M3 04663M3 04663
I P 八、新型說明： 【新型所屬之技術領域】 本創作為提供一種測試裝置，尤指可提供測試電子元件之測 試裝置，同時具有延長測試裝置使用壽命之功效。 【先前技術】 按’隨著電子工業的進步及電子科技應用的快速發展，愈來 愈多的電子產品被頻繁的應用於日常生活中，以提升作業的方便 > 性與生活品質，在許多不同的電子產品應用之中，皆須使用到許 多電子元件，例如：二極體、積體電路、電阻、電容等，來進行 管理、控制、分析、處理、運算使用者輸入之資料，特別是電腦 通訊以及消費性電子產品等皆有日益頻繁的應用。 惟，在完成各式電子元件的製造程序後，需經過一連串之電 氣測試，方能在數量繁多之電子元件中剔除瑕疵不良品，由於電 子元件體積愈趨短小，所以使電子產品愈漸小型化，降低生產成 釀本，提高獲利；同樣的電阻、電容、電壓器甚至直流電阻阻抗（ DCR)等元件，亦是朝此趨勢前進；但，小型化的產品在製作 、品管過程中，因體積小、腳距窄，使相關人員在測試上無法克 服人為疏失障礙，例如：以往使用LCR METER測量參數 數據時，通常是利用手持探測棒之方式量測，但可能會因手指顫 動而造成誤差值過大或誤判，並且在制時還需考驗人員的穩定 度以及财心，除了造成品質不穩定延誤出貨外，射能提高額外 的重工（ReW0 rk i ng)問題，相當不符合經濟效益。 M304663 是以，請參閱十、十-圖所示，係為習用之測試動作狀態側 視示意圖（一）及術見示意s (二），由圖中可清楚看出，習用 係利用具吸管之機械手臂c將電子元件B真空翁，再位移至一 測试平台AJi作導制試，而將電子元仙二侧與測試平台a呈 電性接觸時，-般毅·二塊測試平台A中央處供機械手臂c 將電子兀件B置人進行測試，以使電子元仙二端接腳B丄與測 試平台A接觸點呈電性連接，進而判斷電子元件B的功能和穩定 度是否正常，使生命週期較短的電子元件3在測試的過程中提早 的顯現出來，促使-些較不穩定的零件儘早的制挑出，使產品 出廠後的故障轉到最低，進行篩選、耻綠故障之電子元件 B，維護其電子元件B產品之品f，避免增加後續產品保固之成 本，而使產品進人市場後可靠性相對提高，惟此種測試方式容易 毛生許夕缺失’例如·因左右二塊測試平台A供電子元件B置放 至中間處進行測試，其找電子元仙二端接腳B丨接觸播壓之 測試平台A，會產生向下彎曲變形之現象（如第十一圖所示）， 下次測試電子元件_，電子元件6二端接腳B丨會接觸不到測 試平台A，而使測試精準度降低及誤判等問題發生，倘若，將測 試平台A拆卸進行更換或維修，勢必造成產品成本提高及耗費許 多時間與人力之缺失，亦與提高工作效益之方向背道而驰。 如此，在過去近四十年來半導體製造技術的研究與快速發展 下，單一電子元件密度以極快的速度向上成長，隨著元件尺寸的 縮J下其製私精雄、度要求愈來愈高，使得測試產品的良率亦受 M304663 » ， 到極大的織，是以，如何彻快速、斜、不料繁雜之測試 程序來測試電子元件，以提升生雜生產製造與職之效率，並 可增加測試機台的使用壽命，即為從事此行業之相關廠商所亟欲 研究改善之方向所在者。 【新型内容】 故，創作人有鑑於上述之問題與缺失，乃搜集相關資料，經 由多方評估及考量，並以從事於此行㈣積之多年經驗，經由不 斷試作以及修改’始設計出此種「測試裝置」新型專利誕生者。 本創作之主I目的乃在於透過雜測試治具對稱定位於座體 德測部二側’並以測試治具之測試塊對位於檢測部四邊，於測 忒時四片測试塊可平均接受電子元件二侧向下擠壓之作用力， 為可避免測試塊受擠壓後變形或彎曲之缺失，進而延長測試治具 的使用壽命及測試效果提升之功效。 I 作之次要目的乃在於將戦塊拆卸，並予_倒裝設於 測式冶具上’以使原本向下彎曲之測試塊改變為向上彎曲使用， 進而達到拆解、組裝簡易及可供使用者重複使用之功效，同時具 有延長測試治具壽命及提高測試治具歧適雜之功效。 【實施方式】 為達成上述目的及功效，本創作所採用之技術手段及其構造 ，兹綠圖就本創狀較佳實關詳加說明賤徵與魏如下，= 利完全瞭解。 請同時參閱第-、二圖所示’係為本創作之立體外觀圖以及 • M304663 ， * 立體刀解圖纟圖中所不可清楚看出，本創作之測試裝置係設置 有座體1及職治具2驗成，故就本案之主要結構特徵詳述如 后，其中： 該座體1上設有具凹槽111之檢測部11，並於檢測部i 1二側設有複數？孔12，另於座體1二侧設有複數限位部i 3 〇 該測試治具2為分別形成二個或二個以上相對稱之結構，且 # 皆具有—基部21，並於基部21—侧設有軸孔21 1，而相鄰 軸孔2 1 1上依序層疊有定位更換之職塊2 2及鱗部2 3， 且測試塊2 2為凸出於夾持部2 3外，且夾持部2 3上設有可供 固定元件3鎖固之複數圓孔2 3工，且一侧圓孔2 3工為可供具 凸柱2 21之測試塊2 2置人定位，而測試塊2 2另侧之基部2 1底部設有軸桿2 4，且軸桿2 4外緣分膽設挪性元件2 5 及軸承2 6，並於軸桿2 4末端結合有抵擋部2 7，且基部2工 參 遠離測試塊2 3 —侧設有限位片2 8。 俾當本創作之職裝置於_時，係先將職治具2對稱定 位於座體1之檢測部11二側，並透過測試治具2之轴桿2 4對 位穿入檢測部11二侧穿孔i 2内，同時亦將軸桿2 4上之彈性 元件2 5及軸承2 6依序置入座體1之穿孔i 2内呈一定位，γ 此結構設計’即可使職治具2於座體i上形成上下位移之結^ ，並利用測試治具2之限位4 2 8於座體1二侧限位部工3中形 成夾持限位之作用’即可使測試治具2於座體丄上限位移動時， M304663 以此即完成本創 不會造成顺祕2產生偏騎為，即可形成四_對稱之測試 治具2位於座體1之檢測部11二侧進行測試， $ 作之整體配置。 請繼續參閱第三、四、五、六、七、八圖所示，係為本創作 測試裝置測試前之侧視圖、第三圖A部份測試前之局部放大部、 測試中之侧視圖、第五圖A部份職中之局部放大部、測試後之I P VIII. New description: [New technical field] This creation is to provide a test device, especially a test device that can provide test electronic components, and has the effect of extending the service life of the test device. [Prior Art] According to the advancement of the electronics industry and the rapid development of electronic technology applications, more and more electronic products are frequently used in daily life to improve the convenience of homework > sex and quality of life, in many In the application of different electronic products, many electronic components, such as diodes, integrated circuits, resistors, capacitors, etc., must be used to manage, control, analyze, process, and calculate user input data, especially Computer communications and consumer electronics are increasingly used. However, after completing the manufacturing process