TWM612285U - Deposition processing apparatus for - Google Patents

Deposition processing apparatus for Download PDF

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TWM612285U
TWM612285U TW110200702U TW110200702U TWM612285U TW M612285 U TWM612285 U TW M612285U TW 110200702 U TW110200702 U TW 110200702U TW 110200702 U TW110200702 U TW 110200702U TW M612285 U TWM612285 U TW M612285U
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Taiwan
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gas
air
diffuser
deposition processing
holes
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TW110200702U
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Chinese (zh)
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陳建維
王春暉
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葛來益科技有限公司
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一種沉積處理裝置,包含擴散盤、複數氣體通孔、遮蔽組、導氣環、抽氣環,及抽氣管。該擴散盤包括第一表面,及第二表面,第一表面為自擴散盤圓心向圓周逐漸升高的階梯狀結構,第二表面為平面結構,複數氣體通孔貫穿該擴散盤設置,遮蔽組包括設置於該擴散盤上之遮蔽板,及設置於遮蔽板上之導氣管,導氣環設置於該擴散盤周緣,包括本體,及複數開設於該本體上之導氣孔,抽氣環設置於該導氣環周緣,包括圍繞界定出氣體空間之座體,每一導氣孔與氣體空間相連通,抽氣管與抽氣環連接,氣體由複數導氣孔進入該氣體空間,再由抽氣管向外抽出。A deposition processing device includes a diffusion disk, a plurality of gas through holes, a shielding group, a gas guide ring, a gas pumping ring, and a gas pumping pipe. The diffuser includes a first surface and a second surface. The first surface is a stepped structure gradually rising from the center of the diffuser to the circumference, and the second surface is a planar structure. A plurality of gas through holes are provided through the diffuser, and the shielding group It includes a shielding plate arranged on the diffuser plate, and an air duct arranged on the shielding plate. The air guide ring is arranged on the periphery of the diffuser plate, including a body, and a plurality of air holes opened on the body. The air suction ring is arranged on the The perimeter of the air guide ring includes a seat body surrounding the gas space, each air guide hole is connected to the gas space, and the air extraction pipe is connected to the air extraction ring. The gas enters the gas space through a plurality of air guide holes, and then the air extraction tube outwards Pull out.

Description

沉積處理裝置Deposition processing device

本新型是有關一種處理裝置,特別是指一種沉積處理裝置。 This model relates to a processing device, in particular to a deposition processing device.

高溫化學氣相沉積(CVD)製程廣泛地使用在半導體產業中。基材鍍膜製程之良率及質量取決於基材薄膜沉積均勻性,而薄膜厚度均勻性又受鍍膜反應氣體散佈於反應腔室影響,其中,化學氣相沉積設備設有氣體擴散板,該氣體擴散板位於該反應腔室中,用以分散鍍膜反應氣體氣流,使該鍍膜氣體平均散佈在該反應腔室中,以沉降至欲鍍膜基材,達到均勻鍍膜。 High-temperature chemical vapor deposition (CVD) processes are widely used in the semiconductor industry. The yield and quality of the substrate coating process depend on the substrate film deposition uniformity, and the film thickness uniformity is affected by the coating reaction gas spreading in the reaction chamber. Among them, the chemical vapor deposition equipment is equipped with a gas diffusion plate. The diffusion plate is located in the reaction chamber and is used to disperse the coating reaction gas flow so that the coating gas is evenly dispersed in the reaction chamber to settle to the substrate to be coated to achieve uniform coating.

台灣發明專利第I283437號一種「氣體分佈噴頭」,提及用於半導體製程之氣體分佈噴頭,特徵為一具有細長溝槽或通道型式氣體出口的面板。透過噴頭相對地靠近晶圓之設計,以增加靠近晶圓邊緣之處理氣流,而面板之邊緣部份相對於面板之中心部份較低凹,然而,在晶圓邊緣增加之質量流可能會增加沉積材料之邊緣厚度,致使中間位置薄膜厚度較薄,反而影響鍍膜之均勻性。再者,習知的氣體分佈面板之邊緣相對於面板之中心低凹的非平面結構,會衍生精準度差與加工困難之缺失,而須加以改善。 Taiwan Invention Patent No. I283437 is a "gas distribution nozzle", which refers to a gas distribution nozzle used in semiconductor processing, which is characterized by a panel with a slender groove or channel type gas outlet. The nozzle is relatively close to the wafer to increase the processing air flow near the edge of the wafer. The edge of the panel is relatively concave relative to the center of the panel. However, the increased mass flow at the edge of the wafer may increase The edge thickness of the deposited material results in a thinner film thickness in the middle, which affects the uniformity of the coating. Furthermore, the conventional gas distribution panel has a concave non-planar structure in which the edge of the panel is concave with respect to the center of the panel, which results in poor accuracy and processing difficulties, and needs to be improved.

