WO2007119636A1 - プローブシートの製造方法 - Google Patents
プローブシートの製造方法 Download PDFInfo
- Publication number
- WO2007119636A1 WO2007119636A1 PCT/JP2007/057358 JP2007057358W WO2007119636A1 WO 2007119636 A1 WO2007119636 A1 WO 2007119636A1 JP 2007057358 W JP2007057358 W JP 2007057358W WO 2007119636 A1 WO2007119636 A1 WO 2007119636A1
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- WO
- WIPO (PCT)
- Prior art keywords
- base
- probe sheet
- synthetic resin
- layer
- metal material
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06727—Cantilever beams
Definitions
- the present invention relates to a method for manufacturing a probe sheet suitable for use in an energization test of a flat object such as an integrated circuit or a display device substrate.
- a flexible insulating synthetic resin film and a probe sheet main body having a conductive path supported by the synthetic resin film and protruding from one surface of the probe sheet main body.
- a probe sheet including a plurality of contacts formed and connected to the conductive path is used between a tester body and an object to be inspected (for example, see Patent Document 1).
- Each contact of the probe sheet is connected to an electric circuit of the tester body through a conductive path of the probe sheet body.
- the probe sheet is applied to the test object so that the needle tip of each contact comes into contact with the corresponding electrode of the test object.
- the test object is connected to the tester body by electrical contact with the probe sheet.
- each contactor is formed from the distal end serving as the needle tip toward the proximal end serving as the connection end to the probe sheet main body (for example, Patent Documents 2 to 4) After each contact is formed, each contact is coupled to the probe sheet body such that each proximal end is connected to a corresponding conductive path in the probe sheet body.
- Patent Document 1 Japanese Patent Laid-Open No. 2 0 0 2-3 4 0 9 3 2
- Patent Document 2 Japanese Patent Laid-Open No. 2 0 0 3-4 3 0 6 4
- Patent Document 3 Japanese Unexamined Patent Application Publication No. 2 0 0 3-2 2 7 8 4 9
- Patent Document 4 Special Table 2 0 0 2— 5 0 9 6 0 4
- an object of the present invention is to provide a probe sheet that can arrange the needle tip at an accurate predetermined position without performing a troublesome position adjustment operation of the #F tip in the operation of joining each contactor and the probe sheet main body. It is to provide a manufacturing method.
- the present invention basically includes a probe sheet main body having a flexible insulating synthetic resin film, a conductive path supported by the synthetic resin film, and protruding from one surface of the probe sheet main body.
- a method of manufacturing a probe sheet including a plurality of contacts connected to a conductive path, and using a photolithographic technique on a base, a metal material for the plurality of contacts from each needle tip A plurality of contacts are formed on the base by sequentially depositing them toward the base, and a probe sheet body coupled at the base of each of the contacts held on the front base is mounted on the base. And forming the contactor integrally with the probe sheet main body from the base.
- the plurality of contacts formed at predetermined positions on the base are not individually separated, and these needle tips are placed at predetermined positions on the base.
- a probe sheet main body coupled to the base of each contact is formed on the base.
- the contact point of each contact is held at a predetermined position.
- the probe sheet body is integrally coupled with the probe sheet body during the process of forming the probe sheet body.
- the contact is integrated with the probe sheet main body and separated from the base.
- the method for producing a probe sheet according to the present invention includes a flexible insulating synthetic resin film, a probe sheet main body having a conductive path supported by the synthetic resin film, and the probe sheet main body.
- a method of manufacturing a probe sheet comprising a plurality of contacts that protrude from one surface and are connected to the conductive path, on a base on which a recess for a needle tip of the contact is formed, Photoresist technology is used to form a photoresist that imitates each of the needle tips and the arm portion connected to the needle tip, and a metal material is deposited in a recess imitated by the photoresist to form the contact
- the flexi A second step of forming a resin synthetic resin layer, a third step of forming an opening reaching the arm portion through the flexible synthetic resin layer and the sacrificial layer, and depositing a metal material in the opening.
- the contact is separated from the base integrally with the probe sheet main body.
- a typical example of the synthetic resin film or the flexible synthetic resin layer is polyimide.
- a synthetic resin film called dry film can be used as the sacrificial layer.
- a stainless steel plate can be used for the base.
- Nickel or an alloy thereof can be used as the metal material for the contact.
- the nickel layer and the copper layer can be sequentially stacked on the nickel layer.
- the copper layer functions to facilitate peeling of the arm portion from the base.
- the nickel layer serves to promote the growth of copper on the base. It is desirable to deposit the metal material for forming the arm portion on the base via both layers.
- the deposition of the metal material and the stacking of the nickel layer and the copper layer for the arm portion can be performed by a plating method, respectively, and the arm portion is an electric device that is one of the plating methods. This can be done by law (electro-forming).
- a metal material harder than the metal material of the arm part is deposited in the recess of the base.
- a metal material for the arm portion can be deposited over the metal material.
