WO2002095801A2 - Improved connection assembly for integrated circuit sensors - Google Patents

Improved connection assembly for integrated circuit sensors Download PDF

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Publication number
WO2002095801A2
WO2002095801A2 PCT/US2002/016399 US0216399W WO02095801A2 WO 2002095801 A2 WO2002095801 A2 WO 2002095801A2 US 0216399 W US0216399 W US 0216399W WO 02095801 A2 WO02095801 A2 WO 02095801A2
Authority
WO
WIPO (PCT)
Prior art keywords
sensor
integrated circuit
circuit board
connection
connection assembly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2002/016399
Other languages
English (en)
French (fr)
Other versions
WO2002095801A3 (en
WO2002095801A8 (en
WO2002095801B1 (en
Inventor
Thomas L. Andrade
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Silable Inc
Atrua Technologies Inc
Original Assignee
Silable Inc
Atrua Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Silable Inc, Atrua Technologies Inc filed Critical Silable Inc
Priority to JP2002592167A priority Critical patent/JP2005516377A/ja
Priority to EP02737133A priority patent/EP1407477A4/en
Priority to AU2002310087A priority patent/AU2002310087A1/en
Publication of WO2002095801A2 publication Critical patent/WO2002095801A2/en
Publication of WO2002095801A3 publication Critical patent/WO2002095801A3/en
Anticipated expiration legal-status Critical
Publication of WO2002095801B1 publication Critical patent/WO2002095801B1/en
Publication of WO2002095801A8 publication Critical patent/WO2002095801A8/en
Ceased legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/50Fixed connections
    • H01R12/59Fixed connections for flexible printed circuits, flat or ribbon cables or like structures
    • H01R12/62Fixed connections for flexible printed circuits, flat or ribbon cables or like structures connecting to rigid printed circuits or like structures
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V40/00Recognition of biometric, human-related or animal-related patterns in image or video data
    • G06V40/10Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
    • G06V40/12Fingerprints or palmprints
    • G06V40/13Sensors therefor
    • G06V40/1306Sensors therefor non-optical, e.g. ultrasonic or capacitive sensing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73253Bump and layer connectors
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • H05K1/181Printed circuits structurally associated with non-printed electric components associated with surface mounted components

