WO2005024766A1 - 表示パネルの変換データ決定方法および測定装置 - Google Patents

表示パネルの変換データ決定方法および測定装置 Download PDF

Info

Publication number
WO2005024766A1
WO2005024766A1 PCT/JP2004/013095 JP2004013095W WO2005024766A1 WO 2005024766 A1 WO2005024766 A1 WO 2005024766A1 JP 2004013095 W JP2004013095 W JP 2004013095W WO 2005024766 A1 WO2005024766 A1 WO 2005024766A1
Authority
WO
WIPO (PCT)
Prior art keywords
display panel
light emitting
measurement
capacitor
conversion data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2004/013095
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
Masaharu Goto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Priority to US10/558,911 priority Critical patent/US20060290618A1/en
Publication of WO2005024766A1 publication Critical patent/WO2005024766A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00Aspects of the constitution of display devices
    • G09G2300/08Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
    • G09G2300/0809Several active elements per pixel in active matrix panels
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00Control of display operating conditions
    • G09G2320/02Improving the quality of display appearance
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00Control of display operating conditions
    • G09G2320/02Improving the quality of display appearance
    • G09G2320/029Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel

Definitions

  • the present invention relates to a method of determining conversion data of a display panel, and more particularly to a method of determining luminance conversion data for correcting dispersion of luminance in a TFT array display panel having a self light emitting element, and a display device using the same.
  • the self light emitting element is a light emitting element that generates light according to the amount of current flowing through the element.
  • a TFT array used for a display panel using such a self light emitting element needs to flow a much larger current than a TFT array for a liquid crystal panel which is a typical flat display panel in the past.
  • a sufficient drive current can not often be obtained because the carrier mobility is low.
  • the charge voltage in the gate insulating film causes the threshold voltage of the FET to change over time, and the variation in luminance of each pixel becomes large.
  • a high driving current can be easily obtained because the carrier mobility is high, the aging is small, and a low temperature polysilicon film is often used.
  • the current-voltage characteristics of each FET fluctuate by almost 10% depending on the crystal quality of the FET channel region.
  • variations are likely to be widely dispersed between FETs within a short distance in the panel. That is, in a TFT array using a low temperature polysilicon film, the variation in luminance of each pixel at the time of manufacture is large.
  • the secular change of the light emission characteristics of the light emitting element itself can not be ignored.
  • the EL element uses an organic material, the degree of secular change is large depending on the operating conditions such as the operating temperature and the driving current. It is different. Such variations in light emission luminance cause defects in the display panel, such as image unevenness and color change.
  • a pixel selection transistor 1 3 1 for selecting a pixel such as the EL display panel 1 0 8 in FIG. 1
  • a drive transistor 1 for supplying a drive current according to the voltage of the capacitor 1 3 0 and the capacitor 1 3 0
  • the pixel 1 1 7 of the TFT array of the display panel constituted by 8 and self light emitting elements (EL elements) 1 5 light emission when the capacitor 1 3 0 is charged and after it is completely discharged
  • the capacitor of the measurement pixel must be completely discharged, that is, discharged to below the threshold voltage of the drive transistor, and then the next pixel must be measured.
  • a considerable amount of time is required between pixel measurements.
  • the steady state (the drive current becomes almost constant) from the start of application of the drive current. It takes time according to the time constant until it becomes. For this reason, if a large number of pixels such as a display panel are measured continuously, there is a problem that it takes a very long time.
  • a display panel in which a plurality of pixels having a capacitor, a drive circuit for controlling current or voltage by the voltage of the capacitor, and a self-light emitting element driven by the drive circuit are arranged in a matrix.
