US8427464B2 - Display device - Google Patents
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- US8427464B2 US8427464B2 US13/002,541 US200913002541A US8427464B2 US 8427464 B2 US8427464 B2 US 8427464B2 US 200913002541 A US200913002541 A US 200913002541A US 8427464 B2 US8427464 B2 US 8427464B2
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Images
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0412—Digitisers structurally integrated in a display
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/042—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by opto-electronic means
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3648—Control of matrices with row and column drivers using an active matrix
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/12—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto
- H01L31/14—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the light source or sources being controlled by the semiconductor device sensitive to radiation, e.g. image converters, image amplifiers or image storage devices
- H01L31/147—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the light source or sources being controlled by the semiconductor device sensitive to radiation, e.g. image converters, image amplifiers or image storage devices the light sources and the devices sensitive to radiation all being semiconductor devices characterised by potential barriers
- H01L31/153—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the light source or sources being controlled by the semiconductor device sensitive to radiation, e.g. image converters, image amplifiers or image storage devices the light sources and the devices sensitive to radiation all being semiconductor devices characterised by potential barriers formed in, or on, a common substrate
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2360/00—Aspects of the architecture of display systems
- G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
- G09G2360/145—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen
- G09G2360/147—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen the originated light output being determined for each pixel
- G09G2360/148—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen the originated light output being determined for each pixel the light being detected by light detection means within each pixel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035272—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
Definitions
- the present invention relates to a display device, and in particular to a display device with a photosensor that has an image input function due to including a photodetection element in a pixel.
- a display device with a photosensor that, due to including a photodetection element such as a photodiode inside a pixel, can detect the brightness of external light and pick up an image of an object that has come close to the display.
- a display device with a photosensor is envisioned to be used as a bidirectional communication display device or display device with a touch panel function.
- a photosensor when using a semiconductor process to form known constituent elements such as signal lines, scan lines, TFTs (Thin Film Transistor), and pixel electrodes on an active matrix substrate, a photodiode, peripheral circuits, and the like are simultaneously formed on the active matrix substrate (see PTL 1).
- a photodiode outputs an electrical signal in accordance with the amount of incident light.
- Each photodiode is provided with a peripheral circuit that includes a capacitor.
- each peripheral circuit accumulates a charge in the capacitor in accordance with the level of the electrical signal output by the photodiode, and furthermore generates a photoreception signal whose voltage level varies in accordance with the amount of accumulated charge.
- each peripheral circuit causes the capacitor to discharge an amount of accumulated charge in accordance with the level of the electrical signal that has been output by the photodiode, and generates a photoreception signal whose voltage level varies in accordance with the amount of charge remaining in the capacitor.
- each peripheral circuit outputs this photoreception signal to a detection circuit provided outside the display region via a readout line that extends in the vertical direction of the screen.
- the detection circuit gathers the signals output by the peripheral circuits, generates image data, performs image processing on the image data, and thereafter outputs the resultant image data to the outside.
- the liquid crystal display device disclosed in PTL 1 enables pickup of an image of an object on the observer side of the display screen of the liquid crystal panel.
- the peripheral circuit of a photodiode is provided inside a pixel as with the display device disclosed in the above-described PTL 1, the peripheral circuit is near elements, wiring, and the common electrode that configure the pixel, thus forming a parasitic capacitor with them.
- a parasitic capacitor influences the operation of the pixel, the photodiode, and the peripheral circuit, particularly when the amount of accumulated charge fluctuates, and may reduce the image quality of a display image and a pick-up image.
- An object of the present invention is to solve the above-described problems and provide a display device including an image input function that can suppress a reduction in the image quality of a display image and a pick-up image due to a parasitic capacitor.
- a display device is a display device including an active matrix substrate on which pixels having an active element and a pixel electrode are disposed in a matrix, the display device including: a photoreception unit provided on the active matrix substrate in correspondence with one or two or more of the pixels, and a driving unit that drives the photoreception unit, wherein the photoreception unit includes a photodiode that outputs an electrical signal in accordance with an amount of received light, a capacitor that accumulates a charge in accordance with the electrical signal from when a reset signal from the driving unit has switched from a high level to a low level to when a readout signal at a high level has been applied from the driving unit, and a switching element that, while the readout signal is at the high level, allows output of a photoreception signal whose output level changes in accordance with the amount of accumulated charge, and in a row selection period, after writing of an image signal to the pixel electrodes in the row selected in the row selection period has
- a reset signal applied to a photoreception unit in the same row is switched from the high level to the low level.
- the present invention enables providing a display device including an image input function that can suppress a reduction in the image quality of a display image and a pick-up image due to a parasitic capacitor.
- FIG. 1 is a diagram schematically showing an overall configuration of a liquid crystal display device according to Embodiment 1 of the present invention.
- FIG. 2 is a circuit diagram showing a circuit configuration of a pixel and a photoreception unit of the liquid crystal display device shown in FIG. 1 .
- FIG. 3 is a cross-sectional diagram showing a specific configuration of a photodiode configuring the photoreception unit of the liquid crystal display device shown in FIG. 1 .
- FIG. 4 is a timing chart showing a waveform of a signal supplied to readout signal wiring RWS, a waveform of a signal supplied to reset signal wiring RST, a waveform of a signal supplied to data lines SL, and fluctuation in the potential of V INT , in the photoreception unit shown in FIG. 2 .
- FIG. 5 is an equivalent circuit diagram showing a configuration of a pixel in a variation of the display device according to Embodiment 1.
- FIG. 6 is a timing chart showing a waveform of a signal supplied to the readout signal wiring RWS, a waveform of a signal supplied to the reset signal wiring RST, a waveform of a signal supplied to the data lines SL, and fluctuation in the potential of V INT , in the photoreception unit shown in FIG. 5 .
- FIG. 7 is an equivalent circuit diagram showing a configuration of a pixel in another variation of the display device according to Embodiment 1.
- FIG. 8 is a timing chart showing a waveform of a signal supplied to the readout signal wiring RWS, a waveform of a signal supplied to the reset signal wiring RST, a waveform of a signal supplied to the data lines SL, and fluctuation in the potential of V INT according to Embodiment 2.
- FIG. 9 is a waveform diagram showing timings of various types of signals in the case of interlace driving according to Embodiment 2.
- a display device is a display device including an active matrix substrate on which pixels having an active element and a pixel electrode are disposed in a matrix, the display device including: a photoreception unit provided on the active matrix substrate in correspondence with one or two or more of the pixels, and a driving unit that drives the photoreception unit, wherein the photoreception unit includes a photodiode that outputs an electrical signal in accordance with an amount of received light, a capacitor that accumulates a charge in accordance with the electrical signal from when a reset signal from the driving unit has switched from a high level to a low level to when a readout signal at a high level has been applied from the driving unit, and a switching element that, while the readout signal is at the high level, allows output of a photoreception signal whose output level changes in accordance with the amount of accumulated charge, and in a row selection period, after writing of an image signal to the pixel electrodes in the row selected in the row selection period has ended, the driving unit switches the reset signal
- a reset signal applied to a photoreception unit in the same row is switched from the high level to the low level.
- the driving unit switches the reset signal applied to the row from the low level to the high level, and after a subsequent predetermined time period has elapsed, switches the reset signal applied to the row from the high level to the low level, and in the next row selection period, the driving unit switches the readout signal applied to the row from the low level to the high level.
- a configuration is possible in which in a row selection period, before writing of an image signal to the pixel electrodes in the row selected in the row selection period starts, the driving unit switches the reset signal applied to the row from the low level to the high level, and after the writing of the image signal has ended, switches the reset signal applied to the row from the high level to the low level, and in the next row selection period, the driving unit switches the readout signal applied to the row from the low level to the high level.
- a configuration is possible in which, furthermore, in a row selection period, before writing that accompanies a change in an image signal to the pixel electrodes in the row selected in the row selection period starts, the driving unit switches the reset signal applied to the row from the low level to the high level, and after the writing that accompanies a change in the image signal has ended, switches the reset signal applied to the row from the high level to the low level, and in the next row selection period, the driving unit switches the readout signal applied to the row from the low level to the high level.
- the switching element is configured by one transistor, wiring that supplies the reset signal is connected to an anode of the photodiode, a control electrode of the transistor and a cathode of the photodiode are connected to one electrode of the capacitor, one of two electrodes other than the control electrode of the transistor is connected to wiring that supplies a constant voltage, and the other of the two electrodes is connected to wiring that outputs the photoreception signal, and wiring that supplies the readout signal is connected to another electrode of the capacitor.
- the switching element is configured by a first transistor and a second transistor
- wiring that supplies the reset signal is connected to an anode of the photodiode
- a control electrode of the first transistor and a cathode of the photodiode are connected to one electrode of the capacitor
- one of two electrodes other than the control electrode of the first transistor is connected to wiring that supplies a constant voltage
- the other of the two electrodes other than the control electrode of the first transistor is connected to one of two electrodes other than a control electrode of the second transistor
- the readout signal wiring is connected to the control electrode of the second transistor
- the one of two electrodes other than the control electrode of the second transistor is connected to wiring that supplies the constant voltage
- the other of the two electrodes other than the control electrode of the second transistor is connected to the readout wiring for output current.
