WO2004059988A1 - 画素欠陥検出補正装置及び画素欠陥検出補正方法 - Google Patents
画素欠陥検出補正装置及び画素欠陥検出補正方法 Download PDFInfo
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- 230000007547 defect Effects 0.000 title claims abstract description 314
- 238000000034 method Methods 0.000 title claims abstract description 39
- 230000002950 deficient Effects 0.000 claims abstract description 59
- 238000001514 detection method Methods 0.000 claims description 208
- 238000004364 calculation method Methods 0.000 claims description 86
- 238000012545 processing Methods 0.000 claims description 57
- 238000012937 correction Methods 0.000 claims description 49
- 238000003384 imaging method Methods 0.000 claims description 22
- 230000015556 catabolic process Effects 0.000 claims description 4
- 238000006731 degradation reaction Methods 0.000 claims description 4
- 230000003111 delayed effect Effects 0.000 abstract 1
- 238000004891 communication Methods 0.000 description 14
- 230000015654 memory Effects 0.000 description 8
- 230000000295 complement effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
- H04N25/683—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects by defect estimation performed on the scene signal, e.g. real time or on the fly detection
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/10—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
- H04N23/12—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths with one sensor only
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/80—Camera processing pipelines; Components thereof
- H04N23/84—Camera processing pipelines; Components thereof for processing colour signals
- H04N23/843—Demosaicing, e.g. interpolating colour pixel values
Definitions
- Pixel defect detection and correction apparatus and pixel defect detection and correction method
- the present invention relates to, for example, a pixel defect detection and correction device and a pixel defect detection and correction method.
- Pixel defects in solid-state image sensors always add a fixed amount of charge to normal signals (derived from crystal defects in CCD (Charge Couled Device)).
- the signal level is reduced by the ratio (due to scratches on the CCD on-chip lens, etc.), or the signal level is always 0 or less (due to the opening of the photodiode of the CCD). No. Since these pixel defects become point-like scratches at the time of imaging and cause deterioration of image quality, various means for realizing defect detection and correction by signal processing have been proposed.
- a pixel defect detection and correction device for an image sensor disclosed in the past detects a pixel defect during adjustment, stores the position in a storage device such as a register, refers to the position at the time of imaging, and determines a target pixel.
- a storage device such as a register
- an interpolation value is calculated from the data of the neighboring pixels, and interpolation is performed by replacing the interpolation value with the defective pixel data.
- Patent Document '1 discloses that, in paragraph number [01.8], the number of defects to be corrected for an image sensor is determined at the same time as the detection of pixel defects and the detection of defects during imaging.
- the threshold value of the level comparison related to defect detection is variably set according to the number of defective pixels so that it falls within the range.
- the position information of the defective pixel and the defective pixel in the frame before the current frame are also defective. If detected as It is disclosed that the number of detected frames and information indicating whether or not a defective pixel has been captured in the immediately preceding frame are stored in one storage unit.
- Patent Document 2 also discloses that the [configuration] of the abstract describes the level of a first pixel signal from a first pixel and a second pixel signal from a second pixel around the first pixel of the solid-state imaging device.
- a level difference detection circuit for detecting a level difference
- a comparator for comparing an output signal of the level difference detection circuit with a predetermined threshold value
- a plurality of comparison results of the comparator There is disclosed a memory having memory for fields, and determining a defective pixel based on information stored in the memory.
- Patent Document 3 discloses a system controller that detects a defective pixel that outputs a signal of a specific level from each pixel of a CCD element based on the output signal of the CCD element in the [Configuration] of the abstract.
- a switch, a detection pre-processing circuit, a detection circuit, and a register for storing position data of a defective pixel detected by the switch, and erasing the position data stored in the register are disclosed.
- Patent Document 4 discloses that when performing a defect inspection in the [Configuration] of the abstract, defective pixels are compared by comparing the imaging output level of the CCD solid-state imaging device with a predetermined detection level using a comparator. The number of detected defective pixels is counted by a counter, and when the number of detected pixels exceeds the allowable number for storage, the detection level setting circuit sets the comparator detection level higher than before. It discloses that this reduces the sensitivity of defect detection and repeats re-inspection until the number of defective pixels falls within the allowable range.
- Patent Document 2 (Patent Document 2) ''
- Patent Document 3 Japanese Patent Application Laid-Open No. 6_2 8 4 3 4 6 (Patent Document 3)
- Patent Document 4 Patent Document 4
- the number of defective pixels that can be corrected is limited by the capacity of the storage device, and it is necessary to increase the capacity of the storage device in order to increase the number of pixels that can be corrected.