  • the first measurement step for determining the first drive current of the light emitting element of the display panel when there is not, the charging step for charging the capacitor of the measurement pixel to the ana- logue voltage, and the capacitor of the measurement pixel A second measurement step of measuring a second drive current of the light emitting element of the display panel when charging to the analog output voltage; A drive current calculation step of obtaining a drive current of the measurement pixel from a difference between the drive current and the second drive current, and a data calculation step of obtaining the conversion data based on the drive current.
  • the drive current of the light emitting element of the display panel is measured prior to the measurement of the measurement pixel, and the difference between the drive current of the display panel and the light emission element when the measurement pixel is driven is calculated.
  • the drive current of the pixel can be measured and the measurement can be performed. Can be measured at high speed.
  • the measurement before driving the light emitting element is performed for each predetermined pixel, and the current value before driving of the unmeasured pixel is obtained from the measurement result to obtain higher speed measurement. In this case, although there is a variation in the characteristics of each pixel, it is not possible to obtain an accurate pre-drive current value depending on the capturing interval, but an absolute variation becomes smaller according to the discharge amount. The effects of variability can be ignored.
  • the present invention provides a display panel having a TFT array and a self light emitting element, luminance signal generating means for converting luminance data to converted data to generate a luminance signal, and driving the self light emitting element by the luminance signal.
  • a method of determining conversion data of a display panel comprising: driving means; and measuring means for measuring either or both of a driving current and a light emission luminance of a light emitting element of the TFT array, comprising: The method further comprises the steps of: driving a light emitting element; performing the measurement before the driving current of the measurement pixel reaches a saturation state; and determining the conversion data based on a result of the measurement.
  • the above problem is solved by the method of determining conversion data of display panel. That is, the luminescence of the measurement pixel Even faster measurements can be made by performing measurement before the drive current or the drive current becomes saturated (the light emission luminance or the measurement current becomes a steady value when the device is driven).
  • FIG. 1 is an overall view of a measuring apparatus which is an embodiment of the present invention.
  • FIG. 2 is a diagram showing a measurement voice of the embodiment.
  • FIG. 3 is a view showing a modification of the measurement point.
  • FIG. 4 is an explanatory diagram of measured luminance.
  • FIG. 5 is a diagram showing a control method of the luminance sensor.
  • FIG. 6 is a diagram showing an equivalent circuit of the EL element.
  • FIG. 7 is a diagram showing conversion data of the luminance signal generation circuit.
  • FIG. 8 is a diagram showing a method of determining conversion data.
  • an EL element is used as a self light emitting element in this embodiment, the present invention is not limited to an EL display panel, and another self light emitting element such as a display device using a light emitting diode is used. It can also be used for display panels.
  • FIG. 1 shows a schematic configuration of a display device according to the present invention.
  • the display device comprises a control unit 100 of a panel and an EL display panel 108.
  • the control unit 100 is a pixel selection circuit 104 which is selection means connected to the shift register 1 0 9, 1 1 0 of the EL display panel 1 0 8, an external input of the luminance data and the EL display panel
  • a luminance signal generation circuit 102 connected to the luminance signal line 1 120 of the 1 0 8 and having conversion data for each pixel, an ammeter 1 0 1 which is a measuring means, and an ammeter 1 0 1 are common
  • a power source 103 which is a driving means connected to the line 1 1 9 and a data processor 1 0 5 which is connected to the ammeter 1 0 1 and has an information processing circuit and a memory and is a converted data determining means There is.
  • the luminance data 10 corresponding to the small luminance and the luminance corresponding to the large luminance 2 5 for each pixel has a conversion table in which conversion data corresponding to 0 is stored.
  • the EL display panel 108 includes a plurality of pixels 1 1 7 arranged in a matrix, data lines 1 1 1 and gate lines 1 1 6 for selecting pixels, data lines 1 1 1 and gate lines 1 It comprises shift registers 1 0 9 and 1 1 0 connected to 1 6 respectively.
