TWI771836B - Grinding mechanism and grinding apparatus - Google Patents
Grinding mechanism and grinding apparatus Download PDFInfo
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- TWI771836B TWI771836B TW109145538A TW109145538A TWI771836B TW I771836 B TWI771836 B TW I771836B TW 109145538 A TW109145538 A TW 109145538A TW 109145538 A TW109145538 A TW 109145538A TW I771836 B TWI771836 B TW I771836B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/02—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor involving a reciprocatingly-moved work-table
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B21/00—Machines or devices using grinding or polishing belts; Accessories therefor
- B24B21/008—Machines comprising two or more tools or having several working posts
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/005—Feeding or manipulating devices specially adapted to grinding machines
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/02—Frames; Beds; Carriages
Abstract
Description
本發明有關於一種研削機構及研削裝置。The present invention relates to a grinding mechanism and a grinding device.
在對例如樹脂密封基板等研削對象物進行研削的情況下,存在於粗研削之後進行精研削的情況。For example, when grinding an object to be ground such as a resin-sealed substrate, there is a case where fine grinding is performed after rough grinding.
而且,以前考慮粗研削及精研削利用分別不同的研削裝置來進行,或者在如專利文獻1所示的包括兩個平臺的半導體帶式研磨機中,在其中一個平臺上進行粗研削,且在另一個平臺上進行精研削。
[現有技術文獻]
[專利文獻]Furthermore, it has been considered that rough grinding and fine grinding are performed by separate grinding devices, or in a semiconductor tape grinder including two stages as shown in
[專利文獻1]日本專利第6181799號公報[Patent Document 1] Japanese Patent No. 6181799
[發明所要解決的問題]
然而,在利用不同的研削裝置來進行粗研削及精研削的情況、以及如專利文獻1那樣在不同的平臺上進行粗研削及精研削的情況中的任一情況下,均需要在粗研削後將研削對象物移載至另一平臺。如此一來,需要在移載後的平臺上再次進行對準。即便對準,在移載前後平臺的水平度也不完全相同,因此對固定於平臺上來研削的研削對象物的平坦度造成影響,導致粗研削時的研削對象物的平坦度與精研削時的研削對象物的平坦度改變。其結果為,存在研削精度變差的擔憂。尤其在研削對象物薄(例如,5 mm以下、1 mm以下)的情況下,此平坦度(研削精度)的問題重大。[Problems to be Solved by Invention]
However, in either the case where rough grinding and finish grinding are performed using different grinding devices, or the case where rough grinding and finish grinding are performed on different platforms as in
因此,本發明的主要課題為在對研削對象物的粗研削及精研削中使平坦度一定。Therefore, the main subject of this invention is to make the flatness constant in rough grinding and fine grinding of the grinding object.
[解決問題的技術手段] 即,本發明的研削機構包括:多個平臺,將板狀的研削對象物加以保持;至少一個粗研削部,對所述研削對象物進行粗研削;以及至少一個精研削部,對所述研削對象物進行精研削;並且在所述多個平臺的每一個上,所述粗研削部及所述精研削部構成為能夠移動。 本發明的研削裝置,包括所述研削機構。[Technical means to solve the problem] That is, the grinding mechanism of the present invention includes: a plurality of stages for holding a plate-shaped object to be ground; at least one rough grinding section for rough grinding the object to be ground; and at least one fine grinding section for grinding the object The object is subjected to fine grinding, and the rough grinding portion and the fine grinding portion are configured to be movable on each of the plurality of stages. The grinding apparatus of the present invention includes the grinding mechanism.
[發明的效果] 根據如上所述而構成的本發明,能夠在多個平臺的每一個中使粗研削及精研削的平坦度一定。[Effect of invention] According to this invention comprised as mentioned above, the flatness of rough grinding and finish grinding can be made constant in each of a some surface plate.
其次,關於本發明,舉例來進一步進行詳細說明。但,本發明不受以下說明所限定。Next, the present invention will be described in more detail by way of examples. However, the present invention is not limited by the following description.
