CN118922270A - 激光加工装置、激光加工方法、激光加工程序、记录介质、半导体芯片制造方法和半导体芯片 - Google Patents
激光加工装置、激光加工方法、激光加工程序、记录介质、半导体芯片制造方法和半导体芯片 Download PDFInfo
- Publication number
- CN118922270A CN118922270A CN202280094700.4A CN202280094700A CN118922270A CN 118922270 A CN118922270 A CN 118922270A CN 202280094700 A CN202280094700 A CN 202280094700A CN 118922270 A CN118922270 A CN 118922270A
- Authority
- CN
- China
- Prior art keywords
- processing
- line
- irradiation position
- laser
- laser irradiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/0869—Devices involving movement of the laser head in at least one axial direction
- B23K26/0876—Devices involving movement of the laser head in at least one axial direction in at least two axial directions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/50—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment
- H10P72/53—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment using optical controlling means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
- B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/04—Automatically aligning, aiming or focusing the laser beam, e.g. using the back-scattered light
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/082—Scanning systems, i.e. devices involving movement of the laser beam relative to the laser head
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/083—Devices involving movement of the workpiece in at least one axial direction
- B23K26/0853—Devices involving movement of the workpiece in at least two axial directions, e.g. in a plane
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/0869—Devices involving movement of the laser head in at least one axial direction
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0428—Apparatus for mechanical treatment or grinding or cutting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7416—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
- H10P72/742—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding involving stretching of the auxiliary support post dicing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/40—Semiconductor devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P54/00—Cutting or separating of wafers, substrates or parts of devices
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Laser Beam Processing (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2022/018064 WO2023203614A1 (ja) | 2022-04-18 | 2022-04-18 | レーザ加工装置、レーザ加工方法、レーザ加工プログラム、記録媒体、半導体チップ製造方法および半導体チップ |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN118922270A true CN118922270A (zh) | 2024-11-08 |
Family
ID=88419427
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202280094700.4A Pending CN118922270A (zh) | 2022-04-18 | 2022-04-18 | 激光加工装置、激光加工方法、激光加工程序、记录介质、半导体芯片制造方法和半导体芯片 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20250256353A1 (https=) |
| JP (1) | JP7614451B2 (https=) |
| KR (1) | KR20240148880A (https=) |
| CN (1) | CN118922270A (https=) |
| DE (1) | DE112022006864T5 (https=) |
| TW (1) | TWI862937B (https=) |
| WO (1) | WO2023203614A1 (https=) |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5037082B1 (https=) | 1970-12-31 | 1975-11-29 | ||