  • the pixel 1 1 7 is a pixel selection transistor Q 1 1 3 1 connected to the data line 1 1 1 and the gate line 1 1 6, and a capacitor C 1 connected to the pixel selection transistor 1 3 1 and the common line 1 1 9.
  • a driving transistor Q 21 118 is connected to the driving element 130, the EL element 115, the capacitor 130, the pixel selection transistor 1 31, and the EL element 115.
  • a constant current circuit is used as the drive circuit, but a voltage control circuit may be used.
  • the pixel selection unit 104 outputs a pixel position signal according to an image signal (pixel position data and luminance data) input from the outside, and the shift registers 10 9 and 10 1 are pixels. Select the data line and gate line corresponding to the position. For example, if gate line 1 16 and data line 1 1 1 are selected, then pixel 1 1 7 at the intersection is selected.
  • the luminance signal generator circuit 102 calculates the luminance signal by calculating the analog voltage corresponding to the input luminance data from the converted data (luminance data 10 and luminance data 250) corresponding to each pixel.
  • the luminance signal of the luminance signal line 112 is supplied to the data line 111 selected by the pixel selection circuit 104.
  • the pixel select transistor 1 31 is turned on, and the capacitor 130 is charged by the luminance signal on the data line 11.
  • the pixel select transistor 1 3 1 is turned on.
  • the voltage is maintained by turning off the switch.
  • the voltage of the capacitor 130 controls the current of the drive transistor 118 which is a constant current circuit, and the drive current is applied to the EL element 115.
  • the EL element 115 emits light with a light emission amount corresponding to the current amount of the drive current.
  • the conversion values of luminance data 10 and luminance data 250 are used as the conversion data. It is possible to select which luminance data to use according to the numerical value range of the luminance data.
  • linear interpolation since linear interpolation is used for interpolation, it corresponds to the lower limit value and the upper limit value of the region where the drive current (proportional to the capacitor applied voltage) has linear characteristics with respect to luminance data as shown in FIG. It is desirable to select the luminance data to be used, but by using nonlinear correction It is also possible to use regions with non-linear characteristics.
  • a luminance signal of 0 V is applied to the luminance signal line 112, and the selection transistor 1 31 of each pixel is sequentially selected by the pixel selection circuit 104, and all the capacitors 1 of the EL display panel 10 8 3 Initialize 1).
  • the current flowing to the ammeter 101 is recorded in the memory of the data processor 105.
  • the measurement pixel 1 1 7 to be measured by the pixel selection circuit 1 0 4 is selected.
  • an analog voltage corresponding to the luminance data 10 is applied from the luminance signal generation circuit 102 to the luminance signal line 112.
  • the current flowing to the ammeter 101 is recorded in the memory of the data processor 105.
  • the driving current I m in 1 of the measurement pixel 1 17 can be obtained.
  • I mi ⁇ 1 is only 80% of the preset current value I min
  • the luminance signal generation circuit 102 applies 0 V to the luminance signal line 112 to discharge the capacitor 130. Since it takes time to discharge the capacitor 130 completely until the voltage of the capacitor 130 reaches the threshold voltage of the driving transistor 118, it takes time before discharging to the threshold voltage. Turn off the pixel selection transistor 1 3 1 of, and perform the same measurement on the next measurement pixel. At this time, a predetermined current continues to flow in the drive transistor 118 of the pixel 117 due to the residual potential of the capacitor 130 of the pixel 117.
  • the panel After the measurement of luminance data 10 for the pixels that need to be measured, initialize the panel. Then, measurement and conversion data determination on the luminance data 250 are performed in the same process. That is, as shown in FIG. 8, the driving current I ma 1 when the luminance signal corresponding to the luminance data 250 is applied to the capacitor 1 31 is determined and compared with a preset current value I min 1 Thus, the conversion value of the luminance data 250 of the luminance signal generation circuit 102 is corrected. Like this Thus, a pixel having the characteristic shown by the solid line in FIG. 8 can be corrected to a predetermined characteristic as shown by the broken line.
  • FIG. 2 shows the measurement point of the ammeter 101 in the present embodiment.
  • 401 ⁇ 402-403-404 is the current that flows to the ammeter 101 before the drive current is applied to the EL element of the measurement pixel
