WO2007099641A1 - Board structure for product board, product board manufacturing method, and electronic apparatus - Google Patents

Board structure for product board, product board manufacturing method, and electronic apparatus Download PDF

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Publication number
WO2007099641A1
WO2007099641A1 PCT/JP2006/304140 JP2006304140W WO2007099641A1 WO 2007099641 A1 WO2007099641 A1 WO 2007099641A1 JP 2006304140 W JP2006304140 W JP 2006304140W WO 2007099641 A1 WO2007099641 A1 WO 2007099641A1
Authority
WO
WIPO (PCT)
Prior art keywords
substrate
base material
discarded
product
electronic component
Prior art date
Application number
PCT/JP2006/304140
Other languages
French (fr)
Japanese (ja)
Inventor
Norihito Tukahara
Kiyoshi Nakanishi
Yoshikuni Fujihashi
Original Assignee
Matsushita Electric Industrial Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co., Ltd. filed Critical Matsushita Electric Industrial Co., Ltd.
Priority to PCT/JP2006/304140 priority Critical patent/WO2007099641A1/en
Priority to JP2008502627A priority patent/JP5075114B2/en
Publication of WO2007099641A1 publication Critical patent/WO2007099641A1/en

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0044Mechanical working of the substrate, e.g. drilling or punching
    • H05K3/0052Depaneling, i.e. dividing a panel into circuit boards; Working of the edges of circuit boards
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0097Processing two or more printed circuits simultaneously, e.g. made from a common substrate, or temporarily stacked circuit boards
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0271Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/01Tools for processing; Objects used during processing
    • H05K2203/0147Carriers and holders
    • H05K2203/0169Using a temporary frame during processing
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components

Definitions

  • Substrate structure for product substrate manufacturing method for product substrate, and electronic equipment
  • the present invention relates to a substrate structure for a product substrate in which each electronic component is mounted on a base material portion through a reflow process, a manufacturing method for the product substrate, and an electronic device.
  • a substrate structure for a product substrate for manufacturing a product substrate in which an electronic component is mounted on the substrate is known (for example, Patent Document 1).
  • a circuit pattern is formed by etching an original substrate (hard substrate) of a predetermined size on which copper foil as a conductor layer is laminated, and then a resist is formed on the entire surface of the original substrate. After the circuit pattern is covered by laminating the layers, the base material portion on which the circuit pattern is formed is arranged in a lattice shape via the connecting portions by performing drilling at a predetermined location. A frame-like discarded substrate portion is formed around the periphery. The discarded substrate portion is formed with a laminated portion in which a resist layer is laminated on a copper foil as a conductor layer.
  • each electronic component is mounted on a circuit pattern and then mounted through a reflow process, and then the connecting portion is divided and discarded.
  • a product substrate is obtained by removing.
  • Patent Document 1 Japanese Patent Laid-Open No. 2005-347711
  • the strength of the soft substrate (the strength to maintain a flat shape) is lower than the strength of the conventional hard substrate, and the linear expansion coefficient of the soft substrate
  • the linear expansion coefficient of the resist layer is much larger than that of the resist layer, so that the resist layer in the discarded substrate part extends along the surface direction in the reflow process, and the soft base material in the discarded substrate part follows the extension of the resist layer. Curved and deformed.
  • the conductor layer in the laminated portion of the discarded substrate portion has a relatively small linear expansion coefficient, it follows the elongation of the resist layer and maintains the stretched state of the resist layer even when the temperature is lowered after the reflow process.
  • each base material is also curved and deformed following such deformation of the discarded substrate portion, the entire substrate structure for the product substrate is warped, and the dimensional accuracy of the product substrate cannot be maintained.
  • the present invention has been made to solve the above-mentioned disadvantages, and its purpose is to reduce the dimensional accuracy of the base material portion that becomes the product substrate by suppressing the warpage that occurs in the adjacent discarded substrate portion. It is an object to provide a substrate structure for a product substrate, a manufacturing method for the product substrate, and an electronic device that can be improved.
  • the substrate structure for a product substrate provides the base material by etching a conductor layer laminated on an insulating plate in order to manufacture a product substrate in which an electronic component is mounted on the base material.
  • a base plate portion formed adjacent to the base portion, and a connecting portion formed between the base portion and the base plate portion.
  • Each electronic component is mounted on the circuit pattern and then mounted through a reflow process, and then the discarded substrate portion is removed by dividing the connecting portion. It is a substrate structure, and the warp dimension along the thickness direction per 10 mm along the surface direction of the substrate portion generated after the reflow process is 0.5 mm or less, so that the base material portion and the discarded substrate portion are formed.
  • the linear expansion coefficient difference is within a certain range
  • the conductor layer on the discarded substrate portion does not form a resist layer, the structure, or the material and thickness of the conductor layer or resist layer in the discarded substrate portion.
  • examples thereof include a structure for appropriately selecting a planar shape and the like, and a structure for forming a slit in the discarded substrate portion.
  • the difference in linear expansion coefficient between the base material part and the discarded substrate part so that the warpage dimension along the thickness direction per 10 mm along the surface direction of the base material part generated after the reflow process is 0.5 mm or less. Is configured to be within a certain range.
  • the warpage of the discarded substrate portion is less than a certain value, and the warpage of the base material portion that follows the discarded substrate portion is also less than a certain value.
  • the present invention provides a base material portion that becomes the base material by etching a conductor layer laminated on an insulating plate in order to manufacture a product substrate in which an electronic component is mounted on the base material, Each of the electrons with respect to a circuit pattern formed on the base material portion, and having a discarded substrate portion formed adjacent to the base material portion, and a base portion and a connecting portion formed between the waste substrate portions.
  • a layered portion in which a layer and a resist layer covering the conductor layer are stacked is provided on the discarded substrate portion! / Cunning! It is characterized by that.
  • the present invention includes a structure in which only the conductor layer is formed on the discarded substrate portion, or a structure in which only the resist layer is formed on the discarded substrate portion.
  • a model number, a manufacturing time, a lot number, and the like may be displayed on the discarded substrate portion.
  • letters, numbers, and symbols may be formed by laminating a conductor layer and a resist layer in the manufacturing process of the product substrate, but this is not a laminated portion defined in the present invention.
  • these letters, numbers, symbols, etc. are not the dominant factors for the warpage generated in the substrate structure for manufacturing the product substrate by the reflow process, even if the conductor layer and the resist layer are laminated. ,.
  • the linear expansion coefficient can be reduced as compared with the conventional discarded substrate portion.
  • the warp of the base material part generated following the part is also below a certain level.
  • the present invention provides a base material portion that becomes the base material by etching a conductor layer laminated on an insulating plate in order to manufacture a product substrate in which an electronic component is mounted on the base material, A circuit board pattern formed on the base material part, the circuit board having a waste board part formed adjacent to the base material part, and a connecting part formed between the base material part and the waste board part.
  • Each electric A substrate structure for manufacturing a product substrate in which each electronic component is mounted through a reflow process after placing a child component and then the discarded substrate portion is removed by dividing the connecting portion.
  • a slit is formed in the discarded substrate portion along the arrangement direction of the base material portion and the discarded substrate portion.
  • a slit is formed in the discarded substrate portion along the arrangement direction of the base material portion and the discarded substrate portion.
  • the warping of the discarded substrate part is divided by the slit, and the warp generated in the entire area of the discarded substrate part does not spread to the base material part as before.
  • the present invention is characterized in that a resist layer is formed at predetermined intervals on the discarded substrate portion.
  • the retainability of the discarded substrate portion is improved when the resist layer is supported on the jig via the adhesive surface.
  • the manufacturing method of the product substrate of the present invention includes the steps of etching the conductor layer laminated on the insulating plate in order to manufacture a plurality of product substrates having electronic parts mounted on a base material.
  • a plurality of base material portions to be a base material are formed along the same surface, a frame-shaped discard substrate portion is formed so as to surround each of the base material portions, and each of the base material portions and the discard substrate portion is formed
  • a substrate for a product substrate in which a connecting portion is formed is manufactured in advance, and each electronic component is placed on the circuit pattern formed on the base material portion and then passed through a reflow process.
  • a method of manufacturing a product substrate wherein the discarded substrate portion is removed by mounting and then separating each of the connecting portions, and a frame portion corresponding to the discarded substrate portion and a frame portion provided in the frame portion,
  • the product substrate on a jig having a lattice portion corresponding to the portion Characterized by placing the substrate.
  • the deformation of the substrate portion is regulated by placing the substrate for the product substrate on the jig, the deformation of the substrate portion is less likely to occur, and Since the connecting portion is sandwiched between the portions, the deformation of the base material portion is indirectly suppressed.
  • the product substrate manufacturing method of the present invention is characterized in that the substrate for the product substrate is sandwiched in the thickness direction by using a pair of the jigs.
  • the electronic device of the present invention is characterized in that a product substrate obtained by the above-described substrate structure for a product substrate is used.
  • circuit modules in which product boards are connected to other circuit boards in a hierarchy or along the same plane, etc. Is also included.
  • FIG. 1 is a perspective view showing a product substrate according to the present invention.
  • FIG. 2 (A) is a perspective view showing a substrate structure for a product substrate according to the present invention (first embodiment), and FIG. 2 (B) is a diagram of the substrate structure for a product substrate according to the first embodiment. It is sectional drawing which shows a base material part.
  • FIG. 3 is a perspective view showing a jig used in the manufacturing method for a product substrate according to the first embodiment.
  • FIG. 4 is a perspective view showing a modified example of the substrate structure for a product substrate according to the first embodiment.
  • FIG. 5 is a perspective view showing a substrate structure for a product substrate (second embodiment) according to the present invention.
  • FIG. 6 is a perspective view showing a modified example of the substrate structure for a product substrate according to the second embodiment.
  • FIG. 7 is a perspective view showing a substrate structure for a product substrate (third embodiment) according to the present invention.
