USD796978S1 - Socket for electronic device testing apparatus - Google Patents

Socket for electronic device testing apparatus Download PDF

Info

Publication number
USD796978S1
USD796978S1 US29/560,253 US201629560253F USD796978S US D796978 S1 USD796978 S1 US D796978S1 US 201629560253 F US201629560253 F US 201629560253F US D796978 S USD796978 S US D796978S
Authority
US
United States
Prior art keywords
socket
electronic device
view
testing apparatus
device testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/560,253
Other languages
English (en)
Inventor
Takashi Kawashima
Shintaro Takaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Assigned to ADVANTEST CORPORATION reassignment ADVANTEST CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KAWASHIMA, TAKASHI, TAKAKI, SHINTARO
Application granted granted Critical
Publication of USD796978S1 publication Critical patent/USD796978S1/en
Assigned to ADVANTEST CORPORATION reassignment ADVANTEST CORPORATION CHANGE OF ADDRESS Assignors: ADVANTEST CORPORATION
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

US29/560,253 2016-03-24 2016-04-05 Socket for electronic device testing apparatus Active USD796978S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2016-6402F JP1561023S (enrdf_load_stackoverflow) 2016-03-24 2016-03-24
JP2016-006402 2016-03-24

Publications (1)

Publication Number Publication Date
USD796978S1 true USD796978S1 (en) 2017-09-12

Family

ID=57122013

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/560,253 Active USD796978S1 (en) 2016-03-24 2016-04-05 Socket for electronic device testing apparatus

Country Status (2)

Country Link
US (1) USD796978S1 (enrdf_load_stackoverflow)
JP (1) JP1561023S (enrdf_load_stackoverflow)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD836088S1 (en) * 2016-08-16 2018-12-18 Mitek Corp., Inc. Sleek ceiling speaker
USD893439S1 (en) * 2018-05-07 2020-08-18 Adura Led Solutions Llc Circuit board having arrangements of light-emitting diodes
USD900759S1 (en) * 2018-11-07 2020-11-03 Rohm Co., Ltd. Semiconductor device
USD902164S1 (en) * 2019-01-24 2020-11-17 Toshiba Memory Corporation Integrated circuit card
USD906273S1 (en) * 2018-11-07 2020-12-29 Rohm Co., Ltd. Semiconductor device
USD933618S1 (en) * 2018-10-31 2021-10-19 Asahi Kasei Microdevices Corporation Semiconductor module
USD967036S1 (en) * 2019-09-26 2022-10-18 Infineon Technologies Ag Electrical contact
USD978116S1 (en) * 2020-06-30 2023-02-14 Audio-Technica Corporation Microphone
USD1010620S1 (en) * 2019-09-09 2024-01-09 Murata Manufacturing Co., Ltd. Module for RFID

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8911266B2 (en) * 2010-06-01 2014-12-16 3M Innovative Properties Company Contact holder
US9039425B2 (en) * 2013-01-21 2015-05-26 Tyco Electronics Corporation Electrical interconnect device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8911266B2 (en) * 2010-06-01 2014-12-16 3M Innovative Properties Company Contact holder
US9039425B2 (en) * 2013-01-21 2015-05-26 Tyco Electronics Corporation Electrical interconnect device

Non-Patent Citations (5)

* Cited by examiner, † Cited by third party
Title
Office Action issued in China Appl. No. 201630224369.0, dated Dec. 9, 2016 , along with an English translation thereof.
Office Action issued in China Appl. No. 201630224369.0, dated Nov. 1, 2016 , along with an English translation thereof.
Office Action issued in Korea Counterpart Patent Appl. No. 30-2016-0017017, dated Oct. 4, 2016 , along with an English translation thereof.
Taiwanese Official Action in TW Appl. No. 103306664, Jul. 20, 2015.
Taiwanese Official Action in TW Appl. No. 103306665, Jul. 20, 2015.

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD836088S1 (en) * 2016-08-16 2018-12-18 Mitek Corp., Inc. Sleek ceiling speaker
USD893439S1 (en) * 2018-05-07 2020-08-18 Adura Led Solutions Llc Circuit board having arrangements of light-emitting diodes
USD933618S1 (en) * 2018-10-31 2021-10-19 Asahi Kasei Microdevices Corporation Semiconductor module
USD1046799S1 (en) 2018-10-31 2024-10-15 Asahi Kasei Microdevices Corporation Semiconductor module
USD900759S1 (en) * 2018-11-07 2020-11-03 Rohm Co., Ltd. Semiconductor device
USD906273S1 (en) * 2018-11-07 2020-12-29 Rohm Co., Ltd. Semiconductor device
USD902164S1 (en) * 2019-01-24 2020-11-17 Toshiba Memory Corporation Integrated circuit card
USD1010620S1 (en) * 2019-09-09 2024-01-09 Murata Manufacturing Co., Ltd. Module for RFID
USD967036S1 (en) * 2019-09-26 2022-10-18 Infineon Technologies Ag Electrical contact
USD978116S1 (en) * 2020-06-30 2023-02-14 Audio-Technica Corporation Microphone

Also Published As

Publication number Publication date
JP1561023S (enrdf_load_stackoverflow) 2016-10-17

Similar Documents

Publication Publication Date Title
USD796978S1 (en) Socket for electronic device testing apparatus
KR101599049B1 (ko) 반도체 칩 검사장치
KR200471076Y1 (ko) 전자부품 테스트용 소켓
US20180080977A1 (en) Electrical test fixture
JP2015065167A5 (enrdf_load_stackoverflow)
JP2008101944A5 (enrdf_load_stackoverflow)
KR20130111066A (ko) 반도체 칩 패키지 테스트 소켓
US9543704B1 (en) Power adapter
TWI257005B (en) Methods and apparatus for testing continuity of electrical paths through connectors of circuit assemblies
US9312650B1 (en) Plug connector, receptacle connector and electrical connector assembly
WO2016007804A3 (en) Orthogonal electrical connector system
US20110294357A1 (en) Connector
JP2015002174A (ja) カードソケットのための接触端子
WO2018004819A3 (en) Connector with structures for bi-lateral decoupling of a hardware interface
TW200720685A (en) Semiconducter test device, performance board and interface plate
KR101157366B1 (ko) 고온 세라믹 다이 패키지 및 ｄｕｔ 보드 소켓
TWM468053U (zh) 電連接器組合
US10420218B2 (en) Compact electronic system and device comprising such a system
CN205843687U (zh) 用于插拔连接器的传感器模块及模块和连接器构成的系统
KR101769566B1 (ko) 검사장치
KR102708761B1 (ko) 컨택트 단자 및 컨택트 단자를 포함하는 소켓
KR101624981B1 (ko) 전자부품 테스트용 소켓
CN205015366U (zh) 一种线束通断测试装置
KR102287237B1 (ko) 반도체 패키지를 수납하기 위한 인서트 조립체 및 이를 포함하는 테스트 트레이
US9287671B1 (en) Plug connector, receptacle connector and electrical connector assembly