WO2011108543A1 - ポテンシャル取得装置、磁場顕微鏡、検査装置およびポテンシャル取得方法 - Google Patents
ポテンシャル取得装置、磁場顕微鏡、検査装置およびポテンシャル取得方法 Download PDFInfo
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- WO2011108543A1 WO2011108543A1 PCT/JP2011/054635 JP2011054635W WO2011108543A1 WO 2011108543 A1 WO2011108543 A1 WO 2011108543A1 JP 2011054635 W JP2011054635 W JP 2011054635W WO 2011108543 A1 WO2011108543 A1 WO 2011108543A1
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- 0 CN(*)*(CCC(CC1)*2C1CC1)C21NN=O Chemical compound CN(*)*(CCC(CC1)*2C1CC1)C21NN=O 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
- G01R29/14—Measuring field distribution
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/10—Plotting field distribution ; Measuring field distribution
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
- G01N24/08—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects by using nuclear magnetic resonance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/38—Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field
- G01R33/3808—Magnet assemblies for single-sided MR wherein the magnet assembly is located on one side of a subject only; Magnet assemblies for inside-out MR, e.g. for MR in a borehole or in a blood vessel, or magnet assemblies for fringe-field MR
Definitions
- the present invention relates to a technique for acquiring a two-dimensional potential distribution derived from magnetic potential, potential, temperature, and the like by measurement.
- a magnetic field distribution is obtained using a superconducting quantum interferometer (hereinafter referred to as “SQUID”) or a magnetoresistive sensor, and based on the magnetic field distribution, for example, in addition, the defective (short circuit) portion of the electric circuit is specified. Since the resolution of the magnetic field measurement depends on the size of the SQUID coil and the magnetoresistive sensor, attempts have been made to improve the resolution of the measurement by reducing the size.
- SQUID superconducting quantum interferometer
- MFM magnetic force microscope
- the magnetic force sensor has a thickness of “magnetic thin film thickness + probe tip radius of curvature + magnetic thin film”.
- the thickness of the magnetic thin film is 10 nm and the radius of curvature of the probe tip is 10 nm, It will have a total diameter of 30 nm. At least the measurement resolution does not improve beyond the tip radius of curvature of the probe. In addition, since it is difficult to practically coat the magnetic thin film only on the tip of the probe, the effective magnetic force sensor becomes even larger.
- An object of the present invention is to improve the resolution of measurement of a two-dimensional potential (two-dimensional potential distribution) derived from magnetic potential, potential, temperature, and the like.
- ⁇ (x, y, z) is a potential function indicating at least a three-dimensional potential formed around the object due to the presence of the object.
- Z ⁇ (where ⁇ is a value that is set outside the object) as coordinate parameters of an orthogonal coordinate system defined by mutually perpendicular X, Y, and Z directions set for the object.
- Previous with the angle ⁇ changed to multiple ways A measurement unit for obtaining a measurement value derived from the three-dimensional potential in each of a plurality of linear regions, and a coordinate parameter in the X ′ direction as x ′ (where the origin is on the Z axis), the measurement unit.
- the measurement unit extends in the longitudinal direction and acquires a measurement value derived from the three-dimensional potential, the reference direction, and the longitudinal direction of the measurement unit.
- An angle changing unit for changing the angle ⁇ between the direction and the measurement unit on the measurement surface by moving the measurement unit relative to the object in the X ′ direction on the measurement area.
- a moving mechanism that performs scanning through which the measurement unit passes, and a control unit that repeats the scanning while changing the angle ⁇ by controlling the angle changing unit and the moving mechanism. By repetition, the measurement value f (x ′, ⁇ ) is acquired in the measurement unit.
- the three-dimensional potential is obtained by differentiating the potential of the magnetic potential at least once with respect to the Z direction, and the measurement unit extends in the longitudinal direction and the Z direction and generates a signal derived from the three-dimensional potential.
- the measurement resolution in the scanning direction in the scanning of the measurement unit can be improved.
- the calculation unit obtains a difference image between the first image and the intermediate image, and obtains a differential image obtained by dividing the difference image by the minute distance as a second image;
- the first image ⁇ (x, y, 0) and the second image ⁇ z (x, y, 0) are Fourier transformed, respectively, and ⁇ (k x , k y ) and ⁇ z (k x , K y ) (where k x , k y are X and Y direction wavenumbers),
- the three-dimensional potential is preferably a potential derived from magnetic potential, potential, temperature or gravity.
- the present invention is also directed to a magnetic field microscope using the potential acquisition device and an inspection device using nuclear magnetic resonance, and also to a potential acquisition method.
- FIG. 1 is a diagram for explaining the principle of a two-dimensional potential acquisition method.
- FIG. 1 shows an orthogonal coordinate system defined by mutually perpendicular X, Y, and Z directions.
- coordinate parameters in the X, Y, and Z directions are indicated by x, y, and z.
- the potential of the magnetic potential formed around the magnetized magnetic material or the current flowing inside the multilayer semiconductor device is formed around (and inside) the semiconductor device. 2 on the measurement surface of the three-dimensional potential derived from the potential of the magnetic potential on the premise of the presence of the potential of the magnetic potential formed at least around the target due to the presence of the target, such as the potential of the magnetic potential.
- a dimensional potential (potential distribution) is acquired.
- the measurement unit 21 acquires a Z-direction component of the magnetic field (which may be a magnetic field approximately along the Z-direction, and hereinafter also simply referred to as “magnetic field”)
- a Z-direction component of the magnetic field which may be a magnetic field approximately along the Z-direction, and hereinafter also simply referred to as “magnetic field”
- a two-dimensional potential on the measurement surface of the three-dimensional potential having a gradient in the Z direction of the potential ⁇ as a scalar value is acquired.
- ⁇ (x, y, z) is ⁇ z (1) (x, y, z) (hereinafter referred to as ⁇ z (x, y, z)), which is a one-time differentiation of ⁇ (x, y, z) with z, and is a two-dimensional potential.
- the direction on the measurement surface parallel to the Y direction is the reference direction
- the longitudinal direction of the measurement unit 21 is the Y ′ direction
- the direction perpendicular to the longitudinal direction (Y ′ direction) on the measurement surface is the X ′ direction.
- the angle formed by the reference direction and the Y ′ direction is ⁇
- the coordinate parameters in the X ′ direction and the Y ′ direction are x ′ and y ′ (where the origins in the X ′ direction and the Y ′ direction are on the Z axis
- the measurement unit 21 is moved in the X ′ direction, and a predetermined region on the measurement surface (a region where a measurement region of interest on the object is projected onto the measurement surface is referred to as “measurement” hereinafter.
- a scan that passes through the “target region”) is performed.
- a signal indicating the magnetic field received by the entire measuring unit 21 at each position x ′ in the X ′ direction during scanning (the sum of the magnetic lines of force passing through the measuring unit 21) is generated (that is, the measuring unit 21 applies the magnetic field).
- an electric signal corresponding to the magnetic field is generated) and obtained as a measurement value.
- Equation 3 when viewed along the Z direction, the X′Y ′ coordinate system is obtained by rotating the XY coordinate system by an angle ⁇ about the Z axis, and therefore, Equation 3 is satisfied.
- the measurement value f (x ′, ⁇ ) is expressed by Equation 4. expressed. Note that, with respect to the longitudinal direction (Y ′ direction) of the measurement unit 21, the measurement unit 21 is set to be sufficiently longer than the width of the measurement target region.
