WO1992003741A1 - Federkontaktfeldkörper für ein verdrahtungsträger-/leiterplattenprüfgerät - Google Patents
Federkontaktfeldkörper für ein verdrahtungsträger-/leiterplattenprüfgerät Download PDFInfo
- Publication number
- WO1992003741A1 WO1992003741A1 PCT/EP1990/001331 EP9001331W WO9203741A1 WO 1992003741 A1 WO1992003741 A1 WO 1992003741A1 EP 9001331 W EP9001331 W EP 9001331W WO 9203741 A1 WO9203741 A1 WO 9203741A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- segments
- tubes
- contact
- contact field
- bores
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
Definitions
- the invention relates to a spring contact field body for a wiring carrier / circuit board tester according to the preamble of patent claim 1.
- a printed circuit board test device emerges with a plurality of contact points arranged in the contact field level of the device, which are connected to an electronic control and measuring device and which are connected in the longitudinal direction to the contact points by rigid test pins testing wiring carriers or printed circuit boards are connectable.
- the contact points mentioned are designed as electrically conductive compression springs which are arranged in bores of a spring contact field body made of an electrically insulating material.
- the rigid test pins are supported on one end of the springs held in the bores of the spring contact field body.
- the other ends of the springs held in the bores of the spring contact field body are supported on contact pins of contact field plugs.
- the known spring contact field body is produced, for example, as a fully plastic body by an injection molding process in an injection mold.
- the object of the present invention is therefore to provide a spring contact field body which can be produced comparatively easily without the use of a complicated injection mold.
- the main advantage of the invention is that the manufacture of the spring contact field body is considerably simplified due to its special structure. This can be attributed to the subdivision of the spring contact field body into individual segments which are stacked vertically one above the other. Because these segments each only have a small thickness of, for example, about 3 mm, they can be produced in injection molds with relatively short inserts, and there is no risk of these inserts bending due to their short length of, for example, 3 mm.
- the present spring contact field bodies can be assembled relatively simply in that the individual segments are arranged vertically one above the other and aligned with one another, and in the mutually aligned bores of these segments thin tubes, preferably made of metal, with a very thin wall thickness, preferably in a range of 50 ⁇ m can be inserted.
- the tubes advantageously ensure that smooth transitions are created between the mutually aligned bores of adjacent segments.
- the tubes mentioned cause the segments to be held together in the form of a compact block.
- the smooth transitions between the bores of adjacent segments mentioned prevent damage to the springs inserted into the bores.
- the present spring contact field body is designated by 1 in FIG. 1. It establishes a connection between test pins 2 and the contact pins 3 of a contact field which is preferably formed by contact field plugs 4.
- At the lower end of each driver plate 5 there is a contact plug, not shown, which connects each of the up to 2000 driver plates 5 to an electronic control and measuring device, also not shown, which is located in the lower part of the test Device is arranged. Since neither the contact field plugs nor the driver plates are of essential importance for the invention, these are not explained in more detail.
- the spring contact field body 1 consists of a plurality of disk-shaped segments 6 arranged vertically one above the other.
- each segment 6 there are bores 7 corresponding to the grid of the contact pins 3, each hole having a diameter of approximately 0.8 mm and the distance from bore to bore corresponding to the pitch of the contact pins 3 is 1.27 mm.
- the size of the individual segments 6 can be chosen as desired, so that a desired number of contact pins 3 is detected.
- the dimensions of a segment are 20x20x3mm.
- Such a segment has 256 bores 7.
- the spring contact field body 1 is formed by stacking the segments 6 provided with the bores 7, the segments 6 and therefore also the bores 7 being aligned with one another during the stacking operations. For the sake of simplicity, many holes 7 are represented by dots. Tubes 8 are inserted into the mutually aligned bores 7. The tubes 8 ensure that there is a smooth transition between the mutually aligned bores 7 of adjacent segments 6. The tubes 8 - o -
- a compression spring 9 is inserted into each tube 8, which in the manner already mentioned establishes contact between the end of a test pin 2 facing it and an associated contact pin 3.
- the springs 9 are preassembled in the tube 8 according to FIG. 3, so that these two elements can be inserted as a unit into the bores 7 of the segments 6 stacked one above the other.
- the springs 9 are preferably retained in the tubes 8 by providing them with constrictions or indentations 10 at their end regions, which form contact surfaces for the slightly compressed springs 9 located between them.
- the lengths of the tubes 8 are matched to the lengths of the springs 9.
- the number of segments 6 to be stacked is determined by the lengths of the tubes 8.
- the number of segments 6 and their thicknesses are chosen so that the ends of the tubes 8 in the planes of the -? -
- the spring 4 at both end regions 11, 12, i.e. thus outwards from the resilient region 13, which has turns spaced apart, can be wound with turns lying against one another in the longitudinal direction, which taper in diameter to form an inner cone in the winding direction of the spring and then widen again.
