WO2002056388A2 - Boîtier semi-conducteur a capteur, muni d'un insert, et son procede de fabrication - Google Patents
Boîtier semi-conducteur a capteur, muni d'un insert, et son procede de fabrication Download PDFInfo
- Publication number
- WO2002056388A2 WO2002056388A2 PCT/FR2002/000069 FR0200069W WO02056388A2 WO 2002056388 A2 WO2002056388 A2 WO 2002056388A2 FR 0200069 W FR0200069 W FR 0200069W WO 02056388 A2 WO02056388 A2 WO 02056388A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- insert
- sensor
- front face
- electrical connection
- mounting
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 52
- 238000000034 method Methods 0.000 title claims description 14
- 239000011248 coating agent Substances 0.000 claims abstract description 16
- 238000000576 coating method Methods 0.000 claims abstract description 16
- 239000000463 material Substances 0.000 claims abstract description 16
- 238000004519 manufacturing process Methods 0.000 claims abstract description 14
- 230000003287 optical effect Effects 0.000 claims abstract description 12
- 238000002347 injection Methods 0.000 claims description 14
- 239000007924 injection Substances 0.000 claims description 14
- 125000006850 spacer group Chemical group 0.000 claims description 5
- 238000005538 encapsulation Methods 0.000 claims description 3
- 230000000284 resting effect Effects 0.000 claims 1
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 239000002184 metal Substances 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000008595 infiltration Effects 0.000 description 1
- 238000001764 infiltration Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
- H01L2924/1815—Shape
Definitions
- the present invention relates to the field of semiconductor packages having a sensor, in particular an optical, chemical, displacement sensor, acting remotely or by contact.
- the semiconductor components which comprise a sensor are generally mounted in housings which on the one hand must be accessible from the outside to fulfill their function and on the other hand, in most cases, must be protected.
- the semiconductor components are installed in the bottom of the cavity of encapsulation boxes which often have an attached cover made of a transparent material, the bottom wall of the boxes being used to perform the external electrical connections of the component.
- Such arrangements require a large number of manufacturing steps and are not versatile.
- the object of the present invention is in particular to improve and simplify the semiconductor devices provided with a sensor and their production mode.
- the present invention firstly relates to a method of manufacturing a semiconductor package.
- the method according to the invention consists in: placing, in an injection cavity of an injection mold, a semiconductor component, one rear face of which is fixed to a front face of mounting and electrical connection means and of which a front face comprises a sensor, and an insert which comprises an open passage extending in front of said sensor and provided with a plug closing said passage and which has one end bearing on the front face of said component, around said sensor, and a front face bearing against a bottom of said cavity; and injecting a coating material into said cavity so as to encapsulate said mounting and electrical connection means and, peripherally, said semiconductor component and said insert.
- the process according to the invention can advantageously consist of placing an annular seal constituting a spacer between said insert and said semiconductor component.
- the method according to the invention may advantageously consist in placing in said injection cavity an insert provided with centering fins in this cavity.
- the method according to the invention can advantageously consist in placing in said injection cavity an insert provided with a plug installed in its passage.
- the method according to the invention may advantageously consist, after demolding, of installing a transparent plug in the passage of said insert.
- the present invention also relates to a semiconductor package which can be obtained in particular by implementing the above method.
- this housing comprises: a semiconductor component, one rear face of which is fixed to a front face of mounting and electrical connection means and one front face of which comprises a sensor; an insert bearing on the front face of said optical component, around said sensor, and comprising an open passage extending in front of said sensor; a plug installed in said passage of said insert; and means for encapsulating said mounting and electrical connection means, said semiconductor component and said insert, comprising a coating material which surrounds this semiconductor component and this insert.
- said insert is preferably supported on the front face of said optical component by means of an annular seal constituting a spacer.
- said insert can advantageously be fixed to the front face of said optical component by bonding.
- said plug can advantageously be transparent.
- said plug can advantageously be integrated into said insert.
- said insert can advantageously comprise, in its front face, an annular groove.
- said mounting and electrical connection means may advantageously comprise a grid having a platform or mounting plate for said semiconductor component and electrical connection tabs extending outside of the coating material.
- said mounting and electrical connection means may advantageously comprise a mounting and electrical connection plate.
- the coating material preferably extends at least in front of said plate.
- FIG. 1 shows a top view of the semiconductor package of Figure 1, after its manufacture
- FIG. 3 shows a sectional view of the semiconductor package of Figure 1, after its manufacture
- FIG. 4 shows a second semiconductor package according to the present invention, during manufacture
- FIG. 5 shows, in section, a third semiconductor package according to the present invention, during manufacture;
- FIG. 6 shows, in top view partially in section, the third semiconductor package of Figure 5, after its manufacture.
