CN201421489Y - Electron and circuit board micrometering detection device - Google Patents
Electron and circuit board micrometering detection device Download PDFInfo
- Publication number
- CN201421489Y CN201421489Y CN2009201325005U CN200920132500U CN201421489Y CN 201421489 Y CN201421489 Y CN 201421489Y CN 2009201325005 U CN2009201325005 U CN 2009201325005U CN 200920132500 U CN200920132500 U CN 200920132500U CN 201421489 Y CN201421489 Y CN 201421489Y
- Authority
- CN
- China
- Prior art keywords
- probe
- dials
- base
- hole
- lead
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Abstract
The utility model provides an electron and circuit board micrometering detection device comprising an insulated detection plate, a plurality of probe components and conducting wires arranged in an insertion hole, and a multitap, wherein, the detection plate is made up of an upper probe disc, a spring disc, a lower probe disc and a base provided with plurality of through holes and fixed in sequencelayer upon layer from top to bottom, each probe disc is further provided with an insulated elastic cloth, each probe component comprises a first probe, a spring and a second probe which are positioned respectively in the through holes of the upper probe disc, the spring disc and the lower probe disc and are in contact with each other in a corresponding manner from top to bottom in sequence, the conducting wires are conducting wires provided with insulated layers, and the front end parts of the conducting wires are fixed in the through holes on the base and are in contact in a corresponding manner with the tail ends of the second probes. In the case of a single probe component, the first probe adopts a straight needle, a thick needle or a pin, while the second probe adopts a straight needle, a thick needle or a pin. The probe components in different insertion holes are same as or different from each other. The utility model can increase testing density, and is convenient to repair.
Description
Technical field
The utility model relates to a kind of electronics and circuit board micrometering pick-up unit.
Background technology
Existing a kind of electronics and circuit board detection device comprise the insulation detecting plate that is provided with some jacks and place the some probe assemblies and the lead of jack respectively, described detecting plate is composed of a fixed connection up and down by a dials, a spring holder and a base, each probe assembly is made of a probe and a spring, they are contained in the through hole of dials and spring holder respectively and offset up and down and are connected, and it is interior and weld together with the afterbody of spring that the fore-end of lead is welded on the through hole of base.For probe is located in dials, all probes adopt the thick body pin of stage casing external diameter greater than the two sections external diameter, are stuck in the corresponding dials through hole.Lead must be welded in the through hole of base in the above-mentioned this pick-up unit, spring must with wire bonds together, the external diameter of spring is unfit to do little, test density is limited, and the welding difficulty is bigger, the cost height, also easy-maintaining not, in addition since the external diameter of probe be not easy to do little, so test density is limited.
Summary of the invention
The purpose of this utility model is the problem that exists at above-mentioned existing electronics and circuit board detection device, and a kind of test density, electronics and circuit board micrometering pick-up unit easy to maintenance of increasing is provided.
The purpose of this utility model is achieved in that the utility model comprises insulation detecting plate and some probe assembly and the leads that places jack that is provided with some jacks, also comprise multi-tap, the end portion of lead is connected with binding post on the multi-tap, described detecting plate is by the last dials that is provided with some through holes, spring holder, following dials and base superpose successively up and down and fixedly form, the corresponding up and down back of their through hole constitutes jack, the described dials of going up, following dials comprises two or multilayer board respectively, also be provided with the insulation elastic force cloth that is used to block probe at each dials, it is pressed on up and down between the two-ply, each probe assembly comprises first probe, the spring and second probe, they lay respectively at dials, spring holder, also corresponding up and down successively contact in the through hole of following dials, described lead is the lead of tape insulation layer, its fore-end be fixed in the through hole of base and with the corresponding contact of tail end of second probe, in same probe assembly, first probe adopts staight needle, thick body pin or pin, second probe adopts staight needle, thick body pin or pin, the probe assembly of different jacks is identical or different.
