US20060070417A1 - Flatness monitor - Google Patents

Flatness monitor Download PDF

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Publication number
US20060070417A1
US20060070417A1 US11/182,869 US18286905A US2006070417A1 US 20060070417 A1 US20060070417 A1 US 20060070417A1 US 18286905 A US18286905 A US 18286905A US 2006070417 A1 US2006070417 A1 US 2006070417A1
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Prior art keywords
line
image
deviation
degree
pixels
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Abandoned
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US11/182,869
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English (en)
Inventor
John Nieminen
Victor Chupil
Paul Lammers
David Sloan
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ArcelorMittal Dofasco Inc
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Individual
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Filing date
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Application filed by Individual filed Critical Individual
Priority to US11/182,869 priority Critical patent/US20060070417A1/en
Assigned to DOFASCO INC. reassignment DOFASCO INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: NIEMINEN, JOHN
Assigned to DOFASCO INC. reassignment DOFASCO INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CHUPIL, VICTOR, LAMMERS, PAUL, SLOAN, DAVID
Publication of US20060070417A1 publication Critical patent/US20060070417A1/en
Assigned to ARCELORMITTAL DOFASCO INC. reassignment ARCELORMITTAL DOFASCO INC. CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). Assignors: DOFASCO INC.
Abandoned legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21B—ROLLING OF METAL
    • B21B38/00—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product
    • B21B38/02—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product for measuring flatness or profile of strips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N2021/8924—Dents; Relief flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Definitions

  • the present invention relates to a method and apparatus for monitoring the flatness of a material.
  • the flatness of a material is a paramount importance in certain applications.
  • the flatness of a thin steel strip is critical to the effectiveness of subsequent processing.
  • such a strip of steel might be used in the manufacturer of cans, and the integrity of the tin coating process is dependent upon the flatness of the feed stock.
  • the flatness of the material is usually evaluated by obtaining a sample and measuring the deviation of the edge of the sample relative to a reference surface. Typically, this is performed using physical gauges and an overall evaluation of the quality of the strip is made using empirical industry accepted formulae. These measuring techniques, however, are relatively laborious and subjective, and do not lend themselves to continuous monitoring and a quantative evaluation of the edge.
  • the present invention provides a method of evaluating the flatness of a laminar strip by projecting onto the surface of a strip a reference line.
  • a camera is positioned above the strip and images the reference line on the strip. The image is processed to identify deviations of the line from a predetermined configuration.
  • the image may be processed to provide a quantative indication of the quality of the deviation for process control purposes.
  • the present invention provides a method of monitoring the conformity of a surface of a material to a known topography comprising the steps of projecting a beam of coherent radiation on to the surface of the material to provide a line on the surface, obtaining an image of the line, and determining a deviation of the line from a predetermined configuration to compute a degree of conformity.
  • the present invention provides a system for measuring the conformity of a surface of a material to a known topography.
  • the system comprises a coherent radiation source arranged to direct a beam of coherent radiation on to a surface of the material to provide a line on said surface.
  • An imaging device obtains an image of the line, and a computing device having a processor receives an input fiom the imaging device and processes the image in order to determine a deviation of the line from a predetermined configuration.
  • FIG. 1 is a schematic representation of a process control apparatus.
  • FIG. 2 is an enlarged view of a portion of the apparatus shown in FIG. 1 with a first sample
  • FIG. 3 is a view showing an image obtained with the apparatus of FIG. 1 ;
  • FIG. 4 is a view similar to FIG. 2 showing schematically the calibration of the apparatus of FIG. 1 ;
  • FIG. 5 is a flow chart showing the steps in a height calibration procedure
  • FIG. 6 is a flow chart showing the steps in a width calibration procedure
  • FIG. 7 is a flow chart showing the steps in performing a measurement of a sample.
  • FIG. 8 is a flow chart showing the steps performed during a standard check.
  • a sample of steel strip 10 whose flatness is to be assessed is supported beneath a camera 12 .
  • the camera 12 is connected to a computer 14 having image processing software 16 .
  • the computer 14 is connected to a user interface 18 and an input device 20 to control the image produced on the interface 18 .
