WO2006070623A1 - 対向ターゲット式スパッタ装置 - Google Patents
対向ターゲット式スパッタ装置 Download PDFInfo
- Publication number
- WO2006070623A1 WO2006070623A1 PCT/JP2005/023218 JP2005023218W WO2006070623A1 WO 2006070623 A1 WO2006070623 A1 WO 2006070623A1 JP 2005023218 W JP2005023218 W JP 2005023218W WO 2006070623 A1 WO2006070623 A1 WO 2006070623A1
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- WIPO (PCT)
- Prior art keywords
- target
- facing
- unit
- sputtering apparatus
- magnetic field
- Prior art date
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3464—Sputtering using more than one target
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3488—Constructional details of particle beam apparatus not otherwise provided for, e.g. arrangement, mounting, housing, environment; special provisions for cleaning or maintenance of the apparatus
- H01J37/3497—Temperature of target
Definitions
- an opposed sputtering unit comprising a pair of targets facing each other with a predetermined facing space and a permanent magnet forming an opposing mode magnetic field perpendicular to the target surface provided around the target.
- the present invention relates to a facing target sputtering apparatus in which a film is formed on a substrate disposed so as to face the side surface of the facing space, and more specifically, a facing target unit having the permanent magnet provided around the target is a rectangular parallelepiped.
- the present invention relates to the technology of a facing target type sputtering apparatus which can form a film on a wide substrate and can form a film on a large area substrate in a stationary state.
- the facing target type sputtering apparatus provided with the above-mentioned box type facing type sputtering unit is proposed by the present inventor according to Japanese Patent Application Laid-Open No. 10-36036 (US Pat. No. 6, 156, 172).
- the structure is shown in Fig. 18.
- the box-type opposed sputtering unit 70 has four side surfaces 71 a continuing to the opening side surface 71 f among the five side surfaces 71 a to 71 e excluding the opening side surface 71 f that becomes the opening of the rectangular frame 71.
- Attach target targets 100a and 100b provided with magnetic field generating means consisting of targets 110a and 110b (not shown) and permanent magnets provided around them on two opposite side surfaces 71a and 71b of -71d.
- the three side surfaces are shielded by shielding plates 72c to 72e, and the external shape is a rectangular parallelepiped shape including a cube, and has a box shape as a whole.
- the box-type facing target type sputtering apparatus combines the box-type facing type sputtering unit with the vacuum chamber at the opening side surface 71f as shown in FIG. A thin film is formed on the substrate placed in the tank.
- the opposing direction is the X direction
- the direction in which the substrate on which the film is formed is viewed from the opposing space is the z direction.
- Direction orthogonal to the X and Z directions In other words, the direction parallel to the target surface and the substrate surface is called Y direction, and the coordinate axis of each direction is called X axis, Y axis and Z axis To be.
- the magnetic field formation for generating and constraining the sputter plasma with this configuration is disclosed in, for example, Japanese Patent Laid-Open No. 10-246, the facing space between the facing targets of the target bench provided with the magnetic field generating means.
- a magnetic field in the facing mode in the vertical direction is formed over the target in the same manner as the conventional facing target sputtering apparatus, and in addition, the magnetic field of the magnetron mode in the direction parallel to the target surface near the target surface. Is formed around the outer periphery of the target, resulting in the formation of a high density plasma over the entire surface of the tag.
- a box-type facing target sputtering apparatus provided with a box-type facing sputtering unit in which five side surfaces other than the opening side are shielded, the sputtered particles are arranged with the substrate evacuated to a high vacuum through the opening. Float in a vacuum chamber and deposit on a substrate to form a thin film.
- the above-described conventional box-type facing target sputtering apparatus has a compact configuration and can form high-quality thin films at low temperatures, and its application to various film formations has been advanced. One of them has recently attracted attention, and its application to electrode formation of organic EL devices, for which commercialization development is thriving, has been studied in various ways. In addition, appropriateness to the field of semiconductor devices is also considered. And some of these are close to practical use.
- the conventional facing target sputtering apparatus has the following problems. If the spacing is increased to cover a large area of the substrate, the magnetic field in the opposite direction for plasma restraint is reduced and the opposing sputtering does not function. Therefore, the spacing is essentially increased in the opposite direction. There is a problem that can not be done. And, at present, when a permanent magnet is used as the magnetic field generating means, the interval is limited to at most about 20 cm, so when forming a film in a stationary state of the substrate, it is limited to a substrate smaller than this. There is a problem.
- the force can be applied to a large-area substrate by transferring in the X direction, specifically in the opposite direction, and expanding the target length in the Y direction perpendicular to this.
- the target becomes expensive, uniform cooling of the target becomes difficult, and problems such as limited productivity, and the fact that the target is easily broken in the middle depending on the material, and handling is poor, etc. Disclosure of the invention
- the present invention is intended to solve such problems, and it is an object of the present invention to provide a facing target sputtering apparatus capable of processing a large area substrate without any serious problem, and more specifically, the in-line method described above. It is an object of the present invention to provide a facing target sputtering apparatus which can be used without any problem, and a facing target sputtering apparatus which can process a large area substrate even when the substrate is at rest.
- a target module having a rectangular target attached to the front surface of a backing portion provided with cooling means, and a target module attached to the front surface.
- a unit support having a module attachment unit to be attached, and a magnet support unit having a magnet storage unit for storing a permanent magnet so as to generate a magnetic field in the opposite direction around the module attachment unit;
- a facing target unit having a pair of facing target units having the facing permanent magnets and facing each other at a facing facing space of the facing facing sputtering unit.
- the module attachment portion of the unit support is The target module is divided into a plurality of attachment sections which can be individually sealed and attached in the lateral direction parallel to the mounting surface and the substrate surface, and each attachment section has a predetermined length corresponding thereto.
- An opposite is characterized in that the film formation area of the substrate in the direction of the tat direction is covered with a synthetic target consisting of a plurality of target modules provided side by side by attaching a get module.
- the target sputtering system is Si-filled.
- a pair of targets are made to face each other with a predetermined facing space being separated, and a magnetic field in the opposite direction is generated around the targets.
- a facing type sputtering unit in which a permanent magnet is disposed on the In a facing target sputtering apparatus in which a film is formed on a substrate disposed on the side of the facing space so as to face a side face of the facing space, a plurality of the facing sputtering parts are combined with each other.
- the permanent magnet is arranged to generate a magnetic field in the opposite direction around a plate-like intermediate unit support with the target on the target side attached to each surface, and the overall thickness including the target is By combining the film forming areas of the facing sputter units on both sides with an intermediate target unit having a thickness that can form a film having a predetermined film thickness on the side of the substrate side of the intermediate fabric support.
- a facing target characterized in that it comprises a synthetic facing-type film, a plurality of film-forming areas of the facing sputtering section are synthesized in the facing direction to form one film-forming area.
- Sputtering apparatus is provided.
- the target units having end portions at both ends of the synthetic facing sputtering unit have a rectangular target attached to the front surface of a backing portion provided with cooling means.
- a modular support having a module and a module mounting portion to which a target module is attached on the front surface, and a magnet storage portion storing a permanent magnet around the module mounting portion so as to generate a magnetic field in the opposite direction.
- An intermediate target module comprising a body and the permanent magnet housed in the housing portion, wherein the intermediate target unit is provided with cooling means, and targets are attached to both sides of the intermediate unit support;
- An arrangement consisting of a permanent magnet arranged to generate magnetic fields in opposite directions along the outer circumference of the target As a whole, the dimensions of the target in the vertical direction can be reduced, that is, the thickness of the unit becomes thinner, and the degree of overlapping of the film forming regions of the sputtered portions on both sides of the intermediate target unit can be increased. It is preferable from the point which can be box-shaped.