- Equation 5 ⁇ (k x , k y )
- z ⁇ (hereinafter simply referred to as ⁇ (k x , k y )) obtained by Fourier transform of ⁇ (x, y, ⁇ ) in the X direction and the Y direction. It is expressed as Equation 5. However, the number 5, k x, k y is the wave number of the X and Y directions.
- Equation 7 (Dxdy) in Equation 6 is expressed by Equation 7.
- Equation 6 can be transformed into Equation 8 using Equation 3, Equation 4, and Equation 7.
- Equation 8 ⁇ (k x ′ cos ⁇ , k x ′ sin ⁇ ) is expressed as g (k x ′ , ⁇ ).
- Equation 10 ⁇ (k x ′ cos ⁇ , k x ′ sin ⁇ ) of Equation 8 into Equation 9
- the measurement unit 21 is scanned on the measurement surface to obtain the measurement value f (x ′, ⁇ ) while changing the angle ⁇ formed by the reference direction and the longitudinal direction of the measurement unit 21 in a plurality of ways. Furthermore, by obtaining g (k x ′ , ⁇ ) obtained by Fourier transforming the measured value f (x ′, ⁇ ) with respect to x ′, Equation 10 (hereinafter referred to as “two-dimensional potential acquisition formula”). Can be used to obtain ⁇ (x, y, ⁇ ).
- FIG. 2 is a diagram illustrating a configuration of the magnetic field acquisition apparatus 1.
- the magnetic field acquisition apparatus 1 includes a head unit 2 that detects an interaction force between the sample and the sensor, a sample stage 31 that holds the sample 9 on a horizontal plane, and the sample stage 31 that is positioned on a horizontal plane.
- a rotation mechanism 32 that rotates about an axis perpendicular to the axis, a horizontal movement mechanism 33 that moves the sample table 31 in the horizontal plane together with the rotation mechanism 32, and a head portion 2 (a support portion 22 described later) moves in the vertical direction.
- a lifting / lowering mechanism 34 a signal processing unit 5 that processes signals from the head unit 2, and a computer 4 that controls and calculates each component of the magnetic field acquisition device 1.
- the head unit 2 includes a measurement unit 21 that is a thin film element, and a support unit 22 that holds the measurement unit 21.
- the support unit 22 includes a support plate 221 having a horizontal normal line, and the measurement unit 21 is provided at a position below the support plate 221 in the vertical direction (sample 9 side).
- the upper end of the support plate 221 is connected to one side of the inclined portion 222 that is a substantially rectangular frame.
- the inclined portion 222 is inclined with respect to the horizontal plane, and the side opposite to the support plate 221 is connected to the base portion 223 that extends in the horizontal direction.
- the measurement unit 21 is a sensor using a magnetoresistive effect (for example, a GMR (Giant Magnetoresistive) element), and is formed by laminating a plurality of long rectangular films on the support plate 221 in the horizontal direction.
- the output signal of the measurement unit 21 is input to the computer 4 via the preamplifier 54 and the signal processing unit 55 of the signal processing unit 5.
- the measuring unit 21 acquires a magnetic field that acts on the entire measuring unit 21 by detecting a change in electrical resistance caused by the magnetic field.
- the head unit 2 further includes a laser diode module (hereinafter referred to as “LD module”) 23 and a displacement detection photodiode (position “sensitive” photo-diode) (hereinafter referred to as “PSPD”) 24.
- LD module laser diode module
- PSPD displacement detection photodiode
- a high frequency superimposer 231 is connected to the LD module 23, and an RF oscillator 232 and an LD bias controller 233 are connected to the high frequency superimposer 231.
- the LD temperature controller 234 is connected to the LD module 23, and the temperature of the LD module 23 is adjusted to be constant.
- the magnetic field acquisition apparatus 1 In the magnetic field acquisition apparatus 1, light is emitted from the LD module 23 serving as the emitting unit toward the vicinity of the end of the inclined unit 222 on the support plate 221 side under the control of the computer 4 serving as the control unit, and the PSPD 24 serving as the light receiving unit. Then, the reflected light from the support portion 22 is received.
- the signal from the PSPD 24 is output to the computer 4 through the IV converter 51, the preamplifier 52, and the signal processing unit 53 of the signal processing unit 5, and the vertical position of the support unit 22 is obtained with high accuracy. This prevents the support plate 221 from contacting the sample 9.
- the horizontal movement mechanism 33 includes first and second movement mechanisms 331 and 332 that horizontally move the sample stage 31 in two directions perpendicular to each other.
- the moving direction of the sample stage 31 of the first and second moving mechanisms 331 and 332 is fixed relative to the measuring unit 21, and the first moving mechanism 331 moves the sample stage 31 in the longitudinal direction of the measuring unit 21.
- the second moving mechanism 332 horizontally moves the sample table 31 in the longitudinal direction.
- the rotation mechanism 32, the horizontal movement mechanism 33, and the lifting mechanism 34 are connected to the drive control unit 30.
- the computer 4 is a general computer system in which a CPU 41 that performs various operations, a ROM 42 that stores basic programs, and a RAM 43 that stores various information are connected to a bus line.
- the bus line further includes a fixed disk 44 for storing information, a display 45 for displaying various information, a keyboard 46a and a mouse 46b for accepting input from an operator, an optical disk, a magnetic disk, a magneto-optical disk, and the like.
- a reading device 47 that reads information from the recording medium 8
- a communication unit 48 that sends control signals to the head unit 2 and the drive control unit 30 and receives signals from the signal processing units 53 and 55, as appropriate. They are connected via an interface (I / F).
- the computer 4 reads the program 441 from the recording medium 8 via the reader 47 in advance and stores it in the fixed disk 44.
- the program 441 is copied to the RAM 43 and the CPU 41 executes arithmetic processing according to the program in the RAM 43 (that is, when the computer 4 executes the program), thereby realizing a function as an arithmetic unit described later. .
- FIG. 4 is a block diagram showing a functional configuration realized by the CPU 41, the ROM 42, the RAM 43, the fixed disk 44, and the like together with the signal processing unit 5 when the CPU 41 operates according to the program 441.
- a function realized by the CPU 41 and the like is shown by the arithmetic unit 61 including the Fourier transform units 611 and 612, the two-dimensional potential distribution calculation units 613 and 614, and the three-dimensional potential distribution calculation unit 615. Note that these functions may be realized by a dedicated electrical circuit, or a dedicated electrical circuit may be partially used. Further, it may be realized by a plurality of computers.
- FIG. 5 is a diagram showing a process flow in which the magnetic field acquisition apparatus 1 acquires a two-dimensional potential (distribution).
- the X, Y, Z orthogonal coordinate system in the above-described two-dimensional potential acquisition principle is set relatively fixed with respect to the sample 9, the X direction and the Y direction are horizontal, and the Z direction is It shall be vertical.
- the surface of the sample 9 is parallel to the XY plane, and the rotation mechanism 32 rotates the sample table 31 around the Z axis. Therefore, when the sample 9 is rotated together with the sample stage 31 by the rotation mechanism 32, the X and Y directions are also rotated on the horizontal plane together with the sample 9.
- the moving direction of the sample stage 31 by the first moving mechanism 331 (that is, the horizontal direction perpendicular to the longitudinal direction of the measuring unit 21) is the X ′ direction
- the moving direction of the sample stage 31 by the second moving mechanism 332 (that is, The horizontal direction along the longitudinal direction of the measurement unit 21 is defined as the Y ′ direction.