| JPS5554593U (https=) | 1978-10-06 | 1980-04-12 | ||
| JPS584716U (ja) | 1981-07-02 | 1983-01-12 | 本田技研工業株式会社 | 内燃機関用消音器 |
| JP2000106340A (ja) | 1997-09-26 | 2000-04-11 | Nikon Corp | 露光装置及び走査露光方法、並びにステージ装置 |
| JP2008042032A (ja) * | 2006-08-08 | 2008-02-21 | Sumitomo Heavy Ind Ltd | ステージ駆動方法及び該方法を用いたレーザ加工装置 |
| JP5777415B2 (ja) | 2011-06-10 | 2015-09-09 | 株式会社ディスコ | 分割予定ライン検出方法 |
| TWI516327B (zh) * | 2012-11-30 | 2016-01-11 | Lts有限公司 | 用於控制雷射圖案成形裝置之階段的方法 |
| KR20250037607A (ko) * | 2015-09-09 | 2025-03-17 | 일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드 | 작업물들을 레이저 가공하기 위한 레이저 가공 장치, 방법들 및 관련된 배열들 |
| JP2018120913A (ja) * | 2017-01-24 | 2018-08-02 | 株式会社ディスコ | レーザー加工装置 |
| JP7032050B2 (ja) * | 2017-03-14 | 2022-03-08 | 株式会社ディスコ | レーザー加工装置 |
| JP6918419B2 (ja) * | 2017-09-08 | 2021-08-11 | 株式会社ディスコ | ウェーハの加工方法 |
| JP7278178B2 (ja) * | 2019-09-05 | 2023-05-19 | 株式会社ディスコ | レーザー加工装置の光軸確認方法 |
| JP7412237B2 (ja) * | 2020-03-23 | 2024-01-12 | 株式会社東芝 | 検査装置及び溶接装置 |
| JP7644328B2 (ja) * | 2020-07-14 | 2025-03-12 | 株式会社東京精密 | レーザ加工装置、ウェーハ加工システム及びレーザ加工装置の制御方法 |
-
2022
- 2022-04-18 DE DE112022006864.7T patent/DE112022006864T5/de active Pending
- 2022-04-18 KR KR1020247030037A patent/KR20240148880A/ko not_active Withdrawn
- 2022-04-18 CN CN202280094700.4A patent/CN118922270A/zh active Pending
- 2022-04-18 JP JP2024515756A patent/JP7614451B2/ja active Active
- 2022-04-18 WO PCT/JP2022/018064 patent/WO2023203614A1/ja not_active Ceased
- 2022-04-18 US US18/857,426 patent/US20250256353A1/en active Pending
- 2022-06-20 TW TW111122837A patent/TWI862937B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| US20250256353A1 (en) | 2025-08-14 |
| KR20240148880A (ko) | 2024-10-11 |
| JP7614451B2 (ja) | 2025-01-15 |
| DE112022006864T5 (de) | 2025-02-20 |
| WO2023203614A1 (ja) | 2023-10-26 |
| TWI862937B (zh) | 2024-11-21 |
| JPWO2023203614A1 (https=) | 2023-10-26 |
| TW202342216A (zh) | 2023-11-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5686545B2 (ja) | 切削方法 | |
| CN112640067A (zh) | 部件安装系统以及部件安装方法 | |
| EP1293836A2 (en) | Device for exposure of a strip-shaped workpiece with a meander correction device | |
| CN118922270A (zh) | 激光加工装置、激光加工方法、激光加工程序、记录介质、半导体芯片制造方法和半导体芯片 | |
| TWI856333B (zh) | 雷射加工裝置、雷射加工方法、雷射加工程式、記錄媒體、半導體晶片製造方法及半導體晶片 | |
| TWI853262B (zh) | 雷射加工裝置、雷射加工方法、雷射加工程式、記錄媒體、半導體晶片製造方法及半導體晶片 | |
| TWI868295B (zh) | 加工裝置 | |
| TWI840841B (zh) | 雷射加工裝置、雷射加工方法、雷射加工程式、記錄媒體、半導體晶片製造方法及半導體晶片 | |
| JP5238730B2 (ja) | 部品実装機、部品検出装置、及び部品実装方法 | |
| CN114535826B (zh) | 切割装置的判定方法和切割装置 | |
| JP2006269992A (ja) | 画像データ生成方法及びそれを用いた部品搭載装置 | |
| JP2023002418A (ja) | ウエーハの確認方法 | |
| JP2008268652A (ja) | プラスチック射出レンズ組立方法及び装置 | |
| JP3406975B2 (ja) | 実装装置 | |
| TWI876384B (zh) | 接合裝置、接合方法及接合程式 | |
| JP2004095906A (ja) | 位置合わせ装置及び位置合わせ方法 | |
| CN115194317B (zh) | 激光加工装置 | |
| TW201107892A (en) | Exposure method and exposure apparatus | |
| WO2026069761A1 (ja) | 実装装置及び実装装置の制御方法 | |
| CN116705649A (zh) | 分割装置 | |
| CN121969098A (zh) | 利用晶片的机器视觉定位和对准以施加激光图案的系统 | |
| CN117238798A (zh) | 加工装置 | |
| TW202523406A (zh) | 異物去除裝置、異物去除方法以及電腦程式產品 | |
| JP2003110006A (ja) | 半導体チップの移送装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |