TWM491942U - Crack detection mechanism - Google Patents

Crack detection mechanism Download PDF

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Publication number
TWM491942U
TWM491942U TW103214201U TW103214201U TWM491942U TW M491942 U TWM491942 U TW M491942U TW 103214201 U TW103214201 U TW 103214201U TW 103214201 U TW103214201 U TW 103214201U TW M491942 U TWM491942 U TW M491942U
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TW
Taiwan
Prior art keywords
driving device
rotating member
sensor
rupture
detecting mechanism
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Application number
TW103214201U
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Chinese (zh)
Inventor
Wen-Ming Liu
Wei-Yun Chen
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Grand Plastic Technology Corp
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Priority to TW103214201U priority Critical patent/TWM491942U/en
Publication of TWM491942U publication Critical patent/TWM491942U/en

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Description

破裂偵測機構Rupture detection mechanism

本創作在於提供一種破裂偵測機構,尤指一種可應用於板材(如玻璃、晶圓等)破裂狀態檢出的破裂偵測機構。The present invention provides a rupture detecting mechanism, and more particularly, a rupture detecting mechanism that can be applied to a rupture state of a board (such as glass, wafer, etc.).

按,現有的工業偵測機構,已知應用於基板或相關製程,業界僅止於對於靜態基板可於對位(Alignment)後,以四個固定式的光電感測器(Sensor)偵測基板的四個角落的完整性,或是以荷重元(Load Cell)重量變化比對的方式,以及電荷耦合元件(CCD,Charge-coupled Device)方式偵測物件狀態。According to the existing industrial detection mechanism, which is known to be applied to a substrate or a related process, the industry only detects the substrate with four fixed photo-sensing sensors after the alignment of the static substrate. The integrity of the four corners, or the load cell weight change comparison, and the Charge-coupled Device (CCD) method to detect the state of the object.

習知的晶圓(Wafer)通常可結合於一玻璃(Glass)上,以便利用該玻璃作載板進行相關製程。該晶圓及玻璃完成相關的製程後,可經過雷射剝離(Laser Debond)等方式分離玻璃及晶圓。然而玻璃及晶圓剝離後會有應力集中於邊緣呈不規則破裂的情形,需以破裂偵測機構檢出,以避免玻璃等載板破裂影響晶圓造成客戶損失,然而目前業界內並無任何應用於玻璃及晶圓破裂檢測的適用裝置。Conventional wafers (wafer) can usually be bonded to a glass to use the glass as a carrier for related processes. After the wafer and glass are completed, the glass and wafer can be separated by laser debonding or the like. However, after the glass and the wafer are peeled off, there is a stress concentration on the edge of the irregular crack, which needs to be detected by the rupture detection mechanism to avoid the damage of the carrier such as glass and the wafer, causing customer losses. However, there is currently no industry in the industry. Applicable device for glass and wafer crack detection.

綜上所述,本創作人有感上述缺失可改善,乃特潛心研究並配合學理之應用,終於提出一種設計合理且有效改善上述缺失之創作。In summary, the creator feels that the above-mentioned deficiencies can be improved. He has devoted himself to research and cooperates with the application of academics, and finally proposes a design that is reasonable in design and effective in improving the above-mentioned deficiencies.

本創作所要解決的技術問題,在於提供一種破裂偵測機構,可用於板材(如玻璃、晶圓等)破裂狀態檢出,且可降低成本,並使偵測功能提升。The technical problem to be solved by the present invention is to provide a rupture detecting mechanism which can be used for detecting the rupture state of a board (such as glass, wafer, etc.), and can reduce the cost and improve the detection function.

為了解決上述的技術問題,本創作提供一種破裂偵測機構,包括:一轉動件;至少一感測器,該至少一感測器設置於該轉動件上;以及一第一驅動裝置,該轉動件連接於該第一驅動裝置,該第一驅動裝置能驅動該轉動件轉動。In order to solve the above technical problem, the present invention provides a rupture detecting mechanism, comprising: a rotating member; at least one sensor, the at least one sensor is disposed on the rotating member; and a first driving device, the rotating The piece is coupled to the first driving device, and the first driving device can drive the rotating member to rotate.