- a so-called dovetail joint structure can be applied to the joint between the needle tip portion and the arm portion formed thereafter. Therefore, a strong bond is obtained by both.
- the hard metal material rhodium or palladium cobalt alloy can be used, and the metal material can be deposited by a plating method.
- the third step is performed by irradiating the first flexible synthetic resin layer and the sacrificial layer with laser light in a state where the upper surface of the arm portion under the sacrificial layer is protected by a protective film. it can.
- a copper plating layer can be used, and the copper plating layer can be formed on the upper surface of the arm member prior to the second step.
- the height of the sacrificial layer is exceeded and the first flex
- the same material as the metal material of the arm member is deposited in the opening at a height position not exceeding the sibling synthetic resin layer, and then the same material as the metal material for the conductive path is deposited on the base. It can be deposited in the opening within the thickness dimension of the synthetic resin layer.
- the base of the contact is formed by depositing the same material as the metal material of the arm member into the opening.
- connection boundary between the base part of the contact and the conductive path made of a metal different from the metal constituting the base part is formed. It can be positioned substantially in the first flexible synthetic resin, and the connection boundary between both metals can be protected by the first flexible resin.
- a first conductive material for the conductive path a second conductive material having higher toughness than the first conductive material, and the first conductive material on the first flexible synthetic resin layer
- the conductive materials can be sequentially stacked.
- the conductive path can have a three-layer structure, and the strength against breakage of the conductive path can be increased.
- the first conductive material can be copper, and the second conductive material can be nickel or an alloy thereof. These can be sequentially deposited on the first flexible resin by the plating method.
- a reinforcing plate that covers an upper region of the contact can be fixed onto the first flexible synthetic resin layer and the conductive path via an adhesive sheet.
- a second flexible synthetic resin layer covering the conductive path formed on the first flexible synthetic resin layer can be formed.
- the conductive path is positioned between the second and first flexible resin synthetic resin layers, so that the conductive path is formed in the synthetic resin film composed of both flexible synthetic resin layers. Can be embedded in
- a sacrificial layer is formed on the second flexible synthetic resin layer, An opening reaching the conductive path through the sacrificial layer on the second flexible synthetic resin layer and the second flexible synthetic resin layer can be formed, and a metal material can be deposited in the opening. By depositing the metal material, bumps for the conductive paths can be formed.
- the surface of the bump can be polished so as to coincide with the surface of the sacrificial layer on the second flexible synthetic resin layer, whereby the probe sheet and the probe sheet are connected, for example Each electrical connection to the rigid wiring board can be made reliably.
- the probe sheet main body can be peeled off integrally with the contact from the base, and then the sacrificial layers remaining on the probe sheet can be removed.
- the probe sheet main body is changed from the formation of the needle tip by adjusting the outer shape of the probe sheet main body formed by embedding the conductive path in the first and second flexible synthetic resin layers.
- a series of processes from finishing the outer shape to completing the probe sheet can be performed as an integrated operation.
- the plurality of contacts formed at the predetermined positions on the base are not separated individually, but the needle tips are held at the predetermined positions on the base.
- a probe sheet main body coupled to the base of each contact is formed on the base, and then the contact is separated from the base integrally with the probe sheet main body. Therefore, it is not necessary to connect the individual contacts to the probe sheet body as in the prior art.
- the troublesome adjustment of the needle tip position of the contactor associated with this conventional joining operation is not required. As a result, it is possible to easily manufacture a probe sheet in which the needle tips of the respective contacts are arranged exactly on the same plane at a predetermined position as compared with the related art.
- FIG. 1 is an exploded perspective view showing a probe assembly in which a flexible wiring board according to the present invention is incorporated.
- FIG. 2 is a longitudinal sectional view of the probe assembly shown in FIG.
- FIG. 3 is an enlarged bottom view showing a part of the probe sheet of the probe assembly shown in FIG.
- FIG. 4 is a longitudinal sectional view showing a state before the probe sheet and the support block shown in FIG. 1 are joined.
- FIG. 5 is a partially enlarged longitudinal sectional view showing a state where the probe sheet and the support block shown in FIG. 4 are coupled.
- FIG. 6 is a process explanatory view (No. 1) showing a manufacturing process of the probe sheet according to the present invention.
- FIG. 7 is a process explanatory diagram (No. 2) showing a process for manufacturing a probe sheet according to the present invention.
- FIG. 8 is a process explanatory view (No. 3) showing the manufacturing process of the probe sheet according to the present invention.
- FIG. 9 is a process explanatory view (No. 4) showing a manufacturing process of the probe sheet according to the present invention.
- FIG. 10 is a process explanatory view (No. 5) showing a process for manufacturing a probe sheet according to the present invention.
- FIG. 11 is a plan view of a probe sheet according to the present invention.
- FIG. 12 is a perspective view of the probe tip of the probe according to the present invention as viewed from the distal end side.