of various electronic components, a series of electrical tests are required to remove defective products from a large number of electronic components. As electronic components become smaller and smaller, electronic products are increasingly miniaturized. , reducing production and brewing, and increasing profit; the same resistance, capacitance, voltage, and even DC resistance (DCR) components are also moving toward this trend; however, miniaturized products in the process of production and quality control, Due to its small size and narrow distance, the relevant personnel can't overcome the obstacles of human error in testing. For example, when using LCR METER to measure parameter data, it is usually measured by hand-held probe, but it may be caused by finger vibration. The error value is too large or misjudged, and the stability and wealth of the test personnel need to be tested. In addition to causing unstable quality and delaying shipment, the injection can raise the problem of additional heavy work (ReW0 rk i ng), which is quite inconsistent with economic benefits. . M304663 Yes, please refer to the tenth, tenth-picture, which is a schematic view of the test action state (1) and the schematic view s (2). It can be clearly seen from the figure that the conventional system uses a straw. The mechanical arm c vacuums the electronic component B and then shifts it to a test platform AJi for conducting the test. When the two sides of the electronic element are in electrical contact with the test platform a, the center of the two test platforms A The mechanical arm c is placed on the electronic component B for testing, so that the electronic two-terminal pin B丄 is electrically connected to the contact point of the test platform A, thereby judging whether the function and stability of the electronic component B are normal. The electronic component 3 with a short life cycle is revealed early in the test process, prompting some of the more unstable parts to be picked out as early as possible, so that the faults after leaving the factory are transferred to the lowest, screening, shame fault Electronic component B maintains the product f of its electronic component B product, avoiding the cost of subsequent product warranty, and the reliability of the product after entering the market is relatively improved. However, such a test method is prone to lack of hair. Two blocks The test platform A is placed in the middle of the electronic component B for testing. The electronic test unit B is connected to the test platform A of the broadcast terminal B, which will be bent downward (as shown in Fig. 11). ), the next time you test the electronic components _, the electronic component 6 two-terminal pin B 丨 will not touch the test platform A, and the test accuracy is reduced and misjudgment, etc., if the test platform A is disassembled for replacement or repair, It will inevitably lead to an increase in product costs and a lack of time and manpower, and will run counter to the direction of improving work efficiency. Thus, in the past 40 years of research and rapid development of semiconductor manufacturing technology, the density of a single electronic component has grown at an extremely high speed. With the shrinking of the size of components, the demand for private products has become more and more demanding. The yield of the