- the switching element is configured by a first transistor, a second transistor, and a third transistor
- wiring that supplies the reset signal is connected to a control electrode of the third transistor
- a control electrode of the first transistor, a cathode of the photodiode, and one of two electrodes other than the control electrode of the third transistor are connected to one electrode of the capacitor
- one of two electrodes other than the control electrode of the first transistor is connected to wiring that supplies a constant voltage
- the other of the two electrodes other than the control electrode of the first transistor is connected to one of two electrodes other than a control electrode of the second transistor
- the readout signal wiring is connected to the control electrode of the second transistor
- the one of two electrodes other than the control electrode of the second transistor is connected to wiring that supplies the constant voltage
- the other of the two electrodes other than the control electrode of the second transistor is connected to the readout wiring for output current
- the other of the two electrodes other than the control electrode of the third transistor is connected to wiring that supplies
- the display device according to the present invention can be favorably implemented as a liquid crystal display device further including a common substrate opposing the active matrix substrate, and liquid crystal sandwiched between the active matrix substrate and the common substrate.
- FIG. 1 is a diagram schematically showing an overall configuration of a liquid crystal display device according to embodiments of the present invention.
- the liquid crystal display device according to the present embodiment includes an active matrix substrate 1 , a common substrate 2 , and a liquid crystal layer (not shown) sandwiched between these two substrates.
- the liquid crystal display device also includes a backlight device that illuminates these two substrates and the liquid crystal layer.
- the active matrix substrate 1 includes a glass substrate on which a plurality of sets of active elements and pixel electrodes are formed in a matrix.
- the region in which the pixels are disposed in a matrix is the display region.
- the active elements and the pixel electrodes have been omitted from FIG. 1 .
- Each pixel is configured by one set of an active element and a pixel electrode.
- the active elements are TFTs (Thin Film Transistor).
- the active matrix substrate 1 also includes a gate driver 3 and a data driver 4 in a region in the periphery of the display region.
- the active elements are connected to the gate driver 3 by gate lines GL that extend horizontally, and are connected to the data driver 4 by data lines SL that extend vertically (see FIG. 2 ).
- wiring (not shown) for forming an accumulation capacitor Cs (see FIG. 2 ) is also formed in the display region.
- the gate driver 3 and the data driver 4 are also formed monolithically by a silicon film, similarly to the active elements, on the glass substrate configuring the active matrix substrate 1 .
- the embodiments of the present invention are not limited to this, and the gate driver 3 and the data driver 4 may be an IC chip.
- the IC chip may be directly mounted on the glass substrate, or may be mounted on an FPC that is connected to the active matrix substrate 1 .
- the liquid crystal display device furthermore includes a control unit 7 that drives the gate driver 3 and the data driver 4 .
- the control unit 7 is connected to an external device 8 .
- the external device 8 is, for example, a computer in the case where the liquid crystal display device is used as a computer monitor. Also, in the case where the liquid crystal display device is used as the display device of a mobile phone or a television, the external device 8 is the control board or the like of the mobile phone or television.
- the external device 8 inputs video data to the control unit 7 .
- the control unit 7 inputs a gate start pulse, a clock signal and a control signal to the gate driver 3 , for example. Accordingly, in conformity with the timing of the clock signal, the gate driver 3 selects a horizontal line of active elements via a gate line GL. The control unit 7 also inputs video data, a control signal, and a clock signal to the data driver 4 . The data driver 4 latches the video data at the timing of the clock signal, and writes the image data to the selected active elements via the data lines SL. According to such operations of the gate driver 3 , the data driver 4 , and the control unit 7 , the pixels are driven and an image is displayed in accordance with the video signal.
- the common substrate 2 is disposed so as to overlap with the display region.
- the common substrate 2 includes a common electrode (not shown) and a color filter.
- the color filter is configured by red (R), green (G), and blue (B) color layers in correspondence with the pixel electrodes. Note that there are no limitations on the configuration of the color layers of the color filter.
- the liquid crystal display device includes a plurality of photoreception units (not shown in FIG. 1 ) that output a photoreception signal in accordance with an amount of incident light, a sensor driving unit 5 that drives the photoreception units, and a detection unit 6 that detects the photoreception signals that have been output by the photoreception units.
- the photoreception units are provided in the display region of the active matrix substrate 1 .
- the sensor driving unit 5 and the detection unit 6 are formed in a region in the periphery of the display region.
- the sensor driving unit 5 and the detection unit 6 are also formed monolithically by a silicon film, similarly to the active elements, on the glass substrate configuring the active matrix substrate 1 .
