WO2006120863A1 - 赤外線センサ - Google Patents
赤外線センサ Download PDFInfo
- Publication number
- WO2006120863A1 WO2006120863A1 PCT/JP2006/308342 JP2006308342W WO2006120863A1 WO 2006120863 A1 WO2006120863 A1 WO 2006120863A1 JP 2006308342 W JP2006308342 W JP 2006308342W WO 2006120863 A1 WO2006120863 A1 WO 2006120863A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- optical filter
- opening
- infrared sensor
- package
- conductive adhesive
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 89
- 239000000853 adhesive Substances 0.000 claims abstract description 31
- 230000001070 adhesive effect Effects 0.000 claims abstract description 31
- 230000002093 peripheral effect Effects 0.000 claims abstract description 29
- 239000002184 metal Substances 0.000 claims description 27
- 229910052751 metal Inorganic materials 0.000 claims description 27
- 239000000463 material Substances 0.000 claims description 14
- 239000011248 coating agent Substances 0.000 claims description 4
- 238000000576 coating method Methods 0.000 claims description 4
- 238000007789 sealing Methods 0.000 claims description 3
- 230000001747 exhibiting effect Effects 0.000 abstract 1
- 239000011810 insulating material Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000009413 insulation Methods 0.000 description 4
- 230000005669 field effect Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000001012 protector Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 229910000906 Bronze Inorganic materials 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 239000002313 adhesive film Substances 0.000 description 1
- OYLGJCQECKOTOL-UHFFFAOYSA-L barium fluoride Chemical compound [F-].[F-].[Ba+2] OYLGJCQECKOTOL-UHFFFAOYSA-L 0.000 description 1
- 229910001632 barium fluoride Inorganic materials 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 239000010974 bronze Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000009422 external insulation Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000011029 spinel Substances 0.000 description 1
- 229910052596 spinel Inorganic materials 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0271—Housings; Attachments or accessories for photometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J2001/0276—Protection
Definitions
- the present invention relates to an infrared sensor, and more particularly to an infrared sensor with a wide viewing angle that senses infrared rays, and an infrared sensor with improved electromagnetic shielding properties.
- an infrared sensor element 53 in which a light receiving electrode 61 is disposed on a pyroelectric element 62 is used as one of the conventional infrared sensors used in the detection of human bodies.
- an infrared sensor with lead terminals housed in 55 is housed in 55.
- this infrared sensor usually further includes a support base 63 for supporting the infrared sensor element 53, a support base 63, a substrate 64 on which necessary electrodes and circuits (not shown) are formed on the surface, and a bypass.
- a capacitor 65, FET66, resistor 67, etc. are provided.
- the input / output lead terminals 51 (51a, 51b) of this infrared sensor pass through the metal stem 52 through the insulating material 60 and are connected to the circuit on the substrate 64, and are connected to the ground lead.
- the terminal 51 (51c) is electrically connected to the stem 52.
- attachment structure attachment method of the optical filter to the metal case (cap) in the infrared sensor of this type
- the optical filter 54 is disposed on the window 58 so that the outer surface of the optical filter 54 and the outer surface of the metal case 55 are flush with each other.
- a mounting structure mounting method has been proposed in which the edge and the edge of the opening window 58 are bonded and fixed (see Patent Document 1).
- the optical filter 54 is fitted into a part (opening window) 58 of the upper surface of the metal case 55, and the entire upper surface of the metal case 55 is Since it is not a light receiving surface, there is a problem that the infrared light receiving area (field of view) is narrowed.
- a conductive inner peripheral heat transfer cover disposed on the inner peripheral portion of a conductive protector (package) 72!
- the optical filter 71 is held on the shelf 73 formed on the flange member 75, the end face of the optical filter 71 is set to the inner peripheral face of the conductive inner peripheral heat transfer covering member 75, and the bottom face of the optical filter 71 is set to the inner conductive face.
- the optical filter 71 is electrically connected to the conductive protector (package) 72 by bonding to the bottom surface of the shelf 73 formed on the circumferential heat transfer covering member 75 with the conductive adhesive 74, respectively.
- An infrared sensor that improves the shielding performance has been proposed (see Patent Document 2).
- Patent Document 2 the configuration of the infrared sensor disclosed in Patent Document 2 is intended to improve electromagnetic shielding properties and reduce the influence of ambient temperature changes on the infrared sensor element.
