WO2006001297A1 - 白色発光素子およびその製造方法 - Google Patents
白色発光素子およびその製造方法 Download PDFInfo
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- WO2006001297A1 WO2006001297A1 PCT/JP2005/011429 JP2005011429W WO2006001297A1 WO 2006001297 A1 WO2006001297 A1 WO 2006001297A1 JP 2005011429 W JP2005011429 W JP 2005011429W WO 2006001297 A1 WO2006001297 A1 WO 2006001297A1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/20—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05573—Single external layer
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/91—Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
- H01L2224/92—Specific sequence of method steps
- H01L2224/921—Connecting a surface with connectors of different types
- H01L2224/9212—Sequential connecting processes
- H01L2224/92122—Sequential connecting processes the first connecting process involving a bump connector
- H01L2224/92125—Sequential connecting processes the first connecting process involving a bump connector the second connecting process involving a layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of group III and group V of the periodic system
- H01L33/32—Materials of the light emitting region containing only elements of group III and group V of the periodic system containing nitrogen
Definitions
- the present invention relates to a white light emitting element that emits white light and a method for manufacturing the same, and in particular, has a light emitting layer in which a GaN-based compound semiconductor thin film layer is laminated, and emits white light from a light emitting layer through a phosphor layer.
- the present invention relates to a white light emitting element (white LED element) configured to emit light to the outside and a manufacturing method thereof.
- Gallium nitride (GaN-based) compound semiconductors such as GaN, GaAlN, InGaN, and InAlGaN that combine group III elements such as Ga (gallium), A1 (aluminum), and In (indium) have recently been visible. It is widely used as a semiconductor material for light-emitting devices, etc., and is particularly expanding in the field of blue LEDs.
- the details of its basic structure are, for example, from a GaN-based compound semiconductor layer on a sapphire substrate, an n-type layer, such as SQW or MQW, etc. These are formed by laminating an active layer and a p-type layer (for example, see FIG. 12 of Patent Document 1).
- a white light emitting element incorporating a protective diode for example, a white light emitting element 100 having a hybrid structure as shown in FIG. 4 is known.
- the light from the light emitting element (blue LED element) 40 that emits blue light and the light through the phosphor layer 43 that emits complementary color light by that light are emitted to the outside as white light.
- an insulating sapphire substrate is generally used as the translucent crystal substrate 39 for growing the semiconductor film so that the electrode from the blue LED element 40 can be taken out (can be conducted).
- a submount member (Zener diode) 44 made of a Si substrate by a flip chip method.
- the method shown in FIG. 5 is used (see, for example, Patent Documents 1 and 2).
- Patent Document 1 Japanese Patent Application Laid-Open No. 2001-15817
- Patent Document 2 JP 2002-158377 A
- the sapphire substrate of the blue LED device 40 mounted on the submount device 44 of the Zener diode on the flip chip. Blue light is extracted from the 39 side, and blue light is converted into yellow-green light that is the complementary color by the YAG phosphor 43 coated with resin around the blue LED element 40. Thus, it is extracted as white light. In this case, the light extraction efficiency from the blue LED element 40 was the best structure with this structure. There are four reasons for this.
- the light is extracted from the electrode formation surface side through the transparent electrode. Compared with these light emitting devices, the light extraction efficiency is 30% or more higher.
- the electrode comes to the lower surface opposite to the upper surface of the sapphire substrate 39, which is the main light extraction surface, it works as a light reflecting mirror by using a material with good reflectivity. Can be reflected upward by this reflector (reflecting electrode), thereby improving the light extraction efficiency by more than 50%.
- the refractive index of the GaN-based light emitting layer is 2.1
- the sapphire substrate is 1.7
- the phosphor layer binder resin is 1.5
- the refractive index decreases step by step. The effect of reducing losses is also added.
- the upper surface of the sapphire substrate 39 as a main light extraction surface into a shape that improves the light extraction efficiency, such as roughening the surface of the sapphire glass or grooving.
- the light extraction efficiency is improved by 20% or more.
- the tuner diode 44 which is a submount of the blue LED element 40 that is weak against static electricity, acts as a static electricity protection element, and prevents forward and reverse lkV surges.
- the blue LED element 40 can be protected.
