US20040095085A1 - Window frame-guided stage mechanism - Google Patents

Window frame-guided stage mechanism Download PDF

Info

Publication number
US20040095085A1
US20040095085A1 US10611260 US61126003A US2004095085A1 US 20040095085 A1 US20040095085 A1 US 20040095085A1 US 10611260 US10611260 US 10611260 US 61126003 A US61126003 A US 61126003A US 2004095085 A1 US2004095085 A1 US 2004095085A1
Authority
US
Grant status
Application
Patent type
Prior art keywords
member
stage
frame
mask
horizontal plane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
US10611260
Other versions
US6747732B1 (en )
Inventor
Martin Lee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date

Links

Images

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Exposure apparatus for microlithography
    • G03F7/70216Systems for imaging mask onto workpiece
    • G03F7/70358Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Exposure apparatus for microlithography
    • G03F7/70691Handling of masks or wafers
    • G03F7/70716Stages
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Exposure apparatus for microlithography
    • G03F7/708Construction of apparatus, e.g. environment, hygiene aspects or materials
    • G03F7/70808Construction details, e.g. housing, load-lock, seals, windows for passing light in- and out of apparatus
    • G03F7/70825Mounting of individual elements, e.g. mounts, holders or supports
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Exposure apparatus for microlithography
    • G03F7/708Construction of apparatus, e.g. environment, hygiene aspects or materials
    • G03F7/70808Construction details, e.g. housing, load-lock, seals, windows for passing light in- and out of apparatus
    • G03F7/70833Mounting of optical systems, e.g. mounting of illumination system, projection system or stage systems on base-plate or ground
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Exposure apparatus for microlithography
    • G03F7/708Construction of apparatus, e.g. environment, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/709Vibration, e.g. vibration detection, compensation, suppression
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T74/00Machine element or mechanism
    • Y10T74/20Control lever and linkage systems
    • Y10T74/20012Multiple controlled elements
    • Y10T74/20201Control moves in two planes

Abstract

A guided stage mechanism suitable for supporting a reticle in a photolithography machine includes a stage movable in the X-Y directions on a base. Laterally surrounding the stage is a rectangular window frame guide which is driven in the X-axis direction on two fixed guides by means of motor coils on the window frame guide co-operating with magnetic tracks fixed on the base. The stage is driven inside the window frame guide in the Y-axis direction by motor coils located on the stage co-operating with magnetic tracks located on the window frame guide. Forces from the drive motors of both the window frame guide and the stage are transmitted through the center of gravity of the stage, thereby eliminating unwanted moments of inertia. Additionally, reaction forces caused by the drive motors are isolated from the projection lens and the alignment portions of the photolithography machine. This isolation is accomplished by providing a mechanical support for the stage independent of the support for its window frame guide. The window frame guide is a hinged structure capable of a slight yawing (rotational) motion due to hinged flexures which connect the window frame guide members.

Description

    BACKGROUND OF THE INVENTION
  • 1. Field of the Invention [0001]
  • This invention relates to precision motion stages and more specifically to a stage suitable for use in a photolithography machine and especially adapted for supporting a reticle. [0002]
  • 2. Description of the Prior Art [0003]
  • Photolithography is a well known field especially as applied to semiconductor fabrication. In photolithography equipment a stage (an X-Y motion device) supports the reticle (i.e., mask) and a second stage supports the semiconductor wafer, i.e. the work piece being processed. Sometimes only a single stage is provided, for the wafer or the mask. [0004]
  • Such stages are essential for precision motion in the X-axis and Y-axis directions and often some slight motion is provided for adjustments in the vertical (Z-axis) direction. A reticle stage is typically used where the reticle is being scanned in a scanning exposure system, to provide smooth and precise scanning motion in one linear direction and insuring accurate, reticle to wafer alignment by controlling small displacement motion perpendicular to the scanning direction and a small amount of “yaw” (rotation) in the X-Y plane. It is desirable that such an X-Y stage be relatively simple and be fabricated from commercially available components in order to reduce cost, while maintaining the desired amount of accuracy. Additionally, many prior art stages include a guide structure located directly under the stage itself. This is not a desirable in a reticle stage since it is essential that a light beam be directed through the reticle and through the stage itself to the underlying projection lens. Thus a stage is needed which does not include any guides directly under the stage itself, since the stage itself must define a fairly large central passage for the light bean. [0005]
  • Additionally, many prior art stages do not drive the stage through its center of gravity which undesirably induces a twisting notion in the stage, reducing the frequency response of the stage. Therefore there is a need for an improved stage and especially one suitable for a reticle stage. [0006]
  • SUMMARY
  • A precision motion stage mechanism includes the stage itself which moves in the X-Y plane on a flat base. The stage is laterally surrounded by a “window frame” guide structure which includes four members attached at or near their corners to form a rectangular structure. The attachments are flexures which are a special type of hinge allowing movement to permit slight distortion of the rectangle. In one version these flexures are thin stainless steel strips attached in an “X” configuration, allowing the desired degree of hinge movement between any two adjacent connected window frame members. [0007]
  • The window frame guide structure moves on a base against two spaced-apart and parallel fixed guides in e.g. the X axis direction, being driven by motor coils mounted on two opposing members of the window frame cooperating with magnetic tracks fixed on the base. [0008]
  • The window frame in effect “follows” the movement of the stage and carries the magnetic tracks needed for movement of the stage in the Y axis direction. (It is to be understood that references herein to the X and Y axes directions are merely illustrative and for purposes of orientation relative to the present drawings and are not to be construed as limiting.) [0009]
  • The stage movement in the direction perpendicular (the Y axis direction) to the direction of movement of the window frame is accomplished by the stage moving along the other two members of the window frame. The stage is driven relative to the window frame by motor coils mounted on the stage and cooperating with magnetic tracks mounted in the two associated members of the window frame. [0010]
  • To minimize friction, the stage is supported on the base by air bearings or other fluid bearings mounted on the underside of the stage. Similarly fluid bearings support the window frame members on their fixed guides. Additionally, fluid bearings load the window frame members against the fixed guides and load the stage against the window frame. So as to allow slight yaw movement, these loading bearings are spring mounted. The stage itself defines a central passage. The reticle rests on a chuck mounted on the stage. Light from an illuminating source typically located above the reticle passes to the central passage through the reticle and chuck to the underlying projection lens. [0011]
  • It is to be understood that the present stage, with suitable modifications, is not restricted to supporting a reticle but also may be used as a wafer stage and is indeed not limited to photolithography applications but is generally suited to precision stages. [0012]
  • An additional aspect in accordance with the present invention is that the reaction force of the stage and window frame drive motors is not transmitted to the support frame of the photolithography apparatus projection lens but is transmitted independently directly to the earth's surface by an independent supporting structure. Thus the reaction forces caused by movement of the stage do not induce undesirable movement in the projection lens or other elements of the photolithography machine. [0013]
  • This physically isolating the stage reaction forces from the projection lens and associated structures prevents these reaction forces from vibrating the projection lens and associated structures. These structures include the interferometer system used to determine the exact location of the stage in the X-Y plane and the wafer stage. Thus the reticle stage mechanism support is spaced apart from and independently supported from the other elements of the photolithography machine and extends to the surface of the earth. [0014]
  • Advantageously, the reaction forces from operation of the four motor coils for moving both the stage and its window frame are transmitted through the center of gravity of the stage, thereby desirably reducing unwanted moments of force (i.e., torque). The controller controlling the power to the four drive motor coils takes into consideration the relative position of the stage and the frame and proportions the driving force accordingly by a differential drive technique.[0015]
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 shows a top view of the present window frame guided stage. [0016]
  • FIG. 2 shows a side view of the window frame guided stage and associated structures. [0017]
  • FIGS. 3A and 3B show enlarged views of portions of the structure of FIG. 2. [0018]
  • FIG. 4 shows a top view of a photolithography apparatus including the present window frame guided stage. [0019]
  • FIG. 5 shows a side view of the photolithography apparatus of FIG. 4. [0020]
  • FIGS. 6A and 6B show a flexure hinge structure as used e.g. in the present window frame guided stage. [0021]
  • DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
  • FIG. 1 shows a top view of a stage mechanism in accordance with the present invention. See also copending commonly owned and invented U.S. patent application Ser. No. 08/221,375 entitled “Guideless Stage with Isolated Reaction Stage” filed Apr. 1, 1994, original docket no. NPI0500 which is incorporated herein by reference and shows a related method of supporting elements of a stage mechanism so as to isolate reaction forces from the projection lens and other parts of a photolithography apparatus. [0022]
  • The stage [0023] 10 is (in plan view) a rectangular structure of a rigid material (e.g., steel, aluminum, or ceramic). Two interferometry mirrors 14A and 14B located on stage 10 interact conventionally with respectively laser beams 16A and 16B. Conventionally, laser beams 16A are two pairs of laser beams and laser beams 16B are one pair of laser beam, for three independent distance measurements. The underside of stage 10 defines a relieved portion 22 (indicated by a dotted line, not being visible in the plane of the drawing). A reticle 24 is located on stage 10 and held by conventional reticle vacuum groove 26 formed in the upper surface of chuck plate 28. Stage 10 also defines a central aperture 30 (passage) below the location of reticle 24. Central aperture 30 allows the light (or other) beam which penetrates through reticle 24 to enter the underlying projection lens, as described further below. (It is to be understood that the reticle 24 itself is not a part of the stage mechanism.) Moreover if the present stage mechanism is to be used for other than a reticle stage, i.e. for supporting a wafer, aperture 30 is not needed.
  • Stage [0024] 10 is supported on a conventional rectangular base structure 32 of e.g. granite, steel, or aluminum, and having a smooth planar upper surface. The left and right edges (in FIG. 1) of base structure 32 are shown as dotted lines, being overlain by other structures (as described below) in this view. In operation, stage 10 is not in direct physical contact with its base structure 32; instead, stage 10 is vertically supported by, in this example, conventional bearings such as gas bearings. In one embodiment three air bearings 36A, 36B and 36C are used which may be of a type commercially available.
  • In an alternative air bearing/vacuum structure, the vacuum portion is physically separated from and adjacent to the air bearing portion. It is to be understood that the vacuum and compressed air are provided externally via tubing in a conventional cable bundle and internal tubing distribution system (not shown in the drawings for simplicity). In operation stage [0025] 10 thereby floats on the air bearings 36A, 36B, 36C approximately 1 to 3 micrometers above the flat top surface of base structure 32. It is to be understood that other types of bearings (e.g. air bearing/magnetic combination type) may be used alternatively.
  • Stage [0026] 10 is laterally surrounded by the “window frame guide” which is a four member rectangular structure. The four members as shown in FIG. 1 are (in the drawing) the top member 40A, the bottom member 40B, the lefthand member 40C, and the righthand member 40D. The four members 40A-40D are of any material having high specific stiffness (stiffness to density ratio) such as aluminum or a composite material. These four members 40A-40D are attached together by hinge structures which allow non-rigid movement of the four members relative to one another in the X-Y plane and about the Z-axis as shown in the drawing, this movement also referred to as a “yaw” movement. Th hinge is described in detail below, each hinge 44A, 44B, 44C and 44D being e.g. one or more metal flexures allowing a slight flexing of the window frame guide structure.
  • The window frame guide structure moves in the X axis (to the left and right in FIG. 1) supported on horizontal surfaces of fixed guides [0027] 46A and 46B, and supported on vertical surfaces of fixed guides 64A, 64B. (It is to be understood that each pair of fixed guides 46A, 64A and 46B, 64B could be e.g. a single L-shaped fixed guide, or other configurations of fixed guides may be used.) Mounted on window frame guide member 40A are two air bearings 50A and 50B that cause the member 40A to ride on its supporting fixed guide member 46A. Similarly air bearings 52A and 52B are mounted on the member 40B, allowing member 40B to ride on its supporting fixed guide member 46B. Air bearings 50A, 50B, 52A, 52B are similar to air bearings 36A, etc.
  • The window frame guide is driven along the X axis on fixed guides [0028] 46A and 46B, 64A and 64B by a conventional linear motor, which includes a coil 60A which is mounted on window frame guide member 40A. Motor coil 60A moves in a magnetic track 62A which is located in (or along) fixed guide 64A. Similarly, motor coil 60B which is mounted on window frame guide member 40B moves in magnetic track 62B which is located in fixed guide 64B. The motor coil and track combinations are part no. 1M-310 from Trilogy Company of Webster Tex. These motors are also called “linear commutator motors”. The tracks 62A, 62B are each a number of permanent magnets fastened together. The electric wires which connect to the motor coils are not shown but are conventional. Other types of linear motors may be substituted. It is to be understood that the locations of the motor coils and magnetic tracks for each motor could be reversed, so that for instance the magnetic tracks are located on stage 10 and the corresponding motor coils on the window frame guide members, at a penalty of reduced performance.
  • Similarly, stage [0029] 10 moves along the Y axis in FIG. 1 by means of motor coils 68A and 68B mounted respectively on the left and right edges of stage 10. Motor coil 68A moves in magnetic track 70A mounted in window frame guide member 40C. Motor coil 68B moves in magnetic track 70B mounted in window frame guide member 40D.
  • Also shown in FIG. 1 are air bearings [0030] 72A, 72B and 72C. Air bearing 72A is located on window frame guide member 40A and minimizes friction between window frame guide member 40A and its fixed guide 64A. Similarly two air bearings 72B and 72C on window frame guide member 40B minimize its friction with the fixed guide 64B. The use of a single air bearing 72A at one end and two opposing air bearings 72B and 72C at the other end allows a certain amount of yaw (rotation in the X-Y plane about the Z-axis) as well as limited motion along the Z-axis. In this case, typically air bearing 72A is gimbal mounted, or gimbal mounted with the gimbal located on a flexure so as to allow a limited amount of misalignment between the member 40A and fixed guide 64A.
  • The use of the air bearing [0031] 72A opposing bearings 72B and 72C provides a loading effect to keep the window frame guide in its proper relationship to fixed guides 64A, 64B. Similarly, an air bearing 76A loads opposing air bearings 76B and 76C, all mounted on side surfaces of the stage 10, in maintaining the proper location of stage 10 relative to the opposing window frame guide members 40B and 40D. Again, in this case one air bearing such as 76A is gimbal mounted to provide a limited amount of misalignment, or gimbal mounted with the gimbal on a flexure (spring). Air bearings 72A, 72B, 72C and 76A, 76B, and 76C are conventional air bearings.
  • The outer structure [0032] 80 in FIG. 1 is the base support structure for the fixed guides 46A, 46B, 64A, 64B and the window frame guide members 40A, . . . , 40D of the stage mechanism, but does not support stage base structure 32. Thus underlying support is partitioned so the reaction force on base support structure 80 does not couple into the stage base structure 32. Base support structure 80 is supported by its own support pillars or other conventional support elements (not shown in this drawing) to the ground, i.e. the surface of the earth or the floor of a building. An example of a suitable support structure is disclosed in above-referenced U.S. patent application Ser. No. 08/221,375 at FIGS. 1, 1B, 1C. This independent support structure for this portion of stage mechanism provides the above-described advantage of transmitting the reaction forces of the reticle stage mechanism drive motors away from the frame supporting the other elements of the photolithography apparatus, especially away from the optical elements including the projection lens and from the wafer stage, thereby minimizing vibration forces on the projection lens due to reticle stage movement. This is further described below.
  • The drive forces for the stage mechanism are provided as close as possible through the stage mechanism center of gravity. As can be understood, the center of gravity of the stage mechanism moves with the stage [0033] 10. Thus the stage 10 and the window frame guide combine to define a joint center of gravity. A first differential drive control (not shown) for motor coils 60A, 60B takes into account the location of the window frame guide to control the force exerted by each motor coil 60A, 60B to keep the effective force applied at the center of gravity. A second conventional differential drive control (not shown) for motor coils 68A, 68B takes into account the location of stage 10 to control the force exerted by each motor coil 68A, 68B to keep the effective force applied at the center of gravity. It is to be understood that since stage 10 has a substantial range of movement, that the differential drive for the motor coils 60A, 60B has a wide differential swing. In contrast, the window frame guide has a more limited range of movement, hence the differential drive for the motor coils 68A, 68B has a much lesser differential swing, providing a trim effect. Advantageously, use of the window frame guide maintains the reaction forces generated by movement of the reticle stage mechanism in a single plane, thus making easier to isolate these forces from other parts of the photolithography apparatus.
  • FIG. 2 shows a cross-sectional view through line [0034] 2-2 of FIG. 1. The structures shown in FIG. 2 which are also in FIG. 1 have identical reference numbers and are not described herein. Also shown in FIG. 2 is the illuminator 90 which is a conventional element shown here without detail, and omitted from FIG. 1 for clarity. Also shown without detail in FIG. 2 is the upper portion of the projection lens (barrel) 92. It is to be understood that the lower portion of the projection lens and other elements of the photolithography apparatus are not shown in FIG. 2, but are illustrated and described below.
  • The supporting structure [0035] 94 for the projection lens 92 is also shown in FIG. 2. As can be seen, structure 94 is separated at all points by a slight gap 96 from the base support structure 80 for the reticle stage mechanism. This gap 96 isolates vibrations caused by movement of the reticle stage mechanism from the projection lens 92 and its support 94. As shown in FIG. 2, stage 10 is not in this embodiment a flat structure but defines the underside relieved portion 22 to accommodate the upper portion of lens 92. Magnetic track 70A is mounted on top of the window frame guide 40B and similarly magnetic track 70B is mounted on top of the opposite window frame guide member 40D.
  • FIGS. 3A and 3B are enlarged views of portions of FIG. 2, with identical reference numbers; FIG. 3A is the left side of FIG. 2 and FIG. 3B is the right side of FIG. 2. Shown in FIG. 3A is the spring mounting [0036] 78 for air bearing 76A. Air bearing 78A being spring mounted to a side surface of stage 10, this allows a certain amount of yaw (rotation in the X-Y plane about the Z-axis) as well as limited motion along the Z-axis. A gimbal mounting may be used in place of or in addition to the spring 78. The spring or gimbal mounting thereby allows for a limited amount of misalignment between stage 10 and members 40C, 40D (not shown in FIG. 3A).
  • FIG. 4 is a top view of a photolithography apparatus including the stage mechanism of FIGS. 1 and 2 and further including, in addition to the elements shown in FIG. 1, the supporting base structure [0037] 100 which supports the photolithography apparatus including frame 94 except for the reticle stage mechanism. (Not all the structures shown in FIG. 1 are labelled in FIG. 4, for simplicity.) Base structure 100 supports four vertical support pillars 102A, 102B, 102C and 102D connected to structure 94 by respectively bracket structures 106A, 106B, 106C and 106D. It is to be appreciated that the size of the base structure 100 is fairly large, i.e. approximately 3 meters top to bottom in one embodiment. Each pillar 102A, 102B, 102C, 102D includes an internal conventional servo mechanism (not shown) for leveling purposes. Also shown in FIG. 4 are the supports 108 and 110 for respectively laser interferometer units (beam splitter etc.) 112A, 112B, 112C. FIG. 4 will be further understood with reference to FIG. 5 which shows a view of FIG. 4 through cross-sectional line 5-5 of FIG. 4.
  • In FIGS. 4 and 5 the full extent of the supporting structure [0038] 94 can be seen along with its support pillars 102A, 102C which rest on the base structure 100 which is in contact with the ground via a conventional foundation (not shown). The independent support structure for the reticle stage base support structure 80 is shown, in FIG. 4 only (for clarity) and similarly includes a set of four pillars 114A, 114B, 114C, 114D with associated bracket structures 116A, 116B, 116C, 116D, with the pillars thereby extending from the level of base support structure 80 down to the base structure 100.
  • The lower portion of FIG. 5 shows the wafer stage [0039] 120 and associated support structures 122, 124. The elements of wafer stage 120 conventionally include (not labelled in the drawing) a base, the stage itself, fixed stage guides located on the base, magnetic tracks located on the fixed stage guides, and motor coils fitting in the magnetic tracks and connected to the stage itself. Laser beams from laser 124 mounted on support 126 locate lens 92 and the stage itself by interferometry.
  • FIG. 6A shows detail of one of the window frame guide hinged flexure structures, e.g. [0040] 44C, in a top view (corresponding to FIG. 1). Each of hinges 44A, 44B, 44C and 44D is identical. These flexure hinges have the advantage over a mechanical-type hinge of not needing lubrication, not exhibiting histeresis (as long as the flexure is not bent beyond its mechanical tolerance) and not having any mechanical “slop”, as well as being inexpensive to fabricate.
  • Each individual flexure is e.g. ¼ hard [0041] 302 stainless steel approximately 20 mils (0.02 inch) thick and can sustain a maximum bend of 0.5 degree. The width of each flexure is not critical; a typical width is 0.5 inch. Two, three or four flexures are used at each hinge 44A, 44B, 44C and 44D in FIG. 1. The number of flexures used at each hinge is essentially determined by the amount of space available, i.e., the height of the window frame guide members. The four individual flexures 130A, 130B, 130C, 130D shown in FIG. 6A (and also in a 90° rotated view in FIG. 68) are each attached by clamps 136A, 136B, 136C, 136D to adjacent frame members (members 40 and 40D in FIGS. 6A and 6B) by conventional screws which pass through holes in the individual flexures 130A, 1308, 130C, 130D and through the clamps and are secured in corresponding threaded holes in frame members 40B and 40D.
  • Note that the frame members [0042] 40B, 40D of FIGS. 6A and 6B differ somewhat from those of FIG. 1 in terms of the angular (triangular) structures at the ends of frame members 405, 40D and to which the metal flexures 130A, 130B, 130C, 130D are mounted. In the embodiment of FIG. 1, these angular structures are dispensed with, although their presence makes screw mounting of the flexures easier.
  • In an alternate embodiment, the window frame guide is not hinged but is a rigid structure. To accommodate this rigidity and prevent binding, one of bearings [0043] 72C or 72B is eliminated, and the remaining bearing moved to the canter of member 40B, mounted on a gimbal with no spring. The other bearings (except those mounted on stage 10) are also gimballed.
  • This disclosure is illustrative and not limiting; further modifications will be apparent to one skilled in the art in light of this disclosure and are intended to fall within the scope of the appended claims. [0044]

Claims (27)

    What is claimed is:
  1. 1. An exposure apparatus that exposes a pattern of a mask onto an object by a projection system, comprising:
    a frame that has a support member to support the projection system and a suspended member that is suspended from the support member;
    a first base that is coupled to the support member, the first base having a first horizontal plane;
    a second base that is coupled to the suspended member such that the suspended member receives the weight of the second base, the second base having a second horizontal plane that is located below the first horizontal plane;
    a mask stage that is movably supported by the first horizontal plane to retain the mask, the mask stage having a first reflective member;
    an object stage that is movably supported by the second horizontal plane to retain the object, the object stage having a second reflective member;
    a first linear motor that has a first member coupled to the mask stage and a second member to move the mask stage parallel to the first horizontal plane;
    a second linear motor that moves the object stage parallel to the second horizontal plane;
    a first interferometer system that cooperates with the first reflective member to detect a position of the mask stage, the first interferometer system being supported by the frame;
    a second interferometer system that cooperates with the second reflective member to detect a position of the object stage, the second interferometer system being supported by the frame; and
    a reaction frame that is dynamically isolated from the frame to receive a reaction force caused by a movement of the mask stage, the reaction frame having a member that is located above the suspended member and coupled to the second member of the first linear motor.
  2. 2. The exposure apparatus of claim 1, wherein the first linear motor moves the mask stage in a first direction parallel to the first horizontal plane.
  3. 3. The exposure apparatus of claim 2, further comprising a third linear motor having a coil and a magnet to move the mask stage in a second direction different from the first direction, one of the coil and the magnet being coupled to the reaction frame.
  4. 4. The exposure apparatus of claim 3, wherein the first interferometer system detects the position of the mask stage with regard to the first direction.
  5. 5. The exposure apparatus of claim 4, further comprising a third interferometer system that detects the position of the mask stage with regard to the second direction.
  6. 6. The exposure apparatus of claim 5, wherein the first interferometer system is supported by the support member of the frame.
  7. 7. The exposure apparatus of claim 6, wherein the second interferometer system is supported by the support member of the frame.
  8. 8. The exposure apparatus of claim 7, wherein the third interferometer system is supported by the support member of the frame.
  9. 9. The exposure apparatus of claim 8, wherein the second member of the first linear motor is movable along a guide that is coupled to the reaction frame.
  10. 10. The exposure apparatus of claim 9, wherein the reaction frame receives a reaction force caused by a movement of the object stage.
  11. 11. The exposure apparatus of claim 1, wherein the first interferometer system is supported by the support member of the frame.
  12. 12. The exposure apparatus of claim 1, wherein the second interferometer system is supported by the support member of the frame.
  13. 13. The exposure apparatus of claim 1, wherein the second member of the first linear motor is movable along a guide that is coupled to the reaction frame.
  14. 14. An exposure apparatus that exposes a pattern of a mask onto an object by a projection system, comprising:
    supporting means having a support member for supporting the projection system and a suspended member that is suspended from the support member;
    first guiding means having a first horizontal plane;
    second guiding means having a second horizontal plane;
    mask holding means for retaining the mask, the mask holding means being movably supported by the first horizontal plane and having a first reflective member;
    object holding means for retaining the object, the object holding means being movably supported by the second horizontal plane and having a second reflective member;
    first moving means for moving the mask holding means parallel to the first horizontal plane, the first moving means having a first member coupled to the mask holding means and a second member;
    second moving means for moving the object holding means parallel to the second horizontal plane;
    first position detecting means for detecting a position of the mask holding means and cooperating with the first reflective member;
    second position detecting means for detecting a position of the object holding means and cooperating with the second reflective member; and
    reaction-force-receiving means for receiving a reaction force caused by a movement of the mask holding means, the reaction-force-receiving means being dynamically isolated from the supporting means and having a member that is located above the suspended member and coupled to the second member of the first moving means.
  15. 15. An exposure method that exposes a pattern of a mask onto an object by a projection system, comprising the steps of:
    providing a frame that has a support member to support the projection system and a suspended member that is suspended from the support member;
    providing a first base that is coupled to the support member, the first base having a first horizontal plane;
    providing a second base that is coupled to the suspended member such that the suspended member receives the weight of the second base, the second base having a second horizontal plane that is located below the first horizontal plane;
    moving a mask stage having a first reflective member by a first linear motor, the mask stage being movably supported by the first horizontal plane to retain the mask and the first linear motor having a first member coupled to the mask stage and a second member;
    moving an object stage having a second reflective member by a second linear motor, the object stage being movably supported by the second horizontal plane to retain the object;
    detecting a position of the mask stage by a first interferometer system that cooperates with the first reflective member, the first interferometer system being supported by the frame;
    detecting a position of the object stage by a second interferometer system that cooperates with the second reflective member, the second interferometer system being supported by the frame; and
    receiving in a reaction frame, a reaction force caused by a movement of the mask stage, the reaction frame is dynamically isolated from the frame, the reaction frame having a member that is located above the suspended member and coupled to the second member of the first linear motor.
  16. 16. The method of claim 15, wherein the first linear motor moves the mask stage in a first direction parallel to the first horizontal plane.
  17. 17. The method of claim 16, further comprising moving the mask stage in a second direction different from the first direction by a third linear motor having a coil and a magnet, one of the coil and the magnet being coupled to the reaction frame.
  18. 18. The method of claim 17, wherein the first interferometer system detects the position of the mask stage with regard to the first direction.
  19. 19. The method of claim 18, further comprising detecting the position of the mask stage with regard to the second direction by a third interferometer system.
  20. 20. The method of claim 19, wherein the first interferometer system is supported by the support member of the frame.
  21. 21. The method of claim 20, wherein the second interferometer system is supported by the support member of the frame.
  22. 22. The method of claim 21, wherein the third interferometer system is supported by the support member of the frame.
  23. 23. The method of claim 22, further comprising moving the second member of the first linear motor along a guide that is coupled to the reaction frame.
  24. 24. The method of claim 23, further comprising the reaction frame receiving a reaction force caused by a movement of the object stage.
  25. 25. The method of claim 15, wherein the first interferometer system is supported by the support member of the frame.
  26. 26. The method of claim 15, wherein the second interferometer system is supported by the support member of the frame.
  27. 27. The method of claim 15, further comprising moving the second member of the first linear motor along a guide that is coupled to the reaction frame.
US10611260 1995-04-04 2003-07-02 Method of making exposure apparatus with dynamically isolated reaction frame Expired - Fee Related US6747732B1 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
US08416558 US5874820A (en) 1995-04-04 1995-04-04 Window frame-guided stage mechanism
US09192153 US6246202B1 (en) 1995-04-04 1998-11-12 Method of making exposure apparatus with dynamically isolated reaction frame
US09836273 US6316901B2 (en) 1995-04-04 2001-04-18 Exposure apparatus and method utilizing isolated reaction frame
US09964550 US6683433B2 (en) 1995-04-04 2001-09-28 Exposure apparatus and method utilizing isolated reaction frame
US10611260 US6747732B1 (en) 1995-04-04 2003-07-02 Method of making exposure apparatus with dynamically isolated reaction frame

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10611260 US6747732B1 (en) 1995-04-04 2003-07-02 Method of making exposure apparatus with dynamically isolated reaction frame

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US09964550 Division US6683433B2 (en) 1995-04-04 2001-09-28 Exposure apparatus and method utilizing isolated reaction frame

Publications (2)

Publication Number Publication Date
US20040095085A1 true true US20040095085A1 (en) 2004-05-20
US6747732B1 US6747732B1 (en) 2004-06-08

Family

ID=23650430

Family Applications (11)

Application Number Title Priority Date Filing Date
US08416558 Expired - Lifetime US5874820A (en) 1995-04-04 1995-04-04 Window frame-guided stage mechanism
US09192153 Expired - Lifetime US6246202B1 (en) 1995-04-04 1998-11-12 Method of making exposure apparatus with dynamically isolated reaction frame
US09317847 Expired - Lifetime US6087797A (en) 1995-04-04 1999-05-25 Exposure method, and method of making exposure apparatus having dynamically isolated reaction frame
US09320842 Expired - Lifetime US6020710A (en) 1995-04-04 1999-05-26 Exposure method, and method of making exposure apparatus having dynamically isolated reaction frame
US09318622 Expired - Lifetime US6150787A (en) 1995-04-04 1999-05-26 Exposure apparatus having dynamically isolated reaction frame
US09318623 Expired - Lifetime US6188195B1 (en) 1995-04-04 1999-05-26 Exposure method, and method of making exposure apparatus having dynamically isolated support structure
US09320706 Expired - Lifetime US6151105A (en) 1995-04-04 1999-05-27 Exposure apparatus having dynamically isolated support structure
US09320703 Expired - Lifetime US6175404B1 (en) 1995-04-04 1999-05-27 Exposure apparatus having dynamically isolated reaction frame
US09836273 Expired - Lifetime US6316901B2 (en) 1995-04-04 2001-04-18 Exposure apparatus and method utilizing isolated reaction frame
US09964550 Expired - Fee Related US6683433B2 (en) 1995-04-04 2001-09-28 Exposure apparatus and method utilizing isolated reaction frame
US10611260 Expired - Fee Related US6747732B1 (en) 1995-04-04 2003-07-02 Method of making exposure apparatus with dynamically isolated reaction frame

Family Applications Before (10)

Application Number Title Priority Date Filing Date
US08416558 Expired - Lifetime US5874820A (en) 1995-04-04 1995-04-04 Window frame-guided stage mechanism
US09192153 Expired - Lifetime US6246202B1 (en) 1995-04-04 1998-11-12 Method of making exposure apparatus with dynamically isolated reaction frame
US09317847 Expired - Lifetime US6087797A (en) 1995-04-04 1999-05-25 Exposure method, and method of making exposure apparatus having dynamically isolated reaction frame
US09320842 Expired - Lifetime US6020710A (en) 1995-04-04 1999-05-26 Exposure method, and method of making exposure apparatus having dynamically isolated reaction frame
US09318622 Expired - Lifetime US6150787A (en) 1995-04-04 1999-05-26 Exposure apparatus having dynamically isolated reaction frame
US09318623 Expired - Lifetime US6188195B1 (en) 1995-04-04 1999-05-26 Exposure method, and method of making exposure apparatus having dynamically isolated support structure
US09320706 Expired - Lifetime US6151105A (en) 1995-04-04 1999-05-27 Exposure apparatus having dynamically isolated support structure
US09320703 Expired - Lifetime US6175404B1 (en) 1995-04-04 1999-05-27 Exposure apparatus having dynamically isolated reaction frame
US09836273 Expired - Lifetime US6316901B2 (en) 1995-04-04 2001-04-18 Exposure apparatus and method utilizing isolated reaction frame
US09964550 Expired - Fee Related US6683433B2 (en) 1995-04-04 2001-09-28 Exposure apparatus and method utilizing isolated reaction frame

Country Status (3)

Country Link
US (11) US5874820A (en)
JP (3) JPH08330224A (en)
KR (5) KR100314554B1 (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060132740A1 (en) * 2003-06-19 2006-06-22 Nikon Corporation Exposure apparatus, and device manufacturing method
US20060274293A1 (en) * 2003-02-26 2006-12-07 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US20070132975A1 (en) * 2003-04-11 2007-06-14 Nikon Corporation Cleanup method for optics in immersion lithography
US20070182945A1 (en) * 2004-07-12 2007-08-09 Makoto Shibuta Exposure apparatus and device manufacturing method
US20070242247A1 (en) * 2004-06-09 2007-10-18 Kenichi Shiraishi Exposure apparatus and device manufacturing method
US20070247602A1 (en) * 2003-04-11 2007-10-25 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US20070247600A1 (en) * 2003-05-23 2007-10-25 Nikon Corporation Exposure apparatus and method for producing device
US20070263193A1 (en) * 2003-07-09 2007-11-15 Nikon Corporation Exposure apparatus and method for manufacturing device
US20080143994A1 (en) * 2004-04-09 2008-06-19 Nikon Corporation Drive Method of Moving Body, Stage Unit, and Exposure Apparatus
US20090231564A1 (en) * 2004-02-02 2009-09-17 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
US8451424B2 (en) 2003-07-28 2013-05-28 Nikon Corporation Exposure apparatus, method for producing device, and method for controlling exposure apparatus
US10139737B2 (en) 2004-02-02 2018-11-27 Nikon Corporation Lithographic apparatus and method having substrate and sensor tables