- FIG. 13 is a sectional view taken along line XIII-XIII shown in FIG.
- FIG. 1 which is an exploded view of the probe assembly 10 according to the present invention
- a rigid wiring board 12 and a block 16 which is elastically supported by the rigid wiring board via a spring member 14.
- the flexible wiring board 18 according to the present invention is used as the probe sheet main body of the probe sheet 20.
- the rigid wiring board 12 is composed of, for example, a plate-like electrical insulating base material made of epoxy resin containing glass fiber and a wiring path on the base material. Have.
- the wiring path of the rigid wiring board 12 is connected to an electric circuit of a tester main body (not shown).
- a circular rigid wiring board having a circular opening 12 a at the center is used for the rigid wiring board 12.
- the spring member 14 is made of a flat spring material, and has an annular support portion 14 a having an outer diameter smaller than the diameter of the circular opening 12 2 a of the rigid wiring board 12, and the inside of the annular support portion. And a cross-shaped main body 1 4 b to be arranged.
- stainless steel is connected via a port 2 2 that is screwed to the rigid wiring board 12 at a portion that does not interfere with the wiring path.
- a circular support plate 24 made of metal is fixed. The support plate 24 supports the rigid wiring board 12 and reinforces the rigid wiring board.
- the spring member 14 is held in the circular opening 1 2 a via an annular mounting plate 26 holding the annular support portion 14 a from both sides and a plurality of holding plates 2 8 combined in an annular shape. Is done.
- the mounting plate 26 is coupled to the lower surface of the support plate 24 at the port 30, and each presser plate 28 is connected to the support portion of the presser plate and the spring member 14. 1 4 It is connected to the mounting plate 2 6 with a bolt 3 2 that passes through a and is screwed to the mounting plate 2 6.
- the spring member 14 is held across the opening in the circular opening 12a.
- a parallel adjusting screw member 3 4 for adjusting the holding posture of the spring member 14 with the bolt 30 loosened is in contact with the top surface of the mounting plate 26. It can be screwed onto the support plate 24.
- the aforementioned block 16 is fixed to the main body portion 14 b of the spring member 14 held in the circular opening 12 a of the rigid wiring board 12.
- the block 16 includes a stem portion 16 a having a rectangular cross section and a support portion 16 b having a regular octagonal cross section continuous to the lower end of the stem portion.
- the support portion 16 b has a pedestal portion 36 having a constant diameter along its axis, and a bottom portion 38 having a cross-sectional shape similar to the cross-sectional shape connected to the pedestal portion.
- the bottom portion 3 8 gradually decreases the lateral dimension, that is, the diameter across the axis of the support portion 16 b toward the lower end.
- the block 16 has a tapered surface 40 at its bottom portion 38, and in the illustrated example, eight flat tapered surfaces 40 (see FIG. 3) are formed.
- the block 16 is connected to the main body portion 1 4 b of the spring member 1 4 at the top surface of the stem portion 1 6 a with the bottom portion 3 8 of the pedestal portion 3 6 facing downward.
- the fixing plate 4 2 that clamps the main body 14 b together with the stem 16 a is connected to the stem 16 a by the screw member 4 4 that is screwed to the stem 16 a. It is fixed.
- the flexible wiring board 18 of the probe sheet 20, that is, the probe sheet main body 18, has an octagonal portion 4 formed at the center portion corresponding to the bottom portion 3 8 of the block 16. 6 and a contact region 50 is formed at the center of the octagonal portion, in which a large number of probes 48 are arranged by aligning their gold + tips 48a.
- the contact region 50 is formed in a rectangular shape.
- the probe sheet 20 has a number of probes 4 8 protruding from the contact region 50 of the probe sheet main body 1 8, the needle tips 4 8 a of the octagonal portion 4 facing downward.
- the outer edge of the probe sheet 20 is coupled to the rigid wiring board 12 so that the portion extending outward from the octagonal portion 46 has a slight slack.
- the elastic rubber ring 5 2 is arranged along the outer edge of the probe sheet 20, and the ring metal fitting 5 4 covering the elastic rubber ring 5 2 Is placed.
- the outer edge of the probe sheet 20 and the two members 5 2 and 5 4 are positioned relative to the rigid wiring board 12 by positioning pins 5 6.
- the outer edge portion of the probe sheet 20 is coupled to the rigid wiring board 12 2 by tightening the screw member 5 8 passing through the probe sheet 20 and both members 5 2 and 54 to the rigid wiring board 12.
- the conductive path 18 a of the probe sheet 20 is electrically connected to the corresponding wiring path of the rigid wiring board 12, as in the past. Is done.
- the alignment pin 60 is disposed through the long hole 60 a (see FIG. 3) provided in the probe sheet 20. At the lower end of the alignment bin 60, an alignment mark 60b that can be photographed from the camera supported by the table is provided.
- a table that supports the object to be inspected (illustrated)
- the relative position information of the probe assembly 10 with respect to the probe assembly 10 is obtained, and based on this position information, the probe tips 4 8a of the probes 48 of the probe assembly 10 are on the table.
