US20020080236A1 - Camera with improved illuminator - Google Patents

Camera with improved illuminator Download PDF

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Publication number
US20020080236A1
US20020080236A1 US10/017,512 US1751201A US2002080236A1 US 20020080236 A1 US20020080236 A1 US 20020080236A1 US 1751201 A US1751201 A US 1751201A US 2002080236 A1 US2002080236 A1 US 2002080236A1
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United States
Prior art keywords
stop
aperture
light
light source
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
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US10/017,512
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English (en)
Inventor
David Madsen
Eric Rudd
Mark Schoeneck
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Cyberoptics Corp
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Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to US10/017,512 priority Critical patent/US20020080236A1/en
Assigned to CYBEROPTICS CORPORATION reassignment CYBEROPTICS CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SCHOENECK, MARK R., MADSEN, DAVID D., RUDD, ERIC P.
Publication of US20020080236A1 publication Critical patent/US20020080236A1/en
Priority to US10/793,176 priority patent/US7190393B2/en
Abandoned legal-status Critical Current

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/30—Systems for automatic generation of focusing signals using parallactic triangle with a base line
    • G02B7/32—Systems for automatic generation of focusing signals using parallactic triangle with a base line using active means, e.g. light emitter
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0812—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines the monitoring devices being integrated in the mounting machine, e.g. for monitoring components, leads, component placement

