WO2005087697A1 - β−ジケトナトを配位子とする金属錯体 - Google Patents
β−ジケトナトを配位子とする金属錯体 Download PDFInfo
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- WO2005087697A1 WO2005087697A1 PCT/JP2005/004577 JP2005004577W WO2005087697A1 WO 2005087697 A1 WO2005087697 A1 WO 2005087697A1 JP 2005004577 W JP2005004577 W JP 2005004577W WO 2005087697 A1 WO2005087697 A1 WO 2005087697A1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C45/00—Preparation of compounds having >C = O groups bound only to carbon or hydrogen atoms; Preparation of chelates of such compounds
- C07C45/45—Preparation of compounds having >C = O groups bound only to carbon or hydrogen atoms; Preparation of chelates of such compounds by condensation
- C07C45/455—Preparation of compounds having >C = O groups bound only to carbon or hydrogen atoms; Preparation of chelates of such compounds by condensation with carboxylic acids or their derivatives
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C45/00—Preparation of compounds having >C = O groups bound only to carbon or hydrogen atoms; Preparation of chelates of such compounds
- C07C45/77—Preparation of chelates of aldehydes or ketones
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C49/00—Ketones; Ketenes; Dimeric ketenes; Ketonic chelates
- C07C49/92—Ketonic chelates
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F1/00—Compounds containing elements of Groups 1 or 11 of the Periodic Table
- C07F1/08—Copper compounds
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F3/00—Compounds containing elements of Groups 2 or 12 of the Periodic Table
- C07F3/02—Magnesium compounds
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F3/00—Compounds containing elements of Groups 2 or 12 of the Periodic Table
- C07F3/04—Calcium compounds
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
Definitions
- the present invention relates to a metal oxide film or a metal complex that is advantageously used for producing a metal thin film by a chemical vapor deposition method (CVD method).
- CVD method chemical vapor deposition method
- complexes of Group III metals of the periodic table eg, strontium, norium and magnesium
- Complexes of Group III metals eg, zinc
- complexes of Group III metals eg, indium, aluminum, and gallium
- It is used as a material for the production of films and semiconductor memory gate dielectrics, and is being studied.
- Complexes of Group IVA metals can be used as materials for the manufacture of ferroelectric (PZT) and semiconductor memory gate dielectrics, as well as for Group VIA metals.
- Complexes eg, chromium
- Complexes of Group VIIA metals have been used and studied as materials for the manufacture of thermistor devices utilizing electrochromic devices and the high resistance to temperature change and high temperature resolution. ing.
- Complexes of Group VIII metals are used as materials for forming thin films to improve the density of copper nucleation in copper wiring used in silicon semiconductors and to improve the adhesion between copper wiring and its base.
- Group IB metals eg, copper, silver, and gold
- complexes of Group IB metals are used as materials for forming electrical wiring because of their low electrical resistance.
- copper thin films since they can be used for wiring of silicon semiconductors.
- metal oxide thin films containing copper oxide as a component have attracted attention as a material for high-temperature superconductors! / Puru.
- rare earth metal eg, scandium, yttrium, and lanthanoid
- rare earth metals are attracting attention as high-temperature superconductors, high dielectric materials as gate insulating films, and ferroelectric materials as PLZT thin films. , Useful as materials for their manufacture.
- a metal complex having ⁇ -diketonate as a ligand has been widely used as a raw material for producing a metal atom-containing thin film by a CVD method.
- 8-diketonate as a ligand has excellent stability and sublimability, and is useful as a metal source in CVD.
- Specific examples of the j8-diketonato ligand include, for example, acetylacetonato (acac) and 2,2,6,6-tetramethyl-3,5-heptanedionato (dpm). ing.
- the metal complex represented by is known (Patent Document 1 and Non-Patent Document 1).
- the strontium complex of formula (a) has improved stability, but has a problem of low vapor pressure
- the strontium complex of formula (b) has stability and sublimability.
- it has a problem that it has a high melting point (235 ° C), which is a problem as a raw material for producing strontium thin films by CVD.
- the zinc complex belonging to Group III is represented by the following formula:
- Non-Patent Document 2 A metal complex represented by the following formula is known (Non-Patent Document 2).
- the above-mentioned zinc complex has a drawback that it is difficult to stably supply the zinc complex because the thermal stability is low and thermal deterioration is apt to occur.
- Patent Document 2 A metal complex of a ligand having an ether group represented by the following formula is known (Patent Document 2).
- Patent Document 2 the above-mentioned aluminum complex has a drawback that V is difficult to stably supply the aluminum complex because thermal stability is low and thermal deterioration is apt to occur.