- FIG. 2 is a circuit diagram showing a circuit configuration of a pixel and a photoreception unit of the liquid crystal display device shown in FIG. 1 .
- each pixel 11 includes a thin film transistor M 1 as an active element.
- the gate terminal of the thin film transistor M 1 is connected to one of the gate lines GL.
- the drain terminal (or the source terminal) of the thin film transistor M 1 is connected to one of the data lines SL.
- the pixel corresponding to the red color filter is noted as 11 r
- the pixel corresponding to the green color filter is noted as 11 g
- the pixel corresponding to the blue color filter is noted as 11 b
- the thin film transistor in the pixel corresponding to the red color filter is noted as M 1 r
- the thin film transistor in the pixel corresponding to the green color filter is noted as M 1 g
- the thin film transistor in the pixel corresponding to the blue color filter is noted as M 1 b .
- the data line for driving the pixel corresponding to the red color filter is noted as SLr
- the data line for driving the pixel corresponding to the green color filter is noted as SLg
- the data line for driving the pixel corresponding to the blue color filter is noted as SLb.
- the letters “r”, “g”, and “b” in the reference signs have been omitted when there is no need to distinguish between the pixels.
- the gate line noted by GL(i) corresponds to the gate line in the i-th row in the display region.
- reset signal wiring RST that supplies a reset signal
- readout signal wiring RWS that supplies a readout signal
- the pixel electrode in each of the pixels 11 and the common electrode of the common substrate 2 form a pixel capacitor Clc (see FIG. 2 ) whose dielectric body is the liquid crystal layer.
- the gate driver 3 selects one of the gate lines GL
- the data driver 4 outputs video data to the data lines SLr, SLg, and SLb, and a charge is accumulated in the pixel capacitors Clc in the selected row in accordance with the video data.
- the transmissivity of illumination light that passes through the liquid crystal layer changes in accordance with the accumulated charge, and thus a video is displayed.
- inversion driving for inverting the polarity of the voltage applied to the liquid crystal layer at a constant interval is generally performed in order to prevent liquid crystal burn-in.
- the voltage (common electrode voltage) VCOM applied to the common electrode is switched in each horizontal period, for example.
- each photoreception unit 10 includes a photodiode PD, a capacitor C INT , and a thin film transistor M 2 .
- one photoreception unit 10 is provided per three pixels, namely a red pixel, a green pixel, and a blue pixel.
- the photodiode PD receives incident light via the common substrate 2 and the liquid crystal layer, and outputs an electrical signal in accordance with the amount of received light.
- a PIN diode is used as the photodiode PD. The configuration of the photodiode PD will be described later with reference to FIG. 3 .
- the capacitor C INT accumulates a charge in accordance with the electrical signal output by the photodiode PD. Also, the charge accumulated by the capacitor C INT is reset by the reset signal output by the sensor driving unit 5 .
- the photoreception unit 10 outputs a photoreception signal VSOUT whose level changes in accordance with the amount of accumulated charge. The start and stop of the output of the photoreception signal VSOUT is performed by the switching on and off of the thin film transistor M 2 , which is controlled based on the readout signal output by the sensor driving unit 5 .
- the anode of the photodiode PD is connected to one of the terminals of the capacitor C INT .
- the cathode of the photodiode PD is connected to the reset signal wiring RST that supplies the reset signal.
- the other terminal of the capacitor C INT is connected to the readout signal wiring RWS that supplies the readout signal.
- the gate terminal of the thin film transistor M 2 is connected so as to branch from wiring that connects the anode of the photodiode PD and the one of the terminals of the capacitor C INT .
- V INT indicates the potential at this branch point.
- the source (or drain) of the thin film transistor M 2 is connected to the data line SLb, and the drain (or source) thereof is connected to the data line SLg.
- the data line SLg is also used as wiring VDD via which a constant voltage V DD is applied to the source (or drain) of the thin film transistor M 2 .
- the data line SLb is also used as wiring OUT via which the photoreception signal VSOUT is output.
- capacitors C p1 to C p8 indicate parasitic capacitors formed by the photoreception units 10 along with the pixels and the common substrate.
- the capacitor C p1 is a parasitic capacitor formed with the readout signal wiring RWS that supplies the readout signal.
- the capacitor C p2 is a parasitic capacitor formed with the data line SLg.
- the capacitor C p3 is a parasitic capacitor formed with the data line SLb.
- the capacitor C p4 is a parasitic capacitor formed with the reset signal wiring RST that supplies the reset signal.
- the capacitor C p5 is a parasitic capacitor formed with the photodiode PD.