test product is also affected by M304663 », to the great weaving, is how to test the electronic components in a fast, oblique, and unreasonable test procedure to improve the efficiency of the production and operation of the production, and increase The service life of the test machine is the direction that the relevant manufacturers engaged in this industry are eager to study and improve. [New content] Therefore, in view of the above-mentioned problems and deficiencies, the creators collected relevant information, evaluated and considered them through multiple parties, and based on years of experience in this business (four), through continuous trials and revisions The birth of a new type of "test device". The main purpose of this creation is to symmetrically locate the two sides of the body of the body through the miscellaneous test fixtures, and the test block of the test fixture is located on the four sides of the detection section. The four test blocks can be accepted equally when testing. The force of pressing down on the two sides of the electronic component can avoid the loss of deformation or bending of the test block after being squeezed, thereby prolonging the service life of the test fixture and improving the test effect. The secondary purpose of I is to disassemble the slab and put it on the measuring tool to change the test piece that is bent downward to the upward bending, thereby achieving disassembly, assembly and availability. The effect of repeated use by the user has the effect of prolonging the life of the test fixture and improving the compatibility of the test fixture. [Embodiment] In order to achieve the above objectives and effects, the technical means and its structure adopted in this creation, the green map is better and more detailed, and the levy and Wei are as follows. Please also refer to the three-dimensional appearance of the creation as shown in the first and second figures. • M304663, * The three-dimensional knife solution diagram can not clearly see that the test device of this creation is set with seat 1 and position. The fixture 2 is inspected, so the main structural features of the present invention are as follows: wherein: the base 1 is provided with a detecting portion 11 having a groove 111, and is provided with plural numbers on both sides of the detecting portion i1? The hole 12 is further provided with a plurality of limiting portions i 3 on both sides of the base body 1 . The test fixture 2 is formed into two or more symmetrical structures respectively, and each has a base portion 21 and is at the base portion 21 . - the side is provided with a shaft hole 21 1, and the adjacent shaft hole 2 1 1 is sequentially laminated with the position replacement block 2 2 and the scale portion 2 3 , and the test block 2 2 is protruded from the clamping portion 2 3 And the clamping portion 23 is provided with a plurality of circular holes 2 for locking the fixing member 3, and the one round hole 2 3 is configured for positioning the test block 2 2 having the protruding column 2 21 . The bottom of the base 2 1 on the other side of the test block 2 2 is provided with a shaft 2 4 , and the outer edge of the shaft 2 4 is provided with a biasing element 25 and a bearing 2 6 , and a resisting portion 2 is coupled to the end of the shaft 24 . 