TWI812672B - Light emitting device - Google Patents

Light emitting device Download PDF

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Publication number
TWI812672B
TWI812672B TW108103260A TW108103260A TWI812672B TW I812672 B TWI812672 B TW I812672B TW 108103260 A TW108103260 A TW 108103260A TW 108103260 A TW108103260 A TW 108103260A TW I812672 B TWI812672 B TW I812672B
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Taiwan
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light
wavelength conversion
emitting element
emitting device
wiring
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TW108103260A
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Chinese (zh)
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TW201941458A (en
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中林拓也
石川哲也
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日商日亞化學工業股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/50Wavelength conversion elements
    • H01L33/505Wavelength conversion elements characterised by the shape, e.g. plate or foil
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/10Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a light reflecting structure, e.g. semiconductor Bragg reflector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/50Wavelength conversion elements
    • H01L33/501Wavelength conversion elements characterised by the materials, e.g. binder
    • H01L33/502Wavelength conversion materials
    • H01L33/504Elements with two or more wavelength conversion materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/58Optical field-shaping elements

Abstract

A light emitting device includes a light emitting element including a first surface; a light guide member covering at least a part of a lateral surface of the light emitting element; a first wavelength conversion member covering the first surface and including a first wavelength conversion particles; and a reflective member being in contact with the light emitting element. The first wavelength conversion member has a thickness of 60 μm or more and 120 μm or less. The first wavelength conversion particles have an average particle size of 4 μm or longer and 12 μm or smaller; the first wavelength conversion particles have a central particle size of 4 μm or longer and 12 μm or smaller. A weight ratio of the first wavelength conversion particles is 60% by weight or more and 75% by weight or less with respect to the total weight of the first wavelength conversion member.

Description

發光裝置Lighting device

本發明係關於一種發光裝置。 The present invention relates to a light emitting device.

已知有如下發光裝置,其具有:發光元件;光學層,其配置於發光元件上,使發光元件發出之光之至少一部分透過;及板狀光學構件,其搭載於光學層之上,使發光元件發出之光之至少一部分透過(例如,參照專利文獻1)。 A light-emitting device is known which has: a light-emitting element; an optical layer arranged on the light-emitting element to transmit at least part of the light emitted by the light-emitting element; and a plate-shaped optical member mounted on the optical layer to allow the light to emit light. At least part of the light emitted by the element is transmitted (for example, see Patent Document 1).

[先前技術文獻] [Prior technical literature] [專利文獻] [Patent Document]

[專利文獻1]日本專利特開2012-134355號公報 [Patent Document 1] Japanese Patent Application Laid-Open No. 2012-134355

業界要求於用作背光源或照明之情形時無論在何處均可獲得均勻之色度之光的發光裝置。因此,本發明之實施形態之目的在於提供一種能夠 抑制配光色度不均之發光裝置。 The industry requires a light-emitting device that can obtain uniform chromaticity light no matter where it is used as a backlight or lighting. Therefore, an object of the embodiments of the present invention is to provide a device capable of A light-emitting device that suppresses uneven light distribution and chromaticity.

本發明之一態樣之發光裝置具備:發光元件,其具有第1面及位於上述第1面之相反側之第2面;導光構件,其被覆上述發光元件之側面;第1波長轉換構件,其被覆上述第1面,且具有第1母材及第1波長轉換粒子;以及反射構件,其被覆上述發光元件之側面、上述導光構件之側面及第1波長轉換構件之側面,且與上述發光元件相接;上述第1波長轉換構件之厚度為60μm以上且120μm以下,上述第1波長轉換粒子之平均粒徑為4μm以上且12μm以下,上述第1波長轉換粒子之中心粒徑為4μm以上且12μm以下,相對於上述第1波長轉換構件之總重量而言,上述第1波長轉換粒子為60重量%以上且75重量%以下。 A light-emitting device according to one aspect of the present invention includes: a light-emitting element having a first surface and a second surface located on the opposite side of the first surface; a light guide member covering the side surface of the light-emitting element; and a first wavelength conversion member. , which covers the above-mentioned first surface and has a first base material and first wavelength conversion particles; and a reflective member, which covers the side surfaces of the above-mentioned light-emitting element, the side surfaces of the above-mentioned light guide member and the side surfaces of the first wavelength conversion member, and is connected with The above-mentioned light-emitting elements are in contact with each other; the thickness of the above-mentioned first wavelength conversion member is 60 μm or more and 120 μm or less, the average particle diameter of the above-mentioned first wavelength conversion particles is 4 μm or more and 12 μm or less, and the central particle diameter of the above-mentioned first wavelength conversion particles is 4 μm. or more and 12 μm or less, and the first wavelength conversion particles are 60% by weight or more and 75% by weight or less based on the total weight of the first wavelength conversion member.

根據本發明之實施形態之發光裝置,能夠提供一種能夠抑制配光色度不均之發光裝置。 According to the light-emitting device according to the embodiment of the present invention, it is possible to provide a light-emitting device capable of suppressing uneven light distribution and chromaticity.

10:基板 10:Substrate

11:基材 11:Substrate

12:第1配線 12: 1st wiring

12A:配線主部 12A: Main wiring section

12B:鍍層 12B:Plating

13:第2配線 13: 2nd wiring

14:第3配線 14: 3rd wiring

15:通孔 15:Through hole

16:凹處 16: recess

18:絕緣膜 18:Insulating film

20:發光元件 20:Light-emitting components

21:正負電極 21: Positive and negative electrodes

22:正負電極 22: Positive and negative electrodes

23:半導體積層體 23:Semiconductor laminated body

24:元件基板 24:Component substrate

30:透光性構件 30: Translucent member

31:第1波長轉換構件 31: First wavelength conversion member

32:第2波長轉換構件 32: Second wavelength conversion member

33:被覆構件 33: Covered component

34:覆膜 34:Lamination

40:反射構件 40: Reflective component

50:導光構件 50:Light guide component

60:導電性接著構件 60: Conductive bonding member

111:正面 111:front

112:背面 112: Back

113:底面 113: Bottom surface

114:上表面 114: Upper surface

120A:包含磷之鍍鎳層 120A: Nickel plating containing phosphorus

120B:鍍金層 120B: gold plated layer

120C:包含磷之鍍鎳層 120C: Nickel plating containing phosphorus

120D:鍍鈀層 120D: Palladium coating

120E:第1鍍金層 120E: 1st gold plating layer

120F:第2鍍金層 120F: 2nd gold plating layer

121:凸部 121:convex part

151:第4配線 151: 4th wiring

152:填充構件 152: Filling component

161:平行部 161: Parallel Department

162:傾斜部 162: Inclined part

201:第1面 201: Side 1

202:側面 202:Side

203:第2面 203: Side 2

311:第1波長轉換粒子 311: The first wavelength conversion particle

312:第1母材 312: 1st base material

321:第2波長轉換粒子 321: The second wavelength conversion particle

322:第2母材 322: 2nd base material

403:位於底面側之反射構件之長度方向之側面 403: The side surface in the length direction of the reflective member located on the bottom side

404:位於上表面側之反射構件之長度方向之側面 404: Longitudinal side of the reflective member located on the upper surface side

1000:發光裝置 1000:Lighting device

1000A:發光裝置 1000A:Light-emitting device

1000B:發光裝置 1000B:Light-emitting device

1000C:發光裝置 1000C:Light-emitting device

D1:凹處之中央之深度 D1: Depth of the center of the recess

D2:Z方向上之基材之厚度 D2: Thickness of substrate in Z direction

D3:窄幅部之Y方向之長度 D3: Length of narrow width part in Y direction

D4:寬幅部之Y方向之長度 D4: Length of the wide part in the Y direction

W1:位於凹處之上表面側之基材之厚度 W1: Thickness of the base material on the surface side above the recess

W2:位於凹處之底面側之基材之厚度 W2: Thickness of the base material located on the bottom side of the recess

W3:底面側之凹處之深度 W3: Depth of the recess on the bottom side

W4:上表面側之凹處之深度 W4: Depth of the recess on the upper surface side

X:方向 X: direction

Y:方向 Y: direction

Z:方向 Z: direction

θ:傾斜角度 θ:tilt angle

圖1A係實施形態1之發光裝置之概略立體圖。 FIG. 1A is a schematic perspective view of the light-emitting device according to the first embodiment.

圖1B係實施形態1之發光裝置之概略立體圖。 1B is a schematic perspective view of the light-emitting device according to Embodiment 1.

圖1C係實施形態1之發光裝置之概略前視圖。 1C is a schematic front view of the light-emitting device according to Embodiment 1.

圖2A係圖1C之2A-2A線上之概略剖視圖。 FIG. 2A is a schematic cross-sectional view along line 2A-2A in FIG. 1C.

圖2B係圖1C之2B-2B線上之概略剖視圖。 FIG. 2B is a schematic cross-sectional view along line 2B-2B in FIG. 1C.

圖2C係實施形態1之發光裝置之變化例之概略剖視圖。 FIG. 2C is a schematic cross-sectional view of a variation of the light-emitting device according to Embodiment 1.

圖2D係實施形態1之發光裝置之變化例之概略剖視圖。 FIG. 2D is a schematic cross-sectional view of a variation of the light-emitting device according to Embodiment 1.

圖3A係實施形態1之發光裝置之概略後視圖。 3A is a schematic rear view of the light-emitting device according to the first embodiment.

圖3B係實施形態1之發光裝置之概略仰視圖。 3B is a schematic bottom view of the light-emitting device according to Embodiment 1.

圖3C係實施形態1之發光裝置之概略側視圖。 3C is a schematic side view of the light-emitting device according to Embodiment 1.

圖4係實施形態1之基板之概略側視圖。 FIG. 4 is a schematic side view of the substrate according to the first embodiment.

圖5A係實施形態1之發光裝置之概略剖視圖及將虛線部內放大而表示之放大圖。 5A is a schematic cross-sectional view of the light-emitting device according to Embodiment 1 and an enlarged view of the dotted line portion.

圖5B係實施形態1之發光裝置之變化例之概略剖視圖及將虛線部內放大而表示之放大圖。 5B is a schematic cross-sectional view of a modified example of the light-emitting device according to Embodiment 1 and an enlarged view showing the dotted line portion enlarged.

以下,適當參照圖式對發明之實施形態進行說明。但是,以下說明之發光裝置係用以將本發明之技術思想具體化者,只要無特定記載,則不將本發明限定於以下內容。又,於一實施形態中說明之內容亦可應用於變化例。進而,關於圖式所示之構件之大小或位置關係等,為了使說明明確,有時會進行誇大。 Hereinafter, embodiments of the invention will be described with appropriate reference to the drawings. However, the light-emitting device described below is used to embody the technical idea of the present invention. Unless otherwise specified, the present invention is not limited to the following content. In addition, the contents described in one embodiment can also be applied to modified examples. Furthermore, the sizes and positional relationships of members shown in the drawings may be exaggerated in order to clarify the description.

<實施形態1> <Embodiment 1>

基於圖1A至圖5B對本發明之實施形態之發光裝置1000進行說明。發光裝置1000具備發光元件20、導光構件50、第1波長轉換構件31及反射構件40。發光元件20具有第1面201及位於第1面201之相反側之第2面203。導光構件50被覆發光元件之側面202。第1波長轉換構件31被覆發光元件 之第1面201。又,第1波長轉換構件31具有第1母材312及第1波長轉換粒子311。第1波長轉換構件31之厚度為60μm以上且120μm以下。第1波長轉換粒子311之平均粒徑為4μm以上且12μm以下。第1波長轉換粒子311之中心粒徑為4μm以上且12μm以下。相對於第1波長轉換構件31之總重量而言,第1波長轉換粒子311為60重量%以上且75重量%以下。反射構件40被覆發光元件之側面、導光構件之側面及第1波長轉換構件之側面。又,反射構件40與發光元件相接。發光裝置只要具備至少1個發光元件即可。即,發光裝置可僅具備1個發光元件,亦可具備複數個發光元件。 The light-emitting device 1000 according to the embodiment of the present invention will be described based on FIGS. 1A to 5B . The light-emitting device 1000 includes the light-emitting element 20 , the light guide member 50 , the first wavelength conversion member 31 and the reflective member 40 . The light-emitting element 20 has a first surface 201 and a second surface 203 located on the opposite side of the first surface 201 . The light guide member 50 covers the side surface 202 of the light emitting element. The first wavelength conversion member 31 covers the light emitting element The first side is 201. Furthermore, the first wavelength conversion member 31 includes a first base material 312 and first wavelength conversion particles 311 . The thickness of the first wavelength conversion member 31 is 60 μm or more and 120 μm or less. The average particle diameter of the first wavelength conversion particles 311 is 4 μm or more and 12 μm or less. The central particle diameter of the first wavelength conversion particles 311 is 4 μm or more and 12 μm or less. The first wavelength conversion particles 311 are 60% by weight or more and 75% by weight or less relative to the total weight of the first wavelength conversion member 31 . The reflective member 40 covers the side surfaces of the light emitting element, the side surfaces of the light guide member, and the side surfaces of the first wavelength conversion member. Furthermore, the reflective member 40 is in contact with the light emitting element. The light-emitting device only needs to have at least one light-emitting element. That is, the light-emitting device may include only one light-emitting element or a plurality of light-emitting elements.

