TWM394461U - Test tool - Google Patents

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Publication number
TWM394461U
TWM394461U TW99215574U TW99215574U TWM394461U TW M394461 U TWM394461 U TW M394461U TW 99215574 U TW99215574 U TW 99215574U TW 99215574 U TW99215574 U TW 99215574U TW M394461 U TWM394461 U TW M394461U
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TW
Taiwan
Prior art keywords
groove
bottom plate
limiting
floating plate
test fixture
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Application number
TW99215574U
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Chinese (zh)
Inventor
Ru-Fu Li
Original Assignee
Ru-Fu Li
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Ru-Fu Li filed Critical Ru-Fu Li
Priority to TW99215574U priority Critical patent/TWM394461U/en
Publication of TWM394461U publication Critical patent/TWM394461U/en

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Description

M394461 五、新型說明: 【新型所屬之技術領域】 . 一種測試治具,尤指用以測試積體電路之測試治具。 【先前技術】 按’積體電路(1C)經封裝後’需要進行最後測試,透過最後 測試來確保產品的品質以及功能,而為了方便測試積體電路,生 產者皆會利用測試治具來加快速度,該測試治具主要是提供一座 • 體,並於座體内穿設導電端子,俾使積體電路置放於座體上時, 積體電路所延伸出之接腳可與導電端子呈電性連接,讓測試主機 可對積體電路進行相關測試,然而積體電路之接腳為非常的細 小’若積體電路在測試治具上產生過壓之情形時,接腳即會產生 損壞,因此测試治具之座體上皆會設置一限位塊,使積體電路置 放於座體上時’可定位定之高度,但由於積體電路之接腳種 類相虽的多’高度也長短不一,所以為了使測試治具可適用多種 i積體電路,定位塊大多會明定元件(如:螺絲)翻於座體上, 乂可利用替換定位塊讓測試治具測試不同之積體電路,但由於金 口疋元件會對積體電路產生電性干擾,容g導致測試不正確 —月V發:t再者’積體電路日趨輕薄短小’其整體厚度相當的 广”於1mm 2mm之間厚度的積體電路以為常見所以限位塊之 厚度也會介於lram〜2_之間,因賴定元件也無法有效的固定限 位塊。 β、要如何可使測試治具符合測試多種積體電路,即為從 3 M394461 事此相關業者所亟欲研發之課題。 【新型内容】 ' 本創作之主要目的乃在於,彻浮動板關電子元件在測試 •治具之座體内位移,使積體電路的各個腳位可以正確的與各個相 對應的探針接觸’且不使用固定元件麟動缺·座體,以使 浮動板可容易更換,並可翻試治具可測試多種積體電路。 為達上述目的,本創作係設置有座體及浮動板,該座體表面 籲凹設有容置空間’容置空間底面為具有底板,底板表面周緣間隔 穿設有複數限位孔,該浮動板係位於底板下方,而浮動板上下表 面分別設置有抵靠面及抵壓面,而抵靠面周緣凸設有相對於限位 孔之抵壓部,且抵壓部為穿過並露出於限位孔,並於抵壓面凹設 有谷置槽’且容置槽内設置有可使浮動板上下彈性位移之彈性體。 【實施方式】 請參閱第一圖至第四圖所示,由圖中可清楚看出,本創作係 • 設置有座體1及浮動板2,其中: • 該座體1表面凹設有容置空間11,容置空間11底面為具有底 板12 ’底板12之底面處凸設有凸部13,底板12表面周緣間隔穿 •設有複數限位孔15,限位孔15於底板12之底面處二側凹設有限 - 位槽丨6’且底板12表面於限位孔15之側方間隔設有複數凹槽14, 並於各凹槽14内設置有探針141,定位件17為設置於容置空間 11内’定位件17内係設置有定位槽π卜 該浮動板2上下表面分別設置有抵靠面22及抵壓面23,而抵 4 M394461 罪面&周緣凸設有相對於限位孔15之抵廢部24,抵壓面23凹設 有複數谷置槽231,且各容置槽231係分別位於抵|部24之下方, • 並於谷置槽231内設置有彈性體5,彈性體5可為膠條或彈簧,並 .使彈性體5之高度為高於容置槽231,且賴體5之二側末端形成 有限位。卩51,限位部51為橫向延伸出容置槽23丨,且該限位部w .之门度為與限位槽16相同,抵壓面23凸設有相對於通孔21之凸 部13。 • 當本創作於組構時,係先將定位件Π定位於容置空間u内, 再將浮動板2由座體1之底板12下方置人,使各抵壓部%為分 k並路出於限位孔15,此時底板12底面處所凹設之限位槽 為曰連通於谷置槽23卜而讓彈性體5二侧末端之限位部51定 位於限位槽16内,再將座體1定位於測試基板31上’即可完成 本創作之組構,由於限位部51之高度為與陳槽16相同,且彈 J·生體5之同度略為高於容置槽231,故接合後俾使浮動板2與座體 • 1產生高度差。 。月參閱第五圖至第六圖所示,由圖中可清楚看出,當本創作 於使用時’將座體i定位於測試機台3之測試基板31上,電子元 件4為會由測試機台3吸附並放置於容置空間n内使電子元件 4由定位槽m與抵壓部24導正,再對電子树4施壓,使電子 讀4將抵壓部24下壓,俾使抵壓部%將位於容置槽饥内之 彈性體5下壓,藉由容置槽231與彈性體5所產生之高度差,使 彈性體5因二侧之限位部51定位於限位槽16内產生固定,而讓 5 彈性體5於二限位部51之間產生變形,進而具有彈性復位能力, 除了k供浮動板2下沉之空間外,進而使電子元件4之接腳μ與 測試基板31接觸,以達剩試電子元件4良#之目的,因彈性體 5具彈性纏變形之舰,故測試後^需祕加於電子元件4之壓 力放開,彈性體5便會目雜復減力恢復原來之雜,進而帶 動夺動導正板喊驗;再者,當使用者欲更換具有不同高度之 抵壓部24的浮動板2時,只需將座體i由測試基板31上取下即 可進灯更換’轉朗者可料更換浮練2,進_試不同之電 子元件4。 再清參閱第七圖所示,由圖中可清楚看出,本創作之座體i 與定位件17亦可為—體成型之方式所製成。 請參閱第八圖及第九®所示,_巾可清楚看出,本創作係 設置有座體1及浮動板2,其中: 該座體1表面凹設有容置㈣Η,容置雜11底面為具有底 板12,底板12表面周緣間隔穿設有複數限位孔15,限位孔15於 底板12之底面處一侧凹設有缺槽151,而底板12表面間隔凹設有 複數第立槽121 ’且底板12表面於限位孔15之側方間隔設有 複數凹槽14,並於各凹槽U内設置有探針14卜定位件17為設 置於容置空間11内’定位件17内係設置有定位槽171。 該浮動板2上下表面分別設置有抵靠面22及抵壓面抵壓 面23周緣向下凸設有相對於限位孔15之定位部25,定位部25 末端一側橫向延伸有定位片25卜而抵壓面23凹設有相對第一定 M394461 位槽121之第二定位槽232。 田本創作於組構時,係先將膠條或彈簧所製成之彈性體5置 放於第一疋位槽121與第二定位槽232之間,再將浮動板2由座 體1之底板12上方置入’使各抵壓部24為分別穿過限位孔15, 而讓定位片251位於缺槽151内,再將座體1定位於測試基板31 -上,即可完成本創作之組構;再者,當使用者欲更換浮動板2時, •只需讓抵壓部24脫出缺槽151,即可將浮動板2由座體j内取出。 上’子動板2下壓時,會使第一定位槽121與第二定位槽 232之間之彈性體5下壓’進而具有彈性復位能力,而浮動板曰2 上升時,彈性體5便會因彈性復位能力恢復原來之形狀,進而帶 動浮動板2回復原位。 