TWI764270B - Gas diffuser applicable to chemical vapor deposition - Google Patents
Gas diffuser applicable to chemical vapor depositionInfo
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- TWI764270B TWI764270B TW109130924A TW109130924A TWI764270B TW I764270 B TWI764270 B TW I764270B TW 109130924 A TW109130924 A TW 109130924A TW 109130924 A TW109130924 A TW 109130924A TW I764270 B TWI764270 B TW I764270B
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Abstract
Description
本發明是有關一種氣體擴散裝置,特別是指一種適用於化學氣相沉積的氣體擴散裝置。The present invention relates to a gas diffusion device, in particular to a gas diffusion device suitable for chemical vapor deposition.
高溫化學氣相沉積(CVD)製程廣泛地使用在半導體產業中。基材鍍膜製程之良率及質量取決於基材薄膜沉積均勻性,而薄膜厚度均勻性又受鍍膜反應氣體散佈於反應腔室影響,其中,化學氣相沉積設備設有氣體擴散板,該氣體擴散板位於該反應腔室中,用以分散鍍膜反應氣體氣流,使該鍍膜氣體平均散佈在該反應腔室中,以沉降至欲鍍膜基材,達到均勻鍍膜。High temperature chemical vapor deposition (CVD) processes are widely used in the semiconductor industry. The yield and quality of the substrate coating process depend on the deposition uniformity of the substrate film, and the film thickness uniformity is affected by the coating reaction gas dispersed in the reaction chamber. The chemical vapor deposition equipment is equipped with a gas diffusion plate, the gas The diffusion plate is located in the reaction chamber and is used for dispersing the gas flow of the coating reaction gas, so that the coating gas is evenly distributed in the reaction chamber to settle to the substrate to be coated to achieve uniform coating.
台灣發明專利第I283437號一種「氣體分佈噴頭」,提及用於半導體製程之氣體分佈噴頭,特徵為一具有細長溝槽或通道型式氣體出口的面板。透過噴頭相對地靠近晶圓之設計,以增加靠近晶圓邊緣之處理氣流,而面板之邊緣部份相對於面板之中心部份較低凹,然而,在晶圓邊緣增加之質量流可能會增加沉積材料之邊緣厚度,致使中間位置薄膜厚度較薄,反而影響鍍膜之均勻性。再者,習知的氣體分佈面板之邊緣相對於面板之中心低凹的非平面結構,會衍生精準度差與加工困難之缺失,而須加以改善。Taiwan Invention Patent No. I283437 is a "gas distribution showerhead", which refers to a gas distribution showerhead for semiconductor process, which is characterized by a panel with an elongated groove or channel-type gas outlet. The design of the showerheads relatively close to the wafer increases process airflow near the edge of the wafer, and the edge portion of the panel is less concave relative to the center portion of the panel, however, increased mass flow at the wafer edge may increase The edge thickness of the deposited material results in a thinner film thickness in the middle, which affects the uniformity of the coating. Furthermore, the conventional non-planar structure in which the edge of the gas distribution panel is concave relative to the center of the panel results in poor accuracy and machining difficulties, and needs to be improved.
上述缺點都顯現習知基材薄膜所衍生的種種問題,據此,為了提升氣體散佈於化學氣相沉積設備之反應腔室的程度,增進薄膜厚度均勻性,改善鍍膜製程良率及品質,前述習知氣體擴散板確實有加以改善之必要。The above-mentioned disadvantages all present various problems derived from the conventional substrate film. Accordingly, in order to increase the degree of gas distribution in the reaction chamber of the chemical vapor deposition equipment, improve the uniformity of film thickness, and improve the yield and quality of the coating process, the aforementioned conventional The gas diffusion plate does need to be improved.
本發明之目的,係提供一種適用於化學氣相沉積的氣體擴散裝置,包含一擴散盤,及複數氣體通孔。The purpose of the present invention is to provide a gas diffusion device suitable for chemical vapor deposition, comprising a diffusion plate and a plurality of gas through holes.
該擴散盤包括一第一表面,及一與該第一表面相反之第二表面,該第一表面為一自該擴散盤圓心向圓周逐漸升高的階梯狀結構,而該第二表面為一平面結構,該複數氣體通孔貫穿該擴散盤設置。The diffuser includes a first surface and a second surface opposite to the first surface, the first surface is a stepped structure gradually rising from the center of the diffuser to the circumference, and the second surface is a In a planar structure, the plurality of gas through holes are arranged through the diffusion plate.
