USD776552S1 - Probe pin - Google Patents

Probe pin Download PDF

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Publication number
USD776552S1
USD776552S1 US29/530,265 US201529530265F USD776552S US D776552 S1 USD776552 S1 US D776552S1 US 201529530265 F US201529530265 F US 201529530265F US D776552 S USD776552 S US D776552S
Authority
US
United States
Prior art keywords
probe pin
probe
pin
view
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/530,265
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English (en)
Inventor
Hirotada Teranishi
Takahiro Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Assigned to OMRON CORPORATION reassignment OMRON CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SAKAI, TAKAHIRO, TERANISHI, HIROTADA
Application granted granted Critical
Publication of USD776552S1 publication Critical patent/USD776552S1/en
Active legal-status Critical Current
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US29/530,265 2014-12-15 2015-06-15 Probe pin Active USD776552S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2014-27894F JP1529608S (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2014-12-15 2014-12-15
JP2014-027894 2014-12-15

Publications (1)

Publication Number Publication Date
USD776552S1 true USD776552S1 (en) 2017-01-17

Family

ID=53764635

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/530,265 Active USD776552S1 (en) 2014-12-15 2015-06-15 Probe pin

Country Status (3)

Country Link
US (1) USD776552S1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JP1529608S (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
TW (1) TWD177828S (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170138985A1 (en) * 2014-06-16 2017-05-18 Omron Corporation Probe pin and electronic device using the same
USD847757S1 (en) * 2017-08-30 2019-05-07 Kabushiki Kaisha Nihon Micronics Probe pin
USD867183S1 (en) * 2017-02-10 2019-11-19 Kabushiki Kaisha Nihon Micronics Probe pin
USD869305S1 (en) * 2017-02-10 2019-12-10 Kabushiki Kaisha Nihon Micronics Probe pin
USD873161S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
USD873159S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
USD873160S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
USD873686S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD873683S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD873685S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD873684S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD874958S1 (en) * 2018-02-02 2020-02-11 Kabushiki Kaisha Nihon Micronics Electric contact
USD894025S1 (en) * 2018-05-16 2020-08-25 Nidec-Read Corporation Electric characteristic measuring probe
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin
USD1051865S1 (en) * 2022-04-29 2024-11-19 Point Engineering Co., Ltd. Semiconductor probe pin
USD1090440S1 (en) * 2023-01-12 2025-08-26 Johnstech International Corporation Spring probe contact assembly

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
JP2011232181A (ja) 2010-04-28 2011-11-17 Japan Aviation Electronics Industry Ltd プローブピン用コンタクト、プローブピンおよび電子デバイス用接続治具
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
US8366496B2 (en) * 2010-03-18 2013-02-05 Hon Hai Precision Ind. Co., Ltd. Composite contact assembly having lower contact with contact engaging points offset from each other
US8460010B2 (en) * 2009-09-28 2013-06-11 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
TWD157152S (zh) 2012-05-08 2013-11-11 日本麥克隆尼股份有限公司 電接觸元件
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
US8460010B2 (en) * 2009-09-28 2013-06-11 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
US8366496B2 (en) * 2010-03-18 2013-02-05 Hon Hai Precision Ind. Co., Ltd. Composite contact assembly having lower contact with contact engaging points offset from each other
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
JP2011232181A (ja) 2010-04-28 2011-11-17 Japan Aviation Electronics Industry Ltd プローブピン用コンタクト、プローブピンおよび電子デバイス用接続治具
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor
TWD157152S (zh) 2012-05-08 2013-11-11 日本麥克隆尼股份有限公司 電接觸元件
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Non-Patent Citations (11)

* Cited by examiner, † Cited by third party
Title
Taiwanese Office Action issued in TW Appl. No. 104303166 on Oct. 27, 2015.
Taiwanese Office Action issued in TW Appl. No. 104303167 on Oct. 27, 2015.
Taiwanese Office Action issued in TW Appl. No. 104303168 on Oct. 27, 2015.
Taiwanese Office Action issued in TW Appl. No. 104303169 on Oct. 27, 2015.
U.S. Appl. No. 29/530,260, filed Jun. 15, 2015.
U.S. Appl. No. 29/530,261, filed Jun. 15, 2015.
U.S. Appl. No. 29/530,263, filed Jun. 15, 2015.
U.S. Appl. No. 29/530,264, filed Jun. 15, 2015.
U.S. Appl. No. 29/530,266, filed Jun. 15, 2015.
U.S. Appl. No. 29/530,394, filed Jun. 16, 2015.
U.S. Appl. No. 29/530,396, filed Jun. 16, 2015.

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170138985A1 (en) * 2014-06-16 2017-05-18 Omron Corporation Probe pin and electronic device using the same
US9797925B2 (en) * 2014-06-16 2017-10-24 Omron Corporation Probe pin and electronic device using the same
USD867183S1 (en) * 2017-02-10 2019-11-19 Kabushiki Kaisha Nihon Micronics Probe pin
USD869305S1 (en) * 2017-02-10 2019-12-10 Kabushiki Kaisha Nihon Micronics Probe pin
USD847757S1 (en) * 2017-08-30 2019-05-07 Kabushiki Kaisha Nihon Micronics Probe pin
USD873686S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD874958S1 (en) * 2018-02-02 2020-02-11 Kabushiki Kaisha Nihon Micronics Electric contact
USD873160S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
USD873161S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
USD873683S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD873685S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD873684S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD873159S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
USD894025S1 (en) * 2018-05-16 2020-08-25 Nidec-Read Corporation Electric characteristic measuring probe
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin
USD1051865S1 (en) * 2022-04-29 2024-11-19 Point Engineering Co., Ltd. Semiconductor probe pin
USD1090440S1 (en) * 2023-01-12 2025-08-26 Johnstech International Corporation Spring probe contact assembly

Also Published As

Publication number Publication date
TWD177828S (zh) 2016-08-21
JP1529608S (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2015-07-27

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