TWM612285U - Deposition processing apparatus for - Google Patents
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- TWM612285U TWM612285U TW110200702U TW110200702U TWM612285U TW M612285 U TWM612285 U TW M612285U TW 110200702 U TW110200702 U TW 110200702U TW 110200702 U TW110200702 U TW 110200702U TW M612285 U TWM612285 U TW M612285U
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Abstract
一種沉積處理裝置,包含擴散盤、複數氣體通孔、遮蔽組、導氣環、抽氣環,及抽氣管。該擴散盤包括第一表面,及第二表面,第一表面為自擴散盤圓心向圓周逐漸升高的階梯狀結構,第二表面為平面結構,複數氣體通孔貫穿該擴散盤設置,遮蔽組包括設置於該擴散盤上之遮蔽板,及設置於遮蔽板上之導氣管,導氣環設置於該擴散盤周緣,包括本體,及複數開設於該本體上之導氣孔,抽氣環設置於該導氣環周緣,包括圍繞界定出氣體空間之座體,每一導氣孔與氣體空間相連通,抽氣管與抽氣環連接,氣體由複數導氣孔進入該氣體空間,再由抽氣管向外抽出。A deposition processing device includes a diffusion disk, a plurality of gas through holes, a shielding group, a gas guide ring, a gas pumping ring, and a gas pumping pipe. The diffuser includes a first surface and a second surface. The first surface is a stepped structure gradually rising from the center of the diffuser to the circumference, and the second surface is a planar structure. A plurality of gas through holes are provided through the diffuser, and the shielding group It includes a shielding plate arranged on the diffuser plate, and an air duct arranged on the shielding plate. The air guide ring is arranged on the periphery of the diffuser plate, including a body, and a plurality of air holes opened on the body. The air suction ring is arranged on the The perimeter of the air guide ring includes a seat body surrounding the gas space, each air guide hole is connected to the gas space, and the air extraction pipe is connected to the air extraction ring. The gas enters the gas space through a plurality of air guide holes, and then the air extraction tube outwards Pull out.
Description
本新型是有關一種處理裝置,特別是指一種沉積處理裝置。 This model relates to a processing device, in particular to a deposition processing device.
高溫化學氣相沉積(CVD)製程廣泛地使用在半導體產業中。基材鍍膜製程之良率及質量取決於基材薄膜沉積均勻性,而薄膜厚度均勻性又受鍍膜反應氣體散佈於反應腔室影響,其中,化學氣相沉積設備設有氣體擴散板,該氣體擴散板位於該反應腔室中,用以分散鍍膜反應氣體氣流,使該鍍膜氣體平均散佈在該反應腔室中,以沉降至欲鍍膜基材,達到均勻鍍膜。 High-temperature chemical vapor deposition (CVD) processes are widely used in the semiconductor industry. The yield and quality of the substrate coating process depend on the substrate film deposition uniformity, and the film thickness uniformity is affected by the coating reaction gas spreading in the reaction chamber. Among them, the chemical vapor deposition equipment is equipped with a gas diffusion plate. The diffusion plate is located in the reaction chamber and is used to disperse the coating reaction gas flow so that the coating gas is evenly dispersed in the reaction chamber to settle to the substrate to be coated to achieve uniform coating.
台灣發明專利第I283437號一種「氣體分佈噴頭」,提及用於半導體製程之氣體分佈噴頭,特徵為一具有細長溝槽或通道型式氣體出口的面板。透過噴頭相對地靠近晶圓之設計,以增加靠近晶圓邊緣之處理氣流,而面板之邊緣部份相對於面板之中心部份較低凹,然而,在晶圓邊緣增加之質量流可能會增加沉積材料之邊緣厚度,致使中間位置薄膜厚度較薄,反而影響鍍膜之均勻性。再者,習知的氣體分佈面板之邊緣相對於面板之中心低凹的非平面結構,會衍生精準度差與加工困難之缺失,而須加以改善。 Taiwan Invention Patent No. I283437 is a "gas distribution nozzle", which refers to a gas distribution nozzle used in semiconductor processing, which is characterized by a panel with a slender groove or channel type gas outlet. The nozzle is relatively close to the wafer to increase the processing air flow near the edge of the wafer. The edge of the panel is relatively concave relative to the center of the panel. However, the increased mass flow at the edge of the wafer may increase The edge thickness of the deposited material results in a thinner film thickness in the middle, which affects the uniformity of the coating. Furthermore, the conventional gas distribution panel has a concave non-planar structure in which the edge of the panel is concave with respect to the center of the panel, which results in poor accuracy and processing difficulties, and needs to be improved.