Families Citing this family (204)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6989647B1 (en) * 1994-04-01 2006-01-24 Nikon Corporation Positioning device having dynamically isolated frame, and lithographic device provided with such a positioning device
US7365513B1 (en) 1994-04-01 2008-04-29 Nikon Corporation Positioning device having dynamically isolated frame, and lithographic device provided with such a positioning device
US5528118A (en) * 1994-04-01 1996-06-18 Nikon Precision, Inc. Guideless stage with isolated reaction stage
JP3363662B2 (en) * 1994-05-19 2003-01-08 キヤノン株式会社 Scanning stage device and an exposure apparatus using the same
US6721034B1 (en) 1994-06-16 2004-04-13 Nikon Corporation Stage unit, drive table, and scanning exposure apparatus using the same
US5850280A (en) * 1994-06-16 1998-12-15 Nikon Corporation Stage unit, drive table, and scanning exposure and apparatus using same
US6008500A (en) * 1995-04-04 1999-12-28 Nikon Corporation Exposure apparatus having dynamically isolated reaction frame
US5874820A (en) * 1995-04-04 1999-02-23 Nikon Corporation Window frame-guided stage mechanism
US6392741B1 (en) * 1995-09-05 2002-05-21 Nikon Corporation Projection exposure apparatus having active vibration isolator and method of controlling vibration by the active vibration isolator
US6522386B1 (en) * 1997-07-24 2003-02-18 Nikon Corporation Exposure apparatus having projection optical system with aberration correction element
EP1041607A4 (en) 1997-11-12 2003-11-05 Nikon Corp Projection exposure apparatus
JP3526202B2 (en) * 1998-02-03 2004-05-10 キヤノン株式会社 Stage apparatus, and an exposure apparatus using the same, and device manufacturing method
US6260282B1 (en) * 1998-03-27 2001-07-17 Nikon Corporation Stage control with reduced synchronization error and settling time
JPH11287880A (en) * 1998-04-01 1999-10-19 Canon Inc Stage device, aligner using the device and device production method
JP3554186B2 (en) * 1998-04-08 2004-08-18 キヤノン株式会社 Exposure apparatus, device manufacturing method and reaction force receiving method
WO1999053600A1 (en) 1998-04-10 1999-10-21 Nikon Corporation Linear motor having polygonal coil unit
JP4277448B2 (en) 1998-07-22 2009-06-10 株式会社ニコン Mark detection method and the mark detection device
US6252234B1 (en) * 1998-08-14 2001-06-26 Nikon Corporation Reaction force isolation system for a planar motor
JP2001068396A (en) * 1999-08-26 2001-03-16 Canon Inc Stage control apparatus
JP3616543B2 (en) * 1999-09-10 2005-02-02 日本電気株式会社 Xy stage
US6549277B1 (en) 1999-09-28 2003-04-15 Nikon Corporation Illuminance meter, illuminance measuring method and exposure apparatus
US6324933B1 (en) 1999-10-06 2001-12-04 Agere Systems Guardian Corp. Planar movable stage mechanism
EP1107067B1 (en) * 1999-12-01 2006-12-27 ASML Netherlands B.V. Positioning apparatus and lithographic apparatus comprising the same
DE60032568T2 (en) 1999-12-01 2007-10-04 Asml Netherlands B.V. Positioning apparatus and provided therewith lithographic apparatus
US6791661B2 (en) 1999-12-09 2004-09-14 Nikon Corporation Gas replacement method and apparatus, and exposure method and apparatus
EP1248288A1 (en) 1999-12-16 2002-10-09 Nikon Corporation Exposure method and exposure apparatus
US6836093B1 (en) * 1999-12-21 2004-12-28 Nikon Corporation Exposure method and apparatus
US6271606B1 (en) * 1999-12-23 2001-08-07 Nikon Corporation Driving motors attached to a stage that are magnetically coupled through a chamber
US6555829B1 (en) 2000-01-10 2003-04-29 Applied Materials, Inc. High precision flexure stage
JP2001209188A (en) 2000-01-27 2001-08-03 Nikon Corp Scanning type aligner, method for scanning exposure and mask
KR100772148B1 (en) 2000-03-23 2007-10-31 에이에스엠엘 유에스, 인크. Scanning framing blade apparatus
US6307619B1 (en) * 2000-03-23 2001-10-23 Silicon Valley Group, Inc. Scanning framing blade apparatus
JP2001297960A (en) 2000-04-11 2001-10-26 Nikon Corp Stage device and projection aligner
US6405659B1 (en) 2000-05-01 2002-06-18 Nikon Corporation Monolithic stage
US6473161B2 (en) * 2000-06-02 2002-10-29 Asml Netherlands B.V. Lithographic projection apparatus, supporting assembly and device manufacturing method
US6496060B2 (en) 2000-06-15 2002-12-17 Nikon Corporation Hybridized, high performance PWM amplifier
US6958808B2 (en) * 2000-11-16 2005-10-25 Nikon Corporation System and method for resetting a reaction mass assembly of a stage assembly
US6885430B2 (en) * 2000-11-16 2005-04-26 Nikon Corporation System and method for resetting a reaction mass assembly of a stage assembly
US6496248B2 (en) * 2000-12-15 2002-12-17 Nikon Corporation Stage device and exposure apparatus and method
US6906334B2 (en) 2000-12-19 2005-06-14 Nikon Corporation Curved I-core
US20020080339A1 (en) * 2000-12-25 2002-06-27 Nikon Corporation Stage apparatus, vibration control method and exposure apparatus
US6490105B2 (en) * 2001-03-27 2002-12-03 Nikon Precision Inc. Stage mirror retention system
US6678038B2 (en) 2001-08-03 2004-01-13 Nikon Corporation Apparatus and methods for detecting tool-induced shift in microlithography apparatus
US6648509B2 (en) 2001-08-15 2003-11-18 Nikon Corporation Friction-drive stage
US6842226B2 (en) * 2001-09-21 2005-01-11 Nikon Corporation Flexure supported wafer table
US6600547B2 (en) 2001-09-24 2003-07-29 Nikon Corporation Sliding seal
US20030098965A1 (en) * 2001-11-29 2003-05-29 Mike Binnard System and method for supporting a device holder with separate components
US6888620B2 (en) * 2001-11-29 2005-05-03 Nikon Corporation System and method for holding a device with minimal deformation
US6879127B2 (en) 2002-02-12 2005-04-12 Nikon Corporation 3-ring magnetic anti-gravity support
US6784978B2 (en) * 2002-03-12 2004-08-31 Asml Holding N.V. Method, system, and apparatus for management of reaction loads in a lithography system
US6809323B2 (en) * 2002-04-03 2004-10-26 Nikon Corporation Isolated frame caster
US6724000B2 (en) 2002-05-16 2004-04-20 Nikon Corporation Reaction frame apparatus and method
US6844635B2 (en) * 2002-05-24 2005-01-18 Dover Instrument Corporation Reaction force transfer system
JP3962669B2 (en) * 2002-10-08 2007-08-22 キヤノン株式会社 Manufacturing method of a mobile device and an exposure apparatus and device
US20040080730A1 (en) * 2002-10-29 2004-04-29 Michael Binnard System and method for clamping a device holder with reduced deformation
KR100585476B1 (en) * 2002-11-12 2006-06-07 에이에스엠엘 네델란즈 비.브이. Lithographic Apparatus and Device Manufacturing Method
US7213963B2 (en) * 2003-06-09 2007-05-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7372541B2 (en) * 2002-11-12 2008-05-13 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
CN100568101C (en) * 2002-11-12 2009-12-09 Asml荷兰有限公司 Lithographic apparatus and device manufacturing method
US9482966B2 (en) 2002-11-12 2016-11-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
KR101085372B1 (en) * 2002-12-10 2011-11-21 가부시키가이샤 니콘 Exposure apparatus and method for manufacturing device
DE10261775A1 (en) 2002-12-20 2004-07-01 Carl Zeiss Smt Ag Device for optical measurement of an imaging system
US20040119436A1 (en) * 2002-12-23 2004-06-24 Michael Binnard Method and apparatus for reducing countermass stroke with initial velocity
US6870600B2 (en) * 2003-01-13 2005-03-22 Nikon Corporation Vibration-attenuation devices and methods using pressurized bellows exhibiting substantially zero lateral stiffness
US20040160132A1 (en) * 2003-02-14 2004-08-19 Carter Frederick Michael System and method to reduce the effect of reactive forces on a stage using a balance mass
US8027813B2 (en) * 2004-02-20 2011-09-27 Nikon Precision, Inc. Method and system for reconstructing aberrated image profiles through simulation
KR101181688B1 (en) * 2003-03-25 2012-09-19 가부시키가이샤 니콘 Exposure system and device production method
EP1612850B1 (en) * 2003-04-07 2009-03-25 Nikon Corporation Exposure apparatus and method for manufacturing a device
KR101532824B1 (en) 2003-04-09 2015-07-01 가부시키가이샤 니콘 Exposure method and apparatus, and device manufacturing method
EP3352010A1 (en) 2003-04-10 2018-07-25 Nikon Corporation Run-off path to collect liquid for an immersion lithography apparatus
EP3232271A1 (en) 2003-04-10 2017-10-18 Nikon Corporation Environmental system including vacuum scavenge for an immersion lithography apparatus
KR20170064003A (en) * 2003-04-10 2017-06-08 가부시키가이샤 니콘 Environmental system including a transport region for an immersion lithography apparatus
WO2004102646A1 (en) * 2003-05-15 2004-11-25 Nikon Corporation Exposure apparatus and method for manufacturing device
KR20060009957A (en) * 2003-05-27 2006-02-01 가부시키가이샤 니콘 Exposure apparatus and device-producing method
EP1628330A4 (en) 2003-05-28 2009-09-16 Nikon Corp Exposure method, exposure device, and device manufacturing method
KR101087516B1 (en) 2003-06-04 2011-11-28 가부시키가이샤 니콘 Stage apparatus, fixation method, exposure apparatus, exposure method, and device producing method
KR101528016B1 (en) 2003-06-13 2015-06-12 가부시키가이샤 니콘 Exposure method, substrate stage, exposure apparatus and method for manufacturing device
EP2853943B1 (en) * 2003-07-08 2016-11-16 Nikon Corporation Wafer table for immersion lithography
EP2264532B1 (en) * 2003-07-09 2012-10-31 Nikon Corporation Exposure apparatus and device manufacturing method
CN102944981A (en) * 2003-07-09 2013-02-27 株式会社尼康 Exposure apparatus, and device fabricating method
CN102854755A (en) * 2003-07-09 2013-01-02 株式会社尼康 Exposure apparatus
EP1503244A1 (en) 2003-07-28 2005-02-02 ASML Netherlands B.V. Lithographic projection apparatus and device manufacturing method
US7009359B2 (en) * 2003-08-08 2006-03-07 Asml Holding N.V. Foam core chuck for the scanning stage of a lithography system
KR101475995B1 (en) * 2003-08-21 2014-12-23 가부시키가이샤 니콘 Exposure apparatus, exposure method, and device producing method
JP4325622B2 (en) 2003-08-29 2009-09-02 株式会社ニコン Exposure apparatus and device manufacturing method
KR101609964B1 (en) 2003-08-29 2016-04-14 가부시키가이샤 니콘 Liquid recovery apparatus, exposure apparatus, exposure method, and device production method
US20050057102A1 (en) * 2003-09-11 2005-03-17 Nikon Corporation Holding member, coolant, cooling method and cooling device, linear motor device, stage device, and exposure apparatus
WO2005029559A1 (en) * 2003-09-19 2005-03-31 Nikon Corporation Exposure apparatus and device producing method
EP2312395B1 (en) 2003-09-29 2015-05-13 Nikon Corporation Exposure apparatus, exposure method, and method for producing a device
KR20060120658A (en) * 2003-10-08 2006-11-27 가부시키가이샤 니콘 Substrate carrying apparatus, exposure apparatus, and method for producing device
KR101111364B1 (en) 2003-10-08 2012-02-27 가부시키가이샤 니콘 Substrate carrying apparatus, substrate carrying method, exposure apparatus, exposure method, and method for producing device
KR20140049044A (en) 2003-10-22 2014-04-24 가부시키가이샤 니콘 Exposure apparatus, exposure method, and method for manufacturing device
WO2005041276A1 (en) 2003-10-28 2005-05-06 Nikon Corporation Exposure apparatus, exposure method, and device producing method
EP1679737A4 (en) 2003-10-31 2008-01-30 Nikon Corp Exposure apparatus and device producing method
JP2005159322A (en) * 2003-10-31 2005-06-16 Nikon Corp Surface plate, stage apparatus, exposure device and exposing method
WO2005048326A1 (en) * 2003-11-13 2005-05-26 Nikon Corporation Variable slit apparatus, illumination apparatus, exposure apparatus, exposure method, and device producing method
JPWO2005048325A1 (en) * 2003-11-17 2007-11-29 株式会社ニコン Stage drive methods and stage apparatus and exposure apparatus
EP3139214A3 (en) * 2003-12-03 2017-05-31 Nikon Corporation Exposure apparatus, exposure method, device producing method, and optical component
US20050128449A1 (en) * 2003-12-12 2005-06-16 Nikon Corporation, A Japanese Corporation Utilities transfer system in a lithography system
WO2005057636A1 (en) * 2003-12-15 2005-06-23 Nikon Corporation Stage system, exposure apparatus and exposure method
KR101911681B1 (en) 2004-01-05 2018-10-25 가부시키가이샤 니콘 Exposure apparatus, exposure method, and device producing method
KR20060128912A (en) 2004-01-15 2006-12-14 가부시키가이샤 니콘 Exposure apparatus and device producing method
KR101135232B1 (en) * 2004-01-20 2012-04-12 칼 짜이스 에스엠테 게엠베하 Microlithographic projection exposure apparatus
US20050162802A1 (en) * 2004-01-22 2005-07-28 Nikon Research Corporation Of America Offset gap control for electromagnetic devices
WO2005071717A1 (en) * 2004-01-26 2005-08-04 Nikon Corporation Exposure apparatus and device producing method
US7221433B2 (en) * 2004-01-28 2007-05-22 Nikon Corporation Stage assembly including a reaction assembly having a connector assembly
KR101227211B1 (en) * 2004-02-03 2013-01-28 가부시키가이샤 니콘 Exposure apparatus and method of producing device
WO2005076325A1 (en) * 2004-02-04 2005-08-18 Nikon Corporation Exposure equipment and method, position control method and device manufacturing method
EP3093873B1 (en) 2004-02-04 2017-10-11 Nikon Corporation Exposure apparatus, exposure method, and method for producing a device
WO2005076323A1 (en) 2004-02-10 2005-08-18 Nikon Corporation Aligner, device manufacturing method, maintenance method and aligning method
WO2005081291A1 (en) * 2004-02-19 2005-09-01 Nikon Corporation Exposure apparatus and method of producing device
US20070030467A1 (en) * 2004-02-19 2007-02-08 Nikon Corporation Exposure apparatus, exposure method, and device fabricating method
KR100541740B1 (en) * 2004-02-19 2006-01-11 삼성전자주식회사 Transfer apparatus
US20070258068A1 (en) * 2005-02-17 2007-11-08 Hiroto Horikawa Exposure Apparatus, Exposure Method, and Device Fabricating Method
JP5076497B2 (en) * 2004-02-20 2012-11-21 株式会社ニコン Exposure apparatus, supply method and the method of recovering the liquid, the exposure method, and device manufacturing method
KR101250155B1 (en) 2004-03-25 2013-04-05 가부시키가이샤 니콘 Exposure apparatus and method for manufacturing device
US7034917B2 (en) * 2004-04-01 2006-04-25 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method and device manufactured thereby
KR101330370B1 (en) 2004-04-19 2013-11-15 가부시키가이샤 니콘 Exposure apparatus and device producing method
US7486381B2 (en) * 2004-05-21 2009-02-03 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US20070216889A1 (en) * 2004-06-04 2007-09-20 Yasufumi Nishii Exposure Apparatus, Exposure Method, and Method for Producing Device
EP1774405B1 (en) 2004-06-04 2014-08-06 Carl Zeiss SMT GmbH System for measuring the image quality of an optical imaging system
EP1780786A4 (en) * 2004-06-07 2009-11-25 Nikon Corp Stage apparatus, exposure apparatus, and exposure method
KR101556454B1 (en) 2004-06-10 2015-10-13 가부시키가이샤 니콘 Exposure equipment, exposure method and device manufacturing method
KR101577515B1 (en) 2004-06-10 2015-12-14 가부시키가이샤 니콘 Exposure apparatus, exposure method, and device producing method
US8373843B2 (en) * 2004-06-10 2013-02-12 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US8717533B2 (en) * 2004-06-10 2014-05-06 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US8508713B2 (en) * 2004-06-10 2013-08-13 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
WO2005124833A1 (en) 2004-06-21 2005-12-29 Nikon Corporation Exposure device, exposure device member cleaning method, exposure device maintenance method, maintenance device, and device manufacturing method
US8698998B2 (en) * 2004-06-21 2014-04-15 Nikon Corporation Exposure apparatus, method for cleaning member thereof, maintenance method for exposure apparatus, maintenance device, and method for producing device
KR101330922B1 (en) * 2004-06-21 2013-11-18 가부시키가이샤 니콘 Exposure equipment and device manufacturing method
US7292310B2 (en) * 2004-07-02 2007-11-06 Asml Netherlands B.V. Lithographic apparatus and a device manufacturing method
US7463330B2 (en) 2004-07-07 2008-12-09 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
WO2006006730A1 (en) * 2004-07-15 2006-01-19 Nikon Corporation Planar motor equipment, stage equipment, exposure equipment and device manufacturing method
EP1783823A4 (en) * 2004-07-21 2009-07-22 Nikon Corp Exposure method and method for producing device
US7030959B2 (en) * 2004-07-23 2006-04-18 Nikon Corporation Extreme ultraviolet reticle protection using gas flow thermophoresis
US8169591B2 (en) 2004-08-03 2012-05-01 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
JP2008511138A (en) 2004-08-18 2008-04-10 ニュー ウエイ マシーン コンポーネント インコーポレイティッド Moving the vacuum chamber stage having an air bearing and the step pumping grooves
EP1801853A4 (en) * 2004-08-18 2008-06-04 Nikon Corp Exposure apparatus and device manufacturing method
JP2006083883A (en) * 2004-09-14 2006-03-30 Fujikura Rubber Ltd Vibration-free base device
CN101015039B (en) * 2004-09-17 2010-09-01 尼康股份有限公司 Substrate for exposure, exposure method and device manufacturing method
US8102512B2 (en) * 2004-09-17 2012-01-24 Nikon Corporation Substrate holding device, exposure apparatus, and device manufacturing method
JP4071227B2 (en) * 2004-09-28 2008-04-02 株式会社新川 Bonding apparatus
KR101151575B1 (en) 2004-10-01 2012-06-01 가부시키가이샤 니콘 Linear motor, stage apparatus and exposure apparatus
KR20070063505A (en) * 2004-10-08 2007-06-19 가부시키가이샤 니콘 Exposure device and device manufacturing method
KR20070068340A (en) * 2004-10-13 2007-06-29 가부시키가이샤 니콘 Exposure device, exposure method, and device manufacturing method
KR101285951B1 (en) 2004-10-26 2013-07-12 가부시키가이샤 니콘 Substrate processing method, exposure apparatus and method for manufacturing device
EP1816671A4 (en) 2004-11-11 2010-01-13 Nikon Corp Exposure method, device manufacturing method, and substrate
KR101191056B1 (en) * 2004-11-19 2012-10-15 가부시키가이샤 니콘 Maintenance method, exposure method, exposure apparatus, and device producing method
US9557656B2 (en) 2004-12-01 2017-01-31 Nikon Corporation Stage apparatus and exposure apparatus
JP4555903B2 (en) * 2004-12-02 2010-10-06 株式会社ニコン Exposure apparatus and device manufacturing method
CN100483625C (en) * 2004-12-02 2009-04-29 株式会社尼康 Exposure apparatus, exposure method and device manufacturing method
US7397533B2 (en) * 2004-12-07 2008-07-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP4752473B2 (en) 2004-12-09 2011-08-17 株式会社ニコン Exposure apparatus, exposure method and device manufacturing method
KR101771334B1 (en) 2004-12-15 2017-08-24 가부시키가이샤 니콘 Substrate holding apparatus, exposure apparatus and device manufacturing method
JP4943345B2 (en) * 2004-12-23 2012-05-30 エーエスエムエル ネザーランズ ビー.ブイ. Lithographic apparatus
KR20070090876A (en) * 2004-12-24 2007-09-06 가부시키가이샤 니콘 Magnetic guiding apparatus, stage apparatus, exposure apparatus and device manufacturing method
US7450217B2 (en) * 2005-01-12 2008-11-11 Asml Netherlands B.V. Exposure apparatus, coatings for exposure apparatus, lithographic apparatus, device manufacturing method, and device manufactured thereby
US8053937B2 (en) * 2005-01-21 2011-11-08 Nikon Corporation Linear motor, stage apparatus and exposure apparatus
EP1843204A1 (en) 2005-01-25 2007-10-10 Nikon Corporation Exposure device, exposure method, and micro device manufacturing method
US20060192858A1 (en) * 2005-02-28 2006-08-31 Calvet Robert J Oil damping for camera optical assembly
US7813634B2 (en) 2005-02-28 2010-10-12 Tessera MEMS Technologies, Inc. Autofocus camera
US7283210B2 (en) * 2005-03-22 2007-10-16 Nikon Corporation Image shift optic for optical system
KR101555707B1 (en) 2005-04-18 2015-09-25 가부시키가이샤 니콘 The exposure apparatus and exposure methods, and device manufacturing method
CN100555568C (en) * 2005-04-28 2009-10-28 株式会社尼康 Exposure method, exposure apparatus and device manufacturing method
EP2660852B1 (en) 2005-05-12 2015-09-02 Nikon Corporation Projection optical system, exposure apparatus and exposure method
US8693006B2 (en) * 2005-06-28 2014-04-08 Nikon Corporation Reflector, optical element, interferometer system, stage device, exposure apparatus, and device fabricating method
JP2007012375A (en) * 2005-06-29 2007-01-18 Toyota Motor Corp Fuel cell, method of manufacturing electrode catalyst layer, and operation method thereof
CN100565799C (en) * 2005-07-11 2009-12-02 株式会社尼康 Exposure apparatus and method for manufacturing device
JP5309565B2 (en) * 2005-08-05 2013-10-09 株式会社ニコン Stage apparatus, exposure apparatus, methods, exposure methods, and device manufacturing method
US7580112B2 (en) * 2005-08-25 2009-08-25 Nikon Corporation Containment system for immersion fluid in an immersion lithography apparatus
DE102005045680A1 (en) * 2005-09-24 2007-04-05 Edmund Uschkurat Device for aligning an object along an X-, Y- or Z-axis used e.g. in the pharmaceutical industry comprises a base plate and tables adjustable along the X-axis, Y-axis and the Z-axis
US8125610B2 (en) 2005-12-02 2012-02-28 ASML Metherlands B.V. Method for preventing or reducing contamination of an immersion type projection apparatus and an immersion type lithographic apparatus
DE102005061215A1 (en) * 2005-12-21 2007-07-05 Lucas Automotive Gmbh Control circuit for electrical consumer, has component assembly admitted at input with control signal, in order to provide output
US7649611B2 (en) * 2005-12-30 2010-01-19 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
DE102006021797A1 (en) 2006-05-09 2007-11-15 Carl Zeiss Smt Ag Optical imaging device with thermal attenuation
JP4130837B2 (en) 2006-06-16 2008-08-06 住友重機械工業株式会社 Stage reaction force processing apparatus
US20080073563A1 (en) 2006-07-01 2008-03-27 Nikon Corporation Exposure apparatus that includes a phase change circulation system for movers
KR101236043B1 (en) * 2006-07-14 2013-02-21 가부시키가이샤 니콘 Stage apparatus, exposure apparatus, and device manufacturing method
KR101259643B1 (en) 2006-07-28 2013-04-30 엘지전자 주식회사 Device for compensating straightness of stage for exposurer
US7973910B2 (en) * 2006-11-17 2011-07-05 Nikon Corporation Stage apparatus and exposure apparatus
US8237911B2 (en) 2007-03-15 2012-08-07 Nikon Corporation Apparatus and methods for keeping immersion fluid adjacent to an optical assembly during wafer exchange in an immersion lithography machine
US20080225248A1 (en) * 2007-03-15 2008-09-18 Nikon Corporation Apparatus, systems and methods for removing liquid from workpiece during workpiece processing
US7830046B2 (en) * 2007-03-16 2010-11-09 Nikon Corporation Damper for a stage assembly
US20080231823A1 (en) * 2007-03-23 2008-09-25 Nikon Corporation Apparatus and methods for reducing the escape of immersion liquid from immersion lithography apparatus
JP5267029B2 (en) 2007-10-12 2013-08-21 株式会社ニコン Illumination optical apparatus, exposure apparatus and device manufacturing method
CN101418434B (en) * 2007-10-23 2011-06-22 鸿富锦精密工业(深圳)有限公司 Sputtering carrying platform
US8379187B2 (en) 2007-10-24 2013-02-19 Nikon Corporation Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method
US9116346B2 (en) 2007-11-06 2015-08-25 Nikon Corporation Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method
CN101520606B (en) 2008-01-02 2011-07-20 西安交通大学 Non-contact long-stroke multi-degree-of-freedom nanometer precision working table
NL2002925A1 (en) * 2008-05-29 2009-12-01 Asml Netherlands Bv Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method.
US8796644B2 (en) * 2008-08-18 2014-08-05 Mapper Lithography Ip B.V. Charged particle beam lithography system and target positioning device
NL2003363A (en) * 2008-09-10 2010-03-15 Asml Netherlands Bv Lithographic apparatus, method of manufacturing an article for a lithographic apparatus and device manufacturing method.
US8451431B2 (en) * 2009-01-27 2013-05-28 Nikon Corporation Control systems and methods applying iterative feedback tuning for feed-forward and synchronization control of microlithography stages and the like
US20100222898A1 (en) * 2009-01-27 2010-09-02 Nikon Corporation Stage-control systems and methods including inverse closed loop with adaptive controller
US8767174B2 (en) * 2010-02-18 2014-07-01 Nikon Corporation Temperature-controlled holding devices for planar articles
EP2381310B1 (en) 2010-04-22 2015-05-06 ASML Netherlands BV Fluid handling structure and lithographic apparatus
US20130255414A1 (en) 2010-09-09 2013-10-03 Nikon Corporation Parallel Linkage and Actuator Motor Coil Designs for Tube Carrier
CN102231051A (en) * 2011-05-20 2011-11-02 合肥芯硕半导体有限公司 Pneumatic automatic focusing device and method of photoetching machine
US8572518B2 (en) 2011-06-23 2013-10-29 Nikon Precision Inc. Predicting pattern critical dimensions in a lithographic exposure process
US9030057B2 (en) 2011-06-24 2015-05-12 Nikon Corporation Method and apparatus to allow a plurality of stages to operate in close proximity
US9977343B2 (en) 2013-09-10 2018-05-22 Nikon Corporation Correction of errors caused by ambient non-uniformities in a fringe-projection autofocus system in absence of a reference mirror
CN104880911B (en) * 2014-02-28 2018-01-30 上海微电子装备(集团)股份有限公司 A lithographic machine and the vertical position of the workpiece table initialization method
KR20170016007A (en) * 2014-06-16 2017-02-10 에이에스엠엘 네델란즈 비.브이. Lithographic apparatus, method of transferring a substrate and device manufacturing method
CN107290933B (en) * 2016-03-30 2018-11-09 上海微电子装备(集团)股份有限公司 Leveling apparatus for a lithographic projection and the leveling method