- the predetermined film thickness is preferably equal to or more than the average film thickness of the necessary film forming region from the viewpoint of force uniformity determined from the required film thickness distribution and the like.
- the film on the side of this intermediate target is formed by overlapping incident particles from the sputtered parts on both sides thereof. And, the film thickness of each sputtered part is thick at the center, and becomes thinner gradually as it gets away from this. Therefore, in order to obtain an average film thickness, it is considered sufficient that the film thickness of 50% or more of the maximum film thickness of the sputtered parts on both sides is provided on the side of the intermediate target unit.
- the end target unit can be provided with a plurality of attachments that allow the module attachment portion of the unit support to be attached by individually sealing the target modules in the lateral direction parallel to the target surface and the substrate surface.
- the target module is divided into compartments, and a target module of a predetermined length is attached to each attachment section, and a composite target module consisting of a plurality of target modules arranged in the lateral direction is A target attached to the intermediate support unit, the intermediate target unit having a plurality of intermediate target modules of a predetermined length with targets attached to both sides of the intermediate support provided with the cooling means.
- the first intermediate unit is a synthetic intermediate target unit in which permanent magnets are disposed so as to generate magnetic fields in the opposite direction along the outer periphery of the juxtaposed intermediate target modules while simultaneously achieving the same length.
- An opposing target sputtering system in combination with the embodiment of 1 is carried out.
- the length of the unit in the Y direction is equal to or greater than the length in the Y direction of the substrate.
- the landing unit is divided into a plurality of attachment sections of appropriate length, and target modules are attached to each attachment section, and an opposing target unit formed by mounting a composite target in which a plurality of target modules are connected is placed oppositely. It is According to this configuration, it is possible to effectively increase the length of a target by combining a plurality of target modules of appropriate predetermined lengths without using a long target.
- Sputtering equipment can be used. Furthermore, by setting the target module standardized by the length, it is sufficient to prepare the target and backing part of the limited standard length, and a large effect is obtained in terms of production cost, maintenance management, spare parts, etc. can get.
- a plurality of facing sputtering units are combined by an intermediate target unit in which one target of each sputtering unit is attached to both surfaces to form one film.
- a synthetic facing type sputtering unit is disposed to form a formation region. According to this configuration, the facing-type spatter portion with a limited facing distance can not form a force. It is possible to realize a synthetic facing sputtering unit having a synthetic region, and to form a film of uniform thickness on a substrate having a large area and a large area in the opposing direction, specifically in the X direction in a stationary state. It is possible to provide a facing target sputtering system.
- the third aspect of the present invention is a combination of the second aspect and the first aspect described above, and is essentially the length in the lateral direction (Y direction) and the length in the opposite direction (X direction). It is an object of the present invention to provide a facing target sputtering apparatus capable of forming a film on a large area substrate in a stationary state without any limitation.
- the present invention enables a large mask which is difficult to realize in a facing target sputtering apparatus, which is noted for its low damage to the lower layer by plasma, and is capable of manufacturing semiconductor devices, It can be widely applied to the production of flat panel displays such as liquid crystal displays and organic EL displays, and further, to the production of functional films in which a high functional film such as an ITO film is formed on a plastic film.
- FIG. 1 is a perspective view showing a part of a first embodiment of the present invention in a cross-sectional view.
- FIG. 2 is a schematic perspective view of a target unit according to the first embodiment of this invention.
- FIG. 3 is a cross-sectional view taken along line A-A of FIG.
- FIG. 4 is a perspective view of an auxiliary electrode used in the first embodiment of the present invention.
- FIG. 5 is a plan view of the unit support used in the first embodiment of the present invention.
- FIG. 6 is a perspective view showing a part of a second embodiment of the present invention in a cross-sectional view.
- FIG. 7 is a schematic perspective view of an intermediate target unit used in the second embodiment of the present invention.
- FIG. 8 is a cross-sectional view taken along the line B_B of FIG.
- FIG. 9 is a perspective view of the third embodiment of the present invention.
- FIG. 10 is a schematic perspective view of an intermediate target unit used in the third embodiment of the present invention.
- FIG. 11 is a cross-sectional view taken along the line C-C of FIG.
- FIG. 12 is a cross-sectional view taken along line D-D of FIG.
- FIG. 13 is a cross sectional view showing a modification of the embodiment of the present invention.
- FIG. 14 is a cross sectional view showing a modification of the embodiment of the present invention.
- FIG. 15 is a cross sectional view showing a modification of the embodiment of the present invention.
- FIG. 16 is a graph of the film thickness distribution of the film-forming example 1 of the present invention.
- FIG. 17 is a graph of the film thickness distribution of the film forming example 2 of the present invention.
- FIG. 18 is a perspective view of a conventional box-type opposed sputtering unit. BEST MODE FOR CARRYING OUT THE INVENTION
- FIG. 1 is a schematic perspective view partially including a cross-sectional view, showing a box-type facing target sputtering apparatus according to a first embodiment of the present invention.
- a box-type opposed sputtering unit (hereinafter referred to as a box-shaped sputter section) 70 according to the present embodiment has target units 100a and 100b in the form of a rectangular frame 71, and the opposing side surfaces 71a and 71b on the left and right sides. It is airtightly attached to the board 20 and faces the substrate 20.
- the side faces 71c to 71e other than the open side 71f on the lower side (the side 71c and 71d on the near side and the back side are not shown in the figure) (In the figure, the shield plate 72c of the side surface 71c on the front side is not shown.) Airtightly shields, and only the open side surface 71f is open, and the other is sealed in a box-shaped configuration of the opposing space 120. .
- Target unit 100a the opposite side of the 100b, each two respectively are arranged in the Y-direction target 100a Medical 10032: 1001 ⁇ , 100b 2 ( 100b 2 are not shown) is attached. Further, permanent magnets 130a and 130b for forming a magnetic field mainly in the X direction and permanent magnets 180a and 180b for adjusting a magnetic field in the magnetron mode are attached to the target units 100a and 100b.
- the permanent magnets 130a, 130b and 180a, 180b are fixed in the housing using fixing plates 132a, 132b and 182a, 182b, respectively.
- pole plates 191a, 191b for magnetically coupling the permanent magnets 132a, 132b and the permanent magnets 182a, 182b are provided.
- the pole plates 191a and 191b are provided with openings 193a (not shown) and 193b for passing cooling water supply and drain pipes.
- the front means the side of the opposing space 120 of the target opposite to the target, and the rear means the opposite side).
- the “U” -shaped auxiliary electrode consisting of a copper tube for absorbing electrons, as shown in In order to make it easy to see in FIG. 1, the main body is not shown), and the legs 201b and 201c (201c is not shown) of the auxiliary electrode are drawn out from the shielding plate 72e.
- the facing target units 100a and 100b of the present embodiment have a unit configuration that can be attached to and removed from the frame 71 integrally.
- FIG. 2 is a perspective view of a target unit used in the present embodiment
- FIG. 3 is a cross-sectional view taken along line A-A in FIG. 2 and 3 show the target unit 100a, in which the target unit 100b is reversed in the arrangement of the magnetic poles N and S of the permanent magnet 130a of the magnetic field generating means and the permanent magnet 180a of the magnetic field adjusting means.
- the configuration is the same as that of this target unit 100a except for the detailed description thereof is omitted.
