WO2006129779A1 - 半導体記憶装置 - Google Patents
半導体記憶装置 Download PDFInfo
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- WO2006129779A1 WO2006129779A1 PCT/JP2006/311050 JP2006311050W WO2006129779A1 WO 2006129779 A1 WO2006129779 A1 WO 2006129779A1 JP 2006311050 W JP2006311050 W JP 2006311050W WO 2006129779 A1 WO2006129779 A1 WO 2006129779A1
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Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/60—Protecting data
- G06F21/62—Protecting access to data via a platform, e.g. using keys or access control rules
- G06F21/6218—Protecting access to data via a platform, e.g. using keys or access control rules to a system of files or objects, e.g. local or distributed file system or database
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/08—Address circuits; Decoders; Word-line control circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K23/00—Pulse counters comprising counting chains; Frequency dividers comprising counting chains
- H03K23/40—Gating or clocking signals applied to all stages, i.e. synchronous counters
- H03K23/50—Gating or clocking signals applied to all stages, i.e. synchronous counters using bi-stable regenerative trigger circuits
Definitions
- the present invention relates to a semiconductor memory device that can be rewritten overnight, a semiconductor memory device that is sequentially accessed, and a data write control method for a semiconductor memory device that is sequentially accessed.
- Semiconductor memory devices that can rewrite data are often used as storage devices for various electronic devices.
- Such a semiconductor memory device does not restrict rewriting of input data that satisfies a predetermined data condition in an electronic device, but restricts rewriting of input data that does not satisfy the data condition. It may be desirable to use it in For example, the rewrite is executed only when “the rewrite data is larger than the data stored in the semiconductor memory device (referred to as“ data to be rewritten ”). Or the data condition “rewrite is executed only when the rewritten data is smaller than the data to be rewritten”.
- a technique for controlling the overnight writing to the storage device for example, a technique for installing a write prohibition device for the storage device outside the storage device is known. Or, when using the storage device, it is behind the storage area in the storage device. There is known a technique for prohibiting writing to a data storage area by writing information indicating that writing to the data storage area is not permitted in the address.
- a semiconductor memory device that permits only sequential access to data cells in a memory array, for example, E EP PROM. Since such a semiconductor storage device is relatively inexpensive, it is used as a storage device for holding data relating to the remaining amount or consumption of consumer materials.
- the value of the written data is The value must be greater than the value of existing data already stored in the memory array.
- the value of the data to be written must be smaller than the value of the existing data already stored in the memory array. Disclosure of the invention
- data input to the semiconductor memory device may be garbled during transfer.
- the semiconductor memory device Incorrect data will be recorded in. That is, for example, when data has a characteristic of increasing, there is a possibility that a data value smaller than the existing data may be written to the semiconductor memory device.
- data on the remaining amount or consumption of consumables is used to control or prevent damage or malfunction of equipment that uses consumables, If the data changes in the opposite direction to the original increase / decrease characteristics, there may be a problem with the equipment that uses the consumables.
- the present invention has been made to solve the above-described problems, and an object of the present invention is to limit the writing of data having a value contrary to the increase / decrease characteristics of write data in a semiconductor memory device.
- the present invention also provides a predetermined memory device in a semiconductor memory device. The purpose is to prohibit writing of input data that does not satisfy the conditions.
- a semiconductor memory device includes a nonvolatile memory array that has a write limit storage address in a predetermined address unit for storing data having an increasing characteristic value, and is sequentially accessed.
- Write data holding means for holding the write data to be written to the write restriction storage address in a predetermined address unit; and the held write data in the predetermined address unit with respect to the write restriction storage address.
- a data writing means for writing data, a reading means for reading the existing data stored in the write restriction storage address in the memory array, and a value of the held write data is the read existing data.
- Determining means for determining whether or not the value is less than a value of If the value of over data is less than the value of the existing data, the write de with respect to the write restricted storage Adoresu of the memory array by the write means - and a not run evening writing control unit.
- control unit writes the write data to the write restriction storage address when the value of the write data is equal to or greater than the value of the existing data. May be executed.
- the determination unit determines whether or not the value of the stored write data is less than the value of the read existing data. If the write data value is greater than or equal to the existing data value by the control unit, the write means writes the write data to the write limit storage address of the memory array. In addition, when the value of the write data is less than the value of the existing data, the control unit does not execute the writing of the write data to the write limit storage address. Therefore, it is possible to limit the overnight writing of a value contrary to the characteristics of the write data whose value increases.
- the write restriction storage memory When the number of dresses is n times the predetermined address unit (n is a natural number), the determination means sets the value of the write data to the existing data for each predetermined address unit. The controller determines whether the value of the existing data is less than the value of the write data at any address in the write restriction storage address. It is not necessary to execute the writing of the write data by the writing means for all the write limit storage addresses in the array.
- the control unit In the semiconductor memory device according to the first aspect of the present invention, in all the write restriction storage addresses, when the value of the write data is not less than the value of the existing data, the control unit The write-in overnight write for the write-restricted storage address may be executed.
- the determination unit reads the write data from the write data holding unit every time the existing data is read by the read unit for each address. It may be read for each address, and it may be determined whether or not the value of the written data is less than the value of the existing data that has been read. In such a case, it is determined whether the value of the write data is less than the value of the existing data that has been read without requiring a configuration for storing the existing data that has been read. be able to.
- the determination unit holds the existing data in the predetermined address unit read for each address by the reading unit and the write data holding unit. It may be determined whether or not the value of the write data is less than the value of the existing data that has been read using the write data in units of the predetermined address. In such a case, the prescribed key It is possible to determine whether or not the value of the write data is less than the value of the existing data that has been read, collectively by the address unit.
- data is stored in order from the most significant bit in the write limit storage address in the memory array, and the data writing means is stored in the memory array.
- the data writing means is stored in the memory array.
- the semiconductor memory device stores the data having the characteristic that the value decreases.
- a nonvolatile memory array that is sequentially accessed, and write data holding means for holding write data to be written to the write limit storage address in a predetermined address unit;
- the stored write data is stored in the write limit storage address in the memory array, and a data write means for writing the stored data in the predetermined address unit with respect to the write limit storage address.
- Reading means for reading the existing data, and the stored write data value is stored in the read existing data.
- Determining means for determining whether or not the value is greater than the value of the existing data; and when the value of the writing and writing data is larger than the value of the existing data, the writing means And a control unit that does not write the write data to the write restriction storage address of the memory array.
- control unit may execute the writing of the write data to the write restriction storage address when the value of the write data is equal to or less than the value of the existing data.
- the semiconductor memory device has the data stored by the determination means. It is determined whether or not the value of the write-in overnight is larger than the value of the existing data that has been read out, and if the value of the write-in overnight is less than or equal to the value of the existing data
- the write means writes the write data to the write limit storage address of the memory array by the writing means.
- the write data is not written to the write limit storage address, so the writing of the data whose value is contrary to the characteristics of the write data whose value decreases is restricted. be able to.
- a semiconductor memory device that stores data having an increasing value as rewritable data.
- the semiconductor memory device according to the second aspect of the present invention has eight data cells in one row for sequentially accessing and storing 1-bit data, and stores the rewritable data.
- a non-volatile memory array having a write-restricted row; data receiving means for receiving write data of a multiple of 8 bits to be written to the write-restricted row of the memory array; and the received write data Of these, write data holding means for holding the write data for 8 bits, and data writing for writing the held 8-bit write data to the write-restricted row in units of 8 bits.
- control unit may be configured such that, in all of the write data in units of 8 bits, the value of the write data is greater than the value of the existing data. , For all target data cells in the write restricted row The writing of the write data may be executed.
- whether or not the value of the write data is less than the value of the existing data read by the determination unit is determined in 8-bit units. If the value of the write data is greater than the value of the existing data in all of the 8-bit write data, all the objects of the write-restricted row are written by the writing means. Write data to the data cell overnight. In addition, when the write data value is less than the existing data value in any of the 8-bit unit write data, the control unit sets the write data for all target data cells in the write restricted row. Do not perform evening writing. Therefore, it is possible to limit the overnight writing of a value contrary to the characteristics of the write data whose value increases.
- the determination means reads the write data from the write data holding means every time the existing data is read bit by bit by the read means. It may be read out bit by bit to determine whether or not the value of the write data is less than the value of the read existing data. In such a case, it is possible to determine whether or not the value of the write data is less than the value of the existing data that has been read without requiring a configuration for storing the existing data that has been read.
- the determining means includes the existing data of a multiple of the 8-bit read by the reading means for every 1 bit, and the write data holding means. It is also possible to determine whether or not the value of the write data is less than the value of the read existing data using the 8-bit write data stored in In such a case, collect them in 8-bit units.
- the write-restricted row data is deleted.
- data is stored in order from the most significant pit, and the data writing means executes data writing in the memory array in order from the most significant bit. You may do it. In such a case, it is possible to more quickly determine whether the value of the write data is less than the value of the existing data that has been read.
- the semiconductor memory device according to the second aspect of the present invention has a 1-bit data capacity when accessed sequentially.
- a non-volatile memory array having a write-restricted row for storing the rewritable data, and a multiple of 8 bits to be written to the write-restricted row of the memory array.
- De-evening receiving means for receiving writing data, writing de-evening holding means for holding 8-bit write data among the received write data, and the retained 8-bit writing
- a data writing means for writing data to the write-restricted row in 8-bit units, and a data set for the write-restricted row in the memory array.
