JP2005321305A - Electronic component measurement jig - Google Patents

Electronic component measurement jig Download PDF

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JP2005321305A
JP2005321305A JP2004139785A JP2004139785A JP2005321305A JP 2005321305 A JP2005321305 A JP 2005321305A JP 2004139785 A JP2004139785 A JP 2004139785A JP 2004139785 A JP2004139785 A JP 2004139785A JP 2005321305 A JP2005321305 A JP 2005321305A
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electronic component
chip
measuring
jig
type electronic
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Mitsuhide Katou
Hiromichi Kitajima
充英 加藤
宏通 北島
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Murata Mfg Co Ltd
株式会社村田製作所
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Abstract

<P>PROBLEM TO BE SOLVED: To allow a chip type electronic component 30 to be held parallel to an electronic component measuring jig 10, for measuring the electric characteristics of the electronic component 30, when the electronic component 30 is pressed against the measuring jig 10, measure the electric characteristics of the electronic component 30 accurately without damaging it, and increase the life of an anisotropic electric conductive sheet 20. <P>SOLUTION: The measuring jig 10 has measuring electrodes 12 to 17 on an electronic component measuring surface 21 at positions corresponding to external electrodes 31 of the electronic component 30. The measuring jig 10 is provided with protrusions 18, 19 on the electronic component measuring surface 21 which restrict tilting of the electronic component 30 owing to a deviation of a pressing position, when the electronic component 30 is pressed through the anisotropic electric conductive sheet 20 to measure the electric characteristics of the electronic component 30. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、チップ型電子部品の電気的特性を測定するための電子部品測定治具に関する。 The present invention relates to an electronic component measurement jig for measuring the electrical characteristics of the chip-type electronic component.

従来、電子部品の製造後に当該電子部品の良品、不良品を判別するために、その電気的特性、例えば静電容量、電気抵抗など各種の測定が行われている。 Conventional, non-defective electronic components the electronic component after the production of, in order to determine defective, its electrical properties, for example, capacitance, various measurements such as electrical resistance have been made. 例えば、多端子型のセラミック電子部品の電気的特性を測定する場合、プローブピンなどの測定端子を押し当てて測定するが、チップ型電子部品などの小さいものは電子部品の外部電極パターンに合わせてパターン化された測定電極が形成された電子部品測定治具が用いられる。 For example, when measuring the electrical characteristics of the multi-terminal ceramic electronic component, it is measured by pressing a measuring terminal, such as probe pins, small such as a chip type electronic component in accordance with the external electrode pattern of the electronic component electronic component measurement jig patterned measuring electrode is formed is used.

図7および図8に、電子部品測定治具70の一例を示す(特許文献1参照)。 7 and 8 show an example of an electronic component measurement jig 70 (see Patent Document 1). 電子部品測定治具70は、基材71の電子部品測定面81に測定電極72〜77を設けた構造をしている。 Electronic component measurement jig 70 has a structure in which a measuring electrode 72 to 77 to the electronic component measurement surface 81 of the substrate 71. 電気的特性の測定に際しては、その測定電極72〜77にチップ型電子部品90の外部電極91が当接するように、電子部品測定治具70上にチップ型電子部品90を載置する。 In the measurement of electrical characteristics, to the measuring electrodes 72 to 77 so that the external electrode 91 of the chip-type electronic component 90 abuts, placing the chip-type electronic component 90 on the electronic component measurement jig 70. この場合、測定電極72〜77の外側端に図示略の測定器が電気的に接続される。 In this case, not shown of the measuring instrument is electrically connected to the outer end of the measuring electrode 72-77. 上記測定では、チップ型電子部品90の下面に形成されている外部電極91の厚みにばらつきが存在する場合、全ての外部電極91を同時に測定電極72〜77に接触させることはできない。 In the above measurement, when the variation in the thickness of the external electrodes 91 formed on the lower surface of the chip-type electronic component 90 is present, it is impossible to contact all of the outer electrode 91 at the same time the measuring electrodes 72 to 77. そこで、チップ型電子部品90と電子部品測定治具70との間に当該チップ型電子部品90の外部電極91と電子部品測定治具70の測定電極72〜77との導通をとるための異方性導電シート80を介在させて押圧するとともに上記厚みのばらつきを吸収するように該異方性導電シート80を弾性変形させることで、外部電極91それぞれと測定電極72〜77それぞれとの対応した個別導通をとっている。 Therefore, anisotropic for establishing conduction between the measuring electrode 72 to 77 of the external electrode 91 and the electronic component measurement jig 70 of the chip-type electronic component 90 between the chip-type electronic component 90 and the electronic component measurement jig 70 while pressed by interposing a sexual conductive sheet 80 by elastically deforming the anisotropic conductive sheet 80 to absorb variations in the thickness of the external electrodes 91 individually corresponding to the measuring electrode 72 to 77 respectively are We are taking the conduction.

