WO2004027878A3 - Dispositif semiconducteur de puissance quasi-vertical sur substrat composite - Google Patents
Dispositif semiconducteur de puissance quasi-vertical sur substrat composite Download PDFInfo
- Publication number
- WO2004027878A3 WO2004027878A3 PCT/FR2003/050045 FR0350045W WO2004027878A3 WO 2004027878 A3 WO2004027878 A3 WO 2004027878A3 FR 0350045 W FR0350045 W FR 0350045W WO 2004027878 A3 WO2004027878 A3 WO 2004027878A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- semiconductor material
- support substrate
- semiconductor device
- power semiconductor
- quasi
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 8
- 239000000758 substrate Substances 0.000 title abstract 6
- 239000002131 composite material Substances 0.000 title 1
- 239000000463 material Substances 0.000 abstract 6
- 238000000407 epitaxy Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/861—Diodes
- H01L29/872—Schottky diodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/861—Diodes
- H01L29/868—PIN diodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
- H01L29/1608—Silicon carbide
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/20—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AIIIBV compounds
- H01L29/2003—Nitride compounds
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/526,641 US20050258483A1 (en) | 2002-09-03 | 2003-09-01 | Quasi-vertical power semiconductor device on a composite substrate |
EP03780259A EP1535346A2 (fr) | 2002-09-03 | 2003-09-01 | Dispositif semiconducteur de puissance quasi-vertical sur substrat composite |
JP2004537241A JP2005537679A (ja) | 2002-09-03 | 2003-09-01 | 複合基板上の準縦型パワー半導体デバイス |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR02/10883 | 2002-09-03 | ||
FR0210883A FR2844099B1 (fr) | 2002-09-03 | 2002-09-03 | Dispositif semiconducteur de puissance quasi-vertical sur substrat composite |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004027878A2 WO2004027878A2 (fr) | 2004-04-01 |
WO2004027878A3 true WO2004027878A3 (fr) | 2004-05-06 |
Family
ID=31503070
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FR2003/050045 WO2004027878A2 (fr) | 2002-09-03 | 2003-09-01 | Dispositif semiconducteur de puissance quasi-vertical sur substrat composite |
Country Status (6)
Country | Link |
---|---|
US (1) | US20050258483A1 (fr) |
EP (1) | EP1535346A2 (fr) |
JP (1) | JP2005537679A (fr) |
FR (1) | FR2844099B1 (fr) |
TW (1) | TW200410312A (fr) |
WO (1) | WO2004027878A2 (fr) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7417266B1 (en) | 2004-06-10 | 2008-08-26 | Qspeed Semiconductor Inc. | MOSFET having a JFET embedded as a body diode |
US7436039B2 (en) * | 2005-01-06 | 2008-10-14 | Velox Semiconductor Corporation | Gallium nitride semiconductor device |
US8026568B2 (en) | 2005-11-15 | 2011-09-27 | Velox Semiconductor Corporation | Second Schottky contact metal layer to improve GaN Schottky diode performance |
EP1852895A1 (fr) * | 2006-05-05 | 2007-11-07 | Kinik Company | Substrat à diamant et procédé de sa fabrication |
US8138583B2 (en) | 2007-02-16 | 2012-03-20 | Cree, Inc. | Diode having reduced on-resistance and associated method of manufacture |
US7939853B2 (en) | 2007-03-20 | 2011-05-10 | Power Integrations, Inc. | Termination and contact structures for a high voltage GaN-based heterojunction transistor |
JP2011077351A (ja) * | 2009-09-30 | 2011-04-14 | Sumitomo Electric Ind Ltd | 発光素子 |
FR2977069B1 (fr) | 2011-06-23 | 2014-02-07 | Soitec Silicon On Insulator | Procede de fabrication d'une structure semi-conductrice mettant en oeuvre un collage temporaire |
US8633094B2 (en) | 2011-12-01 | 2014-01-21 | Power Integrations, Inc. | GaN high voltage HFET with passivation plus gate dielectric multilayer structure |
US8940620B2 (en) | 2011-12-15 | 2015-01-27 | Power Integrations, Inc. | Composite wafer for fabrication of semiconductor devices |
US8928037B2 (en) | 2013-02-28 | 2015-01-06 | Power Integrations, Inc. | Heterostructure power transistor with AlSiN passivation layer |
FR3017242B1 (fr) * | 2014-02-05 | 2017-09-01 | St Microelectronics Tours Sas | Diode schottky verticale au nitrure de gallium |