7, and the base 2 work is away from the test block 2 3 - the limit piece 28 is provided on the side. When the job of the creation is at _, the first fixture is symmetrically positioned on the two sides of the detecting portion 11 of the seat body 1, and penetrates the shaft of the test fixture 2 into the detecting portion 11 In the side hole i 2 , the elastic element 25 and the bearing 26 on the shaft 24 are also placed in the perforation i 2 of the seat body 1 in a position, and the γ structure design can be used to make the fixture 2 forming a knot of up-and-down displacement on the seat body i, and using the limit of the test fixture 2 4 2 8 to form a clamping limit in the two-side limit portion 3 of the seat body 1 When the movement of the upper limit of the seat body is carried out, the M304663 can complete the creation without causing the slanting of the shackle 2 to form a four-symmetric test fixture 2 on the two sides of the detecting portion 11 of the seat body 1. Test, $ for the overall configuration. Please continue to refer to the third, fourth, fifth, sixth, seventh and eighth figures, which are the side view before the test device is tested, the partial enlargement part before the test in part A of the third part, the side view during the test, Part of the fifth part of the A part of the job in the partial amplification, after the test
侧視圖及第七1^部份測試後之局部放大部，俾當本創作之測試 裝置於使㈣，係先透過具真空健5之賊何 元件4真^吸起，電子元件4娜酬試治具2上作電性連 接測試，俾當電子元件4受真空吸盤5移動至座體丨檢測部工丄 之凹槽11 1内時，該真空吸盤5施以向下按壓之作用力，即可 使電子元件4二側接腳41碰觸到測試治具2之測試塊2 2上（ 如第五、六圖所示），當被測電子元件4之電阻阻值小於幾歐姆 時，可採關《歧接方式（或稱四制試方式）來進行測試， 開爾文連接有兩個要求，就是對於每個測試點都有一條激勵線F 和一條檢測線S，二者嚴格分開，各自構成獨立回路，同時要求 S線必須個有極高輸人阻抗的職鹏上，使流過檢測線 S的電肌極小，趨近為零，如此，便可將電子元件4與測試塊2 2呈電性導軌態，再透侧試個來麟電子元件4於接觸後 的訊號是否正常，以有效地減少測量誤差。 藉上’該真空吸盤5會持續施以向下按壓之作用力，而使電 子元件4向下移動連同測試治具2之測試塊2 2位移（如第七、 M3 04663 續斤示），而測試治具2之基部2 i底側則會抵持座體丄之檢 ^部1 1上，進而使測試、冶具2形成—止態，避免測試治具 2向下移動產生碰撞或損壞等缺失，如此，當測試完畢後，真空 吸盤5會將電子元件4吸起向上軸，_試治具2之彈性元件 2 5二端較到彈性回復之作用力帶動，而分別_測試治^ 之基部2 i與座體丄，以使測試治具2向上彈起，進而透過測試 治具2底部之抵擋部2 7抵靠於座體工底側形成止播作用，進而 可供下一個待測電子元件4進行測試。 是以’上述職過程中，主要針對四_試治具2對稱定位 於座體1之檢測部i i二側，並使測試治具2之測試塊2 2對位 於檢測部1 1四周，以此結構進行職時，四_銳2 2可平 均承受電子元件4二侧向下擠壓之作用力（如第九圖所示），如 此可避免測試塊2 2受擠壓而變形，同時防止彎曲制題發生， 以使本創作魏長峨治具2較料命，且職效果提升之功 效’如彻上述結構或其它等效結觀化，以達成_等效之功 效，均應同理包含於本創作之專利範圍内，合予陳明。 者上述說明之測試治具2於垂直移動時，可透過抵檔部 2 7止檔鋪1底部形駐擋狀態，進_止戦治具2彈出座 體1外之缺失；而測試治具2透過限位片2 8於座體1之限位部 13内π動限位’於作動時，可提供測試治具2垂直限位不偏擺 之纽*利用上述結構或其它等效結構變化，以達成相似、相 同等效之射’均應同理包含於本辦之專纖圍内，合予陳明 M304663 又’本創作之測試塊2 2亦可提供使用者重複使用之功效， 俾當測試塊2 2受電子元件4抵壓—段時間後，倘若，產生些微 向下曾曲紐料現象時，使用者可制試塊2 2拆卸 ，並予以 反向裝設於峨治具2上’以使原本向下f曲之測試塊2 2改變 為向上彎曲提供職，進而可延長職治具2的個壽命，同時 具有適用性更廣泛之功效。The side view and the partial enlargement of the seventh part of the test after the test, the test device of the creation is (4), firstly through the vacuum thief, the thief, the component 4, the true ^, the electronic component 4 The jig 2 is electrically connected to the test, and when the electronic component 4 is moved by the vacuum chuck 5 into the recess 11 1 of the seat detecting portion, the vacuum chuck 5 is biased downward, that is, The two side pins 41 of the electronic component 4 can be touched on the test block 2 2 of the test fixture 2 (as shown in the fifth and sixth figures), when the resistance of the electronic component 4 to be tested is less than a few ohms, The "connection mode" (or four-test mode) is used for testing. There are two requirements for the Kelvin connection. For each test point, there is an excitation