第1波長轉換構件31所含之第1波長轉換粒子311之平均粒徑為4μm以上且12μm以下。藉由第1波長轉換粒子311之平均粒徑為12μm以下,於第1波長轉換構件31所含之第1波長轉換粒子311之濃度相同之情形時,能夠使第1母材312與第1波長轉換粒子311之界面增加。藉由第1母材與第1波長轉換粒子之界面增加,來自發光元件之光容易利用第1母材與第1波長轉換粒子之界面而擴散。藉此,來自發光元件之光於第1波長轉換構件內擴散,因此,能夠抑制發光裝置之配光色度不均。藉由第1波長轉換粒子之平均粒徑為4μm以上,容易提取來自發光元件之光,因此,發光裝置之光提取效率提昇。 The average particle diameter of the first wavelength conversion particles 311 included in the first wavelength conversion member 31 is 4 μm or more and 12 μm or less. When the average particle diameter of the first wavelength conversion particles 311 is 12 μm or less, when the concentration of the first wavelength conversion particles 311 contained in the first wavelength conversion member 31 is the same, the first base material 312 and the first wavelength conversion particle 311 can be The interface for converting particles 311 has been added. By increasing the interface between the first base material and the first wavelength conversion particles, the light from the light emitting element is easily diffused using the interface between the first base material and the first wavelength conversion particles. Thereby, the light from the light-emitting element is diffused in the first wavelength conversion member, so unevenness in light distribution and chromaticity of the light-emitting device can be suppressed. Since the average particle diameter of the first wavelength conversion particles is 4 μm or more, light from the light-emitting element is easily extracted, and therefore, the light extraction efficiency of the light-emitting device is improved.

於本說明書中,第1波長轉換粒子311之平均粒徑係指藉由FSSS法(費氏微粒測量儀,Fisher Sub-Sieve Sizer)測定之粒徑之平均值。藉由費氏法測定之平均粒徑例如使用Fisher Sub-Sieve Sizer Model95(Fisher Scientific公司製造)進行測定。 In this specification, the average particle size of the first wavelength conversion particles 311 refers to the average particle size measured by the FSSS method (Fisher Sub-Sieve Sizer). The average particle diameter measured by Fisher's method is measured using, for example, Fisher Sub-Sieve Sizer Model 95 (manufactured by Fisher Scientific).

第1波長轉換構件31所含之第1波長轉換粒子311之中心粒徑為4μm以上且12μm以下。藉由第1波長轉換粒子之中心粒徑為12μm以下,於第1波長轉換構件31所含之第1波長轉換粒子311之濃度相同之情形時,第1母材與第1波長轉換粒子之界面增加。藉由第1母材與第1波長轉換粒子之界面增加,來自發光元件之光容易利用第1母材與第1波長轉換粒子之界面而擴散。藉此,來自發光元件之光於第1波長轉換構件內擴散,因此,能夠抑制發光裝置之配光色度不均。藉由第1波長轉換粒子之中心粒徑為4μm以上,容易提取來自發光元件之光,因此,發光裝置之光提取效率提昇。 The central particle size of the first wavelength conversion particles 311 included in the first wavelength conversion member 31 is 4 μm or more and 12 μm or less. Since the central particle diameter of the first wavelength conversion particles is 12 μm or less, when the concentration of the first wavelength conversion particles 311 contained in the first wavelength conversion member 31 is the same, the interface between the first base material and the first wavelength conversion particles Increase. By increasing the interface between the first base material and the first wavelength conversion particles, the light from the light emitting element is easily diffused using the interface between the first base material and the first wavelength conversion particles. Thereby, the light from the light-emitting element is diffused in the first wavelength conversion member, so unevenness in light distribution and chromaticity of the light-emitting device can be suppressed. Since the central particle size of the first wavelength conversion particles is 4 μm or more, light from the light-emitting element is easily extracted, and therefore the light extraction efficiency of the light-emitting device is improved.

於本說明書中,第1波長轉換粒子311之中心粒徑係體積平均粒徑(中值粒徑),係自小徑側算起之體積累積頻率達到50%之粒徑(D50:中值粒徑)。能夠利用雷射繞射式粒度分佈測定裝置(MALVERN公司製造之MASTER SIZER 2000)測定中心粒徑。 In this specification, the central particle diameter of the first wavelength conversion particle 311 is the volume average particle diameter (median particle diameter), which is the particle diameter at which the cumulative volume frequency from the small diameter side reaches 50% (D50: median particle diameter). diameter). The central particle size can be measured using a laser diffraction particle size distribution measuring device (MASTER SIZER 2000 manufactured by MALVERN).

第1波長轉換粒子之自小徑側算起之體積累積頻率達到10%之粒徑(D10)較佳為6μm以上且10μm以下。第1波長轉換粒子之自小徑側算起之體積累積頻率達到90%之粒徑(D90)較佳為15μm以上且20μm以下。 The particle diameter (D10) of the first wavelength conversion particles at which the cumulative volume frequency from the small diameter side reaches 10% is preferably 6 μm or more and 10 μm or less. The particle diameter (D90) of the first wavelength conversion particles at which the cumulative volume frequency from the small diameter side reaches 90% is preferably 15 μm or more and 20 μm or less.

第1波長轉換粒子之體積基準之粒度分佈之標準偏差(σlog)較佳為0.3μm以下。藉由第1波長轉換粒子之偏差較少,容易形成厚度均勻之波長轉換構件31。 The standard deviation (σlog) of the volume-based particle size distribution of the first wavelength conversion particles is preferably 0.3 μm or less. Since the first wavelength conversion particles have less variation, it is easy to form the wavelength conversion member 31 with a uniform thickness.

作為第1波長轉換粒子,例如可列舉錳活化氟化物系螢光體。錳活化氟化物系螢光體係可獲得光譜線寬度相對較窄之發光且就顏色再現性之觀點而言較佳之構件。 Examples of the first wavelength conversion particles include manganese-activated fluoride-based phosphors. The manganese-activated fluoride-based fluorescent system can obtain luminescence with a relatively narrow spectral line width and is a member that is better in terms of color reproducibility.

第1波長轉換構件31之厚度為60μm以上且120μm以下。藉由第1波長轉換構件之厚度為60μm以上,可增加第1波長轉換構件31中能夠含有之第1波長轉換粒子311。藉由第1波長轉換構件31之厚度為120μm以下,能夠使發光裝置薄型化。再者,第1波長轉換構件之厚度係指Z方向上之第1波長轉換構件之厚度。 The thickness of the first wavelength conversion member 31 is 60 μm or more and 120 μm or less. By setting the thickness of the first wavelength conversion member to 60 μm or more, the number of first wavelength conversion particles 311 that can be contained in the first wavelength conversion member 31 can be increased. By setting the thickness of the first wavelength conversion member 31 to 120 μm or less, the light-emitting device can be made thinner. Furthermore, the thickness of the first wavelength conversion member refers to the thickness of the first wavelength conversion member in the Z direction.

相對於第1波長轉換構件31之總重量而言,第1波長轉換粒子311為60重量%以上且75重量%以下。相對於第1波長轉換構件之總重量而言,第1波長轉換粒子為60重量%以上,藉此第1波長轉換粒子之含量增加,因此,第1母材與第1波長轉換粒子之界面增加。藉由第1母材與第1波長轉換粒子之界面增加,來自發光元件之光容易利用第1母材與第1波長轉換粒子之界面而擴散。藉此,來自發光元件之光於第1波長轉換構件內擴散,因此,能夠抑制發光裝置之配光色度不均。相對於第1波長轉換構件之總重量而言,第1波長轉換粒子為75重量%以下,藉此第1波長轉換構件中之第1母材之比率增加,因此,能夠抑制第1波長轉換構件斷裂。再者,第1波長轉換構件可僅具有第1波長轉換粒子作為波長轉換粒子,亦可具有與第1波長轉換粒子不同之材料之波長轉換粒子作為波長轉換粒子。 The first wavelength conversion particles 311 are 60% by weight or more and 75% by weight or less relative to the total weight of the first wavelength conversion member 31 . The first wavelength conversion particles account for more than 60% by weight relative to the total weight of the first wavelength conversion member, thereby increasing the content of the first wavelength conversion particles. Therefore, the interface between the first base material and the first wavelength conversion particles increases. . By increasing the interface between the first base material and the first wavelength conversion particles, the light from the light emitting element is easily diffused using the interface between the first base material and the first wavelength conversion particles. Thereby, the light from the light-emitting element is diffused in the first wavelength conversion member, so unevenness in light distribution and chromaticity of the light-emitting device can be suppressed. The first wavelength conversion particle is 75% by weight or less relative to the total weight of the first wavelength conversion member, thereby increasing the ratio of the first base material in the first wavelength conversion member. Therefore, the first wavelength conversion member can be suppressed. break. Furthermore, the first wavelength conversion member may have only the first wavelength conversion particles as the wavelength conversion particles, or may have wavelength conversion particles of a different material from the first wavelength conversion particles as the wavelength conversion particles.

發光裝置可如圖2A所示之發光裝置1000般具備位於發光元件20與第1波長轉換構件31之間之第2波長轉換構件32,亦可如圖2C所示之發光裝置1000A般不具備位於發光元件20與第1波長轉換構件31之間之第2波長轉換構件。第2波長轉換構件32包含第2母材322及第2波長轉換粒子321。第1波長轉換粒子311之平均粒徑較佳為小於第2波長轉換粒子321之平均粒徑。藉由第2波長轉換粒子之平均粒徑大於第1波長轉換粒子之平均粒徑,來自發光元件之光容易導光至第2波長轉換構件32,因此,發光裝置之光提取效率提昇。又,藉由第1波長轉換粒子311之平均粒徑小於第2波長轉換粒子321之平均粒徑,於第1波長轉換構件31內,來自發光元件之光容易擴散,而能夠抑制發光裝置之配光色度不均。第1波長轉換粒子之材料與第2波長轉換粒子之材料可相同,亦可不同。又,第1母材312之材料與第2母材322之材料可相同,亦可不同。藉由第1母材312之材料與第2母材322之材料相同,第1波長轉換構件31與第22波長轉換構件32之接合強度提昇。藉由第1母材312之材料與第2母材322之材料不同,於第1母材312及第2母材322產生折射率差。藉此,於第1母材312與第2母材322之界面,來自發光元件之光容易擴散,因此,能夠抑制發光裝置之配光色度不均。第1母材312之折射率較佳為高於第2母材322之折射率。藉由如此設定,能夠抑制來自發光元件之光於第1母材312與第2母材322之界面全反射。藉此,發光裝置之光提取效率提昇。 The light-emitting device may have a second wavelength conversion member 32 located between the light-emitting element 20 and the first wavelength conversion member 31 like the light-emitting device 1000 shown in FIG. 2A , or may not have a second wavelength conversion member 32 located between the light-emitting element 20 and the first wavelength conversion member 31 like the light-emitting device 1000A shown in FIG. 2C . The second wavelength conversion member between the light emitting element 20 and the first wavelength conversion member 31. The second wavelength conversion member 32 includes a second base material 322 and second wavelength conversion particles 321 . The average particle diameter of the first wavelength conversion particles 311 is preferably smaller than the average particle diameter of the second wavelength conversion particles 321 . Since the average particle diameter of the second wavelength converting particles is larger than the average particle diameter of the first wavelength converting particles, the light from the light-emitting element is easily guided to the second wavelength converting member 32. Therefore, the light extraction efficiency of the light-emitting device is improved. In addition, since the average particle diameter of the first wavelength conversion particles 311 is smaller than the average particle diameter of the second wavelength conversion particles 321, the light from the light-emitting element is easily diffused in the first wavelength conversion member 31, thereby suppressing the configuration of the light-emitting device. Uneven light color. The material of the first wavelength conversion particles and the material of the second wavelength conversion particles may be the same or different. In addition, the material of the first base material 312 and the material of the second base material 322 may be the same or different. Since the material of the first base material 312 and the second base material 322 are the same, the bonding strength of the first wavelength conversion member 31 and the 22nd wavelength conversion member 32 is improved. Since the material of the first base material 312 and the second base material 322 are different, a refractive index difference occurs between the first base material 312 and the second base material 322 . Thereby, the light from the light-emitting element is easily diffused at the interface between the first base material 312 and the second base material 322. Therefore, uneven light distribution and chromaticity of the light-emitting device can be suppressed. The refractive index of the first base material 312 is preferably higher than the refractive index of the second base material 322 . By setting in this manner, total reflection of light from the light-emitting element at the interface between the first base material 312 and the second base material 322 can be suppressed. Thereby, the light extraction efficiency of the light-emitting device is improved.

第2波長轉換構件32之厚度較佳為20μm以上且60μm以下。藉由第2波長轉換構件32之厚度為20μm以上,可增加第2波長轉換構件32中能夠含有之第2波長轉換粒子321。藉由第2波長轉換構件32之厚度為60μm以 下,能夠使發光裝置薄型化。再者,第2波長轉換構件之厚度係指Z方向上之第2波長轉換構件之厚度。 The thickness of the second wavelength conversion member 32 is preferably 20 μm or more and 60 μm or less. By setting the thickness of the second wavelength conversion member 32 to 20 μm or more, the number of second wavelength conversion particles 321 that can be contained in the second wavelength conversion member 32 can be increased. Since the thickness of the second wavelength conversion member 32 is 60 μm or less, down, the light-emitting device can be made thinner. Furthermore, the thickness of the second wavelength conversion member refers to the thickness of the second wavelength conversion member in the Z direction.