- the hybrid white light emitting device 100 mounted with the flip chip in FIG. 4 has many merits as compared to the blue LED device in which light is extracted from the transparent electrode side.
- it is a low-current (normal size, that is, a blue LED with a bottom area of 0.3 mm 2) , such as a backlight source used in mobile phone displays used at room temperature. It was a light emitting device with an excellent structure for applications used in the region If ⁇ 20 mA).
- the side-view type chip LED used for mobile phones mounting
- the brightness is Reduced to about 50% of the initial brightness. This is due to the discoloration caused by the heat of the epoxy resin used as the binder of the phosphor layer, not due to the deterioration of the blue LED element, due to the decrease in transmittance.
- Even when a silicone resin that is resistant to thermal discoloration is used for the binder if the current is applied at the same ambient temperature, the brightness will deteriorate to about 50% after 2000 hours.
- the blue LED element When a large current region is used for illumination, the blue LED element itself becomes more severe than the ambient temperature due to heat generation. Therefore, it is necessary to improve the resin for the binder of the phosphor layer, or a binder other than the resin. Will be needed. In the case of UV LED elements, it is more likely to be discolored, which is an important issue and requires a binder that does not discolor to UV light.
- each blue LED element 40 using sapphire as a substrate 39 is prepared, and Si serving as a submount element 44 is prepared.
- a bump electrode 41 for connecting the p-side electrode and the n-side electrode of each blue LED element 40 is formed on the woofer 42 (step (a)), and the p-side electrode and the n-side electrode of the blue LED element 40 are connected to each other.
- step (c) Align to the position of the bump electrode 41 and join by flip chip mounting via the bump (step (b)), and grind the upper surface (sapphire substrate 39 side) with the grinding tool 50 to make it flat (uniform) (
- step (c) a phosphor material (phosphor paste) is applied to the top and side surfaces of the substrate to form a plurality of hybrid white light emitting devices having the phosphor layer 43 (step (d)).
- step (e) the upper surfaces of the plurality of hybrid white light emitting elements
- the boundary of the white light emitting element is cut (diced) using a cutting tool (dicer) 52 to obtain individual hybrid white light emitting elements (step (f)), and then the final inspection is performed.
- a cutting tool (dicer) 52 to obtain individual hybrid white light emitting elements (step (f))
- the sharpness of the grinding tool 50 is deteriorated, so that stress at the time of grinding is applied to the joint portion of the bump electrode, and a crack may occur in the joint portion.
- the yield will be reduced, but if it is not detected, it will lead to market failure and a method that includes extremely serious defect factors in reliability. is there
- the phosphor layer 43 is required to be applied to the top and side surfaces of the blue LED element 40.
- the phosphor paste is applied to the pad position, and in this case, it is difficult to retry by removing the phosphor layer 43, resulting in a large yield reduction in which one Si wafer becomes a lot-out.
- the present invention solves the problems of the hybrid white light-emitting element, including the problems of this manufacturing method, and is not limited to the white light-emitting element that uses a blue LED, but may use an ultraviolet LED.
- the white light-emitting device is a light-emitting device having a light-emitting layer made of a GaN-based compound semiconductor layer, having an n-side electrode and a p-side electrode on one surface side, An n-type GaN compound semiconductor layer, and a GaN compound semiconductor layer including a light emitting layer on the p-side electrode, and a translucent crystal substrate on the GaN compound semiconductor layer.
- the white light-emitting element is characterized in that an oxide layer containing a phosphor is formed thereon.
- the white light emitting device of the present invention differs from the conventional hybrid structure 100 in the following two points.
- the phosphor applied to the blue LED element is formed using an inorganic oxide that does not discolor strongly against heat or ultraviolet light rather than using an organic resin that changes color with heat as a binder. It is a point that has been.
- the hybrid structure 100 is indispensable because the submount element is used as a tray for the phosphor paste.
- a white light emitting element is formed without a submount element.
- this structure will be described in detail in the manufacturing method for forming the oxide layer containing the phosphor, but since the submount element is not required for whitening, the structure is simple and the manufacturing method It is possible to solve the above-described problems also in the above.