Technique effect of the present utility model is:
1, lead needn't be welded in the through hole of base in the utility model, and spring and lead need not weld, spring can adopt materials such as stainless steel material or nickel plating material, low than the gold plating spring cost that must adopt in the prior art, probe and spring are consumable accessory, so the utility model installation and maintenance are convenient, can reduce defective products, reduce cost, and meticulousr probe can cooperate meticulousr spring, the raising test density.
2, along with the raising of the usage ratio of the raising of circuit board precision and surface mount elements, the counting of IC pad that needs to detect also correspondingly improved, the ratio of IC pad in total check point that causes needing in the circuit board of middle and high end to detect surpasses 80%, the utility model is used for fixing probe owing to be provided with insulation elastic force cloth, avoid the probe landing, make probe can adopt staight needle (its needle body external diameter unanimity), can reduce the probe cost greatly, and external diameter can be very little, therefore test density can be increased, and absolute vertical checkout can be accomplished.The utility model can adopt the probe of identical or different shape according to the specific requirement of test in different jacks.
3, first probe can be shared with corresponding second probe in the utility model, and same probe can two the transposing direction use therefore convenient installation the, and can reduce the specification of probe.
Description of drawings
Fig. 1 is the structural representation of embodiment one.
Fig. 2 is the structural representation of embodiment two.
Fig. 3 is the structural representation of embodiment three.
Fig. 4 is the structural representation of embodiment four.
Embodiment
Referring to Fig. 1, embodiment one comprises the insulation detecting plate that is provided with some jacks and places the some probe assemblies and the lead of jack, also is provided with multi-tap, has only drawn a jack, a probe assembly and a lead among Fig. 1 and has done signal; Detecting plate is by last dials 1, spring holder 3, following dials 4 and base 6 up and down successively stack combinations form, fix with rivet, at last dials 1, spring holder 3, following dials 4 and base 6 are respectively equipped with some through holes, their through hole connects to form jack up and down, go up dials 1 in the present embodiment and comprise three ply board, also being provided with one deck insulation elastic force cloth 2 in last dials 1 is pressed between the second layer and three ply board of dials 1, following dials 4 comprises two-ply, also being provided with one deck insulation elastic force cloth 5 in playing dials 4 is pressed between the two-ply of following dials 4, insulation elastic force cloth 2,5 owing to have elastic force, after passing, probe can probe be located probe stationary in dials, spring holder 3 is made up of three ply board, the thin and through hole of its first laminate and three ply board is little than intermediate plate, thereby spring is positioned in the spring holder 3, and base 6 comprises one deck insulcrete and pillar; Each probe assembly comprises first probe 7, the spring 8 and second probe 9, they lay respectively at dials 1, spring holder 3, also corresponding up and down successively contact in the through hole of following dials 4, the head of first probe 7 stretches out in the end face of dials 1, the corresponding contact of the afterbody of first probe 7 with the top of spring 8, the corresponding contact of head of the bottom of spring 8 and second probe 9, lead 10 is the lead of tape insulation layer, its fore-end is fixed in the through hole of base 6 with viscose glue 11, the front end of lead 10 concordant with the end face of base 6 through holes and with corresponding contact of afterbody of second probe 9, the rear end part of lead 10 is connected with binding post on the multi-tap, and multi-tap connects test machine.Lead and the contacted front end of second probe are not less than the through hole end face of base in the utility model.
Referring to Fig. 1, first probe 7 among the embodiment one adopts thick body pin, second probe 9 to adopt staight needle.
Referring to Fig. 2, embodiment two with the difference of embodiment one is: first probe 12 among the embodiment two, second probe 13 all adopt thick body pin, can exchange use, are convenient to install.
Referring to Fig. 3, embodiment three with the difference of embodiment one is: first probe 14 among the embodiment three, second probe 15 all adopt staight needle, can make fine size, and therefore this probe assembly is specially adapted to detect the high IC pad of test density.First probe 14 and second probe 15 among the embodiment three can exchange use, are convenient to install.