本發明的研削機構如上所述,特徵在於包括:多個平臺,將板狀的研削對象物加以保持;至少一個粗研削部,對所述研削對象物進行粗研削;以及至少一個精研削部,對所述研削對象物進行精研削;並且在所述多個平臺的每一個上,所述粗研削部及所述精研削部構成為能夠移動。 若為此種研削機構,則在多個平臺的每一個上,粗研削部及精研削部構成為能夠移動,因此能夠以在各平臺上保持有研削對象物的狀態來進行粗研削及精研削這兩者。由此,不需要將研削對象物移載至不同的平臺,不需要在不同平臺上再次對準,能夠在多個平臺的每一個中使粗研削及精研削的平坦度一定。其結果為,能夠藉由將多個研削對象物同時進行研削而提高處理量(處理能力),並且能夠提高各平臺中的研削對象物的研削精度。As described above, the grinding mechanism of the present invention is characterized by comprising: a plurality of stages for holding a plate-shaped grinding object; at least one rough grinding section for rough grinding the grinding object; and at least one fine grinding section, Fine grinding is performed on the object to be ground, and the rough grinding portion and the fine grinding portion are configured to be movable on each of the plurality of stages. With this type of grinding mechanism, the rough grinding section and the fine grinding section are configured to be movable on each of the plurality of stages, so that the rough grinding and the fine grinding can be performed in a state where the object to be ground is held on each stage. both. This eliminates the need to transfer the object to be ground to a different stage, and does not need to align it again on a different stage, and the flatness of rough grinding and finish grinding can be made constant for each of the plurality of stages. As a result, the throughput (processing capacity) can be increased by simultaneously grinding a plurality of objects to be ground, and the grinding accuracy of the objects to be ground in each stage can be improved.
各平臺中,為了設為與其他平臺獨立地進行粗研削及精研削這兩者的結構,所述粗研削部及所述精研削部理想為與所述多個平臺分別對應而設置有多個。In each stage, in order to have a structure in which both rough grinding and fine grinding are performed independently from other stages, it is desirable that a plurality of the rough grinding portion and the fine grinding portion are provided corresponding to the plurality of stages, respectively. .
兩個平臺中,在其中一個平臺上進行粗研削時,在另一個平臺上進行精研削的情況(在兩個平臺上不在相同的時機進行粗研削或精研削的情況)下,不需要與兩個平臺分別對應而設置粗研削部及精研削部。因此,為了簡化結構,所述粗研削部或所述精研削部中的至少一者理想為在至少兩個所述平臺中共用。When rough grinding is performed on one of the two tables and fine grinding is performed on the other table (if the two tables do not perform rough grinding or fine grinding at the same timing), there is no need for the two tables. A rough grinding section and a fine grinding section are set up corresponding to each platform. Therefore, in order to simplify the structure, at least one of the rough grinding portion or the fine grinding portion is desirably shared by at least two of the platforms.
本發明的研削機構中,作為使多個平臺移動的具體實施方式,考慮研削機構還包括多個平臺移動部,所述平臺移動部設置於所述多個平臺的每一個上,且使所述平臺沿著一方向而在規定的範圍內進行直線往復移動。 In the grinding mechanism of the present invention, as a specific embodiment for moving the plurality of stages, it is considered that the grinding mechanism further includes a plurality of stage moving parts provided on each of the plurality of stages, and making the The stage reciprocates linearly within a predetermined range along one direction.
此結構中,作為所述粗研削部及所述精研削部的具體移動形態,考慮所述粗研削部及所述精研削部在將利用所述平臺移動部的所述平臺的往復移動方向橫切的方向上移動。較佳為考慮,所述粗研削部及所述精研削部在與所述平臺的往復移動方向正交的方向上移動。 In this configuration, as a specific movement form of the rough grinding part and the finishing grinding part, it is considered that the rough grinding part and the finishing grinding part traverse the reciprocating movement direction of the stage by the stage moving part. move in the direction of the cut. Preferably, the rough grinding portion and the fine grinding portion move in a direction orthogonal to the reciprocating direction of the table.
粗研削由於研削量增多,故而粗研削用研磨石的堵塞成為問題。因此,所述粗研削部理想為包括粗研削用研磨石的橫軸型的研削部。此外,橫軸型的研削部是研磨石的旋轉軸相對於平檯面而平行的研削方式。 In rough grinding, since the grinding amount increases, clogging of the grinding stone for rough grinding becomes a problem. Therefore, the rough grinding portion is desirably a horizontal axis-type grinding portion including a grinding stone for rough grinding. In addition, the horizontal axis type grinding part is a grinding method in which the rotation axis of the grinding stone is parallel to the table surface.
若為此結構,則能夠減少粗研削用研磨石的堵塞。 According to this structure, clogging of the grinding stone for rough grinding can be reduced.