- 9 Embodiment of Patent Document 2
- a metal plate 81 to be a conductive inner peripheral heat transfer covering member 75
- a shelf 73 is formed at a substantially central portion of each side.
- the shelf 73 restricts the field of view of the optical filter 71 (FIG. 8), and the field of view as an infrared sensor cannot be secured with maximum efficiency. There is a problem.
- Patent Document 1 Japanese Patent Laid-Open No. 9-79902
- Patent Document 2 JP-A-8-1507
- the present invention solves the above-mentioned problems, is an infrared sensor that is small in size and can ensure a wide infrared light receiving region (field of view), and has high electromagnetic shielding properties and excellent electromagnetic wave resistance properties.
- An object of the present invention is to provide an infrared sensor.
- the infrared sensor of the present invention (Claim 1)
- An optical filter configured to allow infrared rays of a predetermined wavelength to pass therethrough, wherein a planar shape of the package is disposed so as to cover a substantially square opening, and the infrared sensor element
- An optical filter that simultaneously functions as a lid that seals the opening and a function of causing the optical element to receive infrared rays having a predetermined wavelength
- infrared sensor comprising:
- the optical filter disposed so as to cover the opening at the four corners of the opening having a substantially square planar shape is lower than the upper end of the inner peripheral wall of the opening.
- a support portion is disposed to support the position;
- a part of the surface side of the optical filter facing the support part enters the opening, and the optical filter is fixed to the package in a state of being supported by the support part.
- the infrared sensor of claim 2 is the infrared sensor of claim 1, wherein the optical filter and the package are bonded and fixed via a conductive adhesive and electrically connected. It is characterized by that!
- the infrared sensor of claim 3 is the infrared sensor of claim 1 or 2, wherein the package covers a metal package body and a main part of the metal package body. And the metal package body is exposed in a region connected to the optical filter via the conductive adhesive, and the optical filter and the package are exposed by the conductive adhesive. It is configured to be electrically connected to the main body.
- the infrared sensor of claim 4 is the infrared sensor of any one of claims 1 to 3, wherein the opening peripheral region of the package is formed lower than an outer region of the opening peripheral region. And a holding recess for holding the conductive adhesive is formed in cooperation with the side end surface of the portion of the optical filter that protrudes from the upper end of the inner peripheral wall of the opening. It is characterized by that.
- the infrared sensor of the present invention (Claim 1) is arranged so as to cover the infrared sensor element, the box-shaped knocker in which the infrared sensor element is housed, and the opening of the knocker.
- An optical that simultaneously functions as a filter and as a lid for sealing an opening In an infrared sensor including a filter, an optical filter disposed so as to cover the opening is disposed at the four corners of the opening having a substantially square shape on the package, and the upper end of the inner peripheral wall of the opening.
- a support portion that supports the optical filter is disposed at a lower position, and a part of the surface side facing the support portion of the optical filter enters the opening portion, and the optical filter is fixed to the package while being supported by the support portion. Therefore, the ratio of the area (area) where the field of view is blocked to the entire surface area of the optical filter can be made extremely low, effectively reducing the infrared light receiving area (field of view). It becomes possible to attach the optical filter to the package.
- the support portions are provided at the four corner portions of the opening having a substantially rectangular planar shape, it is possible to reliably hold the optical filter and obtain a highly reliable infrared sensor.
- the insulation covers the metal package body and the main part of the metal package body.
- the metal package body is exposed in an area connected to the optical filter through the conductive adhesive, and the optical filter and the package body are electrically connected by the conductive adhesive.
- an opening peripheral region of the package is formed lower than a region further outside the peripheral portion of the opening. If the holding recess that holds the conductive adhesive is formed in cooperation with the side end face of the portion of the optical filter that protrudes from the upper end of the inner peripheral wall of the opening, the holding is held in the holding recess.
- the electrically conductive adhesive makes it possible to securely and electrically connect the optical filter and the package.
- the conductive adhesive is held in the holding recess by an amount corresponding to the volume of the holding recess, excess conductive adhesive flows into the central region of the optical filter and the field of view is narrowed. Thus, it is possible to reliably prevent it, and it is possible to obtain an infrared sensor having desired characteristics.
- FIG. 1 is an exploded perspective view showing an infrared sensor according to an embodiment of the present invention.