上述缺點都顯現習知基材薄膜所衍生的種種問題,據此,為了提升氣體散佈於化學氣相沉積設備之反應腔室的程度,增進薄膜厚度均勻性,改善鍍膜製程良率及品質,前述習知氣體擴散板確實有加以改善之必要。 The above-mentioned shortcomings all show the various problems derived from the conventional substrate film. Accordingly, in order to increase the degree of gas dispersion in the reaction chamber of the chemical vapor deposition equipment, increase the uniformity of the film thickness, and improve the yield and quality of the coating process, the foregoing conventional knowledge The gas diffusion plate really needs to be improved.

有鑑於此,本新型之目的,係提供一種沉積處理裝置,包含一擴散盤、複數氣體通孔、一遮蔽組、一導氣環、一抽氣環,及一抽氣管。 In view of this, the object of the present invention is to provide a deposition processing device, which includes a diffusion plate, a plurality of gas through holes, a shielding group, an air guide ring, an air extraction ring, and an air extraction pipe.

該擴散盤包括一第一表面,及一與該第一表面相反之第二表面,該第一表面為一自該擴散盤圓心向圓周逐漸升高的階梯狀結構,而該第二表面為一平面結構,該複數氣體通孔貫穿該擴散盤設置,該遮蔽組包括一設置於該擴散盤上之遮蔽板,及一設置於該遮蔽板上之導氣管,該導氣環設置於該擴散盤周緣,其包括一本體,及複數開設於該本體上之導氣孔,該抽氣環設置於該導氣環周緣,包括一圍繞界定出一氣體空間之座體,該每一導氣孔與該氣體空間相連通,該抽氣管與該抽氣環連接,一氣體由該複數導氣孔進入該氣體空間,再由該抽氣管向外抽出。 The diffuser includes a first surface and a second surface opposite to the first surface. The first surface is a stepped structure gradually rising from the center of the diffuser to the circumference, and the second surface is a Planar structure, the plurality of gas through holes are arranged through the diffuser, the shielding group includes a shielding plate arranged on the diffuser, and an air duct arranged on the shielding plate, and the air guide ring is arranged on the diffuser The peripheral edge includes a body and a plurality of air guide holes formed on the body. The air suction ring is arranged on the periphery of the air guide ring and includes a seat body surrounding and delimiting a gas space. Each of the air guide holes and the gas The space is connected, the air extraction pipe is connected with the air extraction ring, and a gas enters the air space through the plurality of air guide holes, and then is drawn out from the air extraction pipe.

較佳地,該導氣環與該抽氣環呈不同大小之同心環設置。 Preferably, the air guide ring and the air suction ring are arranged as concentric rings of different sizes.

較佳地,該第一表面具有一第一梯部、一環繞該第一梯部設置之第二梯部、一環繞該第二梯部設置之第三梯部、一環繞該第三梯部設置之第四梯部,及一環繞該第四梯部設置之第五梯部,且該第一梯部靠近該擴散盤之圓心設置,而該第五梯部靠近該擴散盤之圓周設置。 Preferably, the first surface has a first step, a second step surrounding the first step, a third step surrounding the second step, and a surrounding third step A fourth step is provided, and a fifth step is provided around the fourth step, and the first step is located close to the center of the diffuser, and the fifth step is located close to the circumference of the diffuser.

較佳地,該複數氣體通孔之孔型截面結構為一直條孔,而該直條孔的孔徑為0.1~10mm。 Preferably, the hole-shaped cross-sectional structure of the plurality of gas through holes is a straight hole, and the diameter of the straight hole is 0.1-10 mm.

較佳地,各相鄰之梯部間的高度差相同。 Preferably, the height difference between adjacent steps is the same.