- the target unit 100a is configured to be detachably attached to the frame 71 by the flange 155a of the unit support 150a.
- the target unit 100a has a modular structure of the support module and the two target modules as follows, and the target module 200 ai is mounted on the unit support 150a of the support module. , 200a 2 are attached in a row in the Y direction.
- the target module 200a 200a 2 comprises a backing portion 113a 113a 2 and targets 110 3 110a 110a 2 fixed on the surface thereof.
- the tacking portions 113 3 l and 113 a 2 are provided with an attachment surface having the same shape as the target 110 a and 110 a 2 as shown in the figure, and cooling grooves 161 a and 161 a 2 are formed inside as shown by dotted lines in the figure.
- a dividing wall 162a 162a 2 is provided, and a cooling jacket 160a 160a 2 is configured here.
- Cooling grooves 161a l N 161a 2 is connected port 163 3 l carried out of both ends of the supply and drainage of cooling water are connected to 163a 2. Further, the cooling grooves 161a and 161a 2 are formed as wide as possible so as to cover the back surface of the targets 110a and 110a 2 .
- the backing portion 113a or 113a 2 with the targets 110 ai and 110a 2 fixed to the front surface is a module attachment portion for attaching the target module provided on the front surface of the unit support 150a of the support module.
- the concave part 152a of the housing it is attached in an airtight and exchangeable manner by using the O-rings 116 ⁇ and 116a 2 by means of bonoreto 111a at a fixed interval in the periphery.
- the cooling jackets 160a and 160a 2 form stepped recesses having partition walls 162a and 162a 2 at the rear of the backing main body 114a and 114a 2 formed of a thick plate-like body of backing portions 113a and 113a 2 ,
- a backing lid 115a or 115a 2 having a connection port 163a or 163a 2 formed on the step is welded to seal the stepped recess.
- the backing portions 1133 and 113a 2 and the partitions 162 ⁇ and 162a 2 are formed of a heat conductive material, specifically, copper in this example.
- a synthetic resin tube is piped through the through hole 154a provided in the unit support 150a to the connection port 163a or 163a 2 and the cooling jacket 160a or 160a 2 is formed. It is designed to allow the passage of cooling water.
- the target 1103 it 110a 2 on the front surface of the backing portion 113a has 113a 2 and bonded with a satisfactorily thermally conductive adhesive material (e.g. indium), and target module 200a have 200a 2.
- a satisfactorily thermally conductive adhesive material e.g. indium
- target module 200a have 200a 2.
- This target module 2003 ⁇ 200a 2 is described in detail below as the cooling jackets 160 ai and 160 a 2 are blocked from the vacuum side (opposite space 120 side) by the O-rings 1163 and 116a 2 for vacuum seedling.
- the rear surface of which a backing portion 1133 I 113a 2 is attached so as to contact directly with bolts 111a in the recess 152a of the module mounting portion of the support module.
- the targets 110 ai and 1103 ⁇ 4 of the two target modules 200a and 200a 2 are connected in series to effectively use a synthetic target that is large in the Y direction. It is possible to form a film on a large substrate. Therefore, according to the in-line method of film formation while transporting the substrate in the X direction, the size in the Y direction, specifically, the width in the horizontal direction, the long continuous film, is a width in the horizontal direction, It becomes possible to form a film on a large-area single wafer or glass substrate. And, independent cooling jackets 160a and 160a 2 are provided for every target module 2003/200 a 2 and they are cooled independently for every target 110 ai and 110 a 2 so that the cooling is effective without unevenness.
- the cooling power can be supplied independently to each of the cooling jackets 160a and 160a 2
- the power input power is small, in other words, the film formation speed is small, and when large cooling is not necessary, etc.
- the piping system can be simplified by connecting two cooling jackets 160a and 160a 2 of modules 200a and 200a 2 in series by piping and supplying the drainage of one cooling jacket to the other cooling jacket.
- the effective Y-direction dimension of the target is increased.
- the Y direction of the synthetic target is obtained by using the permanent magnet 180a of the magnetic field adjustment means described later. Can adjust the film thickness distribution in this direction. Ru.
- the support module consists of an integral unit support 150a which is shaped as shown by heat well, in this example a block of aluminum, as shown by IJ :::. Then, in the flange 155a of the mounting portion, an electrically insulating sleeve, which has a fixed interval, is provided on the frame 71 via the packing 156a made of an electric insulating material, in this example, raw resin, and the O-rings 117a and 118a for vacuum sealing. It is electrically insulated and attached airtightly by attached bolt 112a.
- the unit support 150a has a configuration in which a flange 155a having a predetermined width for attachment to the frame 71 is provided on the rear side of the lower surface of the rectangular support body 151a. It is Then, a concave portion 152a of the module attachment portion for attaching the target module is formed on the front surface (upper surface in the figure) of the support main body portion 151a, and the peripheral magnet portion 153a surrounding the concave portion 152a is a permanent magnet 130a of the magnetic field generating means.
- a storage section 131a for storing the components is drilled from the rear surface (lower surface in the figure) side of the atmosphere.
- the recess 152a of the module attachment portion is as shown in FIG. 5 so that two target modules can be attached. That is, the bottom surface of the module attachment portion of the recess 152a is divided into two sections in the Y direction, and the O-ring 116a or 116a 2 sealing surface 119a is set on the back of the backing section 113a or 113a 2 in each section. 119a 2 is formed as an attachment compartment to which the target modules can be individually sealed and attached individually. Therefore, by attaching a target module to each attachment section, it is possible to construct a composite target module in which a plurality of target modules are connected in the Y direction. In Fig. 5, the bolt holes for mounting are not shown to simplify the drawing. In the present embodiment ..
- the ends of the front (Fig. Above) the end surface have eaves portion and the target 110a of Batsuki ring portion 113a have 113a 2 of the target module U0a 2 of the peripheral wall portion 153a covers.
- this ridge portion and the upper end thereof have the same function as the conventional electron reflecting means, but different from the conventional electron reflecting means attached to the backing portion via the support member described later.
- the target end is bonded to the eaves portion of the backing portion 113a have U3a 2 directly is very well cooled, the effect is significant power to increase productivity as a whole since it turned can be obtained.
- the configuration around the target is very simple, and there is a great cost advantage.
- the target end has an electron reflection function
- the back wall 113a or 113a of the overlapping portion with the peripheral wall 153a may be formed.
- a conventional electron reflecting means in which the ridge portion of 2 and the end portion of the target 110a or 110a 2 are deleted, and the peripheral wall portion 153a, that is, the pole tip of the permanent magnet 130a is raised and an electron reflection plate is provided in front thereof. It is preferable that the front side magnetic pole end face of the permanent magnet 130a be slightly protruded to the inside of the tank than the front face of the target 110a 1 , 110a 2 .
- a groove for attaching the permanent magnet 180a (see FIG. 1) of the magnetic field adjustment means is mounted on the central portion of the rear side of the support main body 151a of the unit support 150a in parallel with the Y axis. It is drilled so as to cover almost the entire length of the 110a 110a 2 .
- a permanent magnet (180a) may be installed in this groove so as to fill the entire groove, or may be spaced apart.
- the permanent magnet (180a) of the magnetic field adjustment means and the permanent magnet 130a of the magnetic field generation means are magnetically coupled by the pole plate 191a via the fixed plates (182a) and 132a.
