WO2006027935A1 - 側鎖含有型有機シラン化合物、有機薄膜トランジスタ及びその製造方法 - Google Patents
側鎖含有型有機シラン化合物、有機薄膜トランジスタ及びその製造方法 Download PDFInfo
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- WO2006027935A1 WO2006027935A1 PCT/JP2005/014847 JP2005014847W WO2006027935A1 WO 2006027935 A1 WO2006027935 A1 WO 2006027935A1 JP 2005014847 W JP2005014847 W JP 2005014847W WO 2006027935 A1 WO2006027935 A1 WO 2006027935A1
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- -1 organosilane compound Chemical class 0.000 title claims abstract description 131
- 238000000034 method Methods 0.000 title claims description 71
- 239000010409 thin film Substances 0.000 title claims description 67
- 230000008569 process Effects 0.000 title claims description 7
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims abstract description 16
- 230000007062 hydrolysis Effects 0.000 claims abstract description 11
- 238000006460 hydrolysis reaction Methods 0.000 claims abstract description 11
- 150000001875 compounds Chemical class 0.000 claims description 141
- 239000010408 film Substances 0.000 claims description 92
- YTPLMLYBLZKORZ-UHFFFAOYSA-N Thiophene Chemical compound C=1C=CSC=1 YTPLMLYBLZKORZ-UHFFFAOYSA-N 0.000 claims description 69
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 claims description 54
- 125000003118 aryl group Chemical group 0.000 claims description 37
- 229930192474 thiophene Natural products 0.000 claims description 34
- 239000000758 substrate Substances 0.000 claims description 32
- 239000000126 substance Substances 0.000 claims description 27
- 238000004519 manufacturing process Methods 0.000 claims description 25
- 229910000077 silane Inorganic materials 0.000 claims description 24
- 125000000217 alkyl group Chemical group 0.000 claims description 16
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical group C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 claims description 15
- 125000004432 carbon atom Chemical group C* 0.000 claims description 14
- 125000003545 alkoxy group Chemical group 0.000 claims description 13
- 125000005843 halogen group Chemical group 0.000 claims description 11
- 238000003747 Grignard reaction Methods 0.000 claims description 8
- 229910052799 carbon Inorganic materials 0.000 claims description 8
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 6
- 125000005106 triarylsilyl group Chemical group 0.000 claims description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 4
- 125000004665 trialkylsilyl group Chemical group 0.000 claims description 3
- 230000001186 cumulative effect Effects 0.000 claims description 2
- 238000010030 laminating Methods 0.000 claims description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 49
- PCLIMKBDDGJMGD-UHFFFAOYSA-N N-bromosuccinimide Chemical compound BrN1C(=O)CCC1=O PCLIMKBDDGJMGD-UHFFFAOYSA-N 0.000 description 47
- 239000000243 solution Substances 0.000 description 45
- VZGDMQKNWNREIO-UHFFFAOYSA-N tetrachloromethane Chemical compound ClC(Cl)(Cl)Cl VZGDMQKNWNREIO-UHFFFAOYSA-N 0.000 description 39
- YLQBMQCUIZJEEH-UHFFFAOYSA-N Furan Chemical compound C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 31
- 230000015572 biosynthetic process Effects 0.000 description 31
- 238000006243 chemical reaction Methods 0.000 description 31
- 238000003786 synthesis reaction Methods 0.000 description 28
- 239000007818 Grignard reagent Substances 0.000 description 25
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 25
- 150000004795 grignard reagents Chemical class 0.000 description 25
- 238000005481 NMR spectroscopy Methods 0.000 description 22
- 239000011777 magnesium Substances 0.000 description 21
- 229910052749 magnesium Inorganic materials 0.000 description 21
- OZAIFHULBGXAKX-UHFFFAOYSA-N 2-(2-cyanopropan-2-yldiazenyl)-2-methylpropanenitrile Chemical compound N#CC(C)(C)N=NC(C)(C)C#N OZAIFHULBGXAKX-UHFFFAOYSA-N 0.000 description 20
- OZAIFHULBGXAKX-VAWYXSNFSA-N AIBN Substances N#CC(C)(C)\N=N\C(C)(C)C#N OZAIFHULBGXAKX-VAWYXSNFSA-N 0.000 description 20
- 239000002243 precursor Substances 0.000 description 20
- 238000005259 measurement Methods 0.000 description 17
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 16
- 125000000026 trimethylsilyl group Chemical group [H]C([H])([H])[Si]([*])(C([H])([H])[H])C([H])([H])[H] 0.000 description 16
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 15
- 229910052751 metal Inorganic materials 0.000 description 14
- 239000002184 metal Substances 0.000 description 14
- 238000001308 synthesis method Methods 0.000 description 14
- 125000000524 functional group Chemical group 0.000 description 13
- 239000002994 raw material Substances 0.000 description 13
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 12
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 11
- 239000004065 semiconductor Substances 0.000 description 11
- 238000007740 vapor deposition Methods 0.000 description 11
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 10
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 10
- 239000000463 material Substances 0.000 description 10
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 9
- 239000011248 coating agent Substances 0.000 description 9
- 238000000576 coating method Methods 0.000 description 9
- IFLREYGFSNHWGE-UHFFFAOYSA-N tetracene Chemical compound C1=CC=CC2=CC3=CC4=CC=CC=C4C=C3C=C21 IFLREYGFSNHWGE-UHFFFAOYSA-N 0.000 description 9
- JRNVZBWKYDBUCA-UHFFFAOYSA-N N-chlorosuccinimide Chemical compound ClN1C(=O)CCC1=O JRNVZBWKYDBUCA-UHFFFAOYSA-N 0.000 description 8
- 239000003054 catalyst Substances 0.000 description 8
- 239000003153 chemical reaction reagent Substances 0.000 description 8
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 8
- 150000002894 organic compounds Chemical class 0.000 description 8
- 125000001246 bromo group Chemical group Br* 0.000 description 7
- CBVJWBYNOWIOFJ-UHFFFAOYSA-N chloro(trimethoxy)silane Chemical compound CO[Si](Cl)(OC)OC CBVJWBYNOWIOFJ-UHFFFAOYSA-N 0.000 description 7
- 238000007598 dipping method Methods 0.000 description 7
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 description 7
- 125000001570 methylene group Chemical group [H]C([H])([*:1])[*:2] 0.000 description 7
- SLIUAWYAILUBJU-UHFFFAOYSA-N pentacene Chemical compound C1=CC=CC2=CC3=CC4=CC5=CC=CC=C5C=C4C=C3C=C21 SLIUAWYAILUBJU-UHFFFAOYSA-N 0.000 description 7
- 239000002904 solvent Substances 0.000 description 7
- KEIFWROAQVVDBN-UHFFFAOYSA-N 1,2-dihydronaphthalene Chemical compound C1=CC=C2C=CCCC2=C1 KEIFWROAQVVDBN-UHFFFAOYSA-N 0.000 description 6
- ILNDSSCEZZFNGE-UHFFFAOYSA-N 1,3-Di-tert-butylbenzene Chemical compound CC(C)(C)C1=CC=CC(C(C)(C)C)=C1 ILNDSSCEZZFNGE-UHFFFAOYSA-N 0.000 description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- XBDYBAVJXHJMNQ-UHFFFAOYSA-N Tetrahydroanthracene Natural products C1=CC=C2C=C(CCCC3)C3=CC2=C1 XBDYBAVJXHJMNQ-UHFFFAOYSA-N 0.000 description 6
- 239000004305 biphenyl Substances 0.000 description 6
- QARVLSVVCXYDNA-UHFFFAOYSA-N bromobenzene Chemical compound BrC1=CC=CC=C1 QARVLSVVCXYDNA-UHFFFAOYSA-N 0.000 description 6
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical compound C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 6
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 6
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 6
- 125000003808 silyl group Chemical group [H][Si]([H])([H])[*] 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 238000010521 absorption reaction Methods 0.000 description 5
- 238000000862 absorption spectrum Methods 0.000 description 5
- 230000009878 intermolecular interaction Effects 0.000 description 5
- 229910052757 nitrogen Inorganic materials 0.000 description 5
- 238000010992 reflux Methods 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 230000002194 synthesizing effect Effects 0.000 description 5
