WO2008114697A1 - 試験装置、及び電子デバイス - Google Patents

試験装置、及び電子デバイス Download PDF

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Publication number
WO2008114697A1
WO2008114697A1 PCT/JP2008/054651 JP2008054651W WO2008114697A1 WO 2008114697 A1 WO2008114697 A1 WO 2008114697A1 JP 2008054651 W JP2008054651 W JP 2008054651W WO 2008114697 A1 WO2008114697 A1 WO 2008114697A1
Authority
WO
WIPO (PCT)
Prior art keywords
test
instruction
pattern
series
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/054651
Other languages
English (en)
French (fr)
Inventor
Tatsuya Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP2009505179A priority Critical patent/JPWO2008114697A1/ja
Publication of WO2008114697A1 publication Critical patent/WO2008114697A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56004—Pattern generation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays
    • G11C2029/2602—Concurrent test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

　被試験デバイスを試験する試験装置であって、被試験デバイスを試験するための試験シーケンスを定める試験命令列を記憶するパターンメモリと、試験命令列中における、繰返し実行するべき少なくとも１つの命令を示す繰返し区間が指定されたことに応じて、繰返し区間を格納する区間レジスタと、パターンメモリから読み出された試験命令列をキャッシングする命令キャッシュと、パターンメモリから試験命令列を読み出して、命令キャッシュに書き込むメモリ制御部と、命令キャッシュから試験命令列に含まれる命令を順次読み出して実行し、実行される命令に対応する試験パターンを発生するパターン発生部と、試験パターンに基づく試験信号を生成し、被試験デバイスに供給する信号出力部とを備え、パターン発生部は、区間レジスタに繰返し区間が格納されている場合において、試験命令列における繰返し区間内の命令列を繰返し実行する試験装置を提供する。
PCT/JP2008/054651 2007-03-21 2008-03-13 試験装置、及び電子デバイス Ceased WO2008114697A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009505179A JPWO2008114697A1 (ja) 2007-03-21 2008-03-13 試験装置、及び電子デバイス

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/689,489 US7647538B2 (en) 2007-03-21 2007-03-21 Test apparatus and electronic device for generating test signal by using repeated interval in a test instruction stream
US11/689,489 2007-03-21

Publications (1)

Publication Number Publication Date
WO2008114697A1 true WO2008114697A1 (ja) 2008-09-25

Family

ID=39765806

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/054651 Ceased WO2008114697A1 (ja) 2007-03-21 2008-03-13 試験装置、及び電子デバイス

Country Status (4)

Country Link
US (1) US7647538B2 (ja)
JP (1) JPWO2008114697A1 (ja)
TW (1) TWI386948B (ja)
WO (1) WO2008114697A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010085177A (ja) * 2008-09-30 2010-04-15 Yokogawa Electric Corp 半導体試験装置
JP2014106034A (ja) * 2012-11-26 2014-06-09 Renesas Electronics Corp テスト装置

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008118297A (ja) * 2006-11-01 2008-05-22 Matsushita Electric Ind Co Ltd デジタルビデオデータ検査システム及び半導体装置
CN101727989B (zh) * 2008-10-16 2013-11-27 杭州华澜微科技有限公司 一种nand flash存储芯片测试系统
CN102142284A (zh) * 2010-01-29 2011-08-03 京元电子股份有限公司 可扩充样本储存器的储存器测试设备
US10642709B2 (en) * 2011-04-19 2020-05-05 Microsoft Technology Licensing, Llc Processor cache tracing
JP2014002557A (ja) * 2012-06-18 2014-01-09 Fujitsu Ltd 試験データ生成方法、試験方法、試験データ生成装置、および試験データ生成プログラム
JP6386434B2 (ja) * 2015-10-08 2018-09-05 株式会社アドバンテスト 試験装置、試験信号供給装置、試験方法、およびプログラム
US10242750B2 (en) * 2017-05-31 2019-03-26 Sandisk Technologies Llc High-speed data path testing techniques for non-volatile memory
TWI833399B (zh) * 2022-10-20 2024-02-21 南亞科技股份有限公司 斷層掃描方法以及非暫態電腦可讀取媒體
TWI914676B (zh) 2023-12-04 2026-02-11 點序科技股份有限公司 快閃記憶體檢測裝置及其檢測方法
CN121522418A (zh) * 2025-10-09 2026-02-13 杭州长川科技股份有限公司 多行pattern的结果匹配方法和芯片测试机
CN121522419A (zh) * 2025-10-09 2026-02-13 杭州长川科技股份有限公司 多行pattern的pin结果匹配方法和芯片测试机
CN121559277A (zh) * 2025-10-10 2026-02-24 杭州长川科技股份有限公司 多行pattern的site结果匹配方法和芯片测试机

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0269685A (ja) * 1988-09-06 1990-03-08 Hitachi Ltd Ｉｃ試験装置
JP2002521698A (ja) * 1998-07-30 2002-07-16 クリーダンス システムズ コーポレイション アルゴリズミックパターン発生器

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2796590B2 (ja) * 1991-08-07 1998-09-10 三菱電機株式会社 メモリ装置及びそれを使用したデータ処理装置
JP3550194B2 (ja) 1994-09-22 2004-08-04 株式会社アドバンテスト Ｌｓｉ試験装置用パターン発生器
US5838694A (en) * 1997-04-28 1998-11-17 Credence Systems Corporation Dual source data distribution system for integrated circuit tester
US6092225A (en) * 1999-01-29 2000-07-18 Credence Systems Corporation Algorithmic pattern generator for integrated circuit tester
TWI354886B (en) * 2004-02-03 2011-12-21 Nextest Systems Corp Method for testing and programming memory devices
US7454681B2 (en) * 2004-11-22 2008-11-18 Teradyne, Inc. Automatic test system with synchronized instruments

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0269685A (ja) * 1988-09-06 1990-03-08 Hitachi Ltd Ｉｃ試験装置
JP2002521698A (ja) * 1998-07-30 2002-07-16 クリーダンス システムズ コーポレイション アルゴリズミックパターン発生器

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010085177A (ja) * 2008-09-30 2010-04-15 Yokogawa Electric Corp 半導体試験装置
JP2014106034A (ja) * 2012-11-26 2014-06-09 Renesas Electronics Corp テスト装置

Also Published As

Publication number Publication date
US20080235549A1 (en) 2008-09-25
TWI386948B (zh) 2013-02-21
US7647538B2 (en) 2010-01-12
JPWO2008114697A1 (ja) 2010-07-01
TW200845024A (en) 2008-11-16

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