line F and a detection line S. The two are strictly separated and each constitutes The independent circuit requires that the S line must have a very high input impedance, so that the electric muscle flowing through the detection line S is extremely small and approaches zero. Thus, the electronic component 4 and the test block 2 2 can be presented. In the electrical rail state, try again to see if the signal of the incoming electronic component 4 is normal after contact. Effectively reduce measurement errors. By the 'the vacuum chuck 5 will continue to apply the downward pressing force, and the electronic component 4 is moved downward together with the test block 2 2 of the test fixture 2 (as shown in the seventh, M3 04663) The bottom side of the base 2 i of the test fixture 2 is placed against the inspection portion 1 1 of the seat body, thereby causing the test and the tool 2 to be stopped, and the test fixture 2 is prevented from moving downward to cause collision or damage. Thus, when the test is completed, the vacuum chuck 5 will suck the electronic component 4 up to the upper axis, and the elastic member of the test fixture 2 will be driven by the force of the elastic recovery, and the base of the test is respectively 2 i and the seat 丄, so that the test fixture 2 bounces up, and then through the bottom of the test fixture 2, the resisting portion 27 abuts against the bottom side of the seat body to form a stop-stopping effect, thereby providing the next electronic device to be tested Element 4 is tested. Therefore, in the above-mentioned occupation process, the four test fixtures 2 are symmetrically positioned on the two sides of the detecting portion ii of the seat body 1, and the test block 2 2 of the test fixture 2 is located around the detecting portion 1 1 . When the structure is in the working position, the four sharp 2 2 can bear the force of the downward pressing of the two sides of the electronic component 4 (as shown in the ninth figure), so that the test block 2 2 can be prevented from being deformed by being squeezed while preventing bending. The problem occurs, so that the creation of the Wei Changzhi jig 2 is more fatal, and the effect of the job effect improvement is as follows: Within the scope of the patents created, Chen Ming is included. When the test fixture 2 described above moves vertically, it can pass through the bottom portion of the resisting portion 27 to stop the stalling state, and the test fixture 2 can be omitted from the outside of the housing 1; and the test fixture 2 Through the limit piece 28 in the limit portion 13 of the seat body 1 π motion limit 'when the action, the test fixture 2 vertical limit is not yawed * using the above structure or other equivalent structural changes, Achieving similar and identical equivalents' should be included in the special fiber section of the office, and combined with Chen Ming M304663. The test block 2 of this creation can also provide users with the effect of repeated use. Block 2 2 is pressed by the electronic component 4 - after a period of time, if a slight downward phenomenon occurs, the user can make the test block 2 2 to disassemble and reversely mount it on the jig 2 In order to change the original test block 2 2 to the upward bending, the life of the work tool 2 can be extended, and the applicability is more extensive.