Citations (89)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US27289A (en) * 1860-02-28 Island
US27436A (en) * 1860-03-13 Kaitge
US3789285A (en) * 1972-03-27 1974-01-29 Handotai Kenkyu Shinkokai Position control system using magnetic force
US3889164A (en) * 1973-01-24 1975-06-10 Handotai Kenkyu Shinkokai Position control system using magnetic forces for correcting the inclination of a controlled member including a torsional mounting
US3935486A (en) * 1973-08-27 1976-01-27 Citizen Watch Co., Ltd. Finely adjustable table assembly
US4019109A (en) * 1974-05-13 1977-04-19 Hughes Aircraft Company Alignment system and method with micromovement stage
US4087729A (en) * 1975-04-21 1978-05-02 Nippon Telegraph & Telephone Public Corporation Position finely adjusting apparatus
US4234175A (en) * 1977-12-20 1980-11-18 Canon Kabushiki Kaisha High precision positioning device
US4383757A (en) * 1979-04-02 1983-05-17 Optimetrix Corporation Optical focusing system
US4392642A (en) * 1980-12-22 1983-07-12 Anorad Corporation Workpiece positioning table with air bearing pads
US4409860A (en) * 1979-04-06 1983-10-18 Hitachi, Ltd. Apparatus for precisely moving a table
US4425508A (en) * 1982-05-07 1984-01-10 Gca Corporation Electron beam lithographic apparatus
US4443743A (en) * 1978-10-05 1984-04-17 Mcdonnell Douglas Corporation Two axis actuator
US4485339A (en) * 1983-06-10 1984-11-27 The Perkin-Elmer Corporation Electro-magnetic alignment device
US4492356A (en) * 1982-02-26 1985-01-08 Hitachi, Ltd. Precision parallel translation system
US4504144A (en) * 1982-07-06 1985-03-12 The Perkin-Elmer Corporation Simple electromechanical tilt and focus device
US4506205A (en) * 1983-06-10 1985-03-19 The Perkin-Elmer Corporation Electro-magnetic alignment apparatus
US4506204A (en) * 1983-06-10 1985-03-19 The Perkin-Elmer Corporation Electro-magnetic apparatus
US4507597A (en) * 1983-06-10 1985-03-26 The Perkin-Elmer Corporation Electro-magnetic alignment assemblies
US4514858A (en) * 1983-03-15 1985-04-30 Micronix Partners Lithography system
US4516253A (en) * 1983-03-15 1985-05-07 Micronix Partners Lithography system
US4525659A (en) * 1981-10-20 1985-06-25 Telmec Co., Ltd. Positioning stage having a vibration suppressor
US4575942A (en) * 1982-10-18 1986-03-18 Hitachi, Ltd. Ultra-precision two-dimensional moving apparatus
US4615515A (en) * 1983-12-27 1986-10-07 Canon Kabushiki Kaisha Precise movement device
US4641071A (en) * 1985-09-25 1987-02-03 Canon Kabushiki Kaisha System for controlling drive of a wafer stage
US4648723A (en) * 1984-07-23 1987-03-10 Omron Tateisi Electronics Co. Static pressure air surface stage
US4648724A (en) * 1984-07-20 1987-03-10 Omron Tateisi Electronics Co. Static pressure air surface stage
US4654571A (en) * 1985-09-16 1987-03-31 Hinds Walter E Single plane orthogonally movable drive system
US4653408A (en) * 1984-09-05 1987-03-31 Citizen Watch Co., Ltd. Table mechanism for controlling table attitude
US4667139A (en) * 1984-10-31 1987-05-19 Hitachi, Ltd. Table device
US4675891A (en) * 1984-06-29 1987-06-23 Thomson-Cgr X-ray apparatus with focus position control
US4677651A (en) * 1983-12-05 1987-06-30 U.S. Philips Corporation Rotary anode X-ray tube having a sliding bearing
US4684315A (en) * 1982-09-30 1987-08-04 Fujitsu Limited Frictionless supporting apparatus
US4687980A (en) * 1980-10-20 1987-08-18 Eaton Corporation X-Y addressable workpiece positioner and mask aligner using same
US4698575A (en) * 1986-04-29 1987-10-06 U.S. Philips Corporation Positioning device
US4708465A (en) * 1986-02-28 1987-11-24 Canon Kabushiki Kaisha Exposure apparatus
US4723086A (en) * 1986-10-07 1988-02-02 Micronix Corporation Coarse and fine motion positioning mechanism
US4742286A (en) * 1985-10-29 1988-05-03 Micro-Stage, Inc. Gas bearing X-Y-θ stage assembly
US4744675A (en) * 1986-01-21 1988-05-17 Canon Kabushiki Kaisha Moving mechanism
US4750721A (en) * 1985-11-06 1988-06-14 Dainippon Screen Mfg. Co., Ltd. Movable table system
US4770531A (en) * 1986-05-23 1988-09-13 Nippon Kogaku K. K. Stage device with levelling mechanism
US4803712A (en) * 1987-01-20 1989-02-07 Hitachi, Ltd. X-ray exposure system
US4808892A (en) * 1985-12-13 1989-02-28 Kulick And Soffa Ind. Inc. Bi-directional drive motor system
US4812725A (en) * 1987-10-16 1989-03-14 Anwar Chitayat Positioning device with dual linear motor
US4818169A (en) * 1985-05-17 1989-04-04 Schram Richard R Automated wafer inspection system
US4817930A (en) * 1987-05-13 1989-04-04 U.S. Philips Corporation Guiding device
US4870668A (en) * 1987-12-30 1989-09-26 Hampshire Instruments, Inc. Gap sensing/adjustment apparatus and method for a lithography machine
US4891526A (en) * 1986-12-29 1990-01-02 Hughes Aircraft Company X-Y-θ-Z positioning stage
US4916340A (en) * 1988-01-22 1990-04-10 Canon Kabushiki Kaisha Movement guiding mechanism
US4948330A (en) * 1988-02-08 1990-08-14 Kabushiki Kaisha Toshiba Alignment stage device
US4952858A (en) * 1988-05-18 1990-08-28 Galburt Daniel N Microlithographic apparatus
US4993696A (en) * 1986-12-01 1991-02-19 Canon Kabushiki Kaisha Movable stage mechanism
US5022619A (en) * 1988-12-09 1991-06-11 Tokyo Aircraft Instrument Co., Ltd. Positioning device of table for semiconductor wafers
US5040431A (en) * 1988-01-22 1991-08-20 Canon Kabushiki Kaisha Movement guiding mechanism
US5059090A (en) * 1990-01-16 1991-10-22 International Business Machines Corp. Two-dimensional positioning apparatus
US5120034A (en) * 1989-10-05 1992-06-09 U.S. Philips Corp. Two-step positioning device using lorentz forces and a static gas bearing
US5140242A (en) * 1990-04-30 1992-08-18 International Business Machines Corporation Servo guided stage system
US5150153A (en) * 1991-02-05 1992-09-22 U.S. Philips Corp. Lithographic device with a suspended object table
US5184055A (en) * 1989-10-06 1993-02-02 Canon Kabushiki Kaisha Device for positioning control
US5208497A (en) * 1989-04-17 1993-05-04 Sharp Kabushiki Kaisha Linear driving apparatus
US5228358A (en) * 1990-02-21 1993-07-20 Canon Kabushiki Kaisha Motion guiding device
US5241183A (en) * 1991-03-22 1993-08-31 Nippon Telegraph And Telephone Corporation Vertical xy stage
US5243491A (en) * 1990-08-30 1993-09-07 U.S. Philips Corporation Electromagnetic support with current-independent characteristics
US5260580A (en) * 1991-09-18 1993-11-09 Canon Kabushiki Kaisha Stage device for an exposure apparatus and semiconductor device manufacturing method which uses said stage device
US5280677A (en) * 1990-05-17 1994-01-25 Canon Kabushiki Kaisha Positioning mechanism
US5285142A (en) * 1993-02-09 1994-02-08 Svg Lithography Systems, Inc. Wafer stage with reference surface
US5309847A (en) * 1990-04-27 1994-05-10 Ntn Corporation Adjustably movable work table
US5323712A (en) * 1987-08-26 1994-06-28 Kabushiki Kaisha Toshiba Table moving apparatus
US5327060A (en) * 1989-10-05 1994-07-05 U.S. Philips Corporation Positioning device using Lorentz forces
US5338121A (en) * 1992-07-24 1994-08-16 Fujitsu Limited Shuttle apparatus for printer
US5385217A (en) * 1991-05-20 1995-01-31 Ebara Corporation Vibration eliminating apparatus for elminating vibration of an installation floor
US5400674A (en) * 1992-05-08 1995-03-28 New Focus, Inc. Precision component positioner
US5453315A (en) * 1989-11-27 1995-09-26 Censtor Corp. Unitary micro-flexure structure and method of making same
US5467720A (en) * 1991-02-25 1995-11-21 Canon Kabushiki Kaisha Support device
US5504407A (en) * 1992-02-21 1996-04-02 Canon Kabushiki Kaisha Stage driving system
US5508518A (en) * 1995-05-03 1996-04-16 International Business Machines Corporation Lithography tool with vibration isolation
US5524502A (en) * 1993-03-11 1996-06-11 Canon Kabushiki Kaisha Positioning apparatus including a hydrostatic bearing for spacing apart a supporting surface and a guide surface
US5528118A (en) * 1994-04-01 1996-06-18 Nikon Precision, Inc. Guideless stage with isolated reaction stage
US5530516A (en) * 1994-10-04 1996-06-25 Tamarack Scientific Co., Inc. Large-area projection exposure system
US5552888A (en) * 1994-12-02 1996-09-03 Nikon Precision, Inc. Apparatus for measuring position of an X-Y stage
US5578164A (en) * 1993-12-24 1996-11-26 Tokyo Electron Limited Plasma processing apparatus and method
US5610686A (en) * 1994-03-15 1997-03-11 Canon Kabushiki Kaisha Exposure apparatus including an antivibration control system
US5623853A (en) * 1994-10-19 1997-04-29 Nikon Precision Inc. Precision motion stage with single guide beam and follower stage
US5757149A (en) * 1995-09-04 1998-05-26 Canon Kabushiki Kaisha Drive control apparatus
US5760564A (en) * 1995-06-27 1998-06-02 Nikon Precision Inc. Dual guide beam stage mechanism with yaw control
US5796469A (en) * 1993-06-30 1998-08-18 Canon Kabushiki Kaisha Exposure apparatus and device manufacturing method using the same
US5812420A (en) * 1995-09-05 1998-09-22 Nikon Corporation Vibration-preventive apparatus and exposure apparatus
US5874820A (en) * 1995-04-04 1999-02-23 Nikon Corporation Window frame-guided stage mechanism
US6272763B1 (en) * 1993-01-21 2001-08-14 Nikon Corporation Staging apparatus and method, and method for manufacturing the staging apparatus, and exposing apparatus using the staging apparatus