Definitions

  • the present invention relates to an improved method for making the electrical and physical connection between an integrated circuit sensor and an electronic system and to a device using or having that electrical and physical connection.
  • the sensor elements transduce the external stimulus at or near the element's surface into electrical signals that are acted upon by electrical circuits within the integrated circuit.
  • the sensor elements transduce stimuli such as light, heat, temperature, pressure (static or sound), capacitance (for example as electrical proximity), resistance (for example as electrical surface conductivity), or other stimuli into electrical signals.
  • connection assembly is required to connect the integrated circuit to the remainder of the electronic system while not interfering with the transducing properties of the sensor elements.
  • An example of a typical connection assembly for integrated circuit is a plastic package: a plastic encapsulated combination of lead frame, wire bond, and integrated circuit.
  • the connection assembly may also provide environmental protection to the entire sensor as demonstrated in commercially available sensors.
  • the sensor area which contains the sensor elements usually exists in roughly the same plane as the connection points, or terminals, of the integrated circuit.
  • a wire bond connection from the integrated circuit to an appropriate wiring substrate extends above the sensor surface and therefore may physically interfere with the proximity required by the sensor elements.
  • a connection assembly that can tolerate the wire bond height is readily available for most optical, pressure, and thermal integrated circuit sensors.
  • Abramov discloses a surface contact sensor used to measure fingerprints in which the package height affects the sensor area. In this disclosure the sensor area is illustrated larger than the finger so that the connection assembly does not interfere with the sensor area.
  • FCD4B14 FingerChip datasheet ATMEL Inc, Revision 1962C-01/20.
  • FTF 1100 MF1 V2.0 FingerTIP Databook Infineon Technologies Inc, Revision 3.3 (05.00).
  • the present invention provides a connection assembly to an integrated circuit sensor (and even to integrated circuits other than sensors) that provides environmental protection of the electrical circuit area (non-sensor area) and simultaneously allows a medium, such as a finger, to be sensed (such as when sensing a fingerprint with a contact or swipe sensor) with minimal physical interference.
  • a thin circuit board material typically less than 100 micrometers, is attached to the integrated circuit sensor using direct circuit board to integrated circuit attachment technologies. These attachment technologies may for example include solder ball and direct compressive attachment technology, or other attachment techniques and structures known in the art.
  • the thin circuit board material is fabricated so as to cover the electrical circuit, but not cover the sensor area.
  • the circuit board is mechanically attached to the integrated circuit sensor and provides additional strength to the assembly.
  • the circuit board reduces the sensor's need for additional mechanical support.
  • the circuit board contains conductive material which is used to conduct ESD currents discharged near the sensor area.
  • the circuit board material provides optical shielding to the electrical circuits located beneath it.
  • the circuit board material is readily attached to remainder of the electronic system by including exposed connection points for either solder or connector attachment.
  • FIG. 1 illustrates a representative integrated circuit sensor
  • FIG. 2 illustrates and embodiment of the circuit board topside, the side not adjacent to the sensor, used in the connection assembly and embodied in the invention
  • FIG. 3 illustrates the bottom side of the thin circuit board shown in FIG. 3;
  • FIG. 4. is an embodiment of the connection assembly;
  • FIG. 5 further illustrates the embodiment of FIG. 4 by means of a topside view with the integrated circuit sensor shown below the thin circuit board;
  • FIG. 6 further illustrates the embodiment of FIG. 4 by means of the cross-sectional view defined as A-B in FIG. 5;
  • FIG. 7 is an additional embodiment of the connection assembly using the cross-sectional view of FIG. 6;
  • FIG. 8 illustrates a representative sensor with the sensor area occupying one corner of the integrated circuit sensor surface
  • FIG. 9. is an embodiment of the connection assembly including the integrated circuit sensor shown in FIG 8.
  • FIG. 1 A typical integrated circuit sensor is illustrated in FIG. 1.
  • the entire integrated circuit sensor (1), the sensor area containing the sensor elements (2), the ancillary electrical circuits (3), and the connection areas (4) are shown.
  • the ancillary electrical circuits (3) perform functions necessary for the operation of the sensor.
  • the electrical circuits contain transistors within the region (3).
  • the sensor area (2) may also contain transistors.
  • the connection areas (4) are illustrated as structures above the integrated circuit sensor surface (1), such as bumps, but the conduction areas (4) may also be openings to conductive films below the surface.
  • a circuit board is used to make electrical connection to the connection areas (4) and also protects the electrical circuits (3) from environmental damage.
  • the circuit board is a structure composed of an insulating film and conducting wires within it or on its surface.
  • FIG. 2 shows such a thin circuit board (5).
  • the illustration in FIG. 2 is the topside view of the circuit board.
  • FIG. 3 shows the opposite side of the circuit board when flipped parallel to the bottom of the figure.
  • the thin circuit board contains an opening (6) approximately the size of the sensor area (4), though it may be sized differently.
  • the circuit board also contains connections areas (11) which are in the locations that match those of the integrated circuit connection areas (4).
  • the circuit board also contains connections from the connection areas (11) to other connection points (7), (8), and (9). These other connection points allow the integrated circuit sensor (1) to be connected to an electrical system by means of a side connector (7) or to top connection points (8) or to bottom connection points (9) or to other components attached to the circuit board (10).
  • connection assembly which is the embodiment of the invention shown in FIG. 4.
  • the circuit board (5) is attached to the integrated circuit sensor (1) by aligning the connection areas on the circuit board (11) to the connection areas (4) on the integrated circuit sensor (1). Once aligned, the connection areas (4), (11) are electrically connected between the circuit board (5) and integrated circuit sensor (1) by means of suitable operations and materials. These materials and the corresponding operations include conductive organic materials, an-isotropic conductive films, solder pastes, and/or the application of heat and/or pressure These materials and the corresponding operations cause the two connection areas (4), (11) to become electrically connected. These methods of connection also provide mechanical connection between the circuit board (5) and integrated circuit sensor (1).
  • FIG 4. illustrates the feature of the connection assembly that only the sensor area (2) and the circuit board, electrical connections (7), (8) are accessible from the topside of the sensor assembly.
  • FIG. 5 depicts a transparent view of the sensor assembly as viewed from directly above the connection assembly shown in FIG. 4.
  • the circuit board (5) covers the electrical circuit areas (3).
  • the opening in circuit board (6) exposes the sensor area (2). Because of the protection provided by the circuit board (5) and the proximity of the opening (6) to the electrical circuit area, a more rugged integrated circuit sensor may be constructed by moving transistors from the sensor area (2) to the electrical circuit area (3) whenever possible.
  • the ' connection areas (4), (11) align so that both are illustrated as one in this view.
  • FIG. 6 further illustrates the features of the connection assembly by means of a cross section through the connection assembly defined by a vertical plane containing points A and B in FIG. 5.
  • connection area (4) and (1 1) The alignment of the connection areas (4) and (1 1) is again shown. The differences between the materials in connection area (4) and connection area (1 1) is illustrated as black and white. If the connection is made via some forms of solder connection, the connection materials blend together more than is currently depicted.
  • the covering of the electrical circuits (3) by the circuit board (5) is shown as is the opening (6) above the sensor area (2). Also shown is an optional insulating sealant material (12) which provides additional protection for the connection areas (4), (11) and the electrical circuits (3) and increases the mechanical strength between the circuit board and the integrated circuit sensor. This sealant material may be applied after the circuit board is connected to the sensor, as in the case of an under-fill material, or as part of the electrical connection process itself, as in the case of an- isotropic conductive film.
  • FIG. 7 shows another embodiment of the invention using the same physical cross section plane identified in FIG. 6.
  • the thin circuit board (5) is physically attached to the side of the integrated circuit sensor opposite the sensor area (2), with adhesive material (13). Because of the bending of the circuit board, connection points (8) are advantageously located on the backside of the integrated circuit sensor.
  • FIG. 8 shows an alternate integrated circuit sensor with sensor area (2) adjacent to the edge of the integrated circuit sensor (1).
  • FIG. 9 shows another embodiment of the invention which also uses a circuit board that only exposes the integrated circuit surface at the sensor area (2).
  • the circuit board opening (6) is a notch in the corner of the circuit board rather than a hole as in FIG. 4.