- the relative position of the probe assembly 10 with respect to the support table is adjusted so as to accurately contact the corresponding electrodes of the object to be inspected. Thereafter, the probe tip 48a of each probe 48 is electrically contacted with the corresponding electrode, whereby the current-inspection of the object to be inspected in the tester body is performed.
- the structure of the probe sheet 20 will be described in detail with reference to FIG.
- the probe sheet 20 includes a pair of flexible electrically insulating synthetic resin films 6 2 and 6 4 such as polyimide resin, for example, and a conductive path 18 a is embedded between the two resin films. Yes.
- the conductive path 18 a includes a first conductive material layer 66 made of a metal material having high conductivity suitable for use as an electric wire, for example, copper, and the like.
- a laminated structure having a metal material having higher toughness than the first conductive material layer for example, a second conductive material layer 68 formed of a metal material such as nickel or nickel phosphorus alloy.
- a three-layer sandwich structure in which a single second conductive material layer 68 is sandwiched between a pair of first conductive material layers 66 is employed.
- the toughness of the two types of metals is that up to the point where the two metals have the same shape and the same dimensions, for example, when each stress-strain diagram is obtained by an impact test, the two metals will break. It can be compared by the area surrounded by the stress-strain curve. When copper and nickel are compared, the area surrounded by the stress-strain curve obtained with Nickel is larger than that obtained with copper. Therefore, it can be said that Eckel is a material that is less susceptible to fracture than copper, that is, has a high toughness.
- Both the first conductive material layers 66 are deposited to a thickness of 10 m, for example, and the second conductive material layer 68 is deposited to a thickness of 2 ⁇ , for example.
- 8a has, for example, a thickness dimension of approximately 2 2 ⁇ .
- Each conductive path 18a protrudes from one electrically insulating synthetic resin film 62.
- the base of the outgoing probe 48 is connected.
- a flat plate-like reinforcing plate 70 made of, for example, a ceramic plate having a size and shape substantially equal to the probe region. Is embedded between the two electrically insulating synthetic resin films 62 and 64 so as to partially cover the conductive path 18a.
- the reinforcing plate 70 ′ can be fixed between the two electrically insulating synthetic resin films 62 and 64 via an adhesive sheet 72 such as a synthetic resin sheet. Since the reinforcing plate 70 has higher rigidity than the electrically insulating synthetic resin films 62 and 64, it suppresses deformation due to external force in the region corresponding to the reinforcing plate 70 of the probe sheet main body 18. Make.
- the reinforcing plate 70 made of a ceramic plate is not easily deformed by expansion and contraction due to heat in addition to the deformation of the prop sheet main body 18 due to the external force described above. Control.
- the reinforcing plate 70 is between the synthetic resin films 6 2 and 6 4 with respect to the conductive path 18 a on the side opposite to the side where the connecting portion between the conductive path and the probe 48 as a contact is provided. It is in place. With this arrangement, a single plate-like member 70 is reinforced to cover the entire contact area 50 without performing any special shape processing to avoid interference with each probe 48, that is, the contact 48. A plate 70 can be placed.
- the other electric circuit forming the back surface of the probe sheet main body 18 is formed.
- the insulating synthetic resin film 64 is provided with a convex portion 74 corresponding to the reinforcing plate 70.
- such a convex shape corresponding to the reinforcing plate 70 is not formed on the electrically insulating synthetic resin film 62 that forms the surface of the probe sheet main body 18.
- a flat rectangular support surface 7 6 corresponding to the contact region 50 is formed on the lower surface of the bottom 1 8 of the block 1 6 that receives the back surface of the probe sheet body 1 8. Yes.
- the support surface 7 6 is formed at the central portion of the bottom portion 3 8, and the central portion It is formed to protrude downward from the stepped portion by an octagonal flat stepped portion 78.
- the tapered surface 40 continues to the support surface 76 via the stepped portion 78 between the tapered surface and the support surface 76.
- a rectangular central recess 80 for receiving the adhesive 80 a opens downward on the support surface 76 formed so as to protrude downward from the flat stepped portion 78.
- the central recess 80 has a planar shape slightly smaller than the contact region 50. Due to the formation of the central recess 80, an annular flat support surface portion 7 6a surrounding the central recess 80 is left on the support surface 76.
- the support surface portion 7 6 a is appropriately sized to receive the edge of the reinforcing plate 70, and the support surface portion 7 6 a has an annular groove 8 2 surrounding the recess 80. Is formed.
- the adhesive 80 a is supplied to the central recess 80.
- the same adhesive is also supplied to the stepped portion 78 surrounding the support surface 76.
- the probe sheet 2 After supplying the adhesive to the block 16, as shown in FIG. 4, the probe sheet 2 is arranged so that the outer edge portion of the convex portion 74 of the probe sheet main body 18 faces the support surface portion 76 a. The relative position of 0 and block 16 is determined. In this state, as shown in FIG. 5, the probe sheet main body 18 is pressed toward the lower surface of the bottom portion 38 of the block 16.
