WO2004075401A1 - System and method for reducing transfer function ripple in a logarithmic rms-to-dc converter - Google Patents

System and method for reducing transfer function ripple in a logarithmic rms-to-dc converter Download PDF

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Publication number
WO2004075401A1
WO2004075401A1 PCT/US2004/003697 US2004003697W WO2004075401A1 WO 2004075401 A1 WO2004075401 A1 WO 2004075401A1 US 2004003697 W US2004003697 W US 2004003697W WO 2004075401 A1 WO2004075401 A1 WO 2004075401A1
Authority
WO
WIPO (PCT)
Prior art keywords
signal
rms
output signal
component
converter system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2004/003697
Other languages
English (en)
French (fr)
Inventor
Eamon Nash
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Analog Devices Inc
Original Assignee
Analog Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analog Devices Inc filed Critical Analog Devices Inc
Priority to EP04709417A priority Critical patent/EP1595331B1/en
Priority to DE602004010237T priority patent/DE602004010237T2/de
Priority to JP2005518289A priority patent/JP4185527B2/ja
Priority to CN2004800016061A priority patent/CN1717865B/zh
Publication of WO2004075401A1 publication Critical patent/WO2004075401A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/02—Measuring effective values, i.e. root-mean-square values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/22—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of AC into DC
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03G—CONTROL OF AMPLIFICATION
    • H03G3/00—Gain control in amplifiers or frequency changers
    • H03G3/20—Automatic control
    • H03G3/30—Automatic control in amplifiers having semiconductor devices
    • H03G3/3036—Automatic control in amplifiers having semiconductor devices in high-frequency amplifiers or in frequency-changers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03G—CONTROL OF AMPLIFICATION
    • H03G3/00—Gain control in amplifiers or frequency changers
    • H03G3/20—Automatic control
    • H03G3/30—Automatic control in amplifiers having semiconductor devices
    • H03G3/3036—Automatic control in amplifiers having semiconductor devices in high-frequency amplifiers or in frequency-changers
    • H03G3/3042—Automatic control in amplifiers having semiconductor devices in high-frequency amplifiers or in frequency-changers in modulators, frequency-changers, transmitters or power amplifiers

Definitions

  • Attenuation levels that fall between tap points require that adjacent trans- conductance stages be active simultaneously, in order to produce a weighted average of these tap points according to which the trans-conductance cell is further directed to conduct current.
  • the manner in which the conductance of adjacent stages changes, in order to slide the tap point along the attenuator, is responsible for the ripple observed in the conformance curves.
  • the squaring cell in the low-range RMS-to-DC converter produces a component at DC along with a component at twice the input frequency.
  • the noise level at the output of the error amplifier is set to a level of at least 300 mVpp, 300 mV being the distance in dB between adjacent taps on the R-2R ladder of the VGA times the gain control slope of the VGA (i.e., 50 mV/dB times 6 dB). As long as this output noise level is at least 300 mVpp, its actual value is not critical.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Control Of Amplification And Gain Control (AREA)
  • Amplifiers (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Transmitters (AREA)
PCT/US2004/003697 2003-02-14 2004-02-09 System and method for reducing transfer function ripple in a logarithmic rms-to-dc converter Ceased WO2004075401A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP04709417A EP1595331B1 (en) 2003-02-14 2004-02-09 System and method for reducing transfer function ripple in a logarithmic rms-to-dc converter
DE602004010237T DE602004010237T2 (de) 2003-02-14 2004-02-09 System und verfahren zur verringerung der übertragungsfunktionswelligkeit in einem logarithmischen rms-zu-gleichstrom-wandler
JP2005518289A JP4185527B2 (ja) 2003-02-14 2004-02-09 対数ｒｍｓ／ｄｃコンバータにおける伝達関数リプルを低減するシステム及び方法
CN2004800016061A CN1717865B (zh) 2003-02-14 2004-02-09 减少对数rms至dc转换器的转移函数波纹的系统和方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US44757103P 2003-02-14 2003-02-14
US60/447,571 2003-02-14

Publications (1)

Publication Number Publication Date
WO2004075401A1 true WO2004075401A1 (en) 2004-09-02

Family

ID=32908463

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/003697 Ceased WO2004075401A1 (en) 2003-02-14 2004-02-09 System and method for reducing transfer function ripple in a logarithmic rms-to-dc converter

Country Status (6)