- KQKGLWMJTTXASS-UHFFFAOYSA-N trimethyl-(4-trimethylsilylfuran-3-yl)silane Chemical compound C[Si](C)(C)C1=COC=C1[Si](C)(C)C KQKGLWMJTTXASS-UHFFFAOYSA-N 0.000 description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 4
- 229910018540 Si C Inorganic materials 0.000 description 4
- 229910002808 Si–O–Si Inorganic materials 0.000 description 4
- 235000002597 Solanum melongena Nutrition 0.000 description 4
- 238000005266 casting Methods 0.000 description 4
- IJOOHPMOJXWVHK-UHFFFAOYSA-N chlorotrimethylsilane Chemical compound C[Si](C)(C)Cl IJOOHPMOJXWVHK-UHFFFAOYSA-N 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- HSZCZNFXUDYRKD-UHFFFAOYSA-M lithium iodide Chemical compound [Li+].[I-] HSZCZNFXUDYRKD-UHFFFAOYSA-M 0.000 description 4
- 239000003960 organic solvent Substances 0.000 description 4
- 125000004430 oxygen atom Chemical group O* 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
- 239000013545 self-assembled monolayer Substances 0.000 description 4
- 238000001179 sorption measurement Methods 0.000 description 4
- 239000007858 starting material Substances 0.000 description 4
- 238000003756 stirring Methods 0.000 description 4
- 229910052717 sulfur Inorganic materials 0.000 description 4
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 4
- XGCDBGRZEKYHNV-UHFFFAOYSA-N 1,1-bis(diphenylphosphino)methane Chemical compound C=1C=CC=CC=1P(C=1C=CC=CC=1)CP(C=1C=CC=CC=1)C1=CC=CC=C1 XGCDBGRZEKYHNV-UHFFFAOYSA-N 0.000 description 3
- ZPQOPVIELGIULI-UHFFFAOYSA-N 1,3-dichlorobenzene Chemical compound ClC1=CC=CC(Cl)=C1 ZPQOPVIELGIULI-UHFFFAOYSA-N 0.000 description 3
- JWCGDNHAPBZVHD-UHFFFAOYSA-N 1,4-epoxy-1,4-dihydronaphthalene Chemical class C12=CC=CC=C2C2OC1C=C2 JWCGDNHAPBZVHD-UHFFFAOYSA-N 0.000 description 3
- KXSFECAJUBPPFE-UHFFFAOYSA-N 2,2':5',2''-terthiophene Chemical compound C1=CSC(C=2SC(=CC=2)C=2SC=CC=2)=C1 KXSFECAJUBPPFE-UHFFFAOYSA-N 0.000 description 3
- SLDBAXYJAIRQMX-UHFFFAOYSA-N 3-ethylthiophene Chemical compound CCC=1C=CSC=1 SLDBAXYJAIRQMX-UHFFFAOYSA-N 0.000 description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N acetic acid Substances CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- 125000004429 atom Chemical group 0.000 description 3
- 235000010290 biphenyl Nutrition 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 239000000460 chlorine Substances 0.000 description 3
- 229910052801 chlorine Inorganic materials 0.000 description 3
- 125000004122 cyclic group Chemical group 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000005669 field effect Effects 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 230000002140 halogenating effect Effects 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 230000003993 interaction Effects 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 230000009257 reactivity Effects 0.000 description 3
- 150000004756 silanes Chemical class 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 150000003577 thiophenes Chemical class 0.000 description 3
- IKBMPVFDRAQKNI-UHFFFAOYSA-N trimethyl-[2,4,5-tris(trimethylsilyl)phenyl]silane Chemical compound C[Si](C)(C)C1=CC([Si](C)(C)C)=C([Si](C)(C)C)C=C1[Si](C)(C)C IKBMPVFDRAQKNI-UHFFFAOYSA-N 0.000 description 3
- SWJPEBQEEAHIGZ-UHFFFAOYSA-N 1,4-dibromobenzene Chemical compound BrC1=CC=C(Br)C=C1 SWJPEBQEEAHIGZ-UHFFFAOYSA-N 0.000 description 2
- MPTKQBAGXQUSMP-UHFFFAOYSA-N 2-bromo-3-ethylthiophene Chemical compound CCC=1C=CSC=1Br MPTKQBAGXQUSMP-UHFFFAOYSA-N 0.000 description 2
- GSFNQBFZFXUTBN-UHFFFAOYSA-N 2-chlorothiophene Chemical compound ClC1=CC=CS1 GSFNQBFZFXUTBN-UHFFFAOYSA-N 0.000 description 2
- UIGHARXPLDWFHA-UHFFFAOYSA-N 2-trimethylsilylphenol Chemical compound C[Si](C)(C)C1=CC=CC=C1O UIGHARXPLDWFHA-UHFFFAOYSA-N 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- TWRXJAOTZQYOKJ-UHFFFAOYSA-L Magnesium chloride Chemical compound [Mg+2].[Cl-].[Cl-] TWRXJAOTZQYOKJ-UHFFFAOYSA-L 0.000 description 2
- OFBQJSOFQDEBGM-UHFFFAOYSA-N Pentane Chemical compound CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- KAESVJOAVNADME-UHFFFAOYSA-N Pyrrole Chemical compound C=1C=CNC=1 KAESVJOAVNADME-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 239000006087 Silane Coupling Agent Substances 0.000 description 2
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 2
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 2
- 239000007983 Tris buffer Substances 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 150000001336 alkenes Chemical class 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 125000003277 amino group Chemical group 0.000 description 2
- 230000031709 bromination Effects 0.000 description 2
- 238000005893 bromination reaction Methods 0.000 description 2
- DIKBFYAXUHHXCS-UHFFFAOYSA-N bromoform Chemical compound BrC(Br)Br DIKBFYAXUHHXCS-UHFFFAOYSA-N 0.000 description 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 2
- 125000001309 chloro group Chemical group Cl* 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 238000012790 confirmation Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- VPUGDVKSAQVFFS-UHFFFAOYSA-N coronene Chemical compound C1=C(C2=C34)C=CC3=CC=C(C=C3)C4=C4C3=CC=C(C=C3)C4=C2C3=C1 VPUGDVKSAQVFFS-UHFFFAOYSA-N 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 125000000753 cycloalkyl group Chemical group 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 150000001993 dienes Chemical class 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 150000002391 heterocyclic compounds Chemical class 0.000 description 2
- 150000002430 hydrocarbons Chemical group 0.000 description 2
- IXCSERBJSXMMFS-UHFFFAOYSA-N hydrogen chloride Substances Cl.Cl IXCSERBJSXMMFS-UHFFFAOYSA-N 0.000 description 2
- 229910000041 hydrogen chloride Inorganic materials 0.000 description 2
- 229910010272 inorganic material Inorganic materials 0.000 description 2
- 239000011147 inorganic material Substances 0.000 description 2
- CFHGBZLNZZVTAY-UHFFFAOYSA-N lawesson's reagent Chemical compound C1=CC(OC)=CC=C1P1(=S)SP(=S)(C=2C=CC(OC)=CC=2)S1 CFHGBZLNZZVTAY-UHFFFAOYSA-N 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Natural products C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 2
- 239000012299 nitrogen atmosphere Substances 0.000 description 2
- 125000004433 nitrogen atom Chemical group N* 0.000 description 2
- 239000011356 non-aqueous organic solvent Substances 0.000 description 2
- 125000000843 phenylene group Chemical group C1(=C(C=CC=C1)*)* 0.000 description 2
- XHXFXVLFKHQFAL-UHFFFAOYSA-N phosphoryl trichloride Chemical compound ClP(Cl)(Cl)=O XHXFXVLFKHQFAL-UHFFFAOYSA-N 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 229920003209 poly(hydridosilsesquioxane) Polymers 0.000 description 2
- 230000035484 reaction time Effects 0.000 description 2
- 239000003870 refractory metal Substances 0.000 description 2
- 239000005871 repellent Substances 0.000 description 2
- 238000007363 ring formation reaction Methods 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- FDNAPBUWERUEDA-UHFFFAOYSA-N silicon tetrachloride Chemical compound Cl[Si](Cl)(Cl)Cl FDNAPBUWERUEDA-UHFFFAOYSA-N 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 239000011593 sulfur Substances 0.000 description 2
- YTZKOQUCBOVLHL-UHFFFAOYSA-N tert-butylbenzene Chemical compound CC(C)(C)C1=CC=CC=C1 YTZKOQUCBOVLHL-UHFFFAOYSA-N 0.000 description 2
- 125000003396 thiol group Chemical class [H]S* 0.000 description 2
- ITMCEJHCFYSIIV-UHFFFAOYSA-M triflate Chemical compound [O-]S(=O)(=O)C(F)(F)F ITMCEJHCFYSIIV-UHFFFAOYSA-M 0.000 description 2
- NEMQDTJVHPZXQU-UHFFFAOYSA-N triphenyl-(3-phenyl-5-triphenylsilylphenyl)silane Chemical group C1=CC=CC=C1C1=CC([Si](C=2C=CC=CC=2)(C=2C=CC=CC=2)C=2C=CC=CC=2)=CC([Si](C=2C=CC=CC=2)(C=2C=CC=CC=2)C=2C=CC=CC=2)=C1 NEMQDTJVHPZXQU-UHFFFAOYSA-N 0.000 description 2
- UNXDQBKUOWUVSW-UHFFFAOYSA-N (2-bromo-5-phenyl-3-trimethylsilylphenyl)-trimethylsilane Chemical group C[Si](C)(C)C1=C(Br)C([Si](C)(C)C)=CC(C=2C=CC=CC=2)=C1 UNXDQBKUOWUVSW-UHFFFAOYSA-N 0.000 description 1
