WO2005067065A1 - Licht emittierende halbleitervorrichtungen mit veränderbarer emissionswellenlänge - Google Patents
Licht emittierende halbleitervorrichtungen mit veränderbarer emissionswellenlänge Download PDFInfo
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- WO2005067065A1 WO2005067065A1 PCT/EP2004/014713 EP2004014713W WO2005067065A1 WO 2005067065 A1 WO2005067065 A1 WO 2005067065A1 EP 2004014713 W EP2004014713 W EP 2004014713W WO 2005067065 A1 WO2005067065 A1 WO 2005067065A1
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- semiconductor
- light
- current
- semiconductor device
- semiconductor region
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 171
- 239000000463 material Substances 0.000 claims abstract description 28
- 239000002800 charge carrier Substances 0.000 claims abstract description 17
- 238000000034 method Methods 0.000 claims description 11
- 239000002096 quantum dot Substances 0.000 claims description 6
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 20
- 229910005540 GaP Inorganic materials 0.000 description 18
- HZXMRANICFIONG-UHFFFAOYSA-N gallium phosphide Chemical compound [Ga]#P HZXMRANICFIONG-UHFFFAOYSA-N 0.000 description 18
- 230000007704 transition Effects 0.000 description 13
- 230000003595 spectral effect Effects 0.000 description 11
- 239000000758 substrate Substances 0.000 description 8
- 239000003086 colorant Substances 0.000 description 6
- 238000009736 wetting Methods 0.000 description 6
- 239000000203 mixture Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 239000002019 doping agent Substances 0.000 description 4
- 239000000654 additive Substances 0.000 description 3
- 230000000996 additive effect Effects 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 230000018109 developmental process Effects 0.000 description 3
- 238000000295 emission spectrum Methods 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 230000006798 recombination Effects 0.000 description 3
- 238000005215 recombination Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- RNQKDQAVIXDKAG-UHFFFAOYSA-N aluminum gallium Chemical compound [Al].[Ga] RNQKDQAVIXDKAG-UHFFFAOYSA-N 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 239000002178 crystalline material Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000010297 mechanical methods and process Methods 0.000 description 1
- 230000005226 mechanical processes and functions Effects 0.000 description 1
- 238000001208 nuclear magnetic resonance pulse sequence Methods 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/04—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
- H01L33/06—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction within the light emitting region, e.g. quantum confinement structure or tunnel barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Definitions
- the present invention relates to a light-emitting semiconductor device with a variable emission wavelength and a method for generating colored light with such a semiconductor device.
- LEDs light-emitting diodes
- GaP gallium phosphide
- LEDs LEDs
- GaP gallium phosphide
- a further area of application for semiconductor devices which emit in the visible spectral range with high light intensity is, for example, traffic lights in which bright red, green lights and yellow emitters are required. But not only in traffic and vehicle technology, but also in information transmission, semiconductor devices that provide a high light intensity in the visible spectral range are useful.
- the semiconductor device e.g. an LED
- the color of the emitted light would have to be adjusted, e.g. the number of necessary semiconductor devices or LEDs in display devices can be reduced since a separate semiconductor device or LED would no longer be necessary for each color.
- Another object of the present invention is to provide an improved display device.
- the first object is achieved by a semiconductor device according to claim 1, the second object by a display device according to claim 12 and the third object by a method according to claim 15.
- the dependent claims contain advantageous developments of the invention.
- the electrical behavior of a semiconductor material can be described with the so-called ribbon model.
- the charge carriers of the semiconductor material have different energy ranges, the so-called energy bands, within which they can essentially assume any energy values. Different bands are often separated from each other by a band gap, ie an energy range with energy values that the charge carriers cannot accept.
- a charge carrier changes from an energetically higher energy band to an energetically lower energy band, an energy is released which corresponds to the difference between the energy values of the charge carrier before and after the change, which is also referred to as "transition”.
- the differential energy can are released in the form of light quanta (photons).
- Negatively charged electrons and positively charged holes which can essentially be imagined as "missing" electrons in an energy band, are available as charge carriers in a semiconductor material.