JP6257459B2 (ja) * | 2014-06-23 | 2018-01-10 | 株式会社東芝 | 半導体装置及びその製造方法 |
US10600635B2 (en) * | 2017-04-20 | 2020-03-24 | Elyakim Kassel | Method and apparatus for a semiconductor-on-higher thermal conductive multi-layer composite wafer |
US10332876B2 (en) * | 2017-09-14 | 2019-06-25 | Infineon Technologies Austria Ag | Method of forming compound semiconductor body |
WO2019170631A1 (fr) * | 2018-03-06 | 2019-09-12 | Abb Schweiz Ag | Dispositif à semi-conducteur de forte puissance à plaque de champ et structure de terminaison mésa auto-alignées et son procédé de fabrication |
US11469333B1 (en) | 2020-02-19 | 2022-10-11 | Semiq Incorporated | Counter-doped silicon carbide Schottky barrier diode |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2681472A1 (fr) * | 1991-09-18 | 1993-03-19 | Commissariat Energie Atomique | Procede de fabrication de films minces de materiau semiconducteur. |
US5635412A (en) * | 1994-05-04 | 1997-06-03 | North Carolina State University | Methods of fabricating voltage breakdown resistant monocrystalline silicon carbide semiconductor devices |
WO1997027629A1 (fr) * | 1996-01-24 | 1997-07-31 | Cree Research, Inc. | Diode schottky a structure mesa dotee d'un anneau de garde |
DE19801999A1 (de) * | 1997-06-18 | 1998-12-24 | Mitsubishi Electric Corp | Halbleitereinrichtung und Herstellungsverfahren einer Halbleitereinrichtung |
WO2000049661A1 (fr) * | 1999-02-17 | 2000-08-24 | Koninklijke Philips Electronics N.V. | Dispositif a semi-conducteur a effet de champ a grille isolee |
US6121661A (en) * | 1996-12-11 | 2000-09-19 | International Business Machines Corporation | Silicon-on-insulator structure for electrostatic discharge protection and improved heat dissipation |
US20010034116A1 (en) * | 2000-03-22 | 2001-10-25 | Lg Electronics Inc. | Semiconductor device with schottky contact and method for forming the same |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6831331B2 (en) * | 1995-11-15 | 2004-12-14 | Denso Corporation | Power MOS transistor for absorbing surge current |
-
2002
- 2002-09-03 FR FR0210883A patent/FR2844099B1/fr not_active Expired - Fee Related
-
2003
- 2003-09-01 JP JP2004537241A patent/JP2005537679A/ja active Pending
- 2003-09-01 US US10/526,641 patent/US20050258483A1/en not_active Abandoned
- 2003-09-01 WO PCT/FR2003/050045 patent/WO2004027878A2/fr active Application Filing
- 2003-09-01 EP EP03780259A patent/EP1535346A2/fr not_active Withdrawn
- 2003-09-02 TW TW092124197A patent/TW200410312A/zh unknown
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2681472A1 (fr) * | 1991-09-18 | 1993-03-19 | Commissariat Energie Atomique | Procede de fabrication de films minces de materiau semiconducteur. |
US5635412A (en) * | 1994-05-04 | 1997-06-03 | North Carolina State University | Methods of fabricating voltage breakdown resistant monocrystalline silicon carbide semiconductor devices |
WO1997027629A1 (fr) * | 1996-01-24 | 1997-07-31 | Cree Research, Inc. | Diode schottky a structure mesa dotee d'un anneau de garde |
US6121661A (en) * | 1996-12-11 | 2000-09-19 | International Business Machines Corporation | Silicon-on-insulator structure for electrostatic discharge protection and improved heat dissipation |
DE19801999A1 (de) * | 1997-06-18 | 1998-12-24 | Mitsubishi Electric Corp | Halbleitereinrichtung und Herstellungsverfahren einer Halbleitereinrichtung |
WO2000049661A1 (fr) * | 1999-02-17 | 2000-08-24 | Koninklijke Philips Electronics N.V. | Dispositif a semi-conducteur a effet de champ a grille isolee |
US20010034116A1 (en) * | 2000-03-22 | 2001-10-25 | Lg Electronics Inc. | Semiconductor device with schottky contact and method for forming the same |
Also Published As
Publication number | Publication date |
---|---|
JP2005537679A (ja) | 2005-12-08 |
FR2844099A1 (fr) | 2004-03-05 |
WO2004027878A2 (fr) | 2004-04-01 |
US20050258483A1 (en) | 2005-11-24 |
FR2844099B1 (fr) | 2005-09-02 |
TW200410312A (en) | 2004-06-16 |
EP1535346A2 (fr) | 2005-06-01 |
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