- FIG. 2 is a diagram showing a state in which an infrared sensor element is housed in a knocker in an infrared sensor that is useful in one embodiment of the present invention.
- FIG. 3 is a perspective view showing a state in which an optical filter is attached to an opening of a package in an infrared sensor according to an embodiment of the present invention.
- FIG. 4 is an enlarged view showing a main part of a cross section taken along line II of the infrared sensor of FIG.
- FIG. 5 is an enlarged view showing a main part of a cross section taken along line II-II in FIG.
- FIG. 6 is a diagram showing a configuration of a conventional infrared sensor
- FIG. 7 is a diagram showing a structure for attaching an optical filter to a package of a conventional infrared sensor.
- FIG. 8 is a view showing a structure for attaching an optical filter to a package of another conventional infrared sensor.
- FIG. 9 is a diagram showing a main part configuration of another conventional infrared sensor.
- FIG. 1 is an exploded perspective view showing an infrared sensor according to an embodiment (Embodiment 1) of the present invention
- FIG. 2 is a view showing a state in which an infrared sensor element is accommodated
- FIG. 3 is an opening of a package
- Fig. 4 is a perspective view showing a state where the optical filter is attached to Fig. 4. It is a figure which expands and shows the principal part.
- This infrared sensor has an infrared sensor element 1 and a box shape with one surface (upper surface side in Fig. 1) opened, and has an electrode 11 (and a wiring pattern, etc.) inside.
- the external sensor element 1 is housed in the inside (sealed space) 32 and is disposed so as to cover the entire surface of the metal package 2 corresponding to the surface mounting and the opening 2a of the knock 2 and the infrared sensor.
- the sensor element 1 receives infrared rays of a predetermined wavelength and the opening 2a of the knock 2 And an optical filter 3 that simultaneously functions as a lid for sealing.
- the infrared sensor element 1 two electrodes (light receiving electrodes) 10a and 10b arranged on the surface of the pyroelectric element la polarized in the thickness direction are connected in series and in reverse polarity, V, so-called dual type infrared sensor elements are used, which are configured to eliminate external noise (such as temperature changes in the surrounding environment) that are input simultaneously to the two light receiving electrodes 10a and 10b.
- the main part of the metal package main body 21 such as 42Ni, phosphor bronze, Shinchu Yuu, Yohaku iron, etc., which has a box shape and is substantially open on the upper surface, is insulated.
- the structure formed by covering with the covering material 22 is used, and the planar shape of the opening 2a of the knocker 2 is rectangular.
- a metal nozzle / cage main body 21 is provided in a region of the cage 2 that is connected to the optical filter 3 via the conductive adhesive 7 (FIGS. 3, 4, and 5).
- the optical filter 3 and the package body 21 are electrically connected to each other by the conductive adhesive 7 and exposed.
- the opening peripheral region 2b of the package 2 is formed lower than the outer region 2c of the opening peripheral region 2b, and the portion 3a of the optical filter 3 protruding from the upper end portion 9 of the inner peripheral wall of the opening 2a.
- the holding recess 15 for holding the conductive adhesive 7 is formed in cooperation with the side end face 3b of the first side (FIG. 4).
- a base 12 that supports the infrared sensor element 1 is disposed on the bottom surface of the knock 2, and the infrared sensor element 1 is configured to be supported on the base 12.
- the field effect transistor 19 necessary for configuring the infrared sensor is disposed in the inside of the knock 2, and in addition, a bypass capacitor, a resistor having a high resistance value, etc. 1 or 2 is disposed integrally with the knocker 2, but the illustration except for the field effect transistor 19 is omitted in FIGS. 1 and 2.
- the outer portion is insulated by an insulating material (not shown) so as not to be electrically connected to the socket 2 at a predetermined position of the metal package 2.
- a connection terminal (external electrode) 5 is provided.
- the infrared sensor element 1 disposed in the cage 2 is connected to the electrode, wiring pattern, and external It is configured to be electrically connected to the outside via a connection terminal (external electrode) 5.
- the optical filter 3 disposed so as to cover the opening 2a is provided at the upper end of the inner peripheral wall of the opening 2a at the four corners 8 of the opening 2a having a substantially square planar shape of the package 2. Lower than the part 9! A support part 20 for supporting the position is provided.
- the support part 20 is formed of the same material as the insulating coating material 22 that covers the main part of the metal package body 21.
- the support portion 20 can be made of a material cover different from the insulating covering material 22.
