TWI781099B - 保護膜形成用膜、保護膜形成用複合片、以及能量線硬化性膜的用途 - Google Patents
保護膜形成用膜、保護膜形成用複合片、以及能量線硬化性膜的用途 Download PDFInfo
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- TWI781099B TWI781099B TW106113974A TW106113974A TWI781099B TW I781099 B TWI781099 B TW I781099B TW 106113974 A TW106113974 A TW 106113974A TW 106113974 A TW106113974 A TW 106113974A TW I781099 B TWI781099 B TW I781099B
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- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 239000001052 yellow pigment Substances 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
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- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/04—Coating
- C08J7/043—Improving the adhesiveness of the coatings per se, e.g. forming primers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/16—Layered products comprising a layer of synthetic resin specially treated, e.g. irradiated
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- C—CHEMISTRY; METALLURGY
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- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F2/00—Processes of polymerisation
- C08F2/46—Polymerisation initiated by wave energy or particle radiation
- C08F2/48—Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light
- C08F2/50—Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light with sensitising agents
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- C—CHEMISTRY; METALLURGY
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- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
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- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/04—Coating
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- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J201/00—Adhesives based on unspecified macromolecular compounds
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
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- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
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- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
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- Organic Chemistry (AREA)
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JP (1) | JP6971977B2 (ja) |
KR (1) | KR102407322B1 (ja) |
CN (1) | CN109071845B (ja) |
TW (1) | TWI781099B (ja) |
WO (1) | WO2017188231A1 (ja) |
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KR20200133288A (ko) * | 2019-05-16 | 2020-11-27 | 삼성디스플레이 주식회사 | 고분자 수지, 이를 포함하는 윈도우 모듈, 및 이를 포함하는 표시 장치 |
JP7288200B2 (ja) * | 2020-07-30 | 2023-06-07 | 日亜化学工業株式会社 | 発光装置および梱包体 |
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KR100815383B1 (ko) | 2006-12-28 | 2008-03-20 | 제일모직주식회사 | 점착필름 형성용 광경화성 조성물 및 이를 포함하는 다이싱다이본딩 필름 |
JP2010031183A (ja) | 2008-07-30 | 2010-02-12 | Furukawa Electric Co Ltd:The | エネルギー線硬化型チップ保護用フィルム |
JP5144433B2 (ja) * | 2008-08-28 | 2013-02-13 | 古河電気工業株式会社 | チップ保護用フィルム |
JP5048815B2 (ja) * | 2010-07-20 | 2012-10-17 | 日東電工株式会社 | フリップチップ型半導体裏面用フィルム、及び、ダイシングテープ一体型半導体裏面用フィルム |
TWI637439B (zh) * | 2012-12-14 | 2018-10-01 | 琳得科股份有限公司 | Protective film forming film |
KR20220035981A (ko) * | 2013-03-22 | 2022-03-22 | 린텍 가부시키가이샤 | 보호막 형성용 필름 및 보호막 형성용 복합 시트 |
WO2016027883A1 (ja) * | 2014-08-22 | 2016-02-25 | リンテック株式会社 | 保護膜形成用シートおよび保護膜付き半導体チップの製造方法 |
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KR20190002471A (ko) | 2019-01-08 |
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KR102407322B1 (ko) | 2022-06-10 |
TW201806767A (zh) | 2018-03-01 |
JPWO2017188231A1 (ja) | 2019-03-07 |
CN109071845A (zh) | 2018-12-21 |
CN109071845B (zh) | 2024-08-09 |
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