WO2000061840A1 - Procédé de production de silicium monocristallin - Google Patents
Procédé de production de silicium monocristallin Download PDFInfo
- Publication number
- WO2000061840A1 WO2000061840A1 PCT/RU1999/000117 RU9900117W WO0061840A1 WO 2000061840 A1 WO2000061840 A1 WO 2000061840A1 RU 9900117 W RU9900117 W RU 9900117W WO 0061840 A1 WO0061840 A1 WO 0061840A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- crucible
- crystal
- heater
- speed
- diameter
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
Definitions
- the invention is subject to technology of reception of material and may be used in the process of cultivating a large volume of equipment.
- the crucible is made up of cylindrical and spherical parts, while pulling Crucible from the cylindrical part of the crucible leads to a large proportion of the rotation, while increasing the speed of rotation increases the speed of 5 D ⁇ ugim va ⁇ ian ⁇ m vy ⁇ aschivaniya m ⁇ n ⁇ is ⁇ all ⁇ v ⁇ emniya on v ⁇ aschayuschuyusya za ⁇ av ⁇ u of ⁇ as ⁇ lava in ⁇ igle, s ⁇ s ⁇ yaschem of tsilind ⁇ iches ⁇ y and s ⁇ e ⁇ iches ⁇ y chas ⁇ ey, yavlyae ⁇ sya s ⁇ s ⁇ b, ⁇ edusma ⁇ ivayuschy change chas ⁇ y v ⁇ ascheniya ⁇ iglya and ⁇ dde ⁇ zhaniya ⁇ s ⁇ yann ⁇ y chas ⁇ y v ⁇ ascheniya ⁇ is ⁇ alla
- ⁇ ⁇ ⁇ increases by (0.2--0.5) rpm, and when growing by a spacing of 0.4, ) rpm for each centimeter of the length of the crystal (BS 2077615, ⁇ 30 ⁇ 15/00, 1997).
- BS 2077615, ⁇ 30 ⁇ 15/00, 1997 In addition to the above described methods, they are difficult to operate and ensure a high, standard one-sided supply system.
- a more uniform distribution of acid in the range of metals is regulated by changing the size, the rate and the rate of rotation of the crucible and crucible
- the phenomenon is caused by the effect of a thermal investment, the intensity of a quick growth with an increase in mass Loads and particularly strong occur at the beginning of the process of stretching at a greater depth of the melting of brown.
- the objective of the present invention is to work out the method of producing non-dispersed multiplexes of an aperture with a second-order radionuclide for the separation of a non-destructive oxidizing substance.
- the posed problem is solved by the described method of radiation of a large metal, including the melting of the original winter in the crucible, the introduction of the strain, the extinction
- a protective gas for example, argon
- the alloy stabilizes the temperature 1442 - 1445 ° ⁇ . It closes the valve on the discharge line and, with the help of the valve on the bypass line, sets the pressure of the valve in the furnace chamber equal to 10 - 12 ⁇ . The waste of gas and thus reduces to 1200 nl / min.
- the automatic system for regulating the diam- For this, the speed of pulling the ingot smoothly increases to 2 mm / min and / or
- the obtained mono-crystal has a correct cylindrical shape without distortion of the soil boundaries, and
- k is the number from the interval from 0.1 to 0.5; ⁇ ⁇ n and ⁇ nom - the corresponding internal diameter of the crucible
- ⁇ - the coefficient of the situation, in this example is equal to 1.5 and takes into account the location of the alloy in the vicinity of the heater.
- the numerical value of the coefficient is determined by the experimental method and can vary from 0.5 to 3.0.
- the coefficient of use is equal to 1.5.
- the above value is obtained by expediently disposing of the alloy in the vicinity of the heater, which ensures the equalization of the temperature with the equipments.
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Cette invention se rapporte aux techniques de production de matériaux semiconducteurs, et peut être utilisée lorsque l'on fait croître des monocristaux de silicium selon le procédé de Tchokhalsky. Cette invention concerne essentiellement un procédé de production de silicium monocristallin, lequel consiste à faire fondre le silicium de départ dans un creuset, à introduire des germes, et à étirer le cristal à partir de la masse en fusion sur un germe en rotation. Le processus se déroule dans une atmosphère de gaz inerte, tandis que les sens de rotation du creuset et du cristal sont les mêmes et que le rapport entre les vitesses de rotation du creuset et du cristal est défini par la formule (I) où φcre et φcri représentent respectivement les vitesses de rotation du creuset et du cristal en t/min., k représente un nombre de 0,1 à 0,5, Dint représente le diamètre interne du creuset de quartz en mm, dnom représente le diamètre nominal du monocristal à faire croître en mm, hmf représente la profondeur initiale de la masse en fusion dans le creuset en mm, Hch représente la longueur de la partie chauffante de l'unité de chauffage en mm, et η représente le coefficient de positionnement qui tient compte de la position du creuset contenant la masse en fusion dans la cavité de l'unité de chauffage, ainsi que de la structure de l'unité thermique. Ce coefficient, qui varie de 0,5 à 3,0, est préalablement déterminé de manière expérimentale.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/RU1999/000117 WO2000061840A1 (fr) | 1999-04-14 | 1999-04-14 | Procédé de production de silicium monocristallin |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/RU1999/000117 WO2000061840A1 (fr) | 1999-04-14 | 1999-04-14 | Procédé de production de silicium monocristallin |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2000061840A1 true WO2000061840A1 (fr) | 2000-10-19 |
Family
ID=20130342
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/RU1999/000117 WO2000061840A1 (fr) | 1999-04-14 | 1999-04-14 | Procédé de production de silicium monocristallin |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2000061840A1 (fr) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU899740A1 (ru) * | 1978-05-23 | 1982-01-23 | Особое Конструкторское Бюро Проблемной Лаборатории Радиационной Физики Ереванского Государственного Университета | Способ контрол диаметра кристалла |
US4436577A (en) * | 1980-12-29 | 1984-03-13 | Monsanto Company | Method of regulating concentration and distribution of oxygen in Czochralski grown silicon |
EP0733725A2 (fr) * | 1995-03-24 | 1996-09-25 | Research Development Corporation Of Japan | Croissance d'un monocristal de silicium |
-
1999
- 1999-04-14 WO PCT/RU1999/000117 patent/WO2000061840A1/fr active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU899740A1 (ru) * | 1978-05-23 | 1982-01-23 | Особое Конструкторское Бюро Проблемной Лаборатории Радиационной Физики Ереванского Государственного Университета | Способ контрол диаметра кристалла |
US4436577A (en) * | 1980-12-29 | 1984-03-13 | Monsanto Company | Method of regulating concentration and distribution of oxygen in Czochralski grown silicon |
EP0733725A2 (fr) * | 1995-03-24 | 1996-09-25 | Research Development Corporation Of Japan | Croissance d'un monocristal de silicium |
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