- Sn (dpm) is known as a tin complex belonging to Group IVB (Patent Document 3)
- V (dpm) is known as a vanadium complex belonging to Group VA (Patent Document
- this complex is also a high melting point metal complex, and has problems as a raw material for producing vanadium thin films by the CVD method.
- a metal complex represented by is known (Non-Patent Document 2 and Patent Document 7).
- the nickel complex of the formula (c) has a low thermal stability, which causes thermal degradation immediately, and the nickel complex of the formula (d) has a problem that the vapor pressure is low due to its large molecular weight. .
- Patent Document 8 A metal complex represented by the following formula is known (Patent Document 8).
- the above-mentioned cobalt complex has a disadvantage that thermal degradation occurs due to low thermal stability and stable supply of the cobalt complex is difficult to obtain immediately.
- the rare earth metal complex is represented by the following formula:
- Patent Document 1 Japanese Patent Application Laid-Open No. 9 136857
- Patent document 2 German published patent application No. 2207866
- Patent Document 3 JP-A-6-234779
- Patent document 4 JP 2002-155008 A
- Patent Document 5 JP-A-2003-226664
- Patent Document 6 JP-A-2003-49269
- Patent Document 7 International Patent Publication No. 01/48130
- Patent Document 8 JP-A-2-121944
- Patent Document 9 Japanese Patent Application Laid-Open No. 2001-181840
- Patent Document 10 JP-A-2003-321475
- Patent Document 11 JP-A-4-72066
- Patent Document 12 JP-A-9-228049
- Non-patent literature l Zhurnal Neorganicheskoi Khimii, 36 (9), 2279 (1991)
- Non-Patent Document 2 Inorg.Chem., 1 (2), 404 (1962)
- An object of the present invention is to provide a metal complex having a low melting point, excellent stability against moisture, air and heat, and suitable for forming a metal thin film by a CVD method.
- the present invention resides in a metal complex having ⁇ -diketonate having an alkoxyalkylmethyl group as a ligand.
- the 13-diketonato ligand having an alkoxyalkylmethyl group of the metal complex of the present invention has the following formula (1): [0040] [Formula 8]
- [X] is an alkoxyalkylmethyl group represented by the above formula (2) (wherein, R a and R b are each independently a straight-chain or branched chain having 115 carbon atoms.
- Y represents a group of the above formula (2) or a linear or branched alkyl group having 18 carbon atoms, and Z represents a hydrogen atom or a carbon atom number. And represents a 1-4 alkyl group].
- the metal complex of the present invention has the following formula (3):
- N represents an integer of 14
- M represents a metal atom
- X, Y and Z have the same meanings as above.
- N represents an integer of 14
- M represents a metal atom
- X, Y and Z have the same meanings as above.
- N represents an integer of 14
- N is preferably a metal complex represented by the following formula:
- M is preferably a metal atom of Group I, II, III, IVB or VA of the periodic table, particularly a magnesium atom, a calcium atom, a strontium atom, or a metal atom. It is preferably a metal atom selected from the group consisting of palladium atom, zinc atom, boron atom, aluminum atom, gallium atom, indium atom, germanium atom, tin atom, lead atom, vanadium atom, niobium atom and tantalum atomic force. .
- M is also a metal atom of Group IVA, VIA, VIIA or VIII of the Periodic Table.
- the metal atom is selected from the group consisting of titanium, zirconium, hafnium, chromium, manganese, nickel, cobalt, iron, ruthenium, and iridium. .
- M is also a metal atom of Group IB of the periodic table (particularly, a metal atom selected from the group consisting of a copper atom, a silver atom and a gold atom), and n may be 1 or 2.
- U preferred.
- M is also a rare earth metal atom (particularly, a metal atom selected from the group consisting of yttrium, lanthanum, cerium, praseodymium, neodymium, samarium, europium, erbium, yttrium, and lutetium nuclear). ), And n is preferably 3 or 4! / ,.
- the present invention also provides a step of heating a metal complex having a / 3 diketonate having an alkoxyalkylmethyl group as a ligand to form a metal complex vapor and supplying it to a reaction vessel equipped with a substrate. Is produced by contacting with oxygen or water vapor under heating in a reaction vessel to thermally decompose and convert the metal oxide vapor into a metal oxide vapor, and depositing the metal oxide vapor on the substrate surface. There is also a method.
- the present invention also provides a step of heating a metal complex having 13 diketonato having an alkoxyalkylmethyl group as a ligand to form a metal complex vapor, and supplying the metal complex vapor into a reaction vessel equipped with a substrate.
- a method for producing a metal thin film which comprises a step of contacting with hydrogen while being heated in a reaction vessel, thermally decomposing the hydrogen into metal vapor, and depositing the metal vapor on a substrate surface.
