US6072179A - Method and apparatus using an infrared laser based optical probe for measuring voltages directly from active regions in an integrated circuit - Google Patents

Method and apparatus using an infrared laser based optical probe for measuring voltages directly from active regions in an integrated circuit Download PDF

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US6072179A
US6072179A US09/130,741 US13074198A US6072179A US 6072179 A US6072179 A US 6072179A US 13074198 A US13074198 A US 13074198A US 6072179 A US6072179 A US 6072179A
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integrated circuit
laser beam
active region
method described
region
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Mario J. Paniccia
Valluri R. M. Rao
Wai Mun Yee
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Intel Corp
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Intel Corp
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Assigned to INTEL CORPORATION reassignment INTEL CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: YEE, WAI MUN, PANICCIA, MARIO J., RAO, VALLURI R.M.
Priority to TW088111791A priority patent/TW444125B/zh
Priority to EP99937303A priority patent/EP1102999B1/en
Priority to IL14119599A priority patent/IL141195A/en
Priority to PCT/US1999/016275 priority patent/WO2000008478A1/en
Priority to KR10-2001-7001619A priority patent/KR100504135B1/ko
Priority to DE69927387T priority patent/DE69927387T2/de
Priority to JP2000564060A priority patent/JP4846902B2/ja
Priority to HK01104642.3A priority patent/HK1033978B/en
Priority to AU52166/99A priority patent/AU5216699A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits

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  • the present invention relates generally to integrated circuit testing and, more specifically, the present invention relates to optical-based probing of integrated circuits.
  • Flip chip technology is also known as controlled collapse chip connection (C4) or flip chip packaging.
  • C4 controlled collapse chip connection
  • flip chip packaging technology the integrated circuit die is flipped upside down. This is opposite to how integrated circuits are packaged today using wire bond technology. By flipping the die upside down, ball bonds may be used to provide direct electrical connections from the bond pads directly to the pins of the flip chip package.
  • FIG. 1A illustrates integrated circuit packaging 101 which utilizes wire bonds 103 instead of ball bonds to electrically connect integrated circuit connections in integrated circuit die 105 through metal interconnects 109 to the pins 107 of package substrate 111.
  • wire bonds 103 instead of ball bonds to electrically connect integrated circuit connections in integrated circuit die 105 through metal interconnects 109 to the pins 107 of package substrate 111.
  • FIG. 1B illustrates flip chip packaging 151 with the integrated circuit die 155 flipped upside down.
  • the ball bonds 153 of flip chip packaging 151 provide more direct connections between the integrated circuit die 155 and the pins 157 of package substrate 161 through metal interconnects 159.
  • the inductance problems associated with typical integrated circuit packaging technologies that use wire bonds are minimized.
  • flip chip technology allows connections to be placed anywhere on the integrated circuit die surface. This leads to a very low inductance power distribution to the integrated circuit which is another major advantage of flip chip.
  • a consequence of the integrated circuit die 155 being flipped upside down in flip chip packaging 151 is that access to internal nodes of the integrated circuit die 155 for testing purposes has become a considerable challenge.
  • the silicon debug phase of a new product that is designed to be packaged into flip chip it is often necessary to probe electrical signals from internal nodes of the chip, insitu, while the chip is packaged in its native flip chip packaging environment.
  • Important data include measuring device parameters such as, but are not limited to, voltage levels, timing information, current levels and thermal information.
  • FIG. 2 illustrates a prior art method used to probe active doped regions in integrated circuits.
  • a device under test (DUT) 231 includes an active region 239 and non active region (metal) 241.
  • a laser 221 is positioned to focus a laser beam 223 through a beam splitter 225, a birefringent beam splitter 227 and an objective lens 229 through the back side of the silicon of DUT 231 on the doped region 239 and metal 241.
  • birefringent beam splitter 227 separates the laser beam 223 into two separate laser beams, a probe laser beam 235 and reference laser beam 237.
  • Both probe laser beam 235 and reference laser beam 237 are reflected from active region 239 and metal 241, respectively, back through objective lens 229 into birefringent beam splitter 227. Probe laser beam 235 and reference laser beam 237 are then recombined in birefringent beam splitter 227 and are guided into detector 233 through beam splitter 225.