- WQWNURNWDYZPPT-UHFFFAOYSA-N (2-bromo-5-phenyl-3-triphenylsilylphenyl)-triphenylsilane Chemical group BrC1=C([Si](C=2C=CC=CC=2)(C=2C=CC=CC=2)C=2C=CC=CC=2)C=C(C=2C=CC=CC=2)C=C1[Si](C=1C=CC=CC=1)(C=1C=CC=CC=1)C1=CC=CC=C1 WQWNURNWDYZPPT-UHFFFAOYSA-N 0.000 description 1
- TZFLBWAKFGADPX-UHFFFAOYSA-N (3-bromo-5-trimethylsilylphenyl)-trimethylsilane Chemical compound C[Si](C)(C)C1=CC(Br)=CC([Si](C)(C)C)=C1 TZFLBWAKFGADPX-UHFFFAOYSA-N 0.000 description 1
- AFVDZBIIBXWASR-AATRIKPKSA-N (E)-1,3,5-hexatriene Chemical compound C=C\C=C\C=C AFVDZBIIBXWASR-AATRIKPKSA-N 0.000 description 1
- SCYULBFZEHDVBN-UHFFFAOYSA-N 1,1-Dichloroethane Chemical compound CC(Cl)Cl SCYULBFZEHDVBN-UHFFFAOYSA-N 0.000 description 1
- WLIJKMIBXQQHCY-UHFFFAOYSA-N 1,2,4,5-tetrachloro-3,6-diethylbenzene Chemical compound CCC1=C(Cl)C(Cl)=C(CC)C(Cl)=C1Cl WLIJKMIBXQQHCY-UHFFFAOYSA-N 0.000 description 1
- XTIRKVIJDRWXBL-UHFFFAOYSA-N 1,2-dihydropentacene Chemical compound C1=CC=C2C=C(C=C3C(C=C4CCC=CC4=C3)=C3)C3=CC2=C1 XTIRKVIJDRWXBL-UHFFFAOYSA-N 0.000 description 1
- USKZHEQYENVSMH-YDFGWWAZSA-N 1,3,5-Heptatriene Chemical compound C\C=C\C=C\C=C USKZHEQYENVSMH-YDFGWWAZSA-N 0.000 description 1
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 1
- OHZAHWOAMVVGEL-UHFFFAOYSA-N 2,2'-bithiophene Chemical compound C1=CSC(C=2SC=CC=2)=C1 OHZAHWOAMVVGEL-UHFFFAOYSA-N 0.000 description 1
- FGKMEOUGRGZQCD-UHFFFAOYSA-N 2-(3-bromothiophen-2-yl)-3-thiophen-2-ylthiophene Chemical compound C1=CSC(C2=C(C=CS2)C=2SC=CC=2)=C1Br FGKMEOUGRGZQCD-UHFFFAOYSA-N 0.000 description 1
- RSEBUVRVKCANEP-UHFFFAOYSA-N 2-pyrroline Chemical compound C1CC=CN1 RSEBUVRVKCANEP-UHFFFAOYSA-N 0.000 description 1
- CMSGUKVDXXTJDQ-UHFFFAOYSA-N 4-(2-naphthalen-1-ylethylamino)-4-oxobutanoic acid Chemical compound C1=CC=C2C(CCNC(=O)CCC(=O)O)=CC=CC2=C1 CMSGUKVDXXTJDQ-UHFFFAOYSA-N 0.000 description 1
- OKPNZHRFXCBDGY-UHFFFAOYSA-N 5,14-dihydropentacene Chemical compound C1=CC=C2C=C(C=C3CC=4C(=CC=CC=4)CC3=C3)C3=CC2=C1 OKPNZHRFXCBDGY-UHFFFAOYSA-N 0.000 description 1
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 1
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical group CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
- 239000005977 Ethylene Substances 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- ZCQWOFVYLHDMMC-UHFFFAOYSA-N Oxazole Chemical compound C1=COC=N1 ZCQWOFVYLHDMMC-UHFFFAOYSA-N 0.000 description 1
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 description 1
- CZPWVGJYEJSRLH-UHFFFAOYSA-N Pyrimidine Chemical compound C1=CN=CN=C1 CZPWVGJYEJSRLH-UHFFFAOYSA-N 0.000 description 1
- 229910004028 SiCU Inorganic materials 0.000 description 1
- 229910020177 SiOF Inorganic materials 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical group [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- FZWLAAWBMGSTSO-UHFFFAOYSA-N Thiazole Chemical compound C1=CSC=N1 FZWLAAWBMGSTSO-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- HJPOKQICBCJGHE-UHFFFAOYSA-J [C+4].[Cl-].[Cl-].[Cl-].[Cl-] Chemical compound [C+4].[Cl-].[Cl-].[Cl-].[Cl-] HJPOKQICBCJGHE-UHFFFAOYSA-J 0.000 description 1
- 125000000218 acetic acid group Chemical group C(C)(=O)* 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 125000001931 aliphatic group Chemical group 0.000 description 1
- 125000003342 alkenyl group Chemical group 0.000 description 1
- 150000004791 alkyl magnesium halides Chemical class 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 239000003125 aqueous solvent Substances 0.000 description 1
- 125000006615 aromatic heterocyclic group Chemical group 0.000 description 1
- 125000002029 aromatic hydrocarbon group Chemical group 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical group 0.000 description 1
- 125000003710 aryl alkyl group Chemical group 0.000 description 1
- 125000004104 aryloxy group Chemical group 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000005380 borophosphosilicate glass Substances 0.000 description 1
- 229950005228 bromoform Drugs 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 150000001721 carbon Chemical group 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000005660 chlorination reaction Methods 0.000 description 1
- MNKYQPOFRKPUAE-UHFFFAOYSA-N chloro(triphenyl)silane Chemical compound C=1C=CC=CC=1[Si](C=1C=CC=CC=1)(Cl)C1=CC=CC=C1 MNKYQPOFRKPUAE-UHFFFAOYSA-N 0.000 description 1
- HRYZWHHZPQKTII-UHFFFAOYSA-N chloroethane Chemical compound CCCl HRYZWHHZPQKTII-UHFFFAOYSA-N 0.000 description 1
- 238000004587 chromatography analysis Methods 0.000 description 1
- 238000004440 column chromatography Methods 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 229920001940 conductive polymer Polymers 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 125000004093 cyano group Chemical group *C#N 0.000 description 1
- 229930007927 cymene Natural products 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- POLCUAVZOMRGSN-UHFFFAOYSA-N dipropyl ether Chemical compound CCCOCCC POLCUAVZOMRGSN-UHFFFAOYSA-N 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- AFOSIXZFDONLBT-UHFFFAOYSA-N divinyl sulfone Chemical compound C=CS(=O)(=O)C=C AFOSIXZFDONLBT-UHFFFAOYSA-N 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000002305 electric material Substances 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 125000004185 ester group Chemical group 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 239000004210 ether based solvent Substances 0.000 description 1
- 229960003750 ethyl chloride Drugs 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000000706 filtrate Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 238000004508 fractional distillation Methods 0.000 description 1
- 239000000446 fuel Substances 0.000 description 1
- 150000002240 furans Chemical class 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 230000026030 halogenation Effects 0.000 description 1
- 238000005658 halogenation reaction Methods 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- KDEZIUOWTXJEJK-UHFFFAOYSA-N heptacene Chemical compound C1=CC=CC2=CC3=CC4=CC5=CC6=CC7=CC=CC=C7C=C6C=C5C=C4C=C3C=C21 KDEZIUOWTXJEJK-UHFFFAOYSA-N 0.000 description 1
- 125000005842 heteroatom Chemical group 0.000 description 1
- QSQIGGCOCHABAP-UHFFFAOYSA-N hexacene Chemical compound C1=CC=CC2=CC3=CC4=CC5=CC6=CC=CC=C6C=C5C=C4C=C3C=C21 QSQIGGCOCHABAP-UHFFFAOYSA-N 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 230000002209 hydrophobic effect Effects 0.000 description 1
- 125000001165 hydrophobic group Chemical group 0.000 description 1
- MTNDZQHUAFNZQY-UHFFFAOYSA-N imidazoline Chemical compound C1CN=CN1 MTNDZQHUAFNZQY-UHFFFAOYSA-N 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 238000007641 inkjet printing Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000011630 iodine Substances 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 125000003253 isopropoxy group Chemical group [H]C([H])([H])C([H])(O*)C([H])([H])[H] 0.000 description 1
- ZLTPDFXIESTBQG-UHFFFAOYSA-N isothiazole Chemical compound C=1C=NSC=1 ZLTPDFXIESTBQG-UHFFFAOYSA-N 0.000 description 1
- CTAPFRYPJLPFDF-UHFFFAOYSA-N isoxazole Chemical compound C=1C=NOC=1 CTAPFRYPJLPFDF-UHFFFAOYSA-N 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 238000004768 lowest unoccupied molecular orbital Methods 0.000 description 1
- 229910001629 magnesium chloride Inorganic materials 0.000 description 1
- 230000035800 maturation Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- AUHZEENZYGFFBQ-UHFFFAOYSA-N mesitylene Substances CC1=CC(C)=CC(C)=C1 AUHZEENZYGFFBQ-UHFFFAOYSA-N 0.000 description 1
- 125000001827 mesitylenyl group Chemical group [H]C1=C(C(*)=C(C([H])=C1C([H])([H])[H])C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000004776 molecular orbital Methods 0.000 description 1