- it is a white light-emitting element in which a blue LED element or ultraviolet LED element and a phosphor layer are integrated without using a submount element, so that the size is smaller than that of the conventional hybrid structure 100. If this is used, it is possible to design a white light emitting device without being bound to the shape of the package. If a protective diode is required, it can be built in by connecting it in parallel with the white light emitting element in reverse polarity.
- the oxide layer containing the phosphor is mainly composed of glass mainly composed of SiO and BO, and mainly composed of SiO, BO and ZnO. Glass, or ingredient
- the thermal expansion coefficient is set approximately equal to the thermal expansion coefficient of the translucent crystal substrate.
- the difference in coefficient of thermal expansion between the two must be within 5%.
- the required properties of glass are that it has good light transmittance and the glass firing temperature (the softening point in the case of powdered glass and the heat treatment temperature in the case of the sol-gel method) adversely affects the light emitting layer of the blue LED.
- the temperature is 700 ° C or less, preferably 600 ° C or less.
- the thermal expansion coefficient of sapphire is 7.4 X 10 _6 / ° C.
- the powder glass component below 700 ° C is powder glass mainly composed of SiO and BO, and lowers the firing temperature.
- powdered glass with 2 2 3 2 2 3. Further, if the translucent crystal substrate of the SiC substrate, the thermal expansion coefficient, 3. 7 X 10 _6 / ° C, thermal expansion the use of powder glass mainly containing SiO and B_ ⁇
- the firing temperature of the powdered glass is 700 ° C or higher, so it is necessary to consider the influence of the light emitting layer of the blue LED, such as shortening the firing time.
- the glass mainly composed of SiO and BO it can be formed by the sol-gel method.
- sol-gel method and heat treatment it can be formed by heat treatment at 600 ° C or less.
- the oxide layer containing the phosphor is composed of a porous layer in which phosphor particles are cross-linked with glass, and PbO is used as a powder glass component.
- PbO is used as a powder glass component.
- the mixing ratio of the powdered glass and the phosphor is made rich in the phosphor (the phosphor concentration is increased)
- the oxide layer containing the phosphor is made as thin as possible.
- the phosphor particles have a porous structure crosslinked with a small amount of glass binder, and the influence of the light transmittance of the crosslinked glass can be minimized.
- the light emitting layer is formed so as to emit blue light
- the phosphor is a phosphor that converts blue light into complementary light of blue light, or blue light.
- the phosphor layer contains a phosphor that converts blue light into complementary light of blue light, it can be added to blue light.
- a white light emitting element is formed by mixing. Even if the oxide layer contains a phosphor that converts blue light to green light and a phosphor that converts blue light to red light, the three primary colors of light (blue light of blue LED element, phosphor)
- a white light emitting element is obtained by adding and mixing green light and red light converted by the above.
- the white light emitting element of claim 5 is formed so that the light emitting layer emits ultraviolet light, and the phosphor is made of a phosphor that converts ultraviolet light into blue light, green light, and red light.
- the oxide layer contains a phosphor that converts ultraviolet light into blue light, a phosphor that converts ultraviolet light into green light, and a phosphor that converts ultraviolet light into red light. Addition of the three primary colors A white light emitting element can be obtained by mixing.
- the white light emitting element according to claim 6 is characterized in that the white light emitting element according to claims 1 to 5 is a single light emitting element, the single light emitting elements are arranged in a matrix, and this is a block unit.
- VF forward voltage
- the elements are connected in series, the same current flows through each single light emitting element, so that the current can be uniformly supplied to each part. Further, since it is not necessary to divide each single light emitting element, the number of man-hours can be reduced.
- the manufacturing method of claim 7 of the present invention is a manufacturing method of a single light emitting element or a block light emitting element of a white light emitting element having a light emitting layer made of a GaN-based compound semiconductor layer, wherein the light transmitting crystal substrate
- a white light emitting device comprising: a chipping process for
- the above-described epitaxial layer blue light or ultraviolet light
- a light-transmitting crystal substrate such as sapphire
- MOCVD method metal organic chemical vapor deposition method
- the oxide layer containing the phosphor on the translucent crystal substrate of this wafer for example, an acid composed of a phosphor and a glass binder mainly composed of SiO, BO and PbO for bonding the phosphor.