Landscapes

  • Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Multi-Conductor Connections (AREA)
  • Image Input (AREA)
  • Wire Bonding (AREA)
  • Optical Transform (AREA)
PCT/US2002/016399 2001-05-22 2002-05-22 Improved connection assembly for integrated circuit sensors Ceased WO2002095801A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2002592167A JP2005516377A (ja) 2001-05-22 2002-05-22 集積回路センサのための改善された接続組立体
EP02737133A EP1407477A4 (en) 2001-05-22 2002-05-22 IMPROVED CONNECTING ASSEMBLY FOR INTEGRATED CIRCUIT SENSORS
AU2002310087A AU2002310087A1 (en) 2001-05-22 2002-05-22 Improved connection assembly for integrated circuit sensors

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US29286201P 2001-05-22 2001-05-22
US60/292,862 2001-05-22

Publications (4)

Publication Number Publication Date
WO2002095801A2 true WO2002095801A2 (en) 2002-11-28
WO2002095801A3 WO2002095801A3 (en) 2003-10-30
WO2002095801B1 WO2002095801B1 (en) 2003-12-04
WO2002095801A8 WO2002095801A8 (en) 2004-01-15

Family

ID=23126529

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2002/016399 Ceased WO2002095801A2 (en) 2001-05-22 2002-05-22 Improved connection assembly for integrated circuit sensors

Country Status (6)

Country Link
US (1) US20030013328A1 (enExample)
EP (1) EP1407477A4 (enExample)
JP (1) JP2005516377A (enExample)
AU (1) AU2002310087A1 (enExample)
TW (1) TWI241531B (enExample)
WO (1) WO2002095801A2 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7989938B2 (en) 2003-03-31 2011-08-02 Fujitsu Semiconductor Limited Semiconductor device for fingerprint recognition
US8999229B2 (en) 2010-11-17 2015-04-07 Alpha Sintered Metals, Inc. Components for exhaust system, methods of manufacture thereof and articles comprising the same
EP3291515A1 (en) * 2016-08-30 2018-03-07 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Fingerprint module, method for fabricating the same, and mobile terminal

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111126351B (zh) * 2020-01-21 2024-02-09 北京京东方光电科技有限公司 指纹识别模组