- the pole plate 191a is made of a ferromagnetic material, and the pole plate (191b) of the target unit (100b) is not shown, for example, a plate made of a ferromagnetic material that covers the entire surface of the shielding plate (72c, 72d or 72e). It is magnetically coupled by the connecting plate.
- the connection plate for the magnetic coupling between the pole plates 191a and 191b is formed by an opening which is inserted between the tank wall 11 of the vacuum tank 10 and the frame 71 and does not narrow the opening of the frame 71. It may be a formed plate-like body.
- the mounting plate 191a can be sufficiently and stably held by the magnetic force of the permanent magnets 130a and 180a, so it is possible to use only these magnetic forces, but for safety it is possible to use a screw with a sleeve with electrical insulation. It can also be fixed.
- the pole plate 191a is electrically insulated from the target unit 100a by fixed plates (182a) and 132a made of an electrical insulating material, and is held at, for example, the ground potential.
- the storage portion 131a is constituted by a slot having a position opened to the atmosphere side so that the permanent magnet 130a of the magnetic field generating means can be taken in and out from the atmosphere side outside the tank.
- the magnet 130a is inserted into the slot of the storage portion 13 la in the illustrated magnetic pole arrangement.
- Permanent magnets 130a the predetermined length in this example, a plate-like Alnico such commercial permanent magnet having a predetermined width, the synthetic target composed of a predetermined number of permanent magnets 130a in the target 110 3 iota and 110a 2 (i.e. It is disposed along the outer periphery of a virtual target (110 3 +110 a 2 ) and fixed by bonding a fixing plate 132a made of an electrically insulating material, in this example, a thin resin plate.
- an X-direction magnetic field in the X direction is formed surrounding the opposing space (the space formed by the pair of opposing synthetic targets) in cooperation with the permanent magnet 130b of the opposing target unit 100b.
- An arc-shaped magnetron mode magnetic field is generated along the periphery of the composite target (iio ai + 110a 2 ) from the surface of the part toward the surface near the center.
- sputtering in the central part of the synthetic target is mainly controlled by the magnetic field in the former opposite mode, and sputtering in the peripheral part of the synthetic target is mainly controlled in the magnetic field in the latter magnetron mode, and along the outer circumference acting as electron reflecting means as a whole.
- a substantially uniform sputtering is realized over the entire surface of the target except for the aforementioned end.
- the permanent magnet 180a of the magnetic field adjustment means is disposed so as to strengthen the magnetic field in the magneto-tonal mode as a whole, and the fixed plate 182a which is the same thin plate as the fixed plate 132a and made of a resin plate is used. Bonded and fixed.
- the magnetic field adjustment means can adjust the magnetic field of the magnetron mode in the vicinity of the front surface of the peripheral part of the synthetic target consisting of the targets 110 3 and 110 a 2 , so that the magnetic field is controlled by the magnetic field of the magneto mode independently of the magnetic field of the opposing mode.
- the plasma constraint at the periphery of the target can be adjusted, making it possible to achieve uniform erosion of the target and even uniform film thickness distribution in the Y direction of the thin film to be formed.
- FIG. 4 is a perspective view of a shield plate 72e showing a state in which an auxiliary electrode is attached.
- the auxiliary electrode of this embodiment has a main body 201a and legs 201b and 201c, which are made of a copper tube, so as to correspond to the end of the above-mentioned synthetic target which is an electron reflecting means in which thermal electrons are easily retained.
- the U-shaped tubular electrode 201 has a part of the leg portion thereof led to the outside from the shielding plate 72e, that is, to the atmosphere. And although it is not shown in FIG. 1 for the sake of clarity, In the opposing space 120, the lower end of the target 110a 110a 2 and 110b 110b 2 in the opposite space 120, and the legs 201b and 201c along the front and rear ends in the same figure in the vicinity of the front It is arranged parallel to the target plane.
- the same anode potential (ground potential) as that of the shield plate 72e is applied to the tubular electrode 201, and absorbs excess electrons including thermal electrons generated in the facing space. Cooling water is circulated in the tubular electrode 201 and forced cooling is performed.
- the arrangement and shape of the auxiliary electrode are not limited to the illustrated example. The point is that the electrode should be disposed in the vicinity of the location where thermal electrons are easily accumulated. When this auxiliary electrode is provided, it is confirmed that the light emission associated with the electron retention is greatly reduced, and it is also confirmed that the temperature rise during film formation of the substrate is suppressed.
- the target unit 100a has a configuration in which two target modular units 200a and 200a 2 are arranged side by side on a unit support 150a. Then, the target unit 100a is provided with a mounting flange portion 155a as a frame 71, and a fixed distance from an electrical insulating material, specifically, a packing 156a made of a heat resistant resin, and vacuum sealing O-rings 117a and 118a. By mounting it with Bonoreto 112a using a sleeve (not shown) made of an electrically insulating material, it is airtightly installed in a frame 71 electrically insulated as shown in FIG. Part 70 is composed.
- the box-shaped sputtering unit 70 is formed by electrically insulating the target units 100a and 100b on the side surfaces 71a and 71b of the frame 71 made of a rectangular parallelepiped structural material (in this example, aluminum) as described above. And airtightly attach, and shield plates 72c to 72e are bolted to the other side surfaces 71c to 71e via an O-ring (not shown) except the side surface 71f which is an opening of the lower surface facing the substrate 20 It is airtightly attached and closed by the operation) (the side surfaces 71c and 71d and the shielding plate 72c are not shown).
- the shield plates 72c to 72e have heat resistance and can be vacuum-shielded, and the material is not limited, and an ordinary structural material can be applied. In this example, the same lightweight aluminum as the frame 71 was used. In addition, the shielding plates 72c to 72e are cooled by providing a cooling pipe or the like on the outer side as needed.
- the box-type sputtering unit 70 is airtightly attached to the tank wall 11 of the vacuum tank 10 by a bolt at the lower opening side surface 71 f of the frame 71 so that the opening thereof faces the vacuum tank 10. Therefore, the vacuum chamber 10 and the frame 71 are electrically connected by the mounting bolt.
- the substrate 20 is held stationary on the substrate holder 21. It is also possible to adopt an in-line method in which the film formation is performed while moving the substrate in the opposite direction by the force transfer means which is configured to form a film while holding it.
- a known load lock chamber (not shown) is connected to one of the side surfaces of the vacuum chamber 10, so that the substrate 20 can be supplied and unloaded onto the substrate holder 21 by the substrate loading and unloading means not shown. It is done.
- the targets 110 ai , 110b, 110a 2 and 110b 2 (110b 2 are not shown) of the synthetic targets face each other at a predetermined interval, and plasma for the synthetic target is generated.
- the basic configuration of the restraint magnetic field is also the same as that in the above-mentioned FIG. 18, ie, the conventional example.
- sputtering film formation is performed in the same manner as in the conventional example. Then, as shown in the film formation examples described later, it is possible to realize the facing target sputtering apparatus which can form a film in a wide range as expected and the film formation region is basically not limited to the horizontal length of the substrate.
- FIG. 6 is a schematic perspective view partially including a cross-sectional view, showing a box-type facing target sputtering apparatus according to a second embodiment of the present invention.
- the target units 100 a and 100 b at both ends are airtightly attached to the opposite side surfaces 71 a and 71 b in the figure of the rectangular frame 71 and face the substrate 20.
- the side faces 71c to 71e (the side faces 71c and 71d on the near side and the back side are not shown) other than the open side face 71f on the lower side are the shielding plates 72c to 72e (in the figure, the shielding plate 72c on the near side 71c).
