TWI862937B - 雷射加工裝置、雷射加工方法、雷射加工程式、記錄媒體、半導體晶片製造方法及半導體晶片 - Google Patents
雷射加工裝置、雷射加工方法、雷射加工程式、記錄媒體、半導體晶片製造方法及半導體晶片 Download PDFInfo
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- TWI862937B TWI862937B TW111122837A TW111122837A TWI862937B TW I862937 B TWI862937 B TW I862937B TW 111122837 A TW111122837 A TW 111122837A TW 111122837 A TW111122837 A TW 111122837A TW I862937 B TWI862937 B TW I862937B
- Authority
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- Prior art keywords
- processing
- line
- irradiation position
- laser irradiation
- laser
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/0869—Devices involving movement of the laser head in at least one axial direction
- B23K26/0876—Devices involving movement of the laser head in at least one axial direction in at least two axial directions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/50—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment
- H10P72/53—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment using optical controlling means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
- B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/04—Automatically aligning, aiming or focusing the laser beam, e.g. using the back-scattered light
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/082—Scanning systems, i.e. devices involving movement of the laser beam relative to the laser head
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/083—Devices involving movement of the workpiece in at least one axial direction
- B23K26/0853—Devices involving movement of the workpiece in at least two axial directions, e.g. in a plane
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/0869—Devices involving movement of the laser head in at least one axial direction
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0428—Apparatus for mechanical treatment or grinding or cutting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7416—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
- H10P72/742—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding involving stretching of the auxiliary support post dicing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/40—Semiconductor devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P54/00—Cutting or separating of wafers, substrates or parts of devices
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Laser Beam Processing (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2022/018064 WO2023203614A1 (ja) | 2022-04-18 | 2022-04-18 | レーザ加工装置、レーザ加工方法、レーザ加工プログラム、記録媒体、半導体チップ製造方法および半導体チップ |
| WOPCT/JP2022/018064 | 2022-04-18 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202342216A TW202342216A (zh) | 2023-11-01 |
| TWI862937B true TWI862937B (zh) | 2024-11-21 |
Family
ID=88419427
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW111122837A TWI862937B (zh) | 2022-04-18 | 2022-06-20 | 雷射加工裝置、雷射加工方法、雷射加工程式、記錄媒體、半導體晶片製造方法及半導體晶片 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20250256353A1 (https=) |
| JP (1) | JP7614451B2 (https=) |
| KR (1) | KR20240148880A (https=) |
| CN (1) | CN118922270A (https=) |
| DE (1) | DE112022006864T5 (https=) |
| TW (1) | TWI862937B (https=) |
| WO (1) | WO2023203614A1 (https=) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201420245A (zh) * | 2012-11-30 | 2014-06-01 | Lts Co Ltd | 用於控制雷射圖案成形裝置之階段的方法 |
| TW201828349A (zh) * | 2017-01-24 | 2018-08-01 | 日商迪思科股份有限公司 | 雷射加工裝置 |
| TW201838001A (zh) * | 2017-03-14 | 2018-10-16 | 日商迪思科股份有限公司 | 雷射加工裝置 |
| TW201913781A (zh) * | 2017-09-08 | 2019-04-01 | 日商迪思科股份有限公司 | 晶圓之加工方法 |
| TW202110562A (zh) * | 2019-09-05 | 2021-03-16 | 日商迪思科股份有限公司 | 雷射加工裝置之光軸確認方法 |
| TW202132034A (zh) * | 2015-09-09 | 2021-09-01 | 美商伊雷克托科學工業股份有限公司 | 雷射處理設備、雷射處理工件的方法及相關配置 |
| TW202136711A (zh) * | 2020-03-23 | 2021-10-01 | 日商東芝股份有限公司 | 檢查裝置及熔接裝置 |
| TW202209458A (zh) * | 2020-07-14 | 2022-03-01 | 日商東京精密股份有限公司 | 雷射加工裝置、晶圓加工系統及雷射加工裝置的控制方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5037082B1 (https=) | 1970-12-31 | 1975-11-29 | ||
| JPS5554593U (https=) | 1978-10-06 | 1980-04-12 | ||
| JPS584716U (ja) | 1981-07-02 | 1983-01-12 | 本田技研工業株式会社 | 内燃機関用消音器 |
| JP2000106340A (ja) | 1997-09-26 | 2000-04-11 | Nikon Corp | 露光装置及び走査露光方法、並びにステージ装置 |
| JP2008042032A (ja) * | 2006-08-08 | 2008-02-21 | Sumitomo Heavy Ind Ltd | ステージ駆動方法及び該方法を用いたレーザ加工装置 |
| JP5777415B2 (ja) | 2011-06-10 | 2015-09-09 | 株式会社ディスコ | 分割予定ライン検出方法 |
-
2022
- 2022-04-18 DE DE112022006864.7T patent/DE112022006864T5/de active Pending
- 2022-04-18 KR KR1020247030037A patent/KR20240148880A/ko not_active Withdrawn
- 2022-04-18 CN CN202280094700.4A patent/CN118922270A/zh active Pending
- 2022-04-18 JP JP2024515756A patent/JP7614451B2/ja active Active
- 2022-04-18 WO PCT/JP2022/018064 patent/WO2023203614A1/ja not_active Ceased
- 2022-04-18 US US18/857,426 patent/US20250256353A1/en active Pending
- 2022-06-20 TW TW111122837A patent/TWI862937B/zh active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201420245A (zh) * | 2012-11-30 | 2014-06-01 | Lts Co Ltd | 用於控制雷射圖案成形裝置之階段的方法 |
| TW202132034A (zh) * | 2015-09-09 | 2021-09-01 | 美商伊雷克托科學工業股份有限公司 | 雷射處理設備、雷射處理工件的方法及相關配置 |
| TW201828349A (zh) * | 2017-01-24 | 2018-08-01 | 日商迪思科股份有限公司 | 雷射加工裝置 |
| TW201838001A (zh) * | 2017-03-14 | 2018-10-16 | 日商迪思科股份有限公司 | 雷射加工裝置 |
| TW201913781A (zh) * | 2017-09-08 | 2019-04-01 | 日商迪思科股份有限公司 | 晶圓之加工方法 |
| TW202110562A (zh) * | 2019-09-05 | 2021-03-16 | 日商迪思科股份有限公司 | 雷射加工裝置之光軸確認方法 |
| TW202136711A (zh) * | 2020-03-23 | 2021-10-01 | 日商東芝股份有限公司 | 檢查裝置及熔接裝置 |
| TW202209458A (zh) * | 2020-07-14 | 2022-03-01 | 日商東京精密股份有限公司 | 雷射加工裝置、晶圓加工系統及雷射加工裝置的控制方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20250256353A1 (en) | 2025-08-14 |
| KR20240148880A (ko) | 2024-10-11 |
| JP7614451B2 (ja) | 2025-01-15 |
| CN118922270A (zh) | 2024-11-08 |
| DE112022006864T5 (de) | 2025-02-20 |
| WO2023203614A1 (ja) | 2023-10-26 |
| JPWO2023203614A1 (https=) | 2023-10-26 |
| TW202342216A (zh) | 2023-11-01 |
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