上述缺點都顯現習知基材薄膜所衍生的種種問題,據此,為了提升氣體散佈於化學氣相沉積設備之反應腔室的程度,增進薄膜厚度均勻性,改善鍍膜製程良率及品質,前述習知氣體擴散板確實有加以改善之必要。 The above-mentioned shortcomings all show the various problems derived from the conventional substrate film. Accordingly, in order to increase the degree of gas dispersion in the reaction chamber of the chemical vapor deposition equipment, increase the uniformity of the film thickness, and improve the yield and quality of the coating process, the foregoing conventional knowledge The gas diffusion plate really needs to be improved.
有鑑於此,本新型之目的,係提供一種沉積處理裝置,包含一擴散盤、複數氣體通孔、一遮蔽組、一導氣環、一抽氣環,及一抽氣管。 In view of this, the object of the present invention is to provide a deposition processing device, which includes a diffusion plate, a plurality of gas through holes, a shielding group, an air guide ring, an air extraction ring, and an air extraction pipe.
該擴散盤包括一第一表面,及一與該第一表面相反之第二表面,該第一表面為一自該擴散盤圓心向圓周逐漸升高的階梯狀結構,而該第二表面為一平面結構,該複數氣體通孔貫穿該擴散盤設置,該遮蔽組包括一設置於該擴散盤上之遮蔽板,及一設置於該遮蔽板上之導氣管,該導氣環設置於該擴散盤周緣,其包括一本體,及複數開設於該本體上之導氣孔,該抽氣環設置於該導氣環周緣,包括一圍繞界定出一氣體空間之座體,該每一導氣孔與該氣體空間相連通,該抽氣管與該抽氣環連接,一氣體由該複數導氣孔進入該氣體空間,再由該抽氣管向外抽出。 The diffuser includes a first surface and a second surface opposite to the first surface. The first surface is a stepped structure gradually rising from the center of the diffuser to the circumference, and the second surface is a Planar structure, the plurality of gas through holes are arranged through the diffuser, the shielding group includes a shielding plate arranged on the diffuser, and an air duct arranged on the shielding plate, and the air guide ring is arranged on the diffuser The peripheral edge includes a body and a plurality of air guide holes formed on the body. The air suction ring is arranged on the periphery of the air guide ring and includes a seat body surrounding and delimiting a gas space. Each of the air guide holes and the gas The space is connected, the air extraction pipe is connected with the air extraction ring, and a gas enters the air space through the plurality of air guide holes, and then is drawn out from the air extraction pipe.
較佳地,該導氣環與該抽氣環呈不同大小之同心環設置。 Preferably, the air guide ring and the air suction ring are arranged as concentric rings of different sizes.
較佳地,該第一表面具有一第一梯部、一環繞該第一梯部設置之第二梯部、一環繞該第二梯部設置之第三梯部、一環繞該第三梯部設置之第四梯部,及一環繞該第四梯部設置之第五梯部,且該第一梯部靠近該擴散盤之圓心設置,而該第五梯部靠近該擴散盤之圓周設置。 Preferably, the first surface has a first step, a second step surrounding the first step, a third step surrounding the second step, and a surrounding third step A fourth step is provided, and a fifth step is provided around the fourth step, and the first step is located close to the center of the diffuser, and the fifth step is located close to the circumference of the diffuser.
較佳地,該複數氣體通孔之孔型截面結構為一直條孔,而該直條孔的孔徑為0.1~10mm。 Preferably, the hole-shaped cross-sectional structure of the plurality of gas through holes is a straight hole, and the diameter of the straight hole is 0.1-10 mm.
較佳地,各相鄰之梯部間的高度差相同。 Preferably, the height difference between adjacent steps is the same.
較佳地,該複數氣體通孔之孔型截面結構為一直條孔連接一向外擴張的喇叭孔,且向外擴張的喇叭孔結構靠近該第二表面。 Preferably, the hole-shaped cross-sectional structure of the plurality of gas through holes is a straight hole connected to an outwardly expanding horn hole, and the outwardly expanding horn hole structure is close to the second surface.
較佳地,該直條孔的孔徑為0.1~10mm,該喇叭孔的孔徑為1.5~5mm。 Preferably, the diameter of the straight hole is 0.1-10 mm, and the diameter of the horn hole is 1.5-5 mm.
較佳地,該喇叭孔的高度為1~5mm,該喇叭孔向外擴張的傾斜角度為30°~90°。 Preferably, the height of the horn hole is 1 to 5 mm, and the inclination angle of the outward expansion of the horn hole is 30° to 90°.
