | 2007-03-30 | 2008-03-28 | 測定により場を取得する装置および方法 |
EP08739255A EP2141481B1 (en) | 2007-03-30 | 2008-03-28 | Device and method for acquiring a field by measurement |
US12/594,050 US8536862B2 (en) | 2007-03-30 | 2008-03-28 | Apparatus and method of obtaining field by measurement |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007091856 | 2007-03-30 | ||
JP2007-091856 | 2007-03-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008123432A1 true WO2008123432A1 (ja) | 2008-10-16 |
Family
ID=39830917
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/056137 WO2008123432A1 (ja) | 2007-03-30 | 2008-03-28 | 測定により場を取得する装置および方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8536862B2 (ja) |
EP (1) | EP2141481B1 (ja) |
JP (1) | JP4878063B2 (ja) |
KR (1) | KR101127682B1 (ja) |
WO (1) | WO2008123432A1 (ja) |
Cited By (13)
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WO2011108543A1 (ja) | 2010-03-01 | 2011-09-09 | 国立大学法人神戸大学 | ポテンシャル取得装置、磁場顕微鏡、検査装置およびポテンシャル取得方法 |
JP2012110470A (ja) * | 2010-11-24 | 2012-06-14 | Kobe Univ | 磁場分布取得装置 |
WO2012153496A1 (ja) | 2011-05-09 | 2012-11-15 | 国立大学法人神戸大学 | 分布解析装置 |
WO2014129151A1 (ja) | 2013-02-25 | 2014-08-28 | 国立大学法人神戸大学 | 分布解析装置および分布解析方法 |
CN105653880A (zh) * | 2016-03-03 | 2016-06-08 | 南京邮电大学 | 一种基于心音的心脏发声场溯源方法 |
WO2017187791A1 (ja) * | 2016-04-28 | 2017-11-02 | 国立大学法人神戸大学 | 計測装置および計測方法 |
US10254352B2 (en) | 2014-03-12 | 2019-04-09 | National University Corporation Kobe University | Conductivity distribution derivation method and conductivity distribution derivation device |
US11041826B2 (en) | 2015-11-16 | 2021-06-22 | National University Corporation Kobe University | Observation method and observation device |
CN113553743A (zh) * | 2021-07-29 | 2021-10-26 | 西安西电变压器有限责任公司 | 一种变压器铁心接缝磁致伸缩特性等效计算方法和装置 |
JP2022063163A (ja) * | 2020-10-09 | 2022-04-21 | 株式会社島津製作所 | 走査型プローブ顕微鏡 |
KR20220106132A (ko) | 2019-11-28 | 2022-07-28 | 고쿠리츠다이가쿠호진 고베다이가쿠 | 외부장 응답 분포 가시화 장치 및 외부장 응답 분포 가시화 방법 |
WO2022190753A1 (ja) * | 2021-03-09 | 2022-09-15 | 株式会社 Integral Geometry Science | 検査装置及び検査方法 |
JP7457239B2 (ja) | 2020-04-16 | 2024-03-28 | 日本製鉄株式会社 | 磁区構造の解析方法及び解析システム |
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JP4102280B2 (ja) * | 2002-10-14 | 2008-06-18 | 三星電子株式会社 | スピン分極電子を用いた磁性媒体及び磁性媒体への情報記録装置及び記録方法 |
US8593141B1 (en) | 2009-11-24 | 2013-11-26 | Hypres, Inc. | Magnetic resonance system and method employing a digital squid |
US8970217B1 (en) | 2010-04-14 | 2015-03-03 | Hypres, Inc. | System and method for noise reduction in magnetic resonance imaging |
US8726410B2 (en) * | 2010-07-30 | 2014-05-13 | The United States Of America As Represented By The Secretary Of The Air Force | Atomic force microscopy system and method for nanoscale measurement |
US9982525B2 (en) | 2011-12-12 | 2018-05-29 | Schlumberger Technology Corporation | Utilization of dynamic downhole surveying measurements |
US9273547B2 (en) * | 2011-12-12 | 2016-03-01 | Schlumberger Technology Corporation | Dynamic borehole azimuth measurements |
JP2014045869A (ja) * | 2012-08-30 | 2014-03-17 | Canon Inc | 撮影装置、画像処理装置、及び画像処理方法 |
US9689934B2 (en) * | 2013-02-26 | 2017-06-27 | Mir Behrad KHAMESEE | Method for providing force information in a magnetic field environment using remote measurement of flux |