- the rotation mechanism 32 which is an angle changing unit rotates the sample stage 31, thereby fixing the X direction relatively to the sample 9.
- the Y direction rotates together with the sample 9.
- the angle ⁇ formed by the reference direction on the measurement surface parallel to the Y direction and the longitudinal direction (Y ′ direction) of the measurement unit 21 is a fixed minute angle (for example, 1 degree to 15 degrees (preferably, The angle is changed by 10 degrees or less (more preferably, 5 degrees or less) (step S13).
- the measurement unit 21 is moved relative to the sample 9 in the X ′ direction on the measurement surface (that is, the measurement unit 21 is scanned), and the magnetic field at each position x ′ is acquired (step S11). ).
- the scanning of the measuring unit 21 is repeated while the rotation mechanism 32 changes the angle ⁇ in a plurality of ways under the control of the computer 4, and the measured value f (x ′, ⁇ ) using x ′ and ⁇ as parameters. ⁇ ) is acquired (steps S12, S13, S11).
- the plurality of angles ⁇ in the present embodiment are angles at regular intervals within a range of 0 ° or more and less than 180 °.
- the Fourier transform unit 611 performs a Fourier transform of f (x ′, ⁇ ) with respect to x ′, thereby obtaining g (k x ′ , ⁇ ) is acquired.
- the two-dimensional potential distribution calculating unit 613, g (k x ', ⁇ ) by substituting the two-dimensional potential acquiring formula (number 10) shows a two-dimensional potential in the measurement plane phi (x, y, alpha ) Is obtained (step S14).
- the measurement unit 21 that is sufficiently longer than the width of the measurement target region is used, and the reference direction on the measurement surface and the longitudinal direction of the measurement unit 21 The scanning in the direction perpendicular to the longitudinal direction of the measurement unit 21 is repeated on the measurement surface while changing the angle ⁇ between the plurality of angles. Then, ⁇ (x, y, ⁇ ) indicating the two-dimensional potential on the measurement surface is obtained by the two-dimensional potential acquisition formula using the measurement value f (x ′, ⁇ ) acquired by repeating scanning.
- the resolution is determined by the film thickness of the thin film element. It is easy to control the thickness of the thin film, and in principle the resolution can be increased to the atomic / molecular scale.
- a superconducting quantum interferometer having a long measurement range in the horizontal direction may be used as the measurement unit 21 (the same applies hereinafter).
- a method for acquiring a three-dimensional potential (distribution) using the above two-dimensional potential acquisition method will be described.
- a three-dimensional potential is acquired by a method similar to that of International Publication No. 2008/123432 (Reference 2).
- ⁇ (x, y, z) indicating a three-dimensional potential satisfying the Laplace equation is obtained.
- Equation 11 which is a three-dimensional potential satisfying the Laplace equation
- Equation 12 k x and k y are wave numbers in the X direction and the Y direction, and a (k x , k y ) and b (k x , k y ) are functions represented by k x and k y. It is. Furthermore, what differentiated both sides of Formula 12 once by z is expressed by Formula 13.
- Equation 20 ⁇ (x, y, z) is expressed by Equation 20.
- a (k x , k y ) and b (k x , k y ) are also obtained by performing processing according to the derivation of equation 20 on the function obtained by differentiating equation 12 with odd and even times.
- An equation corresponding to the number 20 obtained by differentiating ⁇ (x, y, z) at least once can be derived.
- q and p are integers of 0 or more, q is an odd number, and p is an even number (that is, q ⁇ 1, p ⁇ 0 (mod 2)).
- H z (q) (x, y, z) H z (p) ( x, y, z).
- H z (q) (x, y, 0) (that is, Equation 21) that is Fourier-transformed with respect to x and y is represented as h z (q) (k x , k y ), and H z (p)
- h z (p) (k x , k y )
- H z (q) (x, y, z) and H z (p ) (X, y, z) are expressed by Equation 22 and Equation 23, respectively.
- H z (q) (x, y, 0) and H z (p) (x, y, 0) can be obtained by measurement, h (q) ( k x , k y ) and h (p) (k x , k y ) are obtained and h (q) (k x , k y ) and h (p) (k x , k from y) H z (q) ( x, y, z) or H z (p) (x, y, by performing an inverse Fourier transform guides those of z) Fourier transform, H z (q) ( x, can be obtained y, z) or H z (p) (x, y, z) a.
- FIG. 6 is a diagram illustrating a flow of processing in which the magnetic field acquisition apparatus 1 acquires a three-dimensional potential.
- ⁇ (x, y, 0) is acquired.
- the value of ⁇ (x, y, 0) (value indicating the magnitude of the magnetic field) at each position on the measurement surface 91 is converted into a pixel value by the two-dimensional potential distribution calculation unit 613 and measured.
- the two-dimensional distribution of the magnetic field on the surface 91 is stored in the fixed disk 44 (see FIG. 4) as a magnetic field distribution image 71 (more precisely, image data) (FIG. 6: step S21).
- the process of step S21 has already been completed by executing the process of FIG. 5 described above.
- the head unit 2 is lowered by a minute distance d (d> 0) in the Z direction by the elevating mechanism 34 shown in FIG. 2, and the measurement unit 21, the sample 9, and the sample 9 are shown in FIG. Is changed by a minute distance d. That is, a surface 92 that is separated from the measurement surface 91 that is fixed relative to the sample 9 by a minute distance d in the ( ⁇ Z) direction is a new measurement surface. Then, the magnetic field distribution (that is, ⁇ (x, y, ⁇ d)) on the measurement surface 92 is acquired as the auxiliary magnetic field distribution image 72 by performing steps S11 to S14 of FIG. (Step S22).
- step S 22 the measurement value f (x ′, ⁇ ) is output from the signal processing unit 5 in FIG. 4 to the Fourier transform unit 612, and the auxiliary magnetic field distribution image 72 is displayed in the two-dimensional potential distribution calculation unit 614. Generated.
- both the magnetic field distribution image 71 and the auxiliary magnetic field distribution image 72 may be generated by one Fourier transform unit and one two-dimensional potential distribution calculation unit.
- the three-dimensional potential distribution calculation unit 615 obtains a difference image between these images. Then, a differential image obtained by dividing the difference image by the minute distance d is generated.
- the differential image is a differential in the Z direction of the magnetic field on the measurement surface 91, that is, an image substantially showing the magnetic field gradient, and is stored as a magnetic field gradient distribution image (can also be regarded as a potential gradient distribution image) (step S23). .
- the magnetic field distribution image 71 is represented by ⁇ (x, y, 0). Since the magnetic field gradient is obtained by differentiating the magnetic field by z, the magnetic field gradient distribution image is represented as ⁇ z (1) (x, y, 0) (hereinafter, ⁇ z (x, y, 0). ).
- steps S21 to S23 are a two-dimensional first image and intermediate image showing the magnetic field distribution. And obtaining a second image indicating the gradient of the magnetic field from these images.
- the magnetic field distribution image 71 that is ⁇ (x, y, 0) and the magnetic field gradient distribution image that is ⁇ z (x, y, 0) are Fourier transformed with respect to x and y.
- ⁇ (k x , k y ) and ⁇ z (k x , k y ) are obtained (step S24).
- a two-dimensional discrete Fourier transform is performed as the Fourier transform.