  • FIG. 8 is a perspective view showing a substrate structure for a product substrate (fourth embodiment) according to the present invention. Explanation of symbols
  • Substrate structure for product substrate (substrate for product substrate)
  • the product substrate 10 is housed in a case 12 and used in, for example, a memory card 11.
  • the memory card 11 is used as a recording medium by being inserted into the slot hole 14 of the portable terminal 13 or the like.
  • the product substrate 10 is obtained by mounting an electronic component 22 on a base material 21 manufactured from the substrate structure 20 (see FIG. 2) for the product substrate of the first embodiment.
  • the substrate structure 20 for a product substrate of the first embodiment includes a product substrate 10 in which an electronic component 22 is mounted on a base material 21 shown in FIG.
  • the conductive layer 26 laminated on the insulating soft base material 25 is etched to form the circuit pattern 24A on the base material portion 24 to be the base material 21 and to be formed adjacent to the base material portion 24.
  • the connecting portion 28 is provided by performing an oval drilling (punching) process at a predetermined position between the substrate portions 27.
  • the substrate structure 20 for the product substrate has a large number of base material portions 27 arranged in a latticed manner via the connecting portions 28, and a frame-like discarded substrate portion 27 is formed on the peripheral portion.
  • Each electronic component 22 (see FIG. 1) is placed on the circuit pattern 24A formed on 24, and each electronic component 22 is mounted through a force reflow process. The plate part 27 is removed.
  • This substrate structure 20 for manufacturing a product substrate is formed by removing the conductor layer 26 from the discarded substrate portion 27 in the etching process and masking the discarded substrate portion 27 in the resist layer forming process.
  • 27 is not provided with a laminated portion in which a conductor layer and a resist layer are laminated, and one resist layer 29 is formed on the discarded substrate portion 27 at a predetermined interval.
  • the laminated portion having a large linear expansion coefficient is provided from the discarded substrate portion 27, most of the discarded substrate portion 27 can be made only of the soft base material 25. As a result, the discarded board part compared to the conventional case
  • the linear expansion coefficient as 27 can be reduced, and the warpage of the base material portion 24 caused by following the discarded substrate portion 27 is also below a certain level.
  • the base material portion 24 and the discarded substrate portion 2 are formed so that the warp dimension along the thickness direction per 10 mm along the surface direction of the substrate portion 24 generated after the reflow process is 0.5 mm or less.
  • the linear expansion coefficient difference of 7 is within a certain range.
  • the warpage of the discarded substrate portion 27 becomes less than a certain value, and the warpage of the base material portion 24 generated following the discarded substrate portion 27 becomes less than a certain value.
  • the force described in the example in which the resist layer 29 is formed on the front surface 27A of the discarded substrate portion 27 is not limited to this.
  • the resist layer 29 is formed on the rear surface of the discarded substrate portion 27. It is also possible to form partly on both the front surface 27A and the back surface.
  • the jig 30 shown in FIG. 3 is provided in the outer peripheral portion 31 and corresponds to the discarding substrate portion 27 and the frame portion 32 corresponding to the discarded substrate portion 27, and the connecting portion 28 provided in the frame portion 32. And a grid portion 33 to be used.
  • the outer peripheral portion 31 is a portion having a substantially rectangular frame shape and a thickness dimension T1.
  • the frame portion 32 is formed in a rectangular frame shape so as to correspond to the discarded substrate portion 27, and is a portion having a thickness dimension T2.
  • the lattice portion 33 is formed in a lattice shape so as to correspond to each connecting portion 28 by forming a plurality of rectangular openings 34 in the frame portion 32, and is a portion having a thickness dimension T2.
  • the relationship between the thickness dimension T1 and the thickness dimension T2 is TKT2.
  • the frame portion 32 and the lattice portion 33 are formed so that the surfaces 32A and 33A are flush with each other.
  • Each of the surfaces 32A and 33A protrudes from the surface 31A of the outer peripheral portion 31 by a dimension (T2-T1).
  • a pair of jigs 30 are prepared, and the surfaces 32A and 33A of one jig 30 and the surfaces 32A and 33A of the other jig 30 face each other, and the surfaces 32A and 33A of one jig 30
  • the substrate structure 20 for the product substrate is sandwiched between the surfaces 32A and 33A of the other jig 30.
  • the substrate portion 27 is sandwiched between the surface 32A of one jig 30 and the surface 32A of the other jig 30.
  • connecting portion 28 is sandwiched between the surface 33A of one jig 30 and the surface 33A of the other jig 30.
  • the pair of jigs 30 and the substrate structure 20 for the product substrate are carried into a reflow furnace.
  • soldering is performed, and the electronic component 22 (see Fig. 1) is mounted on the base member 24.
  • a plurality of base material portions 24 to be the base materials 21 are formed along the same surface, and a frame shape is formed so as to surround each base material portion 24.
  • the substrate 20 for a product substrate in which the discarded substrate portion 27 is formed and the connecting portion 28 is formed between each base material portion 24 and the discarded substrate portion 27 is manufactured.
  • each electronic component 22 is placed on the circuit pattern 24A formed on the base material portion 24, and then the reflow process is performed. Then, each electronic component 22 is mounted.
  • the substrate 20 for the product substrate is mounted on a jig 30 having a frame portion 32 corresponding to the discarded substrate portion 27 and a lattice portion 33 provided in the frame portion 32 and corresponding to each connecting portion 28. Put. At this time, the substrate portion 27 is discarded against the adhesive layer provided on the surface 32A of the jig 30. The resist layer 29 adheres, thereby fixing the substrate 20 for the product substrate.
  • the product substrate 20 is sandwiched in the thickness direction.
  • the substrate 20 for the product substrate is removed from each jig 30, and the discarded substrate portions 27 are removed by dividing the connecting portions 28, and the connecting portions 28 between the base materials 21 are removed.
  • the process of manufacturing a plurality of product substrates 10 each having the electronic component 22 mounted on the base material 21 is completed.
  • the deformation of the discarded substrate part 27 can be reliably regulated by the frame part 32 of the jig 30, and the lattice part 3 Since the connecting portion 28 is sandwiched by 3, the deformation of the base material portion 24 is indirectly suppressed.
  • the substrate structure 20 for the product substrate of the first embodiment has the force described in the example in which the resist layer 29 is formed one by one at a predetermined interval on the discarded substrate portion 27. As shown in FIG. It is possible to form a plurality of resist layers 29 (five as an example) at predetermined intervals.
  • the resist layers 29 are preferably arranged in a staggered manner. This is because a large number of resist layers 29 can be formed in a relatively small area.
  • the retainability of the discarded substrate portion 27 is further improved when supported by the jig 30 (see FIG. 3) via the adhesive surface.
  • the substrate structure 40 for the product substrate of the second embodiment is discarded in the base material portion 24.
  • a substrate part 41 is provided directly, and a plurality of slits 42 are formed at predetermined intervals in the substrate part 41 along the arrangement direction of the base material part 24 and the discarded substrate part 41. This is the same as the embodiment.
  • the discarded substrate portion 41 is formed with one copper foil 29A as a conductor layer at a predetermined interval.
  • the warpage of the discarded substrate portion 41 is divided by the slit 42, and the warpage generated in the entire area of the discarded substrate portion 41 is propagated to the base material portion 24 as in the past. do not do.
  • the positions where the slits 42 are formed, the number of the slits 42, and the shape of the slits 42 can be arbitrarily determined.
  • the substrate structure 40 for a product substrate of the second embodiment by forming the slits 42 in the substrate part 41, it is not necessary to remove the conductor layer 26 from the discarded substrate part 41.
  • the same effect as the substrate structure 20 for a product substrate of the first embodiment can be obtained.
  • the substrate structure 40 for the product substrate according to the second embodiment has the force described in the example in which the resist 29A is formed one by one at a predetermined interval on the discarded substrate portion 41. As shown in FIG. It is possible to form a plurality of resists 29A (as an example, five) at intervals.
  • the resists 29A are arranged in a staggered manner. This is because a large number of resists 29A can be formed in a relatively small area.
  • the retainability of the discarded substrate portion 41 is further improved when supported by the jig 30 (see FIG. 3) via the adhesive surface.
  • the substrate structure 50 for the product substrate of the third embodiment is obtained by removing the discarded substrate portion 27 from the substrate structure 20 for the product substrate of the first embodiment. This is the same as the embodiment.
  • the warp of the base material portion 24 can be suppressed to a certain level or less. That is, according to the substrate structure 50 for a product substrate of the third embodiment, the same effect as the substrate structure 20 for a product substrate of the first embodiment can be obtained.
  • the substrate structure 60 for product substrates of the fourth embodiment is obtained by connecting the discarded substrate portions 41 in the substrate structure 40 for product substrates of the second embodiment by bridge portions 61.
  • each discarded substrate portion 41 is independent, each discarded substrate portion 41 is individually separated when each base material portion 24 is divided.
  • the discarded substrate portions 41 are connected by the bridge portions 61, when each base material portion 24 is divided, the discarded substrate portions 41 are disposed in an integrated state. As a result, it is possible to simplify the mechanical structure for discarding each discarded substrate portion 41, and to achieve an effect of efficiently performing the disposal work.
  • the processing of adsorption and disposal becomes efficient.
  • a substrate structure for a plurality of types of product substrates having different configurations of the discarded substrate portion is manufactured, the maximum warpage dimension in the substrate structure for the product substrate is measured, and the laminated portion is disposed on the discarded substrate portion.
  • Table 1 will be used to explain the comparison with the maximum warpage dimension in the conventional example provided with.
  • the linear expansion coefficient of the original base material is 12 ppm
  • the linear expansion coefficient of the conductor layer (copper foil) is 16 ppm
  • the linear expansion coefficient of the resist layer is 60 to 70 ppm. is there.
  • Examples 1 to 4 are 73. Omm in length and 55. Omm in width
  • the outer dimensions in Conventional Example 1 are 74.8 mm in height and 95. Omm in width.