  • waveforms may be detected with detector 233 through the silicon substrate of DUT 231. Detection is possible due to the plasma-optical effect in which the refractive index of a region of free charge is different to a region with no charge.
  • the application of a bias causes the free charge, and hence the refractive index, in the probed region to be modulated whereas the refractive index of the region under the reference beam is unaltered. This results in phase shift between probe beam 235 and reference beam 237.
  • detector 233 is able to generate an output signal 241 that is proportional to the charge modulation caused by operation of the P-N junction region under the probe.
  • This optical measurement can then be combined with conventional stroboscopic techniques to measure high frequency charge and hence voltage waveforms from the P-N junction region 239.
  • CMOS complementary metal oxide semiconductor
  • channels of MOS devices are lateral whereas the base-emitter junctions of bipolar devices are vertical, direct measurement of charge modulation in the channel of an MOS device is not possible due to prohibitively small laser spot size required which is far below that of the wavelength of light in silicon.
  • Another prior art optical technique for probing integrated circuits utilizes the electro-optic effect or Pockels effect.
  • This electro-optic effect involves measuring the change in the optical index of refraction that occurs in an asymmetrical crystal when an electric field is applied.
  • the refractive index of electro-optic materials changes when an electric field is applied.
  • the polarization of an optical beam passing through the electro-optic material then changes according to the strength of the electric field or voltage impressed across the electro-optic material.
  • FIG. 3 illustrates an application of the electro-optic effect to an integrated circuit utilizing an asymmetrical crystal such as a gallium arsenide substrate 301.
  • a fringing electric field 307 exists between electrodes 305.
  • a probe beam 303 enters from the back side of substrate 301, passes through the fringing electric field 307 and is reflected from an electrode 305.
  • the electric field 307 can be measured. It is appreciated, however, that although this technique may be utilized in gallium arsenide based integrated circuits, electro-optic sampling in silicon is not possible because silicon is a symmetrical crystal and hence does not exhibit the electro-optic or Pockels effect.
  • CMOS integrated circuits through the back side of silicon.
  • Such a method should be able to probe active regions of a CMOS integrated circuit through the back side of silicon without the need for reference laser beam to be reflected off a metal near the doped region to be probed.
  • this method should be compatible with present day CMOS integrated circuit technology.
  • a method and an apparatus for detecting a signal in an integrated circuit includes the steps of directing an infrared optical beam through a back side of a semiconductor substrate of the integrated circuit through a depletion region of the integrated circuit.
  • the depletion region is modulated in response to the signal.
  • the method also includes the step of detecting an amplitude modulation of a reflected infrared optical beam passed through the depletion region through the back side of the semiconductor substrate.
  • FIG. 1A is an illustration showing present day wire bond technology.
  • FIG. 1B is an illustration showing flip chip or flip chip packaging technology.
  • FIG. 2 is a diagram of a prior art method of probing an active region through the back side of silicon bipolar junction transistor using two laser beams and measuring the phase shift due to charge density modulation of one of the laser beams with respect to the other laser beam.
  • FIG. 3 is a diagram of a prior art method of optical probing integrated circuits using the electro-optic effect used in gallium arsenide substrate.
  • FIG. 4 is a diagram of an active region being probed using a single laser beam in accordance with the teachings of the present invention.
  • FIG. 5 is an illustration showing various waveforms which may be generated using the present invention.
  • FIG. 6 is an illustration of a depletion region in a P-N junction being probed by a single laser beam in accordance with the teachings of the present invention.
  • FIG. 7 is a graph illustrating plots of the measured electro-absorption as a function of wavelength in a highly doped silicon substrate with a high voltages applied across the substrate and measured at various temperatures.
  • FIG. 8 is a diagram of another embodiment of the present invention that probes and monitors an active region in accordance with the teachings of the present invention.
  • FIG. 9A is a diagram illustrating free carriers near a P-N junction during the absence of a nearby depletion region.
  • FIG. 9B is a diagram illustrating the absence of free carriers in a depletion region near a P-N junction.
  • a method and an apparatus for detecting a voltage in an active region of an integrated circuit disposed in a semiconductor is disclosed.
  • numerous specific details are set forth, such as for example wavelengths and energy values, in order to provide a thorough understanding of the present invention. It will be apparent, however, to one having ordinary skill in the art that the specific detail need not be employed to practice the present invention. In other instances, well-known materials or methods have not been described in detail in order to avoid obscuring the present invention.