  • the computer 14 may also connect to auxiliary communications related to process control systems as indicated generally at 22 .
  • a scanner assembly 26 includes a scanning mirror 28 driven by a galvonometer 29 controlled by the computer 14 .
  • a coherent radiation source e.g., a laser device 30 , includes a lens to produce a fan shaped optical beam 34 that produces a line on a surface.
  • the laser 30 is positioned such that the beam 34 intercepts the surface of the mirror 28 and is reflected on to the sample 10 at an angle to the optical axis of the camera 12 .
  • the point of impingement of the beam 34 on the sample 10 is controlled by the orientation of mirror 28 so it may scan from one edge of the sample to the other.
  • the mirror 28 may be held static to provide a line at a fixed location and evaluate the sample 10 based on that location alone.
  • the assembly 26 may also be arranged to perform both stationary and scanning image processing of the sample 10 by enabling the selective control of the mirror 28 .
  • the assembly would comprise a laser device 30 without a rotatable mirror 28 .
  • Such an assembly would only impinge the sample 10 at a single location.
  • the sample 10 may also move relative to the laser device 30 , eliminating the need for a rotatable mirror 28 whilst enabling the assembly 26 to perform a scan of the sample 10 .
  • the image of the line on the surface of the sample 10 is obtained by the camera 12 and is processed by the computer 14 . As shown in solid line in FIG. 2 , if the sample 10 is flat, the beam 34 should illuminate a straight line on the surface of the sample and appears as a straight line on the user interface 18 .
  • the image of the line obtained by the camera 12 deviates from a straight line.
  • the image obtained and displayed is displaced depending on the deviation of the surface from planar and a corresponding image produced on the interface 18 , as shown in greater detail in FIG. 3 .
  • the image obtained by the camera may be analyzed in one of a number of manners.
  • I Units The normal steel industry standard to measure deviations in the flatness of a strip product is to utilise what are known as I Units.
  • An I Unit is a function of the wavelength of the disturbance and the height of that disturbance from the ideal planar state. A combination of those two measurements is then utilized to compute an I number accepted within the industry.
  • the laser beam 34 is scanned onto the surface through mirror 28 that can be stepped in increments across the surface from one edge to the to other.
  • a measurement of the deviation from flat can be obtained at each scan although, for practical purposes both edges and the centreline are all that is required. Because the angle of incidence of the beam varies from one edge to the other, it is first necessary to calibrate the imaging apparatus to obtain a compensation factor as a function of the angle of the beam.
  • a block 40 is placed upon a surface with a known height and width.
  • the offset from the image of the line as it passes over the block 40 is noted, and successive blocks are placed with differing heights to provide calibration data
  • This is performed at each position of the mirror 29 , providing a set of calibration data that can be used for each position of the mirror 29 in order to calculate the height above the surface corresponding to a particular offset of the image, as well as the width at successive mirror positions.
  • two separate calibration procedures are performed, namely a height calibration and a width calibration.
  • the height calibration procedure is shown in FIG. 5 , and can be visualized by referring to the schematic of FIG. 4 .
  • An operator first places the block 40 on the apparatus table 42 .
  • the laser line 34 is moved out of the field-of-view of the camera 12 by sufficiently adjusting the mirror 29 , and a background image is captured by the camera 12 and stored for use during subsequent imaging.
  • An array of N image buffers is then created, and each of the N buffers contains an image that corresponds to respective ones of N imaging laser positions along the table 42 .
  • N is chosen depending on the nature of the application, and may vary based on the particular accuracy of the calibration data which is desired.
  • the laser line 34 is then placed at its initial position, and an image is obtained of the laser line 34 passing over the block 40 , at each laser position, through an entire region of interest. Thus at each position, an image is obtained and the corresponding background image from the buffers is subtracted from it to help eliminate ambient light noise. A smoothing kernel may then be applied as well as an optional subpixel interpolation. Details of the subpixel interpolation will be described in more detail later.
  • the imaging process is repeated N times to obtain an image of the laser line 34 at each of the N laser positions.
  • the angle of incidence of the laser line 34 decreases whilst the laser line 34 passes over the block and the discontinuity of the line deviates further from its normal configuration. Since the height of the block 40 is known, the software 16 can calibrate the scale at each position.