較佳地,該複數氣體通孔之孔型截面結構為一直條孔連接一向外擴張的喇叭孔,且向外擴張的喇叭孔結構靠近該第二表面。 Preferably, the hole-shaped cross-sectional structure of the plurality of gas through holes is a straight hole connected to an outwardly expanding horn hole, and the outwardly expanding horn hole structure is close to the second surface.

較佳地,該直條孔的孔徑為0.1~10mm,該喇叭孔的孔徑為1.5~5mm。 Preferably, the diameter of the straight hole is 0.1-10 mm, and the diameter of the horn hole is 1.5-5 mm.

較佳地,該喇叭孔的高度為1~5mm,該喇叭孔向外擴張的傾斜角度為30°~90°。 Preferably, the height of the horn hole is 1 to 5 mm, and the inclination angle of the outward expansion of the horn hole is 30° to 90°.

較佳地,該第一梯部與該第二梯部的高度差為1~5mm,該第二梯部與該第三梯部的高度差為0.5~3mm,該第三梯部與該第四梯部的高度差為0.5~3mm,該第四梯部與該第五梯部的高度差為0.5~3mm。 Preferably, the height difference between the first step and the second step is 1 to 5 mm, the height difference between the second step and the third step is 0.5 to 3 mm, and the third step and the first step are 0.5 to 3 mm. The height difference between the four steps is 0.5-3mm, and the height difference between the fourth step and the fifth step is 0.5-3mm.

較佳地,各相鄰之梯部間的直徑差相同。 Preferably, the diameter difference between adjacent steps is the same.

較佳地,該氣體通孔位於該擴散盤上的設置密度為每平方公分6~10個。 Preferably, the arrangement density of the gas through holes on the diffuser is 6-10 per square centimeter.

本新型之有益功效在於,藉由該第一表面為自該擴散盤圓心向圓周逐漸升高的階梯狀結構,結合該直條孔連接向外擴張的喇叭孔設計,且該喇叭孔位於同一平面上,將氣體框圍在該複數氣體通孔中,避免氣體於抽氣過程因密集度不足而提早擴散被提早抽離,解決靠近該擴散盤之圓心的氣體氛圍不足之問題,且可減緩氣體向下流動速度使其向內擠壓,補足中間流速較慢之問題,使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤之圓心的氣體通孔流速,以達氣體均勻鍍膜之功效,此外,透過該導氣環、與該抽氣環之同心環設計,達到同心圓效果,再配合位於該抽氣環上之抽氣管,避免側抽均勻性不佳的偏心困擾。 The beneficial effect of the present invention is that the first surface is a stepped structure gradually rising from the center of the diffuser to the circumference, combined with the design of the straight hole connected to the outwardly expanding horn hole, and the horn hole is located on the same plane Above, the gas is enclosed in the plurality of gas through holes to prevent the gas from diffusing and being drawn away early due to insufficient concentration during the pumping process, solving the problem of insufficient gas atmosphere near the center of the diffuser, and reducing the gas The downward flow speed makes it squeeze inward to make up for the slower flow rate in the middle, and increase the gas density and form the effect of a gas curtain, thereby increasing the gas flow velocity near the center of the diffuser to achieve uniform gas coating In addition, the air guide ring and the concentric ring design of the air extraction ring achieve a concentric circle effect, and the air extraction tube located on the air extraction ring can avoid the eccentricity of poor side extraction uniformity.