- an inner cone 14 for receiving the tips of the test pins 2 and the contact pins 3 is formed on both ends of these springs 6.
- These springs 4, which are wound from spring steel, can preferably be coated by galvanic deposition with a suitable contact material, the windings lying against one another being able to "grow together" at the front ends.
- the spring can have an inner cone 1.4 at its upper end region 11, as has already been explained in connection with FIG. 4a.
- the opposite end region 12 can be pin-like - -
- This pin-like extension 15 projects into, for example, a conical or cup-shaped depression which is located in the contact field connector 4 or in a contact element 3. 4c, the upper end region 11 of the spring 9 can have the inner cone 14 already explained.
- the lower end region 12 is provided with a contact tongue part 16 which extends directly to an associated contact point on the surface of a driver plate 5. This means that the contact field plug 4 only has to be provided with correspondingly positioned thin circumferential bores 17 through which these contact tongues 16 are introduced when the contact field is being set up.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP19900912005 EP0543808A1 (de) | 1990-08-13 | 1990-08-13 | Federkontaktfeldkörper für ein verdrahtungsträger-/leiterplattenprüfgerät |
PCT/EP1990/001331 WO1992003741A1 (de) | 1990-08-13 | 1990-08-13 | Federkontaktfeldkörper für ein verdrahtungsträger-/leiterplattenprüfgerät |
DE9017923U DE9017923U1 (de) | 1990-08-13 | 1990-08-13 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP1990/001331 WO1992003741A1 (de) | 1990-08-13 | 1990-08-13 | Federkontaktfeldkörper für ein verdrahtungsträger-/leiterplattenprüfgerät |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1992003741A1 true WO1992003741A1 (de) | 1992-03-05 |
Family
ID=8165512
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP1990/001331 WO1992003741A1 (de) | 1990-08-13 | 1990-08-13 | Federkontaktfeldkörper für ein verdrahtungsträger-/leiterplattenprüfgerät |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0543808A1 (de) |
DE (1) | DE9017923U1 (de) |
WO (1) | WO1992003741A1 (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4420268A1 (de) * | 1994-06-10 | 1995-12-14 | Wee Electrotest Engineering Gm | Vorrichtung zur Kontaktierung eines Steckkontaktes |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0030407A1 (de) * | 1979-12-10 | 1981-06-17 | John Fluke Mfg. Co., Inc. | Elektrischer Tastkopf zur Verwendung in Prüfschaltungen für gedruckte Schaltungen und dgl. |
EP0263244A1 (de) * | 1986-09-08 | 1988-04-13 | MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH | Vorrichtung zum elektronischen Prüfen von Leiterplatten mit Kontaktpunkten in extrem feinem Raster (1/20 bis 1/10 Zoll) |
DE7914951U1 (de) * | 1979-05-23 | 1989-07-13 | Feinmetall Gmbh, 7033 Herrenberg, De | |
WO1990002954A1 (de) * | 1988-09-02 | 1990-03-22 | Microcontact Ag | Führung und isolierung von mikrokontaktdornen und -federn mit hilfe von ganzen mehrfachführungsblöcken und verfahren zur herstellung dieser mehrfachführungsblöcke |
-
1990
- 1990-08-13 DE DE9017923U patent/DE9017923U1/de not_active Expired - Lifetime
- 1990-08-13 WO PCT/EP1990/001331 patent/WO1992003741A1/de not_active Application Discontinuation
- 1990-08-13 EP EP19900912005 patent/EP0543808A1/de not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE7914951U1 (de) * | 1979-05-23 | 1989-07-13 | Feinmetall Gmbh, 7033 Herrenberg, De | |
EP0030407A1 (de) * | 1979-12-10 | 1981-06-17 | John Fluke Mfg. Co., Inc. | Elektrischer Tastkopf zur Verwendung in Prüfschaltungen für gedruckte Schaltungen und dgl. |
EP0263244A1 (de) * | 1986-09-08 | 1988-04-13 | MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH | Vorrichtung zum elektronischen Prüfen von Leiterplatten mit Kontaktpunkten in extrem feinem Raster (1/20 bis 1/10 Zoll) |
WO1990002954A1 (de) * | 1988-09-02 | 1990-03-22 | Microcontact Ag | Führung und isolierung von mikrokontaktdornen und -federn mit hilfe von ganzen mehrfachführungsblöcken und verfahren zur herstellung dieser mehrfachführungsblöcke |
Also Published As
Publication number | Publication date |
---|---|
DE9017923U1 (de) | 1993-02-18 |
EP0543808A1 (de) | 1993-06-02 |
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