- 125000006606 n-butoxy group Chemical group 0.000 description 1
- 125000003506 n-propoxy group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])O* 0.000 description 1
- VGZIOHINNQGTOU-UHFFFAOYSA-N nickel;triphenylphosphane Chemical compound [Ni].C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 VGZIOHINNQGTOU-UHFFFAOYSA-N 0.000 description 1
- 125000002560 nitrile group Chemical group 0.000 description 1
- PFTXKXWAXWAZBP-UHFFFAOYSA-N octacene Chemical compound C1=CC=CC2=CC3=CC4=CC5=CC6=CC7=CC8=CC=CC=C8C=C7C=C6C=C5C=C4C=C3C=C21 PFTXKXWAXWAZBP-UHFFFAOYSA-N 0.000 description 1
- 125000001181 organosilyl group Chemical group [SiH3]* 0.000 description 1
- LSQODMMMSXHVCN-UHFFFAOYSA-N ovalene Chemical compound C1=C(C2=C34)C=CC3=CC=C(C=C3C5=C6C(C=C3)=CC=C3C6=C6C(C=C3)=C3)C4=C5C6=C2C3=C1 LSQODMMMSXHVCN-UHFFFAOYSA-N 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- HFPZCAJZSCWRBC-UHFFFAOYSA-N p-cymene Chemical compound CC(C)C1=CC=C(C)C=C1 HFPZCAJZSCWRBC-UHFFFAOYSA-N 0.000 description 1
- NFHFRUOZVGFOOS-UHFFFAOYSA-N palladium;triphenylphosphane Chemical compound [Pd].C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 NFHFRUOZVGFOOS-UHFFFAOYSA-N 0.000 description 1
- LKPLKUMXSAEKID-UHFFFAOYSA-N pentachloronitrobenzene Chemical compound [O-][N+](=O)C1=C(Cl)C(Cl)=C(Cl)C(Cl)=C1Cl LKPLKUMXSAEKID-UHFFFAOYSA-N 0.000 description 1
- 125000002080 perylenyl group Chemical group C1(=CC=C2C=CC=C3C4=CC=CC5=CC=CC(C1=C23)=C45)* 0.000 description 1
- CSHWQDPOILHKBI-UHFFFAOYSA-N peryrene Natural products C1=CC(C2=CC=CC=3C2=C2C=CC=3)=C3C2=CC=CC3=C1 CSHWQDPOILHKBI-UHFFFAOYSA-N 0.000 description 1
- XDJOIMJURHQYDW-UHFFFAOYSA-N phenalene Chemical compound C1=CC(CC=C2)=C3C2=CC=CC3=C1 XDJOIMJURHQYDW-UHFFFAOYSA-N 0.000 description 1
- OJMIONKXNSYLSR-UHFFFAOYSA-N phosphorous acid Chemical compound OP(O)O OJMIONKXNSYLSR-UHFFFAOYSA-N 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 229920000412 polyarylene Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- DNXIASIHZYFFRO-UHFFFAOYSA-N pyrazoline Chemical compound C1CN=NC1 DNXIASIHZYFFRO-UHFFFAOYSA-N 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- ZVJHJDDKYZXRJI-UHFFFAOYSA-N pyrroline Natural products C1CC=NC1 ZVJHJDDKYZXRJI-UHFFFAOYSA-N 0.000 description 1
- 238000001953 recrystallisation Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- YYMBJDOZVAITBP-UHFFFAOYSA-N rubrene Chemical compound C1=CC=CC=C1C(C1=C(C=2C=CC=CC=2)C2=CC=CC=C2C(C=2C=CC=CC=2)=C11)=C(C=CC=C2)C2=C1C1=CC=CC=C1 YYMBJDOZVAITBP-UHFFFAOYSA-N 0.000 description 1
- 125000005920 sec-butoxy group Chemical group 0.000 description 1
- 239000002094 self assembled monolayer Substances 0.000 description 1
- 229910021332 silicide Inorganic materials 0.000 description 1
- 150000003377 silicon compounds Chemical class 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000006884 silylation reaction Methods 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 239000011780 sodium chloride Substances 0.000 description 1
- 238000000638 solvent extraction Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 125000004089 sulfido group Chemical group [S-]* 0.000 description 1
- 125000004434 sulfur atom Chemical group 0.000 description 1
- QAOWNCQODCNURD-UHFFFAOYSA-N sulfuric acid Substances OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 125000004213 tert-butoxy group Chemical group [H]C([H])([H])C(O*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- JLAVCPKULITDHO-UHFFFAOYSA-N tetraphenylsilane Chemical compound C1=CC=CC=C1[Si](C=1C=CC=CC=1)(C=1C=CC=CC=1)C1=CC=CC=C1 JLAVCPKULITDHO-UHFFFAOYSA-N 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 125000005369 trialkoxysilyl group Chemical group 0.000 description 1
- 150000005671 trienes Chemical class 0.000 description 1
- 125000002827 triflate group Chemical group FC(S(=O)(=O)O*)(F)F 0.000 description 1
- 239000013638 trimer Substances 0.000 description 1
- YUYCVXFAYWRXLS-UHFFFAOYSA-N trimethoxysilane Chemical compound CO[SiH](OC)OC YUYCVXFAYWRXLS-UHFFFAOYSA-N 0.000 description 1
- KXFSUVJPEQYUGN-UHFFFAOYSA-N trimethyl(phenyl)silane Chemical compound C[Si](C)(C)C1=CC=CC=C1 KXFSUVJPEQYUGN-UHFFFAOYSA-N 0.000 description 1
- WQUJQUMDSHMAJX-UHFFFAOYSA-N trimethyl-(2-silyl-4-trimethylsilylfuran-3-yl)silane Chemical compound C[Si](C)(C)C1=COC([SiH3])=C1[Si](C)(C)C WQUJQUMDSHMAJX-UHFFFAOYSA-N 0.000 description 1
- YAFOIWUPQZFRSM-UHFFFAOYSA-N trimethyl-(3-phenyl-5-trimethylsilylphenyl)silane Chemical group C[Si](C)(C)C1=CC([Si](C)(C)C)=CC(C=2C=CC=CC=2)=C1 YAFOIWUPQZFRSM-UHFFFAOYSA-N 0.000 description 1
- RDDMOMIMRPHKSZ-UHFFFAOYSA-N trimethyl-(3-trimethylsilylphenyl)silane Chemical compound C[Si](C)(C)C1=CC=CC([Si](C)(C)C)=C1 RDDMOMIMRPHKSZ-UHFFFAOYSA-N 0.000 description 1
- GQQZPVSCRHRLIX-UHFFFAOYSA-N trimethyl-[3,6,7-tris(trimethylsilyl)-1,4-bis[tri(propan-2-yl)silyl]naphthalen-2-yl]silane Chemical compound C[Si](C)(C)C1=C([Si](C)(C)C)C=C2C([Si](C(C)C)(C(C)C)C(C)C)=C([Si](C)(C)C)C([Si](C)(C)C)=C([Si](C(C)C)(C(C)C)C(C)C)C2=C1 GQQZPVSCRHRLIX-UHFFFAOYSA-N 0.000 description 1
- XSVXWCZFSFKRDO-UHFFFAOYSA-N triphenyl-(3-triphenylsilylphenyl)silane Chemical compound C1=CC=CC=C1[Si](C=1C=C(C=CC=1)[Si](C=1C=CC=CC=1)(C=1C=CC=CC=1)C=1C=CC=CC=1)(C=1C=CC=CC=1)C1=CC=CC=C1 XSVXWCZFSFKRDO-UHFFFAOYSA-N 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
- C07F7/02—Silicon compounds
- C07F7/08—Compounds having one or more C—Si linkages
- C07F7/12—Organo silicon halides
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
- C07F7/02—Silicon compounds
- C07F7/08—Compounds having one or more C—Si linkages
- C07F7/18—Compounds having one or more C—Si linkages as well as one or more C—O—Si linkages
- C07F7/1804—Compounds having Si-O-C linkages
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/06—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of other non-metallic substances
- H01B1/12—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of other non-metallic substances organic substances
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/40—Organosilicon compounds, e.g. TIPS pentacene
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/615—Polycyclic condensed aromatic hydrocarbons, e.g. anthracene
- H10K85/622—Polycyclic condensed aromatic hydrocarbons, e.g. anthracene containing four rings, e.g. pyrene
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/649—Aromatic compounds comprising a hetero atom
- H10K85/655—Aromatic compounds comprising a hetero atom comprising only sulfur as heteroatom
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
Definitions
- the present invention relates to a side chain-containing organosilane compound, an organic thin film transistor, and a method for producing them. More specifically, the present invention relates to a side chain-containing organosilane compound, an organic thin film transistor, and a method for producing them, which are novel conductive or semiconductive materials useful as electrical materials.
- organic semiconductors are easier to manufacture than semiconductors using inorganic materials, can be processed easily, and can respond to the enlargement of devices, and can be expected to reduce costs due to mass production.
- organic compounds having various functions than inorganic materials can be synthesized. Therefore, in recent years, research and development of organic semiconductors has been conducted and the results have been reported.
- a TFT having a large mobility can be produced by using an organic compound containing a ⁇ -electron conjugated molecule.
- organic semiconductor films have been mainly formed by vapor deposition.
- organic compound development is mainly focused on the development of skeletons of ⁇ -electron conjugated molecules, and a typical example of the skeleton is pentacene (for example, IEEE Electron Device Lett., 18, 606-608 (1997) : Non-patent literature 1).