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3457482A (en) * 1967-10-30 1969-07-22 Bruce A Sawyer Magnetic positioning device
NL164370C (en) 1974-07-01 Litton Industries Inc Cardanus Coupling for the suspension of a gyroscope, and a method of manufacturing such a coupling.
JPS5528816B2 (en) * 1976-07-23 1980-07-30
JPS5990929A (en) 1982-11-17 1984-05-25 Canon Inc Focusing method of projected exposing apparatus
JPS60150950A (en) * 1984-01-20 1985-08-08 Hitachi Ltd Guiding device
NL8500930A (en) * 1985-03-29 1986-10-16 Philips Nv A displacement apparatus with pre-stressed contactless bearings.
JPS6320014A (en) * 1986-07-15 1988-01-27 Mitsubishi Electric Corp Liquid circulation filter
JPH0727042B2 (en) * 1986-12-02 1995-03-29 キヤノン株式会社 Stearate - own device
JP2960423B2 (en) 1988-11-16 1999-10-06 株式会社日立製作所 Sample moving device and a semiconductor manufacturing apparatus
US5187519A (en) 1990-10-05 1993-02-16 Canon Kabushiki Kaisha Exposure apparatus having mount means to suppress vibrations
NL9100407A (en) 1991-03-07 1992-10-01 Philips Nv An optical lithographic device with a machine frame offset force.
US5684856A (en) * 1991-09-18 1997-11-04 Canon Kabushiki Kaisha Stage device and pattern transfer system using the same
JP2816513B2 (en) 1992-08-26 1998-10-27 株式会社荏原製作所 Electromagnetic floating floor structure
US5477304A (en) 1992-10-22 1995-12-19 Nikon Corporation Projection exposure apparatus
JP3336441B2 (en) 1992-11-25 2002-10-21 株式会社ニコン Exposure method and apparatus, and device manufacturing method using the method
US5448332A (en) * 1992-12-25 1995-09-05 Nikon Corporation Exposure method and apparatus
JP3277581B2 (en) * 1993-02-01 2002-04-22 株式会社ニコン Stage apparatus and an exposure apparatus
US5621497A (en) * 1994-04-06 1997-04-15 Hitachi, Ltd. Pattern forming method and projection exposure tool therefor
JPH0817151A (en) 1994-04-27 1996-01-19 Sharp Corp Motor controller of information recording/reproducing apparatus
US6008500A (en) * 1995-04-04 1999-12-28 Nikon Corporation Exposure apparatus having dynamically isolated reaction frame
DE69629087D1 (en) * 1995-05-30 2003-08-21 Asml Netherlands Bv Positioning device with a reference frame for a measurement system
JP3221823B2 (en) * 1995-11-24 2001-10-22 キヤノン株式会社 Projection exposure apparatus and exposure method and semiconductor manufacturing method using the same