- a method of multiplying both images as a window function by the nth power of a sine function in the range of 0 to ⁇ (n is 0 or more) is used. Adopted.
- Equation 20 ⁇ (x, y, z) is obtained by an equation (hereinafter referred to as “three-dimensional potential acquisition equation”) (step S25).
- z ( ⁇ , x, y, z) is a value ( ⁇ h) indicating the position of the measurement target substance surface 93 buried in the medium (or a position close to the measurement target substance surface 93 buried in the medium). Value) is substituted, and a magnetic field distribution on the surface 93 of the measurement target material buried in the medium is obtained (step S26).
- the image indicating ⁇ (x, y, ⁇ h) in the magnetic field acquisition device 1 is a fixed disk as a magnetic domain image indicating the magnetic domain structure. 44 is stored.
- the magnetic field distribution image in the vicinity of the measurement target material surface 93 buried in the medium even when the sensor cannot be approached to the measurement target material surface 93 buried in the medium due to the influence of the object existing above the magnetic material such as the protective film.
- a magnetic field microscope having a high spatial resolution of 10 nm or less (2 to 3 nm or less depending on the design) is realized by the magnetic field acquisition device 1.
- the magnetic field distribution image 71 and the auxiliary magnetic field distribution image 72 are acquired by the same method on two measurement surfaces that differ by a minute distance in the Z direction, and a difference image of these images is obtained.
- a differential image divided by a minute distance is acquired as a magnetic field gradient distribution image.
- ⁇ (x, y, 0) that is the magnetic field distribution image 71 and ⁇ z (x, y, 0) that is the magnetic field gradient distribution image are Fourier-transformed, respectively, and ⁇ (k x , k y ) and ⁇ z ( k x , k y ), and ⁇ (x, y, z) is obtained from the three-dimensional potential acquisition formula using ⁇ (k x , k y ) and ⁇ z (k x , k y ). .
- the three-dimensional potential can be obtained with high accuracy.
- the calculation unit 61 sets a value indicating the position of the measurement target substance surface 93 buried in the medium of the sample 9 or the position close to the measurement target substance surface 93 buried in the medium in z of ⁇ (x, y, z). By substituting, it is possible to acquire a magnetic domain image indicating the magnetic domain structure on the surface 93 of the measurement target material buried in the medium, and the magnetic field acquisition apparatus 1 can realize a magnetic field microscope with high spatial resolution.
- the magnetic field acquisition device 1 may be used as a detector for a hard disk drive.
- FIG. 8 is a diagram illustrating a state in which a thin film of magnetic material is formed on a rectangular substrate (hereinafter, denoted by the same reference numeral 221) serving as the support plate 221 of the support portion 22.
- the measurement unit 21 is a multilayer film of a magnetic material (a material containing cobalt (Co), nickel (Ni), iron (Fe), etc.).
- a substrate 221 is arranged in parallel to the plate-like deposition source 81 at a position facing the deposition source 81 of the magnetic material, and has a mask 82 having an opening between the deposition source 81 and the substrate 221 (in FIG. 8, a cross section). In FIG. 9, the parallel diagonal lines are omitted. Then, a thin film 220 of the magnetic material is formed in a region on the substrate 221 corresponding to the opening shape of the mask 82 by vacuum deposition. In this manner, a thin film element that extends along the main surface of the substrate 221 (that is, the measurement unit 21 that extends in the Y ′ direction and the Z direction in FIG. 2) is formed by vapor deposition of a substance that becomes a thin film.
- FIG. 9 is a diagram showing a state in which a thin film of magnetic material is formed on the substrate 221.
- the substrate 221 is arranged to be inclined with respect to the vapor deposition source 81 while the plate-shaped vapor deposition source 81 and the substrate 221 are opposed to each other.
- the lower side of FIG. 9 corresponds to the ( ⁇ Z) side in the magnetic field acquisition device 1 of FIG. 2, and the substrate 221 is arranged such that the lower side portion of the rectangular substrate 221 is separated from the vapor deposition source 81. Tilted. And by performing vapor deposition in this state, as shown in FIG.
- the thin film 220 is formed in the lower part of the board
- a measurement unit in which the film thickness of the thin film 220 on the lower side of the substrate 221 (that is, the sample 9 side when provided in the magnetic field acquisition apparatus 1) is smaller than the film thickness of other parts is formed.
- the film thickness at the lower end of the thin film 220 affects the resolution in the X ′ direction, which is the film thickness direction, and therefore is formed by the method shown in FIG.
- the measurement unit in which the film thickness gradually decreases toward the object side can obtain a measurement value having a higher resolution in the X ′ direction than the measurement unit formed by the method of FIG.
- the thin film element whose film thickness gradually decreases toward the object may be formed by other methods.
- FIG. 10 is a diagram for explaining an inspection apparatus 1a that uses the two-dimensional potential acquisition method.
- the inspection apparatus 1a is an MRI apparatus that acquires an image by a nuclear magnetic resonance imaging method (Magnetic Resonance Imaging (MRI)).
- MRI Magnetic Resonance Imaging
- the left side in FIG. 10 shows the configuration of the inspection apparatus 1a, and the right side is a cross section to be inspected of the object 9a (a cross section parallel to the XY plane in FIG. 10, hereinafter referred to as “inspection target surface”).
- the relationship between the position of a Z direction and the frequency (omega) of the rotating magnetic field provided with respect to the target object 9a by the transmission coil 12 mentioned later is shown.
- the inspection apparatus 1a includes a static magnetic field forming unit 11 that forms a gradient magnetic field in the Z direction with respect to an object 9a that is a human body lying in the Y direction in FIG. 10, and a transmission coil 12 that applies a rotating magnetic field toward the object 9a.
- the head portion 2a disposed on the (+ Z) side of the object 9a, the turning mechanism 32a for turning the head portion 2a around an axis parallel to the Z direction, and the turning mechanism 32a together with the head portion 2a in the Z direction.
- An elevating mechanism 34a that moves up and down, a horizontal moving mechanism 33a that moves the head portion 2a in the X direction and the Y direction together with the rotating mechanism 32a and the elevating mechanism 34a, and a control unit 40 that is connected to each component of the inspection apparatus 1a are provided.
- the strength of the static magnetic field formed by the static magnetic field forming unit 11 is ( ⁇ ) by increasing the length of the plurality of arrows denoted by reference symbol A1 in order from the (+ Z) side toward the ( ⁇ Z) direction. The state of increasing gradually toward the Z) direction is shown abstractly.
- the head part 2a has a measuring part 21a that is sufficiently longer than the width of the object 9a in the X direction (for example, twice or more of the width) and a support plate 221a to which the measuring part 21a is fixed. 221a is attached to the rotation mechanism 32a via the support bar 224.
- FIG. 11 is a diagram illustrating a functional configuration of the control unit 40 together with the measurement unit 21a and the transmission coil 12. As illustrated in FIG. The control unit 62 and the calculation unit 63 in FIG. 11 are functions realized by a computer included in the control unit 40.
- the control unit 62 is connected to the scanning signal generator 410, and the head unit 2a performs scanning by the horizontal movement mechanism 33a based on the signal from the scanning signal generator 410.
- the control unit 62 is connected to the transmission coil 12 via the oscillator 401, the phase adjustment unit 402, the amplitude modulator 403, and the high frequency amplifier 404, and a rotating magnetic field having a frequency according to the control of the control unit 62 is transmitted from the transmission coil 12. It is given to the object 9a.