- the metal complex When heating the metal complex in the method for producing a metal thin film, it is preferable to heat the metal complex as a solution in which the metal complex is dissolved in an organic solvent (particularly, an aliphatic hydrocarbon solvent, an aromatic hydrocarbon solvent or an ether solvent). ,.
- an organic solvent particularly, an aliphatic hydrocarbon solvent, an aromatic hydrocarbon solvent or an ether solvent.
- the metal complex having a ligand of 13 diketonato having an alkoxyalkylmethyl group used in the present invention is represented by the above formula (1), and the metal complex of the present invention is represented by the above formula (3). It is.
- X is an alkoxyalkylmethyl group represented by the above formula (2)
- R a and R b are linear or branched having 115 carbon atoms such as methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, t -butyl group and pentyl group.
- Y represents a group represented by the formula (2) or a methyl group, an ethyl group, an n-propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a t-butyl group, A straight-chain or branched alkyl group having 18 carbon atoms such as pentyl, hexyl, heptyl and octyl; Z is a hydrogen atom or a methyl, ethyl or n-propyl Represents a straight-chain or branched alkyl group having 14 to 14 carbon atoms such as a group, isopropyl group, n-butyl group, isobutyl group, t-butyl group and the like.
- n represents an integer of 1 to 4.
- the 13-diketonato ligand having an alkoxyalkylmethyl group which is a ligand of the metal complex of the present invention, can be easily synthesized by a method according to a known method for producing
- M represents a rare earth metal atom.
- a known CVD method can be used as a method for depositing a metal-containing compound on a substrate.
- a metal complex can be converted to oxygen, water vapor, ozone, nitrogen oxide (eg, under normal pressure or reduced pressure). , NO) and a reducing gas such as hydrogen together with an oxidizing gas such as hydrogen.
- a method of depositing and depositing a metal oxide thin film or a metal thin film, or a method of depositing a metal complex together with a nitrogen-containing basic gas such as an ammonia gas on a heated substrate to deposit a metal nitride thin film can be used. Also, a method of depositing a metal-containing thin film by a plasma CVD method can be used.
- a step of heating the metal complex of the present invention to form a metal complex vapor supplying the vapor to a reaction vessel equipped with a substrate, and reacting the metal complex vapor
- a method comprising a step of bringing into contact with oxygen or water vapor under heating in a vessel to thermally decompose it into a metal oxide vapor and depositing the metal oxide vapor on the substrate surface.
- a step of heating the metal complex of the present invention to form a metal complex vapor supplying the vapor to a reaction vessel equipped with a substrate, and then introducing the metal complex vapor into the reaction vessel Heat and come into contact with a reducing gas such as hydrogen to decompose and convert to metal vapor.
- a reducing gas such as hydrogen to decompose and convert to metal vapor.
- a powerful method for depositing the metal vapor on the substrate surface can be used.
- a metal complex itself is filled in a vaporization chamber.
- the metal complex which can be transported and vaporized alone can be converted to a suitable solvent (for example, aliphatic hydrocarbons such as hexane and octane, aromatic hydrocarbons such as toluene, and ethers such as tetrahydrofuran and dibutyl ether).
- a suitable solvent for example, aliphatic hydrocarbons such as hexane and octane, aromatic hydrocarbons such as toluene, and ethers such as tetrahydrofuran and dibutyl ether.
- the deposition conditions are, for example, the pressure in the reactor is preferably 1 to 200 kPa, more preferably 10 1 lOkPa,
- the substrate temperature is preferably 50-700 ° C, more preferably 100-500 ° C, and the temperature at which the metal complex is vaporized is preferably 50-250 ° C, more preferably 90-200 ° C. C.
- the content ratio of the oxidizing gas with respect to the total gas amount when depositing the metal oxide thin film with an oxidizing gas such as oxygen is preferably 10 to 90% by volume, more preferably 20 to 90% by volume.
- the content of water vapor with respect to the total gas amount when the metal oxide film is deposited by water vapor is preferably 70 to 90% by volume, more preferably 5 to 90% by volume, and still more preferably 10 to 70% by volume.
- the content ratio of the reducing gas with respect to the total gas amount when depositing a metal film with a reducing gas such as hydrogen is preferably 10 to 95% by volume, and more preferably 30 to 90% by volume. .
- the content ratio of the nitrogen-containing basic gas to the total gas amount when depositing the metal nitride film or the metal film with the nitrogen-containing basic gas such as ammonia is preferably 10 to 95% by volume, more preferably. Is 20-90% by volume.