較佳地,該第一梯部與該第二梯部的高度差為1~5mm,該第二梯部與該第三梯部的高度差為0.5~3mm,該第三梯部與該第四梯部的高度差為0.5~3mm,該第四梯部與該第五梯部的高度差為0.5~3mm。 Preferably, the height difference between the first step and the second step is 1 to 5 mm, the height difference between the second step and the third step is 0.5 to 3 mm, and the third step and the first step are 0.5 to 3 mm. The height difference between the four steps is 0.5-3mm, and the height difference between the fourth step and the fifth step is 0.5-3mm.
較佳地,各相鄰之梯部間的直徑差相同。 Preferably, the diameter difference between adjacent steps is the same.
較佳地,該氣體通孔位於該擴散盤上的設置密度為每平方公分6~10個。 Preferably, the arrangement density of the gas through holes on the diffuser is 6-10 per square centimeter.
本新型之有益功效在於,藉由該第一表面為自該擴散盤圓心向圓周逐漸升高的階梯狀結構,結合該直條孔連接向外擴張的喇叭孔設計,且該喇叭孔位於同一平面上,將氣體框圍在該複數氣體通孔中,避免氣體於抽氣過程因密集度不足而提早擴散被提早抽離,解決靠近該擴散盤之圓心的氣體氛圍不足之問題,且可減緩氣體向下流動速度使其向內擠壓,補足中間流速較慢之問題,使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤之圓心的氣體通孔流速,以達氣體均勻鍍膜之功效,此外,透過該導氣環、與該抽氣環之同心環設計,達到同心圓效果,再配合位於該抽氣環上之抽氣管,避免側抽均勻性不佳的偏心困擾。 The beneficial effect of the present invention is that the first surface is a stepped structure gradually rising from the center of the diffuser to the circumference, combined with the design of the straight hole connected to the outwardly expanding horn hole, and the horn hole is located on the same plane Above, the gas is enclosed in the plurality of gas through holes to prevent the gas from diffusing and being drawn away early due to insufficient concentration during the pumping process, solving the problem of insufficient gas atmosphere near the center of the diffuser, and reducing the gas The downward flow speed makes it squeeze inward to make up for the slower flow rate in the middle, and increase the gas density and form the effect of a gas curtain, thereby increasing the gas flow velocity near the center of the diffuser to achieve uniform gas coating In addition, the air guide ring and the concentric ring design of the air extraction ring achieve a concentric circle effect, and the air extraction tube located on the air extraction ring can avoid the eccentricity of poor side extraction uniformity.
1:擴散盤 1: diffuser
11:第一表面 11: The first surface
111:第一梯部 111: The first ladder
112:第二梯部 112: second ladder
113:第三梯部 113: The third ladder
114:第四梯部 114: fourth ladder
115:第五梯部 115: Fifth Ladder
12:第二表面 12: second surface
2:氣體通孔 2: Gas through hole
21:直條孔 21: Straight hole
22:喇叭孔 22: Horn hole
3:遮蔽組 3: Masking group
31:遮蔽板 31: Shading plate
32:導氣管 32: airway
4:導氣環 4: Air guide ring
41:本體 41: body
42:導氣孔 42: air guide hole
5:抽氣環 5: Exhaust ring
50:氣體空間 50: gas space
51:座體 51: Block
6:抽氣管 6: Exhaust pipe
d1:高度差 d1: height difference
d2:孔徑 d2: Aperture
d3:孔徑 d3: Aperture
d4:高度 d4: height
d5:角度 d5: angle
d6:高度差 d6: height difference
d7:直徑 d7: diameter
圖1是一立體示意圖,說明本新型沉積處理裝置之第一較佳實施例的擴散盤態樣;圖2是一上視示意圖,說明該第一較佳實施例之擴散盤的另一視角; 圖3是圖2的A-A剖面圖;圖4是一立體示意圖,說明該第一較佳實施例之態樣;圖5是一側視示意圖,說明該第一較佳實施例之另一視角態樣;圖6是一上視示意圖,說明本新型沉積處理裝置之第二較佳實施例;圖7是圖6的C-C剖面圖;及圖8是一示意圖,說明該第二較佳實施例中一擴散盤之氣體的截面流速分佈態樣。 Fig. 1 is a three-dimensional schematic diagram illustrating the state of the diffuser disc of the first preferred embodiment of the new deposition processing apparatus; Fig. 2 is a schematic top view illustrating another perspective of the diffuser disc of the first preferred embodiment; Fig. 3 is a cross-sectional view taken along line AA of Fig. 2; Fig. 4 is a schematic perspective view illustrating the aspect of the first preferred embodiment; Fig. 5 is a schematic side view illustrating another perspective view of the first preferred embodiment Figure 6 is a schematic top view illustrating the second preferred embodiment of the new deposition processing device; Figure 7 is a cross-sectional view of CC of Figure 6; and Figure 8 is a schematic diagram illustrating the second preferred embodiment The cross-sectional flow velocity distribution of gas in a diffuser disk.