- the measurement unit 21a is connected to the receiver preamplifier 405, and after the signal from the measurement unit 21a is amplified by the receiver preamplifier 405, the signal is output to the phase detector 406, the LPF 407, and the AD converter 408 in order.
- An output signal from the AD converter 408 is stored in the memory 409 as a measured value f (x ′, ⁇ ).
- the content of the signal output from the AD converter 408 is surrounded by a broken-line rectangle labeled B1 (the same applies to rectangles B2 and B3).
- a rotating magnetic field also referred to as an RF pulse (90-degree pulse)
- RF pulse 90-degree pulse
- nuclear magnetic resonance nuclear magnetic resonance (Nuclear magnetic resonance (NMR)
- NMR nuclear magnetic resonance
- an MRI image of the inspection target surface is acquired by scanning the measurement unit 21a in synchronization with the application of the rotating magnetic field.
- the measurement unit 21a is stopped at each position x ′ in the scanning direction (that is, the X ′ direction).
- a rotating magnetic field having a frequency ⁇ 0 is applied from the transmission coil 12 to the object 9a, and nuclear magnetic resonance occurs on the inspection target surface.
- the change of the measured value in the measurement part 21a is acquired for a predetermined time after the drive of the transmission coil 12 is stopped (that is, after the application of the rotating magnetic field is stopped).
- the driving of the transmission coil 12 and the acquisition of the change in the measured value after the driving is stopped are performed for all the positions x ′ in the X ′ direction in the scanning, and one scanning of the measuring unit 21 a is completed.
- the above operation is performed for scanning at all angles ⁇ , whereby a magnetic field distribution image of ⁇ (x, y, 0) is acquired by the reconstruction control unit 631 (FIG. 5: step S14, FIG. 6: Step S21).
- ⁇ (x, y, 0, t) including the elapsed time t after stopping the transmission coil 12 as a parameter is obtained as a magnetic field distribution image for each elapsed time t.
- step S22 When ⁇ (x, y, 0, t) is acquired, the head portion 2a is moved in the Z direction by a minute distance d by the elevating mechanism 34a. Thereafter, the same processing as in step S21 is performed, so that ⁇ (x, y, ⁇ d, t) is acquired as an auxiliary magnetic field distribution image for each elapsed time t (step S22).
- ⁇ z (x, y, 0, t) ie, each difference between ⁇ (x, y, 0, t) and ⁇ (x, y, ⁇ d, t) divided by a minute distance d
- a magnetic field gradient distribution image obtained by dividing the difference image between the magnetic field distribution image at the elapsed time t and the auxiliary magnetic field distribution image by the minute distance d is acquired (step S23).
- ⁇ (x, y, 0 , t) and ⁇ z (x, y, 0 , t) respectively by using a material obtained by Fourier transform, phi by the three-dimensional potential acquiring equation (x, y, z, t ) Is obtained (steps S24 and S25).
- ⁇ (x, y, z, t) indicates ⁇ (x, y, z) with respect to each elapsed time t after the driving of the transmission coil 12 is stopped when the position in the Z direction of the inspection target surface is z0. ing. Therefore, by substituting z0 into z of ⁇ (x, y, z, t) acquired for the inspection target surface, the rotational magnetic field of each position (x, y) of the inspection target surface is changed. ⁇ (x, y, z0, t) indicating the temporal change of the magnetic field after the stop of application is obtained as indicating the relaxation phenomenon of the excited state. And the image which shows the difference of the relaxation phenomenon in each position (x, y) of a to-be-inspected surface is acquired as a MRI image by predetermined calculation (step S26).
- the above steps S21 to S26 are repeated by using each of a plurality of planes at a plurality of positions in the Z direction as inspection target surfaces.
- a rotating magnetic field having a frequency ( ⁇ 0 ⁇ ) is applied to the object 9a.
- the static magnetic field forming unit 11 and the transmission coil 12 cooperate to be inside the object 9a on a plurality of planes at a plurality of positions in the Z direction.
- Nuclear magnetic resonance occurs sequentially.
- the control unit 62 causes the calculation unit 63 to acquire ⁇ (x, y, z) for each elapsed time t, and
- the calculation unit 63 substitutes a value indicating the position of the plane into z of ⁇ (x, y, z)
- the relaxation phenomenon at each position (x, y) on the plane that is the inspection target surface is acquired.
- the inspection apparatus 1a the inspection using nuclear magnetic resonance can be performed with high accuracy.
- the inspection apparatus 1a of FIG. 10 it is possible to reduce a feeling of pressure or a blockage in the subject that occurs in a general tunnel-type MRI apparatus. Unlike normal MRI, it is not necessary to form steep magnetic field gradients in the X and Y directions, and the film thickness of the thin film magnetic field sensor determines the spatial resolution in the X and Y directions, thus enabling high-resolution inspection. . In addition, downsizing of the apparatus is realized, and clinical applications such as real-time high-resolution inspection during surgery are possible.
- the measurement values 21 and 21a are obtained based on the magnetic potential having been differentiated once in the Z direction, but the magnetic potential is differentiated twice in the Z direction.
- a measurement value based on the measurement value may be acquired by the measurement unit.
- ⁇ (x, y, z) is ⁇ z (2) (x, y, z) (hereinafter referred to as ⁇ zz (x, y, z)), which is the second derivative of ⁇ (x, y, z) with respect to z. y, z))).
- FIG. 12 is a diagram showing a part of the magnetic field acquisition apparatus 1b according to the second embodiment of the present invention.
- the configuration of the head part 2b is different from the magnetic field acquisition device 1 of FIG.
- the other structure is the same as that of FIG. 2, and illustration is abbreviate
- a thin film formed of a magnetic material and magnetized is provided as a measurement portion 21b on the support plate 221 of the support portion 22b, and between the entire measurement portion 21b long in the Y ′ direction and the sample 9. Magnetic force acts.
- the support plate 221 is connected to the base part 223 via the inclined part 222, and the base part 223 has a vibrating part 25 that vibrates a cantilevered support part 22 b (hereinafter referred to as “cantilever 22 b”).
- the head unit 2b is provided with the LD module 23 and the PSPD 24 similar to the head unit 2 of FIG.
- the cantilever 22b, the vibration unit 25, the LD module 23, and the PSPD 24 are contained in a sealed container 20. Be contained.
- the inside of the container 20 is depressurized, and the Q value of the cantilever 22b is improved.
- the side surface and the upper surface ((+ Z) side surface) of the container 20 are formed of a predetermined magnetic shield material, and coupled with the improvement of the Q value of the cantilever 22b, the influence of noise in the measurement is greatly reduced. Can do.
- the cantilever 22b is excited up and down at the resonance frequency by the piezo of the vibration unit 25.
- the cantilever 22b is irradiated with light from the LD module 23, and the position of the reflected light is detected by the PSPD 24.
- the amount by which the resonance frequency of the cantilever 22b is shifted by the interaction force with the sample 9 is detected by the signal processing unit 53 (see FIG. 2).
- the shift amount of the frequency of the cantilever vibration is derived from the interaction force and is a measurement amount derived from the storage force gradient.
- the measurement value f (x ′, ⁇ ) is acquired by repeating scanning in the vertical direction, and ⁇ (x, y, ⁇ ) that is a magnetic field gradient distribution image is obtained by the same method as the magnetic field acquisition device 1 of FIG. ) Is acquired.