Family Cites Families (92)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4210899A (en) * 1975-06-23 1980-07-01 Fingermatrix, Inc. Fingerprint-based access control and identification apparatus
JPS5624969A (en) * 1979-08-09 1981-03-10 Canon Inc Semiconductor integrated circuit element
US4353056A (en) * 1980-06-05 1982-10-05 Siemens Corporation Capacitive fingerprint sensor
JPS57109922A (en) * 1980-12-26 1982-07-08 Olympus Optical Co Ltd Film advancing device
US4429413A (en) * 1981-07-30 1984-01-31 Siemens Corporation Fingerprint sensor
US4526043A (en) * 1983-05-23 1985-07-02 At&T Bell Laboratories Conformable tactile sensor
US4577345A (en) * 1984-04-05 1986-03-18 Igor Abramov Fingerprint sensor
FR2626408B1 (fr) * 1988-01-22 1990-05-11 Thomson Csf Capteur d'image a faible encombrement
US5264393A (en) * 1988-11-25 1993-11-23 Fuji Photo Film Co., Ltd. Solid state image pickup device and method of manufacturing the same
US5195145A (en) * 1989-11-13 1993-03-16 Identity Technologies Incorporated Apparatus to record epidermal topography
GB2244164A (en) * 1990-05-18 1991-11-20 Philips Electronic Associated Fingerprint sensing
JPH04258176A (ja) * 1991-02-12 1992-09-14 Mitsubishi Electric Corp 半導体圧力センサ
US5166679A (en) * 1991-06-06 1992-11-24 The United States Of America As Represented By The Administrator Of The National Aeronautics & Space Administration Driven shielding capacitive proximity sensor
JPH05203522A (ja) * 1992-01-23 1993-08-10 Mitsubishi Electric Corp モールドパッケージ半導体圧力センサおよびその製造方法
JPH0758234B2 (ja) * 1992-04-16 1995-06-21 株式会社エニックス 半導体マトリクス型微細面圧分布センサ
US5214388A (en) * 1992-05-28 1993-05-25 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Phase discriminating capacitive array sensor system
US5559504A (en) * 1993-01-08 1996-09-24 Kabushiki Kaisha Toshiba Surface shape sensor, identification device using this sensor, and protected system using this device
US5442347A (en) * 1993-01-25 1995-08-15 The United States Of America As Represented By The Administrater, National Aeronautics & Space Administration Double-driven shield capacitive type proximity sensor
US5434446A (en) * 1993-07-07 1995-07-18 Analog Devices, Inc. Parasitic capacitance cancellation circuit
US5373245A (en) * 1993-07-12 1994-12-13 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Capaciflector camera
KR970005706B1 (ko) * 1994-01-24 1997-04-19 금성일렉트론 주식회사 고체촬상소자 및 그 제조방법
US5485011A (en) * 1994-01-28 1996-01-16 Larry C. Y. Lee Two-sided integrated-circuit PIR sensor package
US5824950A (en) * 1994-03-11 1998-10-20 The Panda Project Low profile semiconductor die carrier
TW299410B (enExample) * 1994-04-04 1997-03-01 At & T Corp
US5382310A (en) * 1994-04-29 1995-01-17 Eastman Kodak Company Packaging medical image sensors
US5673123A (en) * 1994-06-30 1997-09-30 Lucent Technologies Inc. Methods and means for processing images
US5822030A (en) * 1994-09-16 1998-10-13 Seiko Epson Corporation Liquid crystal display device, its mounting structure and electronic device
JP2570628B2 (ja) * 1994-09-21 1997-01-08 日本電気株式会社 半導体パッケージおよびその製造方法
US5631704A (en) * 1994-10-14 1997-05-20 Lucent Technologies, Inc. Active pixel sensor and imaging system having differential mode
US5576763A (en) * 1994-11-22 1996-11-19 Lucent Technologies Inc. Single-polysilicon CMOS active pixel
US6192142B1 (en) * 1994-11-28 2001-02-20 Smarttouch, Inc. Tokenless biometric electronic stored value transactions
US5764789A (en) * 1994-11-28 1998-06-09 Smarttouch, Llc Tokenless biometric ATM access system
US5539292A (en) * 1994-11-28 1996-07-23 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Capaciflector-guided mechanisms
KR960028217A (ko) * 1994-12-22 1996-07-22 엘리 웨이스 움직임 검출 카메라 시스템 및 방법
US5825907A (en) * 1994-12-28 1998-10-20 Lucent Technologies Inc. Neural network system for classifying fingerprints
JP2746171B2 (ja) * 1995-02-21 1998-04-28 日本電気株式会社 固体撮像装置及びその製造方法
US5668874A (en) * 1995-02-28 1997-09-16 Lucent Technologies Inc. Identification card verification system and method