為了解決上述的技術問題,本創作另提供一種破裂偵測機構,應用於玻璃及晶圓剝離後破裂狀態的檢出,該玻璃及該晶圓之間定義為一檢測位置,該破裂偵測機構包括:一轉動件;至少一感測器,該至少一感測器設置於該轉動件上;一第一驅動裝置,該轉動件連接於該第一驅動裝置,該第一驅動裝置能驅動該轉動件轉動;以及該轉動件、該至少一感測器及該第一驅動裝置能移入及移出該檢測位置。In order to solve the above technical problems, the present invention further provides a rupture detecting mechanism for detecting the rupture state of the glass and the wafer after peeling, wherein the glass and the wafer are defined as a detecting position, and the rupture detecting mechanism The device includes: a rotating member; at least one sensor, the at least one sensor is disposed on the rotating member; a first driving device, the rotating member is coupled to the first driving device, and the first driving device can drive the The rotating member rotates; and the rotating member, the at least one sensor and the first driving device can move into and out of the detecting position.

較佳的,進一步包括一第二驅動裝置,該第一驅動裝置連接於該第二驅動裝置,通過該第二驅動裝置驅動該轉動件、該至少一感測器及該第一驅動裝置移入及移出該檢測位置。Preferably, the second driving device is further connected to the second driving device, and the rotating device, the at least one sensor and the first driving device are driven by the second driving device. Remove the detection location.

本創作至少具有下列的優點:This creation has at least the following advantages:

本創作的破裂偵測機構包括轉動件、感測器及第一驅動裝置。該第一驅動裝置可驅動轉動件轉動,使得感測器可以隨著轉動件同步轉動,感測器可沿著圓形的偵測線移動,以達到全面性偵測的效果,可以大幅降低成本,並使偵測功能提升。The rupture detecting mechanism of the present invention includes a rotating member, a sensor and a first driving device. The first driving device can drive the rotating member to rotate, so that the sensor can rotate synchronously with the rotating member, and the sensor can move along the circular detecting line to achieve comprehensive detection effect, which can greatly reduce the cost. And improve the detection function.

本創作的破裂偵測機構檢出板材破裂時,可以及時機台警告,以避免玻璃等板材破裂影響晶圓造成客戶損失。When the rupture detection mechanism of the present invention detects the rupture of the sheet, the machine can be warned in time to avoid the loss of the glass and other plates affecting the customer.

為使能更進一步瞭解本創作的特徵及技術內容,請參閱以下有關本創作的詳細說明與附圖,然而所附圖式僅提供參考與說明用,並非用來對本創作加以限制者。In order to further understand the features and technical contents of the present invention, please refer to the following detailed description and drawings of the present invention. However, the drawings are only for reference and description, and are not intended to limit the creation.

1‧‧‧玻璃1‧‧‧glass

2‧‧‧晶圓2‧‧‧ wafer

3‧‧‧夾具3‧‧‧Clamp

4‧‧‧拔取機構4‧‧‧ extraction agency

5‧‧‧轉動件5‧‧‧Rotating parts

6‧‧‧感測器6‧‧‧ sensor

61‧‧‧偵測線61‧‧‧Detection line

7‧‧‧第一驅動裝置7‧‧‧First drive

8‧‧‧第二驅動裝置8‧‧‧Second drive

100‧‧‧破裂偵測機構100‧‧‧Break detection mechanism

圖1為本創作破裂偵測機構的前視示意圖。FIG. 1 is a front view of the creation of a rupture detecting mechanism.

圖2為本創作破裂偵測機構的俯視示意圖。FIG. 2 is a top plan view of the creation rupture detecting mechanism.

