WO2006022302A1 - 窒化アルミニウム結晶の製造方法およびそれにより得られた窒化アルミニウム結晶 - Google Patents
窒化アルミニウム結晶の製造方法およびそれにより得られた窒化アルミニウム結晶Info
- Publication number
- WO2006022302A1 WO2006022302A1 PCT/JP2005/015366 JP2005015366W WO2006022302A1 WO 2006022302 A1 WO2006022302 A1 WO 2006022302A1 JP 2005015366 W JP2005015366 W JP 2005015366W WO 2006022302 A1 WO2006022302 A1 WO 2006022302A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- aluminum nitride
- nitride crystal
- producing
- flux containing
- group
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Abstract
穏やかな圧力および温度条件で、窒化アルミニウム結晶が製造可能な製造方法を提供する。
窒化アルミニウム結晶の製造方法において、窒素含有ガスの存在下、下記(A)成分および下記(B)成分を含むフラックス中又は下記(B)成分を含むフラックス中において、アルミニウムと前記窒素とを反応させることにより、窒化アルミニウム結晶を生成し成長させる。
(A) アルカリ金属およびアルカリ土類金属の少なくとも一方の元素
(B) スズ(Sn)、ガリウム(Ga)、インジウム(In)、ビスマス(Bi)および水銀(Hg)からなる群から選択される少なくとも一つの元素
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/661,013 US20080008642A1 (en) | 2004-08-24 | 2005-08-24 | Process For Producing Aluminum Nitride Crystal And Aluminum Nitride Crystal Obtained Thereby |
| JP2006531953A JPWO2006022302A1 (ja) | 2004-08-24 | 2005-08-24 | 窒化アルミニウム結晶の製造方法およびそれにより得られた窒化アルミニウム結晶 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004243764 | 2004-08-24 | ||
| JP2004-243764 | 2004-08-24 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| WO2006022302A1 true WO2006022302A1 (ja) | 2006-03-02 |
| WO2006022302A2 WO2006022302A2 (ja) | 2006-03-02 |
| WO2006022302A3 WO2006022302A3 (ja) | 2006-04-20 |
Family
ID=35967930
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2005/015366 Ceased WO2006022302A2 (ja) | 2004-08-24 | 2005-08-24 | 窒化アルミニウム結晶の製造方法およびそれにより得られた窒化アルミニウム結晶 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20080008642A1 (ja) |
| JP (1) | JPWO2006022302A1 (ja) |
| WO (1) | WO2006022302A2 (ja) |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4968707B2 (ja) * | 2006-03-06 | 2012-07-04 | 日本碍子株式会社 | Iii族窒化物単結晶の育成方法 |
| TW200741044A (en) * | 2006-03-16 | 2007-11-01 | Toyoda Gosei Kk | Semiconductor substrate, electronic device, optical device, and production methods therefor |
| JP2008115068A (ja) * | 2006-06-30 | 2008-05-22 | Tama Tlo Kk | 窒化アルミニウム含有物の製造方法 |
| JP4595909B2 (ja) * | 2006-08-14 | 2010-12-08 | 住友金属工業株式会社 | 窒化アルミニウム単結晶の製造方法 |
| JP5224713B2 (ja) * | 2007-04-19 | 2013-07-03 | 日本碍子株式会社 | 窒化アルミニウム単結晶の製造方法 |
| JP2009114035A (ja) * | 2007-11-08 | 2009-05-28 | Toyoda Gosei Co Ltd | Iii族窒化物半導体製造装置および製造方法 |
| US7768812B2 (en) | 2008-01-15 | 2010-08-03 | Micron Technology, Inc. | Memory cells, memory cell programming methods, memory cell reading methods, memory cell operating methods, and memory devices |
| US8211743B2 (en) | 2008-05-02 | 2012-07-03 | Micron Technology, Inc. | Methods of forming non-volatile memory cells having multi-resistive state material between conductive electrodes |
| US8134137B2 (en) | 2008-06-18 | 2012-03-13 | Micron Technology, Inc. | Memory device constructions, memory cell forming methods, and semiconductor construction forming methods |
| US9343665B2 (en) * | 2008-07-02 | 2016-05-17 | Micron Technology, Inc. | Methods of forming a non-volatile resistive oxide memory cell and methods of forming a non-volatile resistive oxide memory array |
| TW201011814A (en) * | 2008-09-08 | 2010-03-16 | Kinik Co | Method for growing epitaxy |
| JP5342353B2 (ja) * | 2009-07-15 | 2013-11-13 | タマティーエルオー株式会社 | 窒化アルミニウム含有物の製造方法 |
