TWM608362U - Gas diffuser suitable for chemical vapor deposition - Google Patents
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Abstract
一種適用於化學氣相沉積的氣體擴散裝置,包含一擴散盤,及複數氣體通孔。該擴散盤包括一第一表面,及一與該第一表面相反之第二表面,該第一表面為一自該擴散盤圓心向圓周逐漸升高的階梯狀結構,而該第二表面為一平面結構,該複數氣體通孔貫穿該擴散盤設置,且複數氣體通孔之孔型截面結構為一直條孔連接一向外擴張的喇叭孔,且向外擴張的喇叭孔結構靠近該第二表面,可將氣體框圍在該複數氣體通孔中,使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤之圓心的氣體通孔流速,達到氣體均勻鍍膜之功效。A gas diffusion device suitable for chemical vapor deposition includes a diffusion disk and a plurality of gas through holes. The diffuser includes a first surface and a second surface opposite to the first surface. The first surface is a stepped structure gradually rising from the center of the diffuser to the circumference, and the second surface is a Plane structure, the plurality of gas through holes are arranged through the diffuser, and the hole cross-sectional structure of the plurality of gas through holes is a straight hole connected to an outwardly expanding horn hole, and the outwardly expanding horn hole structure is close to the second surface, The gas frame can be enclosed in the plurality of gas through holes to increase the gas density and form the effect of a gas curtain, thereby increasing the flow rate of the gas through holes close to the center of the diffuser plate to achieve the effect of uniform gas coating.
Description
本新型是有關一種氣體擴散裝置,特別是指一種適用於化學氣相沉積的氣體擴散裝置。This model relates to a gas diffusion device, in particular to a gas diffusion device suitable for chemical vapor deposition.
高溫化學氣相沉積(CVD)製程廣泛地使用在半導體產業中。基材鍍膜製程之良率及質量取決於基材薄膜沉積均勻性,而薄膜厚度均勻性又受鍍膜反應氣體散佈於反應腔室影響,其中,化學氣相沉積設備設有氣體擴散板,該氣體擴散板位於該反應腔室中,用以分散鍍膜反應氣體氣流,使該鍍膜氣體平均散佈在該反應腔室中,以沉降至欲鍍膜基材,達到均勻鍍膜。High-temperature chemical vapor deposition (CVD) processes are widely used in the semiconductor industry. The yield and quality of the substrate coating process depends on the substrate film deposition uniformity, and the film thickness uniformity is affected by the coating reaction gas spreading in the reaction chamber. Among them, the chemical vapor deposition equipment is equipped with a gas diffusion plate. The diffusion plate is located in the reaction chamber for dispersing the coating reaction gas flow so that the coating gas is evenly dispersed in the reaction chamber to settle to the substrate to be coated to achieve uniform coating.
台灣發明專利第I283437號一種「氣體分佈噴頭」,提及用於半導體製程之氣體分佈噴頭,特徵為一具有細長溝槽或通道型式氣體出口的面板。透過噴頭相對地靠近晶圓之設計,以增加靠近晶圓邊緣之處理氣流,而面板之邊緣部份相對於面板之中心部份較低凹,然而,在晶圓邊緣增加之質量流可能會增加沉積材料之邊緣厚度,致使中間位置薄膜厚度較薄,反而影響鍍膜之均勻性。再者,習知的氣體分佈面板之邊緣相對於面板之中心低凹的非平面結構,會衍生精準度差與加工困難之缺失,而須加以改善。Taiwan Invention Patent No. I283437 is a "gas distribution nozzle", which refers to a gas distribution nozzle used in semiconductor processing, which is characterized by a panel with a slender groove or channel type gas outlet. The nozzle is relatively close to the wafer to increase the processing air flow near the edge of the wafer. The edge of the panel is relatively concave relative to the center of the panel. However, the increased mass flow at the edge of the wafer may increase The edge thickness of the deposited material results in a thinner film thickness in the middle position, which affects the uniformity of the coating. Furthermore, the conventional gas distribution panel has a concave non-planar structure in which the edge of the panel is concave with respect to the center of the panel, which results in poor accuracy and processing difficulties, and needs to be improved.
上述缺點都顯現習知基材薄膜所衍生的種種問題,據此,為了提升氣體散佈於化學氣相沉積設備之反應腔室的程度,增進薄膜厚度均勻性,改善鍍膜製程良率及品質,前述習知氣體擴散板確實有加以改善之必要。The above-mentioned shortcomings all show the various problems derived from the conventional substrate film. Accordingly, in order to increase the degree of gas dispersion in the reaction chamber of the chemical vapor deposition equipment, increase the uniformity of the film thickness, and improve the yield and quality of the coating process, the foregoing conventional knowledge The gas diffusion plate really needs to be improved.