GB2535082B (en) | 2013-12-12 | 2020-12-23 | Halliburton Energy Services Inc | Magnetic monopole ranging system and methodology |
WO2015100424A1 (en) * | 2013-12-25 | 2015-07-02 | Amber Precision Instruments, Inc. | Emission source microscopy for electromagnetic interference applications |
US10073057B2 (en) * | 2016-06-14 | 2018-09-11 | Universidad De Santiago De Chile | Micro magnetic trap and process for evaluating forces with pico Newton resolution |
US11051737B2 (en) * | 2017-05-19 | 2021-07-06 | Ricoh Company, Ltd. | Biomagnetic measurement method, biomagnetic measuring device, and biomagnetic measuring system |
CN111625952B (zh) * | 2020-05-21 | 2022-08-16 | 中国石油大学(华东) | 温度和应力三维分布检测方法、系统、存储介质 |
CN112730994B (zh) * | 2020-12-22 | 2022-10-04 | 国网天津市电力公司电力科学研究院 | 基于matlab获取高压交流线路电场的方法及系统 |
CN113009242B (zh) * | 2021-02-25 | 2022-10-04 | 西安理工大学 | 一种阵列式磁通门表面电势分布及衰减的测量装置及方法 |
Citations (8)
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JPH09160903A (ja) * | 1995-12-05 | 1997-06-20 | Mitsubishi Electric Corp | 物理量分布推定方法 |
JPH09229727A (ja) * | 1996-02-28 | 1997-09-05 | Nkk Corp | 物理量予測方法及びその装置 |
JP2000039414A (ja) * | 1998-07-17 | 2000-02-08 | Nippon Consultant Kk | コンクリート構造物中の鉄筋の腐食状態の評価方法 |
JP2000275206A (ja) * | 1999-03-25 | 2000-10-06 | Ebara Corp | 腐食・防食解析方法 |
JP2002257705A (ja) | 2001-03-01 | 2002-09-11 | Miura Hidemi | Mfmを用いた磁性薄膜の磁極分布断層解析法 |
JP2002366537A (ja) | 2001-06-11 | 2002-12-20 | Nikon Corp | ラプラス方程式を満足するポテンシャル問題の解析方法 |
WO2005050186A1 (ja) * | 2003-11-20 | 2005-06-02 | The Circle For The Promotion Of Science And Engineering | 実環境分極測定装置及びそれを用いた実環境分極抵抗・分極曲線測定方法 |
JP2006031413A (ja) * | 2004-07-16 | 2006-02-02 | Ebara Corp | 電磁場解析方法 |
Family Cites Families (2)
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US5465046A (en) | 1994-03-21 | 1995-11-07 | Campbell; Ann. N. | Magnetic force microscopy method and apparatus to detect and image currents in integrated circuits |
US6714008B1 (en) * | 2002-07-29 | 2004-03-30 | The United States Of America As Represented By The Secretary Of The Navy | Gradiometric measurement methodology for determining magnetic fields of large objects |
-
2008
- 2008-03-28 JP JP2009509223A patent/JP4878063B2/ja active Active
- 2008-03-28 WO PCT/JP2008/056137 patent/WO2008123432A1/ja active Application Filing
- 2008-03-28 KR KR1020097020807A patent/KR101127682B1/ko active IP Right Grant
- 2008-03-28 US US12/594,050 patent/US8536862B2/en active Active
- 2008-03-28 EP EP08739255A patent/EP2141481B1/en active Active
Patent Citations (8)
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JPH09160903A (ja) * | 1995-12-05 | 1997-06-20 | Mitsubishi Electric Corp | 物理量分布推定方法 |
JPH09229727A (ja) * | 1996-02-28 | 1997-09-05 | Nkk Corp | 物理量予測方法及びその装置 |
JP2000039414A (ja) * | 1998-07-17 | 2000-02-08 | Nippon Consultant Kk | コンクリート構造物中の鉄筋の腐食状態の評価方法 |
JP2000275206A (ja) * | 1999-03-25 | 2000-10-06 | Ebara Corp | 腐食・防食解析方法 |
JP2002257705A (ja) | 2001-03-01 | 2002-09-11 | Miura Hidemi | Mfmを用いた磁性薄膜の磁極分布断層解析法 |
JP2002366537A (ja) | 2001-06-11 | 2002-12-20 | Nikon Corp | ラプラス方程式を満足するポテンシャル問題の解析方法 |
WO2005050186A1 (ja) * | 2003-11-20 | 2005-06-02 | The Circle For The Promotion Of Science And Engineering | 実環境分極測定装置及びそれを用いた実環境分極抵抗・分極曲線測定方法 |
JP2006031413A (ja) * | 2004-07-16 | 2006-02-02 | Ebara Corp | 電磁場解析方法 |
Non-Patent Citations (3)
Title |