Definitions

  • the present invention relates generally to automated optical assembly and inspection machines.
  • SMT surface mount technology
  • pick and place machines are used to automatically place electronics components upon a circuit board during manufacture.
  • a component is picked up by a placement head that is movable with respect to the board.
  • the placement head orients the component correctly and places the component at a desired location on the board.
  • pick and place machines In order to properly place components, it is necessary to determine the initial orientation and location of the component on the placement head. Additionally, the position of the placement head with respect to the board itself must be known. Once both are known, the position and orientation of the component are adjusted to place the component correctly upon the board.
  • pick and place machines In order to sense component position and alignment, pick and place machines generally employ component align (CA) sensors.
  • CA component align
  • BA board align
  • the BA camera is used to image a reference position marker or “fiducial” on the circuit board or board artwork. Analyzing the image of the fiducial allows calculation of the BA camera position with respect to the board. Since the BA camera is generally disposed on the placement head, for “on-head” machines, such analysis provides a relationship between the placement head location and the board.
  • Co-axial illumination is defined as illumination directed substantially along the line of sight of the imaging optics. Co-axial illumination is useful in that shadow images are minimized and surface features normal to the optical axis of the camera are illuminated efficiently, especially for objects with specular surfaces.
  • co-axial illumination is effected using a light source projecting illumination from the side of the optical axis into a beamsplitter which bends the beam such that it aligns with the optical axis of the camera.
  • This technique suffers from at least two limitations. First, the beamsplitter is not an economical part and thus can significantly increase the cost of the system. Second, the outgoing beam is attenuated by the beamsplitter and substantially decreases efficiency for diffuse targets.
  • An illumination and imaging system is provided with a co-axial illuminator that does not include a beamsplitter.
  • the co-axial illuminator achieves efficiencies substantially in excess of those achieved with a beamsplitter.
  • an optical stop is used to reflect illumination upon a target.
  • the optical stop includes an aperture allowing light reflected from the target to pass to a detector.
  • the aperture of the stop has an asymmetrical feature that facilitates operation on specular targets.
  • FIG. 1 shows a pick and place machine.
  • FIG. 2 is a diagrammatic view of a placement head of a pick and place machine.
  • FIGS. 3A and 3B are diagrammatic views of an imaging system including a co-axial illuminator in accordance with an embodiment of the present invention.
  • FIG. 4A is a top plan view of a stop in accordance with an embodiment of the present invention.
  • FIG. 4B is an enlarged view of an aperture within the stop shown in FIG. 4A
  • Machine 201 includes conveyor system 202 for transporting a printed circuit board 203 into a working area.
  • Pick and place machine 201 includes an x and y motor drive assembly 204 for moving placement head 206 independently in the x and y directions. Attached to head 206 are multiple vacuum nozzles 208 , and 210 for releasably coupling to one or more components. Head 206 picks one or more components from trays 212 and while head 206 is transporting the components to printed circuit board 203 , sensor 200 senses the x,y and theta orientation of the components.
  • sensor 200 Since sensor 200 is positioned on head 206 , it is considered an on-head sensor and senses the x, y and theta orientation of the components while head 206 transports the components to board 203 .
  • FIG. 1 also illustrates camera 209 located on head 206 .
  • camera 209 is used to image reference marks or “fiducials” or board artwork located on the circuit board 203 in order to provide location information to machine 201 .
  • FIG. 2 is a perspective view of placement head 206 .
  • placement head 206 includes a pair of pick and place units 214 each of which includes a nozzle 216 that is adapted to releasably couple a component to be placed such as components 218 .
  • Pick and place units 214 are adapted to displace components 218 along the Z axis to place components 218 upon a circuit board 203 (shown in FIG. 1). While components 218 are releasably held by nozzles 216 , component align sensor 200 is translated with respect to components 218 while imaging components 218 such that the relative orientations of components 218 with respect to circuit board 203 can be computed.
  • BA camera 209 disposed proximate an edge of placement head 206 and facing downward.
  • BA camera 209 acquires an image of a reference position marker (fiducial) on circuit board 203 in order to allow calculation of the placement head 206 position with respect to circuit board 203 .
  • FIG. 3A is a diagrammatic view of board align camera 209 in accordance with an embodiment of the present invention.
  • Camera 209 includes detector 230 which can be any suitable detector including a Charge Coupled Device (CCD) array.
  • Detector 230 is coupled to image processing electronics (not shown) which receive the image detected by detector 230 .
  • Optional filter 232 can be disposed in front of detector 230 to filter the image arriving at detector 230 .
  • a first pair of optics 234 A and 234 B are positioned in front of filter 232 and are selected to focus incoming rays upon detector 230 .
  • Optics 234 A and 234 B can be considered a first lens cell.
  • the first lens cell is illustrated as a pair of optics, the first lens cell can include any suitable number of lenses, including a single lens.
  • Co-axial illuminator 236 is positioned in front of the first lens cell and allows the image to pass therethrough, while simultaneously injecting illumination substantially along the optical axis of camera 209 . Illuminator 236 will be described in greater detail with respect to FIG. 3B.
  • Optics 238 A and 238 B (also referred to as a second lens cell) are positioned in front of illuminator 236 and cooperate to receive diverging ray bundles from a target of interest and bend the rays such that they remain parallel to one another.
  • the second lens cell can also include any suitable number of lenses including a single lens.
  • FIG. 3A also illustrates optional darkfield illuminator 240 .
  • Darkfield illuminator 240 provides illumination to the target of interest at a relatively high angle of incidence. While only darkfield illuminator 240 is shown, those skilled in the art will recognize that many other types of illumination could be used as desired.
  • FIG. 3B is a diagrammatic view of camera 209 illustrating operation of the optics.
  • FIG. 3B also shows illuminator 236 in greater detail.
  • FIG. 3B illustrates the first lens cell ( 234 A, 234 B) receiving rays that are parallel to one another, and bending them slightly such that they converge upon detector 230 after passing through filter 232 .
  • a pair of baffles 242 , 244 are positioned between the first lens cell and co-axial illuminator 236 .
  • a stop 246 is included within illuminator 236 . Stop 246 includes an aperture 248 through which the rays pass. Stop 246 will be shown in greater detail in FIGS. 4A and 4B.
  • Sources 250 are disposed within enclosure 253 .
  • Sources 250 can take the form of Light Emitting Diodes (LED's), incandescent lights, lasers, and/or any other suitable type of light.
  • Source(s) 250 are arranged to direct light toward stop 246 .
  • Stop 246 includes a surface 252 that reflects at least some light substantially along the optical axis of camera 209 .
  • surface 252 can be stainless steel and preferably is diffuse.
  • Surface 252 can also be provided with a diffuse reflective coating.
  • Illuminator 236 preferably includes an enclosure 253 having a reflective interior such that additional rays emanating from source(s) 250 are aligned with the optical axis thereby increasing the efficiency of illuminator 236 .
  • enclosure 253 is cylindrical.
  • Optics 238 A and 238 B form a second lens cell that receives diverging rays 254 and bends rays 254 such that they are substantially parallel with respect to one another.
  • the first and second lens cells form an optical system that surrounds co-axial illuminator 236 and is telecentric in object space.
  • embodiments of the present invention can be practiced advantageously in a non-telecentric optical system as well.
  • FIG. 4A is a top plan view of stop 246 in accordance with an embodiment of the present invention.
  • Stop 246 is preferably positioned above four Light Emitting Diodes 250 (illustrated in dashed lines), however any suitable number of sources may be used.
  • Stop 246 includes aperture 248 , which is preferably disposed at the center of stop 246 .
  • Surface 252 of stop 246 is a diffuse reflective surface. Thus, light from sources 250 projected normal to surface 252 is reflected off surface 252 to create the co-axial illuminator. It is feasible to depart from a normal illumination angle, provided that the light returning by specular reflection from horizontal target surface 252 is unobstructed.
  • a horizontal mirror would be an example of a specular horizontal target surface.
  • a ray originates in the plane of stop 246 non-coincident with the optical axis, and it experiences a specular reflection from horizontal surface 252 .
  • the ray will return to the plane of stop 246 at a transverse location on stop 246 relative to the optical axis that is directly opposite the point of origin. If stop 246 has an aperture that is symmetric about the optical axis, every ray that originates on the reflective surface of stop 246 (that is, outside aperture 248 ) will, on its return, intersect another opposite point outside aperture 248 and be blocked.
  • tangs 254 are disposed such that substantially no obstructions are present on the opposite side of aperture 248 for any given tang.
  • three tangs 254 are positioned as illustrated in FIG. 4B, though other asymmetrical apertures could be used advantageously.
  • any beamsplitter would attenuate outgoing light, whereas embodiments of the present invention avoid such attenuation.
  • the return beam is attenuated by the tangs, but can be arranged to be no worse than the attenuation imposed by a beamsplitter. The efficiency of the system is thereby increased over that achievable using a beamsplitter.
US10/017,512 2000-12-15 2001-12-14 Camera with improved illuminator Abandoned US20020080236A1 (en)