GB9507817D0 (en) * 1995-04-18 1995-05-31 Philips Electronics Uk Ltd Touch sensing devices and methods of making such
US5625304A (en) * 1995-04-21 1997-04-29 Lucent Technologies Inc. Voltage comparator requiring no compensating offset voltage
US5577120A (en) * 1995-05-01 1996-11-19 Lucent Technologies Inc. Method and apparatus for restrospectively identifying an individual who had engaged in a commercial or retail transaction or the like
US6369116B1 (en) * 1995-06-02 2002-04-09 Oculex Pharmaceuticals, Inc. Composition and method for treating glaucoma
US5739562A (en) * 1995-08-01 1998-04-14 Lucent Technologies Inc. Combined photogate and photodiode active pixel image sensor
US6016355A (en) * 1995-12-15 2000-01-18 Veridicom, Inc. Capacitive fingerprint acquisition sensor
US6049620A (en) * 1995-12-15 2000-04-11 Veridicom, Inc. Capacitive fingerprint sensor with adjustable gain
US5828773A (en) * 1996-01-26 1998-10-27 Harris Corporation Fingerprint sensing method with finger position indication
US5956415A (en) * 1996-01-26 1999-09-21 Harris Corporation Enhanced security fingerprint sensor package and related methods
US5963679A (en) * 1996-01-26 1999-10-05 Harris Corporation Electric field fingerprint sensor apparatus and related methods
EP0790479B1 (en) * 1996-02-14 2002-01-16 STMicroelectronics S.r.l. Capacitive distance sensor, particularly for acquiring fingerprints
US6114862A (en) * 1996-02-14 2000-09-05 Stmicroelectronics, Inc. Capacitive distance sensor
US6320394B1 (en) * 1996-02-14 2001-11-20 Stmicroelectronics S.R.L. Capacitive distance sensor
US5778089A (en) * 1996-03-04 1998-07-07 Dew Engineering And Development Limited Driver circuit for a contact imaging array
US6011294A (en) * 1996-04-08 2000-01-04 Eastman Kodak Company Low cost CCD packaging
US5844486A (en) * 1997-01-02 1998-12-01 Advanced Safety Concepts, Inc. Integral capacitive sensor array
GB9608747D0 (en) * 1996-04-26 1996-07-03 Philips Electronics Nv Fingerprint sensing devices and systems incorporating such
FR2749955B1 (fr) * 1996-06-14 1998-09-11 Thomson Csf Systeme de lecture d'empreintes digitales
FR2755526B1 (fr) * 1996-11-05 1999-01-22 Thomson Csf Systeme de lecture d'empreintes digitales avec resistances de chauffage integrees
US5987156A (en) * 1996-11-25 1999-11-16 Lucent Technologies Apparatus for correcting fixed column noise in images acquired by a fingerprint sensor
JP3576727B2 (ja) * 1996-12-10 2004-10-13 株式会社デンソー 表面実装型パッケージ
US5991408A (en) * 1997-05-16 1999-11-23 Veridicom, Inc. Identification and security using biometric measurements
US6259804B1 (en) * 1997-05-16 2001-07-10 Authentic, Inc. Fingerprint sensor with gain control features and associated methods
US5940526A (en) * 1997-05-16 1999-08-17 Harris Corporation Electric field fingerprint sensor having enhanced features and related methods
US5920640A (en) * 1997-05-16 1999-07-06 Harris Corporation Fingerprint sensor and token reader and associated methods
US5903225A (en) * 1997-05-16 1999-05-11 Harris Corporation Access control system including fingerprint sensor enrollment and associated methods
US5864296A (en) * 1997-05-19 1999-01-26 Trw Inc. Fingerprint detector using ridge resistance sensor
US6208264B1 (en) * 1997-05-23 2001-03-27 Automated Identification Service, Inc. Personal verification in a commercial transaction system
FR2764113B1 (fr) * 1997-05-28 2000-08-04 Motorola Semiconducteurs Dispositif capteur et son procede de fabrication
JP2959532B2 (ja) * 1997-06-30 1999-10-06 日本電気株式会社 静電容量検出方式の指紋画像入力装置
US6011859A (en) * 1997-07-02 2000-01-04 Stmicroelectronics, Inc. Solid state fingerprint sensor packaging apparatus and method
US5867368A (en) * 1997-09-09 1999-02-02 Amkor Technology, Inc. Mounting for a semiconductor integrated circuit device
US6483931B2 (en) * 1997-09-11 2002-11-19 Stmicroelectronics, Inc. Electrostatic discharge protection of a capacitve type fingerprint sensing array