  • the maximum warpage dimension was determined by placing the substrate structure for the product substrate on a surface plate so that the back surface was in contact, and measuring the maximum separation distance of the part lifted from the surface plate to determine the maximum warpage size.
  • the surface mounting for mounting the electronic component on the surface uses the jig according to the present invention described above, the maximum warp dimension in the case, and the jig.
  • the maximum warpage dimension was measured.
  • Example 1 to Example 4 are compared to Conventional Example 1 where the overall judgment is E because the discarded substrate part is not provided with a laminated part or a slit is provided.
  • the maximum warpage dimension is drastically reduced, the configuration according to the present invention is discarded, the warpage of the substrate portion is suppressed, the warpage of the product substrate can be reduced, and comprehensive judgments A to D are obtained.
  • Example 4 since the slit is provided in the discarded substrate portion, even if the laminated portion is provided in the discarded substrate portion, the warp generated in the discarded substrate portion is divided and does not affect the base material portion. As a result, a dramatic improvement was observed compared to Conventional Example 1, and Examples 1 to It can be seen that even when compared with 3, good results were obtained.
  • the substrate structure for the product substrate for obtaining the product substrate by adopting the configuration according to the present invention, the warpage of the product substrate due to the warpage of the discarded substrate portion is suppressed, and the dimensions of the product substrate are reduced. It can be seen that the accuracy can be improved.
  • the present invention is not limited to this, and the present invention can also be applied to a multilayer product substrate.
  • the multilayer product substrate is a laminate of a plurality of single-layer product substrates. For this reason, the warp generated in the substrate portion following the discarded substrate is likely to remain without being eliminated even after the discarded substrate portion is removed.
  • the shape of the part, slit, etc. is not limited to this, and can be changed as appropriate.
  • the present invention is suitable for application to a substrate structure for a product substrate in which each electronic component is mounted on a base material portion through a reflow process and a manufacturing method for the product substrate.

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

A board structure for product boards so designed that the dimension precision of a base part to be machined to a product board is improved by suppressing warp of the adjacent waste board part and a method for manufacturing a product board. A board structure (20) for product boards comprises a waste board part (27) fabricated adjacently to a base part (24) and connection parts (28) formed between the base part (24) and the waste board part (27). Electronic components (22) are placed on a circuit pattern (24A) formed on the base part (24), processed at a reflow step, and thus mounted. Then, the connection parts (28) are cut, and the waste board part (27) is removed. In this board the conductive layer (26) is removed from the waste board part (27).

Description

明 細 書  Specification
製品基板用の基板構造、製品基板用の製造方法および電子機器 技術分野  Substrate structure for product substrate, manufacturing method for product substrate, and electronic equipment
[0001] 本発明は、リフロー工程を経て基材部に各電子部品が実装された製品基板用の基 板構造、製品基板用の製造方法および電子機器に関する。  The present invention relates to a substrate structure for a product substrate in which each electronic component is mounted on a base material portion through a reflow process, a manufacturing method for the product substrate, and an electronic device.
背景技術  Background art
[0002] 基板に電子部品が実装された製品基板を製造するための製品基板用の基板構造 が知られている(例えば、特許文献 1)。  A substrate structure for a product substrate for manufacturing a product substrate in which an electronic component is mounted on the substrate is known (for example, Patent Document 1).
この製品基板用の基板構造は、導体層である銅箔が積層された所定寸法の元基 材 (硬質基板)にエッチング加工を施すことにより回路パターンを形成し、次いで元基 板の全面にレジスト層を積層することにより回路パターンを覆った後、所定個所に穿 設 (抜き加工)加工を施すことにより、回路パターンが形成された基材部が連結部を 介して格子状に配列され、かつ、周部に枠状の捨て基板部が形成されている。 捨て基板部には、導体層である銅箔にレジスト層が積層された積層部が形成され ている。  In this substrate structure for product substrates, a circuit pattern is formed by etching an original substrate (hard substrate) of a predetermined size on which copper foil as a conductor layer is laminated, and then a resist is formed on the entire surface of the original substrate. After the circuit pattern is covered by laminating the layers, the base material portion on which the circuit pattern is formed is arranged in a lattice shape via the connecting portions by performing drilling at a predetermined location. A frame-like discarded substrate portion is formed around the periphery. The discarded substrate portion is formed with a laminated portion in which a resist layer is laminated on a copper foil as a conductor layer.
[0003] このような製品基板用の基板構造においては、回路パターンに対して各電子部品 を載置してからリフロー工程を経て各電子部品が実装され、次いで連結部を分断し て捨て基板部を除去することにより製品基板を得る。  In such a substrate structure for a product substrate, each electronic component is mounted on a circuit pattern and then mounted through a reflow process, and then the connecting portion is divided and discarded. A product substrate is obtained by removing.
特許文献 1:特開 2005— 347711号公報  Patent Document 1: Japanese Patent Laid-Open No. 2005-347711
発明の開示  Disclosure of the invention
発明が解決しょうとする課題  Problems to be solved by the invention
[0004] ところで、近年では、薄型化、小型化するためにフィルム状の軟質基材を採用した 製品基板が考えられている。 [0004] Incidentally, in recent years, a product substrate employing a film-like soft base material has been considered in order to reduce the thickness and size.
しかしながら、前述した製品基板用の基板構造により、軟質基材を採用した製品基 板を製造するにあたっては、以下のような問題がある。  However, there are the following problems in manufacturing a product substrate using a soft base material by the substrate structure for a product substrate described above.
[0005] すなわち、フィルム状の軟質基材を採用した場合、軟質基材の強度 (平坦形状を 維持する強度)が従来の硬質基材の強度よりも低ぐかつ、軟質基板の線膨張係数 に比較してレジスト層の線膨張係数が極めて大きいため、リフロー工程において捨て 基板部のレジスト層が面方向に沿って伸長し、捨て基板部における軟質基材もレジ スト層の伸長に追従して湾曲変形する。 [0005] That is, when a film-like soft substrate is adopted, the strength of the soft substrate (the strength to maintain a flat shape) is lower than the strength of the conventional hard substrate, and the linear expansion coefficient of the soft substrate The linear expansion coefficient of the resist layer is much larger than that of the resist layer, so that the resist layer in the discarded substrate part extends along the surface direction in the reflow process, and the soft base material in the discarded substrate part follows the extension of the resist layer. Curved and deformed.
この際、捨て基板部の積層部における導体層は、線膨張係数が比較的小さいもの の、レジスト層の伸長に追従し、リフロー工程後に降温してもレジスト層の伸長状態を 維持する。  At this time, although the conductor layer in the laminated portion of the discarded substrate portion has a relatively small linear expansion coefficient, it follows the elongation of the resist layer and maintains the stretched state of the resist layer even when the temperature is lowered after the reflow process.
このような捨て基板部の変形に追従して各基材も湾曲変形するため、製品基板用 の基板構造全体に反りが発生し、製品基板の寸法精度を維持できない。  Since each base material is also curved and deformed following such deformation of the discarded substrate portion, the entire substrate structure for the product substrate is warped, and the dimensional accuracy of the product substrate cannot be maintained.
[0006] 本発明は、前述した不都合を解消するためになされたものであり、その目的は、隣 接する捨て基板部に生じる反りを抑制することにより製品基板となる基材部の寸法精 度を向上できる製品基板用の基板構造、製品基板用の製造方法および電子機器を 提供することにある。  [0006] The present invention has been made to solve the above-mentioned disadvantages, and its purpose is to reduce the dimensional accuracy of the base material portion that becomes the product substrate by suppressing the warpage that occurs in the adjacent discarded substrate portion. It is an object to provide a substrate structure for a product substrate, a manufacturing method for the product substrate, and an electronic device that can be improved.
課題を解決するための手段  Means for solving the problem
[0007] 本発明の製品基板用の基板構造は、基材に電子部品が実装された製品基板を製 造するために、絶縁板に積層された導体層をエッチングすることにより前記基材とな る基材部と、前記基材部に隣接形成された捨て基板部と、前記基材部および前記捨 て基板部間に形成された連結部とを有し、前記基材部に形成された回路パターンに 対して前記各電子部品を載置してからリフロー工程を経て前記各電子部品が実装さ れ、次いで前記連結部を分断することにより前記捨て基板部が除去される製品基板 製造用の基板構造であって、前記リフロー工程後に生じる前記基板部の面方向に沿 つた 10mm当たりの厚み方向に沿った反り寸法が 0. 5mm以下となるように、前記基 材部および前記捨て基板部の線膨張係数差が一定以内であることを特徴とする。  [0007] The substrate structure for a product substrate according to the present invention provides the base material by etching a conductor layer laminated on an insulating plate in order to manufacture a product substrate in which an electronic component is mounted on the base material. A base plate portion formed adjacent to the base portion, and a connecting portion formed between the base portion and the base plate portion. Each electronic component is mounted on the circuit pattern and then mounted through a reflow process, and then the discarded substrate portion is removed by dividing the connecting portion. It is a substrate structure, and the warp dimension along the thickness direction per 10 mm along the surface direction of the substrate portion generated after the reflow process is 0.5 mm or less, so that the base material portion and the discarded substrate portion are formed. The linear expansion coefficient difference is within a certain range,
[0008] ここで、前述した所望値を得るために、例えば捨て基板部に導体層ある ヽはレジス ト層を形成しな 、構造や、あるいは捨て基板部における導体層あるいはレジスト層の 材質、厚み、平面形状等を適宜選択する構造や、捨て基板部にスリットを形成する構 造等を例示できる。  [0008] Here, in order to obtain the above-described desired value, for example, the conductor layer on the discarded substrate portion does not form a resist layer, the structure, or the material and thickness of the conductor layer or resist layer in the discarded substrate portion. Examples thereof include a structure for appropriately selecting a planar shape and the like, and a structure for forming a slit in the discarded substrate portion.