  • 41 1 ⁇ 412 ⁇ 413 ⁇ 414 is the state of driving the EL element of the measurement pixel. Is the drive current in the state.
  • the current flowing to the current meter 101 in the state before driving the EL element of the measurement pixel is It will increase gradually.
  • the amount of increase in current is not strictly constant, but it is only necessary to maintain sufficient measurement and correction accuracy for measurement for correction of variations in luminance and drive current. There is no practical problem even if the amount of current increase is regarded as constant. Therefore, in the display device of this embodiment, the current before measurement is measured for every several pixels without actually measuring the current before measurement, and linear interpolation is performed from the latest measured drive current to measure the current It has a mode to obtain the current before measurement. When this mode is selected, for example, after the drive current value 401 is measured, the measurement of the drive current flowing to the display panel 108 before driving the EL element of the measurement pixel is not performed until the measurement of the drive current value 404.
  • the drive current values 402 to 403 are interpolated and obtained from the measured values of the drive current values 401 to 404. In this manner, conversion data can be determined at higher speed by reducing the number of times of measurement of the current when the measurement pixel is not driven.
  • the variation of the driving current can be corrected by appropriately performing measurement not only at the time of device manufacture but also at the time of use. Therefore, it is not necessary to provide a variation correction means such as providing a self correction circuit such as a current mirror circuit for each pixel 107 of the display panel 108, so that the device configuration can be simplified and an inexpensive device can be provided. .
  • control unit 100 of this embodiment can be separated from the display device to be an independent measuring device.
  • the luminance signal generation circuit 102, the power supply 103, and the pixel selection circuit 104 used for normal display are used as display devices, and the luminance signal generation circuit 102, the power supply 103, and the pixel selection circuit 104 used for determination of converted data are measured.
  • Set in the bowl. Configuration of measuring instrument ⁇ Operation is the same as the correction mode described above. It is necessary to transmit the conversion data determined by force measurement to the luminance signal generation circuit built in the externally connected display device. Luminance signal of It is necessary to provide an output device in the raw circuit 102.
  • FIG. 5 is a diagram showing an outline of a luminance measuring device added to the display device of this embodiment.
  • a brightness detection circuit 1 connected to a brightness sensor 1 21 and a brightness sensor 1 2 1 scanning an EL display panel 1 0 8 and detecting brightness from an output signal from the sensor 1 2 1
  • Sensor control circuit 1 2 3 that controls the operation of 2 2 and sensor 1 2 1 is attached.
  • a light shielding means 120 is provided around the sensor 121 so that the sensor 121 can detect only light from pixels in the vicinity of the measurement pixel.
  • the sensor control circuit 1 2 3 moves the sensor 1 2 1 onto the measurement pixel. Then, before driving the measurement pixel 117, the luminance is measured and stored in the memory of the data processor 105. Next, the EL element 115 of the measurement pixel 117 is driven with a driving current corresponding to the luminance data 10 and the luminance data 250, and the luminance at the time of driving is measured. Correct conversion data. Then, discharge the capacitor 130 of the measurement pixel 117 and measure the next pixel sequentially before completely discharging.
  • the conversion data can be determined at high speed.
  • the drive current ⁇ emission brightness after a predetermined time from the start of the current application is proportional to the drive current 'emission brightness in the steady state.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Control Of El Displays (AREA)
  • Electroluminescent Light Sources (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
PCT/JP2004/013095 2003-09-05 2004-09-02 表示パネルの変換データ決定方法および測定装置 Ceased WO2005024766A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US10/558,911 US20060290618A1 (en) 2003-09-05 2004-09-02 Display panel conversion data deciding method and measuring apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003-314587 2003-09-05
JP2003314587A JP2005084260A (ja) 2003-09-05 2003-09-05 表示パネルの変換データ決定方法および測定装置