- a magnetic field gradient distribution image is acquired as an intermediate image on a measurement surface that is separated from the measurement surface by a minute distance (step S22).
- a differential image obtained by dividing the difference image between the first image and the intermediate image by the minute distance d is acquired as a second image indicating the differentiation of the magnetic field gradient by z (step S23).
- the first image corresponds to ⁇ (x, y, 0) (ie, ⁇ zz (x, y, 0))
- the second image corresponds to ⁇ z (x, y, 0) (ie, ⁇ zzzz ). (x, y, 0) because it corresponds to), by substituting these images in 3-dimensional potential acquiring equation number by Fourier transform 20, ⁇ zz (x, y , z) and is phi (x , Y, z) is obtained (steps S24, S25).
- Step S26 a value indicating the position of the surface of the sample 9 is substituted into z of ⁇ (x, y, z), thereby obtaining a magnetic field gradient distribution on the surface, and generating a magnetic domain image based on this ( Step S26).
- the measurement value f (x ′, ⁇ ) based on the differentiation of the potential of the magnetic potential twice in the Z direction is acquired by the measurement unit 21b, and ⁇ zz (x, y, z ) (X, y, z) is realized.
- the magnetic field acquisition device 1b is provided with a measurement unit capable of acquiring a measurement value based on the magnetic potential obtained by differentiating the potential of the magnetic potential three times or more in the Z direction and differentiating the potential of the magnetic potential three times or more in the Z direction. May be acquired as ⁇ (x, y, z).
- the potential obtained by differentiating the potential of the magnetic potential at least once with respect to the Z direction is acquired as ⁇ (x, y, z), and an object is obtained as z of ⁇ (x, y, z).
- the potential of the magnetic potential is differentiated once in the Z direction by acquiring the displacement amount of the cantilever 22b by the LD module 23 and the PSPD 24 while scanning the cantilever 22b that is not vibrated.
- Measured value f (x ′, ⁇ ) based on ⁇ (x, y, z) as ⁇ z (x, y, z) may be obtained by the measurement unit 21b (in an MRI apparatus described later) The same).
- measurement of ⁇ z (x, y, 0) is performed by scanning the cantilever 22b that is not vibrated, and measurement of ⁇ zz (x, y, 0) is performed by scanning the cantilever 22b that is vibrated.
- H z (p) (x, y, z) ie, ⁇ zz (x, y, z) may be determined.
- ⁇ zz (x, y, 0) and ⁇ zz (x, y, 0) can be obtained by measurement
- H z (p) (x, y, 0) which is the p-th derivative of the potential H (x, y, z) with respect to z, is acquired in another measurement.
- H z (p) (x, y, 0) are respectively Fourier transformed to obtain h z (q) (k x , k y ) and h z (p) (k x , k y ) (where k x , k y is the wave number of the X and Y directions by obtaining a.) to obtain the number 22 H z (q) (x , y, z), or the number 23 H z (p) (x, y, z) can be obtained by
- the magnetic field acquisition apparatus 1b of FIG. 12 may be used as an MRI apparatus.
- the static magnetic field forming unit 11 and the transmission coil 12 of FIG. 10 are added to the magnetic field acquisition apparatus 1b, and a plurality of positions at a plurality of positions in the Z direction are used.
- Nuclear magnetic resonance sequentially occurs inside the object on the plane of Then, ⁇ (x, y, z, t) that is ⁇ zz (x, y, z, t) is acquired when nuclear magnetic resonance is caused in each plane included in the plurality of planes, Furthermore, a relaxation phenomenon at each position (x, y) on the plane is acquired by substituting a value indicating the position of the plane into z of ⁇ (x, y, z, t). Thereby, a highly accurate MRI image on the inspection target surface of the object can be acquired.
- a measurement unit that can acquire a measurement value based on a differentiation of the potential of the magnetic potential three times or more in the Z direction, and the potential of the magnetic potential is differentiated three or more times in the Z direction. May be acquired as ⁇ (x, y, z, t).
- the magnetic potential obtained by differentiating the potential of the magnetic potential at least once with respect to the Z direction is acquired as ⁇ (x, y, z), thereby accurately performing the inspection using nuclear magnetic resonance. Is realized.
- the three-dimensional potential that is the basis of the two-dimensional potential ⁇ (x, y, ⁇ ) obtained using the two-dimensional potential acquisition formula (that is, ⁇ (x, y, z obtained using the three-dimensional potential acquisition formula). )) Is not limited to the one derived from the potential of the magnetic potential, and a three-dimensional potential distribution derived from the potential of the potential can be easily applied to the two-dimensional potential acquisition method.
- the sample 9 is assumed to have electric charges on the surface.
- a measurement unit 21b is prepared in which the surface is covered with an insulator and the charge is retained in the insulator.
- the displacement amount of the cantilever 22b is acquired by the LD module 23 and the PSPD 24 as measured values while scanning the cantilever 22b that is not vibrated at each angle ⁇ .
- ⁇ (x, y, ⁇ ) indicating a two-dimensional potential distribution, that is, an electrostatic force distribution image indicating the distribution of electrostatic force (its Z direction component) due to the presence of the sample 9 is acquired.
- ⁇ (x, y, z) indicating a three-dimensional potential distribution (where ⁇ (x, y, z) satisfies the Laplace equation)
- the position of the measurement surface in the Z direction is a minute distance.
- a three-dimensional potential indicating electrostatic force is reproduced.
- the value of z indicating the position of the surface of the sample 9 (or the vicinity of the surface) is substituted into the reproduced potential function, and an image indicating the distribution of electrostatic force on the surface of the sample 9 is an image corresponding to the distribution of charges. Desired.
- a potential distribution that accurately reflects the three-dimensional distribution of charges can be obtained without being affected by short-range interaction from a position sufficiently away from the sample 9. For example, when the charge is three-dimensionally distributed in the insulating film, it is possible to identify the position where the charge is trapped from the field where the charge is generated far away.
- the electrostatic force gradient distribution image may be acquired as ⁇ (x, y, ⁇ ) from the shift amount of the vibration frequency of the resonating cantilever 22b.
- ⁇ (x, y, z) which is a three-dimensional distribution of electrostatic force gradients, may be obtained based on two electrostatic force gradient distribution images in which the position in the Z direction of the measurement surface differs by a minute distance.
- the two-dimensional potential and the three-dimensional potential acquisition method can be applied to any three-dimensional potential formed at least around the object due to the presence of the object, and are derived from the potential of the magnetic potential or potential.
- it can be applied to a temperature potential or a potential derived from gravity.
- a measurement unit that can measure an average temperature in a measurement range that is long in one direction (equivalent to an integrated value of the temperature in the measurement range) is disposed in the vicinity of the object. Then, a steady-state heat flow is generated in the object, and the measurement unit is repeatedly scanned while changing the angle ⁇ formed by the reference direction on the measurement surface and the longitudinal direction of the measurement unit in multiple ways.
- ⁇ (x, y, ⁇ ) indicating the temperature distribution on the surface can be acquired. Further, by obtaining the temperature distribution of two measurement surfaces whose positions in the Z direction are different by a minute distance, a three-dimensional temperature distribution ⁇ (x, y, z) in the object is obtained, and the internal structure of the object It is also possible to know.
- An example of a three-dimensional temperature distribution acquisition device 1c capable of such measurement is shown in FIG.
- the 13 includes a measurement unit 21c having a thin film thermocouple.