- Read means for reading out the existing data stored in 1 pit unit, and whether or not the value of the write data is larger than the value of the read out existing data In any one of determination means for determining each data and write data in 8-bit units, if the value of the write data is larger than the value of the existing data, all of the write-restricted rows are written by the write means. A control unit that does not write the write data to the target cell.
- control unit when the value of the write data is equal to or less than the value of the existing data, writes the write to all target data cells in the write restricted row. Data writing may be executed.
- the semiconductor memory device uses the determination means to Whether or not the value is larger than the value of the existing data that has been read is determined every time the write data is written in 8-bit units. If the value is less than the data value, write data is written to all target data cells in the write-restricted row by the writing means. In addition, when the write data value is larger than the existing data value in any of the 8-bit write data, the control unit writes the write data to all the target data cells in the write restricted row. Do not perform evening writing. Therefore, it is possible to limit the writing of data whose value is contrary to the characteristics of the write data whose value decreases.
- a non-volatile memory array having a write-restricted storage address in a predetermined address unit for storing data having an increasing value, and the data is stored in a predetermined address unit with respect to the memory array.
- a data write control method in a semiconductor memory device to which is written.
- the existing data stored in the write restriction storage address is read, and the value of the write data to be written to the write restriction storage address is: It is determined whether or not the value is less than the value of the existing data that has been read, and if the value of the write data is less than the value of the existing data, the write to the write restriction storage address It is provided that the data is not written in units of the predetermined address.
- the method according to the third aspect of the present invention is stored in the write limit storage address in the memory array.
- Read the existing data determine whether the value of the write data written to the write limit storage address is larger than the value of the read existing data, and the value of the write data When the value is larger than the value of the existing data, the write data may not be written in the predetermined address unit to the write limit storage address.
- the data write control method according to the present invention can be implemented in various aspects in the same manner as the semiconductor memory device according to the first aspect of the present invention.
- a fourth aspect of the present invention there are eight data cells in a row that are sequentially accessed and store 1-bit data, and a write-restricted row that stores rewritable data with an increasing value.
- the present invention provides a data write control method in a semiconductor memory device that includes a non-volatile memory array having data and that writes data to the memory array in units of 8 bits.
- write data of a multiple of 8 bits to be written to the memory array is received, and the write data for 8 bits of the received write data is received.
- the method according to the fourth aspect of the present invention is to write a multiple of 8 bits to be written to the memory array.
- Receiving data holding write data for 8 bits of the received write data, reading the existing data stored in the data cells of the write-restricted row in the memory array, and writing the data It is determined for each write data in 8-bit units whether or not the value of data is larger than the value of the existing data that has been read out, and in any of the write data in 8-bit units.
- the write data is not written to all the data cells in the write restricted row. You may be prepared.
- the data write control method of the fourth aspect of the present invention it is possible to obtain the same functions and effects as those of the semiconductor memory device according to the second aspect of the present invention, and the fourth aspect of the present invention.
- the data write control method according to the present invention can be implemented in various aspects in the same manner as the semiconductor memory device according to the second aspect of the present invention.
- the methods according to the third and fourth aspects of the present invention can also be realized as a program and a computer-readable recording medium that records the program.
- a fifth aspect of the present invention provides a semiconductor memory device.
- a semiconductor memory device includes: a non-volatile memory array; and a read / write controller that controls data writing to the memory array and data reading from the memory array.
- the read / write controller includes a plurality of bits of write data to be written and a plurality of bits of write data to be written when the data write to the memory array is requested.
- the multi-bit storage value stored in the storage area is compared, and the multi-bit write data satisfying a predetermined magnitude relationship is written to the multi-bit storage area.
- the multiple bits that do not satisfy the magnitude relation are written for the multiple bits. To prohibit writing to the storage area.
- the semiconductor memory device of the fifth aspect of the present invention it is possible to prohibit writing of write data that does not satisfy the predetermined magnitude relationship with respect to the stored data.
- a semiconductor memory device includes: a nonvolatile memory array; and a read / write controller that controls data writing to the memory array and data reading from the memory array, The read / write core
- the controller is stored in a multi-bit storage area to which the multi-pit write data value to be written and the multi-bit write data are to be written.
- the stored data values of the plurality of bits are compared in order from the largest bit of the plurality of bits of write data in units of one bit, and a predetermined magnitude relationship is determined with respect to the value of each bit of the stored data. If there is a bit that is determined to be satisfied, write is performed on the write data of the bit after that bit, and if there is a bit that does not satisfy the predetermined magnitude relationship, Writing is prohibited for the pit writing data after the bit.
- the predetermined magnitude relationship is not satisfied with respect to the stored data It is easy to prohibit writing of write data.
- the semiconductor memory device can also be realized as a write control method for a semiconductor memory device, a program, and a computer-readable recording medium recording the program.
- a sixth aspect of the present invention provides a semiconductor memory device.
- a semiconductor memory device is a nonvolatile memory array that stores data relating to the amount of consumption material, the consumption material amount having a characteristic of increasing value, and the memory
- a data writing means for writing new consumption material amount data to be stored in the array, a reading means for reading out the existing consumption material amount data already stored from the memory array, and the new consumption material amount data
- the value is less than the value of the existing consumption material amount data
- the writing of the new consumption material amount is not performed by the data writing means, and the value of the new consumption material amount is not the existing consumption material.
- the semiconductor memory device that can obtain the same operational effects as the semiconductor memory device according to the first or second aspect provides information on the amount of the printing recording material. It is a printing recording material container that accommodates a printing recording material that is detachably attached to a printing apparatus for storage, and may be used by being attached to a housing portion that accommodates the printing recording material. In this case, it is possible to improve the reliability of information relating to the amount of printing recording material.
- a seventh aspect of the present invention is a printing apparatus comprising: a printing apparatus; and a printing recording material container having the semiconductor storage device according to the first, second, fifth, and sixth aspects of the present invention that is detachably attached to the printing apparatus. Provide a system.
- the printing device includes a semiconductor storage device mounted on the printing recording material container, a data signal line, a clock signal line, a reset signal line, a positive power supply line, And a host computer connected by a bus via a negative power supply line, comprising: a host computer that transmits information on the amount of printing recording material consumed in the printing apparatus to the semiconductor storage device; and mounted on the printing recording material container
- the stored semiconductor memory device stores the received amount of information about the print recording material in the memory array.
- FIG. 1 is a block diagram showing a functional internal configuration of the semiconductor memory device according to the first embodiment.
- FIG. 2 is an explanatory diagram schematically showing an internal configuration map of a memory array provided in the semiconductor memory device according to the first embodiment.
- FIG. 3 shows the reset at the time of executing the read operation of the semiconductor memory device according to the first embodiment.
- 5 is a timing chart showing a temporal relationship among a clock signal RST, an external clock signal SCK, a data signal SDA, and an address counter value.
- FIG. 4 is a timing chart showing the temporal relationship between the reset signal RST, the external clock signal SCK, the data signal SDA, and the address count when the write operation of the semiconductor memory device according to the first embodiment is executed. .
- FIG. 5 is a flowchart showing the process routine of the increment confirmation process in the write process executed by the semiconductor memory device according to the first embodiment.
- FIG. 6 is a flowchart showing the process routine of the increment confirmation process in the write process executed by the semiconductor memory device according to the first embodiment.
- FIG. 7 is a flowchart showing the processing routine of the overnight verify process in the write process executed by the semiconductor memory device 10 according to the first embodiment.
- FIG. 8 is an explanatory diagram showing an example of the result of the increment confirmation process in the first embodiment.
- FIG. 9 is an explanatory view showing an application example of the semiconductor memory device according to the first embodiment.
- FIG. 10 is a block diagram showing the internal circuit configuration of the semiconductor memory device according to the second embodiment.
- FIG. 11 is a flowchart showing the procedure of the data write operation in the second embodiment.
- FIG. 12 is a block diagram showing the internal circuit configuration of the semiconductor memory device according to the third embodiment.
- FIG. 13 is a flowchart showing the procedure of the data write operation in the third embodiment.
- FIG. 14 is a flowchart showing a procedure for the overnight write operation as a modification of the third embodiment.
- FIG. 15 is a flowchart showing a procedure of data write operation as a modification of the third embodiment.
- FIG. 1 is a block diagram showing a functional internal configuration of the semiconductor memory device according to the first embodiment.
- FIG. 2 is an explanatory diagram schematically showing an internal configuration map of the memory array provided in the semiconductor memory device according to the first embodiment.
- the semiconductor memory device 10 is a sequential access type storage device that does not need to input an address address that designates an access destination address from the outside.
- the semiconductor memory device 10 has a memory array 100, an address counter 110, an I NZOUT controller 120, an ID comparator 110, a write / read controller 140, an increment controller 150, a charge pump circuit 160, an 8-bit latch register 1 Has 70. Each of these circuits is connected by a bus type signal line.
- the memory array 100 includes an EE PROM array 10 1 and a mask ROM array 10 2.
- the EEPROM array 10 0 1 is a storage area having the characteristics of an EEPROM that can electrically erase and write data.
- the EEPROM array 10 0 1 used in this embodiment is When writing, data can be written immediately without erasing existing data.
- the mask ROM array 102 is a storage area having the characteristics of an erasable and non-rewritable mask ROM in which data is written during the manufacturing process.
- Memory array 1 0 0 EE P ROM array 10 1 and mask ROM array 1 02 includes a plurality of data cells (memory cells) for storing 1-bit information schematically shown in FIG.
- the memory array 100 has 8 addresses (addresses for 8 pits of data) as a predetermined address unit in one row.
