WO2004027512A1 - 波長変換素子 - Google Patents
波長変換素子 Download PDFInfo
- Publication number
- WO2004027512A1 WO2004027512A1 PCT/JP2003/011881 JP0311881W WO2004027512A1 WO 2004027512 A1 WO2004027512 A1 WO 2004027512A1 JP 0311881 W JP0311881 W JP 0311881W WO 2004027512 A1 WO2004027512 A1 WO 2004027512A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- wavelength conversion
- light
- conversion element
- region
- waveguide
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/35—Non-linear optics
- G02F1/353—Frequency conversion, i.e. wherein a light beam is generated with frequency components different from those of the incident light beams
- G02F1/3544—Particular phase matching techniques
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/35—Non-linear optics
- G02F1/3501—Constructional details or arrangements of non-linear optical devices, e.g. shape of non-linear crystals
- G02F1/3509—Shape, e.g. shape of end face
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
- G02F2201/06—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 integrated waveguide
- G02F2201/063—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 integrated waveguide ridge; rib; strip loaded
Definitions
- the present invention relates to a wavelength conversion element used to output a wavelength different from incident light using a quasi-phase matching technique.
- wavelength conversion technology that obtains light having a wavelength different from that of incident light due to higher-order interaction between a substance and light has attracted attention.
- wavelength conversion technology there is a method for efficiently extracting the converted light from the inside of the material to the outside.
- the formation of the domain-inverted region in the wavelength conversion element using the quasi-phase matching technique is performed, for example, by using a ferroelectric material such as lithium niobate as a substrate material and forming an electrode in a region where the domain-inverted area is to be formed by using one photolithography technique.
- the putter This is realized by applying a high DC voltage to the electrode and partially reversing the crystal axis by an electric field.
- a crystal that is not a ferroelectric material is used for a substrate, and a domain-inverted region is formed by applying stress.
- a wavelength conversion device has been recently proposed (S. Kurimura, R. Batchko, d. Mansell, R. Route, M. Fejer, and R. Byer: Proceedings of the Spring Meeting of the Japan Society of Applied Physics, Spring 1998, 28a-SG_18).
- This wavelength conversion element using quartz as a substrate material has a light resistance 100 times or more higher than that using a ferroelectric substrate.
- the lower limit wavelength of transparency is about 150 nm, compared to 400 nm for lithium niobate, light of a wavelength that could not be used conventionally, especially light of about 193 nm, which is equivalent to ArF excimer laser, is used. However, there is an advantage that it can be used.
- the wavelength conversion technology is based on the interaction between a higher-order light and a substance.
- lithium niobate which is a ferroelectric
- a widely used method of using light with a high energy density is to remove a portion of lithium in a substrate by using high-temperature molten benzoic acid.
- This is a method called proton exchange method, which increases the refractive index by substituting protons in an acid as follows.
- a portion having a high refractive index is provided in a substrate by a proton exchange method, a waveguide is formed in that portion, and light is confined therein.
- an aluminum thin film is formed on the surface of the substrate except for a region where an optical waveguide is to be formed.
- the aluminum thin film is formed using a general lift-off process.
- the substrate is immersed in benzoic acid heated from 350 ° C to 400 ° C and left for a predetermined time to proceed with the proton exchange process.
- the aluminum is removed by etching.
- the area where the protons are exchanged has a higher refractive index than the surrounding area, and becomes an optical waveguide in which light is confined and propagated. In this way, light can be confined and propagated in the periodically poled region, and high conversion efficiency can be obtained.
- a plurality of domain-inverted regions are periodically formed in a quartz substrate, and light incident from one end of the quartz substrate passes through the domain-inverted regions.
- a wavelength conversion element performs wavelength conversion by passing to the passage direction of light
- a wavelength conversion element characterized by Uni high refraction region by penetrating the plurality of polarization inversion region are formed c
- the high refraction region is formed so as to penetrate a plurality of domain-inverted regions in the light passing direction, the light is confined in the high refraction region by introducing the light into the high refraction region. In this state, it is possible to propagate the domain-inverted region. Therefore, a wavelength conversion element having high light conversion efficiency can be obtained.