- a hole can be formed by the transition of an electron from another energy band into the energy band The process of filling up is called recombination.
- dopants By introducing foreign substances, so-called dopants, into the semiconductor material, an overweight of electrons or holes can be generated as charge carriers. If the electron is overweight, the semiconductor material is called n-type or n-type, if there is an excess of holes as charge carriers as p-type or p-type, and the introduction of dopants can also be used to protect the charge types to influence accessible or available energy levels in the semiconductor material.
- a semiconductor device for emitting light when a voltage is applied
- a first semiconductor region the conductivity of which is based on charge carriers of a first conductivity type, for example electrons,
- a second semiconductor region the conductivity of which is based on charge carriers of a second conductivity type which have a charge opposite to the charge carriers of the first conductivity type, that is to say, for example, holes, and
- the semiconductor device according to the invention is assigned a switching device for directly or indirectly influencing the current flowing through the active semiconductor region, which is designed in such a way that at least between a current flow through the active semiconductor region with a current strength below a certain threshold current strength and a current flow through the active semiconductor region a current above the threshold current is switched back and forth.
- the quantum structures of the semiconductor device according to the invention are understood to mean structures which have a dimension in at least one direction of expansion which is so small that the properties of the structure are also determined by quantum mechanical processes.
- the configurations of the quantum structures include quantum dots, which represent quasi-zero-dimensional structures, quantum wires, which represent quasi-one-dimensional structures, and quantum wells, which represent quasi-two-dimensional structures , in question.
- a semiconductor device with a structure according to the invention can emit in two different wavelengths. Which wavelength is emitted can be influenced by means of the current intensity of the current flowing through the active region of the semiconductor device.
- the current intensity exceeds a certain threshold current intensity, light with the first wavelength, for example green light, is emitted; if it falls below the threshold current intensity, light with the second wavelength, i.e. red light for example, is emitted.
- a certain threshold current intensity light with the first wavelength, for example green light
- the second wavelength i.e. red light for example
- the semiconductor structure according to the invention for emitting light has a higher efficiency when emitting in the visible spectral range than light-emitting semiconductor structures according to the prior art. The reason for this is as follows:
- the semiconductor device according to the invention makes it possible to use a direct transition between two energy bands for emitting light in the visible spectral range.
- the direct transition takes place in the embedded quantum structures, the material of which is selected in such a way that it has a direct band gap.
- the efficiency of emitting light is higher in the case of a direct transition than in the case of an indirect transition, so that the efficiency of the semiconductor device according to the invention for emitting light when a voltage is applied is higher than that of prior art light-emitting semiconductor devices.
- the quantum structures make it possible to influence the size of the band gap used for the light emission in such a way that the emission takes place in the visible spectral range.
- quantum dots are selected as the first configuration of the quantum structures and a quantum well layer as the second configuration of the quantum structures.
- a structure can be produced with suitable materials using the so-called Stranski-Krastanov growth.
- Stranski-Krastanov growth a flat material layer forms at the beginning of the growth, which can be regarded as a quantum well structure if the growth conditions are chosen such that the flat material layer does not exceed a thickness of a few nanometers (nm), the Thickness is preferably in the range of about 0.1 to about 0.3 nm.
- the growth then turns into island growth, ie on the flat layer the newly added material forms hills (hereinafter referred to as islands), which can be viewed as quantum dots, if the growth conditions are selected such that the lateral dimensions of the islands are on average not more than approx. 50 nm and are preferably in the range from approx. 10 to approx. 30 nm.
- the Stranski-Krastanov growth can be integrated particularly easily into the manufacturing process of the semiconductor device according to the invention if the semiconductor regions are produced in the form of semiconductor layers of a layer stack.
- the first semiconductor region, the second semiconductor region and the active semiconductor region can each comprise Al x Ga ⁇ -x P (aluminum gallium phosphide) with 0 x x 1 1.
- the quantum structures can be produced from an III-V semiconductor material, that is to say a semiconductor material which comprises atoms of the third and fifth main groups of the periodic table and which has a lattice constant which is greater than that of GaP.