1:擴散盤 1: diffuser

11:第一表面 11: The first surface

111:第一梯部 111: The first ladder

112:第二梯部 112: second ladder

113:第三梯部 113: The third ladder

114:第四梯部 114: fourth ladder

115:第五梯部 115: Fifth Ladder

12:第二表面 12: second surface

2:氣體通孔 2: Gas through hole

21:直條孔 21: Straight hole

22:喇叭孔 22: Horn hole

3:遮蔽組 3: Masking group

31:遮蔽板 31: Shading plate

32:導氣管 32: airway

4:導氣環 4: Air guide ring

41:本體 41: body

42:導氣孔 42: air guide hole

5:抽氣環 5: Exhaust ring

50:氣體空間 50: gas space

51:座體 51: Block

6:抽氣管 6: Exhaust pipe

d1:高度差 d1: height difference

d2:孔徑 d2: Aperture

d3:孔徑 d3: Aperture

d4:高度 d4: height

d5:角度 d5: angle

d6:高度差 d6: height difference

d7:直徑 d7: diameter

圖1是一立體示意圖,說明本新型沉積處理裝置之第一較佳實施例的擴散盤態樣;圖2是一上視示意圖,說明該第一較佳實施例之擴散盤的另一視角; 圖3是圖2的A-A剖面圖;圖4是一立體示意圖,說明該第一較佳實施例之態樣;圖5是一側視示意圖,說明該第一較佳實施例之另一視角態樣;圖6是一上視示意圖,說明本新型沉積處理裝置之第二較佳實施例;圖7是圖6的C-C剖面圖;及圖8是一示意圖,說明該第二較佳實施例中一擴散盤之氣體的截面流速分佈態樣。 Fig. 1 is a three-dimensional schematic diagram illustrating the state of the diffuser disc of the first preferred embodiment of the new deposition processing apparatus; Fig. 2 is a schematic top view illustrating another perspective of the diffuser disc of the first preferred embodiment; Fig. 3 is a cross-sectional view taken along line AA of Fig. 2; Fig. 4 is a schematic perspective view illustrating the aspect of the first preferred embodiment; Fig. 5 is a schematic side view illustrating another perspective view of the first preferred embodiment Figure 6 is a schematic top view illustrating the second preferred embodiment of the new deposition processing device; Figure 7 is a cross-sectional view of CC of Figure 6; and Figure 8 is a schematic diagram illustrating the second preferred embodiment The cross-sectional flow velocity distribution of gas in a diffuser disk.

有關本新型之相關申請專利特色與技術內容,在以下配合參考圖式之較佳實施例的詳細說明中,將可清楚的呈現。 The features and technical content of the patent application related to this new model will be clearly presented in the following detailed description of the preferred embodiment with reference to the drawings.

參閱圖1、2,及3,為本新型沉積處理裝置之第一較佳實施例,其包含一擴散盤1、複數氣體通孔2、一遮蔽組3、一導氣環4、一抽氣環5,及一抽氣管6。本新型可用於8、12吋的wafer。 Refer to Figures 1, 2, and 3, which are the first preferred embodiment of the new type of deposition processing device, which includes a diffuser 1, a plurality of gas through holes 2, a shielding group 3, a gas guide ring 4, and a gas exhaust Ring 5, and a suction pipe 6. This model can be used for 8 and 12 inch wafers.

該擴散盤1包括一第一表面11,及一與該第一表面11相反之第二表面12,該第一表面11為一自該擴散盤1圓心向圓周逐漸升高的階梯狀結構,而該第二表面12為一平面結構。 The diffuser 1 includes a first surface 11 and a second surface 12 opposite to the first surface 11. The first surface 11 is a stepped structure gradually rising from the center of the diffuser 1 to the circumference, and The second surface 12 is a plane structure.

其中,該第一表面11具有一第一梯部111、一環繞該第一梯部111設置之第二梯部112、一環繞該第二梯部112設置之第三梯部113、一環繞該第三梯部113設置之第四梯部114,及一環繞該第四梯部114設置之第五梯部115,且該第一梯部111靠近該擴散盤1之圓心設置,而該第五梯部115靠近該擴散盤1之圓周設置。 Wherein, the first surface 11 has a first step portion 111, a second step portion 112 disposed around the first step portion 111, a third step portion 113 disposed around the second step portion 112, and a third step portion 113 surrounding the second step portion 112. The fourth step 114 provided by the third step 113, and a fifth step 115 provided around the fourth step 114, and the first step 111 is located close to the center of the diffuser 1, and the fifth step The step 115 is arranged close to the circumference of the diffuser 1.

於此,各相鄰之梯部間的高度差相同。進一步地,該第一梯部111與該第二梯部112的高度差d1為1~5mm,該第二梯部112與該第三梯部113的高度差d1為1~5mm,該第三梯部113與該第四梯部114的高度差d1為1~5mm,該第四梯部114與該第五梯部115的高度差d1為1~5mm。 Here, the height difference between adjacent steps is the same. Further, the height difference d1 between the first step portion 111 and the second step portion 112 is 1 to 5 mm, the height difference d1 between the second step portion 112 and the third step portion 113 is 1 to 5 mm, and the third step The height difference d1 between the step 113 and the fourth step 114 is 1 to 5 mm, and the height difference d1 between the fourth step 114 and the fifth step 115 is 1 to 5 mm.