Publications (1)

Publication Number Publication Date
WO2005024766A1 true WO2005024766A1 (ja) 2005-03-17

Family

ID=34269810

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2004/013095 Ceased WO2005024766A1 (ja) 2003-09-05 2004-09-02 表示パネルの変換データ決定方法および測定装置

Country Status (6)

Country Link
US (1) US20060290618A1 (https=)
JP (1) JP2005084260A (https=)
KR (1) KR20060092208A (https=)
CN (1) CN1836269A (https=)
TW (1) TW200511203A (https=)
WO (1) WO2005024766A1 (https=)

Families Citing this family (76)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2443206A1 (en) 2003-09-23 2005-03-23 Ignis Innovation Inc. Amoled display backplanes - pixel driver circuits, array architecture, and external compensation
CA2472671A1 (en) 2004-06-29 2005-12-29 Ignis Innovation Inc. Voltage-programming scheme for current-driven amoled displays
US9799246B2 (en) 2011-05-20 2017-10-24 Ignis Innovation Inc. System and methods for extraction of threshold and mobility parameters in AMOLED displays
TWI402790B (zh) 2004-12-15 2013-07-21 Ignis Innovation Inc 用以程式化,校準及驅動一發光元件顯示器的方法及系統
US8599191B2 (en) 2011-05-20 2013-12-03 Ignis Innovation Inc. System and methods for extraction of threshold and mobility parameters in AMOLED displays
US20140111567A1 (en) 2005-04-12 2014-04-24 Ignis Innovation Inc. System and method for compensation of non-uniformities in light emitting device displays
US10013907B2 (en) 2004-12-15 2018-07-03 Ignis Innovation Inc. Method and system for programming, calibrating and/or compensating, and driving an LED display
US8576217B2 (en) 2011-05-20 2013-11-05 Ignis Innovation Inc. System and methods for extraction of threshold and mobility parameters in AMOLED displays
US10012678B2 (en) 2004-12-15 2018-07-03 Ignis Innovation Inc. Method and system for programming, calibrating and/or compensating, and driving an LED display
US9171500B2 (en) 2011-05-20 2015-10-27 Ignis Innovation Inc. System and methods for extraction of parasitic parameters in AMOLED displays
US9280933B2 (en) 2004-12-15 2016-03-08 Ignis Innovation Inc. System and methods for extraction of threshold and mobility parameters in AMOLED displays
US9275579B2 (en) 2004-12-15 2016-03-01 Ignis Innovation Inc. System and methods for extraction of threshold and mobility parameters in AMOLED displays
CA2496642A1 (en) 2005-02-10 2006-08-10 Ignis Innovation Inc. Fast settling time driving method for organic light-emitting diode (oled) displays based on current programming
EP1904995A4 (en) 2005-06-08 2011-01-05 Ignis Innovation Inc METHOD AND SYSTEM FOR CONTROLLING AN ILLUMINATING ELEMENT DISPLAY
US7404645B2 (en) * 2005-06-20 2008-07-29 Digital Display Innovations, Llc Image and light source modulation for a digital display system
CA2518276A1 (en) 2005-09-13 2007-03-13 Ignis Innovation Inc. Compensation technique for luminance degradation in electro-luminance devices
KR20090006198A (ko) 2006-04-19 2009-01-14 이그니스 이노베이션 인크. 능동형 디스플레이를 위한 안정적 구동 방식
JP2008032761A (ja) * 2006-07-26 2008-02-14 Eastman Kodak Co 表示装置における画素電流測定方法および表示装置
CA2556961A1 (en) 2006-08-15 2008-02-15 Ignis Innovation Inc. Oled compensation technique based on oled capacitance
US20080122759A1 (en) * 2006-11-28 2008-05-29 Levey Charles I Active matrix display compensating method
JP5095200B2 (ja) * 2006-12-22 2012-12-12 オンセミコンダクター・トレーディング・リミテッド エレクトロルミネッセンス表示装置及び表示パネルの駆動装置
KR101441390B1 (ko) 2008-02-26 2014-09-17 엘지디스플레이 주식회사 액정표시장치 및 이의 구동방법
CN101685593B (zh) * 2008-09-23 2013-07-17 统宝光电股份有限公司 显示面板对比值改善装置与方法以及图像显示系统
US9311859B2 (en) 2009-11-30 2016-04-12 Ignis Innovation Inc. Resetting cycle for aging compensation in AMOLED displays
US10319307B2 (en) 2009-06-16 2019-06-11 Ignis Innovation Inc. Display system with compensation techniques and/or shared level resources
CA2688870A1 (en) 2009-11-30 2011-05-30 Ignis Innovation Inc. Methode and techniques for improving display uniformity