- pentacene for example, IEEE Electron Device Lett., 18, 606-608 (1997) : Non-patent literature 1.
- This document describes that when an organic semiconductor film is formed using pentacene and a TFT is formed using this organic semiconductor film, the field-effect mobility is 1.5 cm 2 / Vs. Therefore, in this document, it has been reported that it is possible to construct a TFT having a higher ft degree than amorphous silicon.
- the production of the organic semiconductor film requires a vacuum process such as resistance heating vapor deposition or molecular beam vapor deposition. Therefore, the manufacturing process becomes complicated and a film having crystallinity can be obtained only under certain specific conditions. Moreover, since the adsorption of the organic semiconductor film onto the substrate is physical adsorption, there is a problem that the adsorption strength of the film onto the substrate is low and the film is easily peeled off. Furthermore, to control the molecular orientation of organic compounds in the film to some extent
- a self-assembled film is a film in which a part of an organic compound is bonded to a functional group on a substrate surface.
- This film has a high degree of order (crystallinity) with very few defects. Since this self-assembled film has a very simple manufacturing method, it can be easily formed on a substrate.
- a thiol film formed on a gold substrate or a silane compound film formed on a substrate (for example, a silicon substrate) capable of protruding a hydroxyl group on the surface by a hydrophilic treatment is known. Yes.
- silane compound films are attracting attention because of their high durability.
- the silane compound film has been conventionally used as a water-repellent coating, and is formed using a silane coupling agent having an alkyl group having a high water-repellent effect or an fluorinated alkyl group as an organic functional group. It was.
- the conductivity of the self-assembled film is determined by the organic functional group in the silane compound contained in the film.
- commercially available silane coupling agents do not include compounds containing ⁇ -electron conjugated molecules in the organic functional group, and therefore it is difficult to impart conductivity to the self-assembled film. Therefore, there is a need for silane compounds suitable for devices such as TFTs that contain ⁇ -electron conjugated molecules as organic functional groups! /
- Non-Patent Document 1 IEEE Electron Device Lett., 18, 606—608 (1997)
- Patent Document 1 Japanese Patent No. 2889768
- the intermolecular force is composed of an attractive term and a repulsive term.
- the former is inversely proportional to the 6th power of the intermolecular distance
- the latter is inversely proportional to the 12th power of the intermolecular distance. Therefore, the intermolecular force obtained by adding the attractive and repulsive terms has the relationship shown in Fig. 1.
- the minimum point in Fig. 1 (arrow part in the figure) is the intermolecular distance when the most attractive force acts between molecules due to the balance between the attractive term and the repulsive term.
- the above compound may form a two-dimensional network of Si-O-Si to chemically bond to the substrate and obtain ordering due to intermolecular interaction between specific long-chain alkyls.
- one thiophene molecule which is a functional group
- long-chain alkyl alone weakens the interaction between molecules, and the spread of the ⁇ -electron conjugated molecule, which is essential for electrical conductivity, is extremely high. There was a problem of being small.
- one thiophene molecule that is a functional group has a large HOMO-LUMO energy gap as an electric conduction property. For this reason, there is a problem that sufficient carrier mobility cannot be obtained even when the above compound is used as an organic semiconductor layer for TFT or the like.
- the present invention has been made in view of the above problems, and can be easily crystallized by a simple manufacturing method to form an organic thin film. It is possible to form an organic thin film that does not peel off, and is highly ordered (crystalline) and electrically conductive It aims at providing the compound which can produce the organic thin film which has a characteristic. Furthermore, an object of the present invention is to provide a novel organosilane compound capable of ensuring sufficient carrier mobility when used as an electronic device such as a TFT, and a method for producing the same.
- R is a unit derived from a monocyclic aromatic hydrocarbon, a unit derived from a monocyclic heterocyclic compound, and 3 to LO units bonded together.
- R is a unit derived from a monocyclic aromatic hydrocarbon, a unit derived from a monocyclic heterocyclic compound, and 3 to LO units bonded together.
- R is a unit derived from a monocyclic aromatic hydrocarbon, a unit derived from a monocyclic heterocyclic compound, and 3 to LO units bonded together.
- X 1 , X 2 and X 3 are the same or different and are a group which gives a hydroxyl group by hydrolysis, and Y is a hydrogen atom, a halogen atom or a lower alkoxy group
- a substrate, an organic thin film, a gate electrode formed on one surface of the organic thin film via a gate insulating film, and both sides of the gate electrode, the organic thin film A source Z drain electrode formed in contact with one surface or the other surface, and the organic thin film comprises:
- R is a unit derived from a monocyclic aromatic hydrocarbon, a unit derived from a monocyclic heterocyclic compound, and 3 to LO units bonded together.
- the organic thin film transistor is characterized in that it is a film derived from a side chain-containing organic silan compound represented by the following formula.
- a substrate, an organic thin film, a gate electrode formed on one surface of the organic thin film via a gate insulating film, and both sides of the gate electrode, the organic thin film A method for producing an organic thin film transistor comprising a source Z drain electrode formed in contact with one surface or the other surface of
- R is a unit derived from a monocyclic aromatic hydrocarbon, a unit derived from a monocyclic heterocyclic compound, and 3 to LO units bonded together.
- the manufacturing method of the organic thin-film transistor characterized by including a process is provided.
- the compound of the present invention contains a side chain in the organic residue, the compound of the present invention has high solubility in an organic solvent, and therefore a film can be easily formed by a solution process. Further, it can be chemically bonded to the substrate by a network structure composed of a silicon atom and an oxygen atom formed between adjacent compounds by a silyl group contained in the organosilane compound. Since the intermolecular force acting between ⁇ -electron conjugated molecules works efficiently, it can be expected to form a highly crystallized organic thin film with very high stability.
- the compound of the present invention exerts an intermolecular force not only between the main chains of organic residues but also between the side chains, it can be expected to obtain higher crystallinity by forming a film.
- the compound of the present invention can be formed into a film, so that it has a particularly high conductivity in the direction perpendicular to the molecular plane of the main chain of the organic residue and two different conductivities in the other direction. It is possible to have sex. Therefore, wide application not only to organic thin film transistor materials but also to solar cells, fuel cells, sensors, etc. can be expected as conductive materials.
- FIG. 1 is a diagram for explaining the relationship between intermolecular distance and intermolecular force.
- FIG. 2 is a conceptual diagram of an example of an organic TFT of the present invention.
- the side chain-containing organosilane compound of the present invention (hereinafter simply referred to as a silane compound) is represented by the formula (1), that is, R—SiX ⁇ 3 .
- R represents a unit that is a group derived from a monocyclic aromatic hydrocarbon, a unit that is a group derived from a monocyclic heterocyclic compound, and both of these units are 3 to:
- LO An organic residue or an organic residue of a condensed polycyclic compound in which a 5-membered ring or a 6-membered ring is condensed by 2 to 10 and has at least one side chain in the organic residue. is doing.
- Examples of the monocyclic aromatic hydrocarbon constituting the unit include benzene, toluene, xylene, mesitylene, tamen, cymene, styrene, dibutenebenzene, and the like. Of these, benzene is particularly preferred.
- Examples of the hetero atom contained in the monocyclic heterocyclic compound include oxygen, nitrogen, and sulfur.
- Specific examples of the heterocyclic compound include oxygen atom-containing compounds such as furan, nitrogen atom-containing compounds such as pyrrole, pyridine, pyrimidine, pyrroline, imidazoline, and pyrazoline, and sulfur atom-containing compounds such as thiophene.
- Compounds, nitrogen and oxygen atom-containing compounds such as oxazole and isoxazole, sulfur and nitrogen atom-containing compounds such as thiazole and isothiazole, and the like, among which thiophene is particularly preferable.
- a plurality of these units may be connected in a branched manner, but are preferably connected in a linear manner.
- the organic residues may be bonded to the same unit, all different units may be bonded, or multiple types of units may be bonded regularly or in a random order.
- the position of the bond is when the component molecule of the unit is a 5-membered ring, such as 2, 5-position, 3, 4-first position, 2, 3-position, 2, 4-first position, etc. But! / Repulsive force is preferable at 2,5-position.
- a 6-membered ring it may be in the 1,4 1-position, 1,2-position, 1,3-position, etc., among which the 1,4-position 1 is preferred.
- a beylene group may be located between the units.
- the carbon and hydrogen that gives a beylene group include alkenes, alkadienes, and alkatrienes.
- alkene include compounds having 2 to 4 carbon atoms, such as ethylene, propylene, butylene and the like. Of these, ethylene is preferable.
- alkadienes include compounds having 4 to 6 carbon atoms, butagen, pentagen, hexagen and the like.
- the alcatrienes include compounds having 6 to 8 carbon atoms, such as hexatriene, heptatriene, otatriene and the like.
- R for example, as specific examples of R, as shown in the following structural formula, biphenyl, bitophenyl, terfenyl (compound of formula (1)), tarcenyl (compound of formula (2)), quarter Ferrule, quarterthiophene, quinquephele, quinquethiophene, hexifere, hexiophene, chaeloligophenol (see compounds of formula (3)), phelo-oligo-oligochelene (formula ( Examples include groups derived from compounds of 4), block co-oligomers (see compounds of formula (5) or (6)), and bi (dithiodivinyl) phenyl (see compounds of formula (7)).