該複數氣體通孔2貫穿該擴散盤1設置,該氣體通孔2位於該擴散盤1上的設置密度為每平方公分6~10個,於此,該氣體通孔2的密度約32孔/5.32cm2。氣體是由該第一表面11進入並自該第二表面12向外流動。實際實施時,該擴散盤1上方設置有一遮蔽板(圖未示出),且該遮蔽板上開設有複數開口,氣體經由該遮蔽板之開口流至該複數氣體通孔2。 The plurality of gas through holes 2 are arranged through the diffuser plate 1, and the density of the gas through holes 2 on the diffuser plate 1 is 6-10 per square centimeter. Here, the density of the gas through holes 2 is about 32 holes per square centimeter. 5.32cm 2 . Gas enters from the first surface 11 and flows outward from the second surface 12. In actual implementation, a shielding plate (not shown in the figure) is arranged above the diffuser plate 1, and the shielding plate is provided with a plurality of openings, and gas flows to the plurality of gas through holes 2 through the openings of the shielding plate.

在該第一較佳實施例中,該複數氣體通孔2之孔型截面結構為一直條孔21,而該直條孔21的孔徑d2為0.1~10mm,相鄰之直條孔21的孔徑d2間距為3~10mm。位於該第一梯部111的直條孔21最短,位於該第五梯部115的直條孔21最長。 In the first preferred embodiment, the hole-shaped cross-sectional structure of the plurality of gas through holes 2 is a straight hole 21, and the hole diameter d2 of the straight hole 21 is 0.1-10 mm, and the hole diameter of the adjacent straight hole 21 d2 spacing is 3~10mm. The straight hole 21 located on the first step portion 111 is the shortest, and the straight hole 21 located on the fifth step portion 115 is the longest.

配合參閱圖4、5,該遮蔽組3包括一設置於該擴散盤1上之遮蔽板31,及一設置於該遮蔽板31上之導氣管32。 With reference to FIGS. 4 and 5, the shielding set 3 includes a shielding plate 31 arranged on the diffuser 1 and an air duct 32 arranged on the shielding plate 31.

該導氣環4設置於該擴散盤1周緣,其包括一本體41,及複數開設於該本體41上之導氣孔42,且該導氣環4之材質為陶瓷。 The air guide ring 4 is disposed on the periphery of the diffuser 1 and includes a body 41 and a plurality of air guide holes 42 formed on the body 41, and the material of the air guide ring 4 is ceramic.

該抽氣環5設置於該導氣環4周緣,包括一圍繞界定出一氣體空間50之座體51,該每一導氣孔42與該氣體空間50相連通。其中,該導氣環4與該抽氣環5呈不同大小之同心環設置。 The air suction ring 5 is disposed on the periphery of the air guide ring 4 and includes a seat 51 surrounding and defining a gas space 50, and each air guide hole 42 is communicated with the gas space 50. Wherein, the air guide ring 4 and the air suction ring 5 are arranged in concentric rings of different sizes.

該抽氣管6與該抽氣環5連接,一氣體由該複數導氣孔42進入該氣體空間50,再由位於一側之抽氣管6匯集氣體向外抽出。透過該導氣環4、與該抽 氣環5之同心環設計,達到同心圓效果,配合位於該抽氣環5上之抽氣管6,避免側抽均勻性不佳的偏心困擾。 The exhaust pipe 6 is connected to the exhaust ring 5, and a gas enters the gas space 50 through the plurality of air guide holes 42, and then the exhaust pipe 6 on one side collects the gas and extracts it outward. Through the air guide ring 4, and the pump The concentric ring design of the air ring 5 achieves the effect of concentric circles, and it cooperates with the air extraction pipe 6 located on the air extraction ring 5 to avoid the eccentricity of poor side extraction uniformity.

參閱圖6、7,為本新型之第二較佳實施例,與該第一較佳實施例大致相同,相同之處於此不再贅述,不同之處在於,該複數氣體通孔2之孔型截面結構為一直條孔21連接一向外擴張的喇叭孔22,且向外擴張的喇叭孔22結構靠近該第二表面12。 Refer to Figures 6 and 7, which are the second preferred embodiment of the new type, which is roughly the same as the first preferred embodiment. The same parts will not be repeated here. The difference lies in the hole pattern of the plurality of gas through holes 2 The cross-sectional structure is that a straight hole 21 is connected to an outwardly expanding horn hole 22, and the outwardly expanding horn hole 22 is close to the second surface 12.