較佳地,該第一表面具有一第一梯部、一環繞該第一梯部設置之第二梯部、一環繞該第二梯部設置之第三梯部、一環繞該第三梯部設置之第四梯部,及一環繞該第四梯部設置之第五梯部,且該第一梯部靠近該擴散盤之圓心設置,而該第五梯部靠近該擴散盤之圓周設置。Preferably, the first surface has a first stepped portion, a second stepped portion disposed around the first stepped portion, a third stepped portion disposed around the second stepped portion, and a third stepped portion disposed around the second stepped portion A fourth stepped portion is provided, and a fifth stepped portion is provided around the fourth stepped portion, and the first stepped portion is disposed near the center of the diffuser plate, and the fifth stepped portion is disposed near the circumference of the diffuser plate.
較佳地,該複數氣體通孔之孔型截面結構為一直條孔,而該直條孔的孔徑為0.1~10 mm 。Preferably, the hole-shaped cross-sectional structure of the plurality of gas through holes is a straight hole, and the diameter of the straight hole is 0.1-10 mm.
較佳地,各相鄰之梯部間的高度差相同。Preferably, the height difference between adjacent steps is the same.
較佳地, 該複數氣體通孔之孔型截面結構為一直條孔連接一向外擴張的喇叭孔,且向外擴張的喇叭孔結構靠近該第二表面。Preferably, the hole-shaped cross-sectional structure of the plurality of gas through holes is a straight hole connected to an outwardly expanding horn hole, and the outwardly expanding horn hole structure is close to the second surface.
較佳地,該直條孔的孔徑為0.1~10mm,該喇叭孔的孔徑為1.5~5mm 。Preferably, the diameter of the straight hole is 0.1-10 mm, and the diameter of the horn hole is 1.5-5 mm.
較佳地,該喇叭孔的高度為1~5mm,該喇叭孔向外擴張的傾斜角度為30°~90°。Preferably, the height of the horn hole is 1~5mm, and the inclination angle of the horn hole expanding outward is 30°~90°.
較佳地,該第一梯部與該第二梯部的高度差為1~5mm,該第二梯部與該第三梯部的高度差為0.5~3mm,該第三梯部與該第四梯部的高度差為0.5~3mm,該第四梯部與該第五梯部的高度差為0.5~3mm。Preferably, the height difference between the first step and the second step is 1-5mm, the height difference between the second step and the third step is 0.5-3mm, and the third step and the third step are 0.5-3mm. The height difference of the four stepped parts is 0.5-3 mm, and the height difference between the fourth stepped part and the fifth stepped part is 0.5-3 mm.
較佳地,各相鄰之梯部間的直徑差相同。Preferably, the diameter difference between adjacent stepped portions is the same.
較佳地,該氣體通孔位於該擴散盤上的設置密度為每平方公分6~10個。Preferably, the density of the gas through holes on the diffusion plate is 6-10 per square centimeter.
本發明之有益功效在於,藉由該第一表面為自該擴散盤圓心向圓周逐漸升高的階梯狀結構,結合該直條孔連接向外擴張的喇叭孔設計,且該喇叭孔位於同一平面上,將氣體框圍在該複數氣體通孔中,避免氣體於抽氣過程因密集度不足而提早擴散被提早抽離,解決靠近該擴散盤之圓心的氣體氛圍不足之問題,且可減緩氣體向下流動速度使其向內擠壓,補足中間流速較慢之問題,使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤之圓心的氣體通孔流速,以達氣體均勻鍍膜之功效。The beneficial effect of the present invention is that the first surface is a stepped structure that gradually rises from the center of the diffuser disk to the circumference, combined with the design of the straight hole connected to the flared hole that expands outward, and the flared hole is located on the same plane On the other hand, the gas frame is surrounded by the plurality of gas through holes, so as to avoid the early diffusion of the gas due to insufficient density during the gas extraction process, and to solve the problem of insufficient gas atmosphere near the center of the diffusion plate, and can slow down the gas The downward flow speed makes it squeeze inward, making up for the problem of slow flow velocity in the middle, increasing the gas density and forming the effect of a gas curtain, thereby increasing the flow velocity of the gas through holes near the center of the diffuser plate, so as to achieve uniform gas coating. effect.
有關本發明之相關申請專利特色與技術內容,在以下配合參考圖式之較佳實施例的詳細說明中,將可清楚的呈現。The features and technical contents of the relevant patent applications of the present invention will be clearly presented in the following detailed description of the preferred embodiments with reference to the drawings.