- the gate size of the detection circuit is increased.
- Patent Document 1 the position information of a defective pixel, the number of detected frames when a defective pixel is detected as a defective pixel in a frame earlier than the current frame, and the position of the defective pixel immediately before the defective pixel are detected.
- the number of defective pixels that can be corrected is limited by the capacity of the recording unit, and in order to increase the number of pixels that can be corrected, There was a disadvantage that it was necessary to increase the capacity of the storage means.
- Patent Document 2 the result of detecting a defective pixel by detecting a level difference between one pixel of an image sensor and a second pixel around the pixel and comparing the level difference with a threshold value is determined in advance. Since it is stored in the memory, the number of defective pixels that can be corrected is limited by the capacity of the memory, and there is a disadvantage that the memory capacity must be increased to increase the number of correctable pixels.
- Patent Document 3 the pixel corresponding to the position data stored in the storage unit is detected by the defective pixel detection unit over a predetermined number of times. Since the position data is erased from the storage means when no consecutive defective pixels are detected, the influence of the conditions at the time of detection including temperature etc. is eliminated, but the number of defective pixels that can be corrected is determined by the recording means. The capacity is limited, and there is a disadvantage that the capacity of the storage means must be increased in order to increase the number of correctable pixels.
- the number of defective pixels is counted, and when the number of powers exceeds the allowable number of memories, the detection sensitivity is increased by increasing the level comparison threshold in the defect detection means.
- the number of correctable pixels is limited to the capacity of the recording means, and it is necessary to increase the capacity of the storage means to increase the number of correctable pixels There was an inconvenience. Therefore, the present invention has been made in view of such a point, and the number of correctable defective pixels is not limited by the capacity of the printing apparatus, and cannot be detected at the time of adjustment due to a change in operating temperature or the like. It is an object of the present invention to provide a pixel defect detection / correction apparatus and a pixel defect detection / correction method capable of sufficiently detecting and correcting late defects.
- a pixel defect detection and correction device includes: a color difference and luminance calculation unit that calculates absolute value of color difference, color difference and luminance data of adjacent pixels and defect determination target pixels required for defect detection, and data for an interpolation value calculation target pixel.
- Is the defect detection method A defect discriminating and interpolating means for executing interpolation processing by replacing the corresponding interpolation value and the conventional data of the pixel, and a final output of the pixel determined as a defect obtained by the defect discriminating and interpolating means.
- Use to select a value Equipped with a capture value selection means which constantly detects and corrects pixel defects during imaging, and uses the optimal combination of multiple defect detection methods and interpolation methods to determine the pixel defects of image data. It detects and corrects.
- the chrominance and luminance calculating means calculates the absolute value of chrominance, chrominance and luminance data, and interpolation value calculation target pixel required for the adjacent pixel and the defect determination target pixel required for defect detection.
- the various data maximum and minimum value detecting means detects the maximum value and the minimum value of various data from the values calculated by the color difference and luminance calculating means.
- the color difference interpolation value calculation means obtains a color difference capture value of the defect determination target pixel for the interpolation value calculation target pixel.
- the brightness interpolation value calculation means obtains a brightness interpolation value of the defect determination target pixel for the interpolation value calculation target pixel.
- the defect discrimination and interpolation processing means detects each defect using a plurality of defect detection methods based on the data from the various data maximum and minimum value detection means, color difference capture value calculation means, and luminance interpolation value calculation means.
- the defect determination is performed on the defect determination target pixel at the same time, and if it is determined that the pixel is defective, the interpolation processing is executed by replacing the interpolation value according to the defect detection method with the conventional data of the pixel. I do.
- the use intercept value selection means selects the final output value of the pixel determined as a defect obtained by the defect determination and interpolation processing means'. According to the present invention, pixel defects are always detected and corrected during imaging, and pixel defects in image data are detected and corrected by the optimal combination of a plurality of defect detection methods and interpolation methods. .
- the pixel defect detection and correction method is a method for calculating the absolute value, color difference and luminance data of adjacent pixels required for defect detection and a pixel for defect determination, color difference and luminance data, and data for an interpolation value calculation target pixel.