- R may have a line symmetry with respect to the molecular axis as a whole, or may have a point symmetry with respect to the center as a whole.
- (1) has line symmetry
- (2) to (4) have point symmetry.
- the condensed polycyclic compound is not particularly limited as long as it is a compound having a ⁇ -electron conjugated molecular structure, and is preferably a compound having symmetry, particularly line symmetry, from the viewpoint of conductivity.
- a condensed polycyclic compound having a 5-membered ring or a 6-membered ring having a condensation number of 2 to 10 is preferable.
- Specific examples of the skeleton of such a preferable compound include, for example, an acene skeleton that is a linear condensed ring system, an aphene skeleton that is a winged condensed ring system, and a condensed ring system in which two identical rings are aligned.
- a phenylene skeleton which is a condensed ring in which benzene rings are concentrated around one ring.
- a benzene skeleton in which a benzene ring is bonded in a straight line is preferable.
- Specific examples of the acene skeleton include, for example, naphthalene, anthracene, tetracene (naphthacene), pentacene, hexacene, heptacene, octacene, etc. Is mentioned.
- R when R is a condensed polycyclic compound, R may be bonded to Si via an aryl group R2 bonded to an organic residue.
- aryl groups include phenyl groups derived from benzene, biphenyl, etc., thiol groups derived from thiophene, bithiophene, etc., and groups composed of combinations thereof, including beylene groups in between.
- the organic residue may have a functional group at its terminal.
- Specific functional groups include a hydroxyl group, a substituted or unsubstituted amino group, a nitro group, a cyano group, a substituted or unsubstituted alkyl group, a substituted or unsubstituted alkenyl group, a substituted or unsubstituted cycloalkyl group.
- substituted or unsubstituted alkoxy group substituted or unsubstituted aromatic hydrocarbon group, substituted or unsubstituted aromatic heterocyclic group, substituted or unsubstituted aralkyl group, substituted or unsubstituted aryloxy group, substituted or Examples thereof include an unsubstituted alkoxycarbo group, a carboxyl group, an ester group, a trialkoxysilyl group, and the like.
- the group that gives a hydroxyl group by hydrolysis in X 1 , X 2, and X 3 contained in the above formula (I) is not particularly limited, and examples thereof include a halogen atom or a lower alkoxy group. It is done.
- halogen atoms include fluorine, chlorine, iodine and bromine atoms.
- the lower alkoxy group include an alkoxy group having 1 to 4 carbon atoms. Examples include methoxy group, ethoxy group, n-propoxy group, 2-propoxy group, n-butoxy group, sec-butoxy group, tert-butoxy group, etc., some of which are further functional groups (triallylsilyl group).
- X 1 , X 2 and X 3 may be the same, but not all of them are the same, and two or all of them are different. You may go on. Especially, it is preferable that all are the same.
- R in the above formula (I) also has a side chain in the V deviation.
- the side chain is preferably a group imparting lipophilicity to improve solubility in an organic solvent.
- a group that does not react with an adjacent molecule is preferable.
- Side chains include substituted or unsubstituted alkyl groups, halogenated alkyl groups, cycloalkyl groups, aryl groups, dialyl amino groups, di- or triaryl alkyl groups, alkoxy groups, oxyaryl groups, nitrile groups, nitro groups, esters. Group, trialkylsilyl group, triarylsilyl group, phenol group, and acene group.
- the molecular occupied volume of is preferably 100% or less and more preferably 60% or less of the molecular occupied volume of the main skeleton of the organic residue other than the side chain. This is because when the molecular occupation volume is larger than 100% of the main skeleton, the intermolecular interaction between the main skeletons becomes smaller than that of the side chain, and the crystallinity may be significantly lowered.
- Examples of such side chains include linear alkyl groups having 1 to 4 carbon atoms, di- or trialkylsilyl groups having 1 to 4 carbon atoms, secondary and tertiary hydrocarbons, and 1 to 4 carbon atoms.
- a di- or triarylamino group having an aryl group of 5 to 18 is preferred.
- aryl groups having 1 to 3 benzene rings for example, phenyl groups, groups derived from naphthalene and anthracene
- tertiary alkyl groups containing 1 to 4 carbon atoms and benzene rings.
- triarylalkyl and triarylsilyl groups containing 1 to 3 aryl groups for example, a phenyl group or a group derived from naphthalene and anthracene.
- Specific examples of the silane compound of the present invention include those shown below.
- silane compound of the present invention is N-(2-aminoethyl)-2-aminoethyl-N-(2-aminoethyl)-2-aminoethyl-N-(2-aminoethyl)-2-aminoethyl-N-(2-aminoethyl)-2-aminoethyl-N-(2-aminoethyl)-2-aminoethyl silane compound of the present invention.
- the compound of the formula ( ⁇ ) or (IV) is obtained, for example, by reacting a compound represented by RH with alkyllithium, or a compound represented by R—X (X is a halogen atom). It can be obtained by reacting with alkyl magnesium halide or metallic magnesium.
- the reaction temperature during the reaction of the compounds (II) and ( ⁇ ) and the reaction temperature during the reaction of the compounds (IV) and ( ⁇ ) are, for example, preferably from ⁇ 100 to 150 ° C. Preferably, it is 20-100 ° C.
- the reaction time is, for example, about 0.1 to 48 hours.
- the reaction is usually performed in an organic solvent that does not affect the reaction. Examples of the organic solvent that does not adversely influence the reaction include aliphatic solvents such as hexane, pentane, benzene, and toluene, or ether solvents such as jetyl ether, dipropyl ether, dioxane, and tetrahydrofuran (THF).
- the reaction may optionally use a catalyst.
- a known catalyst such as a platinum catalyst, a noradium catalyst, or a nickel catalyst can be used.
- reaction temperature and reaction time in the following synthesis method are the same as those described above, for example, ⁇ 100 to 150 ° C. and 0.1 to 48 hours.
- a precursor of an organic residue composed of a unit derived from benzene which is an example of a monocyclic aromatic hydrocarbon and a unit derived from thiophene which is an example of a monocyclic heterocyclic compound A synthesis example is shown. However, precursors can also be formed for heterocyclic compounds containing nitrogen and oxygen atoms in the same manner as nitrogen-containing heterocyclic compounds such as thiophene.
- side chains are not described below, but by using a raw material having a halogen atom at a desired position and using a Grignard reagent, a side chain is introduced at a desired position of R. it can.
- a method for synthesizing a precursor composed of units derived from benzene or thiophene it is effective to first use a Grignard reaction after halogenating the reaction site of benzene or thiophene. .
- precursors with a controlled number of benzene or thiophene can be synthesized.
- Grignard reagent In addition to the method to be applied, it can also be synthesized by coupling using an appropriate metal catalyst (Cu, Al, Zn, Zr, Sn, etc.).
- the 2-position or 5-position of thiophene is halogenated (for example, bromination or chlorination).
- halogenation method include 1 equivalent of N-chlorosuccinimide (NCS) or N-bromosuccinimide (NBS) treatment or phosphorous oxychloride (POC1) treatment.
- divinyl sulfone is added to the halogenated thiophene and coupled to form a 1,4-diketone body. Then, in the dry toluene solution, add Lawesson Reagent (LR) or P S, and in the former case, ⁇ , the latter
- the ring closure reaction is caused by refluxing for about 3 hours.
- the number of thiophene rings can be increased by using the above reaction of thiophene, which can synthesize a precursor having one thiophene more than the total number of coupled thiophenes.
- the precursor can be halogenated at the same end as the raw material used for the synthesis. Therefore, after halogenating the precursor, for example by reacting with SiCl
- silane compound simple benzene or simple thiophene compound having an organic residue having a silyl group at the terminal and having only a unit derived from benzene or thiophene.
- the following (A) to (D) show an example of a method for synthesizing a precursor of an organic residue that only has benzene or thiophene and a method for silylation of the precursor.
- the thiophene trimer is changed to the 6 or 7 mer. Only the reaction was shown. However, by reacting with thiophene having a different number of units, precursors other than the 6 or 7-mer can be formed.
- thiophene tetramer or pentamer can be formed by reacting 2-chlorothiophene coupled with 2-chlorothiophene and then chlorinated by NCS in the same manner as described below.
- thiophene 8 or 9-mer can be formed by clophenization of thiophene tetramer with NCS [Chem. 7]
- a method of obtaining a precursor of a block-type organic residue by directly bonding a unit in which a predetermined number of thiophene and benzene-derived units are bonded to each other for example, a method using a Grignard reaction is used. is there.
- the precursor can be reacted with SiCl or HSi (OEt).
- the desired silanic compound can be obtained.
- compounds having a terminal alkoxy group silyl group are relatively low in reactivity, and therefore can be synthesized in a state of being bonded to a raw material in advance.
- the following method can be applied.
- the solvent at this time is preferably ether.
- the reaction for boronation is a two-step process. To stabilize the reaction in the initial stage, the first step is carried out at -78 ° C, and the second step is gradually performed at -78 ° C. It is preferable to increase the temperature.
- an intermediate of a block compound having a Grignard reaction force is prepared using benzene or thiophene having halogen groups (for example, bromo groups) at both ends.