Country Link
US (1) US7106604B2 (enExample)
EP (1) EP1595331B1 (enExample)
JP (1) JP4185527B2 (enExample)
CN (1) CN1717865B (enExample)
DE (1) DE602004010237T2 (enExample)
WO (1) WO2004075401A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009142903A3 (en) * 2008-05-19 2010-03-04 Maxim Integrated Products, Inc. Rms detector with automatic gain control
CN1909428B (zh) * 2005-08-04 2010-06-09 中兴通讯股份有限公司 增强数据速率的gsm演进系统中驻波比告警检测装置

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7697909B2 (en) * 2004-09-01 2010-04-13 National Semiconductor Corporation Extended range RMS-DC converter
US8130821B2 (en) * 2006-05-18 2012-03-06 Oracle America, Inc. Equalization in capacitively coupled communication links
US7342431B2 (en) * 2006-07-27 2008-03-11 Linear Technology Corporation Low power wide dynamic range RMS-to-DC converter
US7660685B2 (en) * 2006-08-02 2010-02-09 Lecroy Corporation Virtual probing
US7545303B1 (en) * 2008-03-14 2009-06-09 National Semiconductor Corporation Sigma-delta difference-of-squares RMS-to-DC converter with forward and feedback paths signal squaring
US8060040B2 (en) * 2008-08-18 2011-11-15 Telefonaktiebolaget Lm Ericsson (Publ) True root-mean-square detection with a sub-threshold transistor bridge circuit
US9625498B2 (en) 2010-09-17 2017-04-18 Hittite Microwave Llc RMS and envelope detector
US8665127B2 (en) 2010-12-08 2014-03-04 National Semiconductor Corporation Σ-Δ difference-of-squares RMS to DC converter with multiple feedback paths
US8665128B2 (en) 2010-12-08 2014-03-04 National Semiconductor Corporation Sigma-delta difference-of-squares log-RMS to DC converter with forward path multiplier and chopper stabilization
US8665126B2 (en) 2010-12-08 2014-03-04 National Semiconductor Corporation ΣΔ difference-of-squares LOG-RMS to DC converter with forward and feedback paths signal squaring
US8698544B2 (en) 2012-03-12 2014-04-15 Analog Devices, Inc. Dynamic improvement in RMS to DC converters
CN107612518B (zh) * 2017-08-20 2020-09-15 西安电子科技大学 低压自调制可变增益放大器电路及混合集成电路
US10768211B2 (en) 2017-08-25 2020-09-08 Oracle International Corporation System and method for current sense resistor compensation
WO2019092814A1 (ja) * 2017-11-08 2019-05-16 三菱電機株式会社 可変利得増幅器

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3918003A (en) * 1974-10-29 1975-11-04 Bell Telephone Labor Inc Combined feedback and feedforward automatic gain control
US5724003A (en) * 1995-12-29 1998-03-03 Maxim Integrated Products, Inc. Methods and apparatus for signal amplitude control systems

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5126686A (en) * 1989-08-15 1992-06-30 Astec International, Ltd. RF amplifier system having multiple selectable power output levels
JP2776071B2 (ja) * 1991-07-19 1998-07-16 松下電器産業株式会社 送信出力包絡線検波回路および線形送信回路
US6348781B1 (en) * 2000-12-11 2002-02-19 Motorola, Inc. Buck or boost power converter
JP3942013B2 (ja) * 2002-01-28 2007-07-11 株式会社ルネサステクノロジ 通信用半導体集積回路および無線通信装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3918003A (en) * 1974-10-29 1975-11-04 Bell Telephone Labor Inc Combined feedback and feedforward automatic gain control
US5724003A (en) * 1995-12-29 1998-03-03 Maxim Integrated Products, Inc. Methods and apparatus for signal amplitude control systems

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1909428B (zh) * 2005-08-04 2010-06-09 中兴通讯股份有限公司 增强数据速率的gsm演进系统中驻波比告警检测装置
WO2009142903A3 (en) * 2008-05-19 2010-03-04 Maxim Integrated Products, Inc. Rms detector with automatic gain control
US7994840B2 (en) 2008-05-19 2011-08-09 Maxim Integrated Products, Inc. RMS detector with automatic gain control
US8358166B2 (en) 2008-05-19 2013-01-22 Maxim Integrated Products, Inc. RMS detector with automatic gain control

Also Published As

Publication number Publication date
DE602004010237T2 (de) 2008-10-02
JP2006514810A (ja) 2006-05-11
US7106604B2 (en) 2006-09-12
EP1595331B1 (en) 2007-11-21
CN1717865B (zh) 2010-05-12
US20040223349A1 (en) 2004-11-11
DE602004010237D1 (de) 2008-01-03
CN1717865A (zh) 2006-01-04
JP4185527B2 (ja) 2008-11-26
EP1595331A1 (en) 2005-11-16

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