- IR (neat (cm -1 )): 2972, 2936, 1602 (br), 1461, 1366, 1200, 1059, 886, 809 (The peak at 1602cm- 1 is a characteristic peak of ⁇ -diketone)
- Tris (2-methoxy-6-methinolay 3,5-heptanedionato) indium (III) is a novel compound having the following physical data.
- IR (neat (cm -1 )): 2975, 2933, 1571, 1539, 1515, 1429, 1402, 1363, 1331, 1230, 1120, 952, 914, 809, 554 (j8—peak unique to diketone) (1607 cm— disappeared, peak unique to ⁇ -diketonate (1571 cm observed)
- Tris (2-methoxy-6,6-dimethyl-3,5-heptanedionato) indium (III) is a novel compound having the following physical properties.
- Bis (2-methoxy-6-methyl-3,5-heptanedionato) strontium (II) is a novel compound having the following physical properties.
- Bis (2-methoxy-6,6-dimethyl-3,5-heptanedionato) strontium (II) is a novel compound having the following physical properties.
- IR (KBr method (cm- 1 )): 3430, 2970, 2903, 1609, 1502, 1473, 1434, 1344, 1206, 1151, 1104, 1055, 1018, 884, 839, 784, 751, 474
- Bis (2-methoxy-6-methyl-3,5-heptanedionato) zinc ( ⁇ ) is a novel compound having the following physical properties.
- Example A-6 (Bis (2-methoxy-6-methyl-3,5-heptanedionato) tin ( ⁇ ) (Sn (m opd)))
- a 70% methanol solution of sodium methoxide (4.70 g, 24.4 mmol) was added to a 100 mL flask equipped with a stirrer, a thermometer, and a dropping funnel, and was synthesized by the method of Reference Example 2 under ice-cooling.
- 4-Methoxy-6-methyl-3,5-heptanedione 4.30 g (25.0 mmol) was slowly added dropwise, and the mixture was stirred for 5 minutes.
- a solution of 2.25 g (11.9 mmol) of tin chloride (11) dissolved in 10 mL of methanol was slowly added dropwise, and the mixture was reacted for 30 minutes while stirring under ice-cooling.
- Bis (2-methoxy-6-methyl-3,5-heptanedionato) tin ( ⁇ ) is a novel compound having the following physical properties.
- Tris (2-methoxy-6-methinolay 3,5-heptanedionato) vanadium (III) is a novel compound having the following physical properties.
- Tris (2-methoxy-6-methyl-3,5-heptanedionato) aluminum (III) is a novel compound having the following physical properties.
- the concentrate was distilled under reduced pressure (210 ° C., 25 Pa) to obtain 3.75 g of bis (2-methoxy-6-dimethyl-3,5 heptadionato) magnesium ( ⁇ ) as a pale yellow glassy solid (isolation yield: 90 %).
- Bis (2-methoxy-6-methyl-3,5 heptanedionato) magnesium (II) is a novel compound having the following physical properties.
- Tris (2-methoxy-6-methyl-3,5-heptanedionato) gallium (III) is a novel compound having the following physical properties.
- IR (neat (cm -1 )): 2970, 2936, 1604 (br), 1465, 1365, 1280, 1201, 1118, 990, 941, 800 (Note that 1604cm- 1 peak peak, j8-diketone specific Is the peak)
- Tris (1-methoxy-5,5-dimethyl-2,4-hexanedionato) indium (III) is a novel compound having the following physical properties.
- Tris (2-methoxy-2,6,6-trimethinolate 3,5-heptanedionato) indium (III) is a novel compound having the following physical properties.
- Example A-1 0.50 g of the indium complex synthesized in Example A-1, Comparative Examples A-1 and A-2 was placed in a 25 mL flask, heated at 190 ° C. for 15 minutes under an argon atmosphere, and the appearances were compared. Table 1 shows the results.
- Example 1 In comparison with the above, it can be seen that In (mopd) of Example 1 has excellent thermal stability and a low melting point.
- Example A-4 0.30 g of the strontium complex synthesized in Example A-4 and Comparative Examples A-3 and A-4 was placed in a 25 mL flask, heated at 235 ° C for 15 minutes under reduced pressure (40 Pa), and the appearances were compared. . Table 2 shows the results.
- Sr (mopd) of Example 4 has excellent thermal stability and a low melting point.
- Examples A-1, A-4-1 The metal complexes (indium complex (In (mopd))) obtained in A-12,
- V (mopd) vanadium complex
- Al (mopd) aluminum complex
- magnesium complex magnesium complex
- the apparatus shown in Fig. 1 was used for the evaluation test.
- the metal complex 20 in the vaporizer 3 (glass ampoule) is heated by the heater 10B and vaporized, passes through the mass flow controller 1A, and exits the vaporizer 3 with the helium gas introduced after being preheated by the preheater 10A.