而本創作之保護重點及改善制之技術關鍵在於·四組測 U對稱疋位於座體1之檢測部1丨二侧，並使測試治具2 之測试塊2 2對位於檢測部i i四邊，於測試時，四片測試塊^ 2可平均承受電子元件4二侧向下擠壓之作用力，進而避免測試 塊2 2受擠壓賤形_曲祕失發生，以使摘财提高測試 治具2的使料命，且測試效果相對提升之功效，於自動化作業 上更提高轉效率之目的；再者，本創作之職裝置亦可提供較 大電流之電子元件4進行戦，如，凡職本創作所採用之原 理及等效結構變化，均應_包含於本㈣之專纖_，合予 陳明。 =相·為針對本創作—種較佳之可行實侧說明而已 ，惟該貫關麟肋限定本創作之申請專魏m它未脫 作所揭示之技藝精神下所完成之均等變化與修飾變更，均 應包含於本創作所涵蓋之專利範圍中。 夂1 綜上所述’本創作之測試裝置於使用時具有顯著之功效增進 M3 04663The key to the protection of this creation and the technical key to the improvement is that the four sets of U-symmetry 疋 are located on the two sides of the detection part of the body 1, and the test block 2 of the test fixture 2 is located on the four sides of the detection part ii. During the test, the four test pieces ^ 2 can bear the force of the downward pressing of the two sides of the electronic component 4 on average, thereby avoiding the test block 2 2 being squeezed and deformed, so as to improve the test. The effect of the fixture 2, and the relative improvement of the test effect, the purpose of improving the efficiency of the automation in the automation operation; in addition, the device of the creation can also provide the electronic component 4 with a large current, for example, The principles and equivalent structural changes adopted in the creation of the job should be included in the special fiber of this (4), and combined with Chen Ming. =相· is for the purpose of this creation - a better description of the feasible side, but the Guan Guanlin ribs limit the application of the creation of the special Wei Wei, it has not been removed from the artistic spirit revealed by the change and modification, It should be included in the scope of patents covered by this creation.夂1 In summary, the test device of this creation has a significant effect on the use of M3 04663
，誠符合新穎性、創作性及進步性之專利要件，爰依法提出申& 刀審委早日賜准本案，以保障創作人之辛苦創作，倘若鈞 局有任何稽疑，, 便。 ϋ +吝來函指示，創作人定當竭力配合，實感德 M304663 【圖式簡單說明】 第一圖係為本創作之立體外觀圖。 第二圖係為本創作之立體分解圖。 第三圖係為本創作測試裝置測試前之側視圖。 第四圖係為第三圖A部份測試前之局部放大部。 第五圖係為本創作測試裝置測試中之侧視圖。 第六圖係為第五圖A部份測試中之局部放大部。 • 第七圖係為本創作測試裝置測試後之侧視圖。 第八圖係為第七圖A部份測試後之局部放大部。 第九圖係為本創作測試裝置測試中之俯視圖。 第十圖係為習用之測試動作狀態侧視示意圖（一）。 第十一圖係為習用之測試動作狀態侧視示意圖（二）。 【主要元件符號說明】 ® 1、座體 1 2、穿孔 13、限位部 1 1、檢測部 1 11、凹槽 2、測試治具 2 4、軸桿 2 5、彈性元件 2 6、軸承 2 1、基部 211、軸孔 2 2、測試塊 13 M3 04663Integrity, creative and progressive patent requirements, 提出 提出 申 amp amp amp amp amp amp amp amp amp 刀 刀 刀 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早ϋ 吝 吝 指示 , , , , , , , , , , 创作 创作 创作 创作 创作 创作 创作 创作 创作 创作 创作 304 304 304 304 304 304 304 304 304 304 304 304 304 The second picture is a three-dimensional exploded view of the creation. The third figure is a side view of the creation test device before testing. The fourth figure is the partial enlargement part before the test in part A of the third figure. The fifth figure is a side view of the test of the authoring test device. The sixth figure is the partial enlargement in the partial test of Part A of Figure 5. • The seventh image is a side view of the test device after testing. The eighth figure is the partial enlargement after the partial test of the seventh figure A. The ninth figure is a top view of the test of the authoring test device. The tenth figure is a side view (1) of the test action state of the conventional use. The eleventh figure is a side view of the test action state (2). [Main component symbol description] ® 1. Seat 1 2. Perforation 13, limit 1 1 , detection part 11 11, groove 2, test fixture 2 4, shaft 2 5, elastic element 2 6 , bearing 2 1. Base 211, shaft hole 2, test block 13 M3 04663
v I 2 7、抵擋部 2 8、限位片 2 21、凸柱 2 3、爽持部 2 3 1、圓孔 3、 固定元件 4、 電子元件 I 41、接腳 5、真空吸盤 A、測試平台 B、 電子元件 B 1、接腳 C、 機械手臂v I 2 7, resisting portion 2 8, limiting piece 2 21, stud 2 3, holding portion 2 3 1, circular hole 3, fixing member 4, electronic component I 41, pin 5, vacuum chuck A, test Platform B, electronic component B 1, pin C, robot
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