- the convex portion 74 of the probe sheet main body 18 disappears, and conversely, the probe sheet main body 18 is deformed into a concave shape so that the back surface thereof is along the stepped portion 8 and the support surface 76.
- the probe sheet main body 18 is fixed to the support surface 76 and the step portion 78 which are the bottom surfaces of the bottom portion 38 (excluding the tapered surface 40).
- the probe sheet main body 18 when the back surface of the probe sheet main body 18 is deformed so as to be along the stepped portion 78 and the support surface 76, the probe sheet main body 18 is deformed as a whole in its thickness direction. At this time, a strong shear stress acts on the conductive path 18 a due to the step between the support surface and the step portion 78 in a region corresponding to the outer edge of the support surface 76.
- the conductive path 1 8 a is reinforced by the second conductive material layer 6 8 exhibiting high V and toughness. 8 a will not break.
- the second conductive material Due to the reinforcing action of the layer 68, the conductive path 18a can be reliably prevented from being broken even in the manufacturing process of the probe sheet 20 as described later.
- the excess amount of the adhesive 80 supplied to the recess 80 is obtained when the probe sheet main body 18 receives the pressing force described above. Since it is accommodated in the annular groove 8 2, this excess does not protrude beyond the support surface portion 7 6 a into the stepped portion 7 8.
- the protrusion 7 4 disappears at the same time, and at the same time the step 7 8 and the support surface 7 6 have a level difference between the reinforcing plates 7.
- the sum of the thicknesses of 0 appears as a step difference ⁇ on the surface of the probe sheet body 18.
- the contact region 50 of the probe sheet main body 18 protrudes downward with a step ⁇ H from the peripheral portion.
- this step ⁇ it is possible to increase the distance between the outer portion of the contact region 50 of the probe sheet main body 18 and the test subject. This increase in the spacing more reliably prevents the outer part of the contact region 50 of the probe sheet body 18 from interfering with the object to be inspected, thereby further preventing contamination and damage of the object under test due to the interference between the two. Make sure to prevent it. Even when the reinforcing plate 70 is not required, a step ⁇ corresponding to the protrusion of the support surface 76 can be obtained by protruding the support surface 76 from the peripheral portion thereof.
- the probe sheet 20 when the probe sheet 20 is manufactured, no matter how the probe tip 48a of the probe 48 is prepared, if the contactor area 50 is deformed by external force or stretched by heat during its handling, The aligned postures of the probes 48 are disturbed, and as a result, the alignment of the needle tips 48a is disturbed.
- the probe sheet body 18 is fixed to the support surface 76 in a state in which the contact area 50 is bent during adhesion to the block 16 and this stagnation is left, similarly, the needle tip 4 8 Disturbance occurs in the alignment of a.
- the reinforcing plate 7 corresponding to the contact region 5 0 of the probe sheet body 1 8 By embedding 0 in the probe sheet main body 18, it is possible to reliably prevent the deformation as described above in the contact region 50 of the probe sheet main body. Thereby, it is possible to prevent the posture of each probe, that is, the contact 48, from being disturbed due to the deformation of the contact region 50, and to reliably prevent the needle 48 of the contact 48 from being disturbed. Can do. Therefore, the probe assembly 10 can be easily handled, and the probe assembly 10 having a high positional accuracy of the needle tip 48 a can be provided. —
- a metal plate such as a stainless steel plate is used as the base 100 as shown in FIG. Recesses for 4 to 8 needle tips 1 0 2 are formed. Although a single recess 10 2 is shown in the drawing, as is clear from the above description, it depends on the number of probes 48 formed in the contact region 50 described above. A plurality of recesses 102 are formed at predetermined needle tip intervals.
- the metal 10 6 for the needle tip 48 8 a is deposited, for example, by electric plating in the recess 10 2 and its vicinity (FIG. 6 (c)).
- a hard metal such as rhodium or palladium-cobalt alloy is used as the metal material of the needle tip 48a.
- the pattern mask 104 is removed (FIG. 6 (d)).
- the sacrificial layer to be removed after the probe sheet 20 is completed by the photolithography technique described above.
- the pattern mask 1 0 8 is made of photoresist.
- the nickel layer 110 is formed by, for example, a plating method. It is deposited on the area exposed from the pattern mask 108 on the base 100. Subsequently, a copper layer 1 1 2 is similarly deposited on the nickel layer 1 10 by a plating method.
- a metal material for forming the arm portion 48b which is the main body of the probe 48, is then deposited.
- the copper layer 112 is formed by the deposition of the metal material. It works to facilitate peeling from the base 100. Further, since it is difficult to directly deposit the copper layer 112 on the base 100, the copper layer 112 is deposited via the Luckenore layer 110.
