TWI850309B - 電漿處理裝置 - Google Patents
電漿處理裝置 Download PDFInfo
- Publication number
- TWI850309B TWI850309B TW109100728A TW109100728A TWI850309B TW I850309 B TWI850309 B TW I850309B TW 109100728 A TW109100728 A TW 109100728A TW 109100728 A TW109100728 A TW 109100728A TW I850309 B TWI850309 B TW I850309B
- Authority
- TW
- Taiwan
- Prior art keywords
- electrode
- plate
- gas
- plasma processing
- hole
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32559—Protection means, e.g. coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
- H01J37/32449—Gas control, e.g. control of the gas flow
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32513—Sealing means, e.g. sealing between different parts of the vessel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32522—Temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32541—Shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32568—Relative arrangement or disposition of electrodes; moving means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
- H01J37/32651—Shields, e.g. dark space shields, Faraday shields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32816—Pressure
- H01J37/32834—Exhausting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/72—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using electrostatic chucks
- H10P72/722—Details of electrostatic chucks
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Power Engineering (AREA)
- Drying Of Semiconductors (AREA)
- Plasma Technology (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019-006074 | 2019-01-17 | ||
| JP2019006074A JP7153574B2 (ja) | 2019-01-17 | 2019-01-17 | 上部電極構造、プラズマ処理装置、及び上部電極構造を組み立てる方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202032618A TW202032618A (zh) | 2020-09-01 |
| TWI850309B true TWI850309B (zh) | 2024-08-01 |
Family
ID=71608340
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW109100728A TWI850309B (zh) | 2019-01-17 | 2020-01-09 | 電漿處理裝置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US11443924B2 (https=) |
| JP (1) | JP7153574B2 (https=) |
| KR (1) | KR102839616B1 (https=) |
| CN (1) | CN111446143B (https=) |
| TW (1) | TWI850309B (https=) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7454407B2 (ja) * | 2020-03-02 | 2024-03-22 | 東京エレクトロン株式会社 | プラズマ処理方法及びプラズマ処理装置 |
| US12451331B2 (en) * | 2020-09-22 | 2025-10-21 | Applied Materials, Inc. | Showerhead assembly with recursive gas channels |
| WO2022123615A1 (ja) * | 2020-12-07 | 2022-06-16 | 東芝三菱電機産業システム株式会社 | 活性ガス生成装置 |
| CN118043945A (zh) | 2021-10-05 | 2024-05-14 | 东京毅力科创株式会社 | 上部电极构造和等离子体处理装置 |
| JP7611127B2 (ja) * | 2021-12-13 | 2025-01-09 | 東京エレクトロン株式会社 | 上部電極及びプラズマ処理装置 |
| CN116994936A (zh) * | 2022-01-18 | 2023-11-03 | 江苏天芯微半导体设备有限公司 | 一种衬套及晶圆预处理装置 |
| JP7717015B2 (ja) * | 2022-03-18 | 2025-08-01 | 東京エレクトロン株式会社 | 上部電極及びプラズマ処理装置 |
| WO2025193681A1 (en) * | 2024-03-11 | 2025-09-18 | University Of Maryland, College Park | Thermal plasma systems and methods for gas phase reactions |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011009249A (ja) * | 2009-06-23 | 2011-01-13 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| TW201119522A (en) * | 2009-03-06 | 2011-06-01 | Tokyo Electron Ltd | Plasma processing apparatus and electrode for same |
| US20120247678A1 (en) * | 2005-06-22 | 2012-10-04 | Tokyo Electron Limited | Electrode assembly and plasma processing apparatus |