- the EEPROM array 100 1 8 rows of data cells (8 bits) in one row and 16 data cells (16 words) in one column, 16 bits x 8 bits (128 bits) ) Data can be stored.
- the mask ROM array 102 has 8 data cells (8 bits) in the] _ row and 8 data cells (8 words) in one column, 8 words x 8 bits (64 bits). ) Data can be stored.
- the address map of the memory array 100 will be described with reference to FIG.
- the memory array 100 in this embodiment includes the EEPROM array 1001 and the mask ROM array 102 as described above.
- Identification information (ID information) for identifying each semiconductor memory device is stored in the first 3 addresses (A0 to A2 column in the first row, 3 pits) of the EEPROM array 101. Writing to the first line including the first three addresses is prohibited, and for example, it cannot be rewritten after shipment from the factory.
- the 9th address (08H) to 16th address (0 FH) and 17th address (10H) to 24th address (07H) of EE PROM array 10 1 are subject to certain conditions.
- a line composed of the ninth address to the 16th address and the 17th address to the 24th address is a write-restricted line, or the ninth address to the 16th address and
- the 8th address from the 1st 77th address to the 24th address may be called a write limit storage address in a predetermined address unit.
- the stored information is information related to ink consumption
- the value of the data to be written is greater than the value of the existing data, or the stored condition is stored. If the information is about ink level, it will be written This is a case where the value of the de-evening is smaller than the existing value of the de-evening.
- E E P RO M Array ⁇ 0 1 and after the 2nd 5th address become a read-only area where writing is prohibited. For example, it cannot be rewritten after shipment from the factory.
- the mask ROM array 1 0 2 is written with information (data) when the memory array is manufactured, and after the memory array is manufactured, it cannot be written even before the factory shipment.
- the memory array 100 includes a plurality of rows in units of 8 bits. However, each row is not an independent data cell column. This is realized by bending in bit units. In other words, for the sake of convenience, the row containing the 9th bit is simply called the second byte, and the row containing the 17th bit is simply called the 3rd byte.
- sequential access method in order to access from the head sequentially, so-called sequential access method, and to the desired address possible in the random access method. Direct access is not possible.
- Each cell in memory array 100 is connected to a single line and a bit (data) line.
- Select the corresponding word line (row) (apply a selection voltage) Data is written to the cell by applying a write voltage to the bit line.
- select the corresponding grid line (row) connect the corresponding bit line to the IN / OUT controller 1 2 0, and read the data (1 or 0) of the cell depending on whether current is detected or not. It is.
- the predetermined address unit in the present embodiment can be said to be the number of addresses (number of cells that can be written) that can be written by applying a write voltage to one word line.
- the column selection circuit 1 0 3 sequentially connects the columns (pit lines) to the IN / OUT controller 1 2 0 according to the number of external clock pulses counted by the address counter 1 1 0.
- Row selection circuit 1 0 4 applies selection voltage to rows (word lines) sequentially according to the number of external clock pulses counted by address count 1 1 0 To do. That is, in the semiconductor memory device 10 according to the present embodiment, access to the memory array 100 using the address data is not executed, and a desired address is exclusively determined according to the number of clock pulses counted by the address counter 110. Access to is performed.
- the address counter 1 1 0 is connected to the reset signal terminal RSTT, the clock signal terminal S CKT, the column selection circuit 10 3, and the row selection circuit 10 4.
- the address counter 1 1 0 is reset to the initial value by setting the reset signal input via the reset signal terminal RSTT to 0 (or low). After the reset signal is set to 1, the external clock signal terminal S The number of clock pulses is counted in synchronization with the falling edge of the clock pulse input via CKT (count value is incremented).
- the address counter 110 used in this embodiment is an 8-bit address counter that stores the number of eight clock pulses corresponding to the number of data cells (number of bits) in one row of the memory array 100.
- the initial value may be any value as long as it is associated with the head position of the memory array 100, and generally 0 is used as the initial value.
- the IN / OUT controller 120 transfers the write data input to the data signal terminal S DAT to the memory array 100, or receives the data read from the memory array 100 and receives the data signal. This is a circuit for outputting to the terminal S DAT.
- the IN / OUT controller 1 20 is connected to the data signal terminal SDAT, the reset signal terminal RS TT, the memory array 100, and the write ⁇ read controller 140, and in response to a request from the write / load controller 140, the memory array Controls the data transfer direction for 100 and the data transfer direction (for the signal line connected to data signal terminal SDAT) for data signal terminal SDAT.
- Input signal line from S DAT is connected to 8-bit latch register 1 70 for temporarily storing the write data input from data signal terminal S DAT Yes.
- the 8-bit latch register 170 holds the data string (MS B) input from the data signal terminal SDAT via the input signal line until it reaches 8 bits.
- the 8-bit data held for 1 is written.
- the 8-bit latch register 170 is a so-called FIFO type shift register. When the 9th bit of the input data is newly latched, the already latched 1st pit data is released.
- the NZOUT controller 120 sets the data transfer direction for the memory array 100 to the read direction, and connects the input signal line between the 8-pit latch register 1 70 and the IN / OUT controller 120.
- Data input to the data signal terminal S DAT is prohibited by using high impedance. This state is maintained until a write processing request is input from the write / read controller 14. Therefore, the data of the first 4 bits of the data string input via the data signal terminal S DAT after the reset signal is input is not written to the memory array 100, while the first 4 of the memory array 100 The data stored in the bit (the fourth bit is don't care) is sent to the ID comparator 1 30. As a result, the first 4 bits of the memory array 100 are read-only.
- ID Comparator 1 30 is connected to clock signal terminal S CKT, data signal terminal SD AT, and reset signal terminal RSTT, and the identification data included in the input data string input via data signal terminal SDAT And whether or not the identification data stored in memory array 100 (EE PROM array 1 0 1) matches. More specifically, the ID comparator 100 acquires the first 3 bits of the operation code input after the reset signal RST is input, that is, identification data.
- ID Comparator 1 30 is a 3-bit register (not shown) that stores the identification data included in the input data string, and the most significant 3 bits of the ID obtained from memory array 100 via IN node OUT controller 120 Data It has a 3-bit register to store (not shown), and determines whether or not the identification data matches depending on whether or not the values in both registers match.
- the ID comparator overnight 130 sends an access permission signal EN to the write / read controller 140.
- the write / read controller 140 has the IN / OUT controller 1 20, the ID comparator 1 30, Increment controller 1 50, Charge pump circuit 1 60, Clock signal terminal S CKT, Data signal terminal SDAT, Reset signal terminal RS TT.
- the write load controller 140 writes the Z read control information (following the 3-bit ID information 4) that is input via the data signal terminal SDAT in synchronization with the fourth clock signal after the reset signal RST is input.
- the write / read controller 140 analyzes the acquired write / read command when the access enable signal AEN from the ID comparator 130 and the write enable signal WEN 1 from the increment controller WEN 1 are input. To do. If the write Z read controller 140 is a write command, the write enable signal WEN that switches the data transfer direction of the path signal line to the write direction and permits the write to the IN / OUT controller port # 1 120. 2 is transmitted and the charge pump circuit 160 is requested to generate a write voltage.
- the write data DI force value to be written to the write-restricted row is data having a characteristic of increasing (incrementing)
- the write data DI is compared with the existing data DE already stored in the write-restricted row. If the write data DI has a characteristic that the value decreases (decrement), the write data DI is already included in the write restriction row. By judging whether or not the value is smaller than the existing existing DE, the write data DI becomes garbled, and erroneous data input is reduced or prevented.
- This function is provided by the increment controller in the former case and by the decrement controller in the latter case. In this embodiment, the former will be described as an example in the following description.
- the increment controller 150 is connected to the reset signal terminal R S TT, the write / read controller 140, and the charge pump circuit 160 through signal lines.
- the increment controller 150 has a 4-bit count 15 1 and an 8-bit internal register 1 52, 15 3 inside.
- Increment controller 1 50 determines whether or not the write data DI written to the write restriction line is larger than the existing data DE already stored in the write restriction line, and further EEPROM Determine whether or not the data written to array 10 1 has been written correctly (verify, verify).
- the increment controller 150 reads the existing data DE from the write restriction row of the EE PROM array 1 0 1 at the timing when the write data DI is latched in the 8-pit latch register 1 70, and prepares the internal 8-bit internal register 1 52 To store.
- the increment controller 150 compares the existing data ED to be read with the write data DI input to the 8-bit latch register 1 70 in 1-bit units, and the write data DI is It is determined whether the data is larger than that. In order to speed up the processing, it is desirable that the input data input is MS B.
- the increment controller 150 outputs a write enable signal WEN 1 to the write Z read controller 140 when the write data DI is larger than the existing data DE. Note that if there are multiple write-restricted rows, increment controller 1 only if the write data DI is larger than the existing data DE in all write-restricted rows. 50 outputs the write enable signal WEN 1.
- the increment controller 150 verifies whether the data has been written correctly. If the write data is not written correctly, the increment controller 150 reads the internal 8-bit internal register 1 52 The existing stored DE overnight is written back to the memory array 100.
- the 4-pit counter 1 5 1 provided in the increment controller 1 50 is 8 bits behind the external clock signal from the write stamp state, and the charge pump circuit 1 6 0
- the internal oscillator provided in 164 receives an internal clock signal from 62 and starts counting up. The count value counted up by the 4-bit counter 1 51 is input to the column selection circuit 103 and the row selection circuit 104, and the existing data DE just written is read out.