- the pattern mask 108 is removed (FIG. 6 (g)). After that, a pattern mask 1 14 for the arm part connected to f fe48 a of the probe 48 is formed of the same photoresist as described above (FIG. 6).
- the metal material for the arm portion of the probe 48 is made of the metal for the needle tip 48 a by, for example, a plating method such as electric hole forming. And deposited on the sacrificial layers 1 10, 1 12. As a result, the arm portion 48b is formed integrally with the needle tip 48a made of the metal 106 (FIG. 6 (i)).
- a nickel phosphorus alloy is used as the metal material of the arm portion 48b.
- a copper layer 116 that acts as a protective film in a process to be described later is deposited on the arm portion 48b by, for example, a plating method (FIG. (J)). After the formation of the copper layer 1 16, the pattern mask 1 14 is removed (FIG. 6 (k)).
- a second sacrificial layer that becomes the reference surface of the probe sheet main body 18 is formed.
- the pattern mask 118 which is made of a photoresist that selectively covers the arm portion 48b on which the needle tip 48a on the base 100 is formed, is described above. It is formed by the same photoresist technology (Fig. 7 (a)).
- a metal material for the second sacrificial layer 120 is deposited (FIG. 7 (b)). Nickel is used for the second sacrificial layer 120 and can be deposited by a plating method.
- a pattern mask 118 covering the arm portion 48b is formed. It is removed (Fig. 7 (c)). After that, a resist mask made of photoresist for partially removing the copper layer 1 1 6 on the arm part 4 8 b 1 2 2 force copper layer 1 1 6 It is formed on the entire base 100 (Fig. 7 (d)).
- the second sacrificial layer 1 .2 0 0 and the arm portion 4 8 b serving as the reference surface of the probe sheet main body 1 8 are exposed on the base 1 1.
- a dry film 1 2 4 which is a third sacrificial layer, a resin layer 1 2 6 for the first electrically insulating synthetic resin film 6 2 of the probe sheet body 1 8 and a protective film comprising a resist 1 2 8 are sequentially formed (FIG. 7 (g)).
- the protective film 1 2 8 protecting the resin layer 1 2 6, that is, the surface of the electrically insulating synthetic resin film 6 2, for example, using a laser beam
- the copper layer 1 1 6 on the arm portion 4 8 b is reached. Openings 1 3 0 are formed (FIG. 7 (h)).
- the lower end of the opening 1 30 is the end located on the opposite side of the needle tip 4 8 a of the arm portion 4 8 b and opens onto the copper layer 1 16.
- the copper layer 1 1 6 covers the upper surface of the arm portion 48 b to protect the arm portion from laser light.
- the ⁇ ! Layer 1 1 6 in the opening 1 3 0 is removed by etching, and the arm portion 4 8 b is exposed in the opening 1 3 0 (FIG. 7 (i)).
- a nickel layer 1 3 2 for forming the base portion 4 8 c of the probe 4 8 is integrally deposited on the arm portion 4 8 b by the mesh method.
- the thickness of the nickel layer 1 3 2 in the opening 1 3 0 is the thickness of the dry film or third sacrificial layer 1 2 4 Exceeds the dimensions, but does not exceed the sum of the thickness dimensions of the sacrificial layer and the resin layer 1 2 6. Therefore, the upper surface of the nickel layer 1 3 2 is located in the thickness region of the resin layer 1 2 6 for the electrically insulating synthetic resin film 6 2.
- a copper layer 1 3 4 is integrally deposited on the upper surface of the nickel layer 1 3 2 by a plating method. Therefore, the dissimilar metal joining region of the two metals 1 3 2 and 1 3 4 exists within the thickness range of the resin layer 1 26, that is, the electrically insulating synthetic resin film 62. As a result, the dissimilar metal joining region is protected by the electrically insulating synthetic resin film 62.
- the copper layer 1 3 4 has a thickness dimension such that its upper surface substantially matches the upper surface of the resin layer 1 2 6. After the deposition of the copper layer 1 3 4, the protective film 1 2 8 is removed (FIG. 7 (k)).
- the conductive path 1 8 a is grown on the resin layer 1 2 6 and the copper layer 1 3 4 exposed by removing the protective film 1 2 8 by sputtering.
- a copper layer 1 3 6 having a thickness dimension of 0.3 m is formed.
- a pattern mask 1 3 8 simulating a wiring path region including the upper part of the copper layer 1 3 4 is formed of a photoresist by a photolithography technique.
- the exposed area from the pattern mask 1 3 8 includes a 10 ⁇ m thick ⁇ layer 6 6 for the conductive path 1 8 a, 2 Aim thick nickel layer 6 8 and 10 ⁇ m
- a copper layer 66 having a thickness dimension of ⁇ is sequentially deposited, for example, by a plating method (FIG. 8 (c);).
- the conductive path 1 8 a is formed by the deposition of the copper layer 6 6, the nickel layer 6 8, and the copper layer 6 6, the pattern mask 1 3 8 is removed (FIG. 8 (d)).