しかしながら、このような異方性導電シート80を介在させる測定においては、チップ型電子部品90を押圧する際に、チップ型電子部品90の重心付近を押圧できれば、外部電極91と測定電極72〜77との間にある異方性導電シート80の各部に均等に力をかけることができる。 However, in the measurement of interposing such an anisotropic conductive sheet 80, when pressing the chip-type electronic component 90, if pressed near the center of gravity of the chip-type electronic component 90, the measuring electrode and the outer electrode 91 72 to 77 it is possible to apply equal force to each part of the anisotropic conductive sheet 80 located between. しかし、実際には、チップ型電子部品90の押圧面の形状等により、重心付近を押圧するのは困難であり、図8に示すように、重心から偏った位置が押圧されてチップ型電子部品90が傾いて導通されることになる。 However, in practice, the shape of the pressing surface of the chip-type electronic component 90, it is difficult to press the vicinity of the center of gravity, as shown in FIG. 8, the chip-type electronic component position offset from the center of gravity is pressed so that 90 is turned inclined. 例えば、チップ型電子部品90にSAWフィルタのように大型の部品が搭載されている場合、この大型の部品を押圧して測定することになるが、大型の部品が必ずしもチップ型電子部品90の重心に搭載されているとは限らず、押圧位置がチップ型電子部品90の重心から偏った位置になることがある。 For example, if a large part, as SAW filter chip-type electronic component 90 is mounted, but will be measured by pressing the large part, the center of gravity of a large part necessarily chip electronic component 90 not necessarily mounted on, there is the pressing position is at a position offset from the center of gravity of the chip-type electronic component 90.

その結果、異方性導電シート80の所定箇所のみが特に押圧されることになり、これを繰り返すうちに当該押圧部分が塑性変形して元の形状に復帰しなくなる。 As a result, the only predetermined portions of the anisotropic conductive sheet 80 is particularly pressing, the pressing portion can not return to its original shape by plastic deformation after repeated this. これにより、電気的特性を正確に測定することができなくなり、異方性導電シート80の寿命が短くなるという課題があった。 Thus, it becomes impossible to accurately measure the electric characteristics, the life of the anisotropic conductive sheet 80 has a problem that shortens. また、チップ型電子部品90が傾いて押圧されることにより、チップ型電子部品90が破損するという課題もあった。 Furthermore, by the chip-type electronic component 90 is pressed tilted, the chip-type electronic component 90 there is also the problem of corruption.
特開2000−356650号公報 JP 2000-356650 JP

したがって、本発明により解決すべき課題は、チップ型電子部品を電子部品測定治具に押圧した際に、チップ型電子部品を電子部品測定治具に対して平行に保持可能としてチップ型電子部品を破損することなくその電気的特性の正確な測定と異方性導電シートの長寿命化の達成とを可能にすることである。 Thus, problem to be solved by the present invention, upon pressing the chip-type electronic component on the electronic component measurement jig, the chip-type electronic component as possible held in parallel to the chip-type electronic component to the electronic component measurement jig damage that is to enable the achievement of accurate measurement and longer life of the anisotropic conductive sheet for the electrical characteristics without.