第2波長轉換構件32之厚度較佳為第1波長轉換構件31之厚度之一半以下。藉由如此設定,相較於第2波長轉換構件32較厚之情形時,來自發光元件之光更容易照射至第1波長轉換構件31。例如,於第1波長轉換構件31為80±5μm之情形時,第2波長轉換構件32之厚度較佳為35±5μm。再者,下述被覆第1波長轉換構件31之被覆構件33之厚度亦可具有與第1波長轉換構件31同等之厚度。例如,亦可為,第1波長轉換構件31之厚度為80±5μm,第2波長轉換構件32之厚度為35±5μm,被覆構件33之厚度為80±5μm。再者,於本說明書中,同等之厚度係指容許5μm左右之變動。 The thickness of the second wavelength conversion member 32 is preferably less than half the thickness of the first wavelength conversion member 31 . With this setting, it is easier for the light from the light-emitting element to irradiate the first wavelength conversion member 31 than when the second wavelength conversion member 32 is thicker. For example, when the first wavelength conversion member 31 is 80±5 μm, the thickness of the second wavelength conversion member 32 is preferably 35±5 μm. Furthermore, the thickness of the coating member 33 that covers the first wavelength conversion member 31 described below may be the same as that of the first wavelength conversion member 31 . For example, the thickness of the first wavelength conversion member 31 may be 80±5 μm, the thickness of the second wavelength conversion member 32 may be 35±5 μm, and the thickness of the covering member 33 may be 80±5 μm. Furthermore, in this specification, the equivalent thickness means an allowable variation of approximately 5 μm.

來自被發光元件激發之第2波長轉換粒子321之光之峰值波長較佳為短於來自被發光元件激發之第1波長轉換粒子311之光之峰值波長。藉由來自被發光元件激發之第2波長轉換粒子321之光之峰值波長短於來自被發光元件激發之第1波長轉換粒子311之光之峰值波長,能夠利用來自被發光元件激發之第2波長轉換粒子之光使第1波長轉換粒子激發。藉此,能夠使來自所激發之第1波長轉換粒子之光增加。於第2波長轉換構件32上配置第1波長轉換構件31,因此,來自被發光元件激發之第2波長轉換粒子之光容易出射至第1波長轉換粒子。 The peak wavelength of the light from the second wavelength conversion particles 321 excited by the light-emitting element is preferably shorter than the peak wavelength of the light from the first wavelength conversion particle 311 excited by the light-emitting element. Since the peak wavelength of the light from the second wavelength conversion particles 321 excited by the light emitting element is shorter than the peak wavelength of the light from the first wavelength conversion particle 311 excited by the light emitting element, the second wavelength from the excited light emitting element can be utilized. The light of the conversion particles excites the first wavelength conversion particles. Thereby, the light from the excited first wavelength conversion particles can be increased. Since the first wavelength conversion member 31 is disposed on the second wavelength conversion member 32, the light from the second wavelength conversion particles excited by the light-emitting element can easily emit to the first wavelength conversion particles.

較佳為,來自被發光元件激發之第1波長轉換粒子311之光之峰值波 長為610nm以上且750nm以下,來自被發光元件激發之第2波長轉換粒子321之光之峰值波長為500nm以上且570nm以下。藉由如此設定,能夠設為演色性較高之發光裝置。藉由將發光峰值波長為430nm以上且475nm以下之範圍之發光元件(藍色發光元件)、來自被發光元件激發之光之峰值波長為610nm以上且750nm以下之第1波長轉換粒子、及來自被發光元件激發之光之峰值波長為500nm以上且570nm以下之第2波長轉換粒子組合,能夠獲得發白光之發光裝置。例如,作為第1波長轉換粒子,可列舉錳活化氟化矽酸鉀之螢光體,作為第2波長轉換粒子,可列舉β賽隆系螢光體。於使用錳活化氟化矽酸鉀之螢光體作為第1波長轉換粒子之情形時,尤佳為具備位於發光元件20與第1波長轉換構件31之間之第2波長轉換構件32。為錳活化氟化物螢光體之第1波長轉換粒子容易發生亮度飽和,藉由使第2波長轉換構件32位於第1波長轉換構件31與發光元件20之間,能夠抑制來自發光元件之光過度照射至第1波長轉換粒子。藉此,能夠抑制為錳活化氟化物螢光體之第1波長轉換粒子之劣化。 Preferably, the peak wave of light from the first wavelength conversion particles 311 excited by the light-emitting element The length is 610 nm or more and 750 nm or less, and the peak wavelength of the light from the second wavelength conversion particle 321 excited by the light-emitting element is 500 nm or more and 570 nm or less. By setting in this manner, a light-emitting device with high color rendering can be set. By combining a light-emitting element (blue light-emitting element) whose emission peak wavelength is in the range of 430nm to 475nm, the first wavelength conversion particle whose peak wavelength of light excited by the light-emitting element is 610nm to 750nm, and the first wavelength conversion particles from the light-emitting element. A light-emitting device that emits white light can be obtained by combining the second wavelength conversion particles with the peak wavelength of the light excited by the light-emitting element being 500 nm or more and 570 nm or less. For example, examples of the first wavelength converting particles include manganese-activated potassium fluorosilicate phosphors, and examples of the second wavelength converting particles include β-sialon-based phosphors. When a phosphor of manganese-activated potassium fluorosilicate is used as the first wavelength conversion particle, it is particularly preferable to include a second wavelength conversion member 32 located between the light-emitting element 20 and the first wavelength conversion member 31 . The first wavelength conversion particles, which are manganese-activated fluoride phosphors, are prone to brightness saturation. By positioning the second wavelength conversion member 32 between the first wavelength conversion member 31 and the light-emitting element 20, excessive light from the light-emitting element can be suppressed. Irradiate the first wavelength conversion particles. Thereby, it is possible to suppress the deterioration of the first wavelength conversion particles which are manganese-activated fluoride phosphors.

如圖2A所示,發光元件20具備第1面201及與第1面201為相反側之第2面203。發光元件20至少包含半導體積層體23,且於半導體積層體23設置有正負電極21、22。正負電極21、22形成於發光元件20之同一側之面,較佳為發光元件20覆晶安裝於安裝基板。藉此,不需要對發光元件之正負電極供電之導線,而能夠使發光裝置小型化。於覆晶安裝發光元件之情形時,發光元件之正負電極21、22位於第2面203。再者,於本實施形態中,發光元件20具有元件基板24,但亦可將元件基板24去除。 As shown in FIG. 2A , the light-emitting element 20 includes a first surface 201 and a second surface 203 opposite to the first surface 201 . The light-emitting element 20 includes at least a semiconductor multilayer body 23 , and the semiconductor multilayer body 23 is provided with positive and negative electrodes 21 and 22 . The positive and negative electrodes 21 and 22 are formed on the same side of the light-emitting element 20. It is preferred that the light-emitting element 20 is flip-chip mounted on the mounting substrate. Thereby, wires for supplying power to the positive and negative electrodes of the light-emitting element are not required, and the light-emitting device can be miniaturized. When the light-emitting element is flip-chip mounted, the positive and negative electrodes 21 and 22 of the light-emitting element are located on the second surface 203. Furthermore, in this embodiment, the light-emitting element 20 has the element substrate 24, but the element substrate 24 may be removed.

導光構件50被覆發光元件之側面202。導光構件50相較於反射構件40而言來自發光元件20之光之透過率更高。因此,藉由導光構件50被覆至發光元件之側面202,自發光元件20之側面出射之光容易通過導光構件50而提取至發光裝置之外側,因此,能夠提高光提取效率。又,導光構件50亦可位於發光元件之第1面201與透光性構件30之間,亦可不位於發光元件之第1面201與透光性構件30之間。導光構件係將發光元件與透光性構件接著之構件,因此,藉由導光構件位於發光元件之第1面201與透光性構件30之間,而發光元件與透光性構件之接合強度提昇。 The light guide member 50 covers the side surface 202 of the light emitting element. The light guide member 50 has a higher transmittance of light from the light emitting element 20 than the reflective member 40 . Therefore, by covering the side surface 202 of the light-emitting element with the light guide member 50, the light emitted from the side surface of the light-emitting element 20 can be easily extracted to the outside of the light-emitting device through the light guide member 50. Therefore, the light extraction efficiency can be improved. In addition, the light guide member 50 may be located between the first surface 201 of the light-emitting element and the translucent member 30, or may not be located between the first surface 201 of the light-emitting element and the translucent member 30. The light guide member is a member that connects the light-emitting element and the light-transmitting member. Therefore, the light-emitting element and the light-transmitting member are joined by the light guide member being located between the first surface 201 of the light-emitting element and the light-transmitting member 30. Increased strength.

反射構件40被覆發光元件之側面、導光構件之側面及第1波長轉換構件之側面。藉由如此設定,能夠設為發光區域與非發光區域之對比度較高之「分隔性」良好之發光裝置。又,反射構件40係至少一部分與發光元件相接。藉由反射構件40之至少一部分與發光元件相接,能夠使發光裝置小型化。反射構件40較佳為與發光元件之第2面203相接。藉由如此設定,能夠抑制來自發光元件之光被吸收至供安裝發光元件之基板。 The reflective member 40 covers the side surfaces of the light emitting element, the side surfaces of the light guide member, and the side surfaces of the first wavelength conversion member. By setting in this way, it is possible to provide a light-emitting device with good "separation properties" in which the contrast between the light-emitting area and the non-light-emitting area is high. In addition, at least part of the reflective member 40 is in contact with the light-emitting element. By having at least part of the reflective member 40 in contact with the light-emitting element, the light-emitting device can be miniaturized. The reflective member 40 is preferably in contact with the second surface 203 of the light emitting element. By setting in this manner, it is possible to suppress light from the light-emitting element from being absorbed into the substrate on which the light-emitting element is mounted.

亦可如圖2A所示之發光裝置1000般具備被覆第1波長轉換構件31之被覆構件33。被覆構件33實質上不含波長轉換粒子。藉由具備被覆第1波長轉換構件31之被覆構件33,即便使用不耐水分之第1波長轉換粒子,由於被覆構件33亦作為保護層發揮功能,故能夠抑制第1波長轉換粒子之劣化。作為不耐水分之波長轉換粒子,例如可列舉錳活化氟化物螢光體。錳活化氟化物系螢光體係可獲得光譜線寬度相對較窄之發光且就顏色再現性之觀點而言較佳之構件。「實質上不含波長轉換粒子」係指不排除不可避 免地混入之波長轉換粒子,較佳為波長轉換粒子之含有率為0.05重量%以下。再者,於本說明書中,有時將第1波長轉換構件31、第2波長轉換構件32及/或被覆構件33一併稱作透光性構件30。 The light emitting device 1000 shown in FIG. 2A may also include a covering member 33 covering the first wavelength conversion member 31 . The covering member 33 substantially contains no wavelength conversion particles. By providing the coating member 33 that covers the first wavelength conversion member 31, even if the first wavelength conversion particles that are not resistant to moisture are used, since the coating member 33 also functions as a protective layer, deterioration of the first wavelength conversion particles can be suppressed. Examples of the moisture-intolerant wavelength converting particles include manganese-activated fluoride phosphors. The manganese-activated fluoride-based fluorescent system can obtain luminescence with a relatively narrow spectral line width and is a member that is better in terms of color reproducibility. “Substantially does not contain wavelength converting particles” means that unavoidable In order to avoid mixing the wavelength conversion particles, the content of the wavelength conversion particles is preferably 0.05% by weight or less. In addition, in this specification, the first wavelength conversion member 31 , the second wavelength conversion member 32 and/or the covering member 33 may be collectively referred to as the translucent member 30 .