リフロー工程後に生じる基材部の面方向に沿った 10mm当たりの厚み方向に沿つ た反り寸法が 0. 5mm以下となるように、基材部および捨て基板部の線膨張係数差 が一定以内であるように構成した。 The difference in linear expansion coefficient between the base material part and the discarded substrate part so that the warpage dimension along the thickness direction per 10 mm along the surface direction of the base material part generated after the reflow process is 0.5 mm or less. Is configured to be within a certain range.
線膨張係数差が一定以内であるため、捨て基板部の反りが一定以下となり、捨て 基板部に追従して生じる基材部の反りも一定以下となる。  Since the difference in linear expansion coefficient is within a certain range, the warpage of the discarded substrate portion is less than a certain value, and the warpage of the base material portion that follows the discarded substrate portion is also less than a certain value.
[0009] また、本発明は、基材に電子部品が実装された製品基板を製造するために、絶縁 板に積層された導体層をエッチングすることにより前記基材となる基材部と、前記基 材部に隣接形成された捨て基板部と、前記基材部および前記捨て基板部間に形成 された連結部とを有し、前記基材部に形成された回路パターンに対して前記各電子 部品を載置してからリフロー工程を経て前記各電子部品が実装され、次いで前記連 結部を分断することにより前記捨て基板部が除去される製品基板製造用の基板構造 であって、前記導体層と、前記導体層を被覆するレジスト層とが積層された積層部が 前記捨て基板部に設けられて!/ヽな!ヽことを特徴とする。  [0009] Further, the present invention provides a base material portion that becomes the base material by etching a conductor layer laminated on an insulating plate in order to manufacture a product substrate in which an electronic component is mounted on the base material, Each of the electrons with respect to a circuit pattern formed on the base material portion, and having a discarded substrate portion formed adjacent to the base material portion, and a base portion and a connecting portion formed between the waste substrate portions. A substrate structure for manufacturing a product substrate in which each electronic component is mounted through a reflow process after placing the component, and then the discarded substrate portion is removed by dividing the connecting portion. A layered portion in which a layer and a resist layer covering the conductor layer are stacked is provided on the discarded substrate portion! / Cunning! It is characterized by that.
すなわち、捨て基板部に導体層のみを形成した構造や、あるいは捨て基板部にレ ジスト層のみを形成した構造は本発明に含まれる、  In other words, the present invention includes a structure in which only the conductor layer is formed on the discarded substrate portion, or a structure in which only the resist layer is formed on the discarded substrate portion.
[0010] なお、製品基板製造用の基板構造において、保管時あるいは流通時の利便性を 考慮して、捨て基板部に型番、製造時期、ロット番号等を表示する場合がある。この 際、文字、数字、記号は、製品基板の製造工程上、導体層およびレジスト層を積層 することにより形成される場合があるが、これは本発明において定義される積層部で はない。  [0010] Note that in a substrate structure for manufacturing a product substrate, in consideration of convenience during storage or distribution, a model number, a manufacturing time, a lot number, and the like may be displayed on the discarded substrate portion. In this case, letters, numbers, and symbols may be formed by laminating a conductor layer and a resist layer in the manufacturing process of the product substrate, but this is not a laminated portion defined in the present invention.
すなわち、これらのような文字、数字、記号等は、導体層およびレジスト層が積層さ れたものであっても、リフロー工程により製品基板製造用の基板構造に生じる反りに 対する支配的要因ではな 、。  In other words, these letters, numbers, symbols, etc. are not the dominant factors for the warpage generated in the substrate structure for manufacturing the product substrate by the reflow process, even if the conductor layer and the resist layer are laminated. ,.
[0011] 本発明においては、導体層およびレジスト層が積層された積層部が捨て基板部に 設けられていないため、従来の捨て基板部に比較して線膨張係数を小さくでき、これ により捨て基板部に追従して生じる基材部の反りも一定以下となる。  In the present invention, since the laminated portion in which the conductor layer and the resist layer are laminated is not provided in the discarded substrate portion, the linear expansion coefficient can be reduced as compared with the conventional discarded substrate portion. The warp of the base material part generated following the part is also below a certain level.
[0012] さらに、本発明は、基材に電子部品が実装された製品基板を製造するために、絶 縁板に積層された導体層をエッチングすることにより前記基材となる基材部と、前記 基材部に隣接形成された捨て基板部と、前記基材部および前記捨て基板部間に形 成された連結部とを有し、前記基材部に形成された回路パターンに対して前記各電 子部品を載置してからリフロー工程を経て前記各電子部品が実装され、次いで前記 連結部を分断することにより前記捨て基板部が除去される製品基板製造用の基板構 造であって、前記基材部および前記捨て基板部の配列方向に沿って前記捨て基板 部にスリットが形成されていることを特徴とする。 [0012] Furthermore, the present invention provides a base material portion that becomes the base material by etching a conductor layer laminated on an insulating plate in order to manufacture a product substrate in which an electronic component is mounted on the base material, A circuit board pattern formed on the base material part, the circuit board having a waste board part formed adjacent to the base material part, and a connecting part formed between the base material part and the waste board part. Each electric A substrate structure for manufacturing a product substrate in which each electronic component is mounted through a reflow process after placing a child component and then the discarded substrate portion is removed by dividing the connecting portion. A slit is formed in the discarded substrate portion along the arrangement direction of the base material portion and the discarded substrate portion.
[0013] 基材部および捨て基板部の配列方向に沿って捨て基板部にスリットが形成されて いる。スリットにより捨て基板部の反りが分断され、従来のように捨て基板部の全域に 生じた反りが基材部に波及しな!ヽ。  [0013] A slit is formed in the discarded substrate portion along the arrangement direction of the base material portion and the discarded substrate portion. The warping of the discarded substrate part is divided by the slit, and the warp generated in the entire area of the discarded substrate part does not spread to the base material part as before.
[0014] また、本発明は、前記捨て基板部に所定間隔でレジスト層が形成されていることを 特徴とする。  [0014] Further, the present invention is characterized in that a resist layer is formed at predetermined intervals on the discarded substrate portion.
[0015] 捨て基板部に所定間隔でレジスト層を形成することで、治具に粘着面を介して支持 された際、捨て基板部の保持性が向上する。  [0015] By forming the resist layer at a predetermined interval on the discarded substrate portion, the retainability of the discarded substrate portion is improved when the resist layer is supported on the jig via the adhesive surface.
[0016] そして、本発明の製品基板の製造方法は、基材に電子部品が実装された製品基 板を複数製造するために、絶縁板に積層された導体層をエッチングすることにより前 記各基材となる複数の基材部を同一面に沿って形成するとともに、前記各基材部を 囲むように枠状の捨て基板部を形成し、かつ、前記各基材部および前記捨て基板部 間に連結部を形成した製品基板用の基板を製造しておき、前記基材部に形成した 回路パターンに対して前記各電子部品を載置してからリフロー工程を経て前記各電 子部品を実装し、次いで前記各連結部を分断することにより前記捨て基板部を除去 する製品基板の製造方法であって、前記捨て基板部に対応した枠部と、前記枠部内 に設けられて前記各連結部に対応する格子部とを有する治具に前記製品基板用の 基板を載置することを特徴とする。  [0016] Then, the manufacturing method of the product substrate of the present invention includes the steps of etching the conductor layer laminated on the insulating plate in order to manufacture a plurality of product substrates having electronic parts mounted on a base material. A plurality of base material portions to be a base material are formed along the same surface, a frame-shaped discard substrate portion is formed so as to surround each of the base material portions, and each of the base material portions and the discard substrate portion is formed A substrate for a product substrate in which a connecting portion is formed is manufactured in advance, and each electronic component is placed on the circuit pattern formed on the base material portion and then passed through a reflow process. A method of manufacturing a product substrate, wherein the discarded substrate portion is removed by mounting and then separating each of the connecting portions, and a frame portion corresponding to the discarded substrate portion and a frame portion provided in the frame portion, The product substrate on a jig having a lattice portion corresponding to the portion Characterized by placing the substrate.
[0017] 例えばリフロー工程にあたって、治具に製品基板用の基板を載置することにより捨 て基板部の変形が規制されるため、基材部に変形が波及する虞が少なぐかつ、格 子部により連結部を挟持するため、間接的に基材部の変形が抑制される。  For example, in the reflow process, since the deformation of the substrate portion is regulated by placing the substrate for the product substrate on the jig, the deformation of the substrate portion is less likely to occur, and Since the connecting portion is sandwiched between the portions, the deformation of the base material portion is indirectly suppressed.
[0018] さらに、本発明の製品基板の製造方法は、前記治具を一対用いることにより前記製 品基板用の基板を厚み方向に挟持することを特徴とする。  Furthermore, the product substrate manufacturing method of the present invention is characterized in that the substrate for the product substrate is sandwiched in the thickness direction by using a pair of the jigs.
製品基板用の基板を厚み方向に挟持するため、捨て基板部および基材部の変形 が確実に規制される。 [0019] また、本発明の電子機器は、前述した製品基板用の基板構造により得られた製品 基板が用いられたことを特徴とする。 Since the substrate for the product substrate is sandwiched in the thickness direction, the deformation of the discarded substrate portion and the base material portion is reliably regulated. [0019] Further, the electronic device of the present invention is characterized in that a product substrate obtained by the above-described substrate structure for a product substrate is used.
ここで、電子機器としては、製品基板が筐体に収容された携帯電話やメモリカード 以外にも、製品基板を他の回路基板に対して階層状、あるいは同一面に沿って連結 した回路モジュール等も含まれる。  Here, as electronic devices, in addition to mobile phones and memory cards in which product boards are housed in casings, circuit modules in which product boards are connected to other circuit boards in a hierarchy or along the same plane, etc. Is also included.
発明の効果  The invention's effect
[0020] 本発明によれば、捨て基板部の反りを一定以下にすることが可能で、捨て基板部 に追従して生じる基材部の反りを一定以下にできるという効果を有する。  [0020] According to the present invention, it is possible to reduce the warpage of the discarded substrate portion to a certain level or less, and it is possible to reduce the warpage of the base material portion that follows the discarded substrate portion to a certain value or less.