- a plurality of defect detection methods are used to simultaneously determine the defect of the defect determination target pixel for each defect detection method. If it is determined that the pixel is defective, an interpolation value according to the defect detection method and a defect determination and interpolation processing step of executing the interpolation processing by replacing the conventional data of the pixel;
- a use interpolation value selection step for selecting the final output value of a pixel determined as a defect obtained in the determination and interpolation processing step based on priority, and detecting and detecting a pixel defect at all times during imaging. It performs correction and detects and corrects pixel defects in image data by the optimal combination of multiple defect detection methods and interpolation methods. Therefore, according to the present invention, the following operations are performed.
- the color difference and luminance calculation step the absolute value of the color difference between the adjacent pixel and the defect determination target pixel, the color difference and the luminance data, and the data for the interpolated value calculation target pixel required for defect detection are calculated.
- the various data maximum and minimum value detection steps detect the maximum and minimum values of various data from the values calculated in the color difference and luminance calculation steps.
- the color difference interpolation value calculation step obtains the color difference capture value of the defect determination target pixel for the interpolation value calculation target pixel.
- the luminance interpolation value calculation step obtains a luminance interpolation value of the defect determination target pixel for the interpolation value calculation target pixel.
- the defect determination and interpolation processing steps are based on the data from the various data maximum and minimum value detection steps, the color difference interpolation value calculation step, and the luminance interpolation value calculation step. Against At this time, defect determination is performed on the pixel for defect determination, and when the pixel is determined to be defective, the interpolation processing is executed by replacing the interpolation value according to the defect detection method with the conventional data of the pixel.
- the use interval value selection step selects the final output value of the pixel determined as a defect obtained in the defect determination and capture processing step based on the priority. According to the present invention, pixel defects are always detected and corrected during imaging, and pixel defects in image data are detected and corrected by an optimal combination of a plurality of defect detection methods and interpolation methods. . BRIEF DESCRIPTION OF THE FIGURES
- FIG. 1 is a diagram showing a configuration of a defect detection and correction control block applied to the present embodiment.
- Figure 2 shows the defect detection method and the pixels to be detected.
- Figure 2A shows the absolute color difference comparison between adjacent 8 pixels
- Figure 2B shows the comparison between 8 adjacent pixels
- Figure 2C shows the comparison between the nearest 8 pixels. . '
- FIG. 3 is a diagram showing interpolation value calculation target pixels.
- Figure '4 is a flowchart showing the operation of the used interpolation value selection block.
- FIG. 1 schematically shows a basic configuration of a defect detection and correction control program applied to an embodiment of the present invention.
- the pixel defect detection and interpolation control block 1 which is the center of the embodiment of the present invention includes a CCD 2 which supplies an image input signal I including a pixel defect via an input terminal 4 and the like. It is located between an image block and a camera signal processing block for generating a luminance signal and a color signal for supplying an image output signal O including data corrected via the output terminal 5.
- the defect detection and correction control block 1 applied to the embodiment of the present invention is used for detecting the absolute value of the color difference, the color difference and the luminance data, and the interpolation value calculation target pixel of the adjacent pixel and the defect determination target pixel required for the defect detection. It has a color difference and luminance calculation block (112) for calculating data.
- the defect detection and correction control block 1 detects the maximum value and the minimum value of various data from the values calculated by the color difference and luminance calculation means, and detects the maximum value and the minimum value of various data. 3).
- the defect detection and correction control block 1 has a color difference interpolation value calculation block (1-4) for obtaining a color difference interpolation value of a pixel to be subjected to defect determination with respect to the interpolation value calculation target pixel. It is composed.
- the defect detection and correction control block 1 has a luminance interpolation value calculation block (1_5) for obtaining a luminance interpolation value of the defect determination target pixel with respect to the intercept value calculation target pixel. It is composed.
- the defect detection and correction control block 1 is composed of various data maximum and minimum value detection blocks (113), color difference capture value calculation blocks (1_4), and luminance interpolation value calculation blocks. Based on the data from the block (1_5), multiple defect detection methods were used to simultaneously determine the defect of the defect determination target pixel for each defect detection method and determined that the pixel was defective.
- the image processing apparatus is provided with a defect determination and interception processing block (116) for executing interpolation processing by replacing the interpolation value and the conventional data of the pixel according to the defect detection method.
- the defect detection and correction control program 1 consists of the pixels determined as defects obtained by the defect determination and interpolation processing block (1-6). And a use intercept value selection block (1-7) for selecting the final output value.