- the gas exiting the vaporizer 3 is combined with the oxygen gas introduced via the mass flow controller 1B and the stop valve 2. Both are introduced into the reactor 4.
- the pressure in the reaction system is controlled to a predetermined pressure by opening and closing a valve 6 in front of a vacuum pump, and monitored by a pressure gauge 5.
- the central part of the glass reactor has a structure that can be heated by a heater 10C.
- the metal complex introduced into the reactor is set in the center of the reactor, and is oxidized and thermally decomposed on the surface of the substrate to be evaporated 21 heated to a predetermined temperature by the heater 10C. Precipitates.
- the gas exiting the reactor 4 is exhausted to the atmosphere through a trap 7 and a vacuum pump.
- Substrate SiO / Si (Size: 7mm X 40mm)
- Table 3 shows the results of the vapor deposition (the film characteristics and the products were analyzed by XPS analysis).
- IR (neat (cm -1 )): 2967, 2936, 2977, 2827, 1608 (br), 1458, 1332, 1210, 1119, 802 (The peak at 1608 cm- 1 is a peak specific to j8-diketone. .)
- Tris (2-methoxy-3,5-octanedionato) indium (III) is a novel compound having the following physical properties.
- Bis (2-methoxy-3,5-octanedionato) zinc ( ⁇ ) is a new compound with the following physical properties.
- Bis (2-methoxy-3,5-octanedionato) tin ( ⁇ ) is a new compound with the following physical properties.
- IR (neat (cm -1 )): 2974, 2932, 2873, 2823, 1573, 1511, 1411, 1327, 12 10, 1119, 953, 912, 808, 545 (j8—peak unique to diketone (1608 cm — Force S disappears, peak unique to ⁇ -diketonate (1573cm observed)
- Tris (2-methoxy-3,5-octanedionato) aluminum (III) is a novel compound having the following physical properties.
- Bis (2-methoxy-3,5-octanedionato) magnesium ( ⁇ ) is a novel compound having the following physical properties.
- IR (neat (cm -1 )): 2962, 2932, 2873, 2822, 1610, 1521, 1436, 1336, 12 12, 1117, 964, 792, 532
- Tris (2-methoxy-3,5-octanedionato) gallium (III) is a novel compound having the following physical properties.
- Example A-25 Metal complex obtained in A-31 (indium complex (In (mood)), zinc complex
- Substrate SiO / Si (Size: 7mm X 40mm)
- Table 4 shows the results of the vapor deposition (the film properties and the products were analyzed by XPS analysis).
- IR (neat (cm -1 )): 2987, 2937, 2828, 1611 (br), 1451, 1368, 1211, 1119, 801 (Note that the peak at 1611 cm- 1 is a peak specific to j8-diketone.)
- IR (neat (cm -1 )): 2984, 2939, 2828, 1610 (br), 1458, 1328, 1210, 1119, 1063, 882, 814 (The peak at 1610 cm- 1 is the peak specific to j8-diketone. Is.)
- Tris (2-methoxy-6-methyl-3,5-heptanedionato) chromium (III) is a novel compound with the following physical properties.
- IR (neat (cm -1 )): 2975, 2933, 1568, 1530, 1415, 1333, 1239, 1120, 914, 800, 571 (j8—The peak specific to diketone (1607 cm— disappears, j8 —Diketonato specific peak (1568cm was observed)
- Bis (2-methoxy-6-methyl-3,5-heptanedionato) manganese (II) is a novel compound having the following physical properties.
- IR (neat (cm -1 )): 3375 (br), 2971, 2932, 1601, 1510, 1431, 1332, 1211, 1150, 1118, 1020, 955, 911, 804, 546
- Bis (2-methoxy-6-methyl-3,5-heptanedionato) nickel (II) is a novel compound having the following physical properties.
- Bis (2-methoxy-6-methyl-3,5-heptanedionato) cobalt (II) has the following physical properties: It is a novel compound indicated by a value.
- Tetrakis (2-methoxy-3,5-octanedionato) zirconium (IV) is a novel compound having the following physical properties.
- a methanol solution of 28% sodium methoxide (4.88 g, 25.3 mmol) was added to a 100 mL flask equipped with a stirrer, a thermometer and a dropping funnel, and was synthesized by the method of Reference Example 6 under ice cooling.
- 2-Methoxy-3,5-octanedione (4.41 g, 25.6 mmol) was slowly added dropwise, and the mixture was stirred for 5 minutes.
- a solution of 2.00 g (6.24 mmol) of Shifani Hafnium (IV) dissolved in 10 mL of methanol was slowly added dropwise, and the mixture was reacted for 1 hour at room temperature with stirring.