| KR101317735B1 (ko) * | 2009-09-07 | 2013-10-15 | 도꾸리쯔교세이호징 리가가쿠 겐큐소 | 질화물 반도체 다층 구조체 및 그 제조 방법과, 질화물 반도체 발광 소자 |
| US8427859B2 (en) | 2010-04-22 | 2013-04-23 | Micron Technology, Inc. | Arrays of vertically stacked tiers of non-volatile cross point memory cells, methods of forming arrays of vertically stacked tiers of non-volatile cross point memory cells, and methods of reading a data value stored by an array of vertically stacked tiers of non-volatile cross point memory cells |
| US8289763B2 (en) | 2010-06-07 | 2012-10-16 | Micron Technology, Inc. | Memory arrays |
| JP5491300B2 (ja) * | 2010-07-02 | 2014-05-14 | 独立行政法人科学技術振興機構 | 窒化アルミニウム製造方法 |
| JP5656697B2 (ja) * | 2010-07-14 | 2015-01-21 | 住友金属鉱山株式会社 | 窒化アルミニウム結晶の製造方法 |
| US8351242B2 (en) | 2010-09-29 | 2013-01-08 | Micron Technology, Inc. | Electronic devices, memory devices and memory arrays |
| US8759809B2 (en) | 2010-10-21 | 2014-06-24 | Micron Technology, Inc. | Integrated circuitry comprising nonvolatile memory cells having platelike electrode and ion conductive material layer |
| US8796661B2 (en) | 2010-11-01 | 2014-08-05 | Micron Technology, Inc. | Nonvolatile memory cells and methods of forming nonvolatile memory cell |
| US8526213B2 (en) * | 2010-11-01 | 2013-09-03 | Micron Technology, Inc. | Memory cells, methods of programming memory cells, and methods of forming memory cells |
| US9454997B2 (en) | 2010-12-02 | 2016-09-27 | Micron Technology, Inc. | Array of nonvolatile memory cells having at least five memory cells per unit cell, having a plurality of the unit cells which individually comprise three elevational regions of programmable material, and/or having a continuous volume having a combination of a plurality of vertically oriented memory cells and a plurality of horizontally oriented memory cells; array of vertically stacked tiers of nonvolatile memory cells |
| US8791447B2 (en) | 2011-01-20 | 2014-07-29 | Micron Technology, Inc. | Arrays of nonvolatile memory cells and methods of forming arrays of nonvolatile memory cells |
| US8488365B2 (en) | 2011-02-24 | 2013-07-16 | Micron Technology, Inc. | Memory cells |
| US8537592B2 (en) | 2011-04-15 | 2013-09-17 | Micron Technology, Inc. | Arrays of nonvolatile memory cells and methods of forming arrays of nonvolatile memory cells |
| JP2015034104A (ja) * | 2013-08-08 | 2015-02-19 | 株式会社リコー | 13族窒化物結晶の製造装置及び製造方法 |
| US20170183553A1 (en) * | 2014-05-30 | 2017-06-29 | National University Corporation Nagoya University | Aln crystal preparation method, aln crystals, and organic compound including aln crystals |
| CN104843657B (zh) * | 2015-04-24 | 2017-01-25 | 武汉科技大学 | 一种基于碱金属的氮化铝纳米材料及其制备方法 |
| JP2023155935A (ja) * | 2022-04-12 | 2023-10-24 | 国立大学法人京都大学 | 発振器、増幅器 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01141892A (ja) * | 1987-11-27 | 1989-06-02 | Nec Corp | 結晶育成方法 |
| JPH07277897A (ja) * | 1994-04-04 | 1995-10-24 | Katsutoshi Yoneya | 窒化アルミニウム単結晶の合成方法 |
| JP4003413B2 (ja) * | 2000-12-11 | 2007-11-07 | 日亜化学工業株式会社 | 13族窒化物結晶の製造方法 |
| JP2005187317A (ja) * | 2003-12-03 | 2005-07-14 | Ngk Insulators Ltd | 単結晶の製造方法、単結晶および複合体 |
-
2005
- 2005-08-24 JP JP2006531953A patent/JPWO2006022302A1/ja not_active Withdrawn
- 2005-08-24 WO PCT/JP2005/015366 patent/WO2006022302A2/ja not_active Ceased
- 2005-08-24 US US11/661,013 patent/US20080008642A1/en not_active Abandoned
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