亦可如圖2D所示之發光裝置1000C般具備被覆透光性構件30之上表面之覆膜34。覆膜34係指為奈米粒子之覆膜粒子之凝聚體。再者,覆膜可僅為覆膜粒子,亦可包含覆膜粒子及樹脂材料。藉由覆膜之折射率與位於最表面之透光性構件之母材之折射率不同,能夠校正發光裝置之發光色度。位於最表面之透光性構件之母材係指透光性構件中形成與發光元件之光提取面側之面相反之面的層之母材。例如,於覆膜34之折射率大於位於最表面之透光性構件之母材之折射率之情形時,覆膜與空氣之界面處之反射光成分相較於位於最表面之透光性構件之母材與空氣之界面處之反射光成分增大。因此,能夠增加返回至透光性構件中之反射光成分,因此,容易使波長轉換粒子激發。藉此,能夠將發光裝置之發光色度向長波長側校正。又,於覆膜34之折射率小於位於最表面之透光性構件之母材之折射率之情形時,覆膜與空氣之界面處之反射光成分相較於透光構件之母材與空氣之界面處之反射光成分減少。藉此,能夠減少返回至透光性構件中之反射光成分,因此,不易使波長轉換粒子激發。藉此,能夠將發光裝置之發光色度向短波長側校正。例如,於使用苯基系矽酮樹脂作為位於最表面之透光性構件之母材之情形時,作為將發光裝置之發光色度向長波長側校正之覆膜粒子,可列舉氧化鈦、氧化鈦、氧化鋁等。於使用苯基系矽酮樹脂作為位於最表面之透光性構件之母材之情形時,作為將發光裝置之發光色度向短波長側校正之覆膜粒子,可列舉氧化矽等。於發光裝置具備複數個 透光性構件之情形時,亦可以覆膜被覆一透光性構件之上表面,不以覆膜被覆另一透光性構件之上表面。可與發光裝置之發光色度之校正相應地,適當選擇是否形成被覆透光性構件之上表面之覆膜。又,於發光裝置具備複數個透光性構件之情形時,亦可以具有大於位於最表面之透光性構件之母材之折射率的折射率之覆膜被覆一透光性構件之上表面,以具有小於位於最表面之透光性構件之母材之折射率的折射率之覆膜被覆另一透光性構件之上表面。可與發光裝置之發光色度之校正相應地,適當選擇被覆透光性構件之覆膜之材料。覆膜可藉由利用分注器之灌注、噴墨或利用噴霧器之噴附等公知之方法而形成。 The light-emitting device 1000C shown in FIG. 2D may also include a coating 34 covering the upper surface of the translucent member 30 . The coating 34 refers to an agglomerate of coated particles that are nanoparticles. Furthermore, the coating may only be coating particles, or may include coating particles and resin materials. Because the refractive index of the coating is different from the refractive index of the base material of the translucent member located on the outermost surface, the luminous chromaticity of the light-emitting device can be corrected. The base material of the light-transmitting member located on the outermost surface refers to the base material of the layer forming the surface of the light-transmitting member opposite to the light extraction surface side of the light-emitting element. For example, when the refractive index of the coating 34 is greater than the refractive index of the base material of the translucent member located on the outermost surface, the reflected light component at the interface between the coating 34 and the air is smaller than that of the translucent member located on the outermost surface. The reflected light component at the interface between the base material and the air increases. Therefore, the reflected light component returned to the translucent member can be increased, and therefore the wavelength conversion particles can be easily excited. Thereby, the luminance chromaticity of the light-emitting device can be corrected toward the longer wavelength side. Furthermore, when the refractive index of the coating 34 is smaller than the refractive index of the base material of the light-transmitting member located on the outermost surface, the reflected light component at the interface between the coating and the air is smaller than that of the base material of the light-transmitting member and the air. The reflected light component at the interface is reduced. Thereby, the reflected light component returned to the translucent member can be reduced, so that the wavelength conversion particles are less likely to be excited. Thereby, the luminance chromaticity of the light-emitting device can be corrected toward the shorter wavelength side. For example, when a phenyl-based silicone resin is used as the base material of the light-transmitting member located on the outermost surface, examples of coating particles that correct the luminous chromaticity of the light-emitting device toward the longer wavelength side include titanium oxide, oxide Titanium, alumina, etc. When a phenyl-based silicone resin is used as the base material of the light-transmitting member located on the outermost surface, examples of coating particles that correct the emission chromaticity of the light-emitting device to the short wavelength side include silicon oxide and the like. The light-emitting device has a plurality of In the case of a translucent member, it is also possible to cover the upper surface of one translucent member with a coating, but not to cover the upper surface of another translucent member with a coating. Whether or not to form a film covering the upper surface of the light-transmitting member can be appropriately selected in accordance with the correction of the luminous chromaticity of the light-emitting device. Furthermore, when the light-emitting device has a plurality of translucent members, a coating having a refractive index greater than the refractive index of the base material of the translucent member located on the outermost surface may be coated on the upper surface of one translucent member, The upper surface of another light-transmitting member is covered with a coating having a refractive index smaller than the refractive index of the base material of the light-transmitting member located on the outermost surface. The material of the film covering the translucent member can be appropriately selected in accordance with the correction of the luminance chromaticity of the light-emitting device. The coating can be formed by known methods such as pouring with a dispenser, inkjet or spraying with a sprayer.

發光裝置亦可具備載置發光元件之基板10。例如,基板10具備基材11、第1配線12、第2配線13、第3配線14及通孔15。基材11具有:正面111,其於作為長度方向之第1方向及作為短邊方向之第2方向上延長;背面112,其位於正面之相反側;底面113,其與正面111相鄰並與正面111正交;及上表面114,其位於底面113之相反側。基材11進而具有至少1個凹處16。第1配線12配置於基材11之正面111。第2配線13配置於基材11之背面112。發光元件20與第1配線12電性連接,且載置於第1配線12上。反射構件40被覆發光元件20之側面202及基板之正面111。至少1個凹處向背面112及底面113開口。第3配線14被覆凹處之內壁並與第2配線電性連接。通孔15與第1配線12及第2配線相接。通孔15將第1配線12及第2配線13電性連接。又,通孔15自基材11之正面111貫通背面112。再者,於本說明書中,正交係指容許自90°傾斜±3°左右。 The light-emitting device may also include a substrate 10 on which a light-emitting element is mounted. For example, the substrate 10 includes a base material 11, a first wiring 12, a second wiring 13, a third wiring 14, and a through hole 15. The base material 11 has a front surface 111 extending in the first direction as the length direction and the second direction as the short side direction; a back surface 112 located on the opposite side of the front surface; and a bottom surface 113 adjacent to the front surface 111 and connected to the front surface 111 . The front surface 111 is orthogonal; and the upper surface 114 is located on the opposite side of the bottom surface 113 . The base material 11 further has at least one recess 16 . The first wiring 12 is arranged on the front surface 111 of the base material 11 . The second wiring 13 is arranged on the back surface 112 of the base material 11 . The light-emitting element 20 is electrically connected to the first wiring 12 and is placed on the first wiring 12 . The reflective member 40 covers the side surface 202 of the light emitting element 20 and the front surface 111 of the substrate. At least one recess opens to the back 112 and the bottom 113 . The third wiring 14 covers the inner wall of the recess and is electrically connected to the second wiring. The through hole 15 is connected to the first wiring 12 and the second wiring. The through hole 15 electrically connects the first wiring 12 and the second wiring 13 . In addition, the through hole 15 penetrates from the front surface 111 of the base material 11 to the back surface 112 . Furthermore, in this specification, orthogonal means that an inclination of approximately ±3° from 90° is allowed.

通孔15可與第3配線相接,通孔15亦可與第3配線分開。藉由通孔15與第3配線相接,來自發光元件之熱能夠自第1配線12經由通孔15而傳遞至第2配線13及/或第3配線14,因此,能夠使發光裝置1000之散熱性提昇。藉由通孔15與第3配線分開,於後視下通孔與凹處不重疊,因此,基板之強度提昇。於有複數個通孔15之情形時,亦可為,一通孔與第3配線相接而另一通孔與第3配線分開。 The through hole 15 can be connected to the third wiring, or the through hole 15 can be separated from the third wiring. By connecting the through hole 15 to the third wiring, the heat from the light emitting element can be transferred from the first wiring 12 to the second wiring 13 and/or the third wiring 14 through the through hole 15. Therefore, the light emitting device 1000 can be Improved heat dissipation. Since the through hole 15 is separated from the third wiring, the through hole and the recess do not overlap in the rear view, so the strength of the substrate is improved. When there are a plurality of through holes 15 , one through hole may be connected to the third wiring and the other through hole may be separated from the third wiring.

於發光元件20覆晶安裝於基板10之情形時,發光元件之正負電極21、22經由導電性接著構件60而與基板10連接。於發光元件20覆晶安裝於基板10之情形時,第1配線12較佳為具備凸部121。藉由發光元件20之正負電極21、22位於第1配線12之凸部121上,於經由導電性接著構件60將第1配線12與發光元件之正負電極21、22連接時,能夠利用自對準效果容易地進行發光元件與基板之位置對準。 When the light-emitting element 20 is flip-chip mounted on the substrate 10 , the positive and negative electrodes 21 and 22 of the light-emitting element are connected to the substrate 10 through the conductive adhesive member 60 . When the light-emitting element 20 is flip-chip mounted on the substrate 10, the first wiring 12 preferably has a convex portion 121. Since the positive and negative electrodes 21 and 22 of the light-emitting element 20 are located on the convex portion 121 of the first wiring 12, self-alignment can be used when connecting the first wiring 12 to the positive and negative electrodes 21 and 22 of the light-emitting element via the conductive adhesive member 60. The alignment effect makes it easy to align the position of the light-emitting element and the substrate.

通孔15較佳為於後視下為圓形狀。藉由如此設定,能夠藉由鑽孔器等容易地形成。於本說明書中,圓形狀不僅為真圓,亦包含接近真圓之形狀(例如,亦可為橢圓形狀或如四邊形之四角較大且呈圓弧狀進行倒角所成之形狀)。 The through hole 15 is preferably circular in rear view. With this setting, it can be easily formed using a drill or the like. In this specification, a circular shape is not only a true circle, but also includes a shape close to a true circle (for example, it can also be an elliptical shape or a shape in which the four corners of a quadrilateral are larger and chamfered in an arc shape).

通孔15亦可藉由在基材之貫通孔內填充導電性材料而構成,亦可如圖2A所示,具備被覆基材之貫通孔之表面之第4配線151及填充至被第4配線151包圍之區域之填充構件152。填充構件152可為導電性,亦可為絕緣性。填充構件152較佳為使用樹脂材料。通常,硬化前之樹脂材料相較於 硬化前之金屬材料流動性更高,因此,容易填充至第4配線151內。因此,藉由填充構件使用樹脂材料,容易進行基板之製造。作為容易進行填充之樹脂材料,例如可列舉環氧樹脂。於使用樹脂材料作為填充構件之情形時,較佳為含有添加構件以降低線膨脹係數。藉由如此設定,與第4配線之線膨脹係數之差變小,因此,能夠抑制因來自發光元件之熱使第4配線與填充構件之間產生間隙。作為添加構件,例如可列舉氧化矽。又,於填充構件152使用金屬材料之情形時,能夠使散熱性提昇。又,於通孔15係於基材之貫通孔內填充導電性材料而構成之情形時,較佳為使用導熱性較高之Ag、Cu等金屬材料。 The through hole 15 may also be formed by filling a conductive material in the through hole of the base material. It may also have a fourth wiring 151 covering the surface of the through hole of the base material and a fourth wiring 151 filled therein as shown in FIG. 2A The filling member 152 of the area surrounded by 151. The filling member 152 may be conductive or insulating. The filling member 152 is preferably made of a resin material. Generally, the resin material before hardening is The metal material before hardening has higher fluidity and therefore can be easily filled into the fourth wiring 151 . Therefore, by using a resin material as a filling member, the substrate can be easily manufactured. Examples of the resin material that can be easily filled include epoxy resin. When a resin material is used as a filling member, it is preferable to include an additive member to reduce the linear expansion coefficient. By setting in this manner, the difference in linear expansion coefficient between the fourth wiring and the fourth wiring becomes small, so it is possible to suppress the generation of a gap between the fourth wiring and the filling member due to the heat from the light-emitting element. Examples of the additive member include silicon oxide. In addition, when the filling member 152 is made of a metal material, heat dissipation can be improved. In addition, when the through hole 15 is formed by filling the through hole of the base material with a conductive material, it is preferable to use a metal material such as Ag or Cu with high thermal conductivity.

發光裝置1000能夠利用形成於凹處16內之焊料等接合構件固定於安裝基板。基板所具備之凹處之數量可為1個,亦可為複數個。藉由有複數個凹處,能夠使發光裝置1000與安裝基板之接合強度提昇。凹處之深度可於上表面側及底面側為相同深度,亦可相較於上表面側在底面側更深。如圖2B所示,藉由Z方向上之凹處16之深度相較於上表面側在底面側更深,於Z方向上,能夠使位於凹處之上表面側之基材之厚度W1厚於位於凹處之底面側之基材之厚度W2。藉此,能夠抑制基材之強度下降。又,藉由底面側之凹處之深度W3深於上表面側之凹處之深度W4,形成於凹處內之接合構件之體積增加,因此,能夠使發光裝置1000與安裝基板之接合強度提昇。發光裝置1000無論為使基材11之背面112與安裝基板對向而安裝之上表面發光型(頂視型)抑或是使基材11之底面113與安裝基板對向而安裝之側面發光型(側視型),均可藉由接合構件之體積增加而使其與安裝基板之接合強度提昇。 The light emitting device 1000 can be fixed to the mounting substrate using a joining member such as solder formed in the recess 16 . The number of recesses provided on the substrate may be one or a plurality of recesses. By having a plurality of recesses, the bonding strength between the light-emitting device 1000 and the mounting substrate can be improved. The depth of the recess may be the same depth on the upper surface side and the bottom surface side, or may be deeper on the bottom surface side than on the upper surface side. As shown in FIG. 2B , since the depth of the recess 16 in the Z direction is deeper on the bottom side than on the upper surface side, in the Z direction, the thickness W1 of the base material located on the surface side above the recess can be made thicker than The thickness W2 of the base material located on the bottom side of the recess. This can prevent the base material from decreasing in strength. Furthermore, since the depth W3 of the recess on the bottom surface side is deeper than the depth W4 of the recess on the upper surface side, the volume of the bonding member formed in the recess is increased. Therefore, the bonding strength between the light emitting device 1000 and the mounting substrate can be improved. . The light emitting device 1000 may be a top surface emitting type (top view type) installed with the back surface 112 of the base material 11 facing the mounting substrate, or a side emitting type (side view type) installed with the bottom surface 113 of the base material 11 facing the mounting substrate. Side view type), the joint strength between the joint component and the mounting substrate can be improved by increasing the volume of the joint component.

發光裝置1000與安裝基板之接合強度於側面發光型之情形時尤其能夠提昇。藉由Z方向上之凹處之深度相較於上表面側在底面側更深,能夠增大底面上之凹處之開口部之面積。藉由與安裝基板對向之底面上之凹處之開口部之面積變大,位於底面之接合構件之面積亦可增大。藉此,能夠增大位於與安裝基板對向之面之接合構件之面積,因此,能夠使發光裝置1000與安裝基板之接合強度提昇。 The bonding strength between the light-emitting device 1000 and the mounting substrate can be improved especially in the case of the side-emitting type. By making the depth of the recess in the Z direction deeper on the bottom side than on the upper surface side, the area of the opening of the recess on the bottom surface can be increased. By increasing the area of the opening of the recess on the bottom surface facing the mounting substrate, the area of the joint member located on the bottom surface can also be increased. Thereby, the area of the bonding member located on the surface facing the mounting substrate can be increased, and therefore the bonding strength between the light-emitting device 1000 and the mounting substrate can be improved.