有鑑於此,本新型之目的,係提供一種適用於化學氣相沉積的氣體擴散裝置,包含一擴散盤,及複數氣體通孔。In view of this, the purpose of the present invention is to provide a gas diffusion device suitable for chemical vapor deposition, which includes a diffusion disk and a plurality of gas through holes.
該擴散盤包括一第一表面,及一與該第一表面相反之第二表面,該第一表面為一自該擴散盤圓心向圓周逐漸升高的階梯狀結構,而該第二表面為一平面結構,該複數氣體通孔貫穿該擴散盤設置。The diffuser includes a first surface and a second surface opposite to the first surface. The first surface is a stepped structure gradually rising from the center of the diffuser to the circumference, and the second surface is a In a planar structure, the plurality of gas through holes are arranged through the diffuser.
較佳地,該第一表面具有一第一梯部、一環繞該第一梯部設置之第二梯部、一環繞該第二梯部設置之第三梯部、一環繞該第三梯部設置之第四梯部,及一環繞該第四梯部設置之第五梯部,且該第一梯部靠近該擴散盤之圓心設置,而該第五梯部靠近該擴散盤之圓周設置。Preferably, the first surface has a first step, a second step surrounding the first step, a third step surrounding the second step, and a surrounding third step A fourth step is provided, and a fifth step is provided around the fourth step, and the first step is located close to the center of the diffuser, and the fifth step is located close to the circumference of the diffuser.
較佳地,該複數氣體通孔之孔型截面結構為一直條孔,而該直條孔的孔徑為0.1~10 mm 。Preferably, the hole-shaped cross-sectional structure of the plurality of gas through holes is a straight hole, and the diameter of the straight hole is 0.1-10 mm.
較佳地,各相鄰之梯部間的高度差相同。Preferably, the height difference between adjacent steps is the same.
較佳地, 該複數氣體通孔之孔型截面結構為一直條孔連接一向外擴張的喇叭孔,且向外擴張的喇叭孔結構靠近該第二表面。Preferably, the hole-shaped cross-sectional structure of the plurality of gas through holes is a straight hole connected to an outwardly expanding horn hole, and the outwardly expanding horn hole structure is close to the second surface.
較佳地,該直條孔的孔徑為0.1~10mm,該喇叭孔的孔徑為1.5~5mm 。Preferably, the diameter of the straight hole is 0.1-10 mm, and the diameter of the horn hole is 1.5-5 mm.
較佳地,該喇叭孔的高度為1~5mm,該喇叭孔向外擴張的傾斜角度為30°~90°。Preferably, the height of the horn hole is 1 to 5 mm, and the inclination angle of the outward expansion of the horn hole is 30° to 90°.
較佳地,該第一梯部與該第二梯部的高度差為1~5mm,該第二梯部與該第三梯部的高度差為0.5~3mm,該第三梯部與該第四梯部的高度差為0.5~3mm,該第四梯部與該第五梯部的高度差為0.5~3mm。Preferably, the height difference between the first step and the second step is 1 to 5 mm, the height difference between the second step and the third step is 0.5 to 3 mm, and the third step and the first step are 0.5 to 3 mm. The height difference between the four steps is 0.5-3mm, and the height difference between the fourth step and the fifth step is 0.5-3mm.
較佳地,各相鄰之梯部間的直徑差相同。Preferably, the diameter difference between adjacent steps is the same.
較佳地,該氣體通孔位於該擴散盤上的設置密度為每平方公分6~10個。Preferably, the arrangement density of the gas through holes on the diffusion disk is 6-10 per square centimeter.
本新型之有益功效在於,藉由該第一表面為自該擴散盤圓心向圓周逐漸升高的階梯狀結構,結合該直條孔連接向外擴張的喇叭孔設計,且該喇叭孔位於同一平面上,將氣體框圍在該複數氣體通孔中,避免氣體於抽氣過程因密集度不足而提早擴散被提早抽離,解決靠近該擴散盤之圓心的氣體氛圍不足之問題,且可減緩氣體向下流動速度使其向內擠壓,補足中間流速較慢之問題,使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤之圓心的氣體通孔流速,以達氣體均勻鍍膜之功效。The beneficial effect of the present invention lies in the fact that the first surface is a stepped structure gradually rising from the center of the diffuser to the circumference, combined with the design of the straight hole connected to the outwardly expanding horn hole, and the horn hole is located on the same plane Above, the gas is enclosed in the plurality of gas through holes to prevent the gas from diffusing and being drawn away early due to insufficient concentration during the pumping process, solving the problem of insufficient gas atmosphere near the center of the diffuser, and reducing the gas The downward flow speed makes it squeeze inward to make up for the slower flow rate in the middle, and increase the gas density and form the effect of a gas curtain, thereby increasing the flow rate of the gas through holes near the center of the diffuser to achieve uniform gas coating The effect.