- the defect detection and correction control block 1 detects and corrects pixel defects at all times during imaging, and uses the optimal combination of multiple defect detection methods and capture methods to determine the pixel data of the image data. It is configured to detect and correct defects.
- defect detection and correction control block 1 is a delay generation block (1-1) that performs delay processing on an image input signal for processing of each pixel in each subsequent block. It is configured to have.
- the defect detection and detection control program 1 configured as described above and applied to the embodiment of the present invention operates as follows.
- Complementary color signals can be obtained by optimizing the calculation method of the color difference and luminance calculation block (1-2), the color difference interpolation value calculation block (1-4), and the luminance interpolation value calculation block (115).
- the present invention can be applied to both the processing system and the primary color signal processing system, and can be made independent of the imaging form of a single-plate type or a multi-plate type CCD. The following describes an example of application to a single-chip complementary color signal processing system.
- a color difference and luminance calculation block (1-2), various data maximum value and minimum value detection blocks (113) ), Color difference interpolated value calculation block (114), luminance interpolated value calculation block (1-5), defect determination and interpolation processing blog (116), used interpolation value selection block (1-7) performs the following operation. '.
- the absolute values of the adjacent 8 pixels necessary for defect detection and the absolute value of the color difference of the pixel for defect determination are compared with the absolute value of the adjacent 8 pixel color difference shown in Fig. 2A. 1A-A, 1, IB-B'1, 1C-C'j, 1D-D'I) FF-F 'to IG-G'I, IH — H, I, i I-I '
- is calculated.
- the color difference and luminance data used in the color difference interpolation value calculation block (114) and the luminance interpolation value calculation block (1-5) are applied to the interpolation value calculation target pixel shown in FIG. B, D-D ', E-E', F-F ', H-H', and B + B, D + D ', E + E, F10F', H + H ' It has been calculated.
- the maximum and minimum value detection blocks for various data are used to calculate the maximum and minimum values of various data used in the defect determination and interpolation processing block (1-6). Detected from the value calculated in step (1-2).
- the defective pixel detection by comparing the color difference absolute values between adjacent 8 pixels shown in Fig. 2A, iA-A, I, IB-B'I, IC-C '
- the maximum value from I is calculated as A, B, C , D, F, G, H, and I
- the maximum and minimum values are determined by comparing the nearest eight pixels shown in Fig. 2C with the defective pixels A, B, CD, F,.
- the maximum and minimum values are detected from among G ", H ,, and I".
- the defect detection and capture interval processing block (116) includes various data maximum and minimum value detection blocks (113), color difference interpolation value calculation blocks (1-4), and luminance interpolation. Based on the data from the value calculation block (1-5), three defect detection methods are used to determine the defect E of the defect determination target pixel E for each defect detection method at the same time. If it is determined that the pixel value is equal to the pixel value, the interpolation processing is executed by replacing the interpolation value according to the defect detection method with the conventional data of the pixel E.
- the first defect detection method 1 is a defective pixel detection by comparing the color difference absolute values between adjacent eight pixels shown in FIG. 2A.
- the block (1-6) obtains a value multiplied by a coefficient ⁇ ; 1 that can be arbitrarily set from the outside by a communication setting from the external communication setting unit 3 as a threshold T1.
- defect determination and interpolation processing block '(114) is a pixel for defect determination calculated by the color difference interpolation value calculation block (114) and the luminance interpolation value calculation block (1-5).
- the defect determination and capture processing block (116) is a coefficient that can be arbitrarily set from the outside by the communication setting from the external communication setting unit 3] 3 Obtain the value obtained by multiplying 1 as the limit value L. By comparing these calculation results, when the relationship of the following equation 1 is satisfied, the defect determination target pixel E is determined as a defect.
- This defect detection method uses the color difference, which is the difference between adjacent pixels, to emphasize the defect more, and adapts to a variety of images with fewer false detections than the other two defect detection methods. be able to.
- the color difference is the difference between adjacent pixels, to emphasize the defect more, and adapts to a variety of images with fewer false detections than the other two defect detection methods. be able to.
- the restriction of the conditions 1-2 is often not satisfied in a normal portion of an image, and is often satisfied in a defective portion, so that erroneous detection of a normal pixel can be suppressed. This restriction is also effective in suppressing erroneous detection of a pixel immediately before a defect.
- the luminance interpolation value is used as the optimal interpolation value. C Even if the normal pixel is erroneously detected and the capture processing is performed, the influence on the poor image quality can be minimized.