  • One embodiment of the present invention provides a method and apparatus for measuring electric fields, and hence voltages, directly from an active region of an integrated circuit with a focused infrared (IR) laser beam through the back side of a semiconductor such as silicon.
  • IR infrared
  • One embodiment of the present invention directly probes integrated circuit active regions through the silicon back side of the chip using infrared laser based techniques. Since silicon is partially transparent to infrared light, one can focus the infrared laser beam through a partially thinned silicon integrated circuit to directly reach the active regions.
  • FIG. 4 shows an embodiment of the present invention which allows an integrated circuit active region 403 to be probed through the back side of a semiconductor in accordance with the teachings of the present invention.
  • An optical source or laser 407 is positioned to provide an optical beam or laser beam 413 which is focused on an active region 403.
  • Laser beam 413 passes through a beam splitter 409 and an objective lens 411 which focuses the laser beam 413 on active region 403.
  • Laser beam 413 passes through the substrate and active region 403, reflects off the contact/metal behind the active region and passes back through the active region 403 and the substrate.
  • the reflected laser beam 415 returns back through objective lens 411 and is guided into detector 417 through beam splitter 409.
  • Detector 417 generates an output signal 419 which corresponds to the voltage in the active region 403.
  • detector 417 is included in an optical detection system which detects amplitude modulations in reflected laser beam 415 and attributes the modulations in amplitude to the voltage in the active region 403.
  • DUT 405 is a CMOS integrated circuit disposed in silicon accessible from the back side of the substrate.
  • DUT 405 is a flip chip packaged product. Since the presently described technique detects amplitude modulation as opposed to phase modulation in the reflected beam, the need for a reference beam for the interferometric phase detection is eliminated.
  • DUT 405 is partially thinned to a thickness of approximately 100 to 200 ⁇ m before probing, to allow increased transmission of laser beam 413 through the highly doped silicon substrates, as used in modern VLSI integrated circuits, and correspondingly increases the reflected laser beam 415 returning through the back side of the silicon of DUT 405.
  • laser 407 is a mode locked laser operating at a wavelength of approximately 1.064 ⁇ m.
  • Operation of the present invention is as follows. Assume a focused laser beam 413 of power P impinges on a P-N junction 403. If the energy of the photons of laser beam 413 is greater than or equal to the band gap energy of the silicon of DUT 405, there will be some photo-absorption ⁇ P of the laser beam in the P-N junction. ⁇ P and P are related by the fundamental absorption coefficient ⁇ as given by:
  • ⁇ (E) is the functional relationship between electro-absorption and the electric field.
  • the laser power detected by detector 417 is P 0 . If the same laser beam 413 is moved onto an active region 403 the laser power then seen by the detector is reduced by ⁇ P 0 to P- ⁇ P 0 due to photo-absorption in the P-N junction.
  • an AC electric field E(t) is applied to the P-N junction, the laser power seen by the detector 417 will now be:
  • ⁇ is the functional relationship between electro-absorption and the electric field E(t).
  • the probing laser beam will be reflected both from the metal 406 and the oxide-active region interface 408.
  • the latter arises because the refractive index of the silicon forming the P-N junction and oxide are different.
  • electro-absorption there is also electro-refraction, which leads to a modulation in the refractive index in the P-N junction as a function of the voltage.
  • the portion of the reflected laser beam that originated at the oxide-P-N junction interface will also be modulated due to this effect. This effect is smaller than the electro-absorption effect.
  • the two effects combine to give an overall amplitude modulation in the reflected laser power as seen by the detector 417.
  • FIG. 6 is an illustration having increased detail of an active region 603 in a DUT 605.
  • active region 603 is an N-doped region in a P-doped silicon substrate.
  • another embodiment of the present invention may utilize a P-doped active region in an N-doped substrate.
  • Laser beam 609 is shown passing through the back side of the silicon of DUT 605 into active region 603 through oxide film 604 and reflecting from metal 607 back out of the back side of the silicon of DUT 605.
  • laser beam 609 is an infrared laser beam and is therefore able to pass through the silicon of DUT 605 since silicon is partially transparent to infrared light.