Z方向上之凹處之最大深度較佳為Z方向上之基材之厚度之0.4倍至0.9倍。藉由凹處之深度深於基材之厚度之0.4倍,形成於凹處內之接合構件之體積增加,因此,能夠使發光裝置與安裝基板之接合強度提昇。藉由凹處之深度淺於基材之厚度之0.9倍,能夠抑制基材之強度下降。 The maximum depth of the recess in the Z direction is preferably 0.4 to 0.9 times the thickness of the substrate in the Z direction. By making the depth of the recess deeper than 0.4 times the thickness of the base material, the volume of the joint member formed in the recess is increased. Therefore, the joint strength between the light-emitting device and the mounting substrate can be improved. By making the depth of the recess shallower than 0.9 times the thickness of the base material, the decrease in strength of the base material can be suppressed.

如圖2B所示,凹處16較佳為具備自背面112於與底面113平行之方向(Z方向)上延伸之平行部161。藉由具備平行部161,即便背面上之凹處之開口部之面積相同,亦可增大凹處之體積。藉由增大凹處之體積,能夠增加可形成於凹處內之焊料等接合構件之量,因此,能夠使發光裝置1000與安裝基板之接合強度提昇。再者,於本說明書中,平行係指容許±3°左右之傾斜。又,剖面觀察時,凹處16具備自底面113向基材11之厚度變厚之方向傾斜之傾斜部162。傾斜部162可為直線,亦可彎曲。 As shown in FIG. 2B , the recess 16 preferably has a parallel portion 161 extending from the back surface 112 in a direction parallel to the bottom surface 113 (Z direction). By having the parallel portion 161, even if the area of the opening of the recess on the back surface is the same, the volume of the recess can be increased. By increasing the volume of the recess, the amount of joining components such as solder that can be formed in the recess can be increased, thereby improving the bonding strength between the light emitting device 1000 and the mounting substrate. Furthermore, in this manual, parallel means that an inclination of about ±3° is allowed. In addition, when viewed in cross section, the recess 16 has an inclined portion 162 that is inclined from the bottom surface 113 in the direction in which the thickness of the base material 11 becomes thicker. The inclined portion 162 may be straight or curved.

Y方向上之凹處之最大高度較佳為Y方向上之基材之厚度之0.3倍至0.75倍。藉由Y方向上之凹處之深度長於基材之厚度之0.3倍,形成於凹處 內之接合構件之體積增加,因此,能夠使發光裝置與安裝基板之接合強度提昇。藉由Y方向上之凹處之長度淺於基材之厚度之0.75倍,能夠抑制基材之強度下降。 The maximum height of the recess in the Y direction is preferably 0.3 to 0.75 times the thickness of the substrate in the Y direction. The recess is formed by the depth of the recess in the Y direction being longer than 0.3 times the thickness of the base material. The volume of the internal bonding component is increased, so the bonding strength between the light-emitting device and the mounting substrate can be improved. By making the length of the recess in the Y direction shorter than 0.75 times the thickness of the base material, the decrease in the strength of the base material can be suppressed.

如圖3A所示,於在背面有複數個凹處16之情形時,較佳為位於相對於與Y方向平行之基材之中心線3C而左右對稱的位置。藉由如此設定,於將發光裝置經由接合構件安裝於安裝基板時,自對準有效地發揮作用,而能夠將發光裝置精度良好地安裝於安裝範圍內。 As shown in FIG. 3A , when there are a plurality of recesses 16 on the back surface, it is preferable to locate them in a left-right symmetrical position with respect to the center line 3C of the base material parallel to the Y direction. With this setting, when the light-emitting device is mounted on the mounting substrate via the bonding member, self-alignment effectively functions, and the light-emitting device can be accurately mounted within the mounting range.

發光裝置亦可具備被覆第2配線13之一部分之絕緣膜18。藉由具備絕緣膜18,能夠實現背面上之絕緣性之確保及短路之防止。又,能夠防止第2配線自基材剝離。 The light-emitting device may also include an insulating film 18 covering a part of the second wiring 13 . By providing the insulating film 18, insulation on the back surface can be ensured and short circuit can be prevented. In addition, the second wiring can be prevented from peeling off from the base material.

於底面上,Z方向上之凹處之深度可大致固定,亦可為凹處之深度於中央及端部不同。較佳為如圖3B所示,於底面上,凹處16之中央之深度D1為Z方向上之凹處之最大深度。藉由如此設定,於底面上,於X方向之凹處之端部,能夠增加Z方向上之基材之厚度D2,因此,能夠使基材之強度提昇。再者,於本說明書中,中央係指容許5μm左右之變動。凹處16可藉由鑽孔器或雷射等公知之方法而形成。 On the bottom surface, the depth of the recess in the Z direction may be approximately constant, or the depth of the recess may be different at the center and at the ends. Preferably, as shown in FIG. 3B , on the bottom surface, the depth D1 of the center of the recess 16 is the maximum depth of the recess in the Z direction. By setting in this way, the thickness D2 of the base material in the Z direction can be increased at the end of the recess in the X direction on the bottom surface, and therefore the strength of the base material can be improved. In addition, in this specification, the center refers to an allowable variation of about 5 μm. The recess 16 can be formed by known methods such as drill or laser.

如圖3C所示,位於底面113側之反射構件40之長度方向之側面403較佳為於Z方向上向發光裝置1000之內側傾斜。藉由如此設定,於將發光裝置1000安裝於安裝基板時,位於底面113側之反射構件40之長度方向之側面403與安裝基板之接觸得到 抑制,而發光裝置1000之安裝姿勢容易穩定。位於上表面114側之反射構件40之長度方向之側面404較佳為於Z方向上向發光裝置1000之內側傾斜。藉由如此設定,反射構件40之側面與吸附噴嘴(吸嘴)之接觸得到抑制,而能夠抑制發光裝置1000之吸附時之反射構件40之損傷。如此,位於底面113側之反射構件40之長度方向之側面403及位於上表面114側之反射構件40之長度方向之側面404較佳為自背面於正面方向(Z方向)上向發光裝置1000之內側傾斜。反射構件40之傾斜角度θ可適當選擇,但就容易發揮此種效果及反射構件40之強度之觀點而言,較佳為0.3°以上且3°以下,更佳為0.5°以上且2°以下,進而更佳為0.7°以上且1.5°以下。又,較佳為使發光裝置1000之右側面與左側面為大致相同之形狀。藉由如此設定,能夠使發光裝置1000小型化。 As shown in FIG. 3C , the longitudinal side 403 of the reflective member 40 located on the bottom surface 113 side is preferably inclined toward the inside of the light emitting device 1000 in the Z direction. With this setting, when the light-emitting device 1000 is mounted on the mounting substrate, the longitudinal side 403 of the reflective member 40 located on the bottom surface 113 side is in contact with the mounting substrate. The installation posture of the light-emitting device 1000 is easily stabilized. The side surface 404 in the longitudinal direction of the reflective member 40 located on the upper surface 114 side is preferably inclined toward the inside of the light emitting device 1000 in the Z direction. By setting in this manner, the contact between the side surface of the reflective member 40 and the suction nozzle (suction nozzle) is suppressed, and damage to the reflective member 40 during suction of the light emitting device 1000 can be suppressed. In this way, the longitudinal side 403 of the reflective member 40 located on the bottom surface 113 side and the longitudinal side 404 of the reflective member 40 located on the upper surface 114 side are preferably directed from the back to the light emitting device 1000 in the front direction (Z direction). Medial slope. The inclination angle θ of the reflective member 40 can be appropriately selected, but from the viewpoint of easily exerting this effect and the strength of the reflective member 40, it is preferably 0.3° or more and 3° or less, and more preferably 0.5° or more and 2° or less. , more preferably 0.7° or more and 1.5° or less. In addition, it is preferable that the right side and the left side of the light emitting device 1000 have substantially the same shape. By setting in this manner, the light emitting device 1000 can be miniaturized.

較佳為,如圖4所示之基板10般,於正面觀察時,第1配線12具備Y方向之長度較短之窄幅部及Y方向之長度較長之寬幅部。窄幅部之Y方向之長度D3與寬幅部之Y方向之長度D4相比長度較短。窄幅部於正面觀察時,自通孔15之中心向X方向離開,且於X方向上位於發光元件之電極所在之部分。寬幅部於正面觀察時位於通孔15之中心。藉由第1配線12具備窄幅部,能夠縮小將發光元件之電極與第1配線電性連接之導電性接著構件於第1配線上潤濕擴散之面積。藉此,容易控制導電性接著構件之形狀。再者,第1配線之周緣部亦可為修圓角所成之形狀。 Preferably, like the substrate 10 shown in FIG. 4 , when viewed from the front, the first wiring 12 has a narrow portion with a short length in the Y direction and a wide portion with a long length in the Y direction. The Y-direction length D3 of the narrow-width portion is shorter than the Y-direction length D4 of the wide-width portion. When viewed from the front, the narrow-width portion is separated from the center of the through hole 15 in the X direction, and is located in the portion where the electrode of the light-emitting element is located in the X direction. The wide portion is located at the center of the through hole 15 when viewed from the front. Since the first wiring 12 has a narrow portion, the area where the conductive adhesive member electrically connecting the electrode of the light-emitting element and the first wiring is wetted and diffused on the first wiring can be reduced. This makes it easy to control the shape of the conductive adhesive member. Furthermore, the peripheral edge portion of the first wiring may be in a rounded shape.

如圖5A所示,第1配線、第2配線及或第3配線亦可具有配線主部12A及形成於配線主部12A上之鍍層12B。於本說明書中,配線係指第1配線、 第2配線及或第3配線。作為配線主部12A,可使用銅等公知之材料。藉由在配線主部12A上具有鍍層12B,能夠使配線之表面上之反射率提昇或抑制硫化。例如,亦可使包含磷之鍍鎳層120A位於配線主部12A上。鎳藉由含有磷而硬度提昇,因此,藉由包含磷之鍍鎳層120A位於配線主部12A上,配線之硬度提昇。藉此,能夠抑制於發光裝置之單片化等中將配線切斷時於配線產生毛邊。包含磷之鍍鎳層可藉由電鍍法形成,亦可藉由無電解鍍覆法形成。 As shown in FIG. 5A , the first wiring, the second wiring, and/or the third wiring may have a wiring main part 12A and a plating layer 12B formed on the wiring main part 12A. In this manual, wiring refers to the first wiring, 2nd wiring and/or 3rd wiring. As the wiring main part 12A, a well-known material such as copper can be used. By having the plating layer 12B on the wiring main part 12A, the reflectivity on the surface of the wiring can be improved or vulcanization can be suppressed. For example, the nickel plating layer 120A containing phosphorus may be provided on the wiring main part 12A. The hardness of nickel is increased by containing phosphorus. Therefore, since the nickel plating layer 120A containing phosphorus is located on the wiring main part 12A, the hardness of the wiring is increased. This can suppress the generation of burrs on the wiring when the wiring is cut during singulation of the light-emitting device or the like. The nickel plating layer containing phosphorus can be formed by electroplating or electroless plating.

較佳為如圖5A所示,使鍍金層120B位於鍍層12B之最表面。藉由鍍金層位於鍍層之最表面,可抑制第1配線12、第2配線13及或第3配線14之表面上之氧化、腐蝕,而獲得良好之焊接性。能夠使反射率提昇或抑制硫化。位於鍍層12B之最表面之鍍金層120B較佳為藉由電鍍法形成。電鍍法相較於無電解鍍覆法能夠減少硫等觸媒毒之含有。於使使用鉑系觸媒之加成反應型矽酮樹脂於與鍍金層相接之位置硬化之情形時,藉由電鍍法形成之鍍金層因硫之含有較少,故能夠抑制硫與鉑發生反應。藉此,能夠抑制使用鉑系觸媒之加成反應型矽酮樹脂發生硬化不良。於形成與包含磷之鍍鎳層120A相接之鍍金層120B之情形時,包含磷之鍍鎳層120A及鍍金層120B較佳為藉由電鍍法形成。藉由利用相同方法形成鍍層,能夠抑制發光裝置之製造成本。再者,所謂鍍鎳層,可含有鎳,所謂鍍金層,只要含有金即可,亦可含有其他材料。 Preferably, as shown in FIG. 5A , the gold plating layer 120B is located on the outermost surface of the plating layer 12B. Since the gold plating layer is located on the outermost surface of the plating layer, oxidation and corrosion on the surfaces of the first wiring 12, the second wiring 13, and/or the third wiring 14 can be suppressed, thereby achieving good solderability. Can improve reflectivity or inhibit vulcanization. The gold plating layer 120B located on the outermost surface of the plating layer 12B is preferably formed by electroplating. Compared with electroless plating, electroplating can reduce the content of catalyst poisons such as sulfur. When the addition reaction type silicone resin using a platinum-based catalyst is hardened at the position in contact with the gold plating layer, the gold plating layer formed by the electroplating method contains less sulfur, so it can suppress the occurrence of sulfur and platinum. reaction. This can prevent the addition reaction type silicone resin using a platinum-based catalyst from curing failure. When forming the gold plating layer 120B in contact with the nickel plating layer 120A containing phosphorus, the nickel plating layer 120A and the gold plating layer 120B containing phosphorus are preferably formed by electroplating. By using the same method to form the plating layer, the manufacturing cost of the light-emitting device can be suppressed. Furthermore, the so-called nickel plating layer may contain nickel, and the so-called gold plating layer may contain gold or other materials.

