TWI797153B - 搭配電性測試工具使用的套組和檢驗單元 - Google Patents
搭配電性測試工具使用的套組和檢驗單元 Download PDFInfo
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- TWI797153B TWI797153B TW107129934A TW107129934A TWI797153B TW I797153 B TWI797153 B TW I797153B TW 107129934 A TW107129934 A TW 107129934A TW 107129934 A TW107129934 A TW 107129934A TW I797153 B TWI797153 B TW I797153B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2503—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques for measuring voltage only, e.g. digital volt meters (DVM's)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
- G01R1/22—Tong testers acting as secondary windings of current transformers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/144—Measuring arrangements for voltage not covered by other subgroups of G01R15/14
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Measuring voltage only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/18—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of DC into AC, e.g. with choppers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/22—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of AC into DC
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measurement Of Current Or Voltage (AREA)
- Packages (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/694,456 | 2017-09-01 | ||
| US15/694,456 US10539643B2 (en) | 2017-09-01 | 2017-09-01 | Proving unit for use with electrical test tools |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201930895A TW201930895A (zh) | 2019-08-01 |
| TWI797153B true TWI797153B (zh) | 2023-04-01 |
Family
ID=63405026
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW107129934A TWI797153B (zh) | 2017-09-01 | 2018-08-28 | 搭配電性測試工具使用的套組和檢驗單元 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10539643B2 (https=) |
| EP (1) | EP3454065B1 (https=) |
| JP (1) | JP6980620B2 (https=) |
| CN (1) | CN109425781B (https=) |
| TW (1) | TWI797153B (https=) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6434456B2 (ja) * | 2016-06-23 | 2018-12-05 | 横河電機株式会社 | 絶縁電圧プローブ |
| US10742213B2 (en) * | 2017-06-20 | 2020-08-11 | Lumitex, Inc. | Non-contact proximity sensor |
| US11175314B2 (en) | 2018-04-06 | 2021-11-16 | STB Electrical Test Equipment, Inc. | Multimeter with a meter probe module and phasing probe module capable of wireless communication and taking measurements proximally |
| FR3110704B1 (fr) | 2020-05-20 | 2022-06-10 | Electricite De France | Mesure de la tension dans un câble mono-conducteur isolé |
| SE544739C2 (en) * | 2021-02-26 | 2022-11-01 | Husqvarna Ab | Handheld Power Tool with Fault Data Indication Device |
| FR3125594B3 (fr) * | 2021-07-23 | 2023-09-15 | Totalenergies Renewables | Circuit électrique de vérification pour pince ampèremétrique, pince ampèremétrique et procédé de vérification correspondants |
| EP4493941B1 (en) * | 2022-03-16 | 2025-10-29 | Fluke Corporation | Split insulated input post for electrical measurement tool |
| WO2024158435A1 (en) * | 2023-01-25 | 2024-08-02 | Power Probe Group, Inc. | Diagnostic probe apparatus and related systems and methods |
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| CN102636689A (zh) * | 2012-05-09 | 2012-08-15 | 中国人民解放军重庆通信学院 | 非接触式电力电压测量方法 |
| JP2016109474A (ja) * | 2014-12-03 | 2016-06-20 | 富士電機株式会社 | 非接触電圧センサ及び電力測定装置 |
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-
2017
- 2017-09-01 US US15/694,456 patent/US10539643B2/en active Active
-
2018
- 2018-08-24 EP EP18190649.6A patent/EP3454065B1/en active Active
- 2018-08-28 TW TW107129934A patent/TWI797153B/zh active
- 2018-08-31 JP JP2018163695A patent/JP6980620B2/ja active Active
- 2018-08-31 CN CN201811013058.4A patent/CN109425781B/zh active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0366360A1 (en) * | 1988-10-24 | 1990-05-02 | Edgcumbe Instruments Limited | Proving apparatus & method for high voltage detectors |
| TW512236B (en) * | 2000-06-19 | 2002-12-01 | Kyoritsu Elect Inst Work | Non-contact type current measuring instrument |
| JP2006242855A (ja) * | 2005-03-04 | 2006-09-14 | Nippon Telegraph & Telephone East Corp | 非接触型電圧検出方法及び非接触型電圧検出装置 |
| CN201289497Y (zh) * | 2008-02-01 | 2009-08-12 | 美特国际有限公司 | 非接触式探针 |
| CN102636689A (zh) * | 2012-05-09 | 2012-08-15 | 中国人民解放军重庆通信学院 | 非接触式电力电压测量方法 |
| JP2016109474A (ja) * | 2014-12-03 | 2016-06-20 | 富士電機株式会社 | 非接触電圧センサ及び電力測定装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US10539643B2 (en) | 2020-01-21 |
| JP2019053052A (ja) | 2019-04-04 |
| TW201930895A (zh) | 2019-08-01 |
| CN109425781B (zh) | 2022-05-24 |
| EP3454065B1 (en) | 2021-05-05 |
| JP6980620B2 (ja) | 2021-12-15 |
| EP3454065A1 (en) | 2019-03-13 |
| US20190072632A1 (en) | 2019-03-07 |
| CN109425781A (zh) | 2019-03-05 |
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