- the capacitor C p6 is a parasitic capacitor formed with TFTCOM.
- the capacitor C p7 is a parasitic capacitor formed with the common electrode.
- the capacitor C p8 is a parasitic capacitor formed with the pixel electrode.
- the potential V INT fluctuates due to being influenced by coupling with the parasitic capacitors C p1 to C p8 .
- the value of the capacitor C p8 is relatively high. Accordingly, VSOUT, which is the sensor output, is considerably influenced by fluctuation in the potential of the pixel electrode.
- the configuration of the present embodiment enables obtaining highly precise sensor output by eliminating the influence of the capacitor C p8 .
- FIG. 3 is a cross-sectional diagram showing a specific configuration of a photodiode 20 configuring the photoreception units of the liquid crystal display device shown in FIG. 1 .
- the photodiode 20 is a PIN diode having a lateral structure.
- the photodiode 20 is formed in a silicon film 21 provided on a glass substrate 26 that is the base substrate of the active matrix substrate 1 .
- the silicon film 21 is formed in the process for forming the thin film transistors M 1 and M 2 (see FIG. 2 ), at the same time as the thin film transistors M 1 and M 2 .
- the silicon film 21 and the silicon film forming the thin film transistors M 1 and M 2 are formed by continuous grain silicon (CGS), which is superior in terms of charge transfer rate.
- the silicon film 21 is provided with a p-type semiconductor region (p layer) 22 , an intrinsic semiconductor region (i layer) 23 , and an n-type semiconductor region (n layer) 24 in the stated order along the surface direction.
- the i layer 23 is the photodetection region in the photodiode 20 .
- the i layer 23 needs only be a region that is nearly electrically neutral in comparison with the adjacent p layer 22 and n layer 24 .
- the i layer 23 is preferably a region that includes no impurities whatsoever, or a region whose conduction electron density and hole density are equivalent.
- the photodiode 20 is covered by interlayer insulating films 27 and 28 .
- wiring connected to the p layer 22 is indicated by 25
- wiring connected to the n layer 24 is indicated by 26
- the liquid crystal layer is indicated by 29 . Only the outline of the common substrate 2 is shown.
- the detection unit 6 includes a sampling circuit and an amplification circuit.
- the detection unit 6 converts the photoreception signal VSOUT into a voltage signal, and furthermore amplifies the voltage signal, thus generating an image signal VOUT.
- the image signal VOUT is output from the detection unit 6 to the control unit 7 , and thereafter output to the external device 8 .
- the sensor driving unit 5 outputs a reset signal and a readout signal for each horizontal line of photoreception units 10 . For this reason, the detection unit 6 outputs the image signal VOUT for each photoreception signal output by a horizontal line of photoreception units 10 .
- FIG. 4 is a timing chart showing a waveform of a signal supplied to the readout signal wiring RWS, a waveform of a signal supplied to the reset signal wiring RST, a waveform of a signal supplied to the data lines SL, and fluctuation in the potential of V INT , in the photoreception unit 10 shown in FIG. 2 .
- V INT in FIG. 4 indicates fluctuation in the potential of V INT in the photoreception unit 10 provided in the pixel that is in the i-th row and furthermore the x-th column (noted as P(i,x) in FIG. 4 ).
- the sensor driving unit 5 successively selects each set of reset signal wiring RST(i) and readout signal wiring RWS(i) shown in FIG. 2 at a predetermined time interval. Accordingly, each photosensor row in the pixel region 1 from which a signal charge is to be read is successively selected.
- the end of the wiring OUT is connected to the drain of a thin film transistor M 3 , which is an insulated gate field effect transistor. Also, the drain of the thin film transistor M 3 is connected to the output wiring SOUT. The source of the thin film transistor M 3 is connected to wiring VSS. The gate of the thin film transistor M 3 is connected to a reference voltage power supply (not shown) via reference voltage wiring VB.
- V INT in P(i,x) becomes 0 V
- the charge accumulated in the capacitor C INT is reset.
- the reset signal is switched from the high level to the low level (e.g., ⁇ 4 V)
- a negative voltage is applied to the cathode of the photodiode PD in P(i,x). If light is incident on the photodiode PD in this state, a charge is accumulated in the capacitor C INT , and V INT , drops in accordance with the amount of accumulated charge.
- V INT in P(i,x) steeply rises to the threshold voltage of the thin film transistor M 2 or higher and becomes a voltage in accordance with the amount of charge accumulated in the capacitor C INT .
- the thin film transistor M 2 enters the conductive state due to the channel thereof being opened, thus functioning as a source follower amplifier along with the bias thin film transistor M 3 provided at the end of the wiring OUT in each row.