有關本新型之相關申請專利特色與技術內容,在以下配合參考圖式之較佳實施例的詳細說明中,將可清楚的呈現。 The features and technical content of the patent application related to this new model will be clearly presented in the following detailed description of the preferred embodiment with reference to the drawings.
參閱圖1、2,及3,為本新型沉積處理裝置之第一較佳實施例,其包含一擴散盤1、複數氣體通孔2、一遮蔽組3、一導氣環4、一抽氣環5,及一抽氣管6。本新型可用於8、12吋的wafer。
Refer to Figures 1, 2, and 3, which are the first preferred embodiment of the new type of deposition processing device, which includes a
該擴散盤1包括一第一表面11,及一與該第一表面11相反之第二表面12,該第一表面11為一自該擴散盤1圓心向圓周逐漸升高的階梯狀結構,而該第二表面12為一平面結構。
The
其中,該第一表面11具有一第一梯部111、一環繞該第一梯部111設置之第二梯部112、一環繞該第二梯部112設置之第三梯部113、一環繞該第三梯部113設置之第四梯部114,及一環繞該第四梯部114設置之第五梯部115,且該第一梯部111靠近該擴散盤1之圓心設置,而該第五梯部115靠近該擴散盤1之圓周設置。
Wherein, the
於此,各相鄰之梯部間的高度差相同。進一步地,該第一梯部111與該第二梯部112的高度差d1為1~5mm,該第二梯部112與該第三梯部113的高度差d1為1~5mm,該第三梯部113與該第四梯部114的高度差d1為1~5mm,該第四梯部114與該第五梯部115的高度差d1為1~5mm。
Here, the height difference between adjacent steps is the same. Further, the height difference d1 between the
該複數氣體通孔2貫穿該擴散盤1設置,該氣體通孔2位於該擴散盤1上的設置密度為每平方公分6~10個,於此,該氣體通孔2的密度約32孔/5.32cm2。氣體是由該第一表面11進入並自該第二表面12向外流動。實際實施時,該擴散盤1上方設置有一遮蔽板(圖未示出),且該遮蔽板上開設有複數開口,氣體經由該遮蔽板之開口流至該複數氣體通孔2。
The plurality of gas through
在該第一較佳實施例中,該複數氣體通孔2之孔型截面結構為一直條孔21,而該直條孔21的孔徑d2為0.1~10mm,相鄰之直條孔21的孔徑d2間距為3~10mm。位於該第一梯部111的直條孔21最短,位於該第五梯部115的直條孔21最長。
In the first preferred embodiment, the hole-shaped cross-sectional structure of the plurality of gas through
配合參閱圖4、5,該遮蔽組3包括一設置於該擴散盤1上之遮蔽板31,及一設置於該遮蔽板31上之導氣管32。
With reference to FIGS. 4 and 5, the shielding set 3 includes a shielding
該導氣環4設置於該擴散盤1周緣,其包括一本體41,及複數開設於該本體41上之導氣孔42,且該導氣環4之材質為陶瓷。
The
該抽氣環5設置於該導氣環4周緣,包括一圍繞界定出一氣體空間50之座體51,該每一導氣孔42與該氣體空間50相連通。其中,該導氣環4與該抽氣環5呈不同大小之同心環設置。
The
該抽氣管6與該抽氣環5連接,一氣體由該複數導氣孔42進入該氣體空間50,再由位於一側之抽氣管6匯集氣體向外抽出。透過該導氣環4、與該抽
氣環5之同心環設計,達到同心圓效果,配合位於該抽氣環5上之抽氣管6,避免側抽均勻性不佳的偏心困擾。
The
參閱圖6、7,為本新型之第二較佳實施例,與該第一較佳實施例大致相同,相同之處於此不再贅述,不同之處在於,該複數氣體通孔2之孔型截面結構為一直條孔21連接一向外擴張的喇叭孔22,且向外擴張的喇叭孔22結構靠近該第二表面12。
Refer to Figures 6 and 7, which are the second preferred embodiment of the new type, which is roughly the same as the first preferred embodiment. The same parts will not be repeated here. The difference lies in the hole pattern of the plurality of gas through
實際實施時,該喇叭孔22是位於平面結構的第二表面12上,具有加工簡單與提升精準度之功效。
In actual implementation, the
於此,該直條孔21的孔徑d2為0.1~10mm,該喇叭孔22的孔徑d3為1.5~5mm。該喇叭孔22的高度d4為1~5mm,該喇叭孔22向外擴張的傾斜角度d5為30°~90°。
Here, the diameter d2 of the
設置於靠近該擴散盤1之圓心的第一梯部111上的直條孔21,其流速較靠近該擴散盤1之圓周的第五梯部115上的直條孔21短,而可更快速的到達欲鍍膜基材。
The