參閱圖1、2,及3,為本發明適用於化學氣相沉積的氣體擴散裝置之第一較佳實施例,其包含一擴散盤1,及複數氣體通孔2。本發明可用於8、12吋的wafer。Referring to FIGS. 1 , 2 , and 3 , it is a first preferred embodiment of a gas diffusion device suitable for chemical vapor deposition according to the present invention, which includes a
該擴散盤1包括一第一表面11,及一與該第一表面11相反之第二表面12,該第一表面11為一自該擴散盤1圓心向圓周逐漸升高的階梯狀結構,而該第二表面12為一平面結構。The
其中,該第一表面11具有一第一梯部111、一環繞該第一梯部111設置之第二梯部112、一環繞該第二梯部112設置之第三梯部113、一環繞該第三梯部113設置之第四梯部114,及一環繞該第四梯部114設置之第五梯部115,且該第一梯部111靠近該擴散盤1之圓心設置,而該第五梯部115靠近該擴散盤1之圓周設置。The
於此,各相鄰之梯部間的高度差相同。進一步地,該第一梯部111與該第二梯部112的高度差d1為1~5mm,該第二梯部112與該第三梯部113的高度差d1為1~5mm,該第三梯部113與該第四梯部114的高度差d1為1~5mm,該第四梯部114與該第五梯部115的高度差d1為1~5mm。Here, the height difference between the adjacent steps is the same. Further, the height difference d1 between the
該複數氣體通孔2貫穿該擴散盤1設置,該氣體通孔2位於該擴散盤1上的設置密度為每平方公分6~10個,於此,該氣體通孔2的密度約32孔/5.32cm2
。氣體是由該第一表面11進入並自該第二表面12向外流動。實際實施時,該擴散盤1上方設置有一遮蔽板(圖未示出),且該遮蔽板上開設有複數開口,氣體經由該遮蔽板之開口流至該複數氣體通孔2。The plurality of gas through
在該第一較佳實施例中,該複數氣體通孔2之孔型截面結構為一直條孔21,而該直條孔21的孔徑d2為0.1~10 mm ,相鄰之直條孔21的孔徑d2間距為3~10mm。位於該第一梯部111的直條孔21最短,位於該第五梯部115的直條孔21最長。In the first preferred embodiment, the hole-shaped cross-sectional structure of the plurality of gas through
參閱圖4、5,為本發明之第二較佳實施例,與該第一較佳實施例大致相同,相同之處於此不再贅述,不同之處在於,該複數氣體通孔2之孔型截面結構為一直條孔21連接一向外擴張的喇叭孔22,且向外擴張的喇叭孔22結構靠近該第二表面12。Referring to FIGS. 4 and 5 , it is a second preferred embodiment of the present invention, which is substantially the same as the first preferred embodiment, and the similarities will not be repeated here. The difference lies in the hole patterns of the plurality of gas through
實際實施時,該喇叭孔22是位於平面結構的第二表面12上,具有加工簡單與提升精準度之功效。In actual implementation, the
於此,該直條孔21的孔徑d2為0.1~10 mm ,該喇叭孔21的孔徑d3為1.5~5mm。該喇叭孔21的高度d4為1~5mm,該喇叭21孔向外擴張的傾斜角度d5為30°~90°。Here, the diameter d2 of the
設置於靠近該擴散盤1之圓心的第一梯部111上的直條孔21,其流速較靠近該擴散盤1之圓周的第五梯部115上的直條孔21短,而可更快速的到達欲鍍膜基材。The flow velocity of the
其中,該第一梯部111與該第二梯部112的高度差d6為1~5mm ,該第二梯部112與該第三梯部113的高度差d6為0.5~3mm ,該第三梯部113與該第四梯部114的高度差d6為0.5~3mm ,該第四梯部114與該第五梯部115的高度差d6為0.5~3mm。Wherein, the height difference d6 between the
再者,各相鄰之梯部間的直徑差相同。於此,該第一梯部111的直徑d7為60~75mm,該第二梯部112的直徑d7為100~115mm,該第三梯部113的直徑d7為140~155mm,該第四梯部114的直徑d7為180~195mm,該第五梯部115的直徑d7為220~235mm,各相鄰之梯部間的直徑差為40mm。Furthermore, the diameter difference between the adjacent stepped portions is the same. Here, the diameter d7 of the first
透過該第一表面11為自該擴散盤1圓心向圓周逐漸升高的階梯狀結構,結合該直條孔21連接向外擴張的喇叭孔22設計,且該喇叭孔22位於同一平面上,將氣體框圍在該複數氣體通孔2中,避免氣體於抽氣過程因密集度不足而提早擴散被提早抽離,解決靠近該擴散盤1之圓心的氣體氛圍不足之問題。且可減緩氣體向下流動速度使其向內擠壓,補足中間流速較慢之問題,使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤1之圓心的氣體通孔2流速。Through the