包含磷之鍍鎳層之厚度較佳為厚於鍍金層之厚度。藉由包含磷之鍍鎳層之厚度厚於鍍金層之厚度,容易使第1配線12、第2配線13及或第3配 線14之硬度提昇。包含磷之鍍鎳層之厚度較佳為鍍金層之厚度之5倍以上且500倍以下,更佳為10倍以上且100倍以下。 The thickness of the nickel plating layer containing phosphorus is preferably thicker than the thickness of the gold plating layer. Since the thickness of the nickel plating layer containing phosphorus is thicker than the thickness of the gold plating layer, it is easy to make the first wiring 12 , the second wiring 13 and/or the third wiring The hardness of line 14 is increased. The thickness of the nickel plating layer containing phosphorus is preferably not less than 5 times and not more than 500 times the thickness of the gold plating layer, more preferably not less than 10 times and not more than 100 times.

如圖5B所示之發光裝置1000C般,配線亦可於配線主部12A上形成包含磷之鍍鎳層120C、鍍鈀層120D、第1鍍金層120E及第2鍍金層120F積層而成之鍍層12B。藉由包含磷之鍍鎳層120C、鍍鈀層120D、第1鍍金層120E及第2鍍金層120F進行積層,能夠抑制例如於配線主部12A使用銅之情形時銅擴散至鍍層12B中。藉此,能夠抑制鍍層之各層之密接性下降。亦可於配線主部12A上藉由無電解鍍覆法形成包含磷之鍍鎳層120C、鍍鈀層120D及第1鍍金層120E,並藉由電鍍法形成第2鍍金層120F。藉由利用電鍍法形成之第2鍍金層120F位於最表面,能夠抑制使用鉑系觸媒之加成反應型矽酮樹脂之硬化不良。 Like the light-emitting device 1000C shown in FIG. 5B , the wiring may also form a plating layer composed of a nickel plating layer 120C containing phosphorus, a palladium plating layer 120D, a first gold plating layer 120E, and a second gold plating layer 120F on the wiring main part 12A. 12B. By laminating the nickel plating layer 120C, the palladium plating layer 120D, the first gold plating layer 120E, and the second gold plating layer 120F containing phosphorus, for example, when copper is used for the main wiring portion 12A, diffusion of copper into the plating layer 12B can be suppressed. Thereby, it is possible to suppress a decrease in the adhesion of each layer of the plating layer. Alternatively, the nickel plating layer 120C containing phosphorus, the palladium plating layer 120D, and the first gold plating layer 120E may be formed on the main wiring portion 12A by electroless plating, and the second gold plating layer 120F may be formed by electroplating. Since the second gold plating layer 120F formed by the electroplating method is located on the outermost surface, it is possible to suppress curing failure of the addition reaction type silicone resin using a platinum-based catalyst.

以下,對本發明之一實施形態之發光裝置中之各構成要素進行說明。 Hereinafter, each component of the light-emitting device according to an embodiment of the present invention will be described.

(發光元件20) (Light-emitting element 20)

發光元件20係藉由施加電壓而自發光之半導體元件,可應用由氮化物半導體等構成之已知之半導體元件。作為發光元件20,例如可列舉LED(Light-Emitting Diode,發光二極體)晶片。發光元件20至少具備半導體積層體23,於多數情形時,進而具備元件基板24。發光元件之俯視形狀較佳為矩形、尤其是正方形狀或於一方向上較長之長方形狀,但亦可為其他形狀,例如只要為六邊形狀則亦能夠提高發光效率。發光元件之側 面可相對於上表面垂直,亦可向內側或外側傾斜。又,發光元件具有正負電極。正負電極可由金、銀、錫、鉑、銠、鈦、鋁、鎢、鈀、鎳或該等之合金構成。發光元件之發光峰值波長根據半導體材料或其混晶比,選擇範圍可為紫外線區域至紅外線區域。作為半導體材料,較佳為使用作為能夠發出能夠效率良好地激發波長轉換粒子之短波長之光之材料的氮化物半導體。氮化物半導體主要由通式InxAlyGa1-x-yN(0≦x、0≦y、x+y≦1)表示。發光元件之發光峰值波長就發光效率、以及波長轉換粒子之激發及與其發光之混色關係等之觀點而言,較佳為400nm以上且530nm以下,更佳為420nm以上且490nm以下,進而更佳為450nm以上且475nm以下。此外,亦可使用InAlGaAs系半導體、InAlGaP系半導體、硫化鋅、硒化鋅、碳化矽等。發光元件之元件基板係能夠使主要構成半導體積層體之半導體之晶體生長的晶體生長用基板,但亦可為供接合於自晶體生長用基板分離之半導體元件構造的接合用基板。藉由元件基板具有透光性,容易採用覆晶安裝,又,容易提高光之提取效率。作為元件基板之母材,可列舉藍寶石、氮化鎵、氮化鋁、矽、碳化矽、砷化鎵、磷化鎵、磷化銦、硫化鋅、氧化鋅、硒化鋅、鑽石等。其中,較佳為藍寶石。元件基板之厚度可適當選擇,例如為0.02mm以上且1mm以下,就元件基板之強度及/或發光裝置之厚度之觀點而言,較佳為0.05mm以上且0.3mm以下。 The light-emitting element 20 is a semiconductor element that emits light by itself by applying a voltage, and a known semiconductor element composed of a nitride semiconductor or the like can be applied. An example of the light-emitting element 20 is an LED (Light-Emitting Diode) chip. The light-emitting element 20 includes at least a semiconductor laminated body 23 and, in many cases, an element substrate 24 . The top view shape of the light-emitting element is preferably a rectangular shape, especially a square shape or a rectangular shape that is longer in one direction, but it can also be in other shapes. For example, as long as it is a hexagonal shape, the luminous efficiency can also be improved. The side of the light-emitting element can be perpendicular to the upper surface, or can be inclined inward or outward. In addition, the light-emitting element has positive and negative electrodes. The positive and negative electrodes may be made of gold, silver, tin, platinum, rhodium, titanium, aluminum, tungsten, palladium, nickel or alloys thereof. The luminescence peak wavelength of the light-emitting element depends on the semiconductor material or its mixed crystal ratio, and the selection range can be from the ultraviolet region to the infrared region. As the semiconductor material, it is preferable to use a nitride semiconductor, which is a material capable of emitting short-wavelength light that can efficiently excite wavelength conversion particles. Nitride semiconductors are mainly represented by the general formula In x Aly Ga 1-xy N (0≦x, 0≦y, x+y≦1). The luminescence peak wavelength of the light-emitting element is preferably 400 nm or more and 530 nm or less, more preferably 420 nm or more and 490 nm or less, and still more preferably 400 nm or more and 490 nm or less, from the viewpoint of luminous efficiency, excitation of wavelength conversion particles, and color mixing relationship with their luminescence. Above 450nm and below 475nm. In addition, InAlGaAs-based semiconductors, InAlGaP-based semiconductors, zinc sulfide, zinc selenide, silicon carbide, etc. can also be used. The element substrate of the light-emitting element is a crystal growth substrate capable of growing semiconductor crystals that mainly constitute the semiconductor laminate, but may also be a bonding substrate for bonding to a semiconductor element structure separated from the crystal growth substrate. Because the component substrate is light-transmissive, flip-chip mounting is easy, and the light extraction efficiency is easily improved. Examples of base materials for component substrates include sapphire, gallium nitride, aluminum nitride, silicon, silicon carbide, gallium arsenide, gallium phosphide, indium phosphide, zinc sulfide, zinc oxide, zinc selenide, diamond, etc. Among them, sapphire is preferred. The thickness of the element substrate can be appropriately selected, for example, 0.02 mm or more and 1 mm or less. From the viewpoint of the strength of the element substrate and/or the thickness of the light-emitting device, it is preferably 0.05 mm or more and 0.3 mm or less.

(第1波長轉換構件31) (First wavelength conversion member 31)

第1波長轉換構件係設置於發光元件上之構件。第1波長轉換構件包含第1母材及第1波長轉換粒子。 The first wavelength conversion member is a member provided on the light-emitting element. The first wavelength conversion member includes a first base material and first wavelength conversion particles.

(第1波長轉換粒子311) (First wavelength conversion particle 311)

第1波長轉換粒子吸收發光元件發出之一次光之至少一部分,而發出與一次光不同之波長之二次光。第1波長轉換粒子可單獨使用以下所示之具體例中之1種或將2種以上組合而使用。 The first wavelength conversion particles absorb at least part of the primary light emitted by the light-emitting element and emit secondary light of a different wavelength from the primary light. The first wavelength conversion particles can be used alone or in combination of two or more types among the specific examples shown below.

作為第1波長轉換粒子,可使用發綠色光之波長轉換粒子、發黃色光之波長轉換粒子及或發紅色光之波長轉換粒子等公知之波長轉換粒子。例如,作為發綠色光之波長轉換粒子,可列舉釔-鋁-石榴石系螢光體(例如Y3(Al,Ga)5O12:Ce)、鎦-鋁-石榴石系螢光體(例如Lu3(Al,Ga)5O12:Ce)、鋱-鋁-石榴石系螢光體(例如Tb3(Al,Ga)5O12:Ce)系螢光體、矽酸鹽系螢光體(例如(Ba,Sr)2SiO4:Eu)、氯矽酸鹽系螢光體(例如Ca8Mg(SiO4)4Cl2:Eu)、β賽隆系螢光體(例如Si6-zAlzOzN8-z:Eu(0<z<4.2))、SGS系螢光體(例如SrGa2S4:Eu)等。作為發黃色光之波長轉換粒子,可列舉α賽隆系螢光體(例如Mz(Si,Al)12(O,N)16(其中,0<z≦2,M為Li、Mg、Ca、Y以及除La及Ce以外之鑭系元素)等。此外,上述發綠色光之波長轉換粒子之中亦有發黃色光之波長轉換粒子。又,例如,釔-鋁-石榴石系螢光體可藉由以Gd取代Y之一部分而使發光峰值波長向長波長側位移,從而能夠發黃色光。又,該等之中,亦有能夠發橙色光之波長轉換粒子。作為發紅色光之波長轉換粒子,可列舉含氮鋁矽酸鈣(CASN或SCASN)系螢光體(例如(Sr,Ca)AlSiN3:Eu)等。此外,可列舉錳活化氟化物系螢光體(通式(I)A2[M1-aMnaF6]所示之螢光體(其中,上述通式(I)中,A係選自由K、Li、Na、Rb、Cs及NH4所組成之群中之至少1種,M係選自由第4族元素及第14族元素所組成之群中之至少1種元素,a滿足0<a<0.2))。作為該錳 活化氟化物系螢光體之代表例,有錳活化氟化矽酸鉀之螢光體(例如K2SiF6:Mn)。 As the first wavelength converting particles, known wavelength converting particles such as wavelength converting particles that emit green light, wavelength converting particles that emit yellow light, or wavelength converting particles that emit red light can be used. For example, as wavelength conversion particles that emit green light, yttrium-aluminum-garnet phosphors (for example, Y 3 (Al, Ga) 5 O 12 :Ce), phosphorus-aluminum-garnet phosphors (e.g., For example, Lu 3 (Al, Ga) 5 O 12 : Ce), tungsten-aluminum-garnet phosphor (for example, Tb 3 (Al, Ga) 5 O 12 : Ce) phosphor, silicate phosphor Phosphor (e.g. (Ba,Sr) 2 SiO 4 : Eu), chlorosilicate phosphor (e.g. Ca 8 Mg (SiO 4 ) 4 Cl 2 : Eu), β-sialon phosphor (e.g. Si 6-z Al z O z N 8-z : Eu (0<z<4.2)), SGS-based phosphor (for example, SrGa 2 S 4 : Eu), etc. Examples of wavelength converting particles that emit yellow light include α-sialon phosphors (for example, M z (Si, Al) 12 (O, N) 16 (where 0<z≦2, M is Li, Mg, Ca , Y and lanthanoid elements other than La and Ce), etc. In addition, among the above-mentioned wavelength conversion particles that emit green light, there are also wavelength conversion particles that emit yellow light. Also, for example, yttrium-aluminum-garnet fluorescent By substituting a part of Y with Gd, the luminescence peak wavelength can be shifted to the longer wavelength side, thereby emitting yellow light. Among these, there are also wavelength conversion particles that can emit orange light. As for those that emit red light Examples of the wavelength conversion particles include nitrogen-containing calcium aluminum silicate (CASN or SCASN) phosphors (for example, (Sr,Ca)AlSiN 3 :Eu). In addition, examples include manganese-activated fluoride phosphors (general formula (I) Phosphor represented by A 2 [M 1-a Mn a F 6 ] (wherein, in the above general formula (I), A is selected from the group consisting of K, Li, Na, Rb, Cs and NH 4 At least one element from the group, M is selected from at least one element from the group consisting of Group 4 elements and Group 14 elements, a satisfies 0<a<0.2)). As the manganese-activated fluoride series A representative example of the phosphor is a manganese-activated potassium fluorosilicate phosphor (for example, K 2 SiF 6 :Mn).