實際實施時,該喇叭孔22是位於平面結構的第二表面12上,具有加工簡單與提升精準度之功效。 In actual implementation, the horn hole 22 is located on the second surface 12 of the planar structure, which has the effect of simple processing and improved accuracy.

於此,該直條孔21的孔徑d2為0.1~10mm,該喇叭孔22的孔徑d3為1.5~5mm。該喇叭孔22的高度d4為1~5mm,該喇叭孔22向外擴張的傾斜角度d5為30°~90°。 Here, the diameter d2 of the straight hole 21 is 0.1-10 mm, and the diameter d3 of the horn hole 22 is 1.5-5 mm. The height d4 of the horn hole 22 is 1 to 5 mm, and the inclination angle d5 of the outward expansion of the horn hole 22 is 30° to 90°.

設置於靠近該擴散盤1之圓心的第一梯部111上的直條孔21,其流速較靠近該擴散盤1之圓周的第五梯部115上的直條孔21短,而可更快速的到達欲鍍膜基材。 The straight holes 21 arranged on the first step 111 close to the center of the diffuser 1 have a shorter flow rate than the straight holes 21 on the fifth step 115 close to the circumference of the diffuser 1, and can be faster To reach the substrate to be coated.

其中,該第一梯部111與該第二梯部112的高度差d6為1~5mm,該第二梯部112與該第三梯部113的高度差d6為0.5~3mm,該第三梯部113與該第四梯部114的高度差d6為0.5~3mm,該第四梯部114與該第五梯部115的高度差d6為0.5~3mm。 Wherein, the height difference d6 between the first step portion 111 and the second step portion 112 is 1~5mm, the height difference d6 between the second step portion 112 and the third step portion 113 is 0.5~3mm, the third step The height difference d6 between the portion 113 and the fourth step 114 is 0.5 to 3 mm, and the height difference d6 between the fourth step 114 and the fifth step 115 is 0.5 to 3 mm.

再者,各相鄰之梯部間的直徑差相同。於此,該第一梯部111的直徑d7為60~75mm,該第二梯部112的直徑d7為100~115mm,該第三梯部113的直徑d7為140~155mm,該第四梯部114的直徑d7為180~195mm,該第五梯部115的直徑d7為220~235mm,各相鄰之梯部間的直徑差為40mm。 Furthermore, the diameter difference between adjacent steps is the same. Here, the diameter d7 of the first step 111 is 60~75mm, the diameter d7 of the second step 112 is 100~115mm, the diameter d7 of the third step 113 is 140~155mm, the fourth step The diameter d7 of 114 is 180 to 195 mm, the diameter d7 of the fifth step 115 is 220 to 235 mm, and the diameter difference between adjacent steps is 40 mm.

透過該第一表面11為自該擴散盤1圓心向圓周逐漸升高的階梯狀結構,結合該直條孔21連接向外擴張的喇叭孔22設計,且該喇叭孔22位於同一平面上,將氣體框圍在該複數氣體通孔2中,避免氣體於抽氣過程因密集度不足而提早擴散被提早抽離,解決靠近該擴散盤1之圓心的氣體氛圍不足之問題。且可減緩氣體向下流動速度使其向內擠壓,補足中間流速較慢之問題,使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤1之圓心的氣體通孔2流速。 Through the first surface 11, it is a stepped structure gradually rising from the center of the diffuser 1 to the circumference, combined with the straight hole 21 to connect the outwardly expanding horn hole 22, and the horn hole 22 is located on the same plane. The gas frame is enclosed in the plurality of gas through holes 2 to prevent the gas from being prematurely diffused and drawn away due to insufficient concentration during the pumping process, and solves the problem of insufficient gas atmosphere near the center of the diffuser 1. And it can slow down the downward flow of the gas to make it squeeze inward, to compensate for the slower intermediate flow rate, to increase the gas density and form the effect of a gas curtain, thereby increasing the flow rate of the gas through holes 2 close to the center of the diffuser 1 .