- the charge pump circuit 1 6 0 sets the column selection circuit 1 0 3 based on the request signal from the write Z read controller 140 0 and the write voltage required for writing data to the EE PROM array. This is a circuit for supplying to the selected bit line.
- the charge pump circuit 160 includes an internal oscillator 162 that generates an operation frequency necessary for voltage boosting, and generates a necessary write voltage by boosting a voltage obtained via the positive power supply terminal VDDT.
- FIG. 3 is a timing chart showing the temporal relationship of the reset signal RST, the external clock signal S CK :, the data signal SDA, and the address count value during the read operation of the semiconductor memory device according to the first embodiment. .
- the identification information confirmation and read Z write command confirmation processing based on the operation code will be described.
- a data signal SDA including a 4-pit operation code is input from the strike computer to the data signal terminal S DAT in synchronization with the external clock signal.
- the operation code includes identification information ID 0, ID 1, and ID 2 in the first 3 bits, and the command bit for determining write or read in the 4th bit from the beginning. .
- the comparison of identification information is performed as follows.
- the ID comparator evening 1 30 is the data input to the signal terminal S DAT in synchronization with the rising edges of the three clock signals SCK after the reset signal RST is switched from low to high, that is, Acquire 3-bit identification information and store it in the first 3-bit register.
- the ID comparator 1 3 0 acquires data from the address of the memory array 1 00 specified by the count value 00, 0 1 and 0 2 of the address counter 1 1 0, that is, to the memory array 100. Get the stored identification information and store it in the second 3-bit register.
- the ID comparator overnight 130 determines whether or not the identification information stored in the first and second registers match. If the identification information does not match, the I NZOUT controller 120 sets the 8-bit value. ⁇ ⁇ The high impedance state for the input signal line between the latch register 1 70 and the I NZOUT controller 1 20 is maintained. On the other hand, the ID comparator 130 outputs the access permission signal AEN to the write / read controller 140 when the identification information stored in the first and second registers coincides. The line / read controller 140 that has received the access permission signal AEN sends the command sent to the bus signal line in synchronization with the rising edge of the fourth clock signal SCK after the reset signal RST switches from low to high. A pit is acquired to determine whether or not it is a write command.
- the write / read controller 140 outputs a read command to the I NZOUT controller 120 if the acquired command bit is not a write command.
- the I NZQUT controller 120 changes the data transfer direction for the memory array 100 to the read direction and allows the data transfer. Since address count 1 1 0 is counted up in synchronization with the falling edge of the clock signal S CK, the address count value of address counter 1 1 0 after the operation code is input is 04, and memory array 1 00 The data is read from the existing DE stored in 04H.
- the existing data DE stored in the memory array is sequentially output to the data signal terminal S DAT via the IN / OUT controller 120 in synchronization with the falling edge of the clock signal S CK.
- Overnight DE is held until the next falling edge of clock signal SCK.
- the count value at address count 110 is incremented by one.
- the existing data DE stored in the next address (de-activate cell) in memory array 100 is stored.
- Data signal output to SDAT. This operation is repeated in synchronization with the clock signal S CK until the desired address is reached. That is, since the semiconductor memory device 10 in this embodiment is a sequential access type memory device, the host computer issues the number of clock signal pulses corresponding to the address to be read or written, and Counter 1 1 0 The counter value must be incremented to the count value corresponding to the given address. As a result, the existing data DE is read sequentially from the address specified by the count value of the address counter 110 which is sequentially incremented in synchronization with the clock signal SCK.
- the memory array 100 of the semiconductor memory device 10 has only addresses 00H to BFH, but the address counter 110 is counting up to the address FFH.
- the addresses C 0 H to FFH are pseudo areas, and the corresponding addresses do not exist in the memory array 100. During the period in which such pseudo areas are accessed, the value is relative to the data signal terminal SDAT. “0” is output.
- address count count 1 10 counts up to address FFH, the address returns to address 00H.
- a reset signal RST of 0 or LOW is input from the host computer, and the semiconductor memory device 10 It will be in a waiting state for accepting a pellet code.
- FIG. 4 is a timing chart showing the temporal relationship between the reset signal RST, the external clock signal SCK, the data signal SDA, and the address count value during the write operation of the semiconductor memory device according to the first embodiment. .
- writing is executed in row units (8-bit units), that is, in predetermined address units (8 address units).
- the write read controller 140 receives the write enable signal WEN 1 from the increment controller 1 50 while the acquired command bit is a write command.
- write enable signal WEN2 is output to I NZOUT controller 120.
- 4 clock signals are input to the clock signal terminal S CKT as a dummy write clock, and a write standby state is set. Since address count 1 1 0 is counted up in synchronization with the falling edge of the clock signal S CK, the counter value of address counter 1 10 after the write standby state is 08, starting from address 08 H of memory array 100 De Ichiba will be written.
- 16-bit write data is written to a memory array 100 of 8 bits per row.
- first write data The 8-bit data from the most significant bit (MSB) of DI is sequentially latched into the 8-bit latch registers 1 to 0 in synchronization with the rising edge of the clock signal SCK.
- the write enable signal WEN 2 is output to the I NZOUT controller 120, the existing data after the 8th address of the memory array 100 are sequentially synchronized with the falling edge of the clock signal SCK.
- the I NZOUT controller 1 2 0 that has received the write enable signal WEN 2 changes the data transfer direction to the memory array 1 0 0 to the write direction, and the signal line high between the 8-bit latch register 1 7 0 and the I NZOUT controller Cancel the impedance setting and allow data transfer.
- the value (0 or 1) of the write data DI is transferred to each bit line of the memory array 100.
- the write / read controller 140 requests the charge pump circuit 160 to generate the write voltage after the rising edge of the clock signal SCK in the eighth cycle after the write standby state, and the generated write The voltage is applied to the bit line selected by the column selection circuit 10 3, in this embodiment all the pit lines.
- the 8-bit data stored in the 8-bit latch register 1 7 0 “1” and “0” are written to the write limit line at once.
- the 8-bit existing data DE just written is output from the IN / OUT controller 120, and stored in the 8-bit internal register 1 53 of the increment controller 150 through the I NZO UT controller 120. Is done. Increment controller 1 50 determines whether the existing 8-bit data DE stored in 8-bit internal register 1 53 matches the 8-bit write data DI stored in 8-bit latch register 1 70. Verify whether or not.
- the write data DI is 16-bit long data
- the write data sent from the host computer has the same value (0 or 1) as the data currently stored in the memory array 100, except for the data corresponding to the address to be rewritten. ing. In other words, the address data that cannot be rewritten in the memory array 100 is overwritten with the same value.
- FIGS. 5 to 8 an increment confirmation process and a data verification process in the write process executed by the semiconductor memory device 10 according to the first embodiment will be described.
- FIG. 5 and FIG. 6 are flowcharts showing the processing routine of the increment confirmation processing in the writing processing executed by the semiconductor memory device 10 according to the first embodiment.
- FIG. 7 is a flowchart showing a processing routine of data verification processing in the writing processing executed by the semiconductor memory device 10 according to the first embodiment.
- FIG. 8 is an explanatory diagram showing an example of the result of the increment confirmation process in the first embodiment.
- the increment controller 150 sets the memory array at the timing when the 1-byte write data DI 1 is latched in the 8-bit latch register 170 in the 16-bit (2 bytes) long write data DI.
- Read the corresponding existing data DE 1 stored in the first write-restricted row of 100 in 1-bit units (step S100). Thereafter, each 1-bit existing data DE l constituting the 8-bit existing data DE 1 stored in the first write restriction row is defined as an existing data DE ln (n l to 8).
- the increment controller 150 synchronizes with the falling edge of the clock signal SCK used when latching the write data DI 2 n of the second byte to the 8-bit latch register 170.
- the I NZOUT controller 120 The corresponding existing data DE 1 stored in the first write-restricted row of the memory array 100 is read out in 1-bit units. Note that the address of the memory array 100 to which the first byte write event should be written is the first write restriction row.
- the 8 address is a predetermined unit address.
- the increment controller 150 reads the 1-bit write data DI1 latched in the 8-bit latch register 170 at this timing (step S102).
- the write data DI is input to the semiconductor memory device 10 in order from the most significant bit (MSB), and the write data DII n is sequentially latched in the 8-bit latch register 170 by the MS B. Is done.
- Increment controller 150 determines whether the value of write data DI 1 n read from 8-bit latch register 1 70 is greater than or equal to the value of existing data DE 1 n read from the first write limit row of memory array 100. That is, it is determined whether DI 1 n ⁇ DE 1 n (step S 1 04). If the increment controller 150 determines that D I 1 n ⁇ DE 1 n (step S 1 04: No), the process routine ends. That is, the write data is not written. Note that FIG. 5 describes whether or not the value of the write data DII n is equal to or greater than the value of the existing data DE 1 n, that is, the determination of DI 1 n ⁇ DE 1 n.
- step S 1 06 Ye s
- the existing data DE I n read from the first write-restricted row is internally stored as 8 bits. Store in internal register evening 1 52 (step S106).
- Increment controller 150 finishes comparing 8-bit existing data DE 1 n stored in the first write-restricted row with 8-bit write data DI 1 n stored in 8-bit latch register 1 70 (Step S 108), and if it is determined that it has not been completed (Step S108: N o) Repeat steps S 100 to S 106.