- a compound layer is formed (oxide forming step). Although this thickness depends on the concentration of the phosphor, it should be about several tens of ⁇ . Then, the formed oxide layer is ground (polished) flatly with a surface grinder (polishing machine) so that the upper surface of the oxide layer is parallel to the lower surface of the opposite epi layer.
- a ⁇ -side electrode and a ⁇ -side electrode are formed on the surface on the side of the epitaxial layer opposite to the oxide layer (electrode formation step).
- the ⁇ -side electrode is formed on the exposed surface of the epitaxial layer (on the surface of the vertical layer side with the light emitting layer sandwiched), and the ⁇ type layer and the light emitting layer are further formed by pattern etching (selective etching).
- the ⁇ -type layer is exposed to form the ⁇ -side electrode on the surface. Since the ⁇ -side electrode also serves as a light reflecting mirror (reflecting electrode), it is important to use an electrode material that has high reflectivity and good omics.
- the oxide layer containing the phosphor is ground to an appropriate thickness so that the appropriate emission color (chromaticity) is obtained (chromaticity adjustment process) ).
- it is divided by dicing or the like along the boundary of the single light emitting element or the block light emitting element to obtain a chipped LED element (chip forming step).
- the outer shape of the chip can be processed into a shape with good light extraction efficiency.
- the cross section can be a substantially trapezoidal shape.
- the manufacturing method of claim 8 is the manufacturing method of the light emitting element capable of emitting white light emission according to claim 7, wherein the translucent crystal substrate is formed before the oxide forming step.
- a groove processing step for performing groove processing is further added, and U-shaped or V-shaped grooves are formed by half blasting or sandblasting along the boundary of the single light emitting element, and the next oxidation is performed. If a phosphor-containing oxide layer is also formed in the groove in the product forming process, the white light emitting device formed into a chip in the next chipping process will produce an acid containing phosphor on the side surface of the chip. Since the compound layer can be formed, the white light becomes more uniform in the light emitting direction.
- the manufacturing method of claim 9 is the manufacturing method of the light emitting element capable of emitting white light emission according to claim 7, wherein the emission is performed by grinding the thickness of the oxide layer containing the phosphor.
- a chromaticity adjustment step of adjusting the chromaticity of the phosphor it is possible to adjust the variation in the phosphor concentration and the variation in the emission wavelength emitted from the light emitting layer, thereby obtaining a desired white light emitting element.
- the groove cover is intended to shape the outer shape of the chip into a shape with good light extraction efficiency.
- it has a substantially trapezoidal cross section.
- the white light emitting device having the structure of the present invention described above can be easily manufactured by the manufacturing method of the present invention, and the three problems described in the conventional manufacturing method of the hybrid white light emitting device are light emission on the submount device. Since a white light emitting element can be formed without flip-chip mounting the element, this can be solved easily.
- the bump portion and the bonding pad region are eliminated, and a phosphor is applied to form a phosphor-containing glass layer on the entire surface of the translucent crystal substrate of the wafer.
- the pattern recognition accuracy is not necessary at all, and the problem is eliminated. Therefore, the improvement of the reliability regarding the crack of the bump portion and the decrease of the yield regarding the lot-out of the wafer unit and the like are improved.
- the third problem is that the white light emitting element can be formed on the submount element without flip-chip mounting, which simplifies the process, can be manufactured with a high yield, and can reduce the cost.
- the phosphor applied around the blue LED device or the ultraviolet LED device uses an inorganic oxide that does not discolor strongly against heat or ultraviolet light as a binder. It is used as a white light emitting element without using a submount element.
- this structure is a white light emitting element or a block white light emitting element in which a blue LED element or an ultraviolet light LED element and a phosphor layer are integrated without using a submount element. It can be made package-free so that a white light-emitting device can be configured without depending on the shape, and can be easily configured for an application that requires a large light intensity such as an illumination light source.
- the light extraction efficiency is improved by roughening the upper surface of the translucent crystal substrate, which is the main light extraction surface, into a frosted glass shape or by performing groove processing so that the chip has a substantially trapezoidal cross section.
- an oxide layer containing a phosphor can also be formed on the side surface of a blue or ultraviolet LED element, so that white light is more uniform in the light emitting direction.
- FIG. 1 Details of the white light emitting device of the first embodiment according to the present invention, wherein (a) is a plan view, (b) is a longitudinal sectional view taken along line AA in (c). (C) is a bottom view.