本発明は、チップ型電子部品の外部電極に対応する位置において、電子部品測定面に測定電極を有した電子部品測定治具であって、異方性導電シートを介してチップ型電子部品が圧接され、当該チップ型電子部品の電気的特性を測定する際に、押圧位置の偏りに起因して当該チップ型電子部品が傾斜するのを規制する突起を上記電子部品測定面に設けたものである。 The present invention is, at a position corresponding to the external electrodes of the chip-type electronic component, an electronic component measurement jig having a measurement electrode in the electronic component measurement surface, the chip-type electronic component via the anisotropic conductive sheet is pressed is, in measuring the electrical characteristics of the chip-type electronic component is a projection in which the chip-type electronic component due to the bias of the pressing position to restrict the tilting those provided in the electronic component measuring surface .

上記突起は、押圧位置が偏っている側において、1箇所でもよく、また複数設けられていてもよい。 The protrusions on the side of the pressing position is biased, may be in one place, also may be provided in plurality. 複数設ける例として、例えば矩形の電子部品測定面の押圧位置の偏っている側における端縁の両端や四隅に設ける。 Examples providing a plurality, for example, provided on both ends and corners of the edge on the side that is offset with the pressed position of the rectangular electronic component measuring surface of the.

本発明の電子部品測定治具によると、チップ型電子部品を異方性導電シートを介して電子部品測定治具に押圧した際に、チップ型電子部品が突起に当接して電子部品測定治具に対して平行に保持され、チップ型電子部品が均一に異方性導電シートに押圧される。 According to the electronic component measurement jig of the present invention, the chip-type electronic component via the anisotropic conductive sheet to the time when pressed to the electronic component measurement jig, electronic component test fixture chip electronic components in contact with the protrusion held parallel to the chip-type electronic component is uniformly pressed against the anisotropic conductive sheet. その結果、測定時にチップ型電子部品ががたつくことなく電気的特性を正確に測定でき、かつ、チップ型電子部品を破損することなく、異方性導電シートの長寿命化も図れる。 As a result, the electrical characteristics without rattling chip-type electronic component can be accurately measured during the measurement, and without damaging the chip-type electronic component, thereby also the life of the anisotropic conductive sheet.

また、電子部品測定面に複数の突起を設けることで、チップ型電子部品の保持が安定し、より正確に電気的特性の測定が行える。 In addition, by providing a plurality of projections on the electronic component measurement surface, the holding of the chip-type electronic component is stabilized, can be performed more accurately measure the electrical characteristics.

本発明の電子部品測定治具によると、チップ型電子部品を電子部品測定治具に押圧した際に、チップ型電子部品が電子部品測定治具に対して平行に保持され、チップ型電子部品を破損することなく電気的特性を正確に測定でき、異方性導電シートの長寿命化も図れる。 According to the electronic component measurement jig of the present invention, upon pressing the chip-type electronic component on the electronic component measurement jig, the chip-type electronic component is held in parallel to the electronic component measurement jig, the chip-type electronic component electrical characteristics without breakage can accurately measure, thereby also the life of the anisotropic conductive sheet.

本発明の最良の実施形態を図1ないし図3に基づいて説明する。 The best embodiment of the present invention will be described with reference to FIGS.

図1は電子部品測定治具による測定工程の分解斜視図、図2は電子部品測定治具の平面図、図3は電子部品測定治具による測定工程の正面図である。 Figure 1 is an exploded perspective view of the measurement process by the electronic component measurement jig, FIG. 2 is a plan view of an electronic component measurement jig, FIG. 3 is a front view of a measurement process by the electronic component measurement jig.

電子部品測定治具10は、基材11と、基材11の電子部品測定面21に設けられた測定電極12〜17ならびに突起18,19とから構成されている。 Electronic component measurement jig 10 comprises a substrate 11, and a measuring electrode 12 to 17 and protrusions 18 and 19 provided in the electronic component measuring surface 21 of the substrate 11. なお、電子部品測定治具10の電子部品測定面21は、チップ型電子部品30の下面より外形が大きく形成されており、チップ型電子部品30を電子部品測定治具10に載置した際に、測定電極12〜17がチップ型電子部品30の外周よりはみ出すように構成されている。 The electronic component measuring surface 21 of the electronic component measurement jig 10 is formed from outer shape larger lower surface of the chip-type electronic component 30, when placing the chip-type electronic component 30 to the electronic component measurement jig 10 , measuring electrodes 12 to 17 are configured so as to protrude from the outer periphery of the chip-type electronic component 30.