- silane compound having a silyl group at the terminal of the block type compound can be synthesized.
- a compound having a norogen group (for example, a bromo group) and a trichlorosilyl group at both ends of a unit derived from benzene or thiophene is p-fluoro-lene or 2,5-thiopheneyl and a halogenating agent ( For example, by reacting with NBS, both ends are halogenated, then reacted with SiCl, and one is trichlorosilylated.
- [Chemical 8] As a method for synthesizing a precursor in which units derived from benzene or thiophene and vinyl groups are alternately bonded, for example, the following method can be applied. That is, benzene is Alternatively, after preparing a raw material having a methyl group at the reaction site of thiophene, both ends thereof are brominated using 2,2′-azobisisobutyryl-tolyl (AIBN) and NBS. After this, PO (OEt) is reacted with the bromo form to form an intermediate. Next, Ardehi at the end
- the above precursor can be formed by reacting a compound having a sulfido group with an intermediate using, for example, NaH in a DMF solvent.
- the obtained precursor has a methyl group at the terminal, for example, if this methyl group is further brominated and the above synthetic route is applied again, the precursor having a larger number of units can be formed.
- the obtained precursor is brominated using, for example, NBS, the portion is reacted with SiCl.
- the raw materials used in the above synthesis examples are general-purpose reagents that can be obtained and used from reagent manufacturers.
- the raw material CAS number and the purity of the reagent when it is obtained from Kishida Chemical as a reagent manufacturer are shown below.
- a synthesis example of a precursor of an organic residue composed of a unit derived from acene skeleton which is an example of a condensed ring composed of a 5-membered ring or a 6-membered ring, is shown.
- the side chain can be introduced at a desired position by using a raw material having a halogen atom at a desired position of R and using a Grignard reagent.
- a synthesis method of the acene skeleton for example, (1) a step of substituting a ethynyl group for a hydrogen atom bonded to two carbon atoms at a predetermined position of a raw material compound, followed by a ring-closing reaction between the ethynyl groups (2) A method in which a hydrogen atom bonded to a carbon atom at a predetermined position of a raw material compound is substituted with a triflate group, reacted with furan or a derivative thereof, and subsequently oxidized is repeated.
- An example of the synthesis method of the acene skeleton using these methods is shown below.
- n 1-In addition, since the method (2) is a method of increasing the benzene ring of the acene skeleton one by one, using a raw material having a side chain in advance, as in the following synthesis example, the number of condensed rings You can also guide ⁇ j chain by increasing. [0070] [Chemical 11]
- Ra and Rb mean side chains.
- the starting compound having two acetonitrile groups and a trimethylsilyl group may be changed to a compound in which these groups are all trimethylsilyl groups.
- the reaction product is refluxed under lithium iodide and DBU (1,8 diazabicyclo [5.4.0] undece 7).
- DBU 1,8 diazabicyclo [5.4.0] undece 7
- a compound having one benzene ring and two hydroxyl groups substituted from the compound can be obtained.
- a hydrophobic group can be introduced at the position of the bromo group.
- the raw materials used in the above synthesis examples are general-purpose reagents that can be obtained and used from reagent manufacturers.
- tetracene is available from Tokyo Kasei at a purity of 97% or higher.
- silanic compound can be isolated and purified by a known means such as transfer dissolution, concentration, solvent extraction, fractional distillation, crystallization, recrystallization, chromatography and the like.
- the Silane compound can be formed into an organic thin film as follows, for example.
- the silicon compound is dissolved in a non-aqueous organic solvent such as hexane, black mouth form, or carbon tetrachloride.
- a coating film is obtained by immersing and pulling up a substrate (preferably a substrate having an active hydrogen such as a hydroxyl group or a carboxyl group) on which an organic thin film is to be formed in the obtained solution. Or you may obtain a coating film by apply
- This organic thin film may be used directly as an electric material, or may be subjected to a treatment such as electrolytic polymerization.
- this Silane compound By using this Silane compound, it is possible to obtain a highly ordered (crystallized) organic thin film with a Si—O—Si network and a small distance between adjacent ⁇ -electron conjugated molecules.
- the units when the units are arranged in a straight chain, the units of adjacent silane compounds are not bonded to each other, and further, the distance force S between adjacent units can be reduced, so that it is highly crystallized.
- An organic thin film can be obtained.
- Such an organic thin film is particularly useful as an organic thin film transistor.
- organic thin film transistor organic TFT
- FIG. 2 is a conceptual diagram of an example of the organic TFT of the present invention.
- the organic TFT in Fig. 2 has a bottom gate and bottom contact structure.
- 1 is a substrate
- 2 is a gate electrode
- 3 is a gate insulating film
- 4 is an organic thin film
- 5 and 6 are source and drain electrodes.
- Fig. 2 shows an example in which the bottom surface of the organic thin film is one surface, and the source and drain electrodes are formed on one surface side.
- the structure of the organic TFT is not limited to the structure of FIG.
- Other structures include, for example,
- the material of the gate and source Z drain electrodes is not particularly limited, and any material known in the art can be used. Specifically, metals such as gold, platinum, silver, copper and aluminum; refractory metals such as titanium, tantalum and tungsten; silicides and polycides with refractory metals; p-type or n-type highly doped silicon; ITO, Conductive metal oxides such as NESA; conductive polymers such as PEDOT.
- the film thickness is not particularly limited, and can be appropriately adjusted to a film thickness (for example, 30 to 60 nm) used for a normal transistor.
- the manufacturing method of these electrodes can be appropriately selected according to the electrode material. For example, vapor deposition, sputtering, coating, etc. can be mentioned.
- the gate insulating film is not particularly limited, and any film known in the art can be used. Specifically, silicon oxide film (thermal acid film, low-temperature acid film: LTO film, etc., high-temperature oxide film: HTO film), silicon nitride film, SOG film, PSG film, BSG film, BPSG Insulating films such as films; PZT, PLZ IV, ferroelectric or antiferroelectric films; SiOF-based films, SiOC-based films or CF-based films, or HSQ (hydrogen silsesquioxane) -based films (inorganic) that are formed by coating, Examples thereof include low dielectric films such as MSQ (methyl sil sesquioxane) film, PAE (polyarylene ether) film, BCB film, porous film, CF film and porous film.
- MSQ methyl sil sesquioxane
- PAE polyarylene ether
- the film thickness is not particularly limited, and can be appropriately adjusted to a film thickness (for example, 100 to 500 nm) used for a normal transistor.
- the manufacturing method of a gate insulating film can be suitably selected according to the kind. For example, vapor deposition, notching, coating, etc.
- the material of the organic thin film is the formula (1)
- R is a ⁇ -electron conjugated organic residue in which 3 to 10 units selected from a group derived from a monocyclic aromatic hydrocarbon and a monocyclic heterocyclic compound are bonded, and at least One X 1 , X 2 and X 3 are the same or different, and are groups which give a hydroxyl group by hydrolysis.
- any general technique capable of forming an organic thin film such as a SAM method (for example, LB method, vapor deposition, dipping, dipping, casting, CVD method, etc.) can be applied.
- the material is set appropriately in consideration of the cost of mass production.
- the SAM method is an abbreviation for Self-Assembled Monolayer, and refers to a method of forming a film using a material that can be self-assembled.
- the LB method is an abbreviation of the Langmuir-Blodgett method.
- An amphiphilic substance with a balance of hydrophobic and hydrophilic groups is developed on the water surface, and a single layer of a molecule called a monolayer is developed. This is a technique for producing a film and then transferring it to a substrate.
- the vapor deposition method is a method in which a raw material is heated to be vaporized and deposited in a desired region.
- a resistance heating vapor deposition method can be used.
- the dipping method means a method of forming a film by simply dipping a substrate in a solution and taking it out.
- the casting method means a method of forming a film by dropping and drying a solution containing a raw material in a desired region, and includes ink jetting.
- the CVD method means a method in which a solution is heated and evaporated in a sealed container or space, and vaporized molecules are adsorbed on the substrate surface in the gas phase.
- silanic compound of the present invention and the method for producing the same will be described in detail with reference to examples.
- silanic compounds of the present invention having a phenol group and a thiophene group are used.
- silane compounds of the present invention having a residue derived from naphthacene and pentacene are used.
- combination method of a thing is described, it is not limited to the compound of a following example.
- the title compound was synthesized by the following method. First, 2-Bromo-2-methyl group mouth pan 1M was dissolved in tetrasalt carbon, 1M metal magnesium was added, and then reacted at 60 ° C. for 1 hour to form a Grignard reagent.
- the 2,6 ', 2 ", 6, -tetra-tert-butyl- [1,1,; 4,4, ;; 1,, 1,1,”] quarterfile is set to 0.1M.
- a Grignard reagent was formed by adding 0.1 M NBS and 0.1 M AIBN to the carbon tetrachloride solution contained, reacting at 60 ° C for 1.5 hours, and then catching magnesium metal. This reagent was added to a THF solution containing 0.1M chlorotrimethoxysilane and reacted at 45 ° C for 2 hours to synthesize the title compound.
- t Bu means tert butyl
- Me means methyl
- Table 2 shows the molecular occupied volume of the main skeleton and side chain of the obtained compound, and the ratio (volume ratio) of the molecular occupied volume of the side chain to the molecular occupied volume of the main skeleton.