請參閱圖1,為本創作破裂偵測機構的前視示意圖。本創作提供一種破裂偵測機構,可應用於板材破裂狀態的檢出,該板材的類型並不限制,例如可為玻璃、晶圓、載板等各種板狀材料。在本實施例中,該破裂偵測機構100應用於玻璃1及晶圓2剝離後破裂狀態的檢出。該晶圓2置於一夾具3上,該夾具3可將晶圓2夾持固定。該晶圓2原先結合於玻璃1上,如圖1所示的方向,該晶圓2的頂面原先結合於玻璃1的底面,以便利用玻璃1作為載板承載晶圓2進行相關的製程。當玻璃1及晶圓2欲分離時,則可利用一拔取機構4利用負壓方式將玻璃1吸附固定,進而以雷射剝離或藥劑剝離等方式分離玻璃1及晶圓2,由於玻璃1及晶圓2的剝離方式屬於習知技術,且非本創作申請專利的重點,故不再予以贅述。Please refer to FIG. 1 , which is a front view of the creation of a rupture detecting mechanism. The present invention provides a rupture detecting mechanism which can be applied to the detection of a broken state of a sheet. The type of the sheet is not limited, and may be, for example, various slab materials such as glass, wafer, and carrier. In the present embodiment, the rupture detecting mechanism 100 is applied to the detection of the ruptured state of the glass 1 and the wafer 2 after peeling. The wafer 2 is placed on a jig 3 which holds the wafer 2 in place. The wafer 2 is originally bonded to the glass 1 in the direction shown in FIG. 1. The top surface of the wafer 2 is originally bonded to the bottom surface of the glass 1 so as to carry the wafer 2 using the glass 1 as a carrier to perform the related process. When the glass 1 and the wafer 2 are to be separated, the glass 1 can be adsorbed and fixed by a pick-up mechanism 4 by a negative pressure method, and the glass 1 and the wafer 2 can be separated by laser peeling or chemical peeling, etc., due to the glass 1 and The stripping method of the wafer 2 belongs to the prior art, and is not the focus of the patent application, and therefore will not be described again.

該破裂偵測機構100包括一轉動件5、至少一感測器6及一第一驅動裝置7。該轉動件5大致呈板狀體,其形狀並不限制,例如可呈長條形或圓形等形狀,在本實施例中揭示該轉動件5呈長條形。該轉動件5可移動至欲進行破裂狀態檢出的板材的上方或下方處(定義為一檢測位置),在本實施例中該轉動件5可以移動至玻璃1及晶圓2之間(檢測位置),該破裂偵測機構100可用於檢測玻璃1的破裂狀態,當然也可用於檢測晶圓2的破裂狀態,使其具有上、下破裂檢出的功能。惟,該板材的檢測位置並不限制,例如該檢測位置也可位於玻璃1的上方或晶圓2的下方,只要該破裂偵測機構100移至鄰近該板材的一面處,即可用於該板材的破裂檢測,惟該破裂偵測機構100的設置不能影響玻璃1及晶圓2 的正常運作。The rupture detecting mechanism 100 includes a rotating member 5, at least one sensor 6 and a first driving device 7. The rotating member 5 is substantially a plate-like body, and its shape is not limited, and may be, for example, an elongated shape or a circular shape. In the present embodiment, the rotating member 5 is elongated. The rotating member 5 can be moved to above or below the plate to be detected in the rupture state (defined as a detecting position). In the embodiment, the rotating member 5 can be moved between the glass 1 and the wafer 2 (detection) The rupture detecting mechanism 100 can be used to detect the rupture state of the glass 1, and can of course be used to detect the rupture state of the wafer 2 so as to have the function of detecting the upper and lower ruptures. However, the detection position of the sheet is not limited. For example, the detection position may be located above the glass 1 or below the wafer 2. As long as the rupture detecting mechanism 100 is moved to a side adjacent to the sheet, the sheet can be used for the sheet. Rupture detection, but the setting of the rupture detecting mechanism 100 cannot affect the glass 1 and the wafer 2 The normal operation.