- a semiconductor package 1 which comprises a metal grid 2, known per se, which has a central platform 3 and peripheral tabs 4 for electrical connection.
- the semiconductor package 1 also comprises an insert 11, for example of metal or plastic, which has an annular body 12 placed perpendicular to the semiconductor component 5 and one end of which is in abutment against the front face 7 of the component semiconductor 5, in its zone extending between the sensor 8 and the studs 9. This insert 11 thus determines an access passage 14 opposite the sensor 8.
- the insert 11 has, at the periphery of its end opposite the semiconductor component 5, an annular veil 15 which is extended radially by four fins 16 opposite in pairs and distributed at 90 around the body 12.
- the front face of the plug 17 can also be in contact with the bottom 24.
- the legs 4 of the grid 2 are taken between the parts 19 and 20 of the mold 21 and protrude into the cavity 18.
- the ends of the fins 16 are placed in the corners of the cavity 18 adjacent to its bottom wall 24 and ensure the positioning of the insert 11 relative to the semiconductor component 5.
- the distance between the bottoms 23 and 24 of the cavity 18 determines the pressure force of the rear face 13 of the insert 11 on the front face
- the front face 22 of the insert 11 has an annular groove 25.
- the rear face 13 of the insert 11 could be bonded to the front face 7 of the component 5, the layer of adhesive ensuring a certain flexibility of positioning of the insert 11 in the cavity 18 and a certain control of the pressure force of the insert 11 on the component 5.
- the web 15 and the fins 16 could then be eliminated. That said, we proceed, in a manner known per se, to the injection of a coating material 26 into the cavity 18 of the mold 21 so as to perform an encapsulation operation, this coating material 21 surrounding the plate -form 3 of the grid 2, the semiconductor component 5 and the insert 11 and embedding the inner part of the legs 4 of the grid 2 and the wires 10.
- the insert 11 provided with its plug 17, the passage 14 extending in front of the sensor 8 is protected against any introduction of coating material during the injection operation.
- the annular groove 25 constitute a reserve in the event of frontal infiltration. The semiconductor package 1 being thus produced, o can then remove the plug 17 so as to clear the passage 14 so that the sensor 8 is then accessible from the outside.
- FIG. 4 we see that there is shown a semiconductor package 28 during manufacture, disposed in the cavity 29 of an injection mold 30.
- the semiconductor component 31 is fixed by a layer of adhesive 32 on the front face of a plate 33 for mounting and electrical connection.
- the insert 34 differs from the insert 11 of the previous example by the fact that its fins 35 move away from the bottom 36 of the cavity 29 corresponding to the bottom 24 of the mold 21 of the example previous, the fins 35 coming to bear in the corners of the cavity
- annular seal 40 constituting a spacer is interposed between the rear face 37 of the body 38 of the insert 34, corresponding to the rear face 13 of the insert 11 of the previous example, and the front face. 39 of the semiconductor component 31.
- This seal 40 is preferably glued on the one hand against the face 37 and on the other hand against the face 38 and can ensure a certain flexibility of positioning of the insert 34.
- this coating material is prevented from entering the passage 42 of the insert 34 by a plug 43 installed in this passage 42 and by the seal 40, the latter also making it possible to reduce and control the bearing force of the insert 34 on the semiconductor component 31.
- the fins 35 of l insert 34 are embedded in the coating material 41.
- FIG. 5 and 6 we see that there is shown a semiconductor package 44 which differs from the semiconductor package 1 described with reference to Figures 1 and 2 only in that its insert 45 has a slot 46 formed radially in its body 47 and open on one side.
- a plate 48 for example made of glass, is installed in the slot 46 of the insert 45 and constitutes a plug obstructing the passage 49 of this insert, replacing the plug 17 of the previous example.
- the plate 48 mounted in leaktight manner, is permanently installed in the semiconductor box 44.
- the present invention is not limited to the examples described above. Many alternative embodiments are possible without departing from the scope defined by the appended claims.