  • depletion region 611 When a bias is applied to active region 603, a depletion region 611 is increased at the P-N junction interface between active region 603 and the silicon substrate of DUT 605. With the high doping densities of the active areas, region 603 and substrate of DUT 605, the depletion region 611 at the P-N junction interface is very narrow. In one embodiment of the present invention, depletion region 611 is only about 70 nm thick. Therefore, when a typical integrated circuit operating voltage is applied across such a narrow depletion region 611, a high voltage, such as for example approximately 1 ⁇ 10 5 volts per centimeter, is produced across the depletion region 611 as a result. This high voltage increases the tunneling probability, which in turn leads to an increase in the fundamental absorption coefficient. This effect is also known as electro-absorption or the Franz-Keldysh effect.
  • the modulation of the photo-absorption of the laser beam 609 depends on the modulation of the voltage applied at the junction. This modulation in the absorption of the laser beam is the signal of interest since it is related to the voltage applied to the junction.
  • electro-absorption also leads to electro-refraction. That is, the effects of electro-absorption and electro-refraction are linked. Electro-refraction leads to change in refractive index. This means that at the same time, the refractive index change leads to a modulation in the reflection coefficient for light reflected from the junction/oxide interface. This modulation is superimposed upon the modulation due to electro-absorption and the photodetector actually measures the total amplitude modulation due to both effects.
  • the present invention utilizes detector 417 of FIG. 4 to simultaneously detect both the effects of electro-absorption and electro refraction caused by the applied voltage. Both these effects cause power modulation in the reflected laser beam 415. Detector 417 converts these modulations into output signal 419. The degree of the amplitude modulation is related to the applied electric field (i.e. voltage) across the P-N junction, by the function ⁇ of Equation 2. ⁇ is determined through calibrating the detector output to known applied voltages.
  • electrical waveforms similar to waveforms 501, 503 and 505 of FIG. 5 may be detected with detector 417 through the substrate of DUT 405 which correspond to varying voltages applied to active region 403. This optical measurement can then be combined with conventional stroboscopic techniques to measure high frequency voltage waveforms from the active region 403.
  • FIG. 7 is a graph 701 illustrating plots of the measured electro-absorption as a function of wavelength in a highly doped silicon substrate with a high voltage applied across the substrate and measured at various temperatures.
  • Plots 703, 705 and 707 of graph 701 show the measured change in transmission over the total transmission of the photons of an infrared beam passing through a doped silicon substrate as a function of photon wavelength.
  • plot 703 shows the change in transmission over total transmission through a thinned silicon substrate versus wavelength with an externally applied voltage of approximately 1 ⁇ 10 5 volts per centimeter applied to the silicon substrate at room temperature.
  • Plot 705 shows the relationship of change in transmission over total transmission of photons versus wavelength through the same thinned silicon substrate with no voltage applied at room temperature. As shown in FIG. 7, there is no corresponding electro-absorption peak in plot 705 at 1.064 ⁇ m. FIG. 7 demonstrates the effect that a high voltage has on the electro-absorption characteristics in silicon. The magnitude of the electro-absorption is directly related to the magnitude of the voltage in the silicon. By calibrating this functional relationship one can extract the applied voltage applied to the P-N junction.
  • one embodiment of the present invention measures electro-absorption by implementing an infrared, high frequency, mode locked laser operating at a wavelength which corresponds with the peak in plot 703.
  • the optics of the embodiment of the present invention focus the mode locked laser pulses onto the active regions to be probed.
  • the probing system consists of a single beam that is focused through the back side of the silicon of a fully flip chip packaged integrated circuit into the N doped regions located in a P substrate. It is appreciated that the present invention may also be employed with integrated circuits having P doped regions located in an N substrate.
  • the laser beam passes through the P-N junction interface, reflects off the front side metal, and returns back through the P-N junction region and back out of the silicon surface.
  • Plot 703 illustrates how some of the photons will be absorbed due to electro-absorption. The change in transmission over total transmission will be approximately 2 ⁇ 10 -5 at a wavelength of 1.064 ⁇ m. If no voltage is applied, the photon absorption will be reduced.
  • the band gap of silicon decreases with both increasing doping concentration and with increasing temperature. For instance, it is noted that the band gap decreases by approximately 30 meV at 100 degrees Celsius for highly doped silicon. Accordingly, corresponding plot 707 shows the change in transmission over total transmission through the silicon substrate versus wavelength with an externally applied voltage of approximately 1 ⁇ 10 5 volts per centimeter at 100 degrees Celsius. It can be seen by plot 707 that the electro-absorption peak has accordingly moved to approximately 1.085 ⁇ m due to the increase in temperature.