综上所述,因本創作可針對浮動板2快速更換,且不需使用 習知技射之固定元件進行定位,·可使職治制試多 同之電子元件,並可方便使用者使用。 釀 【圖式簡單說明】 -第一圖係為本創作之立體外觀圖。 第一圖係為本創作另側之立體外觀圖。 •第二圖係為本創作之立體分解圖。 第四圖係為本創作之侧視剖面圖。 第五圖係為本創作較佳實施例之側視剖面圖。 第六圖係為本創作再—較佳實施例之側視剖面圖。 苐七圖係為本創作再—立體外觀圖。 7 M394461 第八圖係為本創作又一較佳實施例之立體外觀圖。 第九圖係為本創作又一較佳實施例之立體局部剖面圖。 _ 【主要元件符號說明】 1、 座體 11、 容置空間 12、 底板 121、第一定位槽 φ 13、凸部 14、 凹槽 141、探針 15、 限位孔 151、缺槽 16、 限位槽 17、 定位件 φ 171、定位槽 2、 浮動板 • 21、通孔 . 22、抵靠面 23、抵壓面 231、 容置槽 232、 第二定位槽 M394461 24、 抵壓部 25、 定位部 251、定位片 * 3、測試機台 31、測試基板 φ 4、電子元件 41、接腳 5、彈性體 51、限位部M394461 V. New description: [New technical field] A test fixture, especially a test fixture used to test integrated circuits. [Prior Art] After the 'integrated circuit (1C) is packaged, 'the final test is required, and the final test is used to ensure the quality and function of the product. In order to facilitate the test of the integrated circuit, the manufacturer will use the test fixture to speed up. Speed, the test fixture is mainly provided with a body, and a conductive terminal is pierced in the body, so that when the integrated circuit is placed on the base, the extension of the integrated circuit can be connected with the conductive terminal Electrical connection allows the test host to perform related tests on the integrated circuit. However, the pin of the integrated circuit is very small. If the integrated circuit generates overvoltage on the test fixture, the pin will be damaged. Therefore, a limit block is set on the seat of the test fixture, so that the height of the integrated circuit can be positioned when the integrated circuit is placed on the base, but the height of the pin type of the integrated circuit is relatively high. In order to make the test fixture applicable to a variety of i-integrated circuits, most of the positioning blocks will be turned on the components (such as screws), and the replacement fixtures can be used to test the test fixtures. body Circuit, but because the gold port element will cause electrical interference to the integrated circuit, the capacity g causes the test to be incorrect - month V hair: t and then 'the integrated circuit is getting thinner and lighter and shorter 'the overall thickness is quite wide" at 1mm 2mm The thickness of the integrated circuit is common, so the thickness of the limit block will also be between lram~2_, because the singular component can not effectively fix the limit block. β, how to make the test fixture conform to the test A variety of integrated circuits, which is the subject of research and development from 3 M394461. [New content] 'The main purpose of this creation is to completely displace the electronic components in the test and fixture. So that the various pins of the integrated circuit can be properly contacted with the corresponding probes' and the fixed components are not used, so that the floating plate can be easily replaced, and the test fixture can be tested. In order to achieve the above purpose, the present invention is provided with a seat body and a floating plate, and the surface of the seat body is concavely provided with an accommodating space. The bottom surface of the accommodating space has a bottom plate, and the periphery of the bottom plate surface is provided with a plurality of limit spaces. hole, The floating plate is located under the bottom plate, and the lower surface of the floating plate is respectively provided with an abutting surface and an abutting surface, and a pressing portion of the abutting surface is protruded with respect to the limiting hole, and the pressing portion is passed through and