- Side chains and main The molecular occupation volume of the skeleton was calculated as follows.
- the entire main skeleton was approximated to be a cylinder, and the volume of the cylinder was defined as the molecular occupancy volume of the main skeleton.
- the main axis of the structural formula of the molecule that constitutes the main skeleton is the central axis.
- the volume of the cylinder obtained by rotating 360 degrees was defined as the molecular occupied volume of the main skeleton.
- the entire side chain was approximated as a cone, and the volume of the cone was defined as the molecular occupation volume of the side chain.
- the volume of the cone obtained by rotating 360 degrees around the straight line passing through the two points of the main skeleton atom bonded to the side chain and the atom directly bonded to the main skeleton is the side chain molecule. Occupied volume.
- the interatomic distance was calculated after optimizing the cylindrical and conical structures by molecular orbital calculation (AMI).
- the title compound was synthesized by the following method. First, 0.5M of m-dichlorobenzene was dissolved in carbon tetrachloride, 0.5M of metallic magnesium was added, and then reacted at 60 ° C for 1 hour to form a Grignard reagent.
- the nuclear magnetic resonance (NMR) measurement of the CCI4 THF compound was performed.
- Table 2 shows the molecular occupied volume of the main skeleton and side chain of the obtained compound, and the ratio (volume ratio) of the molecular occupied volume of the side chain to the molecular occupied volume of the main skeleton.
- the title compound was synthesized by the following method. First, 3-promotiophene and metal magnesium were also synthesized with Grignard reagent, and chloroethane was added and reacted to synthesize 3-ethylthiophene.
- Et means ethyl.
- NMR nuclear magnetic resonance
- Table 2 shows the molecular occupied volume of the main skeleton and side chain of the obtained compound, and the ratio (volume ratio) of the molecular occupied volume of the side chain to the molecular occupied volume of the main skeleton.
- the title compound was synthesized by the following method. First, 2 ′, 6 ′, 2 ′′, 6, one-tetra tert-butyl [1, 1 ′; 4, 4 ”; 1”, 1,. After adding 50 mM NBS and 50 mM AIBN in a carbon tetrachloride solution containing 20 mM of sodium chloride, reacting at 60 ° C for 1.5 hours, and forming magnesium reagent by forming metallic magnesium, 2 Bring 20 mM bromoterthiophene and react for 2 hours at 45 ° C to give 5- (2,6 ', 2 ", 6, -tetra-tert-butyl- [1,1,; 4,4,4, ,; 1,,, 1, "] quarter-fru 4 yl) [2, 2,; 5, 2, 2,] tertophene was synthesized.
- Table 2 shows the molecular occupancy volume of the main skeleton and side chain of the obtained compound, and the ratio (volume ratio) of the molecular occupancy volume of the side chain to the molecular occupancy volume of the main skeleton.
- the title compound was synthesized by the following method. First, 0.5M of m-dichlorobenzene was dissolved in carbon tetrachloride, 0.5M of metal magnesium was added, and then reacted at 60 ° C for 1 hour to form a Grignard reagent.
- Table 2 shows the molecular occupancy volume of the main skeleton and side chain of the obtained compound, and the ratio (volume ratio) of the molecular occupancy volume of the side chain to the molecular occupancy volume of the main skeleton.
- Me means methyl
- the molecular occupancy volume of the main skeleton and side chain of the obtained compound, the molecular occupant of the main skeleton Table 2 shows the ratio of the volume occupied by the side chain molecules to the product (volume ratio).
- Chlorotrimethylsilane 0.4M was added dropwise at a temperature of 80 ° C, stirred for 30 minutes, and then refluxed at 130 ° C for 4 days. From this, 1, 2, 4, 5-tetra (trimethylsilyl) benzene was added. Synthesized
- 2, 3, 7, 8 except that 3,4-di (trimethylsilyl) furan is used in place of 2,5 tri (isopropyl) silyl-1,3,4 di (trimethylsilyl) furan.
- Tetra (trimethylsilyl) 6,9 Synthesis of 2, 3, 8, 9-tetra (trimethylsilyl) 5, 7, 10, 12-tetra (triisoprovirsilyl) tetracene from di (triisopropylpropylsilyl) anthracene 2, 3, 9, 10-tetra (trimethylsilyl) by applying the same method -5, 7, 12, 14-tetra (triisopropylpropyl) pentacene was synthesized.
- Me means methyl
- i Pr means isopropyl
- Ph means phenyl
- Ac means acetyl
- Bu means butyl.
- Table 2 shows the molecular occupied volume of the main skeleton and side chain of the obtained compound, and the ratio (volume ratio) of the molecular occupied volume of the side chain to the molecular occupied volume of the main skeleton.
- Table 2 shows the molecular occupied volume of the main skeleton and side chain of the obtained compound, and the ratio (volume ratio) of the molecular occupied volume of the side chain to the molecular occupied volume of the main skeleton.
- the indicated compound was synthesized by the following method. First, by applying the same method as the reference example of Example 7 except that Ph—Si (CH 2) NH is used instead of i PrNH, 2
- Table 2 shows the molecular occupancy volume of the main skeleton and side chain of the obtained compound, and the ratio (volume ratio) of the molecular occupancy volume of the side chain to the molecular occupancy volume of the main skeleton.
- the title compound was synthesized by the following method. First, a method similar to that of the reference example of Example 7 is applied except that Naphtale ne-C (CH) NH is used instead of i-PrNH.
- Table 2 shows the molecular occupancy volume of the main skeleton and side chain of the obtained compound, and the ratio (volume ratio) of the molecular occupancy volume of the side chain to the molecular occupancy volume of the main skeleton.
- chromium was vapor-deposited on a substrate 1 having a silicon force to form a gate electrode 2.
- Vapor deposition is performed in the order of chromium, gold, and the source and drain electrodes using ordinary lithography techniques.
- the obtained substrate is placed in a mixed solution of hydrogen peroxide and concentrated sulfuric acid (mixing ratio 3: 7)! /, Then, the surface of the gate insulating film 3 was hydrophilized. Then, the obtained substrate was subjected to anaerobic conditions under 2 ', 6', 2 ", 6,, -tetra-tert-butyl- [1, 1 '; 4, 4"; 1 ", 1,, By immersing trimethoxysilane (the compound of Example 1) in a 20 mM solution dissolved in a non-aqueous solvent (for example, n-xadecane) for 5 minutes, slowly lifting it up, washing the solvent, and forming the organic thin film 4, Organic TFT was formed.
- a non-aqueous solvent for example, n-xadecane
- the organic thin film transistor obtained above had a field effect mobility of 4.2 X 10 " 2 cm 2 / Vs, an on / off ratio of about 6 digits, and good performance was obtained.
- Example 11 In the same manner as in Example 11, an organic thin film transistor formed by forming a compound shown in the following table was formed. Each characteristic was evaluated, and good performance shown in the following table was obtained.
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WO2007095973A1 (en) * | 2006-02-24 | 2007-08-30 | Freescale Semiconductor, Inc. | Integrated system for semiconductor substrate processing using liquid phase metal deposition |
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JPH11217392A (ja) * | 1997-02-28 | 1999-08-10 | Sumitomo Chem Co Ltd | 含ケイ素化合物およびそれを用いた有機エレクトロルミネッセンス素子 |
US20030231851A1 (en) * | 2002-05-17 | 2003-12-18 | Rantala Juha T. | Hydrophobic materials for waveguides, optical devices, and other applications |
JP2004089902A (ja) * | 2002-09-02 | 2004-03-25 | Kawamura Inst Of Chem Res | 有機シラン化合物多層薄膜及び有機シラン化合物薄膜の製造方法 |
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JPH11217392A (ja) * | 1997-02-28 | 1999-08-10 | Sumitomo Chem Co Ltd | 含ケイ素化合物およびそれを用いた有機エレクトロルミネッセンス素子 |
US20030231851A1 (en) * | 2002-05-17 | 2003-12-18 | Rantala Juha T. | Hydrophobic materials for waveguides, optical devices, and other applications |
JP2004089902A (ja) * | 2002-09-02 | 2004-03-25 | Kawamura Inst Of Chem Res | 有機シラン化合物多層薄膜及び有機シラン化合物薄膜の製造方法 |
Non-Patent Citations (3)
Title |
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BEN F ET AL: "Evidence for an Organization of Nanostructured Silica Based Hybrid Materials Prepared by Sol-Gel Polymerization.", CHEMISTRY OF MATERIALS., vol. 12, no. 11, 2000, pages 3249 - 3252 * |
CARBONNEAU C ET AL: "Efficient synthesis of new phosphonate terminated trialkoxysilane derived oligoarylenevinylene fluorophores.", TETRAHEDRON LETTERS., vol. 40, no. 32, 1999, pages 5855 - 5858 * |
CARRE F ET AL: "Pentacoordinate silicon compounds: stereochemical non-rigidity of chelates formed by intramolecular ring-closure. Crystal structure of 8-dimethylamino-1-trifluorosilylnaphthalene.", JOURNAL OF ORGANOMETALLIC CHEMISTRY., vol. 470, no. 1-2, 1994, pages 43 - 57 * |
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