- a second invention for achieving the above object is the first invention,
- the high refraction region is formed by forming the periphery thereof into a low refraction region by ion implantation.
- the refractive index of that portion can be relatively increased.
- a third invention for achieving the above object is the first invention, wherein the high refraction region is formed by a bridge type waveguide.
- the “ridge-type waveguide” is one in which a protruding high-refractive portion is provided as a light waveguide by providing a protruding high-refractive portion at a low-refractive-index portion. Also in the present invention, light can be propagated in a state where the light is confined in the protruding high refractive portion. Also, unlike the second invention, it is possible to prevent ion implantation into the domain-inverted region, and in such a case, the characteristics of the domain-inverted region may be changed. Absent.
- a fourth invention for achieving the above object is the third invention, wherein the bridge-type waveguide is formed by selective reactive ion etching. It is.
- a bridge-type waveguide By etching the quartz substrate by selective reactive ion etching, a bridge-type waveguide can be formed.
- a fine bridge-type waveguide can be formed.
- a fifth invention for achieving the above object is the third invention, wherein the bridge type waveguide is formed by machining. It is a sign.
- the ridge waveguide can be formed on the ice crystal substrate by mechanical processing such as dicing.
- a ridge-type waveguide can be formed by a relatively simple process.
- FIG. 1 is a diagram showing a schematic configuration of a quasi-phase matching element using quartz, which is a material of a wavelength conversion element according to an embodiment of the present invention.
- FIG. 2 is a diagram showing a process of manufacturing a wavelength conversion element as an example of the embodiment of the present invention by ion implantation based on the quasi-phase matching element made of quartz crystal shown in FIG.
- the figure on the left shows the A-A section in FIG. 1, and the figure on the right shows the BB section in FIG.
- FIG. 3 shows a ridge waveguide formed by selective reactive ion etching based on the quasi-phase matching element of quartz crystal shown in FIG. 1 to manufacture a wavelength conversion element as an example of the embodiment of the present invention.
- FIG. 3 is a diagram showing a process of performing The figure on the left shows the A-A section in FIG. 1, and the figure on the right shows the BB section in FIG.
- FIG. 4 is a diagram showing a wavelength conversion element as an example of an embodiment of the present invention in which a ridge waveguide is formed by dicing based on the quartz phase matching element of quartz shown in FIG. .
- FIG. 1 is a diagram showing a schematic configuration of a quasi-phase matching element using quartz, which is a material of a wavelength conversion element according to an embodiment of the present invention, wherein (a) is a plan view and (b) is a plan view. (a) is a sectional view taken along the line A-A, and (c) is a sectional view taken along the line BB in (a).
- quartz which is a material of a wavelength conversion element according to an embodiment of the present invention
- the quasi-phase matching element 1 is provided with a projection 2 periodically on one surface.
- the quasi-phase matching element 1 using quartz is formed by a hot press method. That is, as shown in FIG. 1, the quartz substrate having the periodic protrusions 2 on one side is sandwiched between the heater blocks from above and below, and when the temperature of the quartz substrate is increased to reach the desired temperature. Apply pressure. At this time, since stress acts only on the portion corresponding to the convex portion 2, the crystal axis component is inverted only at this portion. The crystal axis reversal part grows to the inside of the crystal, propagates to the inside of the crystal, and largely penetrates in the depth direction of the substrate main body 3.
- the crystal axis inversion part (polarization inversion region) is indicated by reference numeral 4 in the figure.
- a periodic twin lattice can be formed in the substrate main body 3.
- FIG. 2 shows a sectional view taken along the line AA and a sectional view taken along the line BB in FIG.
- the same components as those shown in the above drawings are denoted by the same reference numerals, and description thereof may be omitted.
- FIG. 2 is a diagram showing a quasi-phase matching element 1 made of quartz.
- a positive resist layer 5 having a thickness such that the projections 2 are covered is formed (b). Then, the resist is exposed and the resist is developed by lithography while leaving the center of the BB section of the quasi-phase matching element 1 to form a portion where the resist 5 remains in the center ( c).