該感測器6設置的數量並不限制,例如可為一個、兩個或數個等,所述感測器6設置於轉動件5上,使得感測器6可以隨著轉動件5同步轉動。所述感測器6的類型並不限制,可因應需要適當的加以變化,較佳但不限制為光感測器或影像感測器等,所述感測器6可為一種非接觸式感測器。所述感測器6設置的位置並不限制,所述感測器6可設置於該轉動件5的中間、一端、兩端或其他適當的位置。The number of the sensors 6 is not limited, and may be, for example, one, two or several, etc., the sensor 6 is disposed on the rotating member 5, so that the sensor 6 can rotate synchronously with the rotating member 5. . The type of the sensor 6 is not limited, and may be appropriately changed according to needs, preferably but not limited to a photo sensor or an image sensor, etc., and the sensor 6 may be a non-contact type. Detector. The position where the sensor 6 is disposed is not limited, and the sensor 6 may be disposed at the middle, one end, both ends or other suitable positions of the rotating member 5.

該第一驅動裝置7可為氣缸(如旋轉氣缸)或馬達(如伺服馬達)等轉動裝置,該轉動件5連接於第一驅動裝置7,亦即該轉動件5連接於第一驅動裝置7的動力輸出軸,該第一驅動裝置7可用以驅動轉動件5轉動,使得感測器6可以隨著轉動件5同步轉動,以達到全面性偵測的效果。當轉動件5轉動時即可帶動感測器6沿著圓形的偵測線61移動(如圖2所示)。惟,轉動件5轉動的角度並不限制,例如可以是180度或360度等,該轉動件5轉動的角度可隨需要予以變化。The first driving device 7 can be a rotating device such as a cylinder (such as a rotating cylinder) or a motor (such as a servo motor). The rotating member 5 is connected to the first driving device 7, that is, the rotating member 5 is connected to the first driving device 7. The power output shaft, the first driving device 7 can be used to drive the rotating member 5 to rotate, so that the sensor 6 can rotate synchronously with the rotating member 5 to achieve the comprehensive detection effect. When the rotating member 5 rotates, the sensor 6 can be moved along the circular detecting line 61 (as shown in FIG. 2). However, the angle at which the rotating member 5 rotates is not limited, and may be, for example, 180 degrees or 360 degrees, and the angle at which the rotating member 5 rotates may be changed as needed.

在本實施例中轉動件5、感測器6及第一驅動裝置7採用可移動方式的設置,該轉動件5、感測器6及第一驅動裝置7能移入或移出玻璃1及晶圓2之間(檢測位置)。具體而言,本創作的破裂偵測機構100還可以進一步包括一第二驅動裝置8,該第二驅動裝置8可為氣缸、馬達等裝置,該第一驅動裝置7適當的連接於第二驅動裝置8,以便利用該第二驅動裝置8驅動轉動件5、感測器6及第一驅動裝置7移入檢測位置,且在檢測完成後移出檢測位置。在本實施例中該第二驅動裝置8為一滑軌氣缸,該第二驅動裝置8可驅動轉動件5、感測器6及第一驅動裝置7以直線往復運動的方式水平的移入、移出檢測位置。In the embodiment, the rotating member 5, the sensor 6 and the first driving device 7 are arranged in a movable manner, and the rotating member 5, the sensor 6 and the first driving device 7 can move into or out of the glass 1 and the wafer. Between 2 (detection position). Specifically, the rupture detecting mechanism 100 of the present invention may further include a second driving device 8, which may be a cylinder, a motor, etc., and the first driving device 7 is appropriately connected to the second driving device. The device 8 is used to drive the rotating member 5, the sensor 6 and the first driving device 7 to move into the detecting position by the second driving device 8, and to remove the detecting position after the detection is completed. In this embodiment, the second driving device 8 is a slide cylinder, and the second driving device 8 can drive the rotating member 5, the sensor 6 and the first driving device 7 to move horizontally in and out in a linear reciprocating manner. Detection location.