- an intermediate target unit 300 having targets 110g and 110h on both sides to form an opposing sputtering unit, and opposing sputtering units of two opposing spaces 120 and 120 2 formed between the target units 100a and 100b.
- targets 110g and 110h on both sides to form an opposing sputtering unit, and opposing sputtering units of two opposing spaces 120 and 120 2 formed between the target units 100a and 100b.
- the target units 100a and 100b of the end portions located at the end of the opposing direction of the synthetic facing sputtering unit are not the synthetic target module of FIG. 1 but the target unit and target module of FIG. It has basically the same configuration as that of the example except that it is one, and the symbols of the respective members are the same as in FIG. Therefore, the detailed explanation is It is omitted, and below, only the main points. That is, on the opposite surface side, one rectangular target 110a, 110b of the same size is attached.
- permanent magnets 130a and 130b for forming a magnetic field mainly in the X direction and permanent magnets 180a and 180b for adjusting a magnetic field in the magnetron mode are attached to the target armatures I00a and 100b, respectively.
- pole plates 191a, 191b for magnetically coupling the permanent magnets 130a and 180a and the permanent magnets 130b and 180b are provided.
- the pole plates 191a and 191b have openings 193a (not shown) and 193b for passing a cooling water supply pipe and a drainage pipe.
- the intermediate target unit 300 is formed of a thick rectangular plate having the same rectangular shape as a target having parallel surfaces to which targets are attached on both sides, and a cooling jacket (shown in FIG. 6 for easy viewing).
- facing space 120 have 120 2 to a surface facing the target 110g of the intermediate unit support member 301 shown) is formed, and an intermediate target modules attached to 110h, attached to the other four sides of the medium between Yunitto support 301
- the magnet holder 311 and the magnet holding boxes 314 to 316 (314 and 316 are not shown) of the magnet holding means for holding the permanent magnet 130c which generates the magnetic fields in the X direction, specifically, the opposite direction It consists of a permanent magnet 130c.
- the exposed surfaces other than the surfaces of the targets 110g and 110h of the intermediate target unit 300 are covered with a shield plate 338 as shown so as not to be sputtered.
- the strain board 338 is directly attached to the shielding plate 72e.
- a through hole 76 for piping for circulating cooling water to the cooling jacket in the intermediate unit support 301 is opened.
- auxiliary electrodes for absorbing electrons are provided near the front of the end of each target 100a, 100g, 100h, 100b (not shown in the opposing space for simplification).
- the legs 201b and 201c (201c not shown) of the auxiliary electrode are drawn out from the shielding plate 72e.
- the target 110a and the target 110g face each other at a predetermined distance as in the related art to form an opposing space 12 ( ⁇ , and permanent magnets 130a and 130c are formed along the outer circumference of each target on the back of each end. There has been mounted. Similarly, the target 110b and the target 110h forms a facing space 120 2 by pairs toward the permanent magnet 130b along the back of the respective ends around the respective targets, 130c Where the permanent magnet 130c is the target The permanent magnets 130a and 130c, and the permanent magnets 130b and 130c, which are common to I00g and 100h, are arranged such that the different poles face each other.
- a magnetic field of a predetermined opposing mode is formed in each opposing sputtering system consisting of opposing spaces 120 and 120 2 on both sides of the intermediate target unit 300 to confine plasma in the space.
- an arc-shaped magnetic field of the magneto- tine mode is formed in the vicinity of the surface of the peripheral part of each target.
- the target units 100a and 100b are provided with permanent magnets 180a and 180b of the magnetic field adjustment means for adjusting the magnetron mode magnetic field, for convenience of alignment with the intermediate target unit 300, etc. This can be omitted if it is not necessary to adjust it.
- Vacuum tank 10 is disposed under the synthetic counter-type sputtering section where two counter-type sputtering sections of countering space 120 ⁇ 120 2 are integrated.
- An opening is provided in a portion opposite to the lower surface in the drawing of the sputter portion Vacuum chamber below the opening
- a substrate holder 21 in which a substrate 20 is set is provided in the housing 10.
- a load lock chamber is connected to one side of the vacuum tank 10 on the front and rear sides so that the substrate 20 can be taken in and out.
- the target units 100a and 100b at the end are attached to the side surfaces 71a and 71b of the frame 71 via the heat-resistant I "patterning 156a and 156b made of green resin, and the side surfaces 71c of the frame 71 Shielding plates 72c to 72e (side surfaces 71c and 71d, and shielding plate 72c are not shown) are attached to 71 to 71e, and an insulating plate 331 made of a heat resistant resin or the like is attached to the vacuum side of the shielding plate 72e.
- the intermediate target unit 300 is airtightly attached to form a box-shaped sputtering unit 70.
- the box-shaped sputtering unit 70 is formed by attaching a frame 71 to the tank wall 11 of the vacuum chamber 10 with a bolt.
- the target unit 100a, 100b, the shields 72c to 71e, the vacuum chamber 10, and the frame 71 are airtightly attached to each other through an O-ring, and the facing spaces 120 i, 120 are attached. 2 and the vacuum chamber 10 are shut off from the atmosphere side.
- the film formation region of the substrate 20 immediately below is a view facing to the respective counter sputtering unit consisting of counter space 120 I 120 2, the spatter particles generated by sputtering of the opposing target surface are deposited in fly
- the film formation is performed by the At this time, in the side view of the intermediate target unit 300, sputtered particles also fly to the lower region, and film formation is performed although it is thinner than the region immediately below the facing space. That is, the film formation region of the facing sputtering unit Not only the portion facing the opening, but also the periphery thereof, a film having a substantially uniform film thickness is deposited at the center of the opening and has a substantially uniform film thickness.
- the deposition rate gradually decreases and the film thickness formed simultaneously decreases, but the film is deposited. Therefore, in the region immediately below the intermediate target unit 300, the sputtered particles generated in the facing sputter units on both sides overlap each other to form a combined film. Therefore, X-direction thickness of concrete on the target 110g of sputtering conditions and the intermediate target Interview knit 300, by appropriately selecting the surface dimension between the 110h, facing the space 12 ( ⁇ and 120 each opposite Shikisu Bruno 2
- the thickness of the film formed in the region immediately below the footer portion can be made substantially equal to the thickness of the film formed in the region immediately below the intermediate target unit 300, thereby suppressing the variation in film thickness in the X direction.
- film formation can be performed to a substantially uniform thickness on the substrate 20. That is, according to the present embodiment, a synthetic facing type in which facing type sputter sections on both sides thereof are integrated by an intermediate target unit. The sputtered portion can effectively expand the film formation region with a uniform film thickness in the X direction, specifically in the opposite direction, and form a film in a stationary state on a large-area substrate with no limitation on the dimension in this direction. Be able to do
- FIG. 7 is a perspective view of the intermediate target unit 300
- FIG. 8 is a cross-sectional view taken along the line B- B of FIG.
- the intermediate unit support 301 is made of a thick plate of heat conductive copper having a target attachment surface formed on both sides, and a cooling section partitioned by a partition 304 inside thereof.
- a cooling jacket 302 consisting of grooves 303 is formed.
- a connection port 305 is formed at both ends of the cooling groove 303, and a tube connected thereto supplies and drains the cooling water.
- targets 110g and 110h are adhered to the target attachment surfaces on both sides of the intermediate support 301 using, for example, indium.
- Magnet holding grooves 306 are formed in the remaining four sides of the intermediate unit support 301.
- the magnet holding box 314 of the magnet holding means storing permanent magnets 130c in the magnet housing groove 306 of the three sides except the atmosphere side (the upper side in FIG. 7, FIG. 8) of the four sides. 316 (316 not shown) are attached by screws 334.