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Measuring Fluid Pressure (AREA)
- Light Receiving Elements (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/466,191 US7095123B2 (en) | 2001-01-15 | 2002-01-10 | Sensor semiconductor package, provided with an insert, and method for making same |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0100473A FR2819634B1 (fr) | 2001-01-15 | 2001-01-15 | Boitier semi-conducteur a capteur, muni d'un insert et son procede de fabrication |
FR01/00473 | 2001-01-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2002056388A2 true WO2002056388A2 (fr) | 2002-07-18 |
WO2002056388A3 WO2002056388A3 (fr) | 2003-01-03 |
Family
ID=8858814
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FR2002/000069 WO2002056388A2 (fr) | 2001-01-15 | 2002-01-10 | Boîtier semi-conducteur a capteur, muni d'un insert, et son procede de fabrication |
Country Status (3)
Country | Link |
---|---|
US (1) | US7095123B2 (fr) |
FR (1) | FR2819634B1 (fr) |
WO (1) | WO2002056388A2 (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1420458A2 (fr) | 2002-11-15 | 2004-05-19 | STMicroelectronics Pte Ltd. | Boítier pour dispositif semiconducteur et procédé pour sa fabrication |
CN105277594A (zh) * | 2014-06-06 | 2016-01-27 | 盛思锐股份公司 | 气体传感器封装件 |
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US7127793B2 (en) * | 2002-04-24 | 2006-10-31 | Fuji Photo Film Co., Ltd. | Method of producing solid state pickup device |
WO2004047421A2 (fr) | 2002-11-14 | 2004-06-03 | Donnelly Corporation | Systeme d'imagerie pour vehicule |
US20060003483A1 (en) * | 2003-07-07 | 2006-01-05 | Wolff Larry L | Optoelectronic packaging with embedded window |
US8476591B2 (en) * | 2005-09-21 | 2013-07-02 | Analog Devices, Inc. | Radiation sensor device and method |
US7897920B2 (en) * | 2005-09-21 | 2011-03-01 | Analog Devices, Inc. | Radiation sensor device and method |
CN101816008A (zh) * | 2005-10-28 | 2010-08-25 | 马格纳电子系统公司 | 用于车辆视觉系统的摄像机模块 |
JP4382030B2 (ja) * | 2005-11-15 | 2009-12-09 | 富士通マイクロエレクトロニクス株式会社 | 半導体装置及びその製造方法 |
US8766186B2 (en) | 2006-12-27 | 2014-07-01 | Analog Devices, Inc. | Control aperture for an IR sensor |
US8482664B2 (en) | 2008-10-16 | 2013-07-09 | Magna Electronics Inc. | Compact camera and cable system for vehicular applications |
WO2010091347A1 (fr) | 2009-02-06 | 2010-08-12 | Magna Electronics Inc. | Améliorations apportées à une caméra pour véhicule |
CN102449524B (zh) | 2009-03-25 | 2015-03-11 | 马格纳电子系统公司 | 车辆摄相机和透镜组装 |
TW201104747A (en) * | 2009-07-29 | 2011-02-01 | Kingpak Tech Inc | Image sensor package structure |
DE102011013468A1 (de) * | 2011-03-09 | 2012-09-13 | Micronas Gmbh | Halbleitergehäuse und Verfahren zur Herstellung eines Halbleitergehäuses |
WO2012145501A1 (fr) | 2011-04-20 | 2012-10-26 | Magna Electronics Inc. | Filtre angulaire pour une caméra installée sur un véhicule |
US9871971B2 (en) | 2011-08-02 | 2018-01-16 | Magma Electronics Inc. | Vehicle vision system with light baffling system |
US9596387B2 (en) | 2011-08-02 | 2017-03-14 | Magna Electronics Inc. | Vehicular camera system |
US8802508B2 (en) | 2012-11-29 | 2014-08-12 | Freescale Semiconductor, Inc. | Semiconductor device package |
US9451138B2 (en) | 2013-11-07 | 2016-09-20 | Magna Electronics Inc. | Camera for vehicle vision system |
US9749509B2 (en) | 2014-03-13 | 2017-08-29 | Magna Electronics Inc. | Camera with lens for vehicle vision system |
US10560613B2 (en) | 2015-11-05 | 2020-02-11 | Magna Electronics Inc. | Vehicle camera with modular construction |
US10250004B2 (en) | 2015-11-05 | 2019-04-02 | Magna Electronics Inc. | Method of forming a connector for an electrical cable for electrically connecting to a camera of a vehicle |