  • one embodiment of the present invention is not limited to using a mode locked laser having a fixed wavelength of 1.064 ⁇ m. Instead, the embodiment of the present invention employs a tunable mode locked laser that can be varied or adjusted with temperature or other conditions which may change the band gap of the semiconductor material.
  • the signal to noise ratio of one embodiment of the present invention is continuously optimized. It is noted that the transmission of an infrared laser in silicon decreases as a function of temperature. It is also appreciated that other techniques for compensating for the decrease in transmission of an infrared laser in silicon due to temperature may be employed to optimize the signal to noise ratio.
  • DUT 405 is run and operated in a tester environment on a tester apparatus (not shown) when the output waveforms are generated.
  • DUT 405 may be run and operated in a system environment, such as for example on a computer motherboard, when the output waveforms are generated. That is, laser beam 413 is focused directly onto doped region 403 and waveforms such as waveforms 501, 503 and 505 may be obtained while DUT 405 is mounted and operating in an actual system.
  • one embodiment of present invention enables the debugging of flip chip packaged integrated circuits while the parts are operating on a tester apparatus or in a system environment.
  • the present invention may obtain waveforms from DUT 405 in other types of test environments so long as laser beam 413 is focused onto active region 403 through the back side of the semiconductor substrate while DUT 405 is operated. All this is possible because the DUT is not limited to being operated in a vacuum as opposed to an E-Beam probing environment, which requires the DUT to operate in vacuum. It is noted that it is impractical to probe a DUT operating in a system environment such as on a large PC board using a conventional E-beam probe because the vacuum chamber of the E-beam probe would be required to be prohibitively large to accommodate the large PC board. However, since the present invention does not require the DUT to be in a vacuum chamber, waveforms can now be obtained in a variety of operating environments.
  • FIG. 8 is a diagram of another embodiment 801 of the present invention.
  • a mode locked laser 803 operating at 1.064 ⁇ m produces a laser beam 805 which passes through optical isolator 807, through ⁇ /2 half wave plate 808, through polarizing beam splitter 809, through ⁇ /4 quarter wave plate 810, through dichroic beam splitter 811 and through objective lens 813 is focused onto doped region 817 through the back side of the silicon of DUT 815.
  • the laser beam 805 is reflected off the front side metal 819 back through objective lens 813 and is guided to aperture 821 with dichroic beam splitter 811, ⁇ /4 quarter wave plate 810 and polarizing beam splitter 809.
  • the reflected laser beam 805 is directed by aperture 821 through focusing lens 823 into photo diode 825.
  • Photo diode 825 is coupled to electronics 827 to detect the amplitude modulation of photons in the reflected laser beam from DUT 815 to determine the presence of a voltage at doped region 817.
  • Optical isolator 807 is used to minimize the number of photons reflected back into laser 803.
  • the ⁇ /2 half wave plate 808 and ⁇ /4 quarter wave plate 810 are used in conjunction with polarizing beam splitter 809 to increase the percentage transmission of laser beam 805 to DUT 815 as well as increase the percentage transmission of laser beam 805 reflected from the DUT 815 to aperture 821 to optimize the signal to noise ratio.
  • the embodiment 801 shown in FIG. 8 also includes imaging elements for monitoring, including a tungsten illumination source 829 which generates light 831 which is directed through infrared filter 833, through collimating lenses 835, through beam splitter 837, through dichroic beam splitter 811, and objective lens 813 onto doped region 817 through the back side of the silicon of DUT 815.
  • the light 831 is reflected from DUT 815 back through the objective lens 813, through dichroic beam splitter 811 into infrared camera 843 through beam splitter 837 and focusing lens 841.
  • the reflected light 839 allows imaging of the back side of the DUT 815 with infrared camera 843.
  • a video monitor 845 is coupled to infrared camera 843 to observe the images of the back side of the silicon of DUT 815. This enables direct observation of doped regions insitu while focusing the laser into doped regions needed to be probed.
  • laser 803 may also be configured to act as a scanning laser light source.
  • a laser spot is scanned or rastered across the back side of DUT 815 for imaging purposes.