  • a second loop begins to process each image to calculate the scale at the respective position.
  • the region of interest in the image corresponding to the portion of the line comprising the deviation in the laser line 34 is first identified.
  • a sub-loop then begins wherein for each column of pixels in the image, the centroid of the image is identified by calculating the double derivative of the row of pixels.
  • a median filter of the centroid of the laser line 34 is then applied to remove any erroneous spikes, and the centroid derivative is calculated to reveal the pixel shift due to the calibration sample being in the laser's path (i.e. the deviation of the discontinuity from the normal line).
  • Each iteration of the second loop completes by plotting the pixel shift versus position voltage of the galvonometer, indicating the pixel shift (and thus height) versus the laser position.
  • the width calibration procedure is shown in FIG. 6 , and comprises steps similar to those implemented during the height calibration procedure until the final step of the second loop.
  • the derivative of the centroid reveals the separation between the calibration sample's edges (i.e. the width of the block).
  • the derivative peak separation versus position voltage is thus plotted to complete each iteration of the second loop.
  • a 1 st order polynomial curve is fit to the plotted points and the solution fit is then stored to a file.
  • the width calibration is then complete.
  • the two calibration procedures are essentially similar, which allows the program to reuse some of the routines that are executed.
  • sample block orientations are used for the width and height calibration procedures. For instance, 7 mm wide ⁇ 51 mm high orientation has been found to be suitable for the height calibration and a 51 mm wide ⁇ 7 mm high orientation has been found to be suitable for the width calibration. The operator would thus reorient the block between successive procedures to place the dominant dimension along the direction of the impinging line.
  • the width measurement is substantially linear with respect to the distance of the block 40 from the camera, which allows a 1 st order fit.
  • the height measurement changes as the line moves away from the camera as well as due to the height of the sample off the table 42 , which is nearly 1 st order.
  • a 2 nd order polynomial is preferably used to provide a better fit. It will be appreciated that the choice of polynomial to fit the data is application dependent and may change based on the software or hardware used.
  • the sample 10 is first placed on the table 42 , preferably against a pair of alignment pins 11 (see FIG. 2 ).
  • the system is intialized and the laser line moved out of the camera's field-of-view to enable the camera 12 to obtain a background image.
  • typically only three measurements are required, namely the two edges and the center of the sample.
  • the laser line 34 is moved towards one of the edges or the center.
  • the approximate edge location is known, therefore other image processing may be used to accurately locate the edges or center if desired.
  • An array of N image buffers are created to record the image at each of the N positions of the laser, typically 3, and a first loop is entered to capture and optionally process the images before analysing the images.
  • the first loop comprises incrementing the laser line position, capturing the image, removing the background image, and optionally but preferably applying a smoothing kernel and subpixel interpolation.
  • the loop iterates N times, one for each laser position.
  • a second loop begins which comprises performing a sub-loop for each column of pixels that finds the centroid by calculating the intensity double derivative of the row of pixels, and applying a scaling operation to the pixel position to shown the height in mm.
  • the double derivative finds the location of the line in each column.
  • the scaling has been calculated in the calibration step to compensate for the particular laser position.
  • a third loop then begins, which, for each image, median filters the laser line centroid, applies smoothing, calculates I, stores the I value in an array, and calculates the standard deviation of the laser line 34 and stores in an array.
  • the computation of an I Unit is determined utilising the formula, L m - L s L m ⁇ 10 5 where L m is the length of the line as measured on the sample. L s is the length of the ideal line with a perfectly flat surface.
  • the net deviation is an indication of the increase in length between the ideal straight line and the actual line and is used to compute the I Units at each scanned location.
  • the standard deviation is used to determine when the laser line 34 has moved off the sample 10 . A sudden increase in standard deviation indicates that the line is beyond the edge. Once the third loop completes, the I Units are only considered where the corresponding standard deviation is below a predetermined threshold. This ensures that only relevant images are used to calculate the ultimate I Unit for the sample 10 .
  • a median I is calculated fiom the array of I values stored during the third loop and the results are written to a file.
  • FIG. 8 shows a standard check procedure.