上述第二驅動裝置8驅動轉動件5、感測器6及第一驅動裝置7移動的方式並不限制,例如該第二驅動裝置8也可以驅動轉動件 5、感測器6及第一驅動裝置7以擺動、轉動或升降等各種方式移入、移出檢測位置。惟,由於利用驅動裝置驅動構件移動的構造屬於習知技術,且本創作並不限制第二驅動裝置8的構造,故不再予以贅述。The manner in which the second driving device 8 drives the rotating member 5, the sensor 6 and the first driving device 7 is not limited. For example, the second driving device 8 can also drive the rotating member. 5. The sensor 6 and the first driving device 7 are moved in and out of the detecting position by various means such as swinging, rotating or lifting. However, since the configuration in which the driving member is moved by the driving device is a conventional technique, and the present creation does not limit the configuration of the second driving device 8, it will not be described again.

另,轉動件5、感測器6及第一驅動裝置7在移動時,也可以搭配適當的滑軌、滑座或線性軸承等導引,使各構件得以穩定的動作。另,也可以設有適當的感測器予以偵測定位,使各構件可以準確的到達定位。In addition, when the rotating member 5, the sensor 6 and the first driving device 7 are moved, they can also be guided with appropriate slide rails, slides or linear bearings to make the components stably operate. In addition, an appropriate sensor can be provided to detect and position, so that each component can accurately reach the positioning.

請參閱圖2,為本創作破裂偵測機構的俯視示意圖。該第一驅動裝置7(如圖1所示)可用以驅動轉動件5轉動,使得感測器6可以隨著轉動件5同步轉動,感測器6可沿著圓形的偵測線61移動,以達到全面性偵測的效果,可以大幅降低成本,並使偵測功能提升。本創作破裂偵測機構100可加掛於單晶片機台應用,可用於任一局部破裂檢出、任一角對折破裂檢出及粉碎破裂檢出等,以便及時機台警告,避免玻璃等板材破裂影響晶圓造成客戶損失。Please refer to FIG. 2 , which is a schematic top view of the creation of the rupture detecting mechanism. The first driving device 7 (shown in FIG. 1) can be used to drive the rotating member 5 to rotate, so that the sensor 6 can rotate synchronously with the rotating member 5, and the sensor 6 can move along the circular detecting line 61. In order to achieve comprehensive detection, the cost can be greatly reduced and the detection function can be improved. The creation rupture detecting mechanism 100 can be attached to a single-chip machine application, and can be used for any partial rupture detection, detection of any corner rupture rupture and pulverization rupture detection, etc., so as to timely warn the machine and avoid cracking of glass and the like. Affecting wafers causes customer losses.

惟以上所述僅為本創作之較佳實施例,非意欲侷限本創作的專利保護範圍,故舉凡運用本創作說明書及圖式內容所為的等效變化,均同理皆包含於本創作的權利保護範圍內,合予陳明。However, the above description is only the preferred embodiment of the present invention, and it is not intended to limit the scope of patent protection of this creation. Therefore, the equivalent changes made by using this creation specification and the contents of the schema are all included in the right of this creation. Within the scope of protection, it is given to Chen Ming.