- the lattice constant can be regarded as a measure of how far apart the atoms are in a crystalline material in which the atoms are essentially arranged at the nodes of an imaginary lattice.
- the Ill-V semiconductor materials provide direct band gaps that can emit light in the visible spectral range if the dimensions of the quantum structures are selected appropriately.
- Particularly suitable as the Ill-V semiconductor material is indium phosphide (InP), whose lattice constant is approximately 7.7% greater than that of Al x Ga ⁇ _ x P, which essentially corresponds to the lattice constant of GaP.
- InP indium phosphide
- Al x Ga ⁇ _ x P which essentially corresponds to the lattice constant of GaP.
- the use of Al x Ga- ⁇ -x P makes it possible to produce the semiconductor device
- the semiconductor device according to the invention can in particular be designed as a light-emitting diode.
- the switching device assigned to the semiconductor device can be designed, in particular, for outputting current pulses with a pulse frequency that the human eye cannot resolve, and can include an adjusting device for setting the pulse frequency, the setting range preferably being selected such that all the pulse frequencies in the range are human Eye cannot be resolved.
- the intensity perceived by a viewer of the light emitted by the semiconductor device according to the invention can be adjusted with a constant pulse duration by the frequency of the current pulses. The lower the selected frequency, the less often the semiconductor device lights up within a certain period of time and the lower the perceived luminous intensity of the semiconductor device.
- the adjustability of the intensity perceived by a viewer is particularly important, for example, when the semiconductor device is in the two emission wavelengths are emitted with different intensities or the human eye is less sensitive to one of the wavelengths than to the other wavelength. Such differences can be compensated for with the adjustability of the perceived intensity.
- the switching device can comprise a setting device for setting the pulse duration.
- the intensity perceived by a viewer of the light emitted by the semiconductor device according to the invention can be set at a constant pulse frequency by the duration of the pulses. If both setting options are available, the adjustable range can be increased compared to only one setting option. When the lowest pulse frequency is reached, the intensity can be reduced further by reducing the pulse duration.
- the switching device is preferably designed in such a way that the current intensity output during a current pulse between two current pulses can be changed from a current intensity below the threshold current intensity to a current intensity above the threshold current intensity and vice versa.
- a change may be possible either after each current pulse or after a certain number of current pulses.
- This configuration makes it possible to emit the light emitted with the different wavelengths, ie light with different colors, in such a rapid change that an observer cannot resolve the differently colored light pulses.
- the semiconductor device appears to emit light for the viewer with a color which is an additive color mixture of the two colors of the alternately emitted light, hereinafter referred to as primary colors.
- the proportion of the primary colors in the color mixture can be determined by the length of the current pulses of one primary color in relation to the length of the current pulses of the other primary color and / or the number of successive current pulses for one primary color in relation to the number of successive current pulses for the other basic color can be set. For example, you get red and green Primary colors, as a result of the additive color mixing, the color yellow as a mixed color, the resulting yellow tone depending on the mixing ratio of the green and red light.
- the semiconductor device Since the wavelength of the light emitted by the semiconductor device depends only on the threshold current strength being exceeded or fallen short of, but not otherwise on the value of the current strength, the semiconductor device is particularly suitable for digitally controlling the device.
- the light of at least two different wavelengths is alternately emitted in pulsed form, the change in the wavelength of the emitted light taking place in such a rapid sequence that the human eye detects the Episode cannot resolve.
- the mixing ratio of the emitted wavelengths can be set either by setting the number of successive pulses of one wavelength in relation to the number of successive pulses of the other wavelength, or by setting the duration of the pulses of one wavelength in Ratio to the duration of the pulses of the other wavelength is set.
- a display device comprises a field-like arrangement of semiconductor devices according to the invention, in particular of light-emitting diodes according to the invention.
- the switching device can be designed to output its own switching signal for each semiconductor device in the field, so that one switching device is sufficient for all semiconductor devices of the field-like arrangement, or a separate switching device can be assigned to each semiconductor device.
- the display device according to the invention can be used, for example, to produce displays in which the number of lighting elements per pixel can be reduced, in particular when using light-emitting diodes.
