WO2005106954A3 - Leistungshalbleiterschaltung und verfahren zum herstellen einer leistungshalbleiterschaltung - Google Patents
Leistungshalbleiterschaltung und verfahren zum herstellen einer leistungshalbleiterschaltung Download PDFInfo
- Publication number
- WO2005106954A3 WO2005106954A3 PCT/EP2005/002708 EP2005002708W WO2005106954A3 WO 2005106954 A3 WO2005106954 A3 WO 2005106954A3 EP 2005002708 W EP2005002708 W EP 2005002708W WO 2005106954 A3 WO2005106954 A3 WO 2005106954A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- power semiconductor
- semiconductor circuit
- producing
- heat conducting
- module
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3735—Laminates or multilayers, e.g. direct bond copper ceramic substrates
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- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
- H01L25/072—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
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- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45163—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than 1550°C
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/4813—Connecting within a semiconductor or solid-state body, i.e. fly wire, bridge wire
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H01L2924/01005—Boron [B]
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- H01L2924/01078—Platinum [Pt]
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- H01L2924/10161—Shape being a cuboid with a rectangular active surface
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- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/15786—Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
- H01L2924/15787—Ceramics, e.g. crystalline carbides, nitrides or oxides
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- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/30107—Inductance
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Materials Engineering (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007507680A JP2007533146A (ja) | 2004-04-16 | 2005-03-14 | 電力半導体回路および電力半導体回路の製造方法 |
US11/549,809 US20070145576A1 (en) | 2004-04-16 | 2006-10-16 | Power Semiconductor Circuit And Method Of Manufacturing A Power Semiconductor Circuit |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE200410018471 DE102004018471B4 (de) | 2004-04-16 | 2004-04-16 | Leistungshalbleiterschaltung und Verfahren zum Herstellen einer Leistungshalbleiterschaltung |
DE102004018471.2 | 2004-04-16 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/549,809 Continuation US20070145576A1 (en) | 2004-04-16 | 2006-10-16 | Power Semiconductor Circuit And Method Of Manufacturing A Power Semiconductor Circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005106954A2 WO2005106954A2 (de) | 2005-11-10 |
WO2005106954A3 true WO2005106954A3 (de) | 2005-12-29 |
Family
ID=34961207
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2005/002708 WO2005106954A2 (de) | 2004-04-16 | 2005-03-14 | Leistungshalbleiterschaltung und verfahren zum herstellen einer leistungshalbleiterschaltung |
Country Status (4)
Country | Link |
---|---|
US (1) | US20070145576A1 (de) |
JP (1) | JP2007533146A (de) |
DE (1) | DE102004018471B4 (de) |
WO (1) | WO2005106954A2 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005061016B4 (de) * | 2005-12-19 | 2018-12-06 | Infineon Technologies Ag | Leistungshalbleitermodul, Verfahren zu seiner Herstellung und Verwendung in einem Schaltnetzteil |
JP2009130060A (ja) * | 2007-11-21 | 2009-06-11 | Toyota Industries Corp | 放熱装置 |