基材11を構成する材料については、絶縁性を示す限り、特に限定されず、例えば絶縁性樹脂などを用いて構成することができる。 The material constituting the substrate 11, so long as they exhibit an insulating property, is not particularly limited, for example, can be constructed using an insulating resin. なお、基材11としては、板状のものに限定されず、ブロック状のものであってもよい。 As the base material 11 is not limited to the plate shape, it may be of block-like.

測定電極12〜17は、基材11の電子部品測定面21に金属板を貼り合わせることにより、電子部品測定面21の対向する両端縁11a,11bに沿ってそれぞれ3個ずつ設けられている。 Measuring electrodes 12 to 17, by bonding a metal plate to the electronic component measuring surface 21 of the substrate 11, opposite edges 11a facing the electronic component measurement surface 21, are provided three by three along each of 11b.

突起18,19は、電子部品測定面21の残りの対向する両端縁11c,11dの略中央において接着等にて電子部品測定面21に固定されている。 Projections 18 and 19, the remaining opposing end edges 11c of the electronic component measurement surface 21, and is fixed to the electronic component measurement surface 21 by an adhesive or the like in substantially the center of 11d. 突起18,19は角柱状であり、その高さ寸法は測定電極12〜17の厚みより大きく測定電極12〜17と後述する異方性導電シート20の厚みの和以下に設定されている。 Projections 18 and 19 are prismatic, its height is set to more than the sum of the thickness of the anisotropic conductive sheet 20 to be described later increase the measuring electrode 12 to 17 than the thickness of the measurement electrode 12 to 17. なお、突起18,19の形状は角柱状に限らず、円柱状等であってもよい。 The shape of the protrusions 18, 19 is not limited to prismatic, it may be cylindrical or the like. 突起18,19の材質は、測定時の磨耗を軽減するため、ベリリウム、銅、真鋳等の硬い金属が好ましい。 The material of the projections 18 and 19, in order to reduce the wear at the time of measurement, beryllium, copper, hard metals such as brass is preferred.

異方性導電シート20は、シートの厚み方向に沿って金属線を多数有し、厚み方向のみに導電性を有するものである。 The anisotropic conductive sheet 20 has a large number of metal lines along the thickness direction of the sheet, and has a conductivity only in the thickness direction.

次に、電子部品測定治具10を用いたチップ型電子部品30の電気的特性の測定方法について説明する。 Next, a description method for measuring electrical characteristics of the chip-type electronic component 30 using the electronic component measurement jig 10. 測定に際しては、電子部品測定治具10の測定電極12〜17の外側端を測定装置(図示せず)に電気的に接続する。 In the measurement, it is electrically connected to a measuring device outside edge of the measuring electrode 12 to 17 of the electronic component measurement jig 10 (not shown).