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BRADLEY J. ROTH ET AL.: "Journal of Applied Physics, United States", vol. 65, 1 January 1989, AMERICAN INSTITUTE OF PHYSICS, pages: 361 - 372 |
ROTH B.J. ET AL.: "Using a magnetometer to image a two-dimensional current distribution", J. APPL. PHYS., vol. 65, no. 1, January 1989 (1989-01-01), pages 361 - 372, XP000093117 * |
See also references of EP2141481A4 |
Cited By (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011108543A1 (ja) | 2010-03-01 | 2011-09-09 | 国立大学法人神戸大学 | ポテンシャル取得装置、磁場顕微鏡、検査装置およびポテンシャル取得方法 |
JPWO2011108543A1 (ja) * | 2010-03-01 | 2013-06-27 | 国立大学法人神戸大学 | ポテンシャル取得装置、磁場顕微鏡、検査装置およびポテンシャル取得方法 |
KR101346523B1 (ko) | 2010-03-01 | 2013-12-31 | 고쿠리츠다이가쿠호진 고베다이가쿠 | 포텐셜 취득 장치, 자장 현미경, 검사 장치 및 포텐셜 취득 방법 |
JP5713246B2 (ja) * | 2010-03-01 | 2015-05-07 | 国立大学法人神戸大学 | ポテンシャル取得装置、磁場顕微鏡、検査装置およびポテンシャル取得方法 |
JP2012110470A (ja) * | 2010-11-24 | 2012-06-14 | Kobe Univ | 磁場分布取得装置 |
WO2012153496A1 (ja) | 2011-05-09 | 2012-11-15 | 国立大学法人神戸大学 | 分布解析装置 |
US9568567B2 (en) | 2011-05-09 | 2017-02-14 | National University Corporation Kobe University | Distribution analysis device |
WO2014129151A1 (ja) | 2013-02-25 | 2014-08-28 | 国立大学法人神戸大学 | 分布解析装置および分布解析方法 |
KR20150125931A (ko) | 2013-02-25 | 2015-11-10 | 고쿠리츠다이가쿠호진 고베다이가쿠 | 분포 해석 장치 및 분포 해석 방법 |
US10295617B2 (en) | 2013-02-25 | 2019-05-21 | Kenjiro Kimura | Distribution analyzing device and distribution analyzing method |
US10254352B2 (en) | 2014-03-12 | 2019-04-09 | National University Corporation Kobe University | Conductivity distribution derivation method and conductivity distribution derivation device |
US11041826B2 (en) | 2015-11-16 | 2021-06-22 | National University Corporation Kobe University | Observation method and observation device |
US11422110B2 (en) | 2015-11-16 | 2022-08-23 | National University Corporation Kobe University | Observation method and observation device |
CN105653880A (zh) * | 2016-03-03 | 2016-06-08 | 南京邮电大学 | 一种基于心音的心脏发声场溯源方法 |
US11366079B2 (en) | 2016-04-28 | 2022-06-21 | National University Corporation Kobe University | Measurement device and measurement method |
JPWO2017187791A1 (ja) * | 2016-04-28 | 2019-02-28 | 国立大学法人神戸大学 | 計測装置および計測方法 |
WO2017187791A1 (ja) * | 2016-04-28 | 2017-11-02 | 国立大学法人神戸大学 | 計測装置および計測方法 |
KR20220106132A (ko) | 2019-11-28 | 2022-07-28 | 고쿠리츠다이가쿠호진 고베다이가쿠 | 외부장 응답 분포 가시화 장치 및 외부장 응답 분포 가시화 방법 |
JP7457239B2 (ja) | 2020-04-16 | 2024-03-28 | 日本製鉄株式会社 | 磁区構造の解析方法及び解析システム |
JP2022063163A (ja) * | 2020-10-09 | 2022-04-21 | 株式会社島津製作所 | 走査型プローブ顕微鏡 |
JP7444017B2 (ja) | 2020-10-09 | 2024-03-06 | 株式会社島津製作所 | 走査型プローブ顕微鏡 |
WO2022190753A1 (ja) * | 2021-03-09 | 2022-09-15 | 株式会社 Integral Geometry Science | 検査装置及び検査方法 |
CN113553743A (zh) * | 2021-07-29 | 2021-10-26 | 西安西电变压器有限责任公司 | 一种变压器铁心接缝磁致伸缩特性等效计算方法和装置 |
CN113553743B (zh) * | 2021-07-29 | 2023-08-11 | 西安西电变压器有限责任公司 | 一种变压器铁心接缝磁致伸缩特性等效计算方法和装置 |
Also Published As
Publication number | Publication date |
---|---|
EP2141481A1 (en) | 2010-01-06 |
JPWO2008123432A1 (ja) | 2010-07-15 |
JP4878063B2 (ja) | 2012-02-15 |
EP2141481A4 (en) | 2011-03-23 |
KR20090130369A (ko) | 2009-12-23 |
US20100219819A1 (en) | 2010-09-02 |
KR101127682B1 (ko) | 2012-06-05 |
EP2141481B1 (en) | 2012-05-23 |
US8536862B2 (en) | 2013-09-17 |
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