EP2144284A1 (de) * | 2008-07-11 | 2010-01-13 | Siemens Aktiengesellschaft | Verfahren zum Herstellen eines Anschlusskontaktes an einem Halbleiterbauelement für die Leistungselektronik und elektronisches Bauteil mit einem auf diese Weise an einem Halblei-terbauelement hergestellten Anschlusskontakt |
US8787003B2 (en) * | 2011-10-12 | 2014-07-22 | Infineon Technologies Ag | Low inductance capacitor module and power system with low inductance capacitor module |
JP5734364B2 (ja) * | 2012-11-22 | 2015-06-17 | 株式会社デンソー | 電力変換装置 |
DE102015221925A1 (de) * | 2015-11-09 | 2017-05-11 | Continental Automotive Gmbh | Leistungsschalter für ein Kraftfahrzeug mit Bondverbindung zwischen Zwischenkreiskondensator und Leistungselektronikeinheit |
CA3091748A1 (en) * | 2018-03-05 | 2019-09-12 | Sew-Eurodrive Gmbh & Co. Kg | Electrical appliance arrangement having an electrical appliance which can be fastened to a support element, in particular a wall |
EP4009364B8 (de) | 2020-12-03 | 2023-12-06 | Hitachi Energy Ltd | Anordnung eines leistungshalbleitermoduls und einem kühler |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE8914493U1 (de) * | 1989-12-08 | 1990-05-17 | Siemens Ag, 1000 Berlin Und 8000 Muenchen, De | |
EP0901166A1 (de) * | 1997-08-16 | 1999-03-10 | Abb Research Ltd. | Leistungshalbleitermodul mit in Submodulen integrierten Kühlern |
US6150725A (en) * | 1997-02-27 | 2000-11-21 | Sanyo Electric Co., Ltd. | Semiconductor devices with means to reduce contamination |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4555052A (en) * | 1983-02-28 | 1985-11-26 | Fairchild Camera & Instrument Corporation | Lead wire bond attempt detection |
JP3316714B2 (ja) * | 1994-05-31 | 2002-08-19 | 三菱電機株式会社 | 半導体装置 |
DE19531496C1 (de) * | 1995-08-26 | 1996-11-14 | Semikron Elektronik Gmbh | Leistungshalbleitermodul, insb. Stromumrichter mit Folienverbund als isolierendes Substrat |
KR100320983B1 (ko) * | 1997-08-22 | 2002-06-20 | 포만 제프리 엘 | 칩조립체및직접적인개방열전도성경로의제공방법 |
JP2002203942A (ja) * | 2000-12-28 | 2002-07-19 | Fuji Electric Co Ltd | パワー半導体モジュール |
AU2002340750A1 (en) * | 2001-09-28 | 2003-04-14 | Siemens Aktiengesellschaft | Method for contacting electrical contact surfaces of a substrate and device consisting of a substrate having electrical contact surfaces |
DE10159020C1 (de) * | 2001-11-30 | 2003-03-20 | Semikron Elektronik Gmbh | Schaltungsanordnung und Verfahren zur Überwachung von Leistungshalbleiterbauelementen |
DE10200066A1 (de) * | 2002-01-03 | 2003-07-17 | Siemens Ag | Leistungselektronikeinheit |
DE10314172B4 (de) * | 2003-03-28 | 2006-11-30 | Infineon Technologies Ag | Verfahren zum Betreiben einer Anordnung aus einem elektrischen Bauelement auf einem Substrat und Verfahren zum Herstellen der Anordnung |
-
2004
- 2004-04-16 DE DE200410018471 patent/DE102004018471B4/de not_active Expired - Fee Related
-
2005
- 2005-03-14 JP JP2007507680A patent/JP2007533146A/ja active Pending
- 2005-03-14 WO PCT/EP2005/002708 patent/WO2005106954A2/de active Application Filing
-
2006
- 2006-10-16 US US11/549,809 patent/US20070145576A1/en not_active Abandoned
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE8914493U1 (de) * | 1989-12-08 | 1990-05-17 | Siemens Ag, 1000 Berlin Und 8000 Muenchen, De | |
US6150725A (en) * | 1997-02-27 | 2000-11-21 | Sanyo Electric Co., Ltd. | Semiconductor devices with means to reduce contamination |
EP0901166A1 (de) * | 1997-08-16 | 1999-03-10 | Abb Research Ltd. | Leistungshalbleitermodul mit in Submodulen integrierten Kühlern |
Also Published As
Publication number | Publication date |
---|---|
DE102004018471B4 (de) | 2009-04-16 |
WO2005106954A2 (de) | 2005-11-10 |
US20070145576A1 (en) | 2007-06-28 |
JP2007533146A (ja) | 2007-11-15 |
DE102004018471A1 (de) | 2005-11-10 |
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