Patent Citations (99)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US27289A (en) * 1860-02-28 Island
US27436A (en) * 1860-03-13 Kaitge
US3789285A (en) * 1972-03-27 1974-01-29 Handotai Kenkyu Shinkokai Position control system using magnetic force
US3889164A (en) * 1973-01-24 1975-06-10 Handotai Kenkyu Shinkokai Position control system using magnetic forces for correcting the inclination of a controlled member including a torsional mounting
US3935486A (en) * 1973-08-27 1976-01-27 Citizen Watch Co., Ltd. Finely adjustable table assembly
US4019109A (en) * 1974-05-13 1977-04-19 Hughes Aircraft Company Alignment system and method with micromovement stage
US4087729A (en) * 1975-04-21 1978-05-02 Nippon Telegraph & Telephone Public Corporation Position finely adjusting apparatus
US4234175A (en) * 1977-12-20 1980-11-18 Canon Kabushiki Kaisha High precision positioning device
US4443743A (en) * 1978-10-05 1984-04-17 Mcdonnell Douglas Corporation Two axis actuator
US4383757A (en) * 1979-04-02 1983-05-17 Optimetrix Corporation Optical focusing system
US4409860A (en) * 1979-04-06 1983-10-18 Hitachi, Ltd. Apparatus for precisely moving a table
US4687980A (en) * 1980-10-20 1987-08-18 Eaton Corporation X-Y addressable workpiece positioner and mask aligner using same
US4392642A (en) * 1980-12-22 1983-07-12 Anorad Corporation Workpiece positioning table with air bearing pads
US4525659A (en) * 1981-10-20 1985-06-25 Telmec Co., Ltd. Positioning stage having a vibration suppressor
US4492356A (en) * 1982-02-26 1985-01-08 Hitachi, Ltd. Precision parallel translation system
US4425508A (en) * 1982-05-07 1984-01-10 Gca Corporation Electron beam lithographic apparatus
US4504144A (en) * 1982-07-06 1985-03-12 The Perkin-Elmer Corporation Simple electromechanical tilt and focus device
US4684315A (en) * 1982-09-30 1987-08-04 Fujitsu Limited Frictionless supporting apparatus
US4575942A (en) * 1982-10-18 1986-03-18 Hitachi, Ltd. Ultra-precision two-dimensional moving apparatus
US4514858A (en) * 1983-03-15 1985-04-30 Micronix Partners Lithography system
US4516253A (en) * 1983-03-15 1985-05-07 Micronix Partners Lithography system
US4485339A (en) * 1983-06-10 1984-11-27 The Perkin-Elmer Corporation Electro-magnetic alignment device
US4506204A (en) * 1983-06-10 1985-03-19 The Perkin-Elmer Corporation Electro-magnetic apparatus
US4507597A (en) * 1983-06-10 1985-03-26 The Perkin-Elmer Corporation Electro-magnetic alignment assemblies
US4506205A (en) * 1983-06-10 1985-03-19 The Perkin-Elmer Corporation Electro-magnetic alignment apparatus
US4677651A (en) * 1983-12-05 1987-06-30 U.S. Philips Corporation Rotary anode X-ray tube having a sliding bearing
US4615515A (en) * 1983-12-27 1986-10-07 Canon Kabushiki Kaisha Precise movement device
US4675891A (en) * 1984-06-29 1987-06-23 Thomson-Cgr X-ray apparatus with focus position control
US4648724A (en) * 1984-07-20 1987-03-10 Omron Tateisi Electronics Co. Static pressure air surface stage
US4648723A (en) * 1984-07-23 1987-03-10 Omron Tateisi Electronics Co. Static pressure air surface stage
US4653408A (en) * 1984-09-05 1987-03-31 Citizen Watch Co., Ltd. Table mechanism for controlling table attitude
US4667139A (en) * 1984-10-31 1987-05-19 Hitachi, Ltd. Table device
US4818169A (en) * 1985-05-17 1989-04-04 Schram Richard R Automated wafer inspection system
US4654571A (en) * 1985-09-16 1987-03-31 Hinds Walter E Single plane orthogonally movable drive system
US4641071A (en) * 1985-09-25 1987-02-03 Canon Kabushiki Kaisha System for controlling drive of a wafer stage
US4742286A (en) * 1985-10-29 1988-05-03 Micro-Stage, Inc. Gas bearing X-Y-θ stage assembly
US4750721A (en) * 1985-11-06 1988-06-14 Dainippon Screen Mfg. Co., Ltd. Movable table system
US4808892A (en) * 1985-12-13 1989-02-28 Kulick And Soffa Ind. Inc. Bi-directional drive motor system
US4744675A (en) * 1986-01-21 1988-05-17 Canon Kabushiki Kaisha Moving mechanism
US4708465A (en) * 1986-02-28 1987-11-24 Canon Kabushiki Kaisha Exposure apparatus
US4698575A (en) * 1986-04-29 1987-10-06 U.S. Philips Corporation Positioning device
US4770531A (en) * 1986-05-23 1988-09-13 Nippon Kogaku K. K. Stage device with levelling mechanism
US4723086A (en) * 1986-10-07 1988-02-02 Micronix Corporation Coarse and fine motion positioning mechanism
US4993696A (en) * 1986-12-01 1991-02-19 Canon Kabushiki Kaisha Movable stage mechanism
US4891526A (en) * 1986-12-29 1990-01-02 Hughes Aircraft Company X-Y-θ-Z positioning stage
US4803712A (en) * 1987-01-20 1989-02-07 Hitachi, Ltd. X-ray exposure system
US4817930A (en) * 1987-05-13 1989-04-04 U.S. Philips Corporation Guiding device
US5323712A (en) * 1987-08-26 1994-06-28 Kabushiki Kaisha Toshiba Table moving apparatus
US4812725A (en) * 1987-10-16 1989-03-14 Anwar Chitayat Positioning device with dual linear motor
US4870668A (en) * 1987-12-30 1989-09-26 Hampshire Instruments, Inc. Gap sensing/adjustment apparatus and method for a lithography machine
US4916340A (en) * 1988-01-22 1990-04-10 Canon Kabushiki Kaisha Movement guiding mechanism
US5040431A (en) * 1988-01-22 1991-08-20 Canon Kabushiki Kaisha Movement guiding mechanism
US4948330A (en) * 1988-02-08 1990-08-14 Kabushiki Kaisha Toshiba Alignment stage device
US4952858A (en) * 1988-05-18 1990-08-28 Galburt Daniel N Microlithographic apparatus
US5022619A (en) * 1988-12-09 1991-06-11 Tokyo Aircraft Instrument Co., Ltd. Positioning device of table for semiconductor wafers
US5208497A (en) * 1989-04-17 1993-05-04 Sharp Kabushiki Kaisha Linear driving apparatus
US5120034A (en) * 1989-10-05 1992-06-09 U.S. Philips Corp. Two-step positioning device using lorentz forces and a static gas bearing
US5327060A (en) * 1989-10-05 1994-07-05 U.S. Philips Corporation Positioning device using Lorentz forces
US5184055A (en) * 1989-10-06 1993-02-02 Canon Kabushiki Kaisha Device for positioning control
US5453315A (en) * 1989-11-27 1995-09-26 Censtor Corp. Unitary micro-flexure structure and method of making same
US5059090A (en) * 1990-01-16 1991-10-22 International Business Machines Corp. Two-dimensional positioning apparatus
US5228358A (en) * 1990-02-21 1993-07-20 Canon Kabushiki Kaisha Motion guiding device
US5309847A (en) * 1990-04-27 1994-05-10 Ntn Corporation Adjustably movable work table
US5140242A (en) * 1990-04-30 1992-08-18 International Business Machines Corporation Servo guided stage system
US5280677A (en) * 1990-05-17 1994-01-25 Canon Kabushiki Kaisha Positioning mechanism
US5243491A (en) * 1990-08-30 1993-09-07 U.S. Philips Corporation Electromagnetic support with current-independent characteristics
US5150153A (en) * 1991-02-05 1992-09-22 U.S. Philips Corp. Lithographic device with a suspended object table
US5467720A (en) * 1991-02-25 1995-11-21 Canon Kabushiki Kaisha Support device
US5241183A (en) * 1991-03-22 1993-08-31 Nippon Telegraph And Telephone Corporation Vertical xy stage
US5385217A (en) * 1991-05-20 1995-01-31 Ebara Corporation Vibration eliminating apparatus for elminating vibration of an installation floor
US5260580A (en) * 1991-09-18 1993-11-09 Canon Kabushiki Kaisha Stage device for an exposure apparatus and semiconductor device manufacturing method which uses said stage device
US5504407A (en) * 1992-02-21 1996-04-02 Canon Kabushiki Kaisha Stage driving system
US5400674A (en) * 1992-05-08 1995-03-28 New Focus, Inc. Precision component positioner
US5338121A (en) * 1992-07-24 1994-08-16 Fujitsu Limited Shuttle apparatus for printer
US6272763B1 (en) * 1993-01-21 2001-08-14 Nikon Corporation Staging apparatus and method, and method for manufacturing the staging apparatus, and exposing apparatus using the staging apparatus
US5285142A (en) * 1993-02-09 1994-02-08 Svg Lithography Systems, Inc. Wafer stage with reference surface
US5524502A (en) * 1993-03-11 1996-06-11 Canon Kabushiki Kaisha Positioning apparatus including a hydrostatic bearing for spacing apart a supporting surface and a guide surface
US5796469A (en) * 1993-06-30 1998-08-18 Canon Kabushiki Kaisha Exposure apparatus and device manufacturing method using the same
US5578164A (en) * 1993-12-24 1996-11-26 Tokyo Electron Limited Plasma processing apparatus and method
US5610686A (en) * 1994-03-15 1997-03-11 Canon Kabushiki Kaisha Exposure apparatus including an antivibration control system
US6049186A (en) * 1994-04-01 2000-04-11 Nikon Corporation Method for making and operating an exposure apparatus having a reaction frame
US5942871A (en) * 1994-04-01 1999-08-24 Nikon Corporation Double flexure support for stage drive coil
US5528118A (en) * 1994-04-01 1996-06-18 Nikon Precision, Inc. Guideless stage with isolated reaction stage
US5744924A (en) * 1994-04-01 1998-04-28 Nikon Corporation Guideless stage with isolated reaction frame
US6281654B1 (en) * 1994-04-01 2001-08-28 Nikon Corporation Method for making apparatus with dynamic support structure isolation and exposure method
US6271640B1 (en) * 1994-04-01 2001-08-07 Nikon Corporation Exposure apparatus having reaction frame
US5530516A (en) * 1994-10-04 1996-06-25 Tamarack Scientific Co., Inc. Large-area projection exposure system
US5623853A (en) * 1994-10-19 1997-04-29 Nikon Precision Inc. Precision motion stage with single guide beam and follower stage
US5552888A (en) * 1994-12-02 1996-09-03 Nikon Precision, Inc. Apparatus for measuring position of an X-Y stage
US6246202B1 (en) * 1995-04-04 2001-06-12 Nikon Corporation Method of making exposure apparatus with dynamically isolated reaction frame
US6188195B1 (en) * 1995-04-04 2001-02-13 Nikon Corporation Exposure method, and method of making exposure apparatus having dynamically isolated support structure
US6020710A (en) * 1995-04-04 2000-02-01 Nikon Corporation Exposure method, and method of making exposure apparatus having dynamically isolated reaction frame
US6087797A (en) * 1995-04-04 2000-07-11 Nikon Corporation Exposure method, and method of making exposure apparatus having dynamically isolated reaction frame
US5874820A (en) * 1995-04-04 1999-02-23 Nikon Corporation Window frame-guided stage mechanism
US6175404B1 (en) * 1995-04-04 2001-01-16 Nikon Corporation Exposure apparatus having dynamically isolated reaction frame
US5508518A (en) * 1995-05-03 1996-04-16 International Business Machines Corporation Lithography tool with vibration isolation
US5760564A (en) * 1995-06-27 1998-06-02 Nikon Precision Inc. Dual guide beam stage mechanism with yaw control
US5757149A (en) * 1995-09-04 1998-05-26 Canon Kabushiki Kaisha Drive control apparatus
US5812420A (en) * 1995-09-05 1998-09-22 Nikon Corporation Vibration-preventive apparatus and exposure apparatus