exposed In the limiting hole, a valley groove is recessed in the pressing surface, and an elastic body capable of elastically displaceing the floating plate is disposed in the receiving groove. [Embodiment] Please refer to the first to fourth figures. It can be clearly seen from the figure that the creation system is provided with a seat body 1 and a floating plate 2, wherein: • the seat body 1 has a recessed surface for accommodating space 11, and the bottom surface of the accommodating space 11 has a bottom plate 12' A convex portion 13 is protruded from a bottom surface of the bottom surface of the bottom surface of the bottom plate 12, and a plurality of limiting holes 15 are formed in the bottom surface of the bottom plate 12. The limiting hole 15 is recessed on the bottom surface of the bottom plate 12 with a limit-position groove 丨6' and the bottom plate 12 A plurality of grooves 14 are disposed on the side of the limiting hole 15 , and a probe 141 is disposed in each of the grooves 14 . The positioning member 17 is disposed in the accommodating space 11 and is positioned in the positioning member 17 . The upper and lower surfaces of the floating plate 2 are respectively provided with an abutting surface 22 and an abutting surface 23, and the 4 M394461 sin surface & am The peripheral edge is convexly disposed with respect to the abutting portion 24 of the limiting hole 15, and the pressing surface 23 is recessed with a plurality of valley grooves 231, and each of the receiving grooves 231 is located below the abutting portion 24, respectively. An elastic body 5 is disposed in the valley groove 231. The elastic body 5 may be a rubber strip or a spring, and the height of the elastic body 5 is higher than that of the accommodating groove 231, and the two ends of the body 5 are formed into a limited position.卩51, the limiting portion 51 extends laterally out of the receiving groove 23丨, and the limiting portion w is the same as the limiting groove 16, and the pressing surface 23 is convexly disposed with respect to the convex portion of the through hole 21. 13. • When the creation is in the structure, the positioning member 先 is first positioned in the accommodating space u, and then the floating plate 2 is placed under the bottom plate 12 of the seat body 1 so that each pressing portion is divided into k and For the limiting hole 15, the limiting groove recessed at the bottom surface of the bottom plate 12 is connected to the valley groove 23, and the limiting portion 51 of the two ends of the elastic body 5 is positioned in the limiting groove 16, and then Positioning the base 1 on the test substrate 31 can complete the creation of the present invention. Since the height of the limiting portion 51 is the same as that of the groove 16 and the same degree of the elastic body J is slightly higher than that of the receiving groove 231, so after the joint, the floating plate 2 and the seat body 1 have a height difference. . Referring to the fifth to sixth figures, it can be clearly seen from the figure that when the present invention is used, the seat i is positioned on the test substrate 31 of the test machine 3, and the electronic component 4 is tested. The machine 3 is adsorbed and placed in the accommodating space n, so that the electronic component 4 is guided by the positioning groove m and the pressing portion 24, and then the electronic tree 4 is pressed, so that the electronic reading 4 presses the pressing portion 24, so that the electronic device 4 is pressed down. The pressing portion % presses the elastic body 