図面の簡単な説明  Brief Description of Drawings
[0021] [図 1]本発明に係る製品基板を示す斜視図である。  FIG. 1 is a perspective view showing a product substrate according to the present invention.
[図 2]図 2 (A)は本発明に係る製品基板用の基板構造 (第 1実施形態)を示す斜視図 、図 2 (B)は第 1実施形態に係る製品基板用の基板構造の基材部を示す断面図であ る。  FIG. 2 (A) is a perspective view showing a substrate structure for a product substrate according to the present invention (first embodiment), and FIG. 2 (B) is a diagram of the substrate structure for a product substrate according to the first embodiment. It is sectional drawing which shows a base material part.
[図 3]第 1実施形態に係る製品基板用の製造方法に用いる治具を示す斜視図である  FIG. 3 is a perspective view showing a jig used in the manufacturing method for a product substrate according to the first embodiment.
[図 4]第 1実施形態に係る製品基板用の基板構造の変形例を示す斜視図である。 FIG. 4 is a perspective view showing a modified example of the substrate structure for a product substrate according to the first embodiment.
[図 5]本発明に係る製品基板用の基板構造 (第 2実施形態)を示す斜視図である。  FIG. 5 is a perspective view showing a substrate structure for a product substrate (second embodiment) according to the present invention.
[図 6]第 2実施形態に係る製品基板用の基板構造の変形例を示す斜視図である。  FIG. 6 is a perspective view showing a modified example of the substrate structure for a product substrate according to the second embodiment.
[図 7]本発明に係る製品基板用の基板構造 (第 3実施形態)を示す斜視図である。  FIG. 7 is a perspective view showing a substrate structure for a product substrate (third embodiment) according to the present invention.
[図 8]本発明に係る製品基板用の基板構造 (第 4実施形態)を示す斜視図である。 符号の説明  FIG. 8 is a perspective view showing a substrate structure for a product substrate (fourth embodiment) according to the present invention. Explanation of symbols
[0022] 10 製品基板 [0022] 10 Product Board
20, 40, 50, 60 製品基板用の基板構造 (製品基板用の基板)  20, 40, 50, 60 Substrate structure for product substrate (substrate for product substrate)
21 基材  21 Base material
22 電子部品  22 Electronic components
24 基材部  24 Substrate part
24A 回路パターン 27, 41 捨て基板部 24A circuit pattern 27, 41 Discarded board
28 連結部  28 Connecting part
29 レジスト層  29 resist layer
30 治具  30 Jig
32 枠部  32 Frame
33 格子部  33 Lattice
42 スリット  42 Slit
発明を実施するための最良の形態  BEST MODE FOR CARRYING OUT THE INVENTION
[0023] (第 1実施形態) [0023] (First embodiment)
図 1に示すように、製品基板 10はケース 12に収納されて、例えばメモリーカード 11 に採用される。このメモリーカード 11は、携帯端末 13等のスロット孔 14に差し込むこ とにより記録媒体として使用される。  As shown in FIG. 1, the product substrate 10 is housed in a case 12 and used in, for example, a memory card 11. The memory card 11 is used as a recording medium by being inserted into the slot hole 14 of the portable terminal 13 or the like.
製品基板 10は、第 1実施形態の製品基板用の基板構造 20 (図 2参照)から製造さ れた基材 21に電子部品 22が実装されたものである。  The product substrate 10 is obtained by mounting an electronic component 22 on a base material 21 manufactured from the substrate structure 20 (see FIG. 2) for the product substrate of the first embodiment.
以下、第 1実施形態の製品基板用の基板構造 20を図 2に基づいて説明する。  Hereinafter, the substrate structure 20 for a product substrate of the first embodiment will be described with reference to FIG.
[0024] 図 2 (A) , (B)に示すように、第 1実施形態の製品基板用の基板構造 20は、図 1に 示す基材 21に電子部品 22が実装された製品基板 10を製造するために、絶縁性の 軟質基材 25に積層された導体層 26をエッチングすることにより基材 21となる基材部 24に回路パターン 24Aを形成するとともに、基材部 24に隣接形成された捨て基板 部 27から導体層 26を除去し、次いで元基板における基材部 24に対応する領域にの みレジスト層を積層することにより回路パターン 24Aを覆った後、基材部 24および捨 て基板部 27間の所定個所に長円形状の穿設 (抜き加工)加工を施すことにより連結 部 28が設けられている。 As shown in FIGS. 2 (A) and 2 (B), the substrate structure 20 for a product substrate of the first embodiment includes a product substrate 10 in which an electronic component 22 is mounted on a base material 21 shown in FIG. In order to manufacture, the conductive layer 26 laminated on the insulating soft base material 25 is etched to form the circuit pattern 24A on the base material portion 24 to be the base material 21 and to be formed adjacent to the base material portion 24. After removing the conductor layer 26 from the discarded substrate portion 27 and then covering the circuit pattern 24A by laminating a resist layer only in the region corresponding to the base portion 24 on the original substrate, the base portion 24 and the discarded portion are discarded. The connecting portion 28 is provided by performing an oval drilling (punching) process at a predetermined position between the substrate portions 27.
これにより製品基板用の基板構造 20は、多数の基材部 27が連結部 28を介して格 子状に配列され、かつ、周部に枠状の捨て基板部 27が形成され、基材部 24に形成 された回路パターン 24Aに対して各電子部品 22 (図 1参照)を載置して力 リフロー 工程を経て各電子部品 22が実装され、次いで連結部 28を分断することにより捨て基 板部 27が除去されるものである。 As a result, the substrate structure 20 for the product substrate has a large number of base material portions 27 arranged in a latticed manner via the connecting portions 28, and a frame-like discarded substrate portion 27 is formed on the peripheral portion. Each electronic component 22 (see FIG. 1) is placed on the circuit pattern 24A formed on 24, and each electronic component 22 is mounted through a force reflow process. The plate part 27 is removed.
[0025] この製品基板製造用の基板構造 20は、エッチング工程において捨て基板部 27か ら導体層 26を除去するとともに、レジスト層成膜工程において捨て基板部 27をマスク することにより、捨て基板部 27に導体層およびレジスト層が積層された積層部が設け られていず、捨て基板部 27に所定間隔でレジスト層 29が 1個ずつ形成されている。 [0025] This substrate structure 20 for manufacturing a product substrate is formed by removing the conductor layer 26 from the discarded substrate portion 27 in the etching process and masking the discarded substrate portion 27 in the resist layer forming process. 27 is not provided with a laminated portion in which a conductor layer and a resist layer are laminated, and one resist layer 29 is formed on the discarded substrate portion 27 at a predetermined interval.
[0026] 捨て基板部 27から線膨張係数が大きな積層部が設けられて 、な 、ので、捨て基板 部 27の大部分を軟質基材 25のみにできる。これにより、従来に比較して捨て基板部[0026] Since the laminated portion having a large linear expansion coefficient is provided from the discarded substrate portion 27, most of the discarded substrate portion 27 can be made only of the soft base material 25. As a result, the discarded board part compared to the conventional case
27としての線膨張係数を小さくでき、これにより捨て基板部 27に追従して生じる基材 部 24の反りも一定以下となる。 The linear expansion coefficient as 27 can be reduced, and the warpage of the base material portion 24 caused by following the discarded substrate portion 27 is also below a certain level.
[0027] すなわち、リフロー工程後に生じる基板部 24の面方向に沿った 10mm当たりの厚 み方向に沿った反り寸法が 0. 5mm以下となるように、基材部 24および捨て基板部 2That is, the base material portion 24 and the discarded substrate portion 2 are formed so that the warp dimension along the thickness direction per 10 mm along the surface direction of the substrate portion 24 generated after the reflow process is 0.5 mm or less.
7の線膨張係数差が一定以内となる。 The linear expansion coefficient difference of 7 is within a certain range.
線膨張係数差が一定以内であるため、捨て基板部 27の反りが一定以下となり、捨 て基板部 27に追従して生じる基材部 24の反りも一定以下となる。  Since the difference in linear expansion coefficient is within a certain range, the warpage of the discarded substrate portion 27 becomes less than a certain value, and the warpage of the base material portion 24 generated following the discarded substrate portion 27 becomes less than a certain value.
[0028] また、捨て基板部 27に所定間隔でレジスト層 29を形成することで、後述する治具 3[0028] Further, by forming resist layers 29 on the discarded substrate portion 27 at predetermined intervals, a jig 3 described later is formed.
0 (図 3参照)に粘着面を介して支持された際、捨て基板部 27の保持性が向上する。 When supported by 0 (see FIG. 3) via the adhesive surface, the holding property of the discarded substrate portion 27 is improved.
[0029] なお、第 1実施形態では、レジスト層 29を捨て基板部 27の表面 27Aに形成した例 について説明した力 これに限らないで、レジスト層 29は捨て基板部 27の裏面に形 成することも可能であり、表面 27Aおよび裏面の双方において部分的に形成すること も可能である。 [0029] In the first embodiment, the force described in the example in which the resist layer 29 is formed on the front surface 27A of the discarded substrate portion 27 is not limited to this. The resist layer 29 is formed on the rear surface of the discarded substrate portion 27. It is also possible to form partly on both the front surface 27A and the back surface.
[0030] つぎに、製品基板の製造方法のリフロー工程において用いられる治具 30を図 3に 基づいて説明する。  Next, the jig 30 used in the reflow process of the product substrate manufacturing method will be described with reference to FIG.
図 3に示す治具 30は、治具 30は、外周部 31の内に設けられて捨て基板部 27に対 応した枠部 32と、枠部 32内に設けられて各連結部 28に対応する格子部 33とを有す る。  The jig 30 shown in FIG. 3 is provided in the outer peripheral portion 31 and corresponds to the discarding substrate portion 27 and the frame portion 32 corresponding to the discarded substrate portion 27, and the connecting portion 28 provided in the frame portion 32. And a grid portion 33 to be used.