- FIG. 1 schematically shows a layer stack realizing the semiconductor structure according to the invention.
- FIG. 2 shows a detail from the active semiconductor region of the semiconductor structure shown in FIG. 1.
- FIG. 4 shows a first pulse diagram for explaining the control of light emission.
- 5 shows a second pulse diagram for explaining the control of light emission.
- FIG. 6 shows a third pulse diagram for explaining the control of light emission.
- FIG. 7 shows a fourth pulse diagram for explaining the control of light emission.
- the layer stack comprises an n-doped first semiconductor layer 3, which forms a first semiconductor region, and a p-doped second semiconductor layer 5, which forms a second semiconductor region.
- the electrons of the n-doped first semiconductor layer 3 represent the charge carriers of the first conductivity type
- the holes of the p-doped second semiconductor layer 5 represent the charge carriers of the second Represent conductivity type.
- the quantum structure layers 7A-7C are arranged, which form the active semiconductor region of the LED.
- the quantum structure layers 7A-7C are undoped in the present exemplary embodiment, in alternative embodiments of the exemplary embodiment they can also have an n-doping or a p-doping.
- the substrate 1, the first semiconductor layer 3, the second semiconductor layer 5 and the contact layer 9 are designed as doped GaP layers.
- the substrate 1 and the first semiconductor layer 3 each contain silicon (Si) as the dopant, the Si concentration in the first semiconductor layer 3 corresponding to 5 ⁇ 10 17 cm "3.
- the second semiconductor layer 5 and the contact layer 9, on the other hand, contain beryllium (Be) as the dopant , namely in a concentration of 5x10 17 cm “3 (second semiconductor layer 5) or 1x10 19 cm " 3 (contact layer 9).
- the doping of the substrate 1, the first and second semiconductor layers 3, 5 and the Contact layer 9 can also be reversed
- the semiconductor structure according to the invention would then have a p-doped substrate, a p-doped first semiconductor layer 3, an n-doped second semiconductor layer 5 and an n-doped contact layer 9.
- the layer thicknesses are not shown to scale in FIG. 1. While the semiconductor layer 3 has a thickness of approximately 200 nm and the semiconductor layer 5 has a thickness of approximately 700 nm, the three quantum structure layers 7A-7C together have only a thickness of approximately 18 to 20 nm and the contact layer 9 has a layer thickness of approximately 10 nm.
- the quantum structure layer 7 comprises a GaP layer 11 with a thickness of approx. 3 nm, to which an InP wetting layer 15 (so-called wetting layer for Stranski-Krastanov growth) is applied, which covers the entire layer Surface of the GaP layer 11 covered and has a thickness between 0.1 and 0.3 nm.
- the InP wetting layer 15 represents a quantum well layer, it is the first configuration of the quantum structures arranged in the quantum structure layer 7.
- InP islands 13 are arranged on the InP wetting layer 15 as quantum dots, which represent the second configuration of the quantum structures.
- the InP islands 13 are embedded in a further GaP layer 14, which is also referred to as a GaP matrix.
- the thickness of the GaP matrix 14 is selected such that the InP islands 13 are still covered with GaP, but at most with approximately 1 nm GaP. Overall, the thickness of the GaP matrix is approximately 3 nm, so that the total thickness of the quantum structure layer 7 is approximately 6 to 6.3 nm.
- the average lateral dimensions of the InP islands 13 are approximately 50 nm.
- the average of the lateral dimensions is preferably in the range between 10 and 30 nm, and the covering of the GaP layer 11 by the InP (InP of the InP wetting layer 15 and the InP islands 13) is approximately 3.5 ML, ie the InP would suffice to cover the layer underneath with about 3.5 monatomic InP layers. Approx. 1 ML of the InP is applied to the wetting layer.
- three quantum structure layers 7A-7C are arranged between the first and the second semiconductor layers 3, 5. However, it is sufficient if such a quantum structure layer 7 is present. On the other hand, more than just three quantum structure layers can also be present. There are preferably three to five quantum structure layers.
- the first and second semiconductor layers 3, 5 form a light-emitting diode.