- the increment controller 150 compares the 8-bit existing data DE 1 n stored in the first write limit row with the 8-bit write data DI 1 n stored in the 8-bit latch register 1 70. If it is determined that the data has been completed (step S 10 8: Y es), the write data DI 1 stored in the 8-bit latch register 170 is written to the first write-restricted row in the memory array 100 (Step S 1 1 2). That is, DE 1 D I 1 and write data D I 1 become new existing data DE 1. In more detail, as described above, the increment controller 150 does not directly write the write data DI 1 to the memory array 100, but the write data stored in the 8-bit latch register 170. Overnight DI 1 is permitted to be written to the first write-restricted row of memory array 100. Write enable signal WEN 1 is output to write Z read controller 140 and write enable signal WEN 1 is received. Write Write is performed by the Z read controller 140.
- Increment controller 150 executes data verification processing (step S 1 1 2), and if writing has been completed normally (step S 1 14: Ye s), A and after in FIG. Perform steps. On the other hand, the increment controller 150 executes the data verification process (step S 1 1 2). If the write is not completed normally (step S 1 14: No), the write process is completed. End the process.
- the increment controller 150 reads the existing data DE 1 just written from the first write-restricted row of the memory array 100 (step S 200), and the write data stored in the 8-bit latch register 170. Compare with DI 1 (step S 2 1 0). Specifically, the increment controller 150 is connected to the charge pump circuit 160 in the clock period after the completion of the 1st write. The 4-bit counter 1 5 1 is incremented using the internal clock signal generated by the internal oscillator 1 62.
- the increment controller 150 inputs the count value of the 4-bit counter 15 1 to the column selection circuit 1 0 3 and the mouth selection circuit 1 04, and the data written from the first write restriction row of the memory array 100 is 8
- the existing bit data DE 1 is read out in order of address via the IN / OUT controller 120 and latched in the 8-bit internal register 1 53.
- the internal clock signal is output with a delay of 8 bits (8 clocks) from the write standby state.
- the increment controller 150 uses the existing data DE 1 latched in the 8-bit internal register 1 53 and the write data used for writing to the first write-restricted row latched in the 8-bit latch register 1 70. It is determined whether DI 1 matches (step S204). The increment controller 150 reads the existing data DE 1 stored in the 8-bit internal register 1 53 read from the first write restriction row and the write data DI 1 stored in the 8-bit latch register 1 70. If they match (Step S204: Yes), it is determined that the writing has been normally completed (Step S206), and this processing routine is completed.
- increment controller 1 50 is DE 1 ⁇ DE 1. If it is determined that it is M (step S 2 1 0: No), the existing data DE 1 before writing stored in the 8-bit internal register 1 52 is used as the first write limit of the memory cell 1 0 0. Write back to the line (step S 2 1 2) and end this processing routine. If a write error is determined, the remaining write data DI 2 is not written to the second write-restricted row.
- the write-back process is performed in the write process cycle for the second write-restricted row.
- the existing data DE 1 stored in the 8-bit latch in the DI 2 write cycle. ld is input to the I NZOUT controller 120 and the write process for the first write-restricted row of the memory array 100 is executed in the same manner as the data input via the data signal terminal SDAT.
- the data in the first and second write restricted rows of the memory array 100 is returned to the value before the execution of the write process.
- the increment controller 150 has the write data for the second byte.
- the read controller 150 reads the write data D I 2 n latched in the 8-bit latch register 1 70 at this time (step S 1 1 8).
- the write data DI is input to the semiconductor memory device 10 in order from the most significant bit (MS B), and the 8-bit latch register 170 is sequentially latched with the write data DI 2 n by the MSB. Is done.
- Increment controller 150 has the value of write data DI 2 n read from 8-bit latch register 1 70 greater than the value of existing data DE 2 n read from the first write limit row of memory array 100 It is determined whether or not DI 2 n> DE 2 n (step S 120). If the increment controller 150 determines that DI 2 n ⁇ DE 2 n (step S 120: No), the process routine ends. That is, the write data D I 2 is not written.
- step S 120 determines that DI 2 n> DE 2 n (step S 120: Y es)
- the 8-bit existing data DE 2 stored in the second write restriction row DE 2 Determine whether the comparison between n and the 8-bit write data DI 2 n stored in 8-bit latch register 1 70 has been completed (step S 1 22), and if it has not been completed (Step S 122: No), Steps S 1 1 6 to S 1 20 are repeatedly executed.
- the increment controller 150 compares the 8-bit existing data DE 2 n stored in the second write restriction row and the 8-bit write data DI 2 n stored in the 8-bit latch register 1 70. If it is determined that it has been completed (Step S 1 22: Y es), write the write data DI 2 stored in the 8-bit latch register 170 to the second write restriction row of the memory array 100 (Step S 1 24), This processing routine is completed. That is, DE 2 is equal to D 1 2, and write data DI 2 becomes new existing data DE 2. More specifically, as described above, the increment controller 150 does not directly execute the write of DI 1 to the memory array 100, but the write data stored in the 8-bit latch register 1 70. Write Z that outputs write enable signal WEN 1 to write controller 140 and receives write enable signal WEN 1 to allow writing of DI 2 to the second write restriction row of memory array 1 0 0 Writing is performed by the read controller 140.
- Figure 8 shows memory array 1
- the address of 00 is taken on the horizontal axis, the left end is the most significant bit (MS B) and the right end is the least significant bit (LSB). Addresses 0 8 to 0 F correspond to the first write restriction row, and addresses 10 to 17 correspond to the second write restriction row.
- the write data D I 1 corresponding to the first write-restricted row matches the existing data DE 1 and the write data corresponding to the second write-limited row D 1
- the write data DI 1 corresponding to the first write-restricted row matches the existing data DE 1
- the write data DI 2 corresponding to the second write-restricted row is the existing data DE Since it is smaller than 2, writing is not allowed.
- the write data DI 1 corresponding to the first write-restricted row is larger than the existing data DE 1 but the write data DI 2 corresponding to the second write-restricted row is Write is not allowed because it is smaller than the existing data DE 2.
- the write data DI 1 corresponding to the first write restricted row is already Since it is smaller than the existing data DE 1, writing is not permitted regardless of the magnitude relationship between the writing data DI 2 corresponding to the second write restricted line and the existing data DE 2.
- FIG. 9 is an explanatory diagram showing an application example of the semiconductor memory device according to the first embodiment.
- the semiconductor memory device 10 according to the first embodiment is provided in a storage container for storing a consumption material, for example, an ink storage body 3 10, 3 1 1, 3 1 2 for storing ink as a printing recording material. It is done.
- a storage container for storing a consumption material for example, an ink storage body 3 10, 3 1 1, 3 1 2 for storing ink as a printing recording material. It is done.
- each ink container 3 10, 3 1 1, 3 1 2 is attached to the printing apparatus, it is connected to the host computer 3 0 0 provided in the printing apparatus via a bus.
- the data signal line SDA, the clock signal line SCK, the reset signal line RST, the positive power supply line VDD, and the negative power supply line VSS from the host computer 3 0 0 are connected to the respective ink containers 3 1 0, 3 1 1, 3 1 is connected to the semiconductor memory device 10 provided in 2.
- information on the amount of ink such as the remaining amount of ink or the amount of ink consumed is stored in the semiconductor memory device 10.
- the semiconductor memory device 10 As described above, according to the semiconductor memory device 10 according to the first embodiment, only the write data DI having a value larger than that of the existing device DE is written in the semiconductor memory device 10. Therefore, it is possible to improve the update accuracy of data that has the characteristic that the value increases. In other words, if the write data DI sent from the host computer has been changed to a value smaller than the previous value due to noise, or a value smaller than the previous value was sent by mistake from the host computer. In this case, writing to the semiconductor memory device 10 is not executed. Therefore, when the device is controlled based on the consumption of the consumable material, for example, when the ink head air blow prevention in the ink jet printer is monitored by the ink consumption, It is possible to suppress or prevent the head damage with higher accuracy. Modification of the first embodiment:
- the ink cartridge is used as an application example, but the same effect can be obtained with the toner cartridge.
- the same effect can be obtained when applied to a medium storing currency equivalent information such as prepaid cards.
- the 4-bit counter and the internal oscillator 16 2 are used in the verify process.
- the verify process may be executed without using these circuits. That is, in the above embodiment, the existing data DE 1 latched in the 8-bit internal register 15 3 and the write DI 1 latched in the 8-bit latch register 1 70 are verified in units of 8 bits. Although it is executed, it may be executed in 1-bit units. In such a case, the increment ⁇ controller 1 5 0 is a 4-bit count 1 5 1 and 8-bit internal register. There is no need to have 1 5 3.
- the increment controller 1 5 0 is the first byte of the memory array 1 0 0 at the timing when each bit of the write data DI 2 of the second byte is latched by the 8-bit latch register 1 7 0.
- the existing data DE 1 is read, for example, in the verify process (when the write data D 12 of the second byte is latched), the column selection circuit 1 0 3 and the row selection circuit 1 0 4 force address count 1 It is only necessary to subtract 8 counts from the count value input from 10 and select the memory array 100 0 read out using the subtracted count value.
- the column selection circuit 1 0 3 and the row selection circuit 1 0 4 store the read address of the previous cycle, and sequentially store the stored address based on the count value input from the address counter 1 1 0 You may choose to choose.
- the 8-bit latch register 170 is a FIF 0 type register
- the write data DI 1 already latched every time the second-bit write data DI 2 is latched in 1-bit units. Are emitted in 1-bit units.