有關本新型之相關申請專利特色與技術內容,在以下配合參考圖式之較佳實施例的詳細說明中,將可清楚的呈現。The characteristics and technical content of the patent application related to the present model will be clearly presented in the following detailed description of the preferred embodiment with reference to the drawings.
參閱圖1、2,及3,為本新型適用於化學氣相沉積的氣體擴散裝置之第一較佳實施例,其包含一擴散盤1,及複數氣體通孔2。本新型可用於8、12吋的wafer。Refer to FIGS. 1, 2, and 3, which are the first preferred embodiment of the new type of gas diffusion device suitable for chemical vapor deposition, which includes a
該擴散盤1包括一第一表面11,及一與該第一表面11相反之第二表面12,該第一表面11為一自該擴散盤1圓心向圓周逐漸升高的階梯狀結構,而該第二表面12為一平面結構。The
其中,該第一表面11具有一第一梯部111、一環繞該第一梯部111設置之第二梯部112、一環繞該第二梯部112設置之第三梯部113、一環繞該第三梯部113設置之第四梯部114,及一環繞該第四梯部114設置之第五梯部115,且該第一梯部111靠近該擴散盤1之圓心設置,而該第五梯部115靠近該擴散盤1之圓周設置。Wherein, the
於此,各相鄰之梯部間的高度差相同。進一步地,該第一梯部111與該第二梯部112的高度差d1為1~5mm,該第二梯部112與該第三梯部113的高度差d1為1~5mm,該第三梯部113與該第四梯部114的高度差d1為1~5mm,該第四梯部114與該第五梯部115的高度差d1為1~5mm。Here, the height difference between adjacent steps is the same. Further, the height difference d1 between the
該複數氣體通孔2貫穿該擴散盤1設置,該氣體通孔2位於該擴散盤1上的設置密度為每平方公分6~10個,於此,該氣體通孔2的密度約32孔/5.32cm
2。氣體是由該第一表面11進入並自該第二表面12向外流動。實際實施時,該擴散盤1上方設置有一遮蔽板(圖未示出),且該遮蔽板上開設有複數開口,氣體經由該遮蔽板之開口流至該複數氣體通孔2。
The plurality of gas through
在該第一較佳實施例中,該複數氣體通孔2之孔型截面結構為一直條孔21,而該直條孔21的孔徑d2為0.1~10 mm ,相鄰之直條孔21的孔徑d2間距為3~10mm。位於該第一梯部111的直條孔21最短,位於該第五梯部115的直條孔21最長。In the first preferred embodiment, the hole cross-sectional structure of the plurality of gas through
參閱圖4、5,為本新型之第二較佳實施例,與該第一較佳實施例大致相同,相同之處於此不再贅述,不同之處在於,該複數氣體通孔2之孔型截面結構為一直條孔21連接一向外擴張的喇叭孔22,且向外擴張的喇叭孔22結構靠近該第二表面12。Refer to Figures 4 and 5, which are the second preferred embodiment of the new model, which is roughly the same as the first preferred embodiment, and the same will not be repeated here. The difference lies in the hole pattern of the plurality of gas through
實際實施時,該喇叭孔22是位於平面結構的第二表面12上,具有加工簡單與提升精準度之功效。In actual implementation, the
於此,該直條孔21的孔徑d2為0.1~10 mm ,該喇叭孔21的孔徑d3為1.5~5mm。該喇叭孔21的高度d4為1~5mm,該喇叭21孔向外擴張的傾斜角度d5為30°~90°。Here, the diameter d2 of the
設置於靠近該擴散盤1之圓心的第一梯部111上的直條孔21,其流速較靠近該擴散盤1之圓周的第五梯部115上的直條孔21短,而可更快速的到達欲鍍膜基材。The
其中,該第一梯部111與該第二梯部112的高度差d6為1~5mm ,該第二梯部112與該第三梯部113的高度差d6為0.5~3mm ,該第三梯部113與該第四梯部114的高度差d6為0.5~3mm ,該第四梯部114與該第五梯部115的高度差d6為0.5~3mm。Wherein, the height difference d6 between the
再者,各相鄰之梯部間的直徑差相同。於此,該第一梯部111的直徑d7為60~75mm,該第二梯部112的直徑d7為100~115mm,該第三梯部113的直徑d7為140~155mm,該第四梯部114的直徑d7為180~195mm,該第五梯部115的直徑d7為220~235mm,各相鄰之梯部間的直徑差為40mm。Furthermore, the diameter difference between adjacent steps is the same. Here, the diameter d7 of the
透過該第一表面11為自該擴散盤1圓心向圓周逐漸升高的階梯狀結構,結合該直條孔21連接向外擴張的喇叭孔22設計,且該喇叭孔22位於同一平面上,將氣體框圍在該複數氣體通孔2中,避免氣體於抽氣過程因密集度不足而提早擴散被提早抽離,解決靠近該擴散盤1之圓心的氣體氛圍不足之問題。且可減緩氣體向下流動速度使其向內擠壓,補足中間流速較慢之問題,使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤1之圓心的氣體通孔2流速。Through the