- FIG. 2 Details of the white light emitting device of the second embodiment according to the present invention, wherein (a) is a plan view, (b) is a longitudinal sectional view taken along line B-B in (c), (c ) Is a bottom view.
- FIG. 3 is a cross-sectional view for each process showing the method for manufacturing the light-emitting element according to the first embodiment of the present invention.
- FIG. 4 is a front cross-sectional view showing a structure of a white light emitting element (a hybrid white light emitting element) using a conventional general light emitting element.
- FIG. 5 is a cross-sectional view showing a conventional white light emitting element (hybrid white light emitting element) manufacturing method according to an embodiment.
- the manufacturing method includes steps (a) to (g) as shown in FIG. 3, and is a manufacturing method for manufacturing a plurality of white light emitting elements 1 at a time.
- the white light emitting element 1 in this case is a large white LED element used as a single light emitting element for an illumination light source.
- the unit light-emitting element is a light-emitting element that emits light from a light-emitting layer of a pair of p-side electrode and n-side electrode, as well as a plurality of p-side electrodes and one common n-side electrode as shown in FIG. And a light emitting element that emits light from a plurality of light emitting layers (light emitting portions).
- a plurality of light emitting layers are provided, but the adjacent light emitting layers are formed close to the transparent substrate, and the n-type epi layer is formed in common.
- the white LED element 1 is composed of a blue LED element 4 and an oxide layer 8 including a phosphor integrated therewith.
- Blue LED element 4 is translucent
- a GaN-based compound semiconductor thin film is laminated (epitaxial layer 6) in the order of a buffer layer, an n-type layer, a blue light emitting layer, and a p-type layer from the substrate side.
- the p-side electrode 11 on the surface of the p-type layer of the epitaxial layer 6 and the n-side electrode 1 on the bottom surface of the recess 9 where the p-type layer and the light emitting layer are partially selectively etched to expose the n-type layer 1 0 is formed, and a groove 7 is dug on the light extraction surface side of the sapphire substrate 3.
- This groove 7 is divided into four sections so that blue light extraction efficiency is good.
- the shape is processed so as to have a substantially trapezoidal shape.
- the oxide layer 8 includes YAG phosphor and SiO, BO and PbO for bonding the YAG phosphor on the light extraction surface of the sapphire substrate 3 and in the groove 7.
- This white LED element emits blue light from the blue LED element as white light to the outside through the oxide layer 8, and the opposite side of the oxide layer 8 is the main light extraction surface with the electrode forming surface as the mounting surface.
- This is an element of the type (so-called face-down type).
- the p-side electrode 11 uses Rh or Ag having high reflectivity in order to efficiently reflect blue light downward from the light emitting layer upward.
- the n-side electrode 10 has a shape in which a striped electrode surrounding the p-side electrode 11 divided into four parts is connected to the central round electrode.
- step (a) a GaN-based compound semiconductor thin film is applied on the sapphire substrate 3 from the substrate side to the GaN buffer layer 61, n-type GaN layer 62, n-type AlGaN layer 63, MQW layer 64, p-type AlGaN layer 65, p
- MOCVD metal organic chemical vapor deposition
- step (b) on the upper surface of the sapphire substrate 3 of the LED wafer, the boundary corresponding to the large blue LED element 4 and the center thereof are arranged so that the light extraction efficiency is improved.
- a groove 7 is formed along
- the boundary groove has a width of about 200 to 400 xm and a depth of about 150 to 250 ⁇ m
- the central groove has a width of about 200 to 300 ⁇ m and a depth of about 50 to 150 ⁇ m. Is U-shaped or V-shaped.
- This processing can be performed by a sand blasting method in which the dry film 20 is used as a mask and abrasive powder is ejected from the nozzle 22 for grinding, or a dicing method in which cutting is performed using the dicing blade 23.
- a sand blasting method in which the dry film 20 is used as a mask and abrasive powder is ejected from the nozzle 22 for grinding
- a dicing method in which cutting is performed using the dicing blade 23.