  • laser light reflected from DUT 815 is transmitted to infrared camera 843 so that an image of DUT 815 may be observed on video monitor 845.
  • the optical detection system is a confocal based optical system.
  • the optical source or laser 407 is operated at a wavelength that is transmissible through the semiconductor substrate of the DUT.
  • laser 407 is operated at a wavelength greater than approximately 0.9 ⁇ m through a silicon substrate.
  • laser 407 is positioned to provide an optical beam or laser beam 413 having a wavelength greater than approximately 0.9 ⁇ m, which is transmissible through a silicon substrate.
  • laser 407 is focused on the active region 403.
  • optical source or laser 407 is an infra red continuous wave laser or a pulsed laser, such as for example a Q switched laser, a mode locked laser, or the like.
  • laser beam 413 is focused through a thinned silicon substrate to active region 403.
  • laser 407 is operated at a wavelength of approximately 1.3 ⁇ m and laser beam 413 is focused through an unthinned silicon substrate.
  • Laser beam 413 passes through the beam splitter 409 and the objective lens 411, which focuses the laser beam 413 on active region 403.
  • Laser beam 413 passes through the substrate and active region 403, reflects off the contact/metal 406 behind the active region 403 and passes back through the active region 403 and the substrate.
  • the reflected laser beam 415 returns back through objective lens 411 and is guided into detector 417 through beam splitter 409.
  • Detector 417 generates an output signal 419, which corresponds to the signal at active region 403.
  • reflected laser beam 415 is modulated in response to the free carrier absorption occurring as a result of a modulated depletion region near the active region 403.
  • FIG. 9A shows free carriers 911 in the substrate of DUT 905.
  • the substrate of DUT 905 includes silicon.
  • Laser beam 909 is shown passing through the back side of the of the silicon of DUT 905 into active region 903 through insulator 904 and reflecting from metal 907 back out of the back side of the silicon of DUT 905.
  • active region 903 includes a P-N junction, which may in one embodiment be the drain of an MOS transistor or the like.
  • laser beam 909 is an infrared laser beam having a wavelength that is transmissible through the silicon of DUT 905 since silicon is partially transparent to infrared light. As a result of free carrier absorption, the laser beam 909 is partially absorbed near the P-N junction.
  • FIG. 9A illustrates that free carriers 911 may be distributed nearby the active region 903 during the absence of a depletion region near the active region 903.
  • FIG. 9B illustrates that when a bias is applied to active region 903, a depletion region 913 is formed near active region 903 and free carriers 911 are thereby swept away from active region 903. By modulating the bias applied to active region 903, depletion region 913 is modulated accordingly. By modulating depletion region 913, the free carriers 911 near active region 903 are modulated. By modulating the free carriers 911 near active region 903 in response to a signal applied to active region 903, the free carrier absorption of laser beam 909 is modulated accordingly.
  • the space charge distribution profile of the P-N junction can be approximated as a one-sided abrupt junction.
  • the electric field E, and the depletion layer width w are given by: ##EQU1## where q is the electronic charge, ⁇ S is the permittivity of silicon, V RB is the reverse bias voltage (or signal), and ##EQU2## is the built-in potential of the P-N junction.
  • Equation 3 a(w) is the resulting contribution due to free carrier absorption in depletion region 913. Knowing that free carrier effects are very small (on the order of parts per million), hence the exponential in Equation 3 can be approximated through a power series expansion.
  • equation (3) can be approximated as:
  • Equation 4 the optical modulation of laser beam 909 is then proportional to the width of depletion region 913. From Equation 2 the optical signal is then directly proportional to the electrical signal (V RB ) applied to the P-N junction.
  • the free carrier absorption of light is proportional to the square of the wavelength of the light.
  • the free carrier induced modulation of laser beam 909 is proportional to the square of the wavelength of laser beam 909. Therefore, in one embodiment, the modulation of laser beam 909 in response to free carrier absorption increases proportional to the square of the wavelength of laser beam 909. Thus it is possible to use longer wavelengths (>0.9 ⁇ m) to increase the magnitude of the signal. However, it is noted that as the wavelength of laser beam 909 increases, there is a corresponding increase in absorption in the substrate, which may limit the maximum wavelength that can be used.