5 located in the accommodating groove, and the height difference between the accommodating groove 231 and the elastic body 5 causes the elastic body 5 to be positioned at the limit by the limiting portion 51 on both sides. The fixing of the groove 16 is made, and the 5 elastic body 5 is deformed between the two limiting portions 51, thereby having an elastic restoring ability, and in addition to the space for the floating plate 2 to sink, the pin 4 of the electronic component 4 is further provided. Contact with the test substrate 31 to achieve the purpose of the remaining test electronic component 4, because the elastic body 5 has an elastically wrapped ship, so after the test, the pressure required to be applied to the electronic component 4 is released, and the elastic body 5 will Reducing the power to restore the original miscellaneous, and then driving the guide plate to call the test; in addition, when the user wants to replace the different heights When the floating plate 2 of the pressing portion 24 is pressed, the seat body i can be replaced by the test substrate 31, and the lamp can be replaced. The squirrel 2 can be replaced by the squirrel 2, and the different electronic components 4 can be tested. Referring to the seventh figure, it can be clearly seen from the figure that the seat i and the positioning member 17 of the present invention can also be formed by means of body molding. Please refer to Figure 8 and IX®, _ towel can clearly see that this creation is provided with a seat 1 and a floating plate 2, wherein: the surface of the body 1 is concavely provided with a receiving (four) Η, which accommodates 11 The bottom surface has a bottom plate 12, and a plurality of limiting holes 15 are formed in the periphery of the bottom surface of the bottom plate 12. The limiting holes 15 are recessed on the bottom surface of the bottom plate 12 with a notch 151, and the bottom surface of the bottom plate 12 is recessed with a plurality of first holes. The groove 121 ′ and the surface of the bottom plate 12 are spaced apart from the side of the limiting hole 15 to form a plurality of grooves 14 , and the probes 14 are disposed in the grooves U. The positioning member 17 is disposed in the accommodating space 11 . The positioning system 171 is provided in the interior of the 17th. The upper and lower surfaces of the floating plate 2 are respectively provided with abutting surface 22 and a peripheral portion of the abutting surface 23 of the pressing surface 23, and a positioning portion 25 is formed to protrude downwardly from the limiting hole 15 . The positioning portion 25 extends laterally on the end side of the positioning portion 25 . The pressing surface 23 is recessed with a second positioning groove 232 opposite to the first fixed M394461 slot 121. When the field is created in the structure, the elastic body 5 made of the rubber strip or the spring is placed between the first clamping groove 121 and the second positioning groove 232, and then the floating plate 2 is made of the seat body 1. The bottom plate 12 is placed with 'the respective pressing portions 24 are respectively passed through the limiting holes 15, and the positioning piece 251 is placed in the notch 151, and then the seat body 1 is positioned on the test substrate 31-, thereby completing the creation. Further, when the user wants to replace the floating plate 2, the floating plate 2 can be taken out from the seat body j by simply releasing the pressing portion 24 out of the notch 151. When the upper sub-plate 2 is pressed down, the elastic