- the portion of the copper layer 1 3 6 that protrudes from the conductive path 18 a is removed by etching (FIG. 8 (e)).
- the conductive path 18 a having excellent strength against breakage can be formed.
- an adhesive sheet 72 made of a synthetic resin material is adhered onto the conductive path 18a, and a ceramic plate 70 covering the contactor region 50 is disposed on the sheet. Further, after a similar adhesive sheet 72 is arranged covering the ceramic plate 70, as shown in FIG. 8 (g), the polyimide resin layer covering the other and forming the other electrically insulating synthetic resin film 64 is formed. 140 is deposited.
- a pressing force F acts on the polyimide resin layer.
- Part of this pressing force F is a portion indicated by reference numeral 142 at the edge of the base 48 c of the probe 48 formed by the deposition of the nickel layer 132 and the ⁇ ! Layer 134 and acts as a shearing force of the conductive path 18 a.
- the conductive path 18a reinforced by the second conductive material layer 68 is not damaged by this shearing force.
- a dry film 144 is adhered on the polyimide resin layer as a fourth sacrificial layer (FIG. 9 (a)).
- FIG. 9B an opening 146 opened on the conductive path 18a is formed by the laser light through the fourth sacrificial layer 144 and the polyimide resin layer 140 which is the lower layer.
- a metal material for pads or bumps 148 is deposited by plating. For example, nickel can be deposited as the metal material of the bump 148.
- the bump 148 is polished so that the portion protruding from the surface of the fourth sacrificial layer 144 is flat (FIG. 9 (d)), and this flat surface has the wiring path of the rigid wiring board 12 described above.
- a gold layer 150 for making good electrical contact is formed by, for example, a plating method.
- the probe sheet main body 18 is removed from the base 100 together with the second sacrificial layer 120 and the fourth sacrificial layer 144 as shown in FIG. 10 (a). At this time, even if a part of the peeling force acts as a bending force on the contact region 50 of the probe sheet body 18 via the probe 48, the reinforcing plate 70 embedded in the contact region 50 Deformation is suppressed. Therefore, it is possible to prevent a deviation in the posture of each probe 48 and the needle tip 48 a due to this peeling.
- the contour of the probe sheet main body 18 is adjusted by cutting with a laser cage or a cutter, and at a position where it does not interfere with the conductive path 18 a of the probe sheet main body 18.
- An opening 5 6 a for receiving the positioning pin 5 6 and an elongated hole 60 0 a for receiving the alignment pin 60 are formed, respectively, and a prop assembly 10 is formed.
- the arm portion 48 b and the base portion 48 c are sequentially formed from the needle tip 48 a of the probe 48 requiring extremely high accuracy. Formed on the platform 100.
- the probe sheet main body 18 coupled to the probe 48 is integrally formed with the probe 48 in a state where each probe 48 is held on the base 100.
- this probe that is, the contacts 48 8 need not be individually joined to the probe sheet main body 18, and the adjustment of the needle tip 4 8 a position of the contacts 48 is not required.
- the probe sheet 20 in which the needle tips 48a of the child 48 are accurately arranged at predetermined positions can be easily manufactured as compared with the conventional case.
- a series of steps from the formation of the needle tip 48 a to the completion of the probe sheet 20 by adjusting the outer shape of the probe sheet main body 18 can be efficiently performed by integrated work.
- the needle tip 4 8 a and the arm portion 4 8 b of the contact 48 prior to depositing the metal material for the arm portion 48 b on the base 100. It is possible to deposit a metal material harder than the metal material of the arm portion 48 b in the recess 100 of the base 100. After the hard metal material is deposited, the arm portion is covered with the metal material. By depositing the metal material for 4 8 b, the needle tip 4 8 a of each contact 4 8 can be formed of the hard metal material, so that the needle tip 4 8 a of each contact 4 8 a The durability of each contact 48 can be improved by increasing the wear resistance.
- the needle tip 48 a can be formed using photolithography technology.
- the pattern mask 10 4 is formed on both edges of the metal 1 0 6 formed by the metal 106.
- a skirt part 48 d that increases the width dimension toward the end face is formed.
- the arm portion 4 8 b is formed by depositing a metal material so as to cover the skirt portion 4 8 d, a so-called dovetail connection is formed at the joint portion between the needle tip 4 8 a and the arm portion 4 8 b. The As a result, a strong bond can be obtained between the two 4 8 b and 4 8 d.
- the arm portion 4 8 b is located at a height position that exceeds the height position of the sacrificial layer made of the dry film 1 2 4 and does not exceed the first flexible synthetic resin layer 1 2 6.
- Material is deposited in openings 1 3 0 for base 4 8 c.
- copper of the same material as the metal material for the conductive path 18 a is deposited on the base 48 b in the opening 1 30 within the thickness dimension of the first flexible synthetic resin layer 1 26.