Referring to Fig. 4, enforcement four with the difference of embodiment one is: first probe 16 among the embodiment four, second probe 17 all adopt pin, and both directions are opposite when mounted, and the microcephaly of two pins all contacts with spring.Adopt pin, can avoid probe flexural deformation.First probe 16 and second probe 17 among the embodiment four also can exchange use, are convenient to install.
Lead all is the leads that have external insulation layer among above-mentioned each embodiment, and its bare front end can contact conduction with second probe.The front end of lead also can be exposed to outside the through hole of base, and makes the diameter of its external diameter greater than base plate through holes by methods such as impacts, makes that lead can not fall down from the through hole of base when viscose glue loses efficacy.
The utility model also can be provided with one deck vertical conduction film (also claiming vertical conduction rubber) at the end face of last dials, to strengthen electric conductivity, contacts better with tested point on the circuit board under test.The vertical conduction film can be adsorbed on the end face of dials.
The needle body of thick body pin is made up of for three sections upper, middle and lower described in the utility model, and the diameter in stage casing is big than the diameter of epimere, hypomere; Described staight needle is meant the probe of diameter of needle body unanimity; The needle body of described pin is made up of the long and short two section, and long that section diameter is big than the diameter of that short section.The shape of thick body pin, staight needle is referring to Fig. 1 to Fig. 3, and the shape of pin is referring to Fig. 4, and various probes can also adopt different shape in the shape at needle body two ends, for example tip, tack, pawl head, round end or triangular head, and the foregoing description all is tips.
In the probe assembly of the utility model in same jack, first probe can adopt staight needle, thick body pin or pin, and second probe can adopt staight needle, thick body pin or pin arbitrarily; Can adopt identical or different probe assembly in different jacks, it is fixed to come according to concrete test needs.
The number of plies of forming the insulcrete of going up dials, spring holder, following dials, base in the utility model is not limited to situation described in the foregoing description.
Claims (4)
1. electronics and circuit board micrometering pick-up unit, comprise the insulation detecting plate and some probe assembly and the leads that places jack that are provided with some jacks, also comprise multi-tap, the end portion of lead is connected with binding post on the multi-tap, it is characterized in that: described detecting plate is by the last dials that is provided with some through holes, spring holder, following dials and base superpose successively up and down and fixedly form, the corresponding up and down back of their through hole constitutes jack, the described dials of going up, following dials comprises two or multilayer board respectively, also be provided with the insulation elastic force cloth that is used to block probe at each dials, it is pressed on up and down between the two-ply, each probe assembly comprises first probe, the spring and second probe, they lay respectively at dials, spring holder, also corresponding up and down successively contact in the through hole of following dials, described lead is the lead of tape insulation layer, its fore-end be fixed in the through hole of base and with the corresponding contact of tail end of second probe, in same probe assembly, first probe adopts staight needle, thick body pin or pin, second probe adopts staight needle, thick body pin or pin, the probe assembly of different jacks is identical or different.
2. electronics according to claim 1 and circuit board micrometering pick-up unit, it is characterized in that: the fore-end of described lead is fixed in the through hole of base with viscose glue, and the top of lead is not less than the through hole end face of base.
3. electronics according to claim 2 and circuit board micrometering pick-up unit, it is characterized in that: the front end of described lead is exposed to outside the through hole of base, and its external diameter is greater than the diameter of base plate through holes.