- the magnet holding means for storing the permanent magnet 130c and a magnet holding tool 311 which serves both as an external connection portion to be airtightly attached to the external shielding plate 72e. It is done.
- the magnet holder 311 is constituted by a main body portion 312 having a stepped recess for holding the permanent magnet 130 c in the X direction, specifically, in the opposite direction, and a lid portion 313 fitted in the stepped recess.
- the back end and the front end face of the side of the stepped recess can be sealed, and the main body 312 and the cover 313 of the magnet holder 311 hold bolts 335 while holding the permanent magnet 130 c in the X direction.
- the intermediate target unit 300 is electrically insulated from the shielding plate 72e by being attached to the shielding plate 72e by attaching the magnet holder 311 to the shielding plate 72e by means of the insulating plate 331 with the insulating plate 331 via the insulating plate 331. Be supported. Through holes 317 and 332 for passing a cooling water supply tube are opened in the magnet holder 311 and the insulating plate 331. Further, the insulating plate 331 is provided with a through hole (not shown) for connecting the wire of the sputtering power supply to the wire connection portion 318 provided in the lid portion 313 of the magnet holder 311. The through holes and the cooling jacket 302 of the intermediate unit support 301 are isolated from the vacuum side by O-rings 341 to 343.
- the magnet holder 311 and the magnet holding boxes 314 to 316 are made of lightweight aluminum alloy.
- the permanent magnet 130c housed in the magnet holder 311 and the magnet holding boxes 314 to 316 is processed so as to be able to pass a screw 334, a bolt 335 or a tube for cooling water.
- FIG. 9 is a schematic perspective view showing a box-shaped sputtering unit 70 of the facing target sputtering apparatus according to the third embodiment of the present invention as viewed from the substrate side (vacuum tank side).
- one side surface 71f of the rectangular frame 71 is an opening of a predetermined size facing the substrate side, and two opposing side surfaces sandwiching the opening are formed as shown in FIG.
- Target units 100a and 100b of the same configuration as the first embodiment of the figure are attached.
- the remaining three sides of the frame 71 are closed by shielding plates 72c to 72e.
- the target units 100a and 100b at this end are each attached with two targets 110a and 110a 2 (both not shown); 1101 ⁇ and 110b 2 constituting the synthetic target as described above.
- Pole plates 191a and 191b are attached to the back of the target units 100a and 100b.
- a synthetic intermediate target unit 300 consisting of two end intermediate target units 300 300 2 arranged side by side on the rear side shielding plate 72e facing the opening. Is attached as follows.
- middle targ of each end Ttoyunitto 300 have 300 2 has the same configuration as the intermediate targets Interview knit 300 of the foregoing embodiments the second embodiment except that different part arrangement of the magnet retainer box magnet holding means. That is, targets 110 h and 110 gl ; 110 h 2 and 110 g 2 are attached to the target attachment surfaces on both sides of each intermediate unit support 301 and 301 2 of the intermediate target unit 300 300 2 .
- synthetic intermediate target unit 300 are provided in parallel to the intermediate positions of the target units 100a and 100b equipped with end synthetic targets as shown.
- two pairs of synthetic targets in which two targets are arranged in the Y direction, specifically in the lateral direction, and two facing sputtering sections composed of the synthetic targets composed of each pair are synthesized.
- Intermediate Target Unit 300 These opposing sputtering units are formed on both sides of the synthetic intermediate target unit 300.
- the integrated counter-type sputtering unit was integrated.
- the target units 100a and 100b have the same configuration as that of the first embodiment described with reference to FIGS. 1 to 3 as described above, and thus the details will be omitted. The details of the intermediate target unit of the present embodiment will be described.
- Fig. 10 shows a synthetic intermediate target unit 300 equipped with two intermediate targets 300 ⁇ 300 2 at the end. 11 and 12 are cross-sectional views taken along the lines C-C and D-D of FIG. 10, respectively.
- a zigzag cooling groove 303 303 303 2 partitioned by partition walls 30 ⁇ and 304 2 .
- the cooling jackets 302 and 302 2 are formed.
- At both ends of the cooling grooves 303 have 303 2 is formed with a connection port 305 have 305 2, supplied 'drainage of the cooling water is performed by the connected tube here.
- targets 110 gl and U0 h 1 ; 110 g 2 and 110 h 2 are made of indium, for example, on the target attachment surfaces on both sides of the intermediate unit support 301 and 301 2 respectively. It is glued. The three sides except the side that bind if side i.e. in contact with each other of the intermediate unit support member 301 ⁇ 301 2, the magnet accommodating grooves 306 have 306 2 is bored.
- Magnet holding box 314 for housing the air side surface perpendicular to the permanent magnet 130c to the target (first 0 view of the upper side) 2 side magnet containing grooves 306 have 306 2 except of its three sides Screws 315 J; 315 2 , 316 2 are attached by means of screws 334.
- Intermediate Yunitto support 301 301 magnet holders 311 have 311 2 which also serves as an external connection portion for attaching the second air-side side surface to the magnet holding means and the outside of the shielding plate 72e for accommodating a permanent magnet 130c is It is attached.
- Lid magnet holder 311 I 311 2 the main body portion 312 iota having a stepped recess for holding the permanent magnet 130c to generate a magnetic field in the direction perpendicular to the target, and 31 2 2, which is fitted into the stepped recess part 313 constituted by the I 313 2 (in the first 1 diagram stepped recess for simplicity spoon of Figure is shown as a simple concave).
- the magnet holder 311 have 311 2, through holes 317 have 317 2 for passing a tube for supply and discharge of cooling water is opened, connecting the wiring of sputtering power on the upper surface of the lid portion 313 have 313 2 Wiring connections 318 or 318 2 are provided.
- the cooling jacket 302 I 302 2 of the intermediate unit support, O-ring 341 I 341 2 and the main body portion 312 I 312 2 disposed on the back of the main body 312 I 312 2 of magnet holder 311 I 311 2 It is isolated from the vacuum side by an O-ring (not shown; corresponds to O-ring 342 in Fig. 8) placed on the air side (upper side of the figure).
- the magnet holder 311 ⁇ 311 2 is attached to the shield plate 72 e by an electrically insulating sleeved bolt (not shown) via the insulating plate as in the second embodiment.
- an auxiliary electrode for absorbing excess electrons in the facing space is located in the vicinity of the front of the end of each synthetic target in the shielding plate 72e. It is provided as.
- ⁇ opposed-type sputtering unit consists of, also target 1101 ⁇ , and 110b 2 and the target 110h 1 N 110h 2 opposing sputtering unit consisting of counter space 120 2 facing is formed. it.
- the outer peripheral portion of the synthetic target (110 ai + 110 a 2 and 110 gl + 110 g 2 ) constituted by targets arranged in the Y direction is opposed by the magnetic field in the X direction emitted from the force.
- a magnetic field in the opposite mode surrounding the space 120 is formed, and in the opposite sputtering unit consisting of the opposite space 120 2, a synthetic target (I i b i + i i obs) is formed by targets arranged in the Y direction.
- l io ⁇ + ii The magnetic field in the opposite mode surrounding the facing space 120 is formed by the magnetic field in the X direction emitted from the outer periphery of the oi.
- a magnetic field of magnetron mode is formed along the outer periphery of each target except for the edge welded to the other target in the outer periphery along the outer periphery of each synthetic target.