- Tetrakis (2-methoxy-3,5-octanedionato) hafnium (IV) is a novel compound having the following physical properties.
- Tetrakis (2-methoxy-3,5-hexandionato) hafnium (IV) is a novel compound having the following physical properties.
- Tetrakis (2-methoxy-3,5-heptanedionato) hafnium (IV) is a novel compound having the following physical properties.
- the properties were evaluated.
- the apparatus shown in FIG. 1 was used for producing a metal oxide thin film using oxygen
- the apparatus shown in FIG. 2 was used for producing a metal oxide film using water vapor.
- the metal complex 20 in the vaporizer 3 (glass ampoule) is heated by the heater 10B and vaporized, passes through the mass flow controller 1A, and exits the vaporizer 3 with the helium gas introduced after being preheated by the preheater 10A. .
- the gas exiting the vaporizer 3 was introduced via the mass flow controller 1B, oxygen gas introduced via the stop valve 2 (Fig. 1), or via the mass flow controller 1B, water 8 cooled to 2 ° C.
- the pressure in the reaction system is controlled to a predetermined pressure by opening and closing a valve 6 in front of a vacuum pump, and monitored by a pressure gauge 5.
- the center of the glass reactor has a structure that can be heated by a heater 10C.
- the metal complex introduced into the reactor is set in the center of the reactor, and is oxidized and thermally decomposed on the surface of the substrate 21 heated to a predetermined temperature by the heater 10C. A dangling film is deposited.
- the gas leaving the reactor 4 is exhausted to the atmosphere via a trap 7 and a vacuum pump.
- Example B—10—B—16 (using the vapor deposition apparatus in FIG. 1)
- Substrate SiO / Si (Size: 7mm X 40mm)
- Example B—17—B—18 (Using the vapor deposition apparatus in FIG. 1)
- Substrate SiO / Si (Size: 7mm X 40mm)
- Substrate SiO / Si (Size: 7mm X 40mm)
- Tables 5 and 6 show the results of the vapor deposition (the film properties and the products were analyzed by XPS analysis).
- Example B 10 C r (m op d) 3 170 ° C. Chromium oxide
- Example B Zirconium oxide with 20 Zr (mo od) 4 140
- Example B 2 1 Ti (mo pd) 4 120 ° C Titanium oxide
- Bis (2-methoxy-3,5-octanedionato) copper ( ⁇ ) is a novel compound having the following physical properties.
- Bis (2-methoxy-3,5 heptanedionato) copper (II) is a novel compound having the following physical properties.
- Substrate SiO / Si (Size: 7mm X 40mm) Substrate temperature: 250 ° C
- Table 7 shows the results of the vapor deposition (film characteristics and products are analyzed by XPS analysis).
- the concentrate was distilled under reduced pressure (230 ° C, 26.6 Pa) to obtain 0.93 g of tris (2-methoxy-6-methyl-3,5-heptanedionato) lanthanum (111) as a viscous colorless liquid (isolation yield) : 45%).
- Tris (2-methoxy-6-methyl-3,5-heptanedionato) lanthanum (III) is a novel compound having the following physical properties. [0199] Melting point: 21 ° C
- IR (neat (cm -1 )): 3477 (br), 2968, 2931, 2870, 2827, 1603, 1525, 1483, 1371, 1331, 1209, 1151, 1114, 1060, 1019, 955, 910, 865, 811 , 782 ⁇ 553
- the concentrate was distilled under reduced pressure (230 ° C, 26.6 Pa) to obtain 0.58 g of tris (2-methoxy-6-methyl-3,5-heptanedionato) samarium (III) as a viscous yellow liquid (isolated) Yield: 35%).
- Tris (2-methoxy-6-methyl-3,5-heptanedionato) samarium (III) is a novel compound having the following physical properties.
- IR (neat (cm -1 )): 2968, 2931, 2870, 2825, 1605, 1525, 1495, 1371, 13 31, 1210, 1113, 1020, 910, 804, 783
- Tris (2-methoxy-3,5-octanedionato) lanthanum (III) is a novel compound having the following physical properties.
- IR (neat (cm -1 )): 2961, 2931, 2873, 2826, 1600, 1518, 1479, 1338, 1209, 1116, 1019, 960, 789
- Example D-1 Using the lanthanum complex (La (mopd)) obtained in Example D-1, vapor deposition by the CVD method
- Substrate SiO / Si (Size: 7mm X 40mm) Substrate temperature: 450 ° C
- Table 8 shows the results of the vapor deposition (film characteristics and products were analyzed by XPS analysis).
