WO2008111403A1 - 粒子状物質検出装置 - Google Patents

粒子状物質検出装置 Download PDF

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Publication number
WO2008111403A1
WO2008111403A1 PCT/JP2008/053539 JP2008053539W WO2008111403A1 WO 2008111403 A1 WO2008111403 A1 WO 2008111403A1 JP 2008053539 W JP2008053539 W JP 2008053539W WO 2008111403 A1 WO2008111403 A1 WO 2008111403A1
Authority
WO
WIPO (PCT)
Prior art keywords
section
particulate material
cavity
detecting apparatus
particle charging
Prior art date
Application number
PCT/JP2008/053539
Other languages
English (en)
French (fr)
Inventor
Atsuo Kondou
Takeshi Sakuma
Yasumasa Fujioka
Original Assignee
Ngk Insulators, Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ngk Insulators, Ltd. filed Critical Ngk Insulators, Ltd.
Priority to EP08712110.9A priority Critical patent/EP2120043A4/en
Priority to JP2009503962A priority patent/JP5068307B2/ja
Publication of WO2008111403A1 publication Critical patent/WO2008111403A1/ja
Priority to US12/542,805 priority patent/US7846241B2/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G01N15/0656—Investigating concentration of particle suspensions using electric, e.g. electrostatic methods or magnetic methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/60—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrostatic variables, e.g. electrographic flaw testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M15/00—Testing of engines
    • G01M15/04—Testing internal-combustion engines
    • G01M15/10—Testing internal-combustion engines by monitoring exhaust gases or combustion flame
    • G01M15/102—Testing internal-combustion engines by monitoring exhaust gases or combustion flame by monitoring exhaust gases

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Dispersion Chemistry (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

　内部を貫通する空洞（キャビティ）２を有する検出装置本体１を備え、キャビティ２が、その一方の端部（流入側端部）６側から順に、流入側端部６からキャビティ内に流入した粒子状物質を荷電することが可能な粒子荷電部３、粒子荷電部３で荷電された粒子状物質を捕集し、粒子状物質量を測定することが可能な集塵部４、及び、粒子荷電部３で荷電された粒子状物質をキャビティ２の他方の端部（流出側端部）７側に向かって移動させることが可能なイオン風発生部５を有する粒子状物質検出装置１００。小型で測定誤差が小さく、安価に製造することが可能な粒子状物質検出装置を提供する。
PCT/JP2008/053539 2007-03-15 2008-02-28 粒子状物質検出装置 WO2008111403A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP08712110.9A EP2120043A4 (en) 2007-03-15 2008-02-28 PARTICULAR MATERIAL PROVIDING DEVICE
JP2009503962A JP5068307B2 (ja) 2007-03-15 2008-02-28 粒子状物質検出装置
US12/542,805 US7846241B2 (en) 2007-03-15 2009-08-18 Particulate material detecting apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007066675 2007-03-15
JP2007-066675 2007-03-15

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/542,805 Continuation US7846241B2 (en) 2007-03-15 2009-08-18 Particulate material detecting apparatus

Publications (1)

Publication Number Publication Date
WO2008111403A1 true WO2008111403A1 (ja) 2008-09-18

Family

ID=39759346

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/053539 WO2008111403A1 (ja) 2007-03-15 2008-02-28 粒子状物質検出装置

Country Status (5)

Country Link
US (1) US7846241B2 (ja)
EP (1) EP2120043A4 (ja)
JP (1) JP5068307B2 (ja)
KR (1) KR20100014456A (ja)
WO (1) WO2008111403A1 (ja)

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010032488A (ja) * 2008-07-04 2010-02-12 Ngk Insulators Ltd 粒子状物質検出装置
JP2010078428A (ja) * 2008-09-25 2010-04-08 Ngk Insulators Ltd 粒子状物質検出装置及びその製造方法
WO2010060905A1 (de) * 2008-11-26 2010-06-03 Eads Deutschland Gmbh Vorrichtung zur sammlung von stark elektronenaffinen partikeln
JP2010151613A (ja) * 2008-12-25 2010-07-08 Toshiba Corp エアロゾル検出器
EP2221598A1 (en) * 2009-02-16 2010-08-25 Honda Motor Co., Ltd. Particulate matter detection device
JP2010210539A (ja) * 2009-03-12 2010-09-24 Ngk Insulators Ltd 粒子状物質検出装置
JP2010210534A (ja) * 2009-03-12 2010-09-24 Ngk Insulators Ltd 粒子状物質検出装置
JP2010210535A (ja) * 2009-03-12 2010-09-24 Ngk Insulators Ltd 粒子状物質検出装置
JP2010210533A (ja) * 2009-03-12 2010-09-24 Ngk Insulators Ltd 粒子状物質検出装置
JP2010210536A (ja) * 2009-03-12 2010-09-24 Ngk Insulators Ltd 粒子状物質検出装置
JP2010210538A (ja) * 2009-03-12 2010-09-24 Ngk Insulators Ltd 粒子状物質検出装置
JP2012058015A (ja) * 2010-09-07 2012-03-22 Ngk Insulators Ltd 粒子状物質検出装置
JP2012510051A (ja) * 2008-11-25 2012-04-26 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 浮遊粒子を感知するセンサ
JP2016114367A (ja) * 2014-12-11 2016-06-23 日野自動車株式会社 粒子センサ
JPWO2015146456A1 (ja) * 2014-03-26 2017-04-13 日本碍子株式会社 微粒子の個数計測器及び微粒子の個数計測方法
WO2018139346A1 (ja) * 2017-01-26 2018-08-02 日本碍子株式会社 微粒子数検出器
WO2018139345A1 (ja) * 2017-01-26 2018-08-02 日本碍子株式会社 微粒子数検出器
WO2018163467A1 (ja) * 2017-03-10 2018-09-13 日本碍子株式会社 微粒子検出素子及び微粒子検出器
JP6420525B1 (ja) * 2017-09-06 2018-11-07 日本碍子株式会社 微粒子検出素子及び微粒子検出器
WO2020090438A1 (ja) * 2018-10-31 2020-05-07 日本碍子株式会社 微粒子検出器