4. according to claim 1 or 2 or 3 described electronics and circuit board detection devices, it is characterized in that: the end face of dials also is provided with one deck vertical conduction film on described.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201325005U CN201421489Y (en) | 2009-06-08 | 2009-06-08 | Electron and circuit board micrometering detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201325005U CN201421489Y (en) | 2009-06-08 | 2009-06-08 | Electron and circuit board micrometering detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201421489Y true CN201421489Y (en) | 2010-03-10 |
Family
ID=41808149
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009201325005U Expired - Fee Related CN201421489Y (en) | 2009-06-08 | 2009-06-08 | Electron and circuit board micrometering detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201421489Y (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101923104A (en) * | 2010-05-13 | 2010-12-22 | 王云阶 | General adapter of electron and circuit board detection device |
| CN102128638A (en) * | 2010-12-29 | 2011-07-20 | 上海亨通光电科技有限公司 | Method for detecting optical fiber gyroscope semifinished product detection board |
| CN102346225A (en) * | 2010-08-02 | 2012-02-08 | 百硕电脑(苏州)有限公司 | Rapid detection method of connection condition |
| CN103063902A (en) * | 2012-12-31 | 2013-04-24 | 郑州中实赛尔科技有限公司 | Aluminum electrolytic cell anode voltage signal acquisition device |
| CN108303573A (en) * | 2018-01-03 | 2018-07-20 | 广东东方亮彩精密技术有限公司 | Cubing is connected with circuit check multiposition |
-
2009
- 2009-06-08 CN CN2009201325005U patent/CN201421489Y/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101923104A (en) * | 2010-05-13 | 2010-12-22 | 王云阶 | General adapter of electron and circuit board detection device |
| CN102346225A (en) * | 2010-08-02 | 2012-02-08 | 百硕电脑(苏州)有限公司 | Rapid detection method of connection condition |
| CN102346225B (en) * | 2010-08-02 | 2013-08-21 | 百硕电脑(苏州)有限公司 | Rapid detection method of connection condition |
| CN102128638A (en) * | 2010-12-29 | 2011-07-20 | 上海亨通光电科技有限公司 | Method for detecting optical fiber gyroscope semifinished product detection board |
| CN103063902A (en) * | 2012-12-31 | 2013-04-24 | 郑州中实赛尔科技有限公司 | Aluminum electrolytic cell anode voltage signal acquisition device |
| CN108303573A (en) * | 2018-01-03 | 2018-07-20 | 广东东方亮彩精密技术有限公司 | Cubing is connected with circuit check multiposition |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN201421489Y (en) | Electron and circuit board micrometering detection device | |
| US5945836A (en) | Loaded-board, guided-probe test fixture | |
| US7368927B2 (en) | Probe head having a membrane suspended probe | |
| US7271606B1 (en) | Spring-based probe pin that allows kelvin testing | |
| US7397255B2 (en) | Micro Kelvin probes and micro Kelvin probe methodology | |
| JP2012173263A (en) | Electrical contact and electrical contact unit | |
| CN108279368A (en) | Tester table and test method | |
| WO2007007869A1 (en) | Connector for measuring electrical resistance, and apparatus and method for measuring electrical resistance of circuit board | |
| US6407565B1 (en) | Loaded-board, guided-probe test fixture | |
| CN2890922Y (en) | Automobile speed regulating keyboard plate detector | |
| KR100721478B1 (en) | Circuit board checker and circuit board checking method | |
| CN206515413U (en) | A kind of FPC wireline tests switching device | |
| JP2004053409A (en) | Probe card | |
| CN201387470Y (en) | Electron and circuit board detecting device | |
| CN200953030Y (en) | Wafer test card | |
| JP2005121390A (en) | Circuit board inspection device | |
| CN2842429Y (en) | The direct measuring type tool | |
| CN205958702U (en) | Half consent test jig of PCB | |
| KR102393083B1 (en) | Conductive particle and testing socket comprsing the same | |
| TWI274165B (en) | Probe card interposer | |
| JP3691368B2 (en) | Printed circuit board continuity inspection jig | |
| TWM309751U (en) | Wafer test card | |
| CN109324230A (en) | A kind of electric initiating explosive device insulation resistance detection device and its detection method | |
| JP3700722B2 (en) | Circuit board inspection apparatus and circuit board inspection method | |
| JP3700721B2 (en) | Circuit board inspection apparatus and circuit board inspection method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100310 Termination date: 20110608 |