參閱圖6,為該第二較佳實施例的氣體擴散裝置之截面流速圖,圖中數字的單位為氣體流速(m/s),由氣體模擬圖可得知,藉由該複數氣體通孔2之孔型截面結構為該直條孔21與該喇叭孔22之組合,其氣體平均分佈,藉以提升氣體鍍膜之均勻性的目的。Referring to FIG. 6, it is a cross-sectional flow velocity diagram of the gas diffusion device of the second preferred embodiment. The unit of the numbers in the figure is the gas flow velocity (m/s). It can be known from the gas simulation diagram that through the plurality of gas through holes The hole-shaped cross-sectional structure of 2 is the combination of the
綜上所述,本發明適用於化學氣相沉積的氣體擴散裝置,藉由該擴散盤1,及該複數氣體通孔2間相互設置,透過該第一表面11為自該擴散盤1圓心向圓周逐漸升高的階梯狀結構,結合該直條孔21連接向外擴張的喇叭孔22設計,且該喇叭孔22位於同一平面上,將氣體框圍在該複數氣體通孔2中,且使氣體密集度提升並構成氣簾的效果,藉此提升靠近該擴散盤1之圓心的氣體通孔2流速,以達到氣體均勻鍍膜之功效,故確實可以達成本發明之目的。To sum up, the present invention is applicable to a gas diffusion device for chemical vapor deposition. The
惟以上所述者,僅為本發明之較佳實施例而已,當不能以此限定本發明實施之範圍,即大凡依本發明申請專利範圍及發明說明內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。However, the above are only preferred embodiments of the present invention, and should not limit the scope of the present invention, that is, any simple equivalent changes and modifications made according to the scope of the patent application of the present invention and the contents of the description of the invention, All still fall within the scope of the patent of the present invention.
1:擴散盤 11:第一表面 111:第一梯部 112:第二梯部 113:第三梯部 114:第四梯部 115:第五梯部 12:第二表面 2:氣體通孔 21:直條孔 22:喇叭孔 d1:高度差 d2:孔徑 d3:孔徑 d4:高度 d5:角度 d6:高度差 d7:直徑1: Diffusion disc 11: The first surface 111: The first ladder 112: Second ladder 113: The third ladder 114: Fourth ladder 115: Fifth ladder 12: Second surface 2: Gas through hole 21: Straight hole 22: Horn hole d1: height difference d2: aperture d3: aperture d4: height d5: angle d6: height difference d7: diameter
圖1是一立體示意圖,說明本發明適用於化學氣相沉積的氣體擴散裝置之第一較佳實施例; 圖2是一上視示意圖,說明該第一較佳實施例之另一視角態樣; 圖3是圖2的A-A剖面圖; 圖4是一上視示意圖,說明本發明適用於化學氣相沉積的氣體擴散裝置之第二較佳實施例; 圖5是圖4的C-C剖面圖;及 圖6是一示意圖,說明該第二較佳實施例中一擴散盤之氣體的截面流速分佈態樣。1 is a schematic perspective view illustrating a first preferred embodiment of a gas diffusion device suitable for chemical vapor deposition according to the present invention; FIG. 2 is a schematic top view illustrating another viewing angle of the first preferred embodiment; Fig. 3 is the A-A sectional view of Fig. 2; 4 is a schematic top view illustrating a second preferred embodiment of the gas diffusion device for chemical vapor deposition according to the present invention; Fig. 5 is the C-C sectional view of Fig. 4; and FIG. 6 is a schematic diagram illustrating the cross-sectional flow velocity distribution of gas in a diffuser plate in the second preferred embodiment.
1:擴散盤1: Diffusion disc
111:第一梯部111: The first ladder
112:第二梯部112: Second ladder
113:第三梯部113: The third ladder
114:第四梯部114: Fourth ladder
115:第五梯部115: Fifth ladder
12:第二表面12: Second surface
2:氣體通孔2: Gas through hole
21:直條孔21: Straight hole
22:喇叭孔22: Horn hole
d2:孔徑d2: aperture
d3:孔徑d3: aperture
d4:高度d4: height
d5:角度d5: angle
d6:高度差d6: height difference
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