- Bis (2-methoxy-3,5-heptanedionato) lead (II) is a novel compound having the following physical properties.
- IR (neat (cm -1 )): 2976, 2934, 2877, 2822, 1594, 1516, 1420, 1371, 1335, 1302, 1210, 1117, 1068, 1016, 944, 882, 821, 515 ( j8—Diketone specific peak (1610 cm disappeared, ⁇ -diketonate specific peak (1594 cm observed)
- Tris (2-methoxy-3,5-hexanedionato) indium (III) is a novel compound having the following physical properties.
- Tetrakis (2-methoxy-3,5-hexanedionato) zirconium (IV) is a novel compound having the following physical properties.
- Bis (2-methoxy-6-methyl-3,5-heptanedionato) hafnium (IV) is a novel compound having the following physical properties.
- a 70% methanol solution of sodium methoxide (4.70 g, 24.4 mmol) and 10 mL of methanol were placed in a lOOmL flask equipped with a stirrer, thermometer, and dropping funnel. Then, 4.20 g (24.4 mmol) of 2-methoxy-6-methyl-3,5-heptanedione synthesized in the above was slowly added dropwise, and the mixture was stirred for 5 minutes. Then, a solution prepared by dissolving 1.38 g (5.92 mmol) of zirconium-pium (IV) chloride in 4 mL of methanol was added dropwise under ice-cooling, and the mixture was reacted at room temperature with stirring for 1 hour.
- Bis (2-methoxy-6-methyl-3,5-heptanedionato) zirconium (IV) is a novel compound having the following physical properties.
- Tris (2-methoxy-6-methinolay 3,5-heptanedionato) yttrium (III) is a novel compound having the following physical data.
- IR (neat (cm -1 )): 3435 (br), 2973, 2932, 2871, 2822, 1608, 1531, 1432, 1331, 1211, 1152, 1118, 1022, 912, 787, 559
- Example E-11 A vapor deposition experiment was performed by a CVD method using each of the metal complexes obtained in E-7 to evaluate film formation characteristics. The apparatus shown in Fig. 1 was used for the evaluation test.
- Substrate SiO / Si (Size: 7mm X 40mm)
- Substrate SiO / Si (Size: 7mm X 40mm)
- Substrate SiO / Si (Size: 7mm X 40mm) Substrate temperature: 400 ° C
- Substrate SiO / Si (Size: 7mm X 40mm)
- Substrate SiO / Si (Size: 7mm X 40mm)
- Table 9 shows the results of the vapor deposition (the film properties and the products were analyzed by XPS analysis).
- FIG. 1 is a diagram showing a configuration of a vapor deposition device.
- FIG. 2 is a diagram showing a configuration of a vapor deposition apparatus for producing a metal oxide film using water vapor.
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- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Electrodes Of Semiconductors (AREA)
- Formation Of Insulating Films (AREA)
Abstract
Description
Claims
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/592,876 US7595414B2 (en) | 2004-03-15 | 2005-03-15 | Metal complex compound comprising β-diketonato ligand |
| JP2006511046A JP4716193B2 (ja) | 2004-03-15 | 2005-03-15 | β−ジケトナトを配位子とする金属錯体 |
| CN2005800152658A CN1953953B (zh) | 2004-03-15 | 2005-03-15 | 包含β-酮酸基配体的金属络合物 |
| KR1020067021331A KR101144688B1 (ko) | 2004-03-15 | 2005-03-15 | β-디케토나토를 리간드로서 포함하는 금속 착물 |
Applications Claiming Priority (16)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004-072471 | 2004-03-15 | ||
| JP2004072471 | 2004-03-15 | ||
| JP2004-097670 | 2004-03-30 | ||
| JP2004097670 | 2004-03-30 | ||
| JP2004-111705 | 2004-04-06 | ||
| JP2004111705 | 2004-04-06 | ||
| JP2004180106 | 2004-06-17 | ||
| JP2004-180106 | 2004-06-17 | ||
| JP2004297245 | 2004-10-12 | ||
| JP2004-297245 | 2004-10-12 | ||
| JP2004328357 | 2004-11-12 | ||
| JP2004-328357 | 2004-11-12 | ||
| JP2005011264 | 2005-01-19 | ||
| JP2005-011264 | 2005-01-19 | ||
| JP2005-030220 | 2005-02-07 | ||
| JP2005030220 | 2005-02-07 |