US6028773A (en) * 1997-11-14 2000-02-22 Stmicroelectronics, Inc. Packaging for silicon sensors
US6330345B1 (en) * 1997-11-17 2001-12-11 Veridicom, Inc. Automatic adjustment processing for sensor devices
US6501846B1 (en) * 1997-11-25 2002-12-31 Ethentica, Inc. Method and system for computer access and cursor control using a relief object image generator
US6191593B1 (en) * 1997-12-17 2001-02-20 Stmicroelectronics, Inc. Method for the non-invasive sensing of physical matter on the detection surface of a capacitive sensor
US6317508B1 (en) * 1998-01-13 2001-11-13 Stmicroelectronics, Inc. Scanning capacitive semiconductor fingerprint detector
US6195447B1 (en) * 1998-01-16 2001-02-27 Lucent Technologies Inc. System and method for fingerprint data verification
WO1999060513A1 (de) * 1998-05-19 1999-11-25 Infineon Technologies Ag Sensoreinrichtung zur erfassung von biometrischen merkmalen, insbesondere fingerminutien
US6097195A (en) * 1998-06-02 2000-08-01 Lucent Technologies Inc. Methods and apparatus for increasing metal density in an integrated circuit while also reducing parasitic capacitance
JP2000002882A (ja) * 1998-06-16 2000-01-07 Toshiba Electronic Engineering Corp 液晶表示装置及びその製造方法
DE19831570A1 (de) * 1998-07-14 2000-01-20 Siemens Ag Biometrischer Sensor und Verfahren zu dessen Herstellung
DE19833211C2 (de) * 1998-07-23 2000-05-31 Siemens Ag Verfahren zur Bestimmung sehr kleiner Kapazitäten und Verwendung
DE19836770C1 (de) * 1998-08-13 2000-04-20 Siemens Ag Verfahren zur kapazitiven Bilderfassung
US6246566B1 (en) * 1999-02-08 2001-06-12 Amkor Technology, Inc. Electrostatic discharge protection package and method
US6734093B1 (en) * 1999-03-17 2004-05-11 Intel Corporation Method for placing active circuits beneath active bonding pads
US6260300B1 (en) * 1999-04-21 2001-07-17 Smith & Wesson Corp. Biometrically activated lock and enablement system
US6535622B1 (en) * 1999-04-26 2003-03-18 Veridicom, Inc. Method for imaging fingerprints and concealing latent fingerprints
US6546122B1 (en) * 1999-07-29 2003-04-08 Veridicom, Inc. Method for combining fingerprint templates representing various sensed areas of a fingerprint to derive one fingerprint template representing the fingerprint
US6262895B1 (en) * 2000-01-13 2001-07-17 John A. Forthun Stackable chip package with flex carrier
US6396116B1 (en) * 2000-02-25 2002-05-28 Agilent Technologies, Inc. Integrated circuit packaging for optical sensor devices
US6518560B1 (en) * 2000-04-27 2003-02-11 Veridicom, Inc. Automatic gain amplifier for biometric sensor device
JP2002151551A (ja) * 2000-11-10 2002-05-24 Hitachi Ltd フリップチップ実装構造、その実装構造を有する半導体装置及び実装方法
US6760610B2 (en) * 2000-11-23 2004-07-06 Sentec Ag Sensor and method for measurement of physiological parameters

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7989938B2 (en) 2003-03-31 2011-08-02 Fujitsu Semiconductor Limited Semiconductor device for fingerprint recognition
US8999229B2 (en) 2010-11-17 2015-04-07 Alpha Sintered Metals, Inc. Components for exhaust system, methods of manufacture thereof and articles comprising the same
EP3291515A1 (en) * 2016-08-30 2018-03-07 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Fingerprint module, method for fabricating the same, and mobile terminal
US10049259B2 (en) 2016-08-30 2018-08-14 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Fingerprint module, method for fabricating the same, and mobile terminal
US10133913B2 (en) 2016-08-30 2018-11-20 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Fingerprint module, method for fabricating the same, and mobile terminal

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WO2002095801A3 (en) 2003-10-30
WO2002095801A8 (en) 2004-01-15
AU2002310087A1 (en) 2002-12-03
EP1407477A2 (en) 2004-04-14
TWI241531B (en) 2005-10-11
JP2005516377A (ja) 2005-06-02
US20030013328A1 (en) 2003-01-16
WO2002095801B1 (en) 2003-12-04
EP1407477A4 (en) 2006-06-07

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