CA2573077A1 - Moniteur de planeite - Google Patents

Moniteur de planeite Download PDF

Info

Publication number
CA2573077A1
CA2573077A1 CA002573077A CA2573077A CA2573077A1 CA 2573077 A1 CA2573077 A1 CA 2573077A1 CA 002573077 A CA002573077 A CA 002573077A CA 2573077 A CA2573077 A CA 2573077A CA 2573077 A1 CA2573077 A1 CA 2573077A1
Authority
CA
Canada
Prior art keywords
line
image
deviation
degree
pixels
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002573077A
Other languages
English (en)
Inventor
David Sloan
Victor Chupil
Paul Lammers
John Nieminen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ArcelorMittal Dofasco Inc
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2573077A1 publication Critical patent/CA2573077A1/fr
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21B—ROLLING OF METAL
    • B21B38/00—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product
    • B21B38/02—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product for measuring flatness or profile of strips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N2021/8924—Dents; Relief flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Abstract

L'invention concerne un système et un procédé de contrôle de la planéité d'un matériau. Un faisceau de lumière cohérente est projeté sur la surface du matériau afin qu'une ligne soit formée sur ladite surface. Une image de la ligne sur la surface est obtenue et l'image est utilisée pour déterminer une déviation de la ligne par rapport à une configuration prédéterminée. La déviation correspond à un motif irrégulier ou à une irrégularité du matériau.
CA002573077A 2004-07-16 2005-07-18 Moniteur de planeite Abandoned CA2573077A1 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US58835504P 2004-07-16 2004-07-16
US60/588,355 2004-07-16
PCT/CA2005/001121 WO2006007704A1 (fr) 2004-07-16 2005-07-18 Moniteur de planeite

Publications (1)

Publication Number Publication Date
CA2573077A1 true CA2573077A1 (fr) 2006-01-26

Family

ID=35784840

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002573077A Abandoned CA2573077A1 (fr) 2004-07-16 2005-07-18 Moniteur de planeite

Country Status (3)

Country Link
US (1) US20060070417A1 (fr)
CA (1) CA2573077A1 (fr)
WO (1) WO2006007704A1 (fr)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
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FR2908514B1 (fr) * 2006-11-10 2009-04-17 Peugeot Citroen Automobiles Sa Procede et installation de controle de la qualite de pieces
DE102006059416B4 (de) * 2006-12-15 2009-05-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und Verfahren zur Steigerung der Messgenauigkeit digitaler 3D-Geometriemesssysteme
WO2009006361A1 (fr) * 2007-06-29 2009-01-08 Johnson & Johnson Vision Care, Inc. Procédé de détection de l'orientation d'une lentille ophtalmique dans son emballage
US8929661B2 (en) * 2011-06-29 2015-01-06 Infosys Limited System and method for measuring camber on a surface
CN103163141A (zh) * 2011-12-14 2013-06-19 鞍钢股份有限公司 基于嵌入式图像处理系统的带钢表面在线检测系统及方法
EP2696590B1 (fr) * 2012-08-06 2014-09-24 Axis AB Appareil de positionnement d'un capteur d'image et procédé
TWI562839B (en) * 2014-02-26 2016-12-21 China Steel Corp Method and system for monitoring shape of steel strip in hot rolling process
JP6149845B2 (ja) * 2014-11-14 2017-06-21 Ｊｆｅスチール株式会社 鋼板切断位置設定装置及びその方法
WO2017060046A1 (fr) * 2015-10-05 2017-04-13 Andritz Ag Procédé et système de détermination de la contrainte hydraulique/mécanique exercée sur des bandes de cellulose
WO2018003144A1 (fr) * 2016-06-27 2018-01-04 新日鐵住金株式会社 Dispositif de mesure de forme et procédé de mesure de forme
US10753726B2 (en) 2017-03-26 2020-08-25 Cognex Corporation System and method for 3D profile determination using model-based peak selection
DE102022128499B3 (de) * 2022-10-27 2023-11-16 Thyssenkrupp Steel Europe Ag Verfahren und Vorrichtung zur Bestimmung der Planheit eines Metallbandes
CN117252864B (zh) * 2023-11-14 2024-01-26 海澜智云科技有限公司 基于标识解析的钢铁生产器件光滑度检测系统

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3590258A (en) * 1969-11-05 1971-06-29 Ishikawajima Harima Heavy Ind Apparatus for controlling the shape of rolled product
JPS5937407A (ja) * 1982-08-26 1984-02-29 Fujitsu Ltd 金属シ−ト材の平面度測定法
JPS60200103A (ja) * 1984-03-26 1985-10-09 Hitachi Ltd 光切断線抽出回路
GB2219905A (en) * 1988-06-17 1989-12-20 Philips Electronic Associated Target detection system
US4930350A (en) * 1988-10-06 1990-06-05 Robert Bode Acoustical length measurement
US5129010A (en) * 1989-12-15 1992-07-07 Kabushiki Kaisha Toyoto Chuo Kenkyusho System for measuring shapes and dimensions of gaps and flushnesses on three dimensional surfaces of objects
IL106747A0 (en) * 1993-08-20 1993-12-08 Oren Aharon Laser beam analyzer
US5471541A (en) * 1993-11-16 1995-11-28 National Research Council Of Canada System for determining the pose of an object which utilizes range profiles and synethic profiles derived from a model
JP3333615B2 (ja) * 1993-12-21 2002-10-15 三菱電機株式会社 半導体装置の寸法測定装置及び方法
JPH0993086A (ja) * 1995-09-28 1997-04-04 Toyota Motor Corp スイッチトキャパシタ回路及びこれを用いた信号処理回路
US6050166A (en) * 1995-09-29 2000-04-18 Strilich Technologies, Inc. Non-contact sheet measurement and cutting device
US5818959A (en) * 1995-10-04 1998-10-06 Visual Interface, Inc. Method of producing a three-dimensional image from two-dimensional images
JPH09326026A (ja) * 1996-06-07 1997-12-16 Advantest Corp 画像処理方法及び画像処理装置
US5867274A (en) * 1997-02-14 1999-02-02 Harris Instrument Corporation System for the measurement of the cut length of moving articles
US6002813A (en) * 1997-07-10 1999-12-14 Samsung Electronics Co., Ltd. Interpolation method for binary image
JP4035867B2 (ja) * 1997-09-11 2008-01-23 株式会社セガ 画像処理装置及び画像処理方法並びに媒体
US6233049B1 (en) * 1998-03-25 2001-05-15 Minolta Co., Ltd. Three-dimensional measurement apparatus
US6550156B1 (en) * 2000-08-23 2003-04-22 David Scoville Pipe fitting apparatus, method, and product-by process for taking simultaneous linear and angular measurements
JP2002164066A (ja) * 2000-11-22 2002-06-07 Mitsubishi Heavy Ind Ltd 積層型熱交換器
US6668626B2 (en) * 2001-03-01 2003-12-30 Abb Ab System and a method for measuring and determining flatness
EP1327852A1 (fr) * 2002-01-11 2003-07-16 CENTRO SVILUPPO MATERIALI S.p.A. Appareil pour mesurer la planéité de surfaces, en particulier de bandes métalliques
US7136541B2 (en) * 2002-10-18 2006-11-14 Sony Corporation Method of performing sub-pixel based edge-directed image interpolation

Also Published As

Publication number Publication date
US20060070417A1 (en) 2006-04-06
WO2006007704A1 (fr) 2006-01-26

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Legal Events

Date Code Title Description
FZDE Discontinued
FZDE Discontinued

Effective date: 20110718