  • a benefit of using wavelengths greater than approximately 1.1 ⁇ m, the band gap wavelength of silicon, for laser beam 909 is that the longer wavelengths have lower photon energies than the silicon bandgap of DUT 905. Thus, at 1.3 ⁇ m there will be very little photocurrent generated by laser beam 909. This allows one to use a larger incident laser power for laser beam 909, which results in a larger return signal to the photo diode.

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US09/130,741 1998-08-07 1998-08-07 Method and apparatus using an infrared laser based optical probe for measuring voltages directly from active regions in an integrated circuit Expired - Lifetime US6072179A (en)

Priority Applications (10)

Application Number Priority Date Filing Date Title
US09/130,741 US6072179A (en) 1998-08-07 1998-08-07 Method and apparatus using an infrared laser based optical probe for measuring voltages directly from active regions in an integrated circuit
TW088111791A TW444125B (en) 1998-08-07 1999-07-12 Method and apparatus using an infrared laser based optical probe for measuring voltages directly from active regions in an integrated circuit
DE69927387T DE69927387T2 (de) 1998-08-07 1999-07-26 Verfahren und vorrichtung zum unmittelbaren messen in einer integrierten schaltung unter verwendung einer infrarotlaser-sonde
IL14119599A IL141195A (en) 1998-08-07 1999-07-26 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit
PCT/US1999/016275 WO2000008478A1 (en) 1998-08-07 1999-07-26 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit
KR10-2001-7001619A KR100504135B1 (ko) 1998-08-07 1999-07-26 적외선 레이저 프로브를 이용하여 집적회로 내의 전압을직접 측정하기 위한 방법 및 장치
EP99937303A EP1102999B1 (en) 1998-08-07 1999-07-26 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit
JP2000564060A JP4846902B2 (ja) 1998-08-07 1999-07-26 赤外レーザ・プローブを用いて集積回路における電圧を直接測定する方法および装置
HK01104642.3A HK1033978B (en) 1998-08-07 1999-07-26 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit
AU52166/99A AU5216699A (en) 1998-08-07 1999-07-26 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit

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Application Number Priority Date Filing Date Title
US09/130,741 US6072179A (en) 1998-08-07 1998-08-07 Method and apparatus using an infrared laser based optical probe for measuring voltages directly from active regions in an integrated circuit

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US20100277159A1 (en) * 2009-05-01 2010-11-04 Ng Yin Shyang Systems and method for laser voltage imaging state mapping
US20150002182A1 (en) * 2013-06-29 2015-01-01 Travis M. Eiles Visible laser probing for circuit debug and defect analysis
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US6859052B1 (en) * 1999-11-26 2005-02-22 Christophe Vaucher Electric test of the interconnection of electric conductors on a substrate
US6587258B1 (en) * 2000-03-24 2003-07-01 Southwest Sciences Incorporated Electro-optic electric field probe
US6636056B1 (en) * 2000-10-20 2003-10-21 Intel Corporation Apparatus and method for testing integrated circuits
US7019511B1 (en) * 2001-01-05 2006-03-28 Advanced Micro Devices, Inc. Optical analysis of integrated circuits
US6876220B2 (en) 2002-06-28 2005-04-05 Hewlett-Packard Development Company, L.P. System and method for measuring fault coverage in an integrated circuit
US6714035B2 (en) 2002-06-28 2004-03-30 Hewlett-Packard Development Company, L.P. System and method for measuring fault coverage in an integrated circuit
US7291508B2 (en) * 2003-03-31 2007-11-06 Intel Corporation Laser probe points
US20040189978A1 (en) * 2003-03-31 2004-09-30 Ortega Mel A. Laser probe points
US7710573B2 (en) * 2003-08-22 2010-05-04 Ecole Normale Superieure De Cachan Device and method for the non-invasive detection and measurement of the properties of a medium
US7450237B2 (en) 2003-08-22 2008-11-11 Centre National De La Reccherche Scientifique Cnrs Non-invasive electric-filed-detection device and method