- the output signal voltage from the output wiring SOUT connected to the drain of the thin film transistor M 3 corresponds to the integral value of a photocurrent I PHOTO generated due to light that has been incident on the photodiode PD in the integration period.
- the readout signal applied to the i-th row at the time t 3 is applied in the frame (the (m+1)-th frame in FIG. 4 ) after the frame in which the reset signal is applied to the i-th row (the m-th frame in FIG. 4 ).
- V INT of the pixel P(i,x) in the i-th row is not influenced by the parasitic capacitor C p8 shown in FIG. 2 in the integration period.
- V INT fluctuates due the influence of a parasitic capacitor that accompanies the writing of data to the pixel electrodes in the i-th row.
- the fluctuation in V INT during this period is not readout as the photoreception signal VSOUT, and therefore there is no influence whatsoever on the sensor output. The same follows for the place indicated by an arrow A 2 .
- a reset signal is applied to the reset wiring in the same i-th row, and in the (m+1)-th frame, sensor output is read out from the photoreception units 10 in the i-th row. Accordingly, fluctuation in the potential of the pixel electrodes that accompanies the writing of data to the pixel electrodes in the i-th row does not influence the sensor output, and it is possible to obtain accurate sensor output that is in accordance with the amount of received light.
- the present invention is also applicable to a configuration in which two or three thin film transistors serve as peripheral circuits.
- FIG. 5 is an equivalent circuit diagram showing a configuration of a pixel in this variation of the display device according to Embodiment 1.
- a photoreception unit 30 includes a thin film transistor M 4 in addition to the photodiode PD, the capacitor C INT , and the thin film transistor M 2 .
- FIG. 5 is merely an equivalent circuit diagram, and the disposition of the photodiode PD and the elements of peripheral circuits is not limited to the layout shown in FIG. 5 .
- one of the electrodes of the capacitor C INT is connected to the cathode of the photodiode PD and the gate electrode of the thin film transistor M 2 , and the other electrode of the capacitor C INT is connected to the wiring VDD.
- the drain (or source) of the thin film transistor M 2 is connected to the wiring VDD, and the source (or drain) thereof is connected to the drain (or source) of the thin film transistor M 4 .
- the gate of the thin film transistor M 4 is connected to the readout signal wiring RWS.
- the source (or drain) of the thin film transistor M 4 is connected to the wiring OUT.
- FIG. 6 is a timing chart showing a waveform of a signal supplied to the readout signal wiring RWS, a waveform of a signal supplied to the reset signal wiring RST, a waveform of a signal supplied to the data lines SL, and fluctuation in the potential of V INT , in the photoreception unit 30 shown in FIG. 5 .
- the high level of the readout signal is 8 V, and the low level thereof is 0 V.
- the photodiode PD becomes forward biased.
- the thin film transistor M 2 enters the on state, the readout signal supplied to the readout signal wiring RWS in the same i-th row is at the low level, and the thin film transistor M 4 is in the off state, and therefore nothing is output to the wiring OUT.
- the reset signal in the i-th row returns to the low level, and thus the integration period for photocurrent in the photoreception units 30 in the i-th row begins.
- the integration period time t 2 to t 3
- current from the photodiode PD flows out of the capacitor C INT , and thus the capacitor C INT discharges.
- V INT drops from the reset potential (8 V in this example) in accordance with the intensity of incident light.
- the peripheral circuits of the photodiode PD are desirably designed such that the sensor output is the lowest in the case where the photodiode PD has been irradiated with light whose brightness is the maximum value that is to be detected, that is to say, such that the potential (V INT ) of the gate electrode of the thin film transistor M 2 takes a value that slightly exceeds the threshold in this case.
- the value of V INT falls below the threshold of the thin film transistor M 2 and the thin film transistor M 2 enters the off state, and thus nothing is output to the wiring OUT.
- the readout signal (the signal supplied to the readout signal wiring RWS) for the i-th row rises, and thus the readout period begins.
- the readout signal for the i-th row rises to the high level, and thus the thin film transistor M 4 enters the on state. Accordingly, output from the photoreception units 30 in the i-th row is output from the thin film transistor M 2 to the wiring OUT via the thin film transistor M 4 .
- the thin film transistor M 2 functions as a source follower amplifier along with the bias thin film transistor M 3 provided at the end of the wiring OUT in each column.
- the output signal voltage from the output wiring SOUT corresponds to the integral value of the photocurrent generated due to light that has been incident on the photodiode PD in the integration period.
- FIG. 7 is an equivalent circuit diagram showing a configuration of a pixel of another variation of the display device according to Embodiment 1.