[0031] 外周部 31は、略矩形枠状に形成され、かつ、厚さ寸法 T1の部位である。  [0031] The outer peripheral portion 31 is a portion having a substantially rectangular frame shape and a thickness dimension T1.
枠部 32は、捨て基板部 27に対応するように矩形枠状に形成され、かつ、厚さ寸法 T2の部位である。 格子部 33は、枠部 32内に複数の矩形開口 34を形成することで、各連結部 28に対 応するように格子状に形成され、かつ、厚さ寸法 T2の部位である。 The frame portion 32 is formed in a rectangular frame shape so as to correspond to the discarded substrate portion 27, and is a portion having a thickness dimension T2. The lattice portion 33 is formed in a lattice shape so as to correspond to each connecting portion 28 by forming a plurality of rectangular openings 34 in the frame portion 32, and is a portion having a thickness dimension T2.
[0032] ここで、厚さ寸法 T1と厚さ寸法 T2との関係は、 TKT2が成立する。 [0032] Here, the relationship between the thickness dimension T1 and the thickness dimension T2 is TKT2.
そして、枠部 32および格子部 33は、それぞれの表面 32A, 33Aが面一になるよう に形成されている。各表面 32A, 33Aは、外周部 31の表面 31Aに対して(T2— T1) 寸法だけ隆起している。  The frame portion 32 and the lattice portion 33 are formed so that the surfaces 32A and 33A are flush with each other. Each of the surfaces 32A and 33A protrudes from the surface 31A of the outer peripheral portion 31 by a dimension (T2-T1).
[0033] 治具 30を一対用意し、一方の治具 30の表面 32A, 33Aと、他方の治具 30の表面 32A, 33Aとを互いに向かい合わせ、一方の治具 30の表面 32A, 33Aと、他方の治 具 30の表面 32A, 33Aとで製品基板用の基板構造 20を挟持する。 [0033] A pair of jigs 30 are prepared, and the surfaces 32A and 33A of one jig 30 and the surfaces 32A and 33A of the other jig 30 face each other, and the surfaces 32A and 33A of one jig 30 The substrate structure 20 for the product substrate is sandwiched between the surfaces 32A and 33A of the other jig 30.
これにより、一方の治具 30の表面 32Aと他方の治具 30の表面 32Aとで捨て基板 部 27を挟持する。  As a result, the substrate portion 27 is sandwiched between the surface 32A of one jig 30 and the surface 32A of the other jig 30.
また、一方の治具 30の表面 33Aと他方の治具 30の表面 33Aとで連結部 28を挟持 する。  Further, the connecting portion 28 is sandwiched between the surface 33A of one jig 30 and the surface 33A of the other jig 30.
[0034] この状態で、一対の治具 30および製品基板用の基板構造 20をリフロー炉に搬入 する。リフロー炉内で加熱することでノ、ンダ付けを行い、電子部品 22 (図 1参照)を基 材部 24に実装する。  [0034] In this state, the pair of jigs 30 and the substrate structure 20 for the product substrate are carried into a reflow furnace. By heating in the reflow furnace, soldering is performed, and the electronic component 22 (see Fig. 1) is mounted on the base member 24.
[0035] 以下、治具 30を用いてリフロー工程を実施する製品基板の製造方法について説明 する。  Hereinafter, a method for manufacturing a product substrate in which the reflow process is performed using the jig 30 will be described.
先ず、絶縁板 25に積層された導体層 26をエッチングすることにより各基材 21となる 複数の基材部 24を同一面に沿って形成するとともに、各基材部 24を囲むように枠状 の捨て基板部 27を形成し、かつ、各基材部 24および捨て基板部 27間に連結部 28 を形成した製品基板用の基板 20を製造しておく。  First, by etching the conductor layer 26 laminated on the insulating plate 25, a plurality of base material portions 24 to be the base materials 21 are formed along the same surface, and a frame shape is formed so as to surround each base material portion 24. The substrate 20 for a product substrate in which the discarded substrate portion 27 is formed and the connecting portion 28 is formed between each base material portion 24 and the discarded substrate portion 27 is manufactured.
[0036] つぎに、各基材部 24に対応してレジスト層を成膜した後、基材部 24に形成した回 路パターン 24Aに対して各電子部品 22を載置してからリフロー工程を経て各電子部 品 22を実装する。 [0036] Next, after forming a resist layer corresponding to each base material portion 24, each electronic component 22 is placed on the circuit pattern 24A formed on the base material portion 24, and then the reflow process is performed. Then, each electronic component 22 is mounted.
リフロー工程にあたって、捨て基板部 27に対応した枠部 32と、枠部 32内に設けら れて各連結部 28に対応する格子部 33とを有する治具 30に製品基板用の基板 20を 載置する。この際、治具 30の表面 32Aに設けられた粘着層に対して捨て基板部 27 のレジスト層 29が粘着し、これにより製品基板用の基板 20が固定される。 In the reflow process, the substrate 20 for the product substrate is mounted on a jig 30 having a frame portion 32 corresponding to the discarded substrate portion 27 and a lattice portion 33 provided in the frame portion 32 and corresponding to each connecting portion 28. Put. At this time, the substrate portion 27 is discarded against the adhesive layer provided on the surface 32A of the jig 30. The resist layer 29 adheres, thereby fixing the substrate 20 for the product substrate.
次いで、他の治具 30を製品基板用の基板 20に積層することにより、製品基板用の 基板 20を厚み方向に挟持する。  Next, by stacking another jig 30 on the product substrate 20, the product substrate 20 is sandwiched in the thickness direction.
[0037] リフロー工程後、各治具 30から製品基板用の基板 20を取り外し、各連結部 28を分 断することにより捨て基板部 27を除去するとともに、各基材 21間の各連結部 28を分 断することにより基材 21に電子部品 22が実装された製品基板 10を複数製造するェ 程が完了する。 [0037] After the reflow process, the substrate 20 for the product substrate is removed from each jig 30, and the discarded substrate portions 27 are removed by dividing the connecting portions 28, and the connecting portions 28 between the base materials 21 are removed. The process of manufacturing a plurality of product substrates 10 each having the electronic component 22 mounted on the base material 21 is completed.
[0038] リフロー工程にあたって、表面 32Aの粘着層を介して治具 30に製品基板用の基板 20を載置することにより、捨て基板部 27の変形が規制されるため、基材部 24に変形 が波及する虞が少ない。  [0038] In the reflow process, by placing the substrate 20 for product substrate on the jig 30 through the adhesive layer on the surface 32A, the deformation of the discarded substrate portion 27 is regulated, so that the substrate portion 24 is deformed. Is less likely to spread.
そして、一対の治具 30により製品基板用の基板 20を厚み方向に挟持することによ り、治具 30の枠部 32により捨て基板部 27の変形が確実に規制でき、かつ、格子部 3 3により連結部 28を挟持するため、間接的に基材部 24の変形が抑制される。  Then, by sandwiching the substrate 20 for product substrate in the thickness direction by the pair of jigs 30, the deformation of the discarded substrate part 27 can be reliably regulated by the frame part 32 of the jig 30, and the lattice part 3 Since the connecting portion 28 is sandwiched by 3, the deformation of the base material portion 24 is indirectly suppressed.
[0039] (変形例)  [Modification]
第 1実施形態の製品基板用の基板構造 20は、捨て基板部 27に所定間隔をおいて レジスト層 29を 1個ずつ形成した例について説明した力 図 4に示すように、捨て基 板部 27に所定間隔をおいてレジスト層 29を複数個(一例として 5個)を形成すること が可能である。  The substrate structure 20 for the product substrate of the first embodiment has the force described in the example in which the resist layer 29 is formed one by one at a predetermined interval on the discarded substrate portion 27. As shown in FIG. It is possible to form a plurality of resist layers 29 (five as an example) at predetermined intervals.
[0040] 複数個のレジスト層 29を形成する場合は、各レジスト層 29を千鳥状に配置すること が好ましい。比較的小さな領域に多数のレジスト層 29を形成することが可能になるか らである。  [0040] When a plurality of resist layers 29 are formed, the resist layers 29 are preferably arranged in a staggered manner. This is because a large number of resist layers 29 can be formed in a relatively small area.
さらに、レジスト層 29を千鳥状に配置することで、治具 30 (図 3参照)に粘着面を介 して支持された際、捨て基板部 27の保持性が一層向上する。  Furthermore, by disposing the resist layers 29 in a staggered manner, the retainability of the discarded substrate portion 27 is further improved when supported by the jig 30 (see FIG. 3) via the adhesive surface.
[0041] つぎに、第 2〜3実施形態を図 5〜図 7に基づいて説明する。なお、第 2〜3実施形 態の製品基板用の基板構造において第 1実施形態と同一'類似部材については同 じ符号を付して説明を省略する。 [0041] Next, second to third embodiments will be described with reference to Figs. In the substrate structures for product substrates of the second to third embodiments, the same reference numerals are given to the same members as those in the first embodiment, and the description thereof is omitted.
[0042] (第 2実施形態) [0042] (Second Embodiment)
図 5に示すように、第 2実施形態の製品基板用の基板構造 40は、基材部 24に捨て 基板部 41が直接設けられ、基材部 24および捨て基板部 41の配列方向に沿って捨 て基板部 41に複数のスリット 42が所定の間隔で形成されたもので、その他の構成は 第 1実施形態と同様である。 As shown in FIG. 5, the substrate structure 40 for the product substrate of the second embodiment is discarded in the base material portion 24. A substrate part 41 is provided directly, and a plurality of slits 42 are formed at predetermined intervals in the substrate part 41 along the arrangement direction of the base material part 24 and the discarded substrate part 41. This is the same as the embodiment.