US20080007248A1 (en) * 2003-08-22 2008-01-10 Centre National De La Recherche Scientifque-Cnrs Non-invasive electric-filed-detection device and method
US20070070352A1 (en) * 2003-08-22 2007-03-29 Centre National De La Recherche Scientifque-Cnrs Device and method for the non-invasive detection and measurement of the properties of a medium
US7136163B2 (en) 2003-12-09 2006-11-14 Applied Materials, Inc. Differential evaluation of adjacent regions for change in reflectivity
US7190458B2 (en) 2003-12-09 2007-03-13 Applied Materials, Inc. Use of scanning beam for differential evaluation of adjacent regions for change in reflectivity
WO2005057194A1 (en) * 2003-12-09 2005-06-23 Applied Materials, Inc. Differential evaluation of adjacent regions for change in reflectivity
US20050122515A1 (en) * 2003-12-09 2005-06-09 Borden Peter G. Differential evalution of adjacent regions for change in reflectivity
US20050122525A1 (en) * 2003-12-09 2005-06-09 Borden Peter G. Use of scanning beam for differential evaluation of adjacent regions for change in reflectivity
US20070030493A1 (en) * 2005-05-13 2007-02-08 Laytec Gesellschaft Fuer In-Situ Und Nano-Sensorik Mbh Device and Method for the Measurement of the Curvature of a Surface
US7505150B2 (en) * 2005-05-13 2009-03-17 Laytec Gmbh Device and method for the measurement of the curvature of a surface
US7450245B2 (en) 2005-06-29 2008-11-11 Dcg Systems, Inc. Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system
US7616312B2 (en) 2005-06-29 2009-11-10 Dcg Systems, Inc. Apparatus and method for probing integrated circuits using laser illumination
US9915700B2 (en) 2005-08-26 2018-03-13 Fei Efa, Inc. System and method for modulation mapping
US7659981B2 (en) 2005-08-26 2010-02-09 Dcg Systems, Inc. Apparatus and method for probing integrated circuits using polarization difference probing
US20100039131A1 (en) * 2005-08-26 2010-02-18 Dcg Systems, Inc. System and method for modulation mapping
US20070046947A1 (en) * 2005-08-26 2007-03-01 Credence Systems Corporation Laser probing system for integrated circuits
US7733100B2 (en) 2005-08-26 2010-06-08 Dcg Systems, Inc. System and method for modulation mapping
US7990167B2 (en) 2005-08-26 2011-08-02 Dcg Systems, Inc. System and method for modulation mapping
US8686748B2 (en) 2005-08-26 2014-04-01 Dcg Systems, Inc. System and method for modulation mapping
US9239357B2 (en) 2005-08-26 2016-01-19 Dcg Systems, Inc. System and method for modulation mapping
US7600203B2 (en) 2005-10-28 2009-10-06 Nec Electronics Corporation Circuit design system and circuit design program
US20070113127A1 (en) * 2005-10-28 2007-05-17 Nec Electronics Corporation Circuit design system and circuit design program
US20100277159A1 (en) * 2009-05-01 2010-11-04 Ng Yin Shyang Systems and method for laser voltage imaging state mapping
US8754633B2 (en) 2009-05-01 2014-06-17 Dcg Systems, Inc. Systems and method for laser voltage imaging state mapping
US9244121B2 (en) 2009-05-01 2016-01-26 Dcg Systems, Inc. Systems and method for laser voltage imaging state mapping
US20150002182A1 (en) * 2013-06-29 2015-01-01 Travis M. Eiles Visible laser probing for circuit debug and defect analysis
US9651610B2 (en) * 2013-06-29 2017-05-16 Intel Corporation Visible laser probing for circuit debug and defect analysis
US20180166399A1 (en) * 2016-12-13 2018-06-14 University Of Florida Research Foundation, Incorporated Layout-driven method to assess vulnerability of ics to microprobing attacks
US10573605B2 (en) * 2016-12-13 2020-02-25 University Of Florida Research Foundation, Incorporated Layout-driven method to assess vulnerability of ICs to microprobing attacks
US10768225B1 (en) 2019-03-08 2020-09-08 Advanced Micro Devices, Inc. Probe placement for laser probing system
US11143700B2 (en) 2019-09-25 2021-10-12 Advanced Micro Devices, Inc. Analysis of electro-optic waveforms
US11125815B2 (en) 2019-09-27 2021-09-21 Advanced Micro Devices, Inc. Electro-optic waveform analysis process
CN119334906A (zh) * 2024-10-21 2025-01-21 北京工业大学 一种用于气体或烟雾探测的激光器及其制备方法和应用

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