- the thin film type thermocouple is formed, for example, by sequentially stacking platinum (Pt) and constantan on a substrate.
- a signal from the measurement unit 21c is input to a computer 4 similar to the apparatus in FIG. 2 through an amplifier.
- the computer 4 is indicated by a broken-line rectangle, and functions realized by the computer 4 are shown inside.
- the measurement object 9 c is placed on the sample table 31, and the sample table 31 can be rotated and moved by the rotation mechanism 32 and the horizontal movement mechanism 33. Note that a voltage source 90 is connected to the object 9c, and a steady-state heat flow is generated in the object 9c.
- the measurement unit 21c can be moved in the Z direction by a lifting mechanism (not shown), and the output of the measurement unit 21c is input to the conversion units 610a and 610b via the control unit 62a.
- the conversion units 610a and 610b two-dimensional temperature distributions at two positions in the Z direction are acquired in the same manner as in the apparatus of FIG. Based on the two two-dimensional temperature distributions, a three-dimensional temperature distribution (three-dimensional potential distribution) ⁇ (x, y, z) in the object 9c is acquired.
- the LD module 23 and the PSPD 24 are provided as in the device of FIG.
- the output from the PSPD 24 is a block different from the control unit 62a via the IV converter 51, the signal processing unit 53, and the selector 541 (in FIG. 13, for convenience of illustration, the control unit 62a is connected to the measurement unit 21c. As shown, these blocks are the same controller 62a). Thereby, it is prevented that the measurement part 21c contacts the target object 9c.
- the measurement unit that acquires the measurement value f (x ′, ⁇ ) is realized by the measurement unit, the rotation mechanism, the horizontal movement mechanism, and the computer (or control unit). It may be realized by a configuration.
- FIG. 14 is a bottom view of the element group 210 provided in another measurement unit. As shown in FIG. 14, in the element group 210 in which a large number of thin film elements 21d each serving as a sensor extending in the longitudinal direction are stacked in the film thickness direction, measured values at each position in the X ′ direction at one angle ⁇ are Acquired at the same time.
- the measurement value f (x ′, ⁇ ) is obtained by repeating the measurement by the element group 210 while changing the angle ⁇ in a plurality of ways by rotating the element group 210 or the object around the Z axis.
- the element group 210 measures a plurality of linear regions arranged in the X ′ direction perpendicular to the longitudinal direction and parallel to the measurement surface. The value is acquired at the same time.
- the operation of scanning one measurement unit that is long in the longitudinal direction is performed while arranging a plurality of linear regions in the X ′ direction at one angle ⁇ . This is equivalent to obtaining a measurement value in each of the plurality of linear regions.
- a plurality of linear regions extending in the longitudinal direction parallel to the measurement surface are arranged on the measurement surface in the X ′ direction perpendicular to the longitudinal direction.
- the measurement unit that sets and acquires the measurement values in each of the plurality of linear regions in a state where the angle ⁇ formed by the reference direction and the longitudinal direction is changed in a plurality of ways can be realized in various modes.
- the bottom surface of the measurement unit 21 is sequentially arranged at three heights z1, z2, and z3 in the Z direction. Measurement may then be performed.
- images acquired at heights z1, z2, and z3 are respectively z1 image ⁇ (x, y, z1), z2 image ⁇ (x, y, z2), and z3 image ⁇ (x, y, z3).
- a difference image between the z1 image ⁇ (x, y, z1) and the z2 image ⁇ (x, y, z2) is treated as a magnetic field distribution image
- a difference image from the image ⁇ (x, y, z3) is treated as an auxiliary magnetic field distribution image.
- this method may be employed in the X ′ direction perpendicular to the longitudinal direction and the Z direction.
- a plurality of coils 901 are arranged in a direction perpendicular to the sample 9 as shown in FIG. It is preferable to increase the directivity of the magnetic field in magnetization by arranging (by arranging in multiple stages). Thereby, only a limited range can be magnetized (a magnetically oriented region is prevented from spreading over a wide range), and a preferable measurement can be performed.
- the plate-like sample 9 can be magnetized from both principal surface sides, in addition to the plurality of coils 901 provided on one principal surface side, the two-dot chain line in FIG. As shown, a plurality of similar coils 901 may be provided on the other main surface side to further enhance the directivity of the magnetic field in magnetization.
- the magnetic field distribution image and the magnetic field gradient distribution image are acquired approximately simultaneously, thereby speeding up the measurement of the three-dimensional potential. May be.
- the two-dimensional potential and the three-dimensional potential do not have to be obtained in strict accordance with the above-described two-dimensional potential acquisition formula or the three-dimensional potential acquisition formula, and are obtained by a similar, approximate, or modified operation as appropriate. Good.
- Various well-known techniques may be employed for the Fourier transform and the inverse Fourier transform.
- the measurement units 21, 21 a to 21 c are thin film elements extending in the Y ′ direction and the Z direction, so that the measurement resolution in the scanning direction in the scanning of the measurement units 21, 21 a to 21 c can be improved.
- the measurement resolution of the two-dimensional potential can be improved, but depending on the resolution required for the two-dimensional potential to be measured, the measurement unit extends in parallel with the measurement surface and is relatively thick in the scanning direction. May be used.
- the measurement part 21 of FIG. 2 may move on a measurement surface, and the member which supports the target object 9a of FIG. 10 may move to a horizontal direction with the target object 9a.
- the rotation and movement of the measurement unit with respect to the object on the measurement surface may be relative.
- the measuring units 21, 21a, and 21b are moved in the Z direction by the elevating mechanisms 34 and 34a.
- the movement of the measuring unit in the Z direction relative to the object may be relative to the object.
- An elevating mechanism that moves the Z in the Z direction may be provided as a moving mechanism in the Z direction.