基材11の電子部品測定面21の突起18,19間において、各測定電極12〜17上に異方性導電シート20を載置する。 In between the protrusions 18, 19 of the electronic component measurement surface 21 of the substrate 11, placing the anisotropically conductive sheet 20 on each of the measurement electrodes 12 to 17. さらに、異方性導電シート20上に、チップ型電子部品30を吸引装置のノズル40の先端にて吸引保持しながら載置し、さらに電子部品測定治具10方向に押圧して異方性導電シート20に圧接させる。 Furthermore, on the anisotropic conductive sheet 20, is placed with suction retaining the chip-type electronic component 30 at the tip of the nozzle 40 of the suction device, the anisotropic conductive further pressed against the electronic component measurement jig 10 direction to be pressed against the seat 20. なお、チップ型電子部品30の下面には、測定電極12〜17に対向する位置に外部電極31が設けられており、突起18,19に対向する部位の下面は略平らに形成されている。 Note that the lower surface of the chip-type electronic component 30, the external electrode 31 is provided at a position opposite to the measuring electrode 12 to 17, the lower surface of the portion facing the projection 18 and 19 are substantially flat form. チップ型電子部品30を異方性導電シート20に押圧することで、外部電極31と測定電極12〜17が異方性導電シート20を介して電気的に接続される。 By pressing the chip-type electronic component 30 in the anisotropic conductive sheet 20, the external electrode 31 and the measuring electrode 12 to 17 are electrically connected through an anisotropic conductive sheet 20. この際、チップ型電子部品30の下面の両端が突起18,19の上端に当接し、チップ型電子部品30が電子部品測定治具10に対して水平に保持される。 At this time, both ends of the lower surface of the chip-type electronic component 30 abuts the upper end of the projections 18 and 19, the chip-type electronic component 30 is held horizontally with respect to the electronic component measurement jig 10.

このように構成された電子部品測定治具10によると、チップ型電子部品30を異方性導電シート20を介して電子部品測定治具10に押圧した際に、チップ型電子部品30の両端が突起18,19に当接して電子部品測定治具10に対して平行に保持される。 According to this electronic component measurement jig 10 configured, upon pressing the electronic component measurement jig 10 and chip-type electronic component 30 via the anisotropic conductive sheet 20, both ends of the chip-type electronic component 30 It is held parallel to the electronic component measuring jig 10 in contact with the projections 18 and 19. その結果、測定時にチップ型電子部品30ががたつくことなく電気的特性を正確に測定でき、かつ、チップ型電子部品30を破損することなく、異方性導電シート20の長寿命化も図れる。 As a result, the electrical characteristics without chip-type electronic component 30 can rattle can accurately measure the time of measurement, and without damaging the chip-type electronic component 30, thereby also the life of the anisotropic conductive sheet 20.

また、チップ型電子部品30と接触する突起18,19の先端部の面積が大きい方が、チップ型電子部品30の安定性、耐摩耗性が向上して好ましい。 Also, a larger area of ​​the tip portion of the projection 18, 19 in contact with the chip-type electronic component 30, the stability of the chip-type electronic component 30, the wear resistance is preferably improved.

さらに、電子部品測定面21に複数の突起18,19を設けることで、チップ型電子部品30の保持が安定し、より正確に電気的特性の測定が行える。 Further, by providing a plurality of projections 18 and 19 to the electronic component measurement surface 21, the holding of the chip-type electronic component 30 is stabilized, it can be performed more accurately measure the electrical characteristics.

図4ないし図6に、電子部品測定治具10の変形例を示す。 4 to 6, showing a modification of the electronic component measurement jig 10. なお、図1ないし図3に示した例と同一部分には同一符号を付してその説明を省略する。 Incidentally, examples of the same parts shown in FIGS. 1 to 3 the explanation thereof will be given the same reference numerals.

図4の電子部品測定治具10は、基材11の上面の対角線上に対向する一対の隅部に突起51,52を設けたものである。 Electronic component measurement jig 10 of FIG. 4 are the projections 51 and 52 provided on a pair of opposite corners on the diagonal of the upper surface of the base material 11.

図5の電子部品測定治具10は、基材11の電子部品測定面21の一方の端縁11aの両端に突起61,62を設けたものである。 Electronic component measurement jig 10 of FIG. 5 is one in which the projections 61, 62 provided at both ends of the one edge 11a of the electronic component measurement surface 21 of the substrate 11. このように、突起18,19を押圧位置の偏っている側における電子部品測定面21の端縁の両端に設けることにより、より安定した状態でチップ型電子部品30を保持できる。 By providing both ends of the edge of the electronic component measurement surface 21 on the side which is biased projections 18, 19 of the pressing position, it can hold the chip-type electronic component 30 in a more stable state.