US9384698B2 (en) 2009-11-30 2016-07-05 Ignis Innovation Inc. System and methods for aging compensation in AMOLED displays
CA2669367A1 (en) 2009-06-16 2010-12-16 Ignis Innovation Inc Compensation technique for color shift in displays
US8791930B2 (en) * 2009-09-30 2014-07-29 Innolux Corporation Device and method for improving contrast ratio of display panel and image display system
US10996258B2 (en) 2009-11-30 2021-05-04 Ignis Innovation Inc. Defect detection and correction of pixel circuits for AMOLED displays
US8803417B2 (en) 2009-12-01 2014-08-12 Ignis Innovation Inc. High resolution pixel architecture
CA2687631A1 (en) 2009-12-06 2011-06-06 Ignis Innovation Inc Low power driving scheme for display applications
US10163401B2 (en) 2010-02-04 2018-12-25 Ignis Innovation Inc. System and methods for extracting correlation curves for an organic light emitting device
US20140313111A1 (en) 2010-02-04 2014-10-23 Ignis Innovation Inc. System and methods for extracting correlation curves for an organic light emitting device
US10089921B2 (en) 2010-02-04 2018-10-02 Ignis Innovation Inc. System and methods for extracting correlation curves for an organic light emitting device
JP5443188B2 (ja) * 2010-02-04 2014-03-19 グローバル・オーエルイーディー・テクノロジー・リミテッド・ライアビリティ・カンパニー 表示装置
US9881532B2 (en) 2010-02-04 2018-01-30 Ignis Innovation Inc. System and method for extracting correlation curves for an organic light emitting device
US10176736B2 (en) 2010-02-04 2019-01-08 Ignis Innovation Inc. System and methods for extracting correlation curves for an organic light emitting device
CA2692097A1 (en) 2010-02-04 2011-08-04 Ignis Innovation Inc. Extracting correlation curves for light emitting device
CA2696778A1 (en) 2010-03-17 2011-09-17 Ignis Innovation Inc. Lifetime, uniformity, parameter extraction methods
US8907991B2 (en) 2010-12-02 2014-12-09 Ignis Innovation Inc. System and methods for thermal compensation in AMOLED displays
US9530349B2 (en) 2011-05-20 2016-12-27 Ignis Innovations Inc. Charged-based compensation and parameter extraction in AMOLED displays
US9466240B2 (en) 2011-05-26 2016-10-11 Ignis Innovation Inc. Adaptive feedback system for compensating for aging pixel areas with enhanced estimation speed
CN103562989B (zh) 2011-05-27 2016-12-14 伊格尼斯创新公司 用于amoled显示器的老化补偿的系统和方法
US10089924B2 (en) 2011-11-29 2018-10-02 Ignis Innovation Inc. Structural and low-frequency non-uniformity compensation
US9324268B2 (en) 2013-03-15 2016-04-26 Ignis Innovation Inc. Amoled displays with multiple readout circuits
US8937632B2 (en) 2012-02-03 2015-01-20 Ignis Innovation Inc. Driving system for active-matrix displays
KR101906422B1 (ko) * 2012-05-10 2018-10-10 엘지디스플레이 주식회사 화질처리방법과 이를 이용한 표시장치
US9747834B2 (en) 2012-05-11 2017-08-29 Ignis Innovation Inc. Pixel circuits including feedback capacitors and reset capacitors, and display systems therefore
US8922544B2 (en) 2012-05-23 2014-12-30 Ignis Innovation Inc. Display systems with compensation for line propagation delay
US9786223B2 (en) 2012-12-11 2017-10-10 Ignis Innovation Inc. Pixel circuits for AMOLED displays
US9336717B2 (en) 2012-12-11 2016-05-10 Ignis Innovation Inc. Pixel circuits for AMOLED displays
US9171504B2 (en) 2013-01-14 2015-10-27 Ignis Innovation Inc. Driving scheme for emissive displays providing compensation for driving transistor variations
US9830857B2 (en) 2013-01-14 2017-11-28 Ignis Innovation Inc. Cleaning common unwanted signals from pixel measurements in emissive displays
EP2779147B1 (en) 2013-03-14 2016-03-02 Ignis Innovation Inc. Re-interpolation with edge detection for extracting an aging pattern for AMOLED displays
KR102049089B1 (ko) * 2013-04-10 2019-11-27 삼성디스플레이 주식회사 표시 장치의 색 보상 장치 및 방법
DE112014002086T5 (de) 2013-04-22 2016-01-14 Ignis Innovation Inc. Prüfsystem für OLED-Anzeigebildschirme