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Abstract
Description
1a 検査装置
1c 温度分布取得装置
4 コンピュータ
9 試料
9a,9c 対象物
11 静磁場形成部
12 送信コイル
21,21a~21c 測定部
32,32a 回動機構
33,33a 水平移動機構
34,34a 昇降機構
61,63 演算部
62,62a 制御部
71 磁場分布画像
72 補助磁場分布画像
81 蒸着源
91,92 測定面
93 (試料の)表面
220 薄膜
221 基板
S11~S14,S21~S25 ステップ
Claims (14)
- 対象物(9,9a,9c)の存在に起因して少なくとも前記対象物の周囲に形成される3次元ポテンシャルを示すポテンシャル関数をφ(x,y,z)(ただし、x,y,zは、前記対象物に対して設定される互いに垂直なX,Y,Z方向にて規定される直交座標系の座標パラメータを示す。)として、前記対象物の外部に設定されたz=α(ただし、αは任意の値)を満たす測定面(91,92)におけるφ(x,y,α)を取得するポテンシャル取得装置(1,1a~1c)であって、
XY平面に平行な前記測定面上において前記測定面に平行な長手方向に伸びる複数の線状領域を、前記長手方向に垂直なX’方向に配列設定するとともに、Y方向に平行な前記測定面上の基準方向と、前記長手方向とがなす角度をθとして、前記角度θを複数通りに変更した状態にて前記複数の線状領域のそれぞれにおける前記3次元ポテンシャルに由来する測定値を取得する測定ユニットと、
X’方向の座標パラメータをx’として(ただし、原点はZ軸上である。)、前記測定ユニットにより取得される測定値f(x’,θ)を用いて、
を備える。 - 請求項1に記載のポテンシャル取得装置であって、
前記測定ユニットが、
前記長手方向に伸びるとともに、前記3次元ポテンシャルに由来する測定値を取得する測定部(21,21a~21c)と、
前記基準方向と、前記測定部の前記長手方向との間の前記角度θを変更する角度変更部(32,32a)と、
前記測定面上において前記測定部をX’方向に前記対象物に対して相対的に移動して、前記対象物の測定領域上を前記測定部が通過する走査を行う移動機構(33,33a)と、
前記角度変更部および前記移動機構を制御することにより、前記角度θを複数通りに変更しつつ前記走査を繰り返す制御部(4,62,62a)と、
を備え、
前記走査の繰り返しにより、前記測定ユニットにおいて測定値f(x’,θ)が取得される。 - 請求項2に記載のポテンシャル取得装置であって、
前記3次元ポテンシャルが、磁位のポテンシャルをZ方向に関して1回以上微分したものであり、
前記測定部が、前記長手方向およびZ方向に広がるとともに、前記3次元ポテンシャルに由来する信号を生成する薄膜素子である。 - 請求項3に記載のポテンシャル取得装置であって、
前記薄膜素子の膜厚が前記対象物側に向かって漸次減少する。 - 請求項2ないし4のいずれかに記載のポテンシャル取得装置であって、
前記測定部をZ方向に前記対象物に対して相対的に移動するもう1つの移動機構(34,34a)をさらに備え、
前記3次元ポテンシャルがラプラス方程式を満たし、
前記制御部が、z=0を満たす前記測定面においてφ(x,y,0)を2次元の第1画像(71)として取得し、前記測定部をZ方向に微小距離だけ相対移動した後、前記第1画像と同様の手法により2次元の中間画像(72)を取得し、
前記演算部が、前記第1画像と前記中間画像との差分画像を求め、前記差分画像を前記微小距離で除算した微分画像を第2画像として取得し、前記第1画像であるφ(x,y,0)および前記第2画像であるφz(x,y,0)をそれぞれフーリエ変換してψ(kx,ky)およびψz(kx,ky)(ただし、kx,kyはX方向およびY方向の波数である。)を求め、さらに、ψ(kx,ky)およびψz(kx,ky)を用いて、
- 請求項1ないし4のいずれかに記載のポテンシャル取得装置であって、
前記3次元ポテンシャルがラプラス方程式を満たし、
z=0を満たす前記測定面における任意のポテンシャルH(x,y,z)のzによるq回微分であるHz (q)(x,y,0)が一の測定において取得されるφ(x,y,α)であり、前記任意のポテンシャルH(x,y,z)のzによるp回微分であるHz (p)(x,y,0)が他の測定において取得されるφ(x,y,α)であり(ただし、p,qは0以上の整数であり、qが奇数、pが偶数である。)、
前記演算部が、Hz (q)(x,y,0)およびHz (p)(x,y,0)をそれぞれフーリエ変換してhz (q)(kx,ky)およびhz (p)(kx,ky)(ただし、kx,kyはX方向およびY方向の波数である。)を求め、さらに、hz (q)(kx,ky)およびhz (p)(kx,ky)を用いて、
- 請求項1ないし6のいずれかに記載のポテンシャル取得装置であって、
前記3次元ポテンシャルが、磁位、電位、温度または重力に由来するポテンシャルである。 - 磁場顕微鏡(1)であって、
磁位のポテンシャルをZ方向に関して1回以上微分したものをφ(x,y,z)として取得する請求項5に記載のポテンシャル取得装置を備え、
前記演算部が、φ(x,y,z)のzに前記対象物の表面の位置または表面に近接する位置を示す値を代入する。 - 核磁気共鳴を利用した検査装置(1a)であって、
磁位のポテンシャルをZ方向に関して1回以上微分したものをφ(x,y,z)として取得する請求項5に記載のポテンシャル取得装置と、
Z方向の複数の位置における複数の平面上にて前記対象物の内部に核磁気共鳴を順次生じさせる手段(11,12)と、
を備え、
前記制御部が、前記複数の平面に含まれる各平面にて核磁気共鳴を生じさせた際に、φ(x,y,z)を取得し、
前記演算部が、前記各平面に対して取得されるφ(x,y,z)のzに前記各平面の位置を示す値を代入する。 - 対象物(9,9a,9c)の存在に起因して少なくとも前記対象物の周囲に形成される3次元ポテンシャルを示すポテンシャル関数をφ(x,y,z)(ただし、x,y,zは、前記対象物に対して設定される互いに垂直なX,Y,Z方向にて規定される直交座標系の座標パラメータを示す。)として、前記対象物の外部に設定されたz=α(ただし、αは任意の値)を満たす測定面(91,92)におけるφ(x,y,α)を取得するポテンシャル取得方法であって、
a)XY平面に平行な前記測定面上において前記測定面に平行な長手方向に伸びる複数の線状領域を、前記長手方向に垂直なX’方向に配列設定するとともに、Y方向に平行な前記測定面上の基準方向と、前記長手方向とがなす角度をθとして、前記角度θを複数通りに変更した状態にて前記複数の線状領域のそれぞれにおける前記3次元ポテンシャルに由来する測定値を取得する工程(S11~S13)と、
b)X’方向の座標パラメータをx’として(ただし、原点はZ軸上である。)、前記a)工程により取得される測定値f(x’,θ)を用いて、
を備える。 - 請求項10に記載のポテンシャル取得方法であって、
前記a)工程が、
a1)前記長手方向に伸びるとともに、前記3次元ポテンシャルに由来する測定値を取得する測定部(21,21a~21c)を、前記測定面上においてX’方向に前記対象物に対して相対的に移動して、前記対象物の測定領域上を前記測定部が通過する走査を行う工程(S11)と、
a2)前記基準方向と、前記測定部の前記長手方向との間の前記角度θを複数通りに変更しつつ、前記a1)工程を繰り返すことにより測定値f(x’,θ)を取得する工程(S12~S13)と、
を備える。 - 請求項11に記載のポテンシャル取得方法であって、
前記3次元ポテンシャルが、磁位のポテンシャルをZ方向に関して1回以上微分したものであり、
前記測定部が、前記長手方向およびZ方向に広がるとともに、前記3次元ポテンシャルに由来する信号を生成する薄膜素子である。 - 請求項11または12に記載のポテンシャル取得方法であって、
前記3次元ポテンシャルがラプラス方程式を満たし、かつ、前記測定面がz=0を満たし、
前記a)およびb)工程によりφ(x,y,0)が2次元の第1画像(71)として取得され、
前記ポテンシャル取得方法が、
c)前記測定部をZ方向に微小距離だけ相対移動した後、前記第1画像と同様の手法により2次元の中間画像(72)を取得する工程(S22)と、
d)前記第1画像と前記中間画像との差分画像を求め、前記差分画像を前記微小距離で除算した微分画像を第2画像として取得する工程(S23)と、
e)前記第1画像であるφ(x,y,0)および前記第2画像であるφz(x,y,0)をそれぞれフーリエ変換してψ(kx,ky)およびψz(kx,ky)(ただし、kx,kyはX方向およびY方向の波数である。)を求める工程(S24)と、
f)ψ(kx,ky)およびψz(kx,ky)を用いて、
を備える。 - 請求項10ないし13のいずれかに記載のポテンシャル取得方法であって、
前記3次元ポテンシャルが、磁位、電位、温度または重力に由来するポテンシャルである。
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