US10351072B2 (en) | 2015-11-05 | 2019-07-16 | Magna Electronics Inc. | Vehicle camera with modular construction |
US10230875B2 (en) | 2016-04-14 | 2019-03-12 | Magna Electronics Inc. | Camera for vehicle vision system |
US10142532B2 (en) | 2016-04-08 | 2018-11-27 | Magna Electronics Inc. | Camera for vehicle vision system |
CN107611147B (zh) * | 2016-07-11 | 2020-02-18 | 胜丽国际股份有限公司 | 多芯片塑胶球状数组封装结构 |
US10237456B2 (en) | 2016-08-22 | 2019-03-19 | Magna Electronics Inc. | Vehicle camera assembly process |
FR3073980A1 (fr) * | 2017-11-23 | 2019-05-24 | Stmicroelectronics (Grenoble 2) Sas | Capot d'encapsulation pour boitier electronique et procede de fabrication |
US11683911B2 (en) | 2018-10-26 | 2023-06-20 | Magna Electronics Inc. | Vehicular sensing device with cooling feature |
US11438487B2 (en) | 2019-03-07 | 2022-09-06 | Magna Electronics Inc. | Vehicular camera with thermal interface material |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61134187A (ja) * | 1984-12-04 | 1986-06-21 | Toshiba Corp | 固体撮像デバイス |
JPS63186469A (ja) * | 1987-01-28 | 1988-08-02 | Mitsubishi Electric Corp | 光透過窓を有する半導体装置 |
US4812420A (en) * | 1986-09-30 | 1989-03-14 | Mitsubishi Denki Kabushiki Kaisha | Method of producing a semiconductor device having a light transparent window |
JPH0575935A (ja) * | 1991-09-17 | 1993-03-26 | Toshiba Corp | Ccdモジユール |
US5534725A (en) * | 1992-06-16 | 1996-07-09 | Goldstar Electron Co., Ltd. | Resin molded charge coupled device package and method for preparation thereof |
DE19958229A1 (de) * | 1998-12-09 | 2000-06-15 | Fuji Electric Co Ltd | Optisches Halbleiter-Sensorbauelement |
-
2001
- 2001-01-15 FR FR0100473A patent/FR2819634B1/fr not_active Expired - Fee Related
-
2002
- 2002-01-10 WO PCT/FR2002/000069 patent/WO2002056388A2/fr not_active Application Discontinuation
- 2002-01-10 US US10/466,191 patent/US7095123B2/en not_active Expired - Lifetime
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61134187A (ja) * | 1984-12-04 | 1986-06-21 | Toshiba Corp | 固体撮像デバイス |
US4812420A (en) * | 1986-09-30 | 1989-03-14 | Mitsubishi Denki Kabushiki Kaisha | Method of producing a semiconductor device having a light transparent window |
JPS63186469A (ja) * | 1987-01-28 | 1988-08-02 | Mitsubishi Electric Corp | 光透過窓を有する半導体装置 |
JPH0575935A (ja) * | 1991-09-17 | 1993-03-26 | Toshiba Corp | Ccdモジユール |
US5534725A (en) * | 1992-06-16 | 1996-07-09 | Goldstar Electron Co., Ltd. | Resin molded charge coupled device package and method for preparation thereof |
DE19958229A1 (de) * | 1998-12-09 | 2000-06-15 | Fuji Electric Co Ltd | Optisches Halbleiter-Sensorbauelement |
Non-Patent Citations (3)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 010, no. 329 (E-452), 8 novembre 1986 (1986-11-08) -& JP 61 134187 A (TOSHIBA CORP), 21 juin 1986 (1986-06-21) * |
PATENT ABSTRACTS OF JAPAN vol. 012, no. 465 (E-690), 7 décembre 1988 (1988-12-07) & JP 63 186469 A (MITSUBISHI ELECTRIC CORP), 2 août 1988 (1988-08-02) * |
PATENT ABSTRACTS OF JAPAN vol. 017, no. 404 (E-1405), 28 juillet 1993 (1993-07-28) & JP 05 075935 A (TOSHIBA CORP), 26 mars 1993 (1993-03-26) * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1420458A2 (fr) | 2002-11-15 | 2004-05-19 | STMicroelectronics Pte Ltd. | Boítier pour dispositif semiconducteur et procédé pour sa fabrication |
EP1420458A3 (fr) * | 2002-11-15 | 2005-05-04 | STMicroelectronics Pte Ltd. | Boítier pour dispositif semiconducteur et procédé pour sa fabrication |
CN105277594A (zh) * | 2014-06-06 | 2016-01-27 | 盛思锐股份公司 | 气体传感器封装件 |
Also Published As
Publication number | Publication date |
---|---|
FR2819634A1 (fr) | 2002-07-19 |
US20040077118A1 (en) | 2004-04-22 |
US7095123B2 (en) | 2006-08-22 |
FR2819634B1 (fr) | 2004-01-16 |
WO2002056388A3 (fr) | 2003-01-03 |
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