- a photoreception unit 40 includes a thin film transistor M 5 in addition to the photodiode PD, the capacitor C INT , and the thin film transistors M 2 and M 4 .
- FIG. 7 is merely an equivalent circuit diagram, and the disposition of the photodiode PD and the elements of the peripheral circuits is not limited to the layout shown in FIG. 7 .
- one of the electrodes of the capacitor C INT is connected to the cathode of the photodiode PD, and the other electrode of the capacitor C INT is connected to GND.
- the gate of the thin film transistor M 2 is also connected to the cathode of the photodiode PD.
- the drain (or source) of the thin film transistor M 2 is connected to the wiring VDD, and the source (or drain) thereof is connected to the drain (or source) of the thin film transistor M 4 .
- the gate of the thin film transistor M 4 is connected to the readout signal wiring RWS.
- the source (or drain) of the thin film transistor M 4 is connected to the wiring OUT.
- the gate of the thin film transistor M 5 is connected to the reset signal wiring RST, the drain (or source) thereof is connected to the wiring VDD, and the source (or drain) thereof is connected to the cathode of the photodiode PD.
- the drains of the thin film transistors M 4 and M 5 are both connected in common to constant voltage wiring (wiring VDD) is shown in this example, a configuration is possible in which they are connected to mutually different constant voltage wiring.
- the waveforms of the reset signal supplied from the reset signal wiring RST and the readout signal supplied from the readout signal wiring RWS are the same as the waveforms ( FIG. 6 ) of the signals for the photoreception unit 30 shown in FIG. 5 .
- the waveform diagram showing a relationship between input signals (reset signal and readout signal) and V INT in the photoreception unit 40 is the same as the waveforms ( FIG. 6 ) for the photoreception unit 30 shown in FIG. 5 .
- the following description therefore also makes reference to FIG. 6 .
- the high level of the reset signal for the photoreception unit 40 shown in FIG. 7 is set to the potential at which the thin film transistor M 5 enters the on state.
- the high level of the reset signal is 8 V, and the low level thereof is 0 V.
- the high level of the readout signal is 8 V, and the low level thereof is 0 V.
- the reset signal (the signal supplied to the reset signal wiring RST) for the photoreception units 40 in the i-th row returns to the low level, and thus the photocurrent integration period (time t 2 to t 3 ) begins.
- the reset signal falls to the low level, and thus the thin film transistor M 5 in the photoreception units 40 in the i-th row enters the off state.
- the anode of the photodiode PD is at GND and the cathode thereof is at 8 V, a reverse bias is applied to the photodiode PD.
- the sensor circuits are desirably designed such that the sensor output is the lowest in the case where the photodiode PD has been irradiated with light whose brightness is the maximum value that is to be detected, that is to say, such that the potential (V INT ) of the gate electrode of the thin film transistor M 2 takes a value that slightly exceeds the threshold in this case.
- the potential (V INT ) of the gate electrode of the thin film transistor M 2 takes a value that slightly exceeds the threshold in this case.
- the readout signal (the signal supplied to the readout signal wiring RWS) for the photoreception units 40 in i-th row rises, and thus the readout period begins.
- the readout signal for the photoreception units 40 in the i-th row rises to the high level, and thus the thin film transistor M 4 of the photoreception units 40 in the i-th row enters the on state. Accordingly, output from the thin film transistor M 2 of the photoreception units 40 in the i-th row is output to the wiring OUT via the thin film transistor M 4 .
- the thin film transistor M 2 of the photoreception units 40 in the i-th row functions as a source follower amplifier along with the bias thin film transistor M 3 provided at the end of the wiring OUT in each column.
- the output signal voltage from the output wiring SOUT corresponds to the integral value of the photocurrent generated due to light that has been incident on the photodiode PD in the integration period.
- V INT fluctuates due to the influence of a parasitic capacitor that accompanies the writing of data to the pixel electrodes in the i-th row.
- the fluctuation in V INT during this period is not readout as the photoreception signal VSOUT, and therefore there is no influence whatsoever on the sensor output. The same follows for the place indicated by the arrow A 4 .
- Embodiment 2 of the present invention below is a description of a display device according to Embodiment 2 of the present invention. Note that the same reference numerals have been given to constituent elements that have functions likewise to those of the constituent elements described in Embodiment 1, and detailed descriptions thereof have been omitted.
- the peripheral circuit of the photodiode PD in the photoreception unit 40 of the display device according to Embodiment 2 includes the capacitor C INT and the three thin film transistors M 2 , M 4 , and M 5 .