- an optical filter having a resistance of 1 M ⁇ Zcm or less and having a single crystal silicon force that transmits infrared rays of a predetermined wavelength is used. It has a rectangular planar shape substantially corresponding to the opening 2a on the upper surface.
- FIG. 4 which is an enlarged view of the essential part of the infrared sensor of Fig. 3 taken along the line II, and the essential part of the cross section taken along line II-II of Fig. 3
- FIG. 5 which is an enlarged view, the optical filter 3 is supported by the support portions 20 disposed at the four corner portions 8 of the opening portion 2a of the package 2 more than the upper end portion 9 of the inner peripheral wall of the opening portion 2a.
- the conductive adhesive 7 supplied and held in the holding recess 15 allows the optical filter 3 (side end surface 3b) and the package 2 (opening peripheral area 2b and the exposed metal
- an infrared sensor can be obtained in which the optical filter 3 and the package 2 are securely connected and fixed electrically and mechanically.
- the optical filter 3 disposed so as to cover the opening 2a is disposed at the four corners 8 of the opening 2a of the package 2 and the inner peripheral wall of the opening 2a.
- a support portion 20 that is supported at a position lower than the upper end portion 9 of the optical filter 3 is disposed, and a part (lower portion) 3c on the surface side facing the support portion 20 of the optical filter 3 enters the opening portion 2a. Since the optical filter 3 is fixed to the package 2 with the conductive adhesive 7 in a supported state, the ratio of the region where the visual field is blocked by the support portion 20 to the entire surface area of the optical filter 3 is extremely low. In effect, the optical filter 3 can be attached to the package 2 without reducing the infrared light receiving area (field of view).
- the support portions 20 are provided at the four corner portions 8 of the opening portion 2a having a substantially square planar shape, it is possible to reliably hold the optical filter 3 and obtain an infrared sensor with high reliability.
- the box-shaped structure formed by covering the main part of the metal package body 21 with the insulating covering material 22 is used as the knock 2, the box-shaped structure formed by covering the main part of the metal package body 21 with the insulating covering material 22 is used. While ensuring insulation, the optical filter 3 and the package 2 are reliably electrically connected, and a highly reliable ceramic electronic component having excellent electromagnetic shielding properties and insulation from the outside can be reliably obtained.
- the opening peripheral region 2b of the knock 2 is formed lower than the region 2c further outside the opening peripheral region 2b, and the upper end 9 of the inner peripheral wall of the opening 2a of the optical filter 3 is formed. Since the holding recess 15 that holds the conductive adhesive 7 is formed in cooperation with the side end surface 3b of the protruding portion 3a, the optical adhesive film 7 is formed by the conductive adhesive 7 held in the holding recess 15. 3 and the package 2 can be securely connected electrically and mechanically.
- the conductive adhesive 7 is held in the holding recess 15 by a corresponding amount of the volume of the holding recess 15, the excess conductive adhesive 7 flows into the central region of the optical filter 3 and the field of view. Can be surely prevented, and an infrared sensor having desired characteristics can be obtained.
- the optical filter 3 uses an optical filter having a low resistance material (single crystal silicon) force as the optical filter 3.
- the optical filter 3 has a low resistance on the surface of the filter base made of an insulating material.
- An optical filter provided with a metal film made of Ge (germanium) by a method such as vapor deposition is used as the resistive material film, and the optical filter 3 is passed through the low-resistance material film with a conductive adhesive. It is also possible to configure the optical filter 3 and the package 2 to be electrically connected by bonding to each other.
- the filter base material constituting the optical filter for example, materials having various materials that transmit infrared rays such as quartz, sapphire, barium fluoride, and spinel are used. It is possible.
- the force described in the case where the infrared sensor element is a so-called dual-type pyroelectric infrared sensor element using a pyroelectric element is used as an example.
- Single infrared type with no special restrictions on the type of element, or various infrared sensor elements such as thermopile and photodiode It is possible to apply the present invention to an infrared sensor using the above.
- the force main part using a structure in which the main part of the metal package body 21 is covered with the insulating coating material 22 as the knock 2 is made of metal. Even in the case of using a package in which only necessary parts are covered with an insulating material, or a package in which a main part is formed of an insulating material and a conductive material is provided only in parts necessary for electrical connection.
- the present invention can be applied.