図6の電子部品測定治具10は、基材11の電子部品測定面21の四隅に突起41〜44を設けたものである。 Electronic component measurement jig 10 of FIG. 6 is one in which the projections 41 to 44 provided at the four corners of the electronic component measurement surface 21 of the substrate 11. この結果、チップ型電子部品30の四隅を保持することができ、押圧位置の偏りによってチップ型電子部品30がいずれの方向に傾いても水平に保持できる。 As a result, it is possible to hold the four corners of the chip-type electronic component 30, even a chip-type electronic component 30 by the bias of the pressed position is tilted in any direction can be held horizontally.

本発明は、チップ型の高周波電子部品等の電気的特性を測定するための電子部品測定治具として有用である。 The present invention is useful as an electronic component measurement jig for measuring the electrical characteristics of the high-frequency electronic components of the chip-type.

本発明の実施形態における電子部品測定治具による測定工程の分解斜視図 It exploded perspective view of a measurement process by the electronic component measurement jig in the embodiment of the present invention 本発明の実施形態における電子部品測定治具の平面図 Plan view of the electronic component measurement jig in the embodiment of the present invention 本発明の実施形態における電子部品測定治具による測定工程の正面図 Front view of a measurement process by the electronic component measurement jig in the embodiment of the present invention 本発明の実施形態における変形例の電子部品測定治具の平面図 Plan view of the electronic component measurement jig modification of the embodiment of the present invention 本発明の実施形態におけるその他の変形例の電子部品測定治具の平面図 Plan view of the electronic component measurement jig other modification of the embodiment of the present invention 本発明の実施形態におけるその他の変形例の電子部品測定治具の平面図 Plan view of the electronic component measurement jig other modification of the embodiment of the present invention 従来例における電子部品測定治具による測定工程の分解斜視図 It exploded perspective view of a measurement process by the electronic component measurement jig in the conventional example 従来例における電子部品測定治具による測定工程の正面図 Front view of a measurement process by the electronic component measurement jig in the conventional example

符号の説明 DESCRIPTION OF SYMBOLS

10 電子部品測定治具11 基材12〜17 測定電極18,19 突起20 異方性導電シート21 電子部品測定面30 チップ型電子部品31 外部電極 10 electronic component measurement jig 11 substrate 12-17 measuring electrodes 18, 19 protrusion 20 anisotropic conductive sheet 21 electronic component measurement surface 30 chip-type electronic component 31 external electrodes

Claims (4)

  1. チップ型電子部品の外部電極に対応する位置において、電子部品測定面に測定電極を有した電子部品測定治具であって、 At positions corresponding to the external electrodes of the chip-type electronic component, an electronic component measurement jig having a measurement electrode in the electronic component measurement surface,
    異方性導電シートを介してチップ型電子部品が圧接され、当該チップ型電子部品の電気的特性を測定する際に、押圧位置の偏りに起因して当該チップ型電子部品が傾斜するのを規制する突起を上記電子部品測定面に設けた電子部品測定治具。 Regulatory chip-type electronic component via the anisotropic conductive sheet is pressed against, when measuring the electrical characteristics of the chip-type electronic component, from the chip-type electronic component due to the bias of the pressing position is inclined electronic component measurement jig projections provided on the electronic component measuring surface to be.
  2. 上記突起が複数設けられていることを特徴とする請求項1に記載の電子部品測定治具。 Electronic component measuring jig according to claim 1, characterized in that the projection is provided with a plurality.
  3. 上記電子部品測定面が矩形であり、上記突起が押圧位置の偏っている側における上記電子部品測定面の端縁の両端に設けられていることを特徴とする請求項2に記載の電子部品測定治具。 A said electronic component measuring surface is rectangular, the electronic component measurement according to claim 2, characterized in that provided at both ends of the edge of the electronic component measurement surface on the side where the projection is biased with pressing position jig.
  4. 上記電子部品測定面が矩形であり、上記突起が上記電子部品測定面の四隅に設けられていることを特徴とする請求項2に記載の電子部品測定治具。 It said an electronic component measurement surface is rectangular, the electronic component measuring jig according to claim 2, characterized in that the protrusions are provided at four corners of the electronic component measuring surface.
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