| TW201310524A (zh) * | 2011-03-31 | 2013-03-01 | 東京威力科創股份有限公司 | 頂部電極板及基板處理裝置 |
| WO2014172112A1 (en) * | 2013-04-17 | 2014-10-23 | Tokyo Electron Limited | Capacitively coupled plasma equipment with uniform plasma density |
| US20170069470A1 (en) * | 2014-05-12 | 2017-03-09 | Tokyo Electron Limited | Upper electrode structure of plasma processing apparatus, plasma processing apparatus, and operation method therefor |
| US20170162406A1 (en) * | 2005-03-31 | 2017-06-08 | Tokyo Electron Limited | Capacitive coupling plasma processing apparatus and method for using the same |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5572398A (en) * | 1994-11-14 | 1996-11-05 | Hewlett-Packard Co. | Tri-polar electrostatic chuck |
| TW492135B (en) * | 2000-05-25 | 2002-06-21 | Tomoegawa Paper Co Ltd | Adhesive sheets for static electricity chuck device, and static electricity chuck device |
| WO2009031566A1 (ja) * | 2007-09-06 | 2009-03-12 | Creative Technology Corporation | 静電チャック装置におけるガス供給構造の製造方法及び静電チャック装置ガス供給構造並びに静電チャック装置 |
| JP5213530B2 (ja) * | 2008-06-11 | 2013-06-19 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP2010182763A (ja) * | 2009-02-04 | 2010-08-19 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| US9449859B2 (en) * | 2009-10-09 | 2016-09-20 | Applied Materials, Inc. | Multi-gas centrally cooled showerhead design |
| US11532497B2 (en) * | 2016-06-07 | 2022-12-20 | Applied Materials, Inc. | High power electrostatic chuck design with radio frequency coupling |
| JP6827287B2 (ja) * | 2016-09-28 | 2021-02-10 | 株式会社日立ハイテク | プラズマ処理装置の運転方法 |
| JP7073098B2 (ja) * | 2017-12-27 | 2022-05-23 | 株式会社日立ハイテク | ウエハ処理方法およびウエハ処理装置 |
-
2019
- 2019-01-17 JP JP2019006074A patent/JP7153574B2/ja active Active
-
2020
- 2020-01-08 KR KR1020200002434A patent/KR102839616B1/ko active Active
- 2020-01-09 US US16/738,369 patent/US11443924B2/en active Active
- 2020-01-09 CN CN202010020933.2A patent/CN111446143B/zh active Active
- 2020-01-09 TW TW109100728A patent/TWI850309B/zh active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20170162406A1 (en) * | 2005-03-31 | 2017-06-08 | Tokyo Electron Limited | Capacitive coupling plasma processing apparatus and method for using the same |
| US20120247678A1 (en) * | 2005-06-22 | 2012-10-04 | Tokyo Electron Limited | Electrode assembly and plasma processing apparatus |
| TW201119522A (en) * | 2009-03-06 | 2011-06-01 | Tokyo Electron Ltd | Plasma processing apparatus and electrode for same |
| JP2011009249A (ja) * | 2009-06-23 | 2011-01-13 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| TW201310524A (zh) * | 2011-03-31 | 2013-03-01 | 東京威力科創股份有限公司 | 頂部電極板及基板處理裝置 |
| WO2014172112A1 (en) * | 2013-04-17 | 2014-10-23 | Tokyo Electron Limited | Capacitively coupled plasma equipment with uniform plasma density |
| US20170069470A1 (en) * | 2014-05-12 | 2017-03-09 | Tokyo Electron Limited | Upper electrode structure of plasma processing apparatus, plasma processing apparatus, and operation method therefor |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111446143A (zh) | 2020-07-24 |
| JP7153574B2 (ja) | 2022-10-14 |
| CN111446143B (zh) | 2024-11-05 |
| KR20200089608A (ko) | 2020-07-27 |
| TW202032618A (zh) | 2020-09-01 |
| KR102839616B1 (ko) | 2025-07-30 |
| US20200234930A1 (en) | 2020-07-23 |
| JP2020115419A (ja) | 2020-07-30 |
| US11443924B2 (en) | 2022-09-13 |
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