- the infrared sensor of the first embodiment since the infrared sensor of the first embodiment includes the electrode (and the wiring pattern) 11 in the inside of the knock 2, the number of electrodes and the wiring pattern to be formed on other members is reduced.
- the product can be downsized and the number of parts can be reduced.
- the knock 2 includes the base 12 that supports the infrared sensor element 1, a separate support member is not required, and the number of components and the size of the product can be reduced. Is possible.
- the product can be downsized in this respect as well.
- the present invention is not limited to the above-described Example 1 in other respects as well.
- the specific configuration and shape of the package, the adhesive for bonding the optical filter and the package (conductivity) Various types of applications and modifications can be made within the scope of the invention with respect to the type of the adhesive).
- an infrared sensor that is small in size and can secure a wide infrared light receiving region (field of view) without requiring a complicated structure or a complicated manufacturing process. Can do.
- the optical filter and the package can be securely joined, and the infrared sensor element force is excellent in electromagnetic shielding, housed in a sealed space formed by the optical filter and the package electrically connected to each other.
- An infrared sensor can be obtained.
- the present invention can be widely used in the field of general-purpose infrared ray sensors used for human body detection and crime prevention equipment.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007528194A JP4702366B2 (ja) | 2005-05-11 | 2006-04-20 | 赤外線センサ |
CN2006800160856A CN101175977B (zh) | 2005-05-11 | 2006-04-20 | 红外线传感器 |
EP06745523.8A EP1884754B1 (en) | 2005-05-11 | 2006-04-20 | Infrared sensor |
US11/937,218 US7626167B2 (en) | 2005-05-11 | 2007-11-08 | Infrared sensor |
US12/424,565 US7919751B2 (en) | 2005-05-11 | 2009-04-16 | Infrared sensor |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005-138991 | 2005-05-11 | ||
JP2005138991 | 2005-05-11 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/937,218 Continuation US7626167B2 (en) | 2005-05-11 | 2007-11-08 | Infrared sensor |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2006120863A1 true WO2006120863A1 (ja) | 2006-11-16 |
Family
ID=37396376
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2006/308342 WO2006120863A1 (ja) | 2005-05-11 | 2006-04-20 | 赤外線センサ |
Country Status (5)
Country | Link |
---|---|
US (2) | US7626167B2 (ja) |
EP (1) | EP1884754B1 (ja) |
JP (1) | JP4702366B2 (ja) |
CN (1) | CN101175977B (ja) |
WO (1) | WO2006120863A1 (ja) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2011021519A1 (ja) | 2009-08-17 | 2011-02-24 | パナソニック電工株式会社 | 赤外線センサ |
WO2011162319A1 (ja) | 2010-06-25 | 2011-12-29 | パナソニック電工株式会社 | 焦電型赤外線検知素子およびそれを用いた赤外線センサ |
WO2012117568A1 (ja) * | 2011-03-02 | 2012-09-07 | オムロン株式会社 | 赤外線温度センサ、電子機器、および赤外線温度センサの製造方法 |
JP2013044560A (ja) * | 2011-08-22 | 2013-03-04 | Nec Tokin Corp | 赤外線センサおよびその製造方法 |
JP2013050359A (ja) * | 2011-08-30 | 2013-03-14 | Citizen Electronics Co Ltd | 焦電型赤外線センサおよびその製造方法 |
DE102013215049A1 (de) | 2012-08-08 | 2014-02-13 | Nec Tokin Corporation | Infrarotsensor |
WO2014112392A1 (ja) * | 2013-01-21 | 2014-07-24 | パナソニック株式会社 | 赤外線検出素子、赤外線検出器及び赤外線式ガスセンサ |