- the second defect detection method 2 is detection of a defective pixel by comparing eight adjacent pixels shown in FIG. 2B.
- the maximum value of adjacent eight pixels obtained by the maximum and minimum value detection blocks (1-3) of various data is compared with the defect determination and interpolation processing block (1-16).
- the defect determination and interpolation processing block (1 to 6) sets the coefficient ⁇ 2 which can be set arbitrarily from the outside by the communication setting from the external communication setting unit 3. Is calculated as the threshold value ⁇ 2—min. By comparing these calculation results, when the relationship of the following expression 2 is satisfied, the defect determination target pixel E is determined as a defect.
- the present detection method can achieve high detection efficiency while suppressing erroneous detection of images with intense contrast such as black and white stripes.
- the color difference interpolation value is adopted as the optimal interpolation value.
- the third defect detection method 3 is a defect pixel detection based on a comparison between the nearest eight pixels shown in FIG. 2C.
- the maximum value of the nearest eight pixels obtained by the maximum and minimum value detection blocks for various data (113) is compared with the defect determination and interpolation processing block (111). 6) calculates a value multiplied by a coefficient ⁇ 3 that can be arbitrarily set from the outside by the communication setting from the external communication setting unit 3 as a threshold ⁇ 3—max.
- the defect determination and interpolation processing block (1_6) is a coefficient ⁇ 3 that can be arbitrarily set from the outside by the communication setting from the external communication setting unit 3. Is multiplied by the threshold value 3—mi ⁇ . Based on the comparison of these calculation results, the pixel ⁇ to be determined as a defect is determined as a defect when the following equation (3) is satisfied.
- the signal level is often similar even between the nearest pixels with different color filters.
- the signal level is often different from the nearest pixel having a different color filter. Therefore, this detection method can be expected to improve the defect detection sensitivity in a bright image portion, which is difficult to detect by the other two defect detection methods.
- the luminance interpolation value is adopted as the optimal interpolation value.
- the final output value of the pixel E determined as a defect obtained in the defect determination and interpolation processing block (1-6) is selected.
- the defect determination and interpolation processing block (1-6) three defect detection methods and intercept processing optimized for each were performed, but an error was detected for each of the three defect detection methods. Different images are suitable for suppressing detection and maintaining maximum defect detection efficiency. Therefore, the final output value of pixel E is selected as follows from the characteristics of each defect detection method.
- FIG. 4 is a flowchart showing the operation of the used interpolation value selection block (1_7).
- step S1 it is determined whether the first defect detection method 1 has determined that the pixel is a defective pixel. If the pixel is determined to be defective by the first defect detection method 1 in step S1, the interpolated value of the first defect detection method 1 is output in step S2, regardless of the determination results of other detection methods. I do.
- step S1 If it is determined in step S1 that the pixel is not a defective pixel in the first defect detection method 1, it is determined in step S3 whether the pixel is determined to be a defective pixel in the second defect detection method 2. In the second defect detection method 2, defective pixels If determined, in step S4, if the defect is not determined by the first defect detection method 1, the interpolation value of the second defect detection method 2 is output regardless of the determination result of the defect detection method 3.
- step S3 If it is determined in step S3 that the pixel is not a defective pixel by the second defect detection method 2, it is determined in step S5 whether the pixel is determined to be a defective pixel by the third defect detection method 3. If the pixel is determined as a defective pixel by the third defect detection method 3, the interpolation value of the third defect method 3 is output only in step S6 if the other two defect detection methods have not determined that the pixel is defective. You.
- the value of the pixel E is output as it is in step S7.
- a storage device for storing the position of the defective pixel is not required, and the area for performing the defect detection and correction is provided. You can avoid being restricted.
- defect correction for all pixels can be realized at low cost.
- defect detection and interpolation are always performed at the time of image capturing, it is possible to detect and correct a defect that has occurred lately, which is caused by a temperature change of the image sensor, or the like.
- a pixel defect detection and correction device is a pixel defect detection and correction device for detecting and correcting a pixel defect of image data captured by an imaging unit.