其中,該第一梯部111與該第二梯部112的高度差d6為1~5mm,該第二梯部112與該第三梯部113的高度差d6為0.5~3mm,該第三梯部113與該第四梯部114的高度差d6為0.5~3mm,該第四梯部114與該第五梯部115的高度差d6為0.5~3mm。
Wherein, the height difference d6 between the
再者,各相鄰之梯部間的直徑差相同。於此,該第一梯部111的直徑d7為60~75mm,該第二梯部112的直徑d7為100~115mm,該第三梯部113的直徑d7為140~155mm,該第四梯部114的直徑d7為180~195mm,該第五梯部115的直徑d7為220~235mm,各相鄰之梯部間的直徑差為40mm。
Furthermore, the diameter difference between adjacent steps is the same. Here, the diameter d7 of the
透過該第一表面11為自該擴散盤1圓心向圓周逐漸升高的階梯狀結構,結合該直條孔21連接向外擴張的喇叭孔22設計,且該喇叭孔22位於同一平面上,將氣體框圍在該複數氣體通孔2中,避免氣體於抽氣過程因密集度不足而提早擴散被提早抽離,解決靠近該擴散盤1之圓心的氣體氛圍不足之問題。且可減緩氣體向下流動速度使其向內擠壓,補足中間流速較慢之問題,使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤1之圓心的氣體通孔2流速。
Through the
參閱圖8,為該第二較佳實施例的沉積處理裝置之截面流速圖,圖中數字的單位為氣體流速(m/s),由氣體模擬圖可得知,藉由該複數氣體通孔2之孔型截面結構為該直條孔21與該喇叭孔22之組合,其氣體平均分佈,藉以提升氣體鍍膜之均勻性的目的。
Refer to FIG. 8, which is a cross-sectional flow rate diagram of the deposition processing apparatus of the second preferred embodiment. The unit of the figure in the figure is the gas flow rate (m/s). It can be seen from the gas simulation diagram that the plurality of gas through holes The hole-shaped cross-sectional structure of 2 is a combination of the
綜上所述,本新型沉積處理裝置,藉由該擴散盤1,及該複數氣體通孔2間相互設置,透過該第一表面11為自該擴散盤1圓心向圓周逐漸升高的階梯狀結構,結合該直條孔21連接向外擴張的喇叭孔22設計,且該喇叭孔22位於同一平面上,將氣體框圍在該複數氣體通孔2中,且使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤1之圓心的氣體通孔2流速,以達到氣體均勻鍍膜之功效,此外,透過該導氣環4、與該抽氣環5之同心環設計,達到同心圓效果,配合位於該抽氣環5上之抽氣管6,避免側抽均勻性不佳的偏心困擾,故確實可以達成本新型之目的。
To sum up, the new type of deposition processing device uses the
惟以上所述者,僅為本新型之較佳實施例而已,當不能以此限定本新型實施之範圍,即大凡依本新型申請專利範圍及新型說明內容所作之簡單的等效變化與修飾,皆仍屬本新型專利涵蓋之範圍內。 However, the above are only the preferred embodiments of the present model, and should not be used to limit the scope of implementation of the present model, that is, simple equivalent changes and modifications made in accordance with the scope of the patent application for the present model and the description of the new model, All are still within the scope of this new patent.
3:遮蔽組 3: Masking group
31:遮蔽板 31: Shading plate
32:導氣管 32: airway
4:導氣環 4: Air guide ring
5:抽氣環 5: Exhaust ring
6:抽氣管 6: Exhaust pipe
Claims (11)
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CN116752106A (en) * | 2023-08-17 | 2023-09-15 | 上海陛通半导体能源科技股份有限公司 | Physical vapor deposition apparatus for reactive sputtering |
CN116752106B (en) * | 2023-08-17 | 2023-11-10 | 上海陛通半导体能源科技股份有限公司 | Physical vapor deposition apparatus for reactive sputtering |
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