參閱圖6,為該第二較佳實施例的氣體擴散裝置之截面流速圖,圖中數字的單位為氣體流速(m/s),由氣體模擬圖可得知,藉由該複數氣體通孔2之孔型截面結構為該直條孔21與該喇叭孔22之組合,其氣體平均分佈,藉以提升氣體鍍膜之均勻性的目的。Refer to FIG. 6, which is a cross-sectional flow rate diagram of the gas diffusion device of the second preferred embodiment. The unit of the figure in the figure is the gas flow rate (m/s). It can be seen from the gas simulation diagram that by the plurality of gas through holes The hole-shaped cross-sectional structure of 2 is a combination of the
綜上所述,本新型適用於化學氣相沉積的氣體擴散裝置,藉由該擴散盤1,及該複數氣體通孔2間相互設置,透過該第一表面11為自該擴散盤1圓心向圓周逐漸升高的階梯狀結構,結合該直條孔21連接向外擴張的喇叭孔22設計,且該喇叭孔22位於同一平面上,將氣體框圍在該複數氣體通孔2中,且使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤1之圓心的氣體通孔2流速,以達到氣體均勻鍍膜之功效,故確實可以達成本新型之目的。In summary, the present invention is suitable for a gas diffusion device for chemical vapor deposition. The
惟以上所述者,僅為本新型之較佳實施例而已,當不能以此限定本新型實施之範圍,即大凡依本新型申請專利範圍及新型說明內容所作之簡單的等效變化與修飾,皆仍屬本新型專利涵蓋之範圍內。However, the above are only the preferred embodiments of the present model, and should not be used to limit the scope of implementation of the present model, that is, simple equivalent changes and modifications made in accordance with the scope of the patent application for the present model and the description of the model, All are still within the scope of this new patent.
1:擴散盤 11:第一表面 111:第一梯部 112:第二梯部 113:第三梯部 114:第四梯部 115:第五梯部 12:第二表面 2:氣體通孔 21:直條孔 22:喇叭孔 d1:高度差 d2:孔徑 d3:孔徑 d4:高度 d5:角度 d6:高度差 d7:直徑1: diffuser 11: The first surface 111: The first ladder 112: second ladder 113: The third ladder 114: fourth ladder 115: Fifth Ladder 12: second surface 2: Gas through hole 21: Straight hole 22: Horn hole d1: height difference d2: Aperture d3: Aperture d4: height d5: angle d6: height difference d7: diameter
圖1是一立體示意圖,說明本新型適用於化學氣相沉積的氣體擴散裝置之第一較佳實施例; 圖2是一上視示意圖,說明該第一較佳實施例之另一視角態樣; 圖3是圖2的A-A剖面圖; 圖4是一上視示意圖,說明本新型適用於化學氣相沉積的氣體擴散裝置之第二較佳實施例; 圖5是圖4的C-C剖面圖;及 圖6是一示意圖,說明該第二較佳實施例中一擴散盤之氣體的截面流速分佈態樣。 Figure 1 is a three-dimensional schematic diagram illustrating the first preferred embodiment of the new gas diffusion device suitable for chemical vapor deposition; Figure 2 is a schematic top view illustrating another view of the first preferred embodiment; Figure 3 is a cross-sectional view taken along line A-A of Figure 2; 4 is a schematic top view illustrating the second preferred embodiment of the new gas diffusion device suitable for chemical vapor deposition; Figure 5 is a C-C cross-sectional view of Figure 4; and 6 is a schematic diagram illustrating the cross-sectional flow velocity distribution of gas in a diffusion disk in the second preferred embodiment.
1:擴散盤 1: diffuser
111:第一梯部 111: The first ladder
112:第二梯部 112: second ladder
113:第三梯部 113: The third ladder
114:第四梯部 114: fourth ladder
115:第五梯部 115: Fifth Ladder
12:第二表面 12: second surface
2:氣體通孔 2: Gas through hole
21:直條孔 21: Straight hole
22:喇叭孔 22: Horn hole
d2:孔徑 d2: Aperture
d3:孔徑 d3: Aperture
d4:高度 d4: height
d5:角度 d5: angle
d6:高度差 d6: height difference
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2020
- 2020-09-09 TW TW109211793U patent/TWM608362U/en unknown
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