- the upper surface of the sapphire substrate 3 (including the inside of the groove 7) is composed mainly of YAG phosphor, SiO, BO, and PbO for bonding the YAG phosphor. Powdered glass, and small
- the powdered glass has a thermal expansion coefficient almost equal to that of the sapphire substrate. 7.4 X 10 _6 Z ° C, sintering temperature is about 500-600 ° C, and visible light transmittance is 90% or more. Has characteristics. When the light transmittance of the sintered glass is good, the YAG phosphor and the powdered glass are made rich by increasing the powdered glass ratio, and the oxide layer 8 is thickened.
- the phosphor can be obtained by setting the proportion of phosphor to 60% or more, preferably 70% or more. Although this thickness depends on the concentration of the phosphor, it should be about several tens of ⁇ . Then, the formed oxide layer 8 is ground (polished) flatly with a surface grinder (polishing machine) so that the upper surface of the oxide layer 8 is parallel to the lower surface of the opposite epoxy layer on the opposite side.
- step (d) a SiO film is formed on the surface of the epitaxial layer 6, and the n-side electrode 10 is formed.
- the p-type AlGaN layer 65, the MQW layer 64, and the n-type AlGaN layer 63 are sequentially removed by plasma etching (RIE) using a chlorine-based gas to expose the n-type GaN layer 62 (etching process).
- RIE plasma etching
- this etching process affects the oxide layer 8
- this etching process may be performed before the oxide formation process.
- step (e) the SiO film is removed, and a p-type cap on the surface of the epitaxial layer 6 is formed.
- P-side electrode 11 in which Rh, Ag, Ni and Au having high reflectivity are laminated on the upper surface of layer 66, and n-side electrode 10 in which Ti and Au are laminated on the upper surface of n-type GaN layer 62 in which recess 9 is exposed.
- Form electrode forming process
- step (f) a current is passed through the electrodes in the wafer state to emit light, and an appropriate emission color is obtained.
- step (g) the oxide layer 8 serving as the main light extraction surface is aligned along the boundary of the large white LED element 1 (single light emitting element) so that the light extraction efficiency is improved. Then, it is divided into dice so as to form a V shape, and is formed into chips (chip forming process).
- the cross-sectional shape of the chip is a substantially trapezoidal shape, which improves the light extraction efficiency.
- the oxide layer 8 including the phosphor and the blue LED are integrated, and the oxide layer 8 using glass as the phosphor binder. Therefore, it becomes a single large-sized white LED element used for a high-brightness and high-reliability illumination light source that does not discolor even with heat of a large current.
- the white light emitting device of the second embodiment is the block light emitting device 2 shown in FIG. 2, and the manufacturing method thereof is the same as the manufacturing method of the first embodiment.
- a block light-emitting element means a light-emitting element in which adjacent light-emitting layers are not shared by n-type epitaxial layers but are separated from each other by grooves.
- unit light-emitting elements having one light-emitting layer are formed on a light-transmitting substrate electrically independent from each other.
- unit light emitting elements having a plurality of light emitting layers and having a common n- type epi layer can be further arranged in a matrix to form a block light emitting element. .
- four unit light emitting elements having four light emitting layers shown in FIG. 1 may be arranged in a matrix to form a block light emitting element. In this case, there are four unit light emitting elements and 16 light emitting layers.
- the block light emitting device 2 in this case has a side of 0 as a single light emitting device.
- the structure of a single light emitting device is the same as that shown in Fig. 1 except that the device size and electrode pattern are different.
- the manufacturing method includes substantially the same steps as in the first embodiment, and is not shown. The only difference is that the electrode pattern of the blue LED element and the unit of chip formation are different.
- this block light-emitting element 2 can be a white light-emitting element without flip-chip mounting, it has the same merit as that described in the first embodiment, and this block light-emitting element 2 has the following advantages: It has an optimal structure as a high-current white light-emitting element such as an illumination light source. If the white light-emitting element is enlarged, the area is simply increased as shown in Fig. 1. There are a method of increasing the area of the electrode and a method of blocking small white light emitting elements as shown in FIG. 2 and connecting them in series. As a method of flowing a current uniformly to each part of the white light emitting element, If there is no VF (forward voltage) variation in the light emitting element, no difference will occur.