另外,所述精研削部理想為包括精研削用研磨石的縱軸型的研削部。此外,縱軸型的研削部是研磨石的旋轉軸相對於平檯面而垂直的研削方式。 In addition, it is preferable that the said finish grinding part is a vertical axis|shaft type grinding part including the grindstone for finish grinding. In addition, the grinding part of the vertical axis type is a grinding method in which the rotation axis of the grinding stone is perpendicular to the table surface.
若為此結構,則能夠進行高精度的研削,研削面積大而能夠提高生產性。 With this structure, high-precision grinding can be performed, the grinding area is large, and productivity can be improved.
根據研削對象物的種類,粗研削用研磨石或精研削用研磨石的堵塞的問題變大。另外,還存在如例如僅使銅配線部或焊接部露出的研削對象物等那樣對研削精度的要求不太高的研削對象物。在如上所述的研削對象物的情況下,若使用粗研削用研磨石或精研削用研磨石,則運轉成本增大。 為了適當解決此問題,所述粗研削部或所述精研削部理想為使用無端帶狀的研削帶的帶式研削型的研削部。與粗研削用研磨石或精研削用研磨石相比,研削帶廉價,能夠實現大幅度的成本下降。另外,研削帶與粗研削用研磨石或精研削用研磨石相比,交換作業也容易。The problem of clogging of the grinding stone for rough grinding or the grinding stone for fine grinding increases depending on the type of the object to be ground. In addition, there are also objects to be ground that do not require too much grinding accuracy, such as objects to be ground such as those in which only copper wiring portions or soldered portions are exposed. In the case of the object to be ground as described above, if the grinding stone for rough grinding or the grinding stone for fine grinding is used, the running cost increases. In order to appropriately solve this problem, the rough grinding part or the fine grinding part is preferably a belt grinding type grinding part using an endless belt-shaped grinding belt. Compared with the grinding stone for rough grinding or the grinding stone for fine grinding, the grinding belt is inexpensive and can achieve significant cost reduction. In addition, the replacement work of the grinding belt is also easier than that of the grinding stone for rough grinding or the grinding stone for fine grinding.
為了能夠選擇與研削對象物的種類相應的研削形態,提高研削機構的通用性,所述粗研削部理想為構成為能夠以包括粗研削用研磨石的橫軸型的研削部以及使用無端帶狀的研削帶的帶式研削型的研削部的形式來進行變更,所述精研削部理想為構成為能夠以包括精研削用研磨石的縱軸型的研削部以及使用無端帶狀的研削帶的帶式研削型的研削部的形式來進行變更。In order to be able to select the grinding form according to the type of the object to be ground, and to improve the versatility of the grinding mechanism, the rough grinding section is desirably configured to be a horizontal axis type grinding section including a rough grinding stone or an endless belt-shaped grinding section. The form of the belt grinding type grinding part of the grinding belt is changed, and the finishing grinding part is ideally constituted so as to be able to use a vertical axis type grinding part including a grinding stone for finishing grinding and a grinding belt using an endless belt. The form of the grinding section of the belt grinding type is changed.
為了藉由穩定地支撐粗研削部及精研削部而提高研削精度,理想為還包括夾持所述多個平臺而設置的一對腳部、以及架設於所述一對腳部的連結梁部,並且所述粗研削部及所述精研削部以能夠移動的方式支撐於所述連結梁部。In order to improve the grinding accuracy by stably supporting the rough grinding part and the finishing grinding part, it is desirable to further include a pair of leg parts provided to sandwich the plurality of platforms, and a connecting beam part spanning the pair of leg parts. , and the rough grinding portion and the fine grinding portion are movably supported by the connecting beam portion.
此處,所述連結梁部中,理想為在近前側支撐所述粗研削部或所述精研削部中的一者,且在深處側支撐所述粗研削部或所述精研削部中的另一者。若為此結構,則在每個平臺上,能夠使由於連結梁部的撓曲等而受到的粗研削的不均相同,且能夠使由於連結梁部的撓曲等而受到的精研削的不均相同。Here, in the connection beam portion, it is desirable to support either the rough grinding portion or the fine grinding portion on the near side, and support the rough grinding portion or the fine grinding portion on the deep side. of the other. According to this structure, the unevenness of rough grinding due to the deflection of the connecting beam portion and the like can be made the same for each stage, and the difference of the fine grinding due to the deflection of the connecting beam portion, etc. can be made uniform. are the same.