- the color difference and luminance calculation means for calculating the absolute value of the color difference, the color difference and luminance data, and the data for the interpolation value calculation target pixel, and the maximum value and the minimum value of various data are detected from the values calculated by the color difference and luminance calculation means Means for detecting the maximum and minimum values of various data to be calculated, and means for calculating a color difference interpolation value of a pixel to be subjected to defect determination for a pixel to be subjected to interpolation value calculation; A luminance interpolation value calculation means for obtaining a luminance interpolation value of the pixel to be determined; a maximum value and minimum value detection means for the various data; a color difference interpolation value calculation means; Based on the data, a plurality of defect detection methods are used to simultaneously determine the defect of the defect determination target pixel for each defect detection method
- Equipped with an interpolation value selection means to select the final output value always detects and corrects surface element defects during imaging, and uses the optimal combination of multiple defect detection methods and interpolation methods.
- the memory for storing the position of defective pixels to perform the trapping process immediately after pixel defect detection. No equipment is required, and the area where defect detection and correction is performed is not restricted.Also, defect detection and interpolation are always performed at the time of imaging, and are caused by temperature changes in the image sensor. Thus, it is possible to detect and correct a defect that has occurred late.
- the pixel defect detection and correction device of the present invention limits the defect determination by using the color difference interpolation value and the luminance interpolation value for the defect determination target pixel. Therefore, at the time of defect detection, by limiting the detection based on the relationship between the signal level of the interpolation value calculated from the luminance and the color difference and the signal level of the pixel to be detected, the state of the image that is likely to be erroneously detected is detected. This has the effect that erroneous detection can be suppressed.
- the pixel defect detection and correction apparatus of the present invention is characterized in that the defect determination and interpolation processing in the defect determination and interpolation processing means includes a plurality of defect detection methods and a method for minimizing image quality degradation even when erroneous detection is performed.
- the interpolation method optimized for each defect detection method so that it can be minimized each defect detection and interpolation processing are performed at the same time, and the interpolation value selection means is used to determine the final value based on the characteristics of the defect detection method.
- the final interpolated output value is selected by determining the final interpolated output value, so that multiple defect detections and interpolation processes suitable for it are performed simultaneously, and the final defect output method is selected based on the features of the defect detection method.
- the threshold for performing the defect detection is set for each defect detection method by communication. To minimize false detection of normal pixels and maximize the efficiency of detecting defective pixels It has the effect that it can be done.
- the pixel defect detection and correction method is a pixel defect detection and correction method for detecting and correcting a pixel defect of image data captured by an imaging unit.
- a color difference signal and a luminance signal calculation step for calculating the absolute value of the color difference, the color difference and the luminance data of the pixel to be subjected to the defect determination, and the interpolation target pixel, and the maximum value and the minimum value of various data;
- the area where defect detection and correction is performed is not restricted, and defect detection and interpolation are always performed during imaging. can and this to detect and ToTadashi of generated defects, also, an output child between values capturing the defect detection based on the priority: effective that can be Play a fruit.
- the priority in the above-described use intercept value selecting step is such that adjacent 8 pixel color difference absolute value comparison, adjacent 8 pixel comparison, and nearest 8 pixel Since the comparison is performed in the order, it is possible to output an interpolated value for defect detection in the order of the adjacent 8 pixel color difference absolute value comparison, the adjacent 8 pixel comparison, and the nearest 8 pixel comparison.
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EP03780729A EP1578138A4 (en) | 2002-12-24 | 2003-12-11 | PIXEL DEFECT DETECTION / CORRECTION DEVICE AND PIXEL DEFECT DETECTION / CORRECTION PROCESS |
US10/540,058 US7564491B2 (en) | 2002-12-24 | 2003-12-11 | Pixel defect detecting/correcting device and pixel defect detecting/correcting method |
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JP2002372873A JP3747909B2 (ja) | 2002-12-24 | 2002-12-24 | 画素欠陥検出補正装置及び画素欠陥検出補正方法 |
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- 2003-12-11 KR KR1020057011831A patent/KR101001431B1/ko not_active IP Right Cessation
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Also Published As
Publication number | Publication date |
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JP2004207896A (ja) | 2004-07-22 |
CN100474935C (zh) | 2009-04-01 |
KR101001431B1 (ko) | 2010-12-14 |
CN1732693A (zh) | 2006-02-08 |
US7564491B2 (en) | 2009-07-21 |
TWI236851B (en) | 2005-07-21 |
EP1578138A4 (en) | 2008-08-13 |
EP1578138A1 (en) | 2005-09-21 |
US20060012694A1 (en) | 2006-01-19 |
TW200427337A (en) | 2004-12-01 |
JP3747909B2 (ja) | 2006-02-22 |
KR20050089847A (ko) | 2005-09-08 |
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