(第1母材312) (1st base material 312)

第1母材312只要為對自發光元件發出之光具有透光性者即可。再者,「透光性」係指發光元件之發光峰值波長下之透光率較佳為60%以上、更佳為70%以上、進而更佳為80%以上。第1母材可使用矽酮樹脂、環氧樹脂、酚系樹脂、聚碳酸酯樹脂、丙烯酸系樹脂、或該等之改性樹脂。亦可為玻璃。其中,矽酮樹脂及改性矽酮樹脂係耐熱性及耐光性優異而較佳。作為具體之矽酮樹脂,可列舉二甲基矽酮樹脂、苯基甲基矽酮樹脂、二苯基矽酮樹脂。再者,本說明書中之「改性樹脂」包含混成樹脂。 The first base material 312 only needs to be translucent to the light emitted by the self-luminous element. Furthermore, "light transmittance" means that the light transmittance at the peak emission wavelength of the light-emitting element is preferably 60% or more, more preferably 70% or more, and still more preferably 80% or more. As the first base material, silicone resin, epoxy resin, phenolic resin, polycarbonate resin, acrylic resin, or modified resins thereof can be used. It can also be glass. Among them, silicone resin and modified silicone resin are preferred because of their excellent heat resistance and light resistance. Specific silicone resins include dimethyl silicone resin, phenylmethyl silicone resin, and diphenyl silicone resin. Furthermore, "modified resin" in this specification includes mixed resin.

第1母材亦可於上述樹脂或玻璃中含有各種擴散粒子。作為擴散粒子,可列舉氧化矽、氧化鋁、氧化鋯、氧化鋅等。擴散粒子可單獨使用該等中之1種或將該等中之2種以上組合而使用。尤佳為熱膨脹係數較小之氧化矽。又,亦可藉由使用奈米粒子作為擴散粒子,使發光元件發出之光之散射增大,而減少波長轉換粒子之使用量。 The first base material may contain various diffusion particles in the above-mentioned resin or glass. Examples of diffusion particles include silicon oxide, aluminum oxide, zirconium oxide, zinc oxide, and the like. As the diffusion particles, one of these may be used alone or two or more of these may be used in combination. Silicon oxide with a small thermal expansion coefficient is particularly preferred. In addition, nanoparticles can also be used as diffusion particles to increase the scattering of light emitted by the light-emitting element and reduce the amount of wavelength conversion particles used.

(導光構件50) (Light guide member 50)

導光構件係將發光元件與透光性構件接著並將來自發光元件之光導光至透光性構件之構件。導光構件之母材可列舉矽酮樹脂、環氧樹脂、酚系樹脂、聚碳酸酯樹脂、丙烯酸系樹脂、或該等之改性樹脂。其中,矽酮樹脂及改性矽酮樹脂係耐熱性及耐光性優異而較佳。作為具體之矽酮樹 脂,可列舉二甲基矽酮樹脂、苯基甲基矽酮樹脂、二苯基矽酮樹脂。又,導光構件之母材亦可與上述第1母材同樣地含有擴散粒子。 The light guide member is a member that connects the light-emitting element and the translucent member and guides the light from the light-emitting element to the translucent member. Examples of the base material of the light guide member include silicone resin, epoxy resin, phenol resin, polycarbonate resin, acrylic resin, or modified resins thereof. Among them, silicone resin and modified silicone resin are preferred because of their excellent heat resistance and light resistance. silicone tree Examples of the resin include dimethyl silicone resin, phenyl methyl silicone resin, and diphenyl silicone resin. Moreover, the base material of the light guide member may also contain diffusion particles similarly to the said 1st base material.

(反射構件) (reflective component)

關於反射構件,就向Z方向之光提取效率之觀點而言,發光元件之發光峰值波長下之光反射率較佳為70%以上,更佳為80%以上,進而更佳為90%以上。進而,反射構件較佳為白色。由此,反射構件較佳為於母材中含有白色顏料而成。反射構件於硬化前經過液狀之狀態。反射構件可藉由轉注成形、射出成形、壓縮成形、灌注等而形成。 Regarding the reflective member, from the viewpoint of light extraction efficiency in the Z direction, the light reflectivity at the peak wavelength of light emission of the light-emitting element is preferably 70% or more, more preferably 80% or more, and further more preferably 90% or more. Furthermore, the reflective member is preferably white. Therefore, it is preferable that the reflective member contains a white pigment in the base material. The reflective member passes through a liquid state before hardening. The reflective member can be formed by transfer molding, injection molding, compression molding, infusion, or the like.

(反射構件之母材) (base material of reflective components)

反射構件之母材可使用樹脂,例如可列舉矽酮樹脂、環氧樹脂、酚系樹脂、聚碳酸酯樹脂、丙烯酸系樹脂、或該等之改性樹脂。其中,矽酮樹脂及改性矽酮樹脂係耐熱性及耐光性優異而較佳。作為具體之矽酮樹脂,可列舉二甲基矽酮樹脂、苯基甲基矽酮樹脂、二苯基矽酮樹脂。 Resin can be used as the base material of the reflective member, and examples include silicone resin, epoxy resin, phenol resin, polycarbonate resin, acrylic resin, or modified resins thereof. Among them, silicone resin and modified silicone resin are preferred because of their excellent heat resistance and light resistance. Specific silicone resins include dimethyl silicone resin, phenylmethyl silicone resin, and diphenyl silicone resin.

(白色顏料) (white pigment)

白色顏料可單獨使用氧化鈦、氧化鋅、氧化鎂、碳酸鎂、氫氧化鎂、碳酸鈣、氫氧化鈣、矽酸鈣、矽酸鎂、鈦酸鋇、硫酸鋇、氫氧化鋁、氧化鋁、氧化鋯、氧化矽中之1種或將該等中之2種以上組合而使用。白色顏料之形狀可適當選擇,亦可為不定形或破碎狀,但就流動性之觀點而言較佳為球狀。又,白色顏料之粒徑例如可列舉0.1μm以上且0.5μm以下左右,為了提高光反射或被覆之效果,越小越佳。反射構件中之白色顏料之 含量可適當選擇,但就光反射性及液狀時之黏度等觀點而言,例如較佳為10wt%以上且80wt%以下,更佳為20wt%以上且70wt%以下,進而更佳為30wt%以上且60wt%以下。再者,「wt%」係重量百分比,指該材料之重量相對於反射構件之總重量之比率。 White pigments can be used alone: titanium oxide, zinc oxide, magnesium oxide, magnesium carbonate, magnesium hydroxide, calcium carbonate, calcium hydroxide, calcium silicate, magnesium silicate, barium titanate, barium sulfate, aluminum hydroxide, aluminum oxide, One of zirconium oxide and silicon oxide, or two or more of them are used in combination. The shape of the white pigment can be appropriately selected and may be amorphous or broken, but from the viewpoint of fluidity, a spherical shape is preferred. In addition, the particle size of the white pigment is, for example, about 0.1 μm or more and 0.5 μm or less. In order to improve the light reflection or coating effect, the smaller the particle size, the better. of white pigments in reflective components The content can be appropriately selected, but from the viewpoint of light reflectivity and viscosity in liquid form, for example, it is preferably 10 wt% or more and 80 wt% or less, more preferably 20 wt% or more and 70 wt% or less, and still more preferably 30 wt%. Above and below 60wt%. Furthermore, "wt%" refers to the weight percentage, which refers to the ratio of the weight of the material to the total weight of the reflective component.

(第2波長轉換構件32) (Second wavelength conversion member 32)

第2波長轉換構件可使用與第1波長轉換構件相同之材料。 The second wavelength conversion member may be made of the same material as the first wavelength conversion member.

(被覆構件33) (covered member 33)

第2波長轉換構件可使用與第1母材相同之材料。 The second wavelength conversion member can be made of the same material as the first base material.

(基板10) (Substrate 10)

基板10係載置發光元件之構件。基板10由基材11、第1配線12、第2配線13、第3配線14及通孔15構成。 The substrate 10 is a member on which the light-emitting element is mounted. The substrate 10 is composed of a base material 11 , a first wiring 12 , a second wiring 13 , a third wiring 14 , and a through hole 15 .

(基材11) (Substrate 11)

基材11可使用樹脂或纖維強化樹脂、陶瓷、玻璃等絕緣性構件而構成。作為樹脂或纖維強化樹脂,可列舉環氧、玻璃環氧、雙馬來醯亞胺三嗪(BT,Bismaleimide Triazine)、聚醯亞胺等。作為陶瓷,可列舉氧化鋁、氮化鋁、氧化鋯、氮化鋯、氧化鈦、氮化鈦、或該等之混合物等。該等基材之中,尤佳為使用具有接近發光元件之線膨脹係數之物性的基材。基材之厚度之下限值可適當選擇,但就基材之強度之觀點而言,較佳為0.05mm以上,更佳為0.2mm以上。又,就發光裝置之厚度(深度)之觀點 而言,基材之厚度之上限值較佳為0.5mm以下,更佳為0.4mm以下。 The base material 11 can be made of an insulating member such as resin, fiber-reinforced resin, ceramics, or glass. Examples of the resin or fiber-reinforced resin include epoxy, glass epoxy, bismaleimide triazine (BT, Bismaleimide Triazine), polyimide, and the like. Examples of ceramics include alumina, aluminum nitride, zirconium oxide, zirconium nitride, titanium oxide, titanium nitride, or mixtures thereof. Among these base materials, it is particularly preferable to use a base material having physical properties close to the linear expansion coefficient of the light-emitting element. The lower limit of the thickness of the base material can be appropriately selected, but from the viewpoint of the strength of the base material, it is preferably 0.05 mm or more, and more preferably 0.2 mm or more. Also, from the perspective of the thickness (depth) of the light-emitting device Specifically, the upper limit of the thickness of the base material is preferably 0.5 mm or less, more preferably 0.4 mm or less.

(第1配線12、第2配線13、第3配線14) (1st wiring 12, 2nd wiring 13, 3rd wiring 14)

第1配線配置於基板之正面,與發光元件電性連接。第2配線配置於基板之背面,經由通孔而與第1配線電性連接。第3配線被覆凹處之內壁,與第2配線電性連接。第1配線、第2配線及第3配線可由銅、鐵、鎳、鎢、鉻、鋁、銀、金、鈦、鈀、銠、或該等之合金形成。可為該等金屬或合金之單層,亦可為多層。就散熱性之觀點而言尤佳為銅或銅合金。又,就導電性接著構件之潤濕性及/或光反射性等觀點而言,亦可於第1配線及/或第2配線之表層設置銀、鉑、鋁、銠、金或該等之合金等之層。 The first wiring is arranged on the front surface of the substrate and is electrically connected to the light-emitting element. The second wiring is arranged on the back surface of the substrate and is electrically connected to the first wiring through the through hole. The third wiring covers the inner wall of the recess and is electrically connected to the second wiring. The first wiring, the second wiring, and the third wiring may be formed of copper, iron, nickel, tungsten, chromium, aluminum, silver, gold, titanium, palladium, rhodium, or alloys thereof. It can be a single layer of these metals or alloys, or it can be multiple layers. From the viewpoint of heat dissipation, copper or copper alloy is particularly preferred. In addition, from the viewpoint of wettability and/or light reflectivity of the conductive adhesive member, silver, platinum, aluminum, rhodium, gold or the like may be provided on the surface of the first wiring and/or the second wiring. Alloy etc. layer.

(通孔15) (Through hole 15)

通孔15係設置於貫通基材11之正面及背面之孔內而將第1配線與上述第2配線電性連接之構件。通孔15亦可由被覆基材之貫通孔之表面之第4配線151及填充至第4配線內151之填充構件152構成。第4配線151可使用與第1配線、第2配線及第3配線相同之導電性構件。填充構件152可使用導電性之構件,亦可使用絕緣性之構件。 The through hole 15 is a member provided in a hole penetrating the front and back surfaces of the base material 11 to electrically connect the first wiring and the second wiring. The through hole 15 may be composed of a fourth wiring 151 covering the surface of the through hole of the base material and a filling member 152 filled in the fourth wiring 151 . The fourth wiring 151 can use the same conductive member as the first wiring, the second wiring, and the third wiring. The filling member 152 may be a conductive member or an insulating member.

(絕緣膜18) (Insulation film 18)

絕緣膜18係實現背面上之絕緣性之確保及短路之防止的構件。絕緣膜可由該領域中使用之任一種形成。例如,可列舉熱固性樹脂或熱塑性樹脂等。 The insulating film 18 is a member that ensures insulation on the back surface and prevents short circuits. The insulating film can be formed of any one used in this field. Examples include thermosetting resins, thermoplastic resins, and the like.

(導電性接著構件60) (Conductive adhesive member 60)

導電性接著構件係指將發光元件之電極與第1配線電性連接之構件。作為導電性接著構件,可使用金、銀、銅等之凸塊、包含銀、金、銅、鉑、鋁、鈀等之金屬粉末及樹脂黏合劑之金屬膏、錫-鉍系、錫-銅系、錫-銀系、金-錫系等之焊料、低熔點金屬等釺料中之任一種。 The conductive bonding member refers to a member that electrically connects the electrode of the light-emitting element and the first wiring. As the conductive adhesive member, bumps of gold, silver, copper, etc., metal pastes containing metal powders of silver, gold, copper, platinum, aluminum, palladium, etc. and resin binders, tin-bismuth series, and tin-copper can be used. Any of solders such as tin-silver series, gold-tin series, low melting point metals, etc.