body 5 between the first positioning groove 121 and the second positioning groove 232 is pressed down to further have an elastic restoring ability, and when the floating plate 曰 2 is raised, the elastic body 5 is lifted. The original shape will be restored due to the elastic resetting ability, and then the floating plate 2 will be returned to the original position. In summary, because the creation can be quickly replaced for the floating plate 2, and it is not necessary to use the fixed components of the conventional technology for positioning, the electronic components can be tested and the user can use it. Brewing [Simple description of the schema] - The first image is a three-dimensional appearance of the creation. The first picture is a three-dimensional appearance of the other side of the creation. • The second image is a three-dimensional exploded view of the creation. The fourth figure is a side cross-sectional view of the creation. The fifth drawing is a side cross-sectional view of a preferred embodiment of the present invention. Figure 6 is a side cross-sectional view of the preferred embodiment of the present invention. The seven-figure figure is the creation of the re-dimensional appearance. 7 M394461 The eighth figure is a perspective view of another preferred embodiment of the present invention. The ninth drawing is a perspective partial cross-sectional view of still another preferred embodiment of the present invention. _ [Main component symbol description] 1. Seat 11, accommodating space 12, bottom plate 121, first positioning groove φ 13, convex portion 14, groove 141, probe 15, limiting hole 151, notch 16, limit The position groove 17, the positioning member φ 171, the positioning groove 2, the floating plate 21, the through hole 22. The abutting surface 23, the pressing surface 231, the accommodating groove 232, the second positioning groove M394461 24, the pressing portion 25, Positioning portion 251, positioning piece * 3, test machine table 31, test substrate φ 4, electronic component 41, pin 5, elastic body 51, and limiting portion

Claims (1)

M394461 六、申請專利範圍: 1、 一種測試治具,該測試治具係設置有座體及浮動板,其中: . 該座體表面凹設有容置空間,容置空間底面為具有底板,底 板表面周緣間隔穿設有複數限位孔; 該浮動板係位於底板下方,而浮動板上下表面分別設置有抵 靠面及抵壓面,而抵靠面周緣凸設有相對於限位孔之抵壓部,且 抵壓部為穿過並露出於限位孔,並於抵壓面凹設有容置槽,且容 Φ 置槽内設置有可使浮動板上下彈性位移之彈性體。 2、 如申請專利範圍第1項所述之測試治具之結構改良,其中 該容置槽係位於抵壓部之下方,而限位孔於底板之底面處二側凹 設有限位槽,且限位槽連通於容置槽,而彈性體之二側末端形成 有限位部’並使限位部定位於限位槽内。 3、 如申請專利範圍第1項所述之測試治具之結構改良,其中 底板表面於限位孔之側方間隔設有複數凹槽,各凹槽内設置有探 # 針。 • 4、如申請專利範圍第1項所述之測試治具之結構改良,其中 彈性體為具彈性之膠條或彈簧。 . 5、一種測試治具’該測試治具係設置有座體及浮動板,其中: . 該座體表面凹設有容置空間,容置空間底面為具有底板,底 板表面周緣間隔穿設有複數限位孔; 土該浮動板係位於底板上方,而浮動板上下表面分別設置有抵 靠面及抵壓面,而抵壓面周緣向下凸設有相對於限位孔之定位 M394461 部,且抵壓部可於限位孔内上下位移,並於浮動板底面與底板表 面之間設置有可使浮動板上下彈性位移之彈性體。 . 6、如申請專利範圍第5項所述之測試治具之結構改良,其中 • 雜位孔於敍之底面處-侧凹設有缺槽,而粒部末端一側产 向延伸有定位片,並使定位片位於缺槽内。 . 7、Μ請專職圍第5撕述之觀治具之結·良,其中 -該底板表關_設有概第—定位槽,祕壓㈣設有相對 # -雜槽之第二粒槽,且彈性體為位於第— 乐一疋位 8、如申請專利細第5項所述之测試治具之結構改良, =板表面於限位孔之側方間隔設有複數凹槽,⑼槽内設置= 彈二 ==所述,—M394461 VI. Patent application scope: 1. A test fixture, which is provided with a seat body and a floating plate, wherein: the surface of the seat body is concavely provided with an accommodating space, and the bottom surface of the accommodating space has a bottom plate and a bottom plate. The surface of the surface is spaced apart from the plurality of limiting holes; the floating plate is located below the bottom plate, and the lower surface of the floating plate is respectively provided with an abutting surface and an abutting surface, and the peripheral edge of the abutting surface is convexly disposed opposite to the limiting hole The pressing portion passes through and is exposed to the limiting hole, and the receiving groove is recessed in the pressing surface, and the elastic body of the floating plate is elastically displaced in the groove. 