JP2014142236A (ja) * | 2013-01-23 | 2014-08-07 | Panasonic Corp | 赤外線受光ユニット、赤外線式ガスセンサ |
US12050134B2 (en) | 2019-11-18 | 2024-07-30 | Murata Manufacturing Co., Ltd. | Optical sensor |
US12092524B2 (en) | 2019-11-18 | 2024-09-17 | Murata Manufacturing Co., Ltd. | Optical sensor |
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CN101405872B (zh) * | 2006-03-22 | 2011-04-20 | 株式会社村田制作所 | 红外传感器及其制造方法 |
US9116037B2 (en) * | 2006-10-13 | 2015-08-25 | Fresnel Technologies, Inc. | Passive infrared detector |
US8665364B2 (en) * | 2010-06-25 | 2014-03-04 | Omnivision Technologies, Inc. | Reinforcement structure for wafer-level camera module |
US9063229B2 (en) * | 2012-09-05 | 2015-06-23 | Honeywell International Inc. | Mirror used as microwave antenna for motion sensor |
EP2957875A4 (en) * | 2013-02-14 | 2017-02-15 | Asahi Kasei Microdevices Corporation | Filter member for infrared sensors, method for producing same, infrared sensor and method for manufacturing infrared sensor |
US10441177B2 (en) | 2013-07-23 | 2019-10-15 | Bae Systems Information And Electronic Systems Integration Inc. | High definition thermal imaging for medical applications |
JP6194799B2 (ja) * | 2014-01-15 | 2017-09-13 | オムロン株式会社 | 赤外線センサ |
EP3212064A4 (en) * | 2014-10-30 | 2018-04-11 | BAE SYSTEMS Information and Electronic Systems Integration Inc. | High definition thermal imaging for medical applications |
WO2016192035A1 (zh) * | 2015-06-02 | 2016-12-08 | 东莞传晟光电有限公司 | 热释电传感器 |
DE102015223362A1 (de) * | 2015-11-25 | 2017-06-01 | Minimax Gmbh & Co. Kg | Explosionsgeschütztes Gehäuse für Mittel zum Senden und Empfangen elektromagnetischer Strahlung |
JP2018109588A (ja) * | 2017-01-06 | 2018-07-12 | 三菱マテリアル株式会社 | 赤外線センサ実装部材の製造方法 |
US20180235478A1 (en) * | 2017-02-18 | 2018-08-23 | VVV IP Holdings Limited | Multi-Vital Sign Detector in an Electronic Medical Records System |
US11430906B2 (en) * | 2018-07-26 | 2022-08-30 | Advanced Semiconductor Engineering, Inc. | Optical device including lid having first and second cavity with inclined sidewalls |
DE102018217732A1 (de) * | 2018-10-17 | 2020-04-23 | Robert Bosch Gmbh | Induktive Energieübertragungseinrichtung, Ladesystem |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04127530U (ja) * | 1991-05-16 | 1992-11-20 | 株式会社村田製作所 | 焦電型赤外線検出器 |
JPH04138246U (ja) * | 1991-06-17 | 1992-12-24 | 日本セラミツク株式会社 | 焦電型赤外線検出器 |
JPH07190852A (ja) * | 1993-12-24 | 1995-07-28 | Matsushita Electric Ind Co Ltd | 赤外線センサ |
JPH0815007A (ja) * | 1994-06-29 | 1996-01-19 | Matsushita Electric Ind Co Ltd | 赤外線センサおよびその製造方法 |
JPH0979902A (ja) * | 1995-09-18 | 1997-03-28 | Murata Mfg Co Ltd | 赤外線センサ、センサ製造用パレット及び赤外線センサの製造方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6432131A (en) * | 1987-07-29 | 1989-02-02 | Toshiba Corp | Infrared sensor |
JPH0434568U (ja) * | 1990-07-18 | 1992-03-23 | ||
US5468960A (en) * | 1993-05-12 | 1995-11-21 | Optex Co., Ltd. | Pyroelectric infrared detector |
JP3360504B2 (ja) * | 1995-11-10 | 2002-12-24 | ソニー株式会社 | 固体撮像装置の後処理方法及び製造方法 |
US5962854A (en) * | 1996-06-12 | 1999-10-05 | Ishizuka Electronics Corporation | Infrared sensor and infrared detector |
DE10318501A1 (de) * | 2003-04-24 | 2005-01-05 | Robert Bosch Gmbh | Chipaufbau in einem Premold-Gehäuse |
CN2658728Y (zh) * | 2003-09-26 | 2004-11-24 | 玉山奈米机电股份有限公司 | 热电堆红外线感测组件的封装结构 |