- VF forward voltage
- the variation is large, so it was blocked as shown in Fig. 2. In this way, current can flow more uniformly in each part of the light emitting element, and the light emission efficiency can be improved. Also, considering the illumination light source, etc., it is preferable to set the drive voltage to 100V, but it is easier to configure the illumination light source by connecting in series. Moreover, since it is not necessary to divide each single light emitting element, the number of man-hours can be reduced. In addition, since it is already a white light emitting element, it is limited to whitening at the time of package sealing, and it becomes package-free regardless of the type of package.
- the translucent crystal substrate 3 of the white light emitting device shown in FIG. 1 is an SiC substrate, and the binder of the oxide layer 8 containing the phosphor is an SiC substrate.
- This is a white light-emitting element made of glass composed mainly of SiO and BO, which is almost equal to the thermal expansion coefficient of
- the manufacturing method is almost the same as the manufacturing method of the first embodiment, but the oxide layer 8 containing the phosphor is partially hydrolyzed with alkoxide (Si (OC H) in advance,
- Phosphor powder is dispersed in a solution prepared by adding B (OCH (CH)) to this solution to
- the glass skeleton After most of the glass skeleton is formed by decomposition and polycondensation reaction, it is formed by heat treatment at 500 to 600 ° C. for 10 to 30 minutes.
- the white light emitting element of the fourth embodiment is the block light emitting element 2 shown in FIG. 2, and the same as the third embodiment, the translucent crystal substrate 3 is an SiC substrate, and the binder is SiO and BO.
- 2 2 3 is a white light emitting element made of glass.
- an example of a blue LED element formed so that light emitted from the light emitting layer is blue is used.
- an ultraviolet LED element that emits ultraviolet light is used.
- a phosphor that converts ultraviolet light into blue light, green light, and red light may be used as the phosphor of the phosphor-containing oxide layer 8.
- the present invention can be used as a light source in a wide range of fields, such as backlights for liquid crystal display devices, various light emitting elements such as white and blue, and lighting devices.
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- Led Devices (AREA)
- Led Device Packages (AREA)
Abstract
Description
Claims
Priority Applications (4)
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JP2006528553A JPWO2006001297A1 (ja) | 2004-06-23 | 2005-06-22 | 白色発光素子およびその製造方法 |
KR1020067027123A KR20070034005A (ko) | 2004-06-23 | 2005-06-22 | 백색 발광 소자 및 그 제조 방법 |
EP05753466A EP1783838A1 (en) | 2004-06-23 | 2005-06-22 | White light-emitting device and method for producing same |
US11/629,999 US20080042150A1 (en) | 2004-06-23 | 2005-06-22 | White Light Emitting Device and Method for Manufacturing the Same |
Applications Claiming Priority (2)
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JP2004-185617 | 2004-06-23 | ||
JP2004185617 | 2004-06-23 |
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WO2006001297A1 true WO2006001297A1 (ja) | 2006-01-05 |
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PCT/JP2005/011429 WO2006001297A1 (ja) | 2004-06-23 | 2005-06-22 | 白色発光素子およびその製造方法 |
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US (1) | US20080042150A1 (ja) |
EP (1) | EP1783838A1 (ja) |
JP (1) | JPWO2006001297A1 (ja) |
KR (1) | KR20070034005A (ja) |
CN (1) | CN100459192C (ja) |
WO (1) | WO2006001297A1 (ja) |
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US7368179B2 (en) | 2003-04-21 | 2008-05-06 | Sarnoff Corporation | Methods and devices using high efficiency alkaline earth metal thiogallate-based phosphors |
US8906262B2 (en) | 2005-12-02 | 2014-12-09 | Lightscape Materials, Inc. | Metal silicate halide phosphors and LED lighting devices using the same |
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JP2013232678A (ja) * | 2008-04-24 | 2013-11-14 | Citizen Holdings Co Ltd | Led光源の製造方法 |
JP2010130986A (ja) * | 2008-12-08 | 2010-06-17 | Mkv Dream Co Ltd | 植物栽培方法 |
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Also Published As
Publication number | Publication date |
---|---|
CN100459192C (zh) | 2009-02-04 |
KR20070034005A (ko) | 2007-03-27 |
US20080042150A1 (en) | 2008-02-21 |
CN1981389A (zh) | 2007-06-13 |
EP1783838A1 (en) | 2007-05-09 |
JPWO2006001297A1 (ja) | 2008-07-31 |
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