捨て基板部 41には所定間隔で導体層である銅箔 29Aが 1個ずつ形成されている。  The discarded substrate portion 41 is formed with one copper foil 29A as a conductor layer at a predetermined interval.
[0043] 捨て基板部 41にスリット 42を形成することで、スリット 42により捨て基板部 41の反り が分断され、従来のように捨て基板部 41の全域に生じた反りが基材部 24に波及しな い。 [0043] By forming the slit 42 in the discarded substrate portion 41, the warpage of the discarded substrate portion 41 is divided by the slit 42, and the warpage generated in the entire area of the discarded substrate portion 41 is propagated to the base material portion 24 as in the past. do not do.
スリット 42を形成する位置、スリット 42の個数、スリット 42の形態は任意に決めること ができる。  The positions where the slits 42 are formed, the number of the slits 42, and the shape of the slits 42 can be arbitrarily determined.
[0044] 第 2実施形態の製品基板用の基板構造 40によれば、基板部 41にスリット 42を形成 することで、捨て基板部 41から導体層 26を除去する必要がない。  According to the substrate structure 40 for a product substrate of the second embodiment, by forming the slits 42 in the substrate part 41, it is not necessary to remove the conductor layer 26 from the discarded substrate part 41.
カロえて、第 2実施形態の製品基板用の基板構造 40によれば、第 1実施形態の製品 基板用の基板構造 20と同様の効果が得られる。  According to the substrate structure 40 for a product substrate of the second embodiment, the same effect as the substrate structure 20 for a product substrate of the first embodiment can be obtained.
[0045] (変形例)  [0045] (Modification)
第 2実施形態の製品基板用の基板構造 40は、捨て基板部 41に所定間隔をおいて レジスト 29Aを 1個ずつ形成した例について説明した力 図 6に示すように、捨て基板 部 41に所定間隔をおいてレジスト 29Aを複数個(一例として 5個)を形成することが 可能である。  The substrate structure 40 for the product substrate according to the second embodiment has the force described in the example in which the resist 29A is formed one by one at a predetermined interval on the discarded substrate portion 41. As shown in FIG. It is possible to form a plurality of resists 29A (as an example, five) at intervals.
[0046] 複数個のレジスト 29Aを形成する場合は、各レジスト 29Aを千鳥状に配置すること が好ましい。比較的小さな領域に多数のレジスト 29Aを形成することが可能になるか らである。  [0046] When a plurality of resists 29A are formed, it is preferable that the resists 29A are arranged in a staggered manner. This is because a large number of resists 29A can be formed in a relatively small area.
さらに、レジスト 29Aを千鳥状に配置することで、治具 30 (図 3参照)に粘着面を介 して支持された際、捨て基板部 41の保持性が一層向上する。  Furthermore, by disposing the resists 29A in a staggered manner, the retainability of the discarded substrate portion 41 is further improved when supported by the jig 30 (see FIG. 3) via the adhesive surface.
[0047] (第 3実施形態) [0047] (Third embodiment)
図 7に示すように、第 3実施形態の製品基板用の基板構造 50は、第 1実施形態の 製品基板用の基板構造 20から捨て基板部 27を除去したもので、その他の構成は第 1実施形態と同様である。  As shown in FIG. 7, the substrate structure 50 for the product substrate of the third embodiment is obtained by removing the discarded substrate portion 27 from the substrate structure 20 for the product substrate of the first embodiment. This is the same as the embodiment.
[0048] 捨て基板部 27を除去することで、基材部 24の反りを一定以下に抑えることができる すなわち、第 3実施形態の製品基板用の基板構造 50によれば、第 1実施形態の製 品基板用の基板構造 20と同様の効果が得られる。 [0048] By removing the discarded substrate portion 27, the warp of the base material portion 24 can be suppressed to a certain level or less. That is, according to the substrate structure 50 for a product substrate of the third embodiment, the same effect as the substrate structure 20 for a product substrate of the first embodiment can be obtained.
[0049] (第 4実施形態) [0049] (Fourth embodiment)
図 8に示すように、第 4実施形態の製品基板用の基板構造 60は、第 2実施形態の 製品基板用の基板構造 40における各捨て基板部 41を橋部 61により連結したもので ある。  As shown in FIG. 8, the substrate structure 60 for product substrates of the fourth embodiment is obtained by connecting the discarded substrate portions 41 in the substrate structure 40 for product substrates of the second embodiment by bridge portions 61.
[0050] ところで、前述した第 2実施形態では、各捨て基板部 41が独立しているため、各基 材部 24を分割した際、各捨て基板部 41が個別に切り離されることになる。  By the way, in the second embodiment described above, since each discarded substrate portion 41 is independent, each discarded substrate portion 41 is individually separated when each base material portion 24 is divided.
従って、前述した第 2実施形態では、各捨て基板部 41を廃棄するための機械構造 が複雑ィ匕するとともに、廃棄作業の効率を向上しにくいという不都合が生じる可能性 がある。  Therefore, in the second embodiment described above, there is a possibility that the mechanical structure for discarding each discarded substrate portion 41 becomes complicated and it is difficult to improve the efficiency of the disposal work.
一方、前述した第 4実施形態によれば、捨て基板部 41が橋部 61により連結されて いるため、各基材部 24を分割した際、各捨て基板部 41が一体化された状態で廃棄 可能となり、各捨て基板部 41を廃棄するための機械構造を簡略ィ匕できるとともに、廃 棄作業も効率ィ匕できるという効果が得られる。  On the other hand, according to the fourth embodiment described above, since the discarded substrate portions 41 are connected by the bridge portions 61, when each base material portion 24 is divided, the discarded substrate portions 41 are disposed in an integrated state. As a result, it is possible to simplify the mechanical structure for discarding each discarded substrate portion 41, and to achieve an effect of efficiently performing the disposal work.
捨て基板部 41がー体構造で残る為、例えば機械を用いて捨て基板を排出する際 、吸着、廃棄という処理が効率的になります。  Since the discarded substrate part 41 remains in the body structure, for example, when discharging the discarded substrate using a machine, the processing of adsorption and disposal becomes efficient.
[0051] (実施例) [0051] (Example)
つぎに、本発明に対応して捨て基板部の形態が異なる複数種類の製品基板用の 基板構造を製作し、製品基板用の基板構造における最大反り寸法を測定し、捨て基 板部に積層部が設けられた従来例における最大反り寸法と比較したので表 1を用い て説明する。  Next, according to the present invention, a substrate structure for a plurality of types of product substrates having different configurations of the discarded substrate portion is manufactured, the maximum warpage dimension in the substrate structure for the product substrate is measured, and the laminated portion is disposed on the discarded substrate portion. Table 1 will be used to explain the comparison with the maximum warpage dimension in the conventional example provided with.
なお、実施例 1〜実施例 4および従来例 1において、元基材の線膨張係数は 12pp m、導体層(銅箔)の線膨張係数は 16ppm、レジスト層の線膨張係数は 60〜70ppm である。  In Examples 1 to 4 and Conventional Example 1, the linear expansion coefficient of the original base material is 12 ppm, the linear expansion coefficient of the conductor layer (copper foil) is 16 ppm, and the linear expansion coefficient of the resist layer is 60 to 70 ppm. is there.
また、実施例 1〜実施例 4の外形寸法は縦 73. Omm,横 55. Ommであり、従来例 1の外形寸法は縦 74. 8mm、横 95. Ommである。 [0052] そして、以上のような実施例 1〜実施例 4および比較例 1に対して、電子部品を実 装する前の初期状態における最大反り寸法を測定した後、リフロー工程により表面に 電子部品を実装した状態で再び最大反り寸法を測定し、次いでリフロー工程により裏 面に電子部品を実装した状態で再び最大反り寸法を測定した。 In addition, the outer dimensions of Examples 1 to 4 are 73. Omm in length and 55. Omm in width, and the outer dimensions in Conventional Example 1 are 74.8 mm in height and 95. Omm in width. [0052] Then, for Examples 1 to 4 and Comparative Example 1 as described above, after measuring the maximum warpage dimension in the initial state before mounting the electronic component, the electronic component was formed on the surface by a reflow process. The maximum warp dimension was measured again in the state of mounting, and then the maximum warp dimension was measured again with the electronic component mounted on the back surface by the reflow process.
最大反り寸法は、裏面が接触するように製品基板用の基板構造を定盤に載置し、 定盤から浮き上がった個所の最大離間寸法を測定して最大反り寸法とした。  The maximum warpage dimension was determined by placing the substrate structure for the product substrate on a surface plate so that the back surface was in contact, and measuring the maximum separation distance of the part lifted from the surface plate to determine the maximum warpage size.
[0053] なお、実施例 1〜実施例 4においては、表面に電子部品を実装する表面実装は前 述した本発明に係る治具を用いなレ、場合の最大反り寸法と、治具を用いた場合の最 大反り寸法とを測定した。  [0053] In Examples 1 to 4, the surface mounting for mounting the electronic component on the surface uses the jig according to the present invention described above, the maximum warp dimension in the case, and the jig. The maximum warpage dimension was measured.
一方、従来例 1は、治具を用いない場合の最大反り寸法のみを測定した。  On the other hand, in Conventional Example 1, only the maximum warpage dimension was measured when no jig was used.
[0054] [表 1]  [0054] [Table 1]
Figure imgf000014_0001
以上の結果から、実施例 1〜実施例 4は、捨て基板部に積層部が設けられていな いか、あるいはスリットが設けられてレ、るため、総合判定が Eとなった従来例 1に比較 して最大反り寸法が激減し、本発明による構成が捨て基板部の反りを抑制して、製品 基板の反りを小さくできて総合判定 A〜Dを得たことが判る。
Figure imgf000014_0001
From the above results, Example 1 to Example 4 are compared to Conventional Example 1 where the overall judgment is E because the discarded substrate part is not provided with a laminated part or a slit is provided. Thus, it can be seen that the maximum warpage dimension is drastically reduced, the configuration according to the present invention is discarded, the warpage of the substrate portion is suppressed, the warpage of the product substrate can be reduced, and comprehensive judgments A to D are obtained.