- electrons from the first semiconductor layer 3 and holes from the second semiconductor layer 5 enter the quantum structure layers 7A-7C at a voltage suitably applied between the contact layer 9 and the substrate 1 and generally referred to as forward voltage.
- a recombination of electrons and takes place in the quantum structure layers 7A-7C Holes instead, ie electrons fill the holes.
- this recombination represents a transition from an energetically higher energy band to an energetically lower energy band.
- the transition is a direct transition that essentially takes place in the quantum structures, ie in the InP. Due to the small dimensions of the InP quantum structures, the band gap in the InP is much larger than in a large-volume InP material, so that the wavelength of the light emitted during the direct transition lies in the visible spectral range.
- the substrate 1, the first semiconductor layer 3, the second semiconductor layer 5 and the contact layer 9 are described as GaP layers in the exemplary embodiment described, these layers can generally be formed as Al x Ga ⁇ -x P layers with 0 x x 1 1 , where the values for x can vary from layer to layer. Accordingly, the quantum structures need not be made from InP. Instead, they can be formed as In y Ga ⁇ -y P layers with 0 ⁇ y ⁇ 0.5, preferably with 0 ⁇ y ⁇ 0.1. Since Al x Ga- ⁇ -x P is transparent in the visible spectral range, the layer structure described can in particular also be used to produce LEDs which emit vertically, ie in the stacking direction.
- the wavelength of the emitted light can be influenced by the current intensity of the current flowing through the quantum structure layers 7A-7C.
- the semiconductor device With a forward voltage of 3V and a current of less than approx. 100 mA, the semiconductor device emits red light with a wavelength of approx. 725 nm, whereas with a current of more than approx. 100 mA it emits green light with a wavelength of approx 550 nm emitted (Fig. 3).
- Experimentally determined emission spectra of the semiconductor structure described are shown in FIG. 3 for a current of 15 mA and for a current of 120 mA.
- the emission spectrum of the semiconductor device has a maximum at approximately 725 nm at 15 mA and 3 V forward voltage, whereas it has a maximum at approximately 550 nm at 120 mA and 3 V forward voltage. In both cases, the intensity of the emitted light is very high due to the direct transition. The show a similar behavior
- a switching unit 20 is assigned to the semiconductor device, which in the present exemplary embodiment is designed as a digital circuit and which, as required, transmits a current with a current strength to the active region 7A-7C approx. 100 mA to or with a current below approx. 100 mA.
- the switching unit 20 can be controlled digitally via a control input 22 in order to switch between the two current strengths as required.
- the intensity of the light emitted by the semiconductor structure can be influenced by suitable control of the switching over of the current intensity. In this way, for example, differences in intensity of the two wavelengths emitted by the semiconductor structure can be compensated.
- the compensation can take place, for example, by continuously emitting at the wavelength at which the intensity is lower. If a switch is then made to the emission with the wavelength at which the intensity is higher, a switch is made to a pulsed emission. If the low intensity corresponds to approximately half of the high intensity, the pulses are selected such that a period of current flow is followed by an equally long period without current flow. Such a pulse sequence is shown in FIG. 4. In FIG.
- the high level H1 represents the current intensity that leads to the emission with the one wavelength
- the high level H2 represents the current intensity that leads to the emission with the other wavelength
- the low level L represents the current intensity with the value zero
- the emission can also be pulsed at both wavelengths, the pulses being related to one another in such a way that the Duration of current flow per unit of time for low-intensity emissions is correspondingly longer than the duration of current flow per unit of time for high-intensity emissions.
- the duration of the current flow per unit of time can be set either by the length of the current pulses (FIG. 5) or the frequency with which the current pulses occur per unit of time, ie the pulse frequency (FIG. 6). It is also possible to influence the duration of the current pulses by a combination of pulse frequency and pulse length.
- pulsed light is emitted, the emission of red light (level H1) alternating with the emission of green light (level H2).
- the change takes place at a frequency that is so high that the human eye cannot perceive the change. If the level H1 and the level H2 each have the same duration under the assumption made above, an observer perceives light whose color corresponds to an additive mixture of red and green light in a ratio of one to one. Such light is yellow in color.