- the box-shaped sputtering unit 70 is provided with bolts at the upper opening side in the drawing of the frame 71 so that the opening faces the vacuum chamber. Airtightly attached to the chamber wall of the vacuum chamber. Therefore, the vacuum chamber and the frame 71 are electrically connected by the mounting bolt. In the vacuum chamber, the substrate is set to face the above-mentioned opening and the film formation is carried out as in the above-mentioned embodiment. At that time, as described in the second embodiment, a synthetic intermediate target unit 300.
- a synthetic intermediate tag 300 In the third embodiment, a synthetic intermediate tag 300.
- a single intermediate target unit is provided to form two opposed type sputter units, and two targets are arranged in the Y direction.
- a composite intermediate target unit 300 0 disposed between the single-target unit 100 a and 100 b.
- the number of targets may be two or more, and / or the number of targets aligned in the Y direction may be three or more, so that film formation can be performed on a wider substrate.
- the number of intermediate target units and targets to be arranged can be arbitrarily selected, thus providing a facing target type sputtering apparatus capable of processing a large area substrate with essentially no dimensional limitation in the horizontal direction of the substrate and in the vertical direction as well. .
- Figure 13 shows a composite intermediate target unit 300 when three targets are arranged in the Y direction. It is sectional drawing which shows the structure of.
- the end middle target unit Is arranged a central portion intermediate targets Interview knit 300 3 synthetic intermediate targets Interview two Tsu DOO 300 0 is configured between.
- the first 1 are those having the same reference same structure as Yunitto of codes is shown in Figure and the detailed description is omitted.
- third intermediate unit support member 301 3 of the central portion is provided with cooling channels 303 3 partitioned by those similarly to the partition wall 304 3 ends, the cooling jacket 302 3 here It is formed.
- the cooling grooves 303 3 is formed with a connection port 305 3, supply and drainage of cooling water is performed by attached tubing here.
- the middle part of the intermediate fabric support 301 3 is parallel to the XZ plane, in particular the middle part of the end.
- No permanent magnets are disposed on the side surfaces joined to the side surfaces of the knit supports 301 i and 3012.
- Magnet accommodating groove for accommodating a magnet on the side of the side surface and opposite thereto on the side surface specific parallel to the XY plane between Yunitto support 301 3 Among the connections to the outside (not shown) It is formed.
- Recesses magnet holders 311 3 includes a main body 3123 having a stepped recess, stepped recesses (First 3 view configured by the lid portion 313 3 to be fitted to the stepped recess Ru single name As shown).
- the main body portion 312 3 and the cover portion 313 3 of the magnet holder 311 3 is attached to the intermediate unit support 301 3 by Ponoreto 335.
- the magnet holder 311 3, the through-hole 317 3 are opened for the passage of tubes for cooling water supply, is Rooster connecting portion 318 3 connecting Rooster sputtering power provided on the upper surface of the lid portion 313 3 It is done.
- Synthesis intermediate targets Interview knit 300 0 and the target Interview knit 100a disposed opposite each the 100b support modules are arranged three target module.
- the target modules arranged on both sides are configured in the same manner as the target module 2003 ⁇ 200a 2 shown in FIGS. 2 and 3, and the middle target module has two side surfaces parallel to the Z-X plane. It joins with other target modules and is configured to contact the peripheral wall of the support body only on the remaining 2 sides (sides parallel to the XY plane).
- the synthetic intermediate target unit is not shown in the drawings, a scanned board is disposed on the exposed surface except for the target surface in the same manner as in the second embodiment.
- the facing target single sputtering devices are both cases where the target is a nonmagnetic material, but when the target is a magnetic material, the magnetic field of the target is a magnetic field in the facing mode. It is desirable not to cover the magnetic pole of the permanent magnet for forming the Furthermore, on the periphery of the target (if the targets are arranged in the Y direction, they should be arranged in the Y direction). It is desirable to provide an electron reflecting means on the periphery of the composite target formed by FIG. 14 is a cross-sectional view of the target unit 100a when the target is a magnetic body, and FIG. 15 is a cross-sectional view of the intermediate target unit when the target is a magnetic body, both of which are shown. This is an example of arranging two targets in the Y direction.
- the backing portion 113a or 113a 2 of the tag module 200a or 200a 2 is provided with a ridge portion covering the circumferential wall portion 153a of the support main portion 151a.
- this ridge is eliminated, and the backing portions 113 ai and 113 a 2 are formed in a rectangular shape.
- an electron reflection means 170a is attached on the peripheral wall portion 153a of the support main body portion 151a as shown in the figure.
- the electron reflecting means 170a has a configuration in which an electron reflecting plate portion 171a having a width facing the peripheral portion of the target 110a or 110a 2 is supported by an attaching portion 172a made of copper of a thermal good conductor having an L-shaped cross section. It is The electron reflection plate portion 171a is formed using a ferromagnetic material, for example, an iron plate so as to double as the magnetic pole of the magnetic field generating means.
- FIG. 15 the parts corresponding to the parts of the third embodiment shown in FIG. 12 are assigned the same reference numerals, and duplicate explanations are omitted.
- the intermediate unit support 301 i, 301 to 2 of 3 sides magnet containing groove 306 ,, 306 2 has been bored, in the example of the first 5 FIG intermediate A magnet accommodating groove is not formed in the unit support 301 ⁇ ⁇ ⁇ 301 2 , and the intermediate unit support 301 or 301 2 has a rectangular parallelepiped shape.
- Electron reflecting means 170c is attached to both end faces of each of the magnet holding boxes 31 and 316 2 which accommodate the permanent magnets 130c as shown.
- the electron reflecting means 170c has a configuration in which an electron reflecting plate portion 171c having a width facing the peripheral portion of the target is supported by an attaching portion 172c made of copper of a plate-like heat good conductor.
- the electron reflection plate portion 171c is formed using a ferromagnetic material, for example, an iron plate so as to serve as the magnetic pole of the magnetic field generating means.
- electron reflecting means 170c are also attached to both end faces of the magnet holder 311 ⁇ 311 2 and the magnet holding box 315, 315 2 (see FIG. 11). .
- electron reflecting means 170c is covered in electron reflection means 170c The Ru.
- the facing target sputtering apparatus provided with the synthetic target of the first embodiment shown in FIG. 1, five target modules are arranged side by side in the Y direction, ie, in the lateral direction, and The total length was 1300 mm, and the facing distance between the targets was 90 ⁇ . Then, place the substrate holder at a distance of 80 ⁇ ⁇ from the end of the target, arrange the glass substrates horizontally on the substrate holder, and use a metal oxide target, from a common power source for both synthetic targets. Electric power is supplied in parallel, a metal oxide film is formed on a glass substrate so that the maximum film thickness becomes 1 ⁇ m ⁇ or more, and the film thickness distribution is measured by measuring the film thickness with a stylus difference meter. evaluated.
- the measurement results of the film thickness distribution are shown in FIG.
- This film thickness distribution shows the film thickness distribution in the ⁇ direction at the position corresponding to the center between the targets.
- the film thickness was 100% based on the film thickness at the center (measurement position 7 in the figure), and the measured value at each measurement position was shown as a ratio (%) to the reference.
- the measurement positions were 10 cm apart in the vertical direction.
- the Z direction is 100 and the Y direction is 100 so that film formation on an 8-inch wafer is possible.
- the thickness of the intermediate target unit that is, the distance between the targets on both sides is 60%
- the distance between the targets is 145
- the X direction force is 50%
- the permanent magnets 180a and 180b for adjusting the magnetic field are omitted in the second embodiment.