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US10/017,512 US20020080236A1 (en) 2000-12-15 2001-12-14 Camera with improved illuminator
US10/793,176 US7190393B2 (en) 2000-12-15 2004-03-04 Camera with improved illuminator

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Application Number Priority Date Filing Date Title
US25592800P 2000-12-15 2000-12-15
US10/017,512 US20020080236A1 (en) 2000-12-15 2001-12-14 Camera with improved illuminator

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JP (1) JP4278386B2 (de)
DE (1) DE10197043T1 (de)
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Cited By (6)

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US20070009257A1 (en) * 2005-07-08 2007-01-11 Leo Baldwin Optimizing use and performance of optical systems implemented with telecentric on-axis dark field illumination
WO2007008763A1 (en) * 2005-07-08 2007-01-18 Electro Scientific Industries, Inc. Achieving convergent light rays emitted by planar array of light sources
WO2008056721A1 (en) * 2006-11-06 2008-05-15 Panasonic Corporation Moving device and electronic component mounting apparatus
DE112004000329B4 (de) * 2003-02-26 2013-03-07 Electro Scientific Industries, Inc. Koaxiale Kleinwinkel-Dunkelfeld-Beleuchtungseinrichtung
US20160191871A1 (en) * 2013-07-05 2016-06-30 The University Of Tokyo Information presentation device
TWI643499B (zh) * 2017-02-06 2018-12-01 佐臻股份有限公司 Method for manufacturing depth image capturing module capable of improving positioning accuracy and heat insulation effect

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US9510753B2 (en) * 2014-02-27 2016-12-06 Lc Technologies, Inc. Asymmetric aperture for eyetracking

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Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112004000329B4 (de) * 2003-02-26 2013-03-07 Electro Scientific Industries, Inc. Koaxiale Kleinwinkel-Dunkelfeld-Beleuchtungseinrichtung
US7862207B2 (en) 2005-07-08 2011-01-04 Electro Scientific Industries, Inc. Optimizing use and performance of optical systems implemented with telecentric on-axis dark field illumination
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US7787159B2 (en) 2005-07-08 2010-08-31 Electro Scientific Industries, Inc. Achieving convergent light rays emitted by planar array of light sources
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WO2002085091A3 (en) 2003-01-23
JP2005504454A (ja) 2005-02-10
WO2002085091A2 (en) 2002-10-24
JP4278386B2 (ja) 2009-06-10
DE10197043T1 (de) 2003-11-13
US7190393B2 (en) 2007-03-13
US20040233322A1 (en) 2004-11-25

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