  • a standard check may be performed at desired time intervals to verify the integrity of the system.
  • the standard check may be used to determined whether a recalibration is required. For example, a standard check may be performed every 12 hours, at the beginning of each shift in a manufacturing environment. The operator can obtain an indication of how well the system is operating and can calibrate prior to operating a line. Calibrations and standard checks may be performed as fiequently as required by the particular application, or based on quality standards.
  • the subpixel interpolation algorithm step shown in FIGS. 5-8 can be applied to the images after smoothing to determine the lateral extent, i.e. thickness of the laser line on the image.
  • Subpixel interpolation allows the resolution to be enhanced using software and reduces the cost and operating requirements for the hardware.
  • a typical sub pixel interpolation algorithm involves subdividing pixels based on the intensities of neighbouring pixels.
  • Four Ray Supersampling involves creating a virtual image by covering the image with a finer grid than is actually available, and then using multiple sample points to determine an intensity for each pixel.
  • a weighted average and/or post-filtering may also be performed.
  • the present invention has been described in the context of monitoring the flatness of a sheet of steel 10 , it will be appreciated that the invention may apply to other materials where the monitoring of flatness is desired, such as copper, aluminium or plastic.
  • the system has been described having separate computing devices, software, and a camera, that a smait camera may be used to provide data processing capabilities in a single device. It will also be appreciated that the functionality of the software may be implemented using hardware as desired.
  • the above example describes measuring the flatness of a substantially planar surface. It will be appreciated that the above concepts can be applied to the measurement of other topographies, such as the curved upper surface of a tube. In such an application, the impinging laser would follow the contour of the surface, and when directed at an angle thereto, would create an elliptical line in the image. Through a series of calibrations using a curved block, a desired image can be established and deviations in this line would indicate a deviation from the roundness of the surface. Other surface topographies could also be monitored and measured using the same principles by applying a series of calibrations and devising a predetermined datum.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
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US11/182,869 2004-07-16 2005-07-18 Flatness monitor Abandoned US20060070417A1 (en)

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EP1921442A1 (fr) * 2006-11-10 2008-05-14 Peugeot Citroen Automobiles SA Procédé et installation de contrôle de la qualité de pieces
WO2008071414A1 (fr) * 2006-12-15 2008-06-19 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Dispositif et procédé d'augmentation de la précision de mesure de systèmes numériques à géométrie en 3d
WO2009006361A1 (fr) * 2007-06-29 2009-01-08 Johnson & Johnson Vision Care, Inc. Procédé de détection de l'orientation d'une lentille ophtalmique dans son emballage
US20130004080A1 (en) * 2011-06-29 2013-01-03 Infosys Limited System and method for measuring camber on a surface
CN103163141A (zh) * 2011-12-14 2013-06-19 鞍钢股份有限公司 基于嵌入式图像处理系统的带钢表面在线检测系统及方法
US20140036096A1 (en) * 2012-08-06 2014-02-06 Axis Ab Image sensor positioning apparatus and method
JP2016093827A (ja) * 2014-11-14 2016-05-26 Ｊｆｅスチール株式会社 鋼板切断位置設定装置及びその方法
TWI562839B (en) * 2014-02-26 2016-12-21 China Steel Corp Method and system for monitoring shape of steel strip in hot rolling process
WO2017060046A1 (fr) * 2015-10-05 2017-04-13 Andritz Ag Procédé et système de détermination de la contrainte hydraulique/mécanique exercée sur des bandes de cellulose
EP3454004A4 (fr) * 2016-06-27 2020-03-04 Nippon Steel Corporation Dispositif de mesure de forme et procédé de mesure de forme
JP2020512536A (ja) * 2017-03-26 2020-04-23 コグネックス・コーポレイション モデルベースのピーク選択を使用した３ｄプロファイル決定のためのシステム及び方法
CN117252864A (zh) * 2023-11-14 2023-12-19 海澜智云科技有限公司 基于标识解析的钢铁生产器件光滑度检测系统
WO2024088877A1 (fr) * 2022-10-27 2024-05-02 Thyssenkrupp Steel Europe Ag Procédé et dispositif de détermination de la planéité d'une bande métallique

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