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8794048B2 (en) * 2009-04-07 2014-08-05 Horiba, Ltd. System for determining number of particles
JP5542006B2 (ja) * 2010-08-26 2014-07-09 日本碍子株式会社 粒子状物質検出装置
EP3705871A1 (de) 2019-03-08 2020-09-09 Heraeus Nexensos GmbH Sensor oder sensorelement, sensorsystem, verfahren zur herstellung und verwendung
CN110307988B (zh) * 2019-07-04 2021-03-23 江铃汽车股份有限公司 一种汽油颗粒捕捉器标定开发在线优化方法

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JPS58137744A (ja) * 1982-02-01 1983-08-16 カジヤ−ニ・オ−ワイ 不完全燃焼灰中の残炭量測定方法と装置
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Cited By (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010032488A (ja) * 2008-07-04 2010-02-12 Ngk Insulators Ltd 粒子状物質検出装置
EP2169381A3 (en) * 2008-09-25 2014-05-21 NGK Insulators, Ltd. Particulate matter detection device and method for manufacturing the same
JP2010078428A (ja) * 2008-09-25 2010-04-08 Ngk Insulators Ltd 粒子状物質検出装置及びその製造方法
KR101747666B1 (ko) * 2008-11-25 2017-06-15 코닌클리케 필립스 엔.브이. 공중 부유 입자들을 감지하기 위한 센서
JP2012510051A (ja) * 2008-11-25 2012-04-26 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 浮遊粒子を感知するセンサ
WO2010060905A1 (de) * 2008-11-26 2010-06-03 Eads Deutschland Gmbh Vorrichtung zur sammlung von stark elektronenaffinen partikeln
US8852325B2 (en) 2008-11-26 2014-10-07 Eads Deutschland Gmbh Device for collecting particles that have a strong electron affinity
JP2010151613A (ja) * 2008-12-25 2010-07-08 Toshiba Corp エアロゾル検出器
US8382884B2 (en) 2009-02-16 2013-02-26 Honda Motor Co., Ltd. Particulate matter detection device
EP2221598A1 (en) * 2009-02-16 2010-08-25 Honda Motor Co., Ltd. Particulate matter detection device
JP2010210536A (ja) * 2009-03-12 2010-09-24 Ngk Insulators Ltd 粒子状物質検出装置
JP2010210538A (ja) * 2009-03-12 2010-09-24 Ngk Insulators Ltd 粒子状物質検出装置
JP2010210533A (ja) * 2009-03-12 2010-09-24 Ngk Insulators Ltd 粒子状物質検出装置
JP2010210535A (ja) * 2009-03-12 2010-09-24 Ngk Insulators Ltd 粒子状物質検出装置
JP2010210534A (ja) * 2009-03-12 2010-09-24 Ngk Insulators Ltd 粒子状物質検出装置
JP2010210539A (ja) * 2009-03-12 2010-09-24 Ngk Insulators Ltd 粒子状物質検出装置
JP2012058015A (ja) * 2010-09-07 2012-03-22 Ngk Insulators Ltd 粒子状物質検出装置
JPWO2015146456A1 (ja) * 2014-03-26 2017-04-13 日本碍子株式会社 微粒子の個数計測器及び微粒子の個数計測方法
US10488316B2 (en) 2014-03-26 2019-11-26 Ngk Insulators, Ltd. Fine-particle number measurement device and fine-particle number measurement method
JP2016114367A (ja) * 2014-12-11 2016-06-23 日野自動車株式会社 粒子センサ
WO2018139346A1 (ja) * 2017-01-26 2018-08-02 日本碍子株式会社 微粒子数検出器
WO2018139345A1 (ja) * 2017-01-26 2018-08-02 日本碍子株式会社 微粒子数検出器
WO2018163467A1 (ja) * 2017-03-10 2018-09-13 日本碍子株式会社 微粒子検出素子及び微粒子検出器
JP6420525B1 (ja) * 2017-09-06 2018-11-07 日本碍子株式会社 微粒子検出素子及び微粒子検出器
WO2019049236A1 (ja) * 2017-09-06 2019-03-14 日本碍子株式会社 微粒子検出素子及び微粒子検出器
WO2020090438A1 (ja) * 2018-10-31 2020-05-07 日本碍子株式会社 微粒子検出器

Also Published As

Publication number Publication date
KR20100014456A (ko) 2010-02-10
US7846241B2 (en) 2010-12-07
EP2120043A1 (en) 2009-11-18
US20090308251A1 (en) 2009-12-17
JP5068307B2 (ja) 2012-11-07
JPWO2008111403A1 (ja) 2010-06-24
EP2120043A4 (en) 2014-05-14

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