- FIG. 8 is a timing chart showing a waveform of the signal supplied to the readout signal wiring RWS, a waveform of the signal supplied to the reset signal wiring RST, a waveform of the signal supplied to the data lines SL, and fluctuation in the potential of V INT according to the present embodiment.
- the high level of the reset signal for the photoreception unit 40 shown in FIG. 7 is set to the potential at which the thin film transistor M 5 enters the on state.
- the high level of the reset signal is 8 V (V DD ), and the low level thereof is 0 V.
- the high level of the readout signal is 8 V, and the low level thereof is 0 V.
- the reset signal switches from the low level to the high level. Accordingly, the thin film transistor M 5 in the photoreception units 40 in the i-th row enter the on state, and V INT is reset to V DD .
- the reset signal is constantly kept at the high level while the image signal is being written to the pixel electrodes connected to GL in the i-th row.
- the reset signal for the i-th row switches from the high level to the low level. Accordingly, the potential of V INT is sustained at the reset potential (0 V) from the time t 1 to the time t 2 , and photocurrent from the photodiode PD in the photoreception units 40 in the i-th row flows out of the capacitor C INT , and thus the capacitor C INT discharges. Specifically, at the time t 2 , the reset signal falls to the low level, and thus the thin film transistor M 5 in the photoreception units 40 in the i-th row enter the off state.
- the anode of the photodiode PD is at GND, and the cathode thereof is at 8 V, a reverse bias is applied to the photodiode PD.
- photocurrent from the photodiode PD in the photoreception units 40 in the i-th row flows out of the capacitor C INT , and thus the capacitor C INT discharges.
- V INT drops from the reset potential (8 V in this example) in accordance with the intensity of incident light.
- the readout signal (the signal supplied to the readout signal wiring RWS) for the photoreception units 40 in i-th row rises at the time t 3 , and thus the readout period begins.
- the readout signal for the photoreception units 40 in the i-th row rises to the high level, and thus the thin film transistor M 4 of the photoreception units 40 in the i-th row enters the on state. Accordingly, output from the thin film transistor M 2 of the photoreception units 40 in the i-th row is output to the wiring OUT via the thin film transistor M 4 .
- the thin film transistor M 2 of the photoreception units 40 in the i-th row functions as a source follower amplifier along with the bias thin film transistor M 3 provided at the end of the wiring OUT in each column.
- the output signal voltage from the output wiring SOUT corresponds to the integral value of the photocurrent generated due to light that has been incident on the photodiode PD in the integration period.
- the reset signal (the signal supplied to the reset signal wiring RST) for the i-th row is kept at the high level during the period for writing to the pixel electrodes in the i-th row, and after the writing to the pixel electrodes has been completed, the reset signal is switched to the low level, and the integration period starts. Accordingly, the writing to the pixel electrodes has no influence on V INT of the photoreception units 40 , thus enabling obtaining highly precise sensor output.
- FIG. 9 is a waveform diagram showing timings of various types of signals in the case of interlace driving.
- the writing of one entire screen is performed with use of two frames, namely a frame in which an image signal is written to only odd-numbered rows, and a frame in which an image signal is written to only even-numbered rows.
- the reading out of sensor output from the photoreception units 40 is performed at the rate of once per two display frames. Accordingly, assuming that the writing cycle of the image signal is 60 Hz, sensor output will be read out at 30 Hz.
- writing to the odd-numbered rows is performed in the k-th display frame
- writing to the even-numbered rows is performed in the (k+1)-th display frame.
- a new image signal is supplied to only the pixel electrodes in the i-th (i being an odd number) row, and the potential of the previous frame is sustained in the pixel electrodes in the even-numbered rows.
- a new image signal is supplied to only the pixel electrodes in the (i+1)-th (i being an odd number) row, and the potential of the previous frame is sustained in the pixel electrodes in the odd-numbered rows.
- the reset signal (the signal supplied to the reset signal wiring RST) is sustained at the high level while writing to the odd-numbered rows is being performed in the k-th display frame. Then, after the writing to the odd-numbered rows has ended, the reset signal is switched from the high level to the low level, and thus the integration period starts, as described above.
- the reset signal is sustained at the high level while writing to the even-numbered rows is performed. Then, after the writing to the even-numbered rows has ended, the reset signal is switched from the high level to the low level, and thus the integration period starts, as described above.
- the embodiments of the present invention are not limited to only these specific examples, and it is possible to make various changes within the scope of the invention.
- a liquid crystal display device is described as an example in the above embodiments, the display device of the present invention is not limited to a liquid crystal display device.
- the present invention is industrially applicable as a display device.
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US20110109601A1 (en) | 2011-05-12 |
WO2010007890A1 (fr) | 2010-01-21 |
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