[產業上之可利用性] [Industrial availability]

本發明之一實施形態之發光裝置可用於液晶顯示器之背光源裝置、各種照明器具、大型顯示器、廣告或目的地引導等之各種顯示裝置、投影機裝置,進而數位攝錄影機、傳真機、影印機、掃描儀等中之圖像讀取裝置等。 The light-emitting device according to one embodiment of the present invention can be used in backlight devices of liquid crystal displays, various lighting fixtures, large displays, various display devices such as advertisements or destination guides, projector devices, and furthermore, digital video cameras, fax machines, Image reading devices in photocopiers, scanners, etc.

10‧‧‧基板 10‧‧‧Substrate

12‧‧‧第1配線 12‧‧‧1st wiring

13‧‧‧第2配線 13‧‧‧2nd wiring

14‧‧‧第3配線 14‧‧‧3rd wiring

15‧‧‧通孔 15‧‧‧Through hole

16‧‧‧凹處 16‧‧‧Recess

20‧‧‧發光元件 20‧‧‧Light-emitting components

21‧‧‧正負電極 21‧‧‧Positive and negative electrodes

22‧‧‧正負電極 22‧‧‧Positive and negative electrodes

23‧‧‧半導體積層體 23‧‧‧Semiconductor laminated body

24‧‧‧元件基板 24‧‧‧Component substrate

30‧‧‧透光性構件 30‧‧‧Transparent components

31‧‧‧第1波長轉換構件 31‧‧‧The first wavelength conversion component

32‧‧‧第2波長轉換構件 32‧‧‧Second wavelength conversion component

33‧‧‧被覆構件 33‧‧‧Covered components

40‧‧‧反射構件 40‧‧‧Reflective components

50‧‧‧導光構件 50‧‧‧Light guide component

111‧‧‧正面 111‧‧‧Front

112‧‧‧背面 112‧‧‧Back

121‧‧‧凸部 121‧‧‧Protrusion

151‧‧‧第4配線 151‧‧‧4th wiring

152‧‧‧填充構件 152‧‧‧Filling components

201‧‧‧第1面 201‧‧‧Side 1

202‧‧‧側面 202‧‧‧Side

203‧‧‧第2面 203‧‧‧Side 2

311‧‧‧第1波長轉換粒子 311‧‧‧The first wavelength conversion particle

312‧‧‧第1母材 312‧‧‧1st base material

321‧‧‧第2波長轉換粒子 321‧‧‧The second wavelength conversion particle

322‧‧‧第2母材 322‧‧‧Second base material

1000‧‧‧發光裝置 1000‧‧‧Light-emitting devices

X‧‧‧方向 X‧‧‧ direction

Y‧‧‧方向 Y‧‧‧ direction

Z‧‧‧方向 Z‧‧‧ direction

Claims (6)

一種發光裝置,其具備:發光元件,其具有第1面、位於上述第1面之相反側之第2面、及位於上述第1面與上述第2面之間之第1側面;導光構件,其被覆上述發光元件之上述第1側面;第1波長轉換構件,其位於上述第1面之上方,且含有第1母材及第1波長轉換粒子,上述第1波長轉換粒子為錳活化氟化物螢光體;第2波長轉換構件,其位於上述發光元件與上述第1波長轉換構件之間,包含第2母材及第2波長轉換粒子,上述第2波長轉換粒子具有較上述第1波長轉換粒子短之峰值波長;以及反射構件,其與上述發光元件之至少一部分相接;上述第2波長轉換構件具有與上述第1面對向之第3面、位於上述第3面之相反側之第4面、及位於上述第3面與上述第4面之間之第2側面,上述第1波長轉換構件具有與上述第4面對向之第5面、位於上述第5面之相反側之第6面、及位於上述第5面與上述第6面之間之第3側面,上述反射構件被覆上述導光構件、上述第2波長轉換構件之上述第2側面、及上述第1波長轉換構件之上述第3側面,上述第5面與上述第6面之間之距離,即上述第1波長轉換構件之厚度,為60μm以上且120μm以下,上述第1波長轉換粒子之平均粒徑為4μm以上且12μm以下,上述第1波長轉換粒子之中心粒徑為4μm以上且12μm以下,相對於上述第1波長轉換構件之總重量而言,上述第1波長轉換粒子 為60重量%以上且75重量%以下,上述第3面與上述第4面之間之距離,即上述第2波長轉換構件之厚度,為上述第1波長轉換構件之厚度之一半以下。 A light-emitting device provided with: a light-emitting element having a first surface, a second surface located on the opposite side of the first surface, and a first side surface located between the first surface and the second surface; a light guide member , which covers the first side of the light-emitting element; a first wavelength conversion member, which is located above the first side and contains a first base material and first wavelength conversion particles, and the first wavelength conversion particles are manganese-activated fluorine chemical phosphor; a second wavelength conversion member located between the above-mentioned light-emitting element and the above-mentioned first wavelength conversion member, including a second base material and second wavelength conversion particles, the above-mentioned second wavelength conversion particles having a wavelength greater than that of the above-mentioned first wavelength Conversion particles have a short peak wavelength; and a reflective member that is in contact with at least part of the above-mentioned light-emitting element; the above-mentioned second wavelength conversion member has a third surface facing the above-mentioned first surface and located on the opposite side of the above-mentioned third surface. The fourth side and the second side between the third side and the fourth side, the first wavelength conversion member has a fifth side facing the fourth side and located on the opposite side of the fifth side. The sixth surface and the third side surface located between the fifth surface and the sixth surface, the reflective member covers the second side surface of the light guide member, the second wavelength conversion member, and the first wavelength conversion member The distance between the above-mentioned third side, the above-mentioned fifth surface and the above-mentioned sixth surface, that is, the thickness of the above-mentioned first wavelength conversion member, is 60 μm or more and 120 μm or less, and the average particle diameter of the above-mentioned first wavelength conversion particles is 4 μm or more. and 12 μm or less, the central particle diameter of the first wavelength conversion particle is 4 μm or more and 12 μm or less, relative to the total weight of the first wavelength conversion member, the first wavelength conversion particle It is 60% by weight or more and 75% by weight or less, and the distance between the third surface and the fourth surface, that is, the thickness of the second wavelength conversion member, is less than half of the thickness of the first wavelength conversion member. 如請求項1之發光裝置,其中上述第1波長轉換粒子之平均粒徑小於上述第2波長轉換粒子之平均粒徑。 The light-emitting device of claim 1, wherein the average particle size of the first wavelength conversion particles is smaller than the average particle size of the second wavelength conversion particles. 如請求項1或2之發光裝置,其中上述第2波長轉換粒子為β賽隆系螢光體。 The light-emitting device of claim 1 or 2, wherein the second wavelength conversion particles are β-sialon phosphors. 如請求項1或2之發光裝置,其中上述第2波長轉換構件之厚度為20μm以上且60μm以下。 The light-emitting device of claim 1 or 2, wherein the thickness of the second wavelength conversion member is 20 μm or more and 60 μm or less. 如請求項1或2之發光裝置,其具備被覆上述第1波長轉換構件之被覆構件。 The light-emitting device according to claim 1 or 2, which includes a covering member covering the first wavelength conversion member. 如請求項1或2之發光裝置,其中上述第1波長轉換構件之體積基準之粒度分佈之標準偏差為0.3μm以下。 The light-emitting device of claim 1 or 2, wherein the standard deviation of the volume-based particle size distribution of the first wavelength conversion member is 0.3 μm or less.
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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7445155B2 (en) * 2021-06-21 2024-03-07 日亜化学工業株式会社 Fluoride phosphor and its manufacturing method, wavelength conversion member, and light emitting device

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002059982A1 (en) * 2001-01-24 2002-08-01 Nichia Corporation Light emitting diode, optical semiconductor elemet and epoxy resin composition suitable for optical semiconductor element and production methods therefor
WO2006077740A1 (en) * 2004-12-28 2006-07-27 Nichia Corporation Nitride phosphor, method for producing same and light-emitting device using nitride phosphor
US20140008683A1 (en) * 2010-12-03 2014-01-09 Osram Opto Semiconductors Gmbh Method for Producing a Semiconductor Chip Emitting Radiation, Semiconductor Chip Emitting Radiation, and Component Emitting Radiation
JP2016072379A (en) * 2014-09-29 2016-05-09 日亜化学工業株式会社 Light-emitting device and method of manufacturing the same
US20170186920A1 (en) * 2015-12-24 2017-06-29 Nichia Corporation Light emitting device using wavelength conversion member, method of manufacturing wavelength conversion member, and method of manufacturing light emitting device
US20170294561A1 (en) * 2016-04-06 2017-10-12 Nichia Corporation Light emitting device

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4473283B2 (en) 2006-03-31 2010-06-02 Dowaエレクトロニクス株式会社 Light emitting device and manufacturing method thereof
JP2009030042A (en) * 2007-06-29 2009-02-12 Mitsubishi Chemicals Corp Phosphor, method for producing phosphor, phosphor-containing composition, and light-emitting device
JP5523676B2 (en) * 2008-02-29 2014-06-18 日亜化学工業株式会社 Phosphor and light emitting device using the same
JP5832713B2 (en) * 2008-04-14 2015-12-16 日亜化学工業株式会社 Phosphor, light emitting device using the same, and method for producing phosphor
JP2010004035A (en) * 2008-05-22 2010-01-07 Mitsubishi Chemicals Corp Semiconductor light-emitting apparatus, illuminator, and image display apparatus
JPWO2009144922A1 (en) 2008-05-30 2011-10-06 株式会社東芝 White LED, backlight using the same, and liquid crystal display device
TWI381556B (en) 2009-03-20 2013-01-01 Everlight Electronics Co Ltd Light emitting diode package structure and manufacturing method thereof
JP5423120B2 (en) * 2009-04-17 2014-02-19 三菱化学株式会社 Semiconductor light emitting device
JP2011228344A (en) * 2010-04-15 2011-11-10 Hitachi Ltd Led light-emitting device
WO2012050199A1 (en) * 2010-10-15 2012-04-19 三菱化学株式会社 White light emitting device and lighting device
JP2012124191A (en) * 2010-12-06 2012-06-28 Citizen Electronics Co Ltd Light emitting device and manufacturing method of the same
JP5553741B2 (en) * 2010-12-22 2014-07-16 スタンレー電気株式会社 Light emitting device and manufacturing method thereof
JP5762044B2 (en) 2011-02-23 2015-08-12 三菱電機株式会社 Light emitting device, light emitting device group, and manufacturing method
US8742654B2 (en) 2011-02-25 2014-06-03 Cree, Inc. Solid state light emitting devices including nonhomogeneous luminophoric particle size layers
JP5741211B2 (en) * 2011-05-24 2015-07-01 大日本印刷株式会社 LED lead frame with reflector and manufacturing method of semiconductor device using the same
JP2013038187A (en) * 2011-08-05 2013-02-21 Stanley Electric Co Ltd Light-emitting device and method of manufacturing the same
TWI505515B (en) * 2011-08-19 2015-10-21 Epistar Corp Lighting emitting device and manufacturing method thereof
TWI447961B (en) * 2012-04-16 2014-08-01 Lextar Electronics Corp Light emitting diode packaging structure
DE102012107290A1 (en) * 2012-08-08 2014-02-13 Osram Opto Semiconductors Gmbh Optoelectronic semiconductor device, conversion agent platelets and method of making a conversion agent platelet
JP2014140015A (en) 2012-12-19 2014-07-31 Panasonic Corp Light emitting module and illumination light source using the same
JP6107510B2 (en) * 2013-07-25 2017-04-05 日亜化学工業株式会社 Light emitting device and manufacturing method thereof
US9660151B2 (en) * 2014-05-21 2017-05-23 Nichia Corporation Method for manufacturing light emitting device
US9929319B2 (en) * 2014-06-13 2018-03-27 General Electric Company LED package with red-emitting phosphors
JP6503929B2 (en) * 2014-06-30 2019-04-24 日亜化学工業株式会社 Semiconductor light emitting device
JP6492492B2 (en) * 2014-09-29 2019-04-03 日亜化学工業株式会社 Light emitting device and manufacturing method thereof
JP6484982B2 (en) * 2014-09-30 2019-03-20 日亜化学工業株式会社 Method for manufacturing light emitting device
JP6428194B2 (en) 2014-11-21 2018-11-28 日亜化学工業株式会社 Wavelength converting member, method for manufacturing the same, and light emitting device
US9716212B2 (en) * 2014-12-19 2017-07-25 Nichia Corporation Light emitting device
KR102528015B1 (en) * 2015-12-18 2023-05-10 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 Light emitting device and lighting system having thereof
JP6384508B2 (en) * 2016-04-06 2018-09-05 日亜化学工業株式会社 Light emitting device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002059982A1 (en) * 2001-01-24 2002-08-01 Nichia Corporation Light emitting diode, optical semiconductor elemet and epoxy resin composition suitable for optical semiconductor element and production methods therefor
WO2006077740A1 (en) * 2004-12-28 2006-07-27 Nichia Corporation Nitride phosphor, method for producing same and light-emitting device using nitride phosphor
US20140008683A1 (en) * 2010-12-03 2014-01-09 Osram Opto Semiconductors Gmbh Method for Producing a Semiconductor Chip Emitting Radiation, Semiconductor Chip Emitting Radiation, and Component Emitting Radiation
JP2016072379A (en) * 2014-09-29 2016-05-09 日亜化学工業株式会社 Light-emitting device and method of manufacturing the same
US20170186920A1 (en) * 2015-12-24 2017-06-29 Nichia Corporation Light emitting device using wavelength conversion member, method of manufacturing wavelength conversion member, and method of manufacturing light emitting device
US20170294561A1 (en) * 2016-04-06 2017-10-12 Nichia Corporation Light emitting device

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