- this facing target sputtering system uses this facing target sputtering system to set an 8-inch wafer at a distance of 100 ⁇ from the target, and use a metal oxide target and common to the end target unit and the intermediate target unit. Then, power was supplied in parallel to form a metal oxide film on the wafer so that the maximum film thickness would be 1000 A or more, and the film thickness distribution was evaluated by measuring the film thickness with a stylus type profilometer.
- the figure shows the film thickness distribution in the X direction, that is, the opposite direction, and each film thickness is a measured value measured at intervals of 10 ⁇ on the center line of this direction of the opening.
- the figure shows the film thickness distribution in the Y direction, that is, in the lateral direction, and each film thickness is a measurement value measured at 10 ⁇ intervals on the center line of this direction of the opening. Measurement position 6 is at the center of the opening. The film thickness was 100% based on the film thickness at the center of the opening, and the ratio of the measured straight line measured at each measurement position to the reference was shown (%).
- the film thickness distribution in both directions is within ⁇ 10% of the average value even for an 8-inch wafer. Also, it can be seen that with a 6-inch wafer, a very uniform distribution within ⁇ 5% can be obtained. Furthermore, the uniformity can be further improved by providing a mask or the like for adjusting the film thickness.
- the film formation area in the opposite direction can be expanded by the synthetic facing sputtering section, which has not been possible in the related art, and film formation on a large area substrate can be performed in the stationary state required for manufacturing semiconductor devices. A facing target sputtering system is realized.
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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EP05819974A EP1835047A4 (en) | 2004-12-28 | 2005-12-13 | SPRAY DEVICE WITH TARGETS FACING FACE |
JP2006550682A JP4379744B2 (ja) | 2004-12-28 | 2005-12-13 | 対向ターゲット式スパッタ装置 |
US11/547,640 US20070187234A1 (en) | 2004-12-28 | 2005-12-13 | Facing-targets type sputtering apparatus |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2004378805 | 2004-12-28 | ||
JP2004-378805 | 2004-12-28 |
Publications (1)
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WO2006070623A1 true WO2006070623A1 (ja) | 2006-07-06 |
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PCT/JP2005/023218 WO2006070623A1 (ja) | 2004-12-28 | 2005-12-13 | 対向ターゲット式スパッタ装置 |
Country Status (6)
Country | Link |
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US (1) | US20070187234A1 (ja) |
EP (1) | EP1835047A4 (ja) |
JP (1) | JP4379744B2 (ja) |
CN (1) | CN100540728C (ja) |
TW (1) | TWI322190B (ja) |
WO (1) | WO2006070623A1 (ja) |
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WO2011111712A1 (ja) | 2010-03-09 | 2011-09-15 | 株式会社イー・エム・ディー | スパッタ装置 |
US9738967B2 (en) | 2006-07-12 | 2017-08-22 | Cardinal Cg Company | Sputtering apparatus including target mounting and control |
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JP5147083B2 (ja) * | 2007-03-30 | 2013-02-20 | 国立大学法人東北大学 | 回転マグネットスパッタ装置 |
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JP5374590B2 (ja) * | 2009-09-01 | 2013-12-25 | 東京エレクトロン株式会社 | スパッタリング装置 |
US9303312B2 (en) * | 2013-03-06 | 2016-04-05 | Areesys Technologies, Inc. | Film deposition apparatus with low plasma damage and low processing temperature |
CN105095028B (zh) * | 2014-04-29 | 2018-11-02 | 国际商业机器公司 | 用于在组件中定位单元的方法和装置 |
KR101686802B1 (ko) * | 2015-03-10 | 2016-12-15 | 성균관대학교산학협력단 | 대향 타겟식 스퍼터링 장치 |
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JP2755776B2 (ja) * | 1990-04-20 | 1998-05-25 | 三菱重工業株式会社 | 高速成膜スパッタリング装置 |
JPH10330936A (ja) * | 1997-06-02 | 1998-12-15 | Sadao Kadokura | 対向ターゲット式スパッタ装置 |
JP2003155564A (ja) * | 2001-11-19 | 2003-05-30 | Fts Corporation:Kk | 対向ターゲット式スパッタ装置 |
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US4666788A (en) * | 1982-02-16 | 1987-05-19 | Teijin Limited | Perpendicular magnetic recording medium, method for producing the same, and sputtering device |
JPS58141433A (ja) * | 1982-02-16 | 1983-08-22 | Teijin Ltd | 磁気記録媒体とその製造方法 |
JP2004143548A (ja) * | 2002-10-25 | 2004-05-20 | Sumitomo Metal Mining Co Ltd | 多分割スパッタリングターゲット組立体 |
JP3965479B2 (ja) * | 2003-07-28 | 2007-08-29 | 株式会社エフ・ティ・エスコーポレーション | 箱型対向ターゲット式スパッタ装置及び化合物薄膜の製造方法 |
-
2005
- 2005-11-30 TW TW094142031A patent/TWI322190B/zh not_active IP Right Cessation
- 2005-12-13 WO PCT/JP2005/023218 patent/WO2006070623A1/ja active Application Filing
- 2005-12-13 CN CNB2005800166862A patent/CN100540728C/zh not_active Expired - Fee Related
- 2005-12-13 EP EP05819974A patent/EP1835047A4/en not_active Withdrawn
- 2005-12-13 JP JP2006550682A patent/JP4379744B2/ja not_active Expired - Fee Related
- 2005-12-13 US US11/547,640 patent/US20070187234A1/en not_active Abandoned
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JPH0411624B2 (ja) * | 1986-06-20 | 1992-03-02 | Teijin Ltd | |
JP2755776B2 (ja) * | 1990-04-20 | 1998-05-25 | 三菱重工業株式会社 | 高速成膜スパッタリング装置 |
JPH10330936A (ja) * | 1997-06-02 | 1998-12-15 | Sadao Kadokura | 対向ターゲット式スパッタ装置 |
JP2003155564A (ja) * | 2001-11-19 | 2003-05-30 | Fts Corporation:Kk | 対向ターゲット式スパッタ装置 |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9738967B2 (en) | 2006-07-12 | 2017-08-22 | Cardinal Cg Company | Sputtering apparatus including target mounting and control |
EP2059625B1 (en) * | 2006-07-12 | 2019-04-10 | Cardinal CG Company | Sputtering target assembly and method for deploying it |
JP2011074415A (ja) * | 2009-09-29 | 2011-04-14 | Toppan Printing Co Ltd | 電子吸収体およびそれを用いた電子線加熱蒸着装置 |
WO2011111712A1 (ja) | 2010-03-09 | 2011-09-15 | 株式会社イー・エム・ディー | スパッタ装置 |
US10604442B2 (en) | 2016-11-17 | 2020-03-31 | Cardinal Cg Company | Static-dissipative coating technology |
US11325859B2 (en) | 2016-11-17 | 2022-05-10 | Cardinal Cg Company | Static-dissipative coating technology |
Also Published As
Publication number | Publication date |
---|---|
EP1835047A1 (en) | 2007-09-19 |
JPWO2006070623A1 (ja) | 2008-06-12 |
TWI322190B (en) | 2010-03-21 |
EP1835047A4 (en) | 2009-11-04 |
TW200628622A (en) | 2006-08-16 |
CN100540728C (zh) | 2009-09-16 |
CN1957107A (zh) | 2007-05-02 |
US20070187234A1 (en) | 2007-08-16 |
JP4379744B2 (ja) | 2009-12-09 |
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