また、実施例 4は、捨て基板部にスリットが設けられているため、捨て基板部に積層 部が設けられていても、捨て基板部に生じた反りが分断されて基材部に波及せず、こ れにより従来例 1に比較して飛躍的な改善が認められるとともに、実施例 1〜実施例 3に比較しても良好な結果が得られたことが判る。 Further, in Example 4, since the slit is provided in the discarded substrate portion, even if the laminated portion is provided in the discarded substrate portion, the warp generated in the discarded substrate portion is divided and does not affect the base material portion. As a result, a dramatic improvement was observed compared to Conventional Example 1, and Examples 1 to It can be seen that even when compared with 3, good results were obtained.
以上の結果から、製品基板を得るための製品基板用の基板構造において、本発明 による構成を採用することにより、捨て基板部の反りに起因する製品基板の反りを抑 制し、製品基板の寸法精度を向上できることが判る。  From the above results, in the substrate structure for the product substrate for obtaining the product substrate, by adopting the configuration according to the present invention, the warpage of the product substrate due to the warpage of the discarded substrate portion is suppressed, and the dimensions of the product substrate are reduced. It can be seen that the accuracy can be improved.
[0056] なお、前述した各実施形態では、本発明を単層の製品基板に適用した例について 説明したが、これに限らないで、本発明を多層の製品基板に適用することも可能であ る。  In each of the above-described embodiments, the example in which the present invention is applied to a single-layer product substrate has been described. However, the present invention is not limited to this, and the present invention can also be applied to a multilayer product substrate. The
多層の製品基板は、単層の製品基板を複数積層したものである。このため、捨て基 板に追従して基板部に生じた反りが、捨て基板部を除去した後も解消されることなく 残存しやすくなる。  The multilayer product substrate is a laminate of a plurality of single-layer product substrates. For this reason, the warp generated in the substrate portion following the discarded substrate is likely to remain without being eliminated even after the discarded substrate portion is removed.
したがって、本発明を多層の製品基板に適用することで、特に顕著な効果が得られ る。  Therefore, a particularly remarkable effect can be obtained by applying the present invention to a multilayer product substrate.
[0057] また、前述した各実施形態で例示した製品基板、製品基板用の基板構造、基材、 電子部品、基材部、捨て基板部、連結部、レジスト層、治具、枠部、格子部、スリット 等の形状は、これに限定するものではなぐ適宜変更が可能である。  [0057] In addition, the product substrate, the substrate structure for the product substrate, the base material, the electronic component, the base material portion, the discarded substrate portion, the connection portion, the resist layer, the jig, the frame portion, and the lattice exemplified in each of the embodiments described above The shape of the part, slit, etc. is not limited to this, and can be changed as appropriate.
産業上の利用可能性  Industrial applicability
[0058] 本発明は、リフロー工程を経て基材部に各電子部品が実装された製品基板用の基 板構造および製品基板用の製造方法への適用に好適である。 The present invention is suitable for application to a substrate structure for a product substrate in which each electronic component is mounted on a base material portion through a reflow process and a manufacturing method for the product substrate.

Claims

請求の範囲 The scope of the claims
[1] 基材に電子部品が実装された製品基板を製造するために、  [1] In order to manufacture a product substrate with electronic components mounted on the substrate,
絶縁板に積層された導体層をエッチングすることにより前記基材となる基材部と、前 記基材部に隣接形成された捨て基板部と、前記基材部および前記捨て基板部間に 形成された連結部とを有し、  Etching the conductor layer laminated on the insulating plate, forming the base material portion as the base material, the discarded substrate portion formed adjacent to the base material portion, and the base material portion and the discarded substrate portion. A connected portion,
前記基材部に形成された回路パターンに対して前記各電子部品を載置してからリ フロー工程を経て前記各電子部品が実装され、  Each electronic component is mounted through a reflow process after placing each electronic component on the circuit pattern formed on the substrate portion,
次いで前記連結部を分断することにより前記捨て基板部が除去される製品基板製 造用の基板構造であって、  Next, a substrate structure for producing a product substrate in which the discarded substrate portion is removed by dividing the connecting portion,
前記リフロー工程後に生じる前記基板部の面方向に沿った 10mm当たりの厚み方 向に沿った反り寸法が 0. 5mm以下となるように、  The warp dimension along the thickness direction per 10 mm along the surface direction of the substrate portion generated after the reflow process is 0.5 mm or less.
前記基材部および前記捨て基板部の線膨張係数差が一定以内であることを特徴と する製品基板用の基板構造。  A substrate structure for a product substrate, wherein a difference in linear expansion coefficient between the base material portion and the discarded substrate portion is within a certain range.
[2] 基材に電子部品が実装された製品基板を製造するために、 [2] To manufacture a product substrate with electronic components mounted on the substrate,
絶縁板に積層された導体層をエッチングすることにより前記基材となる基材部と、前 記基材部に隣接形成された捨て基板部と、前記基材部および前記捨て基板部間に 形成された連結部とを有し、  Etching the conductor layer laminated on the insulating plate, forming the base material portion as the base material, the discarded substrate portion formed adjacent to the base material portion, and the base material portion and the discarded substrate portion. A connected portion,
前記基材部に形成された回路パターンに対して前記各電子部品を載置してからリ フロー工程を経て前記各電子部品が実装され、  Each electronic component is mounted through a reflow process after placing each electronic component on the circuit pattern formed on the substrate portion,
次いで前記連結部を分断することにより前記捨て基板部が除去される製品基板製 造用の基板構造であって、  Next, a substrate structure for producing a product substrate in which the discarded substrate portion is removed by dividing the connecting portion,
前記導体層と、前記導体層を被覆するレジスト層とが積層された積層部が前記捨 て基板部に設けられていないことを特徴とする製品基板用の基板構造。  A substrate structure for a product substrate, wherein a laminated portion in which the conductor layer and a resist layer covering the conductor layer are laminated is not provided on the substrate portion.
[3] 基材に電子部品が実装された製品基板を製造するために、 [3] In order to manufacture product boards with electronic components mounted on the substrate,
絶縁板に積層された導体層をエッチングすることにより前記基材となる基材部と、前 記基材部に隣接形成された捨て基板部と、前記基材部および前記捨て基板部間に 形成された連結部とを有し、  Etching the conductor layer laminated on the insulating plate, forming the base material portion as the base material, the discarded substrate portion formed adjacent to the base material portion, and the base material portion and the discarded substrate portion. A connected portion,
前記基材部に形成された回路パターンに対して前記各電子部品を載置してからリ フロー工程を経て前記各電子部品が実装され、 After placing each electronic component on the circuit pattern formed on the base material, Each electronic component is mounted through a flow process,
次いで前記連結部を分断することにより前記捨て基板部が除去される製品基板製 造用の基板構造であって、  Next, a substrate structure for producing a product substrate in which the discarded substrate portion is removed by dividing the connecting portion,
前記基材部および前記捨て基板部の配列方向に沿って前記捨て基板部にスリット が形成されていることを特徴とする製品基板用の基板構造。  A substrate structure for a product substrate, wherein a slit is formed in the discarded substrate portion along an arrangement direction of the base material portion and the discarded substrate portion.
[4] 前記捨て基板部に所定間隔でレジスト層が形成されていることを特徴とする請求項 [4] The resist layer is formed at predetermined intervals on the discarded substrate portion.
2および請求項 3のうちのいずれかに記載の製品基板用の基板構造。 4. A substrate structure for a product substrate according to any one of claims 2 and 3.
[5] 基材に電子部品が実装された製品基板を複数製造するために、 [5] To produce multiple product boards with electronic components mounted on the substrate,
絶縁板に積層された導体層をエッチングすることにより前記各基材となる複数の基 材部を同一面に沿って形成するとともに、前記各基材部を囲むように枠状の捨て基 板部を形成し、かつ、前記各基材部および前記捨て基板部間に連結部を形成した 製品基板用の基板を製造しておき、  By etching the conductor layer laminated on the insulating plate, a plurality of base material portions serving as the respective base materials are formed along the same surface, and a frame-shaped discarded base plate portion is provided so as to surround the respective base material portions. And manufacturing a substrate for a product substrate in which a connecting portion is formed between each base material portion and the discarded substrate portion,
前記基材部に形成した回路パターンに対して前記各電子部品を載置してからリフ ロー工程を経て前記各電子部品を実装し、  After mounting each electronic component on the circuit pattern formed on the base material portion, the electronic component is mounted through a reflow process,
次いで前記各連結部を分断することにより前記捨て基板部を除去する製品基板の 製造方法であって、  Next, a method of manufacturing a product substrate in which the discarded substrate portion is removed by dividing each of the connecting portions,
前記捨て基板部に対応した枠部と、前記枠部内に設けられて前記各連結部に対 応する格子部とを有する治具に前記製品基板用の基板を載置することを特徴とする 製品基板の製造方法。  The product substrate is placed on a jig having a frame portion corresponding to the discarded substrate portion and a lattice portion provided in the frame portion and corresponding to each of the connecting portions. A method for manufacturing a substrate.
[6] 前記治具を一対用いることにより前記製品基板用の基板を厚み方向に挟持するこ とを特徴とする請求項 5に記載の製品基板の製造方法。  6. The method for producing a product substrate according to claim 5, wherein the product substrate is sandwiched in the thickness direction by using a pair of the jigs.
[7] 請求項 1ないし請求項 4のうちのいずれかに記載した製品基板用の基板構造により 得られた製品基板が用いられたことを特徴とする電子機器。 [7] An electronic device comprising a product substrate obtained by the substrate structure for a product substrate according to any one of claims 1 to 4.
PCT/JP2006/304140 2006-03-03 2006-03-03 Board structure for product board, product board manufacturing method, and electronic apparatus WO2007099641A1 (en)

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