- Increment controller 1 5 0 is the 1st byte write data DI 1 released from 8-bit latch register 1 7 0 in MSB in 1-bit units and the first write restriction row of memory array 1 0 0 Whether or not the write data DI 1 to be written is correctly written to the first write-restricted row of the memory array 1 0 0 by comparing with the existing data DE 1 read from the MSB in 1 pit units That is, it can be determined whether or not the values of the respective bits match.
- the 8-bit internal register 1 5 Existing data DE 1 latched in 2 before writing. ⁇ is written back to the first write-restricted line, but it is not necessary to execute the write-back. Even in such a case, the write of the second byte of write data DI2 to the second write-restricted row is not executed, and the value of the lower 8 bits is guaranteed to be a normally written value.
- the upper 8-bit value is generally not a value that fluctuates greatly in a short period of time, so it is possible to avoid problems by verifying the likelihood of the previous value on the host computer side.
- the semiconductor memory device is an E EPROM that is stored in a nonvolatile manner and is sequentially accessed from the top address in 1-bit units.
- FIG. 10 is a block diagram showing the internal circuit configuration of the semiconductor memory device according to the second embodiment.
- the semiconductor memory device 1 OA includes an access controller 1 1 1 10, a re-dry controller 1 1 2 0, an address counter 1 1 3 0, and a memory array 1 1 4 0.
- the memory array 1140 has a storage area of a predetermined capacity, for example, 256 bits.
- the address counter 1 1 30 is a circuit that increments the counter value in synchronization with the clock signal CLK input to the clock signal terminal CKT. More specifically, the 7-dress counter 1 1 30 is a circuit that increments (counts up) the counter value in synchronization with the count-up signal CP output from the read / write controller 1 1 20.
- the count-up signal CP is a clock signal output from the read / write controller 1 1 20 and corresponds to the internal clock signal I CK.
- the internal clock signal I CK is a clock signal output from the controller 1 1 1 1 0 and corresponds to the clock signal CLK. Therefore, the count-up signal CP is a clock signal corresponding to the clock signal CLK, and the address counter 1 1 30 counts up the count value in synchronization with the clock signal CLK.
- the count value of the address counter 1 1 3 0 is input to the memory array 1 140 as an address ADD indicating the 256-bit storage area position of the memory array 1 140, and the count value of the address counter 1 1 30 A write position or a read position in the memory array 1 14 0 can be designated.
- the address count 1 1 30 also resets the counter value to the initial value when the counter reset signal CRST is input.
- the initial value may be any value as long as it is associated with the head position of the memory array 1140, and generally 0 is used as the initial value.
- the counter reset signal CRST is output from the read / write controller 1 120 when the device is started or when access (read / write overnight) starts or ends.
- the address count 1130 can specify the write position or read position of the memory array 1140 in order by the counter value counted up from the initial value.
- the access controller 1 1 10 is connected to the chip select terminal CS, the clock signal terminal CKT, and the data signal terminal IO, and the chip select signal CS # is input via the chip select terminal C KT.
- the clock signal CLK is input via the clock signal terminal CKT, and the data signal DA is input or output via the data signal terminal IO.
- the input clock signal CLK is sent to the read / write controller 1 120 as the internal clock signal I CK.
- the data signal DA When the data signal DA is an input data signal, it is sent to the read / write controller 1 120 as the input data signal I DA and sent to the memory array 1 140 as the write data signal WDA.
- the data signal DA is an output data signal, the read data signal RDA transmitted from the memory array 1 140 is output as the data signal DA.
- the access controller 110 controls the start and end of access based on the chip select signal CS # and the data signal DA that is input in synchronization with the clock signal CLK. Specifically, the access controller 1 1 10 receives the chip select signal CS #, and the command data indicating the overnight reading or writing is input as the data signal DA at a predetermined evening timing.
- the access permission signal AEN is sent to the read / write controller 1 1 20 and the address counter 1 1 30. If the specified access is only write, the write access start signal WRS is read and written. Controller 1 1 Controls start of access by sending to 20. In addition, when the input of the chip select signal CS # is finished, the access controller 1 1 10 finishes sending the access permission signal AEN, and sends the write access start signal WRS if it is sent. Controls the end of access by terminating.
- the read / write controller 1 1 20 includes a read control unit 1 1 2 2 for controlling data reading, a write control unit 1 124 for controlling data writing, and a read
- the read execution signal RD is sent to the memory array 1 140 according to the instruction from the control unit 1 1 22, and the read execution signal RD and the write execution signal WR are sent to the memory array 1 140 according to the instruction from the write control unit 1 1 24.
- Read / write execution unit 1 1 26 and actually controls reading or writing of data. Specifically, when only the access permission signal AEN is input from the access controller 1 1 1 0 to the access permission signal A EN and the write start signal WRS, the read control unit 1 1 22 and read / write execution are performed.
- Unit 1 1 26 operates to send the read execution signal RD synchronized with the falling edge (rising edge) of the internal clock signal I CK to the memory array 1 140 to execute the data reading process.
- the read data included in the read data signal RDA from the memory array 1 140 (also simply referred to as “read data RDA”) is input to the access controller 1 1 1 0 and the data signal terminal IO is Output as a DA signal.
- the write control unit 1 124 and the read / write execution unit 1 1 26 operate and the internal clock signal Read execution signal RD synchronized with the fall (rise) of ICK and internal write signal WR synchronized with the rise (fall) of internal clock signal ICK are sent to memory array 1140, and the data is output as described later. Perform overnight reading and writing processing.
- the data signal DA input to the access controller 1 1 1 0 via the data signal terminal I0 is sent to the memory array 1 140 as the write de-even signal WD A, and the write de-even signal Data represented by WDA (also simply called “write data WDA”) is written in the order in which it is input to memory array 1140.
- WDA write de-even signal Data represented by WDA
- the feature of the semiconductor memory device of this embodiment is in the part of the overnight write operation by the write control unit 1 1 24, and the part of the data read operation by the read control unit 1 1 22 is conventional. Since this is the same as the semiconductor memory device of Add a description of the data write operation.
- the data of multiple pits that are sequentially input as data signal DA through data signal terminal IO are always input in 1-bit units from the maximum bit (MS B), and the storage area of memory array 1 1 40 The position is also accessed in order from the address associated with the maximum bit.
- FIG. 11 is a flowchart showing the procedure of the data write operation in the second embodiment. As described above, this operation is performed when the access permission signal AEN is input from the access controller 1 1 1 0 to the read write controller 1 1 2 0 and the write access start signal WRS is input. This is executed by the light control unit 1 1 24.
- the write control unit 1 1 24 first causes the read write execution unit 1 1 26 to perform overnight reading (step S 1 1 0 2).
- the read / write execution unit '1 1 2 6 sends a read execution signal RD to the memory array 1 140 in synchronization with the falling edge of the internal clock signal ICK.
- the data is stored from the storage area at the storage area corresponding to the address value indicated by the address signal ADD sent from the address counter 1 1 3 0 of the memory array 1 1 40 Data (stored data) is read.
- the read execution signal RD is transmitted in synchronization with the falling edge of the internal clock signal ICK in the other read processing described below.
- the write control unit 1 124 reads the data represented by the read data signal RDA read out as described above and transmitted from the memory array 1 140 (simply referred to as “read data”).
- the data (referred to simply as “input data”) represented by the input data signal I DA that is input via the data signal terminal IO and transmitted from the access controller 1 1 1 0 is compared with. (Step S 1 1 04 ) Then, it is determined whether or not the reading data value and the input data value match (step S 1 1 0 6).
- Step S 1 1 0 6 Ye s
- the write controller 1 1 24 sets the power counter value of the address counter 1 30. It is incremented by 1 (step S 1 1 08), and it is further determined whether or not the access operation is to be terminated (step S 1 1 1 0). No) Again, the read / write execution unit 1 1 26 executes data reading (step S 1 1 02). For example, the read / write controller 1 1 20 counts the count-up signal CP in synchronization with the next falling edge of the internal clock signal ICK after the read / write execution unit 1 226 sends the read execution signal RD. Send to 30.
- the count value of count 1 1 30 is counted up by one according to the count-up signal CP.
- the counter 1 1 30 counts up the counter value every cycle at the falling timing (count-up timing) of the count-up signal CP corresponding to the internal clock signal ICK.
- the write control unit 1 1 24 does not match the read data and the input data (step S 1 1 06: No) until the data read process (step S 1 1 02) and the input data
- the write control unit 1 1 24 determines whether to end the access operation (step S 1 104).
- step S 1 1 1 0 if it is determined that the access operation will be terminated (step S 1 1 1 0: Y es), reset the count value of address count 1 1 30 (step S 1 1 24) This write operation is terminated.
- the end of the access operation can be determined by whether the chip select signal #CS or the access enable signal AEN is input. Specifically, if the signal to be judged, for example, the access permission signal AEN is in a non-active state, the access operation is completed. It can be determined that
- the write control unit 1124 determines whether or not the read data value matches the input data value (step S 1 106), and the read data value and the input data value -If not (step S 1 106: No), determine whether the input data value is [1] (step S 1 1 1 2 If the input data value is [1] If there is (step S 1 1 1 2: Ye s), set the write enable flag (step S 1 1 14) and write the input data as write data to the read / write execution unit 1 1 26. (Step S 1 1 1 6) For example, the read write execution unit 1 1 26 sends the write execution signal WR to the memory array 1 140 in synchronization with the rising edge of the internal clock signal ICK. Send from address counter 1 1 30 of array 1 140 The storage area of the storage area position corresponding to Adoresu value represented by the address signal ADD that is, the input data (write de Isseki) is written.