- the connection boundary between the base portion 4 8 c of the contact 48 and the conductive path 18 a made of a metal material different from the base portion substantially falls within the first flexible synthetic resin 1 2 6 (6 2). Therefore, the connection boundary between the two metals can be protected with the first flexible resin 1 2 6 (6 2).
- the first conductive material layer 6 6 for the conductive path 1 8 a on the first flexible synthetic resin layer 1 2 6 (6 2), the first The second conductive material layer 68 having higher toughness than the first conductive material layer and the first conductive material layer 66 can be secondarily laminated.
- the conductive path 18 a can have a three-layer structure, and the strength against breakage of the conductive path 18 a can be increased.
- the reinforcing plate 70 covering the upper region of the contact 48 is attached to the first flexible synthetic resin layer 1 2 6 via the adhesive sheet 72. (6 2) and can be fixed on the conductive path 18 a. Placement of reinforcing plate 70
- the step of forming the probe sheet 20 when the contact 48 of the probe sheet main body 18 is peeled from the base 100, or the block 16 of the probe sheet 20 or rigid wiring
- deformation due to external force or deformation due to thermal expansion / contraction of the contact area 50 where each contact 48 is provided can be suppressed.
- the displacement of the needle tip position of the contact is suppressed.
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/297,216 US8202684B2 (en) | 2006-04-14 | 2007-03-27 | Method for manufacturing probe sheet |
CN2007800133020A CN101421630B (zh) | 2006-04-14 | 2007-03-27 | 探针片的制造方法 |
DE112007000936.5T DE112007000936B4 (de) | 2006-04-14 | 2007-03-27 | Verfahren zur Herstellung einer Sondenlamelle |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006-111814 | 2006-04-14 | ||
JP2006111814A JP4841298B2 (ja) | 2006-04-14 | 2006-04-14 | プローブシートの製造方法 |
Publications (1)
Publication Number | Publication Date |
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WO2007119636A1 true WO2007119636A1 (ja) | 2007-10-25 |
Family
ID=38609400
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/057358 WO2007119636A1 (ja) | 2006-04-14 | 2007-03-27 | プローブシートの製造方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US8202684B2 (ja) |
JP (1) | JP4841298B2 (ja) |
KR (1) | KR100986994B1 (ja) |
CN (1) | CN101421630B (ja) |
DE (1) | DE112007000936B4 (ja) |
TW (1) | TW200745558A (ja) |
WO (1) | WO2007119636A1 (ja) |
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US7800001B2 (en) | 2006-04-14 | 2010-09-21 | Kabushiki Kaisha Nihon Micronics | Probe sheet and electrical connecting apparatus |
US7934944B2 (en) | 2006-04-07 | 2011-05-03 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus |
US7934945B2 (en) | 2006-09-28 | 2011-05-03 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus |
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JP2011089891A (ja) * | 2009-10-22 | 2011-05-06 | Micronics Japan Co Ltd | 電気的接続装置及びこれを用いる試験装置 |
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JP2013130400A (ja) * | 2011-12-20 | 2013-07-04 | Micronics Japan Co Ltd | プローブ組立体及びこれを含むプローブカード並びにこれらの製造方法 |
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JP5847663B2 (ja) * | 2012-08-01 | 2016-01-27 | 日本電子材料株式会社 | プローブカード用ガイド板の製造方法 |
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US9435855B2 (en) | 2013-11-19 | 2016-09-06 | Teradyne, Inc. | Interconnect for transmitting signals between a device and a tester |
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US9977052B2 (en) | 2016-10-04 | 2018-05-22 | Teradyne, Inc. | Test fixture |
JP2019149420A (ja) * | 2018-02-26 | 2019-09-05 | 富士通株式会社 | 基板 |
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US11828775B1 (en) | 2020-05-13 | 2023-11-28 | Microfabrica Inc. | Vertical probe arrays and improved methods for making using temporary or permanent alignment structures for setting or maintaining probe-to-probe relationships |
US11363746B2 (en) | 2019-09-06 | 2022-06-14 | Teradyne, Inc. | EMI shielding for a signal trace |
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- 2007-03-27 CN CN2007800133020A patent/CN101421630B/zh active Active
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US7934945B2 (en) | 2006-09-28 | 2011-05-03 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus |
Also Published As
Publication number | Publication date |
---|---|
DE112007000936B4 (de) | 2014-02-13 |
TWI322267B (ja) | 2010-03-21 |
US8202684B2 (en) | 2012-06-19 |
JP4841298B2 (ja) | 2011-12-21 |
US20110159444A1 (en) | 2011-06-30 |
CN101421630A (zh) | 2009-04-29 |
KR20080107461A (ko) | 2008-12-10 |
TW200745558A (en) | 2007-12-16 |
KR100986994B1 (ko) | 2010-10-11 |
CN101421630B (zh) | 2011-06-08 |
JP2007285802A (ja) | 2007-11-01 |
DE112007000936T5 (de) | 2009-02-19 |
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