Cited By (109)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8102504B2 (en) 2003-02-26 2012-01-24 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US20060274293A1 (en) * 2003-02-26 2006-12-07 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US7932991B2 (en) 2003-02-26 2011-04-26 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US8736809B2 (en) 2003-02-26 2014-05-27 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US7911583B2 (en) 2003-02-26 2011-03-22 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US7907253B2 (en) 2003-02-26 2011-03-15 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US7907254B2 (en) 2003-02-26 2011-03-15 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US9348239B2 (en) 2003-02-26 2016-05-24 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US9182684B2 (en) 2003-02-26 2015-11-10 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US20070263185A1 (en) * 2003-02-26 2007-11-15 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US20070263183A1 (en) * 2003-02-26 2007-11-15 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US9766555B2 (en) 2003-02-26 2017-09-19 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US9081298B2 (en) 2003-04-11 2015-07-14 Nikon Corporation Apparatus for maintaining immersion fluid in the gap under the projection lens during wafer exchange using a co-planar member in an immersion lithography machine
US8670104B2 (en) 2003-04-11 2014-03-11 Nikon Corporation Cleanup method for optics in immersion lithography with cleaning liquid opposed by a surface of object
US20080100813A1 (en) * 2003-04-11 2008-05-01 Nikon Corporation Cleanup method for optics in immersion lithography
US8670103B2 (en) 2003-04-11 2014-03-11 Nikon Corporation Cleanup method for optics in immersion lithography using bubbles
US8634057B2 (en) 2003-04-11 2014-01-21 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US8610875B2 (en) 2003-04-11 2013-12-17 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US8514367B2 (en) 2003-04-11 2013-08-20 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US8488100B2 (en) 2003-04-11 2013-07-16 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US20090195762A1 (en) * 2003-04-11 2009-08-06 Nikon Corporation Cleanup method for optics in immersion lithography
US20070273857A1 (en) * 2003-04-11 2007-11-29 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US8879047B2 (en) 2003-04-11 2014-11-04 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens using a pad member or second stage during wafer exchange in an immersion lithography machine
US9500960B2 (en) 2003-04-11 2016-11-22 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US9946163B2 (en) 2003-04-11 2018-04-17 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US8848168B2 (en) 2003-04-11 2014-09-30 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US9329493B2 (en) 2003-04-11 2016-05-03 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US20070247602A1 (en) * 2003-04-11 2007-10-25 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US9958786B2 (en) 2003-04-11 2018-05-01 Nikon Corporation Cleanup method for optics in immersion lithography using object on wafer holder in place of wafer
US8848166B2 (en) 2003-04-11 2014-09-30 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US20070132975A1 (en) * 2003-04-11 2007-06-14 Nikon Corporation Cleanup method for optics in immersion lithography
US8351019B2 (en) 2003-04-11 2013-01-08 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US8269944B2 (en) 2003-04-11 2012-09-18 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
US8269946B2 (en) 2003-04-11 2012-09-18 Nikon Corporation Cleanup method for optics in immersion lithography supplying cleaning liquid at different times than immersion liquid
US8035795B2 (en) 2003-04-11 2011-10-11 Nikon Corporation Apparatus and method for maintaining immersion fluid in the gap under the protection lens during wafer exchange in an immersion lithography machine
US8493545B2 (en) 2003-04-11 2013-07-23 Nikon Corporation Cleanup method for optics in immersion lithography supplying cleaning liquid onto a surface of object below optical element, liquid supply port and liquid recovery port
US8085381B2 (en) 2003-04-11 2011-12-27 Nikon Corporation Cleanup method for optics in immersion lithography using sonic device
US20090161084A1 (en) * 2003-04-11 2009-06-25 Nikon Corporation Cleanup method for optics in immersion lithography
US8134682B2 (en) 2003-05-23 2012-03-13 Nikon Corporation Exposure apparatus and method for producing device
US8125612B2 (en) 2003-05-23 2012-02-28 Nikon Corporation Exposure apparatus and method for producing device
US8130363B2 (en) 2003-05-23 2012-03-06 Nikon Corporation Exposure apparatus and method for producing device
US9304392B2 (en) 2003-05-23 2016-04-05 Nikon Corporation Exposure apparatus and method for producing device
US8169592B2 (en) 2003-05-23 2012-05-01 Nikon Corporation Exposure apparatus and method for producing device
US8174668B2 (en) 2003-05-23 2012-05-08 Nikon Corporation Exposure apparatus and method for producing device
US8780327B2 (en) 2003-05-23 2014-07-15 Nikon Corporation Exposure apparatus and method for producing device
US20070247600A1 (en) * 2003-05-23 2007-10-25 Nikon Corporation Exposure apparatus and method for producing device
US9939739B2 (en) 2003-05-23 2018-04-10 Nikon Corporation Exposure apparatus and method for producing device
US20110199594A1 (en) * 2003-05-23 2011-08-18 Nikon Corporation Exposure apparatus and method for producing device
US20080030696A1 (en) * 2003-05-23 2008-02-07 Nikon Corporation Exposure apparatus and method for producing device
US8384877B2 (en) 2003-05-23 2013-02-26 Nikon Corporation Exposure apparatus and method for producing device
US20080225250A1 (en) * 2003-05-23 2008-09-18 Nikon Corporation Exposure apparatus and method for producing device
US20080225249A1 (en) * 2003-05-23 2008-09-18 Nikon Corporation Exposure apparatus and method for producing device
US8760617B2 (en) 2003-05-23 2014-06-24 Nikon Corporation Exposure apparatus and method for producing device
US8072576B2 (en) 2003-05-23 2011-12-06 Nikon Corporation Exposure apparatus and method for producing device
US20090190112A1 (en) * 2003-06-19 2009-07-30 Nikon Corporation Exposure apparatus, and device manufacturing method
US8767177B2 (en) 2003-06-19 2014-07-01 Nikon Corporation Exposure apparatus, and device manufacturing method
US7812925B2 (en) 2003-06-19 2010-10-12 Nikon Corporation Exposure apparatus, and device manufacturing method
US9025129B2 (en) 2003-06-19 2015-05-05 Nikon Corporation Exposure apparatus, and device manufacturing method
US9019473B2 (en) 2003-06-19 2015-04-28 Nikon Corporation Exposure apparatus and device manufacturing method
US9001307B2 (en) 2003-06-19 2015-04-07 Nikon Corporation Exposure apparatus and device manufacturing method
US8436978B2 (en) 2003-06-19 2013-05-07 Nikon Corporation Exposure apparatus, and device manufacturing method
US8436979B2 (en) 2003-06-19 2013-05-07 Nikon Corporation Exposure apparatus, and device manufacturing method
US9810995B2 (en) 2003-06-19 2017-11-07 Nikon Corporation Exposure apparatus and device manufacturing method
US9274437B2 (en) 2003-06-19 2016-03-01 Nikon Corporation Exposure apparatus and device manufacturing method
US8319941B2 (en) 2003-06-19 2012-11-27 Nikon Corporation Exposure apparatus, and device manufacturing method
US8705001B2 (en) 2003-06-19 2014-04-22 Nikon Corporation Exposure apparatus, and device manufacturing method
US8018575B2 (en) 2003-06-19 2011-09-13 Nikon Corporation Exposure apparatus, and device manufacturing method
US20070211234A1 (en) * 2003-06-19 2007-09-13 Nikon Corporation Exposure apparatus, and device manufacturing method
US8830445B2 (en) 2003-06-19 2014-09-09 Nikon Corporation Exposure apparatus, and device manufacturing method
US8717537B2 (en) 2003-06-19 2014-05-06 Nikon Corporation Exposure apparatus, and device manufacturing method
US8027027B2 (en) 2003-06-19 2011-09-27 Nikon Corporation Exposure apparatus, and device manufacturing method
US8724085B2 (en) 2003-06-19 2014-05-13 Nikon Corporation Exposure apparatus, and device manufacturing method
US10007188B2 (en) 2003-06-19 2018-06-26 Nikon Corporation Exposure apparatus and device manufacturing method
US8692976B2 (en) 2003-06-19 2014-04-08 Nikon Corporation Exposure apparatus, and device manufacturing method
US20060132740A1 (en) * 2003-06-19 2006-06-22 Nikon Corporation Exposure apparatus, and device manufacturing method
US9551943B2 (en) 2003-06-19 2017-01-24 Nikon Corporation Exposure apparatus and device manufacturing method
US8879043B2 (en) 2003-07-09 2014-11-04 Nikon Corporation Exposure apparatus and method for manufacturing device
US20070263193A1 (en) * 2003-07-09 2007-11-15 Nikon Corporation Exposure apparatus and method for manufacturing device
US7855777B2 (en) 2003-07-09 2010-12-21 Nikon Corporation Exposure apparatus and method for manufacturing device
US9760026B2 (en) 2003-07-28 2017-09-12 Nikon Corporation Exposure apparatus, method for producing device, and method for controlling exposure apparatus
US9494871B2 (en) 2003-07-28 2016-11-15 Nikon Corporation Exposure apparatus, method for producing device, and method for controlling exposure apparatus
US8451424B2 (en) 2003-07-28 2013-05-28 Nikon Corporation Exposure apparatus, method for producing device, and method for controlling exposure apparatus
US8749757B2 (en) 2003-07-28 2014-06-10 Nikon Corporation Exposure apparatus, method for producing device, and method for controlling exposure apparatus
US9665016B2 (en) 2004-02-02 2017-05-30 Nikon Corporation Lithographic apparatus and method having substrate table and sensor table to hold immersion liquid
US8547528B2 (en) 2004-02-02 2013-10-01 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
US10007196B2 (en) 2004-02-02 2018-06-26 Nikon Corporation Lithographic apparatus and method having substrate and sensor tables
US8736808B2 (en) 2004-02-02 2014-05-27 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
US10139737B2 (en) 2004-02-02 2018-11-27 Nikon Corporation Lithographic apparatus and method having substrate and sensor tables
US20090231564A1 (en) * 2004-02-02 2009-09-17 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
US8724079B2 (en) 2004-02-02 2014-05-13 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
US8045136B2 (en) 2004-02-02 2011-10-25 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
US8705002B2 (en) 2004-02-02 2014-04-22 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
US9684248B2 (en) 2004-02-02 2017-06-20 Nikon Corporation Lithographic apparatus having substrate table and sensor table to measure a patterned beam
US8711328B2 (en) 2004-02-02 2014-04-29 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
US20090296069A1 (en) * 2004-02-02 2009-12-03 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
US20090296067A1 (en) * 2004-02-02 2009-12-03 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
US9632431B2 (en) 2004-02-02 2017-04-25 Nikon Corporation Lithographic apparatus and method having substrate and sensor tables
US8553203B2 (en) 2004-02-02 2013-10-08 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
US20080143994A1 (en) * 2004-04-09 2008-06-19 Nikon Corporation Drive Method of Moving Body, Stage Unit, and Exposure Apparatus
US7852034B2 (en) 2004-04-09 2010-12-14 Nikon Corporation Drive method of moving body, stage unit, and exposure apparatus
US9645505B2 (en) 2004-06-09 2017-05-09 Nikon Corporation Immersion exposure apparatus and device manufacturing method with measuring device to measure specific resistance of liquid
US8704997B2 (en) 2004-06-09 2014-04-22 Nikon Corporation Immersion lithographic apparatus and method for rinsing immersion space before exposure
US8525971B2 (en) 2004-06-09 2013-09-03 Nikon Corporation Lithographic apparatus with cleaning of substrate table
US20070291239A1 (en) * 2004-06-09 2007-12-20 Kenichi Shiraishi Exposure Apparatus and Device Manufacturing Method
US8520184B2 (en) 2004-06-09 2013-08-27 Nikon Corporation Immersion exposure apparatus and device manufacturing method with measuring device
US20070242247A1 (en) * 2004-06-09 2007-10-18 Kenichi Shiraishi Exposure apparatus and device manufacturing method
US9250537B2 (en) 2004-07-12 2016-02-02 Nikon Corporation Immersion exposure apparatus and method with detection of liquid on members of the apparatus
US8384874B2 (en) 2004-07-12 2013-02-26 Nikon Corporation Immersion exposure apparatus and device manufacturing method to detect if liquid on base member
US20070182945A1 (en) * 2004-07-12 2007-08-09 Makoto Shibuta Exposure apparatus and device manufacturing method

Also Published As

Publication number Publication date Type
US6316901B2 (en) 2001-11-13 grant
JP3867676B2 (en) 2007-01-10 grant
JP2003264147A (en) 2003-09-19 application
KR100314554B1 (en) 2001-10-31 grant
KR100314556B1 (en) 2001-10-31 grant
US6747732B1 (en) 2004-06-08 grant
KR100314552B1 (en) 2001-10-31 grant
US20010019250A1 (en) 2001-09-06 application
US6020710A (en) 2000-02-01 grant
US6683433B2 (en) 2004-01-27 grant
US6087797A (en) 2000-07-11 grant
JP2006313940A (en) 2006-11-16 application
US6175404B1 (en) 2001-01-16 grant
US6188195B1 (en) 2001-02-13 grant
US6246202B1 (en) 2001-06-12 grant
JPH08330224A (en) 1996-12-13 application
US20020017889A1 (en) 2002-02-14 application
JP3969455B2 (en) 2007-09-05 grant
KR100314553B1 (en) 2001-10-31 grant
US6151105A (en) 2000-11-21 grant
KR100314555B1 (en) 2001-10-31 grant
US5874820A (en) 1999-02-23 grant
US6150787A (en) 2000-11-21 grant

Similar Documents

Publication Publication Date Title
US7486380B2 (en) Wafer table for immersion lithography
US6144118A (en) High-speed precision positioning apparatus
US5864389A (en) Stage apparatus and exposure apparatus and device producing method using the same
US6353271B1 (en) Extreme-UV scanning wafer and reticle stages
US6449030B1 (en) Balanced positioning system for use lithographic apparatus
US20030053037A1 (en) Coordinate measuring stage and coordinate measuring instrument
US5228358A (en) Motion guiding device
US5760564A (en) Dual guide beam stage mechanism with yaw control
US6408045B1 (en) Stage system and exposure apparatus with the same
US5858587A (en) Positioning system and method and apparatus for device manufacture
US6479991B1 (en) Stage mechanism, exposure apparatus and device manufacturing method in which a coil unit of a driving mechanism is moved substantially in synchronism with a stage
US20050236908A1 (en) Stage positioning unit for photo lithography tool and for the like
US6570645B2 (en) Stage system and stage driving method for use in exposure apparatus
US6538720B2 (en) Lithographic tool with dual isolation system and method for configuring the same
US5991005A (en) Stage apparatus and exposure apparatus having the same
US6879375B1 (en) Exposure apparatus and method that exposes a pattern onto a substrate
US5285142A (en) Wafer stage with reference surface
US6255796B1 (en) Electromagnetic alignment and scanning apparatus
US6437463B1 (en) Wafer positioner with planar motor and mag-lev fine stage
US6525803B2 (en) Balanced positioning system for use in lithographic apparatus
US6134981A (en) Precision scanning apparatus and method with fixed and movable guide members
US5815246A (en) Two-dimensionally balanced positioning device, and lithographic device provided with such a positioning device
US6486941B1 (en) Guideless stage
US6522388B1 (en) Vibration eliminator, exposure apparatus and projection exposure method
US5196745A (en) Magnetic positioning device

Legal Events

Date Code Title Description
FPAY Fee payment

Year of fee payment: 4

FPAY Fee payment

Year of fee payment: 8

REMI Maintenance fee reminder mailed
LAPS Lapse for failure to pay maintenance fees
FP Expired due to failure to pay maintenance fee

Effective date: 20160608