- Step S 1 1 1 8 the write controller 1 1 24 increments the count value of the address counter 1 1 30 by one at the next count up timing (step S 1 1 1 8), and further determines whether or not to end the access operation.
- Step S1 120 If the access operation is to be continued (Step S1 120: No), the data write process (Step S1 1 1 6) and the address count up process (Step S1 120) S 1 1 1 8) is executed. On the other hand, when the access operation is terminated (step S 1 120: Ye s), the write enable flag setting is canceled (step S 1 122) and the count value of address counter 1 1 30 is reset. (Step S 1 1 24), this write operation is completed.
- the write controller 1 1 24 determines that the value of the input data is not [1] in the determination of whether or not the value of the input data is [1] (step S 1 1 10). If this occurs (Step S 1 1 10: No), until the access operation is completed (Step S 1 1 28: No), input data writing is prohibited (Step S 1 1 26) and read / write execution is performed. Stop the operation of part 1 126. On the other hand, when the access operation is terminated (step S 1 1 28: Y es), the count value of the address counter 1 1 3 0 is reset (step S 1 1 24) and this write operation is terminated. .
- the write enable flag is set, the second bit [1], the third bit [0], and the fourth bit [0] from the left are written in order, and each 4-bit memory is stored.
- the data stored in the area is rewritten to [10 10 b] force input data [1 1 00 b].
- the data is rewritten only when the value of the input data as the write data is larger than the value of the memory data. If the written data is smaller than the stored data, the writing can be prohibited. As a result, it is possible to prevent writing other than writing under predetermined conditions.
- the write permission flag may be set to write the input data, and the overnight write may be prohibited only when the write data is smaller than the stored data.
- the write operation of the second embodiment has been described on the assumption that data is sequentially written in 1-bit units. However, data in n-bit units may be written all at once. However, in this case, it is necessary to provide a data buffer for holding the input data of each bit until all data of n bits are input.
- the write operation of the second embodiment enables the overnight rewrite only when the data condition “write data is larger than stored data” is satisfied.
- the data condition is changed.
- the semiconductor memory device of the embodiment corresponding to this problem.
- the semiconductor memory device is also an EEPROM that holds the storage contents in a nonvolatile manner and is accessed sequentially from the first address in 1-bit units. .
- FIG. 12 is a block diagram showing the internal circuit configuration of the semiconductor memory device according to the third embodiment.
- This semiconductor memory device 2 OA includes a data buffer 1 228 and a subtractor 1 2 3 2 in addition to an access controller 12 10, a read / write controller 1 220, an address count 1 230 and a memory array 1 240.
- Access controller 1 2 10, address count 1 230 and memory array 1240 are the access controller 1 1 10, address counter 1 1 30 and memory of the semiconductor memory device of the second embodiment (see FIG. 10). Same as Array 1 140.
- the data buffer 1 228 latches the input data signal IDA from the access controller 1 210 in accordance with the latch signal DLT input from the read / write controller 1 220 and also stores the memory data as the write data signal WD A. Send to array 1 140.
- the subtractor 1 23 2 is an address represented by the count value of the address counter 1 230 according to the subtraction signal DEC from the read / write controller 1 220 (referred to as “non-subtracted address”), or An address (referred to as “subtraction address”) represented by a value obtained by subtracting the counter value is sent to the memory array 1140 as an address signal ADD.
- the read / write controller 1 220 includes a read control unit 1 222, a write control unit 1 224, and a read / write execution unit 1 226. Basically, the read / write controller 1 of the second embodiment 1 1 20 As with, access (data reading or data writing) is actually controlled. Lead controller 1 222 and The read / write execution unit 1 2 2 6 is the same as the read control unit 1 1 2 2 and the read / write execution unit 1 1 2 6 of the second embodiment.
- the write control unit 1 2 2 4 controls the operations of the address counter 1 2 3 0, the read / write execution unit 1 2 2 6, the data buffer 1 2 2 8 and the subtractor 1 2 3 2, and the data described later Controls the write operation.
- the semiconductor memory device is also characterized by the data write operation performed under the control of the write control unit 1 2 2 4 and the data read operation performed by the read control unit 1 1 2 2. Since this is the same as that of a conventional semiconductor memory device, the data write operation by the write controller 1 2 2 4 will be described below.
- the multi-bit data that is sequentially input as the data signal DA through the data signal terminal IO must always start from the maximum bit (MSB).
- MSB maximum bit
- the data is sequentially input in 1-bit units, and the storage area location of the memory array 1 240 is also accessed sequentially from the address associated with the maximum bit.
- FIG. 13 is a flowchart showing the procedure of the data write operation in the third embodiment.
- the access permission signal AEN is input from the access controller 1 2 1 0 to the read / write controller 1 2 2 0, and the write access start signal WRS is input.
- the write control unit 1 2 2 4 When it is executed, it is executed by the write control unit 1 2 2 4.
- the write control unit 1 2 2 4 first causes the read / write execution unit 1 2 2 6 to read data (step S 1 2 0 2).
- the read / write execution unit 1 2 2 6 sends a read execution signal RD to the memory array 1 240 in synchronization with the falling of the internal clock signal ICK.
- the stored data (stored data) is read from the storage area at the storage area corresponding to the address value represented by the address signal ADD sent from the address counter 1 230 of the memory array 1 240. It is.
- the read execution signal RD is transmitted in synchronization with the fall of the internal clock signal ICK in the other read processing described below.
- the write control unit 1 224 compares the read data from the memory array 1 240 read out as described above with the input data (step S 1204), and compares the read data value with the input data. It is determined whether the data value matches (step S 1 206).
- step S 1 206 If the value of the read data matches the value of the input data (step S 1 206: Y es), the write control unit 1 224 latches the input data in the data buffer 1 228 (step S 1208) After that, address count 1 23 00 The counter value is incremented by 1 (step S 1 2 1 0), and it is further determined whether or not the access operation is to be terminated (step S 1 2 1 2). When the operation is to be continued (step S 1 2 1 2: No), the data read execution unit 1 1 26 is made to read data again (step S 1 202).
- the read controller 1220 receives the latch signal DLT from the data buffer 1 22 in synchronization with the next rising edge of the internal clock signal ICK after the read / write execution unit 1 226 sends the read execution signal RD. Send to 8.
- the data (input data) represented by the input data signal IDA transmitted from the access controller 1 1 1 1 0 is latched in the data buffer 1 2 28 according to the latch signal DL 1.
- the read / write controller 1 220 receives the count-up signal CP in synchronization with the next falling edge of the internal clock signal ICK after the read / write execution unit 1 226 sends the latch signal DLT to the data buffer 1 228. Send to counter 1 230.
- the counter value of counter 1 230 is incremented by one according to the count-up signal CP.
- the data buffer 1 228 is The input data is latched every cycle at each rise timing (latch timing) of the lock signal ICK.
- Counter 1 230 counts up the counter value every cycle at each falling timing (count-up timing) of count-up signal CP corresponding to internal clock signal ICK.
- the write control unit 1 224 performs the data reading process (step S 1202) and the comparison process with the input data (step S) until the read data does not match the input data (step S1206: No). 1 204) is repeated Note that the write control unit 1 224 determines that the access operation is to be ended in the above-described access operation end determination (step S 1 2 1 2) (step S 1 2 1 2: Y es), the counter value of the address counter 1 230 is reset (step S 1 250), and this write operation is terminated.
- the end of the access operation can be determined by whether the chip select signal #Cs or the access enable signal AEN is input. Specifically, it can be determined that the access operation is completed if the signal to be determined, for example, the access permission signal AEN is in an inactive state.
- the write control unit 1 224 determines whether the read data value matches the input data value (step S 1 206). If it is determined that it is not correct (step S 1 206: N ⁇ ), it is further determined whether or not the value of the input data is [1] (step S 1 2 14).
- step S1 2 14 Ye s
- step S1 2 14 sets the write enable flag (step S1 2 1 6), and at the next latch timing
- step S 1 2 20 The input data is latched in 228 (step S 1 2 1 8), and the write / overwrite is executed in the read / write execution unit 1 226 (step S 1 220).
- the read / write controller 1220 executes read write.
- Unit 1 226 sends a latch signal DLT to data buffer 1228 in synchronization with the next rising edge of internal clock signal ICK after sending read execution signal RD. At this time, the input data is latched in the data buffer 1 228 according to the latch signal DLT.
- the read / write execution unit sends the write execution signal WR to the memory array 1240 in synchronization with the next rising edge of the internal clock signal ICK after sending the read execution signal RD.
- the input data (write data) is written to the storage area at the storage area corresponding to the address value indicated by the address signal ADD sent from the address counter 1 2 3 0 of the memory array 1240. It is.
- the write control unit 1 224 increments the counter value of the address count 1 230 by one at the next address count up timing (step S 1 220).
- the write control unit 1 224 sets, in the subtractor 1 232, the address (subtraction address) of the value obtained by subtracting [1] from the counter value (address value) of the address counter 1 230 as the read address.
- the read / write execution unit 1 226 is caused to execute data reading (Step S 1 226).
- the write control unit 1 224 compares the read data and the write data that are latched in the data buffer 1 228 (latch data) (step S 1 228). Then, it is determined whether or not the read data value matches the latch data value (step S 1 230).
- step S 1 230 If the read data value matches the latch data value (step S 1 230: Y es), the input data is first latched in the data buffer 1 228 at the next latch timing (step S 1 232), let subtractor 1 232 set the address (non-subtracting address) of the counter address of 1 2 0 as the write address (step S 1234) and let the dry dry executor 1 1 26 Write the input data as a write-down event (step S 1 23 6).