- a low-refractive-index region 6a is formed in a portion without the resist 5 (d).
- the resist layer 5 is removed, and He ions having energy different from that of the step (d) are implanted.
- the energy of the He ions implanted at this time is increased so that the He ions do not stay near the surface of the substrate but stay at a certain depth.
- a low refractive index region 6b is newly formed at a predetermined depth.
- a high refraction region 7 is formed so as to penetrate a plurality of crystal axis inversion portions (polarization inversion regions) 4. Therefore, by passing light through the high refractive index region 7, the light passes through the crystal axis inversion portion (polarization inversion region) 4 while being confined in the high refractive region 7, and wavelength conversion is performed. Therefore, the energy of light in the wavelength conversion element can be made high, and high wavelength conversion efficiency can be obtained.
- FIG. 3 shows a sectional view taken along the line AA and a sectional view taken along the line BB in FIG. 1 (a).
- FIG. 3 is a diagram showing a quasi-phase matching element 1 made of quartz.
- a negative resist layer 5 having a thickness such that the projections 2 are covered is formed (b).
- the central portion of the BB cross section of the quasi-phase matching element 1 is exposed to a predetermined width in the left-right direction in FIG. Remove (c).
- CF 4 + H 2 -based gas is injected into the surface of the quasi-phase matching element 1 using the resist as a mask.
- the portion covered with the resist remains to form the projection 8 (d).
- a wavelength conversion element as an example of the embodiment of the present invention is completed (e).
- the convex portion 8 is formed so as to penetrate a plurality of crystal axis inversion portions (polarization inversion regions) 4, and a bridge type waveguide 9 is formed therebelow. Therefore, by passing the light through the waveguide 9, the light passes through the crystal axis inversion portion (polarization inversion region) 4 while being confined in the waveguide 9, and the wavelength is converted. Is performed. Therefore, the energy of light in the wavelength conversion element can be in a high state, and high wavelength conversion efficiency can be obtained.
- FIG. 4 (a) is a plan view, (b) is an A-A cross-sectional view in (a), and (c) is a BB cross-sectional view in (a).
- Grooves are formed by dicing on the quasi-phase matching element 1 made of quartz as shown in FIG. 1 to form a wavelength conversion element as shown in FIG. That is, two grooves 10 are diced in parallel along the light passing direction. Then, as shown in (b) and (c) of FIG. 4, a projection 11 sandwiched between two grooves 10 is formed on the upper surface side in the figure, and a ridge-type conductor is formed therein. Wave path 9 is formed. Therefore, by passing the light through the waveguide 9, the light passes through the crystal axis inversion portion (polarization inversion region) 4 while being confined in the waveguide 9, and the wavelength is converted. Is performed. Therefore, the intensity of light in the wavelength conversion element can be made high, and high wavelength conversion efficiency can be obtained.
- the ridge-type waveguide 9 is formed by machining, so that the process is simple, and ion implantation is not performed, so that the properties of the crystallographic axis inversion portion (polarization inversion region) 4 are changed. It has the feature that it does not occur.
- air is used as the low-refractive index material for forming the ridge waveguide 9.
- the upper surface of the wavelength conversion element shown in FIGS. Alternatively, it may be covered with a material having a lower refractive index than quartz.