參閱圖8,為該第二較佳實施例的沉積處理裝置之截面流速圖,圖中數字的單位為氣體流速(m/s),由氣體模擬圖可得知,藉由該複數氣體通孔2之孔型截面結構為該直條孔21與該喇叭孔22之組合,其氣體平均分佈,藉以提升氣體鍍膜之均勻性的目的。 Refer to FIG. 8, which is a cross-sectional flow rate diagram of the deposition processing apparatus of the second preferred embodiment. The unit of the figure in the figure is the gas flow rate (m/s). It can be seen from the gas simulation diagram that the plurality of gas through holes The hole-shaped cross-sectional structure of 2 is a combination of the straight hole 21 and the horn hole 22, and the gas is evenly distributed, so as to improve the uniformity of the gas coating.

綜上所述,本新型沉積處理裝置,藉由該擴散盤1,及該複數氣體通孔2間相互設置,透過該第一表面11為自該擴散盤1圓心向圓周逐漸升高的階梯狀結構,結合該直條孔21連接向外擴張的喇叭孔22設計,且該喇叭孔22位於同一平面上,將氣體框圍在該複數氣體通孔2中,且使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤1之圓心的氣體通孔2流速,以達到氣體均勻鍍膜之功效,此外,透過該導氣環4、與該抽氣環5之同心環設計,達到同心圓效果,配合位於該抽氣環5上之抽氣管6,避免側抽均勻性不佳的偏心困擾,故確實可以達成本新型之目的。 To sum up, the new type of deposition processing device uses the diffuser 1 and the plurality of gas through holes 2 to be mutually arranged, and the first surface 11 is a stepped shape gradually rising from the center of the diffuser 1 to the circumference through the first surface 11 Structure, combined with the design of the straight hole 21 connecting the outwardly expanding horn hole 22, and the horn hole 22 is located on the same plane, the gas frame is enclosed in the plurality of gas through holes 2, and the gas density is increased to form an air curtain The effect of this is to increase the flow rate of the gas through hole 2 close to the center of the diffuser 1 to achieve the effect of uniform gas coating. In addition, through the concentric ring design of the gas guide ring 4 and the gas extraction ring 5, concentricity is achieved The circular effect, combined with the suction pipe 6 located on the suction ring 5, avoids the problem of eccentricity due to poor side suction uniformity, so it can indeed achieve the purpose of new cost.

惟以上所述者,僅為本新型之較佳實施例而已,當不能以此限定本新型實施之範圍,即大凡依本新型申請專利範圍及新型說明內容所作之簡單的等效變化與修飾,皆仍屬本新型專利涵蓋之範圍內。 However, the above are only the preferred embodiments of the present model, and should not be used to limit the scope of implementation of the present model, that is, simple equivalent changes and modifications made in accordance with the scope of the patent application for the present model and the description of the new model, All are still within the scope of this new patent.

3:遮蔽組 3: Masking group

31:遮蔽板 31: Shading plate

32:導氣管 32: airway

4:導氣環 4: Air guide ring

5:抽氣環 5: Exhaust ring

6:抽氣管 6: Exhaust pipe

Claims (11)