CN107452314B (zh) 2013-08-12 2021-08-24 伊格尼斯创新公司 用于要被显示器显示的图像的补偿图像数据的方法和装置
US9741282B2 (en) 2013-12-06 2017-08-22 Ignis Innovation Inc. OLED display system and method
US9761170B2 (en) 2013-12-06 2017-09-12 Ignis Innovation Inc. Correction for localized phenomena in an image array
US9502653B2 (en) 2013-12-25 2016-11-22 Ignis Innovation Inc. Electrode contacts
DE102015206281A1 (de) 2014-04-08 2015-10-08 Ignis Innovation Inc. Anzeigesystem mit gemeinsam genutzten Niveauressourcen für tragbare Vorrichtungen
CA2879462A1 (en) 2015-01-23 2016-07-23 Ignis Innovation Inc. Compensation for color variation in emissive devices
CA2889870A1 (en) 2015-05-04 2016-11-04 Ignis Innovation Inc. Optical feedback system
CA2892714A1 (en) 2015-05-27 2016-11-27 Ignis Innovation Inc Memory bandwidth reduction in compensation system
CA2900170A1 (en) 2015-08-07 2017-02-07 Gholamreza Chaji Calibration of pixel based on improved reference values
US10490122B2 (en) 2016-02-29 2019-11-26 Samsung Display Co., Ltd. Display device
KR102666831B1 (ko) 2016-04-15 2024-05-21 삼성디스플레이 주식회사 표시 장치
KR102605283B1 (ko) 2016-06-30 2023-11-27 삼성디스플레이 주식회사 표시 장치
KR102613863B1 (ko) 2016-09-22 2023-12-18 삼성디스플레이 주식회사 표시 장치
KR102611958B1 (ko) 2016-09-23 2023-12-12 삼성디스플레이 주식회사 표시 장치
KR102559096B1 (ko) 2016-11-29 2023-07-26 삼성디스플레이 주식회사 표시 장치
KR102715304B1 (ko) 2016-11-29 2024-10-14 삼성디스플레이 주식회사 표시 장치
KR102793284B1 (ko) 2017-02-21 2025-04-10 삼성디스플레이 주식회사 표시 장치
KR102417989B1 (ko) 2017-05-23 2022-07-07 삼성디스플레이 주식회사 표시 장치
CN109256090B (zh) * 2018-11-16 2020-05-05 京东方科技集团股份有限公司 一种显示画面的调节方法、显示面板及显示装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002040074A (ja) * 2000-07-28 2002-02-06 Wintest Corp 有機elディスプレイの評価装置および評価方法
WO2003002957A2 (en) * 2001-06-28 2003-01-09 Candescent Technologies Corporation Methods and systems for measuring display attributes of a fed
JP2003195813A (ja) * 2001-09-07 2003-07-09 Semiconductor Energy Lab Co Ltd 発光装置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3887826B2 (ja) * 1997-03-12 2007-02-28 セイコーエプソン株式会社 表示装置及び電子機器
JPH10254410A (ja) * 1997-03-12 1998-09-25 Pioneer Electron Corp 有機エレクトロルミネッセンス表示装置及びその駆動方法
US6229508B1 (en) * 1997-09-29 2001-05-08 Sarnoff Corporation Active matrix light emitting diode pixel structure and concomitant method
US6034479A (en) * 1997-10-29 2000-03-07 Micron Technology, Inc. Single pixel tester for field emission displays
JP3381145B2 (ja) * 1998-12-24 2003-02-24 スタンレー電気株式会社 マトリックス駆動装置及びマトリックス駆動方法
US6498592B1 (en) * 1999-02-16 2002-12-24 Sarnoff Corp. Display tile structure using organic light emitting materials
JP3769463B2 (ja) * 2000-07-06 2006-04-26 株式会社日立製作所 表示装置、表示装置を備えた画像再生装置及びその駆動方法
TWI221268B (en) * 2001-09-07 2004-09-21 Semiconductor Energy Lab Light emitting device and method of driving the same
JP4052865B2 (ja) * 2001-09-28 2008-02-27 三洋電機株式会社 半導体装置及び表示装置
US7019719B2 (en) * 2001-10-19 2006-03-28 Clare Micronix Integrated Systems, Inc. Method and clamping apparatus for securing a minimum reference voltage in a video display boost regulator
JP2003150107A (ja) * 2001-11-09 2003-05-23 Sharp Corp 表示装置およびその駆動方法
US6911781B2 (en) * 2002-04-23 2005-06-28 Semiconductor Energy Laboratory Co., Ltd. Light emitting device and production system of the same
US6916221B2 (en) * 2002-11-18 2005-07-12 Eastman Kodak Company Determining defects in OLED devices
JP4211368B2 (ja) * 2002-11-25 2009-01-21 沖電気工業株式会社 表示駆動回路の試験方法
JP4571375B2 (ja) * 2003-02-19 2010-10-27 東北パイオニア株式会社 アクティブ駆動型発光表示装置およびその駆動制御方法
JP4838498B2 (ja) * 2003-05-21 2011-12-14 キヤノン株式会社 表示装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002040074A (ja) * 2000-07-28 2002-02-06 Wintest Corp 有機elディスプレイの評価装置および評価方法
WO2003002957A2 (en) * 2001-06-28 2003-01-09 Candescent Technologies Corporation Methods and systems for measuring display attributes of a fed
JP2003195813A (ja) * 2001-09-07 2003-07-09 Semiconductor Energy Lab Co Ltd 発光装置