- Step S 1 23 8 the write control unit 1 224 increments the counter value of the address count 1 230 at the next count-up timing (step S 1 23 8), and further determines whether or not to end the access operation.
- Yes Step S 1 240
- Step S 1 240 To continue the access operation (Step S 1 240: No), again, from input data latch processing (Step S 1 232) to address count up processing (Step S 1 2 38) Is executed.
- Step S 1 240: Yes the write enable flag setting is canceled (Step S 1 242) and the address counter 1 230 counter value is reset. (Step S 1 2 50) This write operation is terminated.
- the write control unit 1 224 determines whether the read data value and the latch data value match the value of the read data value and the latch data value (step S 1230). If it is not correct (Step S1 230: No), the setting of the write enable flag is canceled (Step S1244) and the access operation is completed (Step S1248: No). Writing is inhibited (step S 1 246), and the operation of the read / write execution unit 1 226 is stopped. On the other hand, when the access operation is terminated (step S1248: Ye s), the counter value of address count 1230 is reset (step S1250), and this write operation is terminated. ,
- the value of the input data for the second bit from the left is [1]
- the value of the storage data is [0]
- the value of the input data is [1].
- This value of input data is larger than the value of stored data.
- the write enable flag is set, and the input data of each bit from the second bit to the fourth bit is written in order.
- the input data as the write data and the storage data as the stored data are compared in magnitude from the largest bit side in order of bit size, If the input data is larger, write is permitted, and after writing the bit data, it is checked whether the data is correctly written. If it is not written correctly, write permission can be canceled and subsequent writes can be prohibited. As a result, it is possible to further enhance the prevention of writing other than writing under a predetermined data condition as compared with the second embodiment.
- n-bit units (n is an integer of 2 or more) are all collected at once. You may make it write.
- FIG. 14 and FIG. 15 are flowcharts showing the procedure of the evening write operation as a modification of the third embodiment.
- This operation is the write operation shown in Figure 13 Steps S 1 2 1 8 to S 1 244 are changed from Step S 1 3 0 2 to Step S 1 340, and the processing is the same except for the change. In the following, only the changed processing will be explained.
- the write controller 1 2 24 sets the write enable flag (step S 1 2 1 6).
- the address output from the address counter 1 2 3 0 Until all the values of the lower n bits (A 0, A 1, An— 1) of [1] are all set to [1] (Step S 1 3 04: No), the input data is sequentially input to the data buffer 1 at each latch timing.
- step S 1 3 0 2 is latched (step S 1 3 0 2), and the count value of address count 1 2 3 0 is counted up in order at each address count up timing (step S 1 3 0 6). If all the values of the lower n-bit address become [1] (step S 1 3 04: Ye s), the read / write execution unit 1 2 2 6 latches in the data buffer 1 2 2 8 The n-bit latch data written at the same time is executed together (step S 1 3 0 8), and the counter value of address count 1 2 3 0 is incremented by 1 at the next address count up timing. (Step S 1 3 1 0).
- the write control unit 1 2 24 sets the subtraction address of the value obtained by subtracting [n] from the counter value (address value) of the address counter 1 2 3 0 as the read address in the subtractor 1 2 3 2 (Step S 1 3 1 2), the read / write execution unit 1 2 2 6 executes data reading (Step S 1 3 1 4).
- the write control unit 1 2 2 4 compares the read data with the data (latch data) corresponding to the write data and latched in the data buffer 1 2 2 8 (step S 1 3 1 6) Determine whether the read data value matches the latch data value (step S 1 3 1 8).
- Step S 1 246 Prohibit input data write (step S 1 246)
- step S 1 3 1 8: Y es the address Count-up processing (Step S 1 322), input until each value of the read address of the lower n-bit output from Count 1 230 reaches [1]
- Step S 1 320: No Data latch processing (step S 1 324), read address setting processing (step S 1 3 12), data read processing (step S 1 3 14), comparison processing with latch data (step S 1 3 1 6) And the determination process (steps S 1 3 1 8) is repeated.
- step S 1 320 when all the values of the read address of the lower n bits are [1] (step S 1 320: Y es;), the subtracter 1 232 is turned on by the address counter 1 230. The non-subtracted address represented by the evening value is set as the write address (step S 1 328), and the read / write execution unit 1 1 26 has the n-bit bit latched in the data buffer 1 228. Latch data is written all at once (step S 1 330).
- the write control unit 1224 counters the address count 1 230 in each address count up timing until all the bit values of the lower n bits of the write address become [1] (step S1332: No). Is incremented by 1 (step S 1.334), and if the access operation is not terminated (step S 1 336: No), the input data is latched by the data buffer 1228 at the corresponding latch timing ( Step S 1 3 3 8). If each bit value of the write address of the lower n bits is all [1] (step S 1 332: Y es), n read / write execution unit 1 126 is latched in data buffer 1 228 n Pit latches are written all at once (step S 1 3 30).
- step S 1 336 Ye s
- the write enable flag is cleared (step S 1 340) and the input data is written. Prohibition of cracking (step S 1 246).
- the capacity of the memory array is described as 256 bits.
- the present invention is not limited to this, and changes appropriately according to the amount of data to be stored. It can be done.
- the EEPROM is used as the semiconductor memory device.
- the memory device can be rewritten and the storage device can be maintained in a nonvolatile manner. If it is, the memory device is not limited to the EEPROM, and may be a memory device that performs reading or writing in units of a plurality of bits.
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EP06747095A EP1898424A4 (en) | 2005-05-30 | 2006-05-26 | SEMICONDUCTOR STORAGE DEVICE |
AU2006253347A AU2006253347B2 (en) | 2005-05-30 | 2006-05-26 | Semiconductor storage apparatus |
JP2007519076A JP5024042B2 (ja) | 2005-05-30 | 2006-05-26 | 半導体記憶装置 |
BRPI0609896-7A BRPI0609896A2 (pt) | 2005-05-30 | 2006-05-26 | dispositivo de memória de semicondutor |
CA002610061A CA2610061A1 (en) | 2005-05-30 | 2006-05-26 | Semiconductor memory device |
CN2006800193258A CN101189682B (zh) | 2005-05-30 | 2006-05-26 | 半导体存储装置 |
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2006
- 2006-05-26 EP EP06747095A patent/EP1898424A4/en not_active Withdrawn
- 2006-05-26 CA CA002610061A patent/CA2610061A1/en not_active Abandoned
- 2006-05-26 AU AU2006253347A patent/AU2006253347B2/en not_active Ceased
- 2006-05-26 WO PCT/JP2006/311050 patent/WO2006129779A1/ja active Application Filing
- 2006-05-26 US US11/420,535 patent/US7522470B2/en active Active
- 2006-05-26 MX MX2007014846A patent/MX2007014846A/es not_active Application Discontinuation
- 2006-05-26 KR KR1020077030717A patent/KR20080022135A/ko not_active Application Discontinuation
- 2006-05-26 CN CN2006800193258A patent/CN101189682B/zh active Active
- 2006-05-26 JP JP2007519076A patent/JP5024042B2/ja not_active Expired - Fee Related
- 2006-05-26 BR BRPI0609896-7A patent/BRPI0609896A2/pt not_active IP Right Cessation
- 2006-05-26 RU RU2007149036/09A patent/RU2391722C2/ru active
- 2006-05-30 TW TW095119093A patent/TW200713283A/zh not_active IP Right Cessation
-
2009
- 2009-03-11 US US12/402,151 patent/US7791979B2/en active Active
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102741053A (zh) * | 2008-03-26 | 2012-10-17 | 精工爱普生株式会社 | 液体容纳体 |
JP2011048543A (ja) * | 2009-08-26 | 2011-03-10 | Seiko Epson Corp | 記憶装置、及び、ホスト回路に対し電気的に接続可能な記憶装置を含むシステム |
EP2423803A2 (en) | 2010-08-23 | 2012-02-29 | Seiko Epson Corporation | Storage device, circuit board, liquid reservoir and system |
US8392769B2 (en) | 2010-08-23 | 2013-03-05 | Seiko Epson Corporation | Storage device, circuit board, liquid reservoir and system |
US8882214B2 (en) | 2012-06-25 | 2014-11-11 | Seiko Epson Corporation | Liquid consumption device, program, and printing device |
Also Published As
Publication number | Publication date |
---|---|
US7522470B2 (en) | 2009-04-21 |
US20080144382A1 (en) | 2008-06-19 |
US20090225609A1 (en) | 2009-09-10 |
EP1898424A1 (en) | 2008-03-12 |
KR20080022135A (ko) | 2008-03-10 |
JPWO2006129779A1 (ja) | 2009-01-08 |
JP5024042B2 (ja) | 2012-09-12 |
TW200713283A (en) | 2007-04-01 |
CA2610061A1 (en) | 2006-12-07 |
TWI305357B (ja) | 2009-01-11 |
CN101189682B (zh) | 2010-10-13 |
AU2006253347B2 (en) | 2009-09-10 |
BRPI0609896A2 (pt) | 2010-05-11 |
US7791979B2 (en) | 2010-09-07 |
RU2007149036A (ru) | 2009-07-20 |
RU2391722C2 (ru) | 2010-06-10 |
CN101189682A (zh) | 2008-05-28 |
MX2007014846A (es) | 2008-02-21 |
EP1898424A4 (en) | 2008-12-10 |
AU2006253347A1 (en) | 2006-12-07 |
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