一種沉積處理裝置,包含:一擴散盤,包括一第一表面,及一與該第一表面相反之第二表面,該第一表面為一自該擴散盤圓心向圓周逐漸升高的階梯狀結構,而該第二表面為一平面結構;複數貫穿該擴散盤設置之氣體通孔;一遮蔽組,包括一設置於該擴散盤上之遮蔽板,及一設置於該遮蔽板上之導氣管;一導氣環,設置於該擴散盤周緣,其包括一本體,及複數開設於該本體上之導氣孔;一抽氣環,設置於該導氣環周緣,包括一圍繞界定出一氣體空間之座體,該每一導氣孔與該氣體空間相連通;及一與該抽氣環連接之抽氣管,一氣體由該複數導氣孔進入該氣體空間,再由該抽氣管向外抽出。 A deposition processing device, comprising: a diffusion disk, including a first surface, and a second surface opposite to the first surface, the first surface being a stepped structure gradually rising from the center of the diffusion disk to the circumference , And the second surface is a plane structure; a plurality of gas through holes arranged through the diffuser plate; a shielding group, including a shielding plate arranged on the diffuser plate, and an air duct arranged on the shielding plate; An air guide ring is arranged on the periphery of the diffuser, and includes a body and a plurality of air guide holes opened on the body; an air suction ring is arranged on the periphery of the air guide ring, and includes a surrounding and defining a gas space In the seat body, each air guiding hole is connected to the gas space; and an air suction pipe connected with the air suction ring, a gas enters the gas space through the plurality of air guiding holes, and then is drawn out from the air suction pipe. 依據請求項1所述之沉積處理裝置,其中,該導氣環與該抽氣環呈不同大小之同心環設置。 The deposition processing apparatus according to claim 1, wherein the air guide ring and the air pumping ring are arranged in concentric rings of different sizes. 依據請求項2所述之沉積處理裝置,其中,該第一表面具有一第一梯部、一環繞該第一梯部設置之第二梯部、一環繞該第二梯部設置之第三梯部、一環繞該第三梯部設置之第四梯部,及一環繞該第四梯部設置之第五梯部,且該第一梯部靠近該擴散盤之圓心設置,而該第五梯部靠近該擴散盤之圓周設置。 The deposition processing apparatus according to claim 2, wherein the first surface has a first step, a second step surrounding the first step, and a third step surrounding the second step Part, a fourth ladder part arranged around the third ladder part, and a fifth ladder part arranged around the fourth ladder part, and the first ladder part is arranged close to the center of the diffuser, and the fifth ladder part The part is arranged close to the circumference of the diffuser. 依據請求項3所述之沉積處理裝置,其中,該複數氣體通孔之孔型截面結構為一直條孔,而該直條孔的孔徑為0.1~10mm。 The deposition processing apparatus according to claim 3, wherein the hole-shaped cross-sectional structure of the plurality of gas through holes is a straight hole, and the diameter of the straight hole is 0.1-10 mm. 依據請求項4所述之沉積處理裝置,其中,各相鄰之梯部間的高度差相同。 The deposition processing apparatus according to claim 4, wherein the height difference between adjacent steps is the same. 依據請求項2所述之沉積處理裝置,其中,該複數氣體通孔之孔型截面結構為一直條孔連接一向外擴張的喇叭孔,且向外擴張的喇叭孔結構靠近該第二表面。 The deposition processing apparatus according to claim 2, wherein the hole-shaped cross-sectional structure of the plurality of gas through holes is a straight hole connected to an outwardly expanding horn hole, and the outwardly expanding horn hole structure is close to the second surface. 依據請求項6所述之沉積處理裝置,其中,該直條孔的孔徑為0.1~10mm,該喇叭孔的孔徑為1.5~5mm。 The deposition processing device according to claim 6, wherein the diameter of the straight hole is 0.1-10 mm, and the diameter of the horn hole is 1.5-5 mm. 依據請求項7所述之沉積處理裝置,其中,該喇叭孔的高度為1~5mm,該喇叭孔向外擴張的傾斜角度為30°~90°。 The deposition processing device according to claim 7, wherein the height of the horn hole is 1 to 5 mm, and the inclination angle of the outward expansion of the horn hole is 30° to 90°. 依據請求項3所述之沉積處理裝置,其中,該第一梯部與該第二梯部的高度差為1~5mm,該第二梯部與該第三梯部的高度差為0.5~3mm,該第三梯部與該第四梯部的高度差為0.5~3mm,該第四梯部與該第五梯部的高度差為0.5~3mm。 The deposition processing device according to claim 3, wherein the height difference between the first step and the second step is 1 to 5 mm, and the height difference between the second step and the third step is 0.5 to 3 mm , The height difference between the third step and the fourth step is 0.5-3mm, and the height difference between the fourth step and the fifth step is 0.5-3mm. 依據請求項9所述之沉積處理裝置,其中,各相鄰之梯部間的直徑差相同。 The deposition processing apparatus according to claim 9, wherein the diameter difference between adjacent steps is the same. 依據請求項1所述之沉積處理裝置,其中,該氣體通孔位於該擴散盤上的設置密度為每平方公分6~10個。 The deposition processing device according to claim 1, wherein the arrangement density of the gas through holes on the diffusion disk is 6-10 per square centimeter.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116752106A (en) * 2023-08-17 2023-09-15 上海陛通半导体能源科技股份有限公司 Physical vapor deposition apparatus for reactive sputtering

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116752106A (en) * 2023-08-17 2023-09-15 上海陛通半导体能源科技股份有限公司 Physical vapor deposition apparatus for reactive sputtering
CN116752106B (en) * 2023-08-17 2023-11-10 上海陛通半导体能源科技股份有限公司 Physical vapor deposition apparatus for reactive sputtering

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