Also Published As

Publication number Publication date
KR20060092208A (ko) 2006-08-22
CN1836269A (zh) 2006-09-20
TW200511203A (en) 2005-03-16
US20060290618A1 (en) 2006-12-28
JP2005084260A (ja) 2005-03-31

Similar Documents

Publication Publication Date Title
WO2005024766A1 (ja) 表示パネルの変換データ決定方法および測定装置
CN109166526B (zh) 一种温度补偿方法及装置、显示装置
RU2726875C1 (ru) Устройство калибровки для субпиксельной схемы oled, схема возбуждения электрода истока и способ компенсации напряжения данных
JP5738910B2 (ja) 表示装置、電子装置及び駆動方法
CN101483031B (zh) 有机el显示装置
US7696965B2 (en) Method and apparatus for compensating aging of OLED display
JP5296700B2 (ja) 駆動トランジスタにおける閾値電圧の変化を補償する方法、oledデバイス用駆動トランジスタの閾値電圧の変化を補償する方法、駆動トランジスタおよびoledデバイスの劣化を補償する方法及びoled駆動回路における変化を補償する方法
EP2033178B1 (en) Active matrix display compensating apparatus
CN101595518B (zh) 有源矩阵显示器的补偿方法
KR20180127961A (ko) 데이터 전압 보상 방법, 디스플레이 구동 방법 및 디스플레이 장치
US11087687B2 (en) Display device and driving method for the same
CN113409734B (zh) 显示装置及其驱动方法
JP4534052B2 (ja) 有機el基板の検査方法
KR20100089112A (ko) 액티브·매트릭스형 표시장치
CN107025884A (zh) Oled像素补偿方法、补偿装置及显示装置
CN114664260B (zh) 有机发光显示装置
EP2531994B1 (en) Display device
US7486100B2 (en) Active matrix panel inspection device and inspection method
CN101968947A (zh) 显示器系统及其消除显示器亮度不均匀的方法
CN110710195B (zh) 图像显示装置及其控制方法
US20050104830A1 (en) Method and device for measuring drive current of thin film transistor array
CN110596983B (zh) 显示装置
JP2003042896A (ja) ディスプレイ検査装置、ディスプレイの検査方法、寄生容量の検査方法
KR20090043167A (ko) 액정표시장치 및 이의 구동방법
JP2004294093A (ja) 半導体集積回路及びその検査方法

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200480023199.4

Country of ref document: CN

AK Designated states

Kind code of ref document: A1

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A1

Designated state(s): BW GH GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
WWE Wipo information: entry into national phase

Ref document number: 2006290618

Country of ref document: US

Ref document number: 10558911

Country of ref document: US

WWE Wipo information: entry into national phase

Ref document number: 1020067004530

Country of ref document: KR

122 Ep: pct application non-entry in european phase
WWP Wipo information: published in national office

Ref document number: 10558911

Country of ref document: US