- the ratio of the mixture can be influenced by the ratio of the pulse duration of level H1 to the pulse duration of level H2.
- the yellow light will not be generated by a one-to-one mixing ratio, but with a mixing ratio in which the green light has a greater proportion to compensate for the differences in the sensitivity of the human eye.
- This can be achieved, for example, by selecting the pulse duration for the emission of the green light to be longer than the pulse duration for the emission of the red light.
- the mixing ratio can also be influenced by using pulses of the same duration in each case, for example the pulses H1 which lead to the emission with one wavelength occur more frequently than the pulses H2 which lead to the emission with the other wavelength. A short phase without current flow through the semiconductor structure is then present between the individual pulses.
- the semiconductor device according to the invention is arranged in an array (field) and the individual semiconductor devices of the field are to be controlled individually, then with the aid of the semiconductor device a color display can be constructed in which the number of light-emitting elements can be reduced compared to the prior art, since, for example, red and green light can be generated with the same semiconductor device.
- superluminescent diodes or coherent light emitting light can be emitted with the semiconductor device according to the invention Laser diodes are manufactured.
- the basic structure of superluminescent diodes and laser diodes is, for example, the books “Spontaneous Emission and Laser Oscillation in Microcavities", Edit.
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Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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US10/584,882 US20070114538A1 (en) | 2004-01-08 | 2004-12-24 | Light-emitting semiconductor devices having variable emission wavelengths |
GB0613765A GB2425655B (en) | 2004-01-08 | 2004-12-24 | Light-Emitting Semiconductor Devices Having a Variable Emission Wavelength |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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DE102004001823.5 | 2004-01-08 | ||
DE102004001823A DE102004001823B3 (de) | 2004-01-08 | 2004-01-08 | Licht emittierende Halbleitervorrichtungen mit veränderbarer Emissionswellenlänge |
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WO2005067065A1 true WO2005067065A1 (de) | 2005-07-21 |
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PCT/EP2004/014713 WO2005067065A1 (de) | 2004-01-08 | 2004-12-24 | Licht emittierende halbleitervorrichtungen mit veränderbarer emissionswellenlänge |
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US (1) | US20070114538A1 (de) |
DE (1) | DE102004001823B3 (de) |
GB (1) | GB2425655B (de) |
WO (1) | WO2005067065A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2012095138A1 (de) * | 2011-01-13 | 2012-07-19 | Julius-Maximilians-Universität Würzburg | Halbleiter-schichtstruktur mit quantenpunkten, leuchtdiode und laserdiode |
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DE10347292A1 (de) * | 2003-10-02 | 2005-05-12 | Univ Berlin Humboldt | Halbleitervorrichtung zum Emittieren von Licht |
KR100931483B1 (ko) | 2009-03-06 | 2009-12-11 | 이정훈 | 발광소자 |
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DE69425383T2 (de) * | 1994-10-11 | 2001-02-15 | International Business Machines Corp., Armonk | Monoelektrische anordnung von lichtemittierenden dioden zur lichterzeugung mehrerer wellenlängen und deren anwendung für mehrfarben-anzeigevorrichtungen |
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- 2004-01-08 DE DE102004001823A patent/DE102004001823B3/de not_active Expired - Fee Related
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- 2004-12-24 GB GB0613765A patent/GB2425655B/en not_active Expired - Fee Related
- 2004-12-24 US US10/584,882 patent/US20070114538A1/en not_active Abandoned
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Cited By (1)
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WO2012095138A1 (de) * | 2011-01-13 | 2012-07-19 | Julius-Maximilians-Universität Würzburg | Halbleiter-schichtstruktur mit quantenpunkten, leuchtdiode und laserdiode |
Also Published As
Publication number | Publication date |
---|---|
GB2425655B (en) | 2008-07-16 |
US20070114538A1 (en) | 2007-05-24 |
GB0613765D0 (en) | 2006-08-23 |
GB2425655A (en) | 2006-11-01 |
DE102004001823B3 (de) | 2005-09-01 |
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