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03797651A EP1542070A4 (en) | 2002-09-20 | 2003-09-18 | Wavelength conversion element |
US10/522,698 US7177070B2 (en) | 2002-09-20 | 2003-09-18 | Wavelength conversion element |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002276000A JP2004109915A (ja) | 2002-09-20 | 2002-09-20 | 波長変換素子 |
JP2002-276000 | 2002-09-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2004027512A1 true WO2004027512A1 (ja) | 2004-04-01 |
Family
ID=32025050
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2003/011881 WO2004027512A1 (ja) | 2002-09-20 | 2003-09-18 | 波長変換素子 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7177070B2 (ja) |
EP (1) | EP1542070A4 (ja) |
JP (1) | JP2004109915A (ja) |
WO (1) | WO2004027512A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4209162B2 (ja) * | 2002-09-20 | 2009-01-14 | 株式会社ニコン | 押圧装置および相転移型双晶を有する水晶の製造方法 |
JP2004109914A (ja) * | 2002-09-20 | 2004-04-08 | Nikon Corp | 擬似位相整合水晶の製造方法及び擬似位相整合水晶 |
JP2006017925A (ja) * | 2004-06-30 | 2006-01-19 | Kyocera Kinseki Corp | 光導波路及びその製造方法 |
CN101689006B (zh) * | 2007-04-18 | 2012-01-18 | 株式会社尼康 | 波长转换元件、波长转换方法、相位匹配方法及光源装置 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03237437A (ja) * | 1990-02-15 | 1991-10-23 | Asahi Glass Co Ltd | 分極ドメイン反転分布型光導波路素子 |
US5382334A (en) * | 1992-10-21 | 1995-01-17 | Pioneer Electronic Corporation | Process for forming polarization inversion layer |
JPH11212128A (ja) * | 1998-01-23 | 1999-08-06 | Mitsubishi Materials Corp | 波長変換素子及びその製造方法並びにこれを用いた固体レーザ装置 |
US20010055453A1 (en) * | 2000-03-21 | 2001-12-27 | Matsushita Electric Industrial Co., Ltd. And Ngk Insulators, Ltd. | Optical waveguide elements, optical wave length conversion elements, and process for producing optical waveguide elements |
JP2002122898A (ja) * | 2000-06-29 | 2002-04-26 | Nikon Corp | コヒーレント光光源、半導体露光装置、レーザ治療装置、レーザ干渉計装置、レーザ顕微鏡装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5581642A (en) * | 1994-09-09 | 1996-12-03 | Deacon Research | Optical frequency channel selection filter with electronically-controlled grating structures |
-
2002
- 2002-09-20 JP JP2002276000A patent/JP2004109915A/ja active Pending
-
2003
- 2003-09-18 WO PCT/JP2003/011881 patent/WO2004027512A1/ja active Application Filing
- 2003-09-18 EP EP03797651A patent/EP1542070A4/en not_active Withdrawn
- 2003-09-18 US US10/522,698 patent/US7177070B2/en not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03237437A (ja) * | 1990-02-15 | 1991-10-23 | Asahi Glass Co Ltd | 分極ドメイン反転分布型光導波路素子 |
US5382334A (en) * | 1992-10-21 | 1995-01-17 | Pioneer Electronic Corporation | Process for forming polarization inversion layer |
JPH11212128A (ja) * | 1998-01-23 | 1999-08-06 | Mitsubishi Materials Corp | 波長変換素子及びその製造方法並びにこれを用いた固体レーザ装置 |
US20010055453A1 (en) * | 2000-03-21 | 2001-12-27 | Matsushita Electric Industrial Co., Ltd. And Ngk Insulators, Ltd. | Optical waveguide elements, optical wave length conversion elements, and process for producing optical waveguide elements |
JP2002122898A (ja) * | 2000-06-29 | 2002-04-26 | Nikon Corp | コヒーレント光光源、半導体露光装置、レーザ治療装置、レーザ干渉計装置、レーザ顕微鏡装置 |
Non-Patent Citations (3)
Title |
---|
BABSAIL L. ET AL.: "Second-harmonic generation in ion-implanted quartz planar waveguides", APPL. PHYS. LETT., vol. 59, no. 4, 22 July 1991 (1991-07-22), pages 384 - 386, XP000241523 * |
See also references of EP1542070A4 * |
TADASHI KURIMURA ET AL.: "Shigai hacho henkan o mezashita giji iso seigo suisho", OYO BUTSURI, vol. 69, no. 5, 2000, pages 548 - 552, XP002975833 * |
Also Published As
Publication number | Publication date |
---|---|
JP2004109915A (ja) | 2004-04-08 |
US20050174629A1 (en) | 2005-08-11 |
US7177070B2 (en) | 2007-02-13 |
EP1542070A4 (en) | 2008-09-03 |
EP1542070A1 (en) | 2005-06-15 |
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