JP6980620B2 - 電気試験ツールとの使用のための検証ユニット - Google Patents

電気試験ツールとの使用のための検証ユニット Download PDF

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Publication number
JP6980620B2
JP6980620B2 JP2018163695A JP2018163695A JP6980620B2 JP 6980620 B2 JP6980620 B2 JP 6980620B2 JP 2018163695 A JP2018163695 A JP 2018163695A JP 2018163695 A JP2018163695 A JP 2018163695A JP 6980620 B2 JP6980620 B2 JP 6980620B2
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voltage
verification unit
contact
switch
measuring device
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JP2019053052A (ja
JP2019053052A5 (https=
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クラーク・エヌ・ハーバ
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Fluke Corp
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Fluke Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2503—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques for measuring voltage only, e.g. digital volt meters (DVM's)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/22—Tong testers acting as secondary windings of current transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/144—Measuring arrangements for voltage not covered by other subgroups of G01R15/14
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Measuring voltage only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/18—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of DC into AC, e.g. with choppers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/22—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of AC into DC
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Packages (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP2018163695A 2017-09-01 2018-08-31 電気試験ツールとの使用のための検証ユニット Active JP6980620B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/694,456 2017-09-01
US15/694,456 US10539643B2 (en) 2017-09-01 2017-09-01 Proving unit for use with electrical test tools

Publications (3)

Publication Number Publication Date
JP2019053052A JP2019053052A (ja) 2019-04-04
JP2019053052A5 JP2019053052A5 (https=) 2021-10-07
JP6980620B2 true JP6980620B2 (ja) 2021-12-15

Family

ID=63405026

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018163695A Active JP6980620B2 (ja) 2017-09-01 2018-08-31 電気試験ツールとの使用のための検証ユニット

Country Status (5)

Country Link
US (1) US10539643B2 (https=)
EP (1) EP3454065B1 (https=)
JP (1) JP6980620B2 (https=)
CN (1) CN109425781B (https=)
TW (1) TWI797153B (https=)

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US11175314B2 (en) 2018-04-06 2021-11-16 STB Electrical Test Equipment, Inc. Multimeter with a meter probe module and phasing probe module capable of wireless communication and taking measurements proximally
FR3110704B1 (fr) 2020-05-20 2022-06-10 Electricite De France Mesure de la tension dans un câble mono-conducteur isolé
SE544739C2 (en) * 2021-02-26 2022-11-01 Husqvarna Ab Handheld Power Tool with Fault Data Indication Device
FR3125594B3 (fr) * 2021-07-23 2023-09-15 Totalenergies Renewables Circuit électrique de vérification pour pince ampèremétrique, pince ampèremétrique et procédé de vérification correspondants
EP4493941B1 (en) * 2022-03-16 2025-10-29 Fluke Corporation Split insulated input post for electrical measurement tool
WO2024158435A1 (en) * 2023-01-25 2024-08-02 Power Probe Group, Inc. Diagnostic probe apparatus and related systems and methods

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Also Published As

Publication number Publication date
US10539643B2 (en) 2020-01-21
JP2019053052A (ja) 2019-04-04
TW201930895A (zh) 2019-08-01
CN109425781B (zh) 2022-05-24
EP3454065B1 (en) 2021-05-05
EP3454065A1 (en) 2019-03-13
TWI797153B (zh) 2023-04-01
US20190072632A1 (en) 2019-03-07
CN109425781A (zh) 2019-03-05

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