EP1887331A4 (en) * | 2005-05-11 | 2011-12-07 | Murata Manufacturing Co | INFRARED SENSOR AND METHOD FOR MANUFACTURING SAME |
JP2006324543A (ja) * | 2005-05-20 | 2006-11-30 | Nec Electronics Corp | 固体撮像装置 |
-
2006
- 2006-04-20 EP EP06745523.8A patent/EP1884754B1/en active Active
- 2006-04-20 JP JP2007528194A patent/JP4702366B2/ja active Active
- 2006-04-20 WO PCT/JP2006/308342 patent/WO2006120863A1/ja active Application Filing
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-
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- 2007-11-08 US US11/937,218 patent/US7626167B2/en active Active
-
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- 2009-04-16 US US12/424,565 patent/US7919751B2/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04127530U (ja) * | 1991-05-16 | 1992-11-20 | 株式会社村田製作所 | 焦電型赤外線検出器 |
JPH04138246U (ja) * | 1991-06-17 | 1992-12-24 | 日本セラミツク株式会社 | 焦電型赤外線検出器 |
JPH07190852A (ja) * | 1993-12-24 | 1995-07-28 | Matsushita Electric Ind Co Ltd | 赤外線センサ |
JPH0815007A (ja) * | 1994-06-29 | 1996-01-19 | Matsushita Electric Ind Co Ltd | 赤外線センサおよびその製造方法 |
JPH0979902A (ja) * | 1995-09-18 | 1997-03-28 | Murata Mfg Co Ltd | 赤外線センサ、センサ製造用パレット及び赤外線センサの製造方法 |
Cited By (16)
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---|---|---|---|---|
JP5492213B2 (ja) * | 2009-08-17 | 2014-05-14 | パナソニック株式会社 | 赤外線センサ |
WO2011021519A1 (ja) | 2009-08-17 | 2011-02-24 | パナソニック電工株式会社 | 赤外線センサ |
KR101346054B1 (ko) * | 2009-08-17 | 2013-12-31 | 파나소닉 주식회사 | 적외선 센서 |
US9074935B2 (en) | 2009-08-17 | 2015-07-07 | Panasonic Intellectual Property Management Co., Ltd. | Infrared sensor |
WO2011162319A1 (ja) | 2010-06-25 | 2011-12-29 | パナソニック電工株式会社 | 焦電型赤外線検知素子およびそれを用いた赤外線センサ |
US8487258B2 (en) | 2010-06-25 | 2013-07-16 | Panasonic Corporation | Pyroelectric infrared detection element and infrared sensor using the same |
WO2012117568A1 (ja) * | 2011-03-02 | 2012-09-07 | オムロン株式会社 | 赤外線温度センサ、電子機器、および赤外線温度センサの製造方法 |
JP2013044560A (ja) * | 2011-08-22 | 2013-03-04 | Nec Tokin Corp | 赤外線センサおよびその製造方法 |
JP2013050359A (ja) * | 2011-08-30 | 2013-03-14 | Citizen Electronics Co Ltd | 焦電型赤外線センサおよびその製造方法 |
DE102013215049A1 (de) | 2012-08-08 | 2014-02-13 | Nec Tokin Corporation | Infrarotsensor |
US9274006B2 (en) | 2012-08-08 | 2016-03-01 | Nec Tokin Corporation | Infrared sensor |
WO2014112392A1 (ja) * | 2013-01-21 | 2014-07-24 | パナソニック株式会社 | 赤外線検出素子、赤外線検出器及び赤外線式ガスセンサ |
US9528879B2 (en) | 2013-01-21 | 2016-12-27 | Panasonic Intellectual Property Management Co., Ltd. | Infrared detection element, infrared detector, and infrared type gas sensor |
JP2014142236A (ja) * | 2013-01-23 | 2014-08-07 | Panasonic Corp | 赤外線受光ユニット、赤外線式ガスセンサ |
US12050134B2 (en) | 2019-11-18 | 2024-07-30 | Murata Manufacturing Co., Ltd. | Optical sensor |
US12092524B2 (en) | 2019-11-18 | 2024-09-17 | Murata Manufacturing Co., Ltd. | Optical sensor |
Also Published As
Publication number | Publication date |
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JP4702366B2 (ja) | 2011-06-15 |
EP1884754B1 (en) | 2015-11-04 |
EP1884754A1 (en) | 2008-02-06 |
US7919751B2 (en) | 2011-04-05 |
JPWO2006120863A1 (ja) | 2008-12-18 |
CN101175977A (zh) | 2008-05-07 |
CN101175977B (zh) | 2010-07-14 |
EP1884754A4 (en) | 2012-01-25 |
US20080087824A1 (en) | 2008-04-17 |
US20090212218A1 (en) | 2009-08-27 |
US7626167B2 (en) | 2009-12-01 |
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