1‧‧‧玻璃1‧‧‧glass

2‧‧‧晶圓2‧‧‧ wafer

3‧‧‧夾具3‧‧‧Clamp

4‧‧‧拔取機構4‧‧‧ extraction agency

5‧‧‧轉動件5‧‧‧Rotating parts

6‧‧‧感測器6‧‧‧ sensor

7‧‧‧第一驅動裝置7‧‧‧First drive

8‧‧‧第二驅動裝置8‧‧‧Second drive

100‧‧‧破裂偵測機構100‧‧‧Break detection mechanism

Claims (11)

一種破裂偵測機構,包括:一轉動件;至少一感測器,該至少一感測器設置於該轉動件上;以及一第一驅動裝置,該轉動件連接於該第一驅動裝置,該第一驅動裝置能驅動該轉動件轉動。A rupture detecting mechanism includes: a rotating member; at least one sensor, the at least one sensor is disposed on the rotating member; and a first driving device, the rotating member is coupled to the first driving device, The first driving device can drive the rotating member to rotate. 如請求項1所述之破裂偵測機構,其中該轉動件、該至少一感測器及該第一驅動裝置能移入及移出一檢測位置。The rupture detecting mechanism of claim 1, wherein the rotating member, the at least one sensor, and the first driving device are movable into and out of a detecting position. 如請求項2所述之破裂偵測機構,其中進一步包括一第二驅動裝置,該第一驅動裝置連接於該第二驅動裝置,通過該第二驅動裝置驅動該轉動件、該至少一感測器及該第一驅動裝置移入及移出該檢測位置。The rupture detecting mechanism of claim 2, further comprising a second driving device coupled to the second driving device, wherein the rotating member is driven by the second driving device, the at least one sensing And the first driving device moves into and out of the detecting position. 如請求項3所述之破裂偵測機構,其中該第二驅動裝置為氣缸或馬達。The rupture detecting mechanism of claim 3, wherein the second driving device is a cylinder or a motor. 如請求項1所述之破裂偵測機構,其中該至少一感測器為非接觸式感測器。The rupture detecting mechanism of claim 1, wherein the at least one sensor is a non-contact sensor. 如請求項1所述之破裂偵測機構,其中該第一驅動裝置為氣缸或馬達。The rupture detecting mechanism of claim 1, wherein the first driving device is a cylinder or a motor. 一種破裂偵測機構,應用於玻璃及晶圓剝離後破裂狀態的檢出,該玻璃及該晶圓之間定義為一檢測位置,該破裂偵測機構包括:一轉動件;至少一感測器,該至少一感測器設置於該轉動件上;一第一驅動裝置,該轉動件連接於該第一驅動裝置,該第一驅動裝置能驅動該轉動件轉動;以及該轉動件、該至少一感測器及該第一驅動裝置能移入及移出該檢測位置。A rupture detecting mechanism is applied to detect the rupture state of the glass and the wafer after peeling, and the glass and the wafer are defined as a detecting position, and the rupture detecting mechanism comprises: a rotating member; at least one sensor The at least one sensor is disposed on the rotating member; a first driving device is coupled to the first driving device, the first driving device can drive the rotating member to rotate; and the rotating member, the at least the rotating member A sensor and the first driving device can move into and out of the detecting position. 如請求項7所述之破裂偵測機構,其中進一步包括一第二驅動裝置,該第一驅動裝置連接於該第二驅動裝置,通過該第二驅動裝置驅動該轉動件、該至少一感測器及該第一驅動裝置移入及移出該檢測位置。The rupture detecting mechanism of claim 7, further comprising a second driving device connected to the second driving device, wherein the rotating member is driven by the second driving device, the at least one sensing And the first driving device moves into and out of the detecting position. 如請求項8所述之破裂偵測機構,其中該第二驅動裝置為氣缸或馬達。The rupture detecting mechanism of claim 8, wherein the second driving device is a cylinder or a motor. 如請求項7所述之破裂偵測機構,其中該至少一感測器為非接觸式感測器。The rupture detecting mechanism of claim 7, wherein the at least one sensor is a non-contact sensor. 如請求項7所述之破裂偵測機構,其中該第一驅動裝置為氣缸或馬達。The rupture detecting mechanism of claim 7, wherein the first driving device is a cylinder or a motor.
TW103214201U 2014-08-08 2014-08-08 Crack detection mechanism TWM491942U (en)

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