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| WO2005087697A1 true WO2005087697A1 (ja) | 2005-09-22 |
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| PCT/JP2005/004577 Ceased WO2005087697A1 (ja) | 2004-03-15 | 2005-03-15 | β−ジケトナトを配位子とする金属錯体 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7595414B2 (ja) |
| JP (1) | JP4716193B2 (ja) |
| KR (1) | KR101144688B1 (ja) |
| CN (1) | CN1953953B (ja) |
| TW (1) | TW200535138A (ja) |
| WO (1) | WO2005087697A1 (ja) |
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| JP2005350423A (ja) * | 2004-06-14 | 2005-12-22 | Asahi Denka Kogyo Kk | 薄膜形成用原料及び薄膜の製造方法 |
| JP2007031283A (ja) * | 2004-07-16 | 2007-02-08 | Ube Ind Ltd | アルコキシアルキルメチル基を有するβ−ジケトナト及びアルコキシを配位子とする金属錯体及び当該金属錯体を用いた金属含有薄膜の製法 |
| WO2008013244A1 (en) | 2006-07-27 | 2008-01-31 | Ube Industries, Ltd. | Organoruthenium complex, and method for production of ruthenium thin film using the ruthenium complex |
| JP2008229412A (ja) * | 2007-03-16 | 2008-10-02 | Institute Of National Colleges Of Technology Japan | 酸化亜鉛微細結晶を接着した基板、およびその製造方法 |
| JP2009081431A (ja) * | 2007-09-03 | 2009-04-16 | Ulvac Japan Ltd | 半導体装置の製造方法 |
| JP2009081432A (ja) * | 2007-09-03 | 2009-04-16 | Ulvac Japan Ltd | 半導体装置の製造方法 |
| JP2011126843A (ja) * | 2009-12-21 | 2011-06-30 | Ube Industries Ltd | 有機銅錯体及び当該有機銅錯体を用いる銅含有薄膜の製造法 |
| US12435224B2 (en) | 2020-11-16 | 2025-10-07 | Autonetworks Technologies, Ltd. | Crosslinkable polymer composition, crosslinked polymer material, metal member, and wiring harness |
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| WO2013065806A1 (ja) | 2011-11-02 | 2013-05-10 | 宇部興産株式会社 | トリス(ジアルキルアミド)アルミニウム化合物及び当該アルミニウム化合物を用いるアルミニウム含有薄膜の製造方法 |
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- 2005-03-15 JP JP2006511046A patent/JP4716193B2/ja not_active Expired - Fee Related
- 2005-03-15 WO PCT/JP2005/004577 patent/WO2005087697A1/ja not_active Ceased
- 2005-03-15 US US10/592,876 patent/US7595414B2/en not_active Expired - Fee Related
- 2005-03-15 TW TW094108041A patent/TW200535138A/zh unknown
- 2005-03-15 KR KR1020067021331A patent/KR101144688B1/ko not_active Expired - Fee Related
- 2005-03-15 CN CN2005800152658A patent/CN1953953B/zh not_active Expired - Fee Related
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| WO2001048130A1 (fr) * | 1999-12-28 | 2001-07-05 | Alexandr Andreevich Panin | Composition lubrifiante et additif multifonctions |
| JP2002371359A (ja) * | 2001-06-14 | 2002-12-26 | Samsung Electronics Co Ltd | β−ジケトンの配位子を有する有機金属錯体を利用した原子層蒸着方法 |
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| WO2008013244A1 (en) | 2006-07-27 | 2008-01-31 | Ube Industries, Ltd. | Organoruthenium complex, and method for production of ruthenium thin film using the ruthenium complex |
| CN101516818B (zh) * | 2006-07-27 | 2013-08-14 | 宇部兴产株式会社 | 有机钌络合物以及使用该钌络合物的钌薄膜的制造方法 |
| JP2008229412A (ja) * | 2007-03-16 | 2008-10-02 | Institute Of National Colleges Of Technology Japan | 酸化亜鉛微細結晶を接着した基板、およびその製造方法 |
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| JP2009081432A (ja) * | 2007-09-03 | 2009-04-16 | Ulvac Japan Ltd | 半導体装置の製造方法 |
| JP2011126843A (ja) * | 2009-12-21 | 2011-06-30 | Ube Industries Ltd | 有機銅錯体及び当該有機銅錯体を用いる銅含有薄膜の製造法 |
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Also Published As
| Publication number | Publication date |
|---|---|
| CN1953953B (zh) | 2010-12-22 |
| JP4716193B2 (ja) | 2011-07-06 |
| CN1953953A (zh) | 2007-04-25 |
| TW200535138A (en) | 2005-11-01 |
| JPWO2005087697A1 (ja) | 2008-01-24 |
| US20080254216A1 (en) | 2008-10-16 |
| US7595414B2 (en) | 2009-09-29 |
| KR101144688B1 (ko) | 2012-05-29 |
| KR20060131988A (ko) | 2006-12-20 |
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