2. The structural improvement of the test fixture according to claim 1, wherein the receiving groove is located below the pressing portion, and the limiting hole is recessed on the two sides of the bottom surface of the bottom plate, and The limiting slot is connected to the receiving slot, and the two ends of the elastic body form a limiting portion and the limiting portion is positioned in the limiting slot. 3. The structural improvement of the test fixture according to the first aspect of the patent application, wherein the surface of the bottom plate is provided with a plurality of grooves at a side of the limiting hole, and a probe is arranged in each groove. • 4. The structural improvement of the test fixture as described in claim 1 of the patent application, wherein the elastomer is an elastic strip or spring. 5. A test fixture 'The test fixture is provided with a seat body and a floating plate, wherein: the surface of the seat body is recessed with a receiving space, and the bottom surface of the receiving space has a bottom plate, and the periphery of the bottom plate surface is spaced apart. a plurality of limiting holes; the floating plate is located above the bottom plate, and the lower surface of the floating plate is respectively provided with an abutting surface and an abutting surface, and the peripheral edge of the pressing surface is convexly disposed with a position M394461 opposite to the limiting hole, The pressing portion is vertically displaceable in the limiting hole, and an elastic body capable of elastically displaceing the floating plate is disposed between the bottom surface of the floating plate and the surface of the bottom plate. 6. The structural improvement of the test fixture according to item 5 of the patent application scope, wherein: the miscellaneous hole is located at the bottom surface of the suffix - the undercut is provided with a vacant groove, and the end of the granule end is extended with a positioning piece And the positioning piece is located in the missing slot. 7. Please ask the full-length section of the 5th to tear the view of the fixture, the good, which - the bottom plate of the table _ with the outline - positioning groove, secret pressure (four) with the opposite # - the second groove of the groove And the elastic body is a structural improvement of the test fixture described in the first item of the first section, as described in the fifth paragraph of the patent application, wherein the surface of the plate is provided with a plurality of grooves on the side of the limiting hole, (9) groove Internal setting = bomb two == stated, -
TW99215574U 2010-08-13 2010-08-13 Test tool TWM394461U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI468699B (en) * 2012-09-05 2015-01-11 Inventec Appliances Corp Testing system and method for measuring current of a voltage-stabilizing element
TWI734423B (en) * 2020-03-23 2021-07-21 李柏廷 Artificial intelligence detection product correct placement system and method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI468699B (en) * 2012-09-05 2015-01-11 Inventec Appliances Corp Testing system and method for measuring current of a voltage-stabilizing element
TWI734423B (en) * 2020-03-23 2021-07-21 李柏廷 Artificial intelligence detection product correct placement system and method

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