除此以外,為了提高研削機構的通用性,理想為除了所述粗研削部及所述精研削部以外,還包括使用無端帶狀的研削帶的帶式研削部,並且在所述多個平臺的每一個上,所述帶式研削部構成為能夠移動。In addition, in order to improve the versatility of the grinding mechanism, it is desirable to include a belt grinding section using an endless belt-shaped grinding belt in addition to the rough grinding section and the finishing grinding section, and the plurality of stage On each of the above, the belt grinding section is configured to be movable.
為了抑制由毛刺所引起的研削不良,或者提高研削對象物的品質,研削機構理想為還包括進行所述研削對象物的去毛刺的去毛刺部,並且在所述多個平臺的每一個上,所述去毛刺部構成為能夠移動。In order to suppress poor grinding caused by burrs or to improve the quality of the object to be ground, it is desirable that the grinding mechanism further includes a deburring section for deburring the object to be ground, and on each of the plurality of stages, The deburring portion is configured to be movable.
另外,包括所述研削機構的研削裝置也為本發明的一形態。In addition, a grinding device including the above-mentioned grinding mechanism is also one aspect of the present invention.
<本發明的一實施方式> 以下,參照圖式來對本發明的研削裝置的一實施方式進行說明。此外,關於以下所示的任一圖,為了容易理解,而適當省略或者誇張地示意性描畫。關於同一構成元件,標注同一符號而適當省略說明。<One Embodiment of the Present Invention> Hereinafter, an embodiment of the grinding apparatus of the present invention will be described with reference to the drawings. In addition, about any figure shown below, in order to understand easily, it is abbreviate|omitted or exaggerated and a schematic drawing is shown suitably. About the same component, the same code|symbol is attached|subjected, and description is abbreviate|omitted suitably.
以下的說明中,作為板狀的研削對象物,以經樹脂密封的基板(密封完畢基板)為一例來進行說明。基板例如可列舉:玻璃環氧基板、陶瓷基板、樹脂基板、金屬基板等一般的基板以及引線框架等。除此以外,板狀的研削對象物也可為基板以外的對象。In the following description, as a plate-shaped grinding object, a resin-sealed substrate (sealed substrate) will be described as an example. Examples of the substrate include general substrates such as glass epoxy substrates, ceramic substrates, resin substrates, and metal substrates, and lead frames. In addition to this, the plate-shaped grinding object may be an object other than a substrate.
<研削裝置100的整體結構>
本實施方式的研削裝置100藉由對密封完畢基板W(以下簡稱為“基板W”)的表面進行平面研削,來進行基板W的高度調整(厚度調整)、或者搭載於基板W的電子零件的散熱性的提高等基板的改良。<Overall Structure of
具體而言,研削裝置100如圖1所示,包括:供給基板W的基板供給模塊100A、對基板W進行研削的基板研削模塊100B、對經研削的基板W進行洗滌的基板洗滌模塊100C、以及將經研削的基板W加以收納的基板收納模塊100D,來分別作為構成元件。各構成元件100A~100D能夠分別相對於其他構成元件而相互拆裝,且能夠更換。另外,在各模塊100A~100D間的基板W的移動是利用基板搬送機構100E和/或機械臂(未圖示)來進行。本實施方式的研削裝置100整體的動作是利用包括後述控制部9的控制機器CTL來控制。Specifically, as shown in FIG. 1 , the
基板供給模塊100A供給研削前的基板W(研削前基板)。具體而言,基板供給模塊100A包括供給基板W的研削前基板供給部11。The
基板研削模塊100B對由基板搬送機構100E和/或機械臂(未圖示)來搬送的基板W的表面進行平面研削,具體而言,基板研削模塊100B進行粗研削及精研削這兩者。詳情將於後述。The
基板洗滌模塊100C對利用基板研削模塊100B來研削的基板W(研削完畢基板)進行洗滌。具體而言,基板洗滌模塊100C包括:旋轉式的洗滌部13,利用例如水等洗滌液來對經研削的基板W進行洗滌;以及乾燥部14,使經洗滌的基板W乾燥。除此以外,在基板洗滌模塊100C,也可設置有包括用以判斷基板W的優劣的相機的檢查部15。此外,此檢查部15也可與基板洗滌模塊100C分開而作為檢查模塊來設置。The
基板收納模塊100D將利用基板洗滌模塊100C來洗滌,且利用基板搬送機構100E和/或機械臂(未圖示)來搬送的基板W加以收納。具體而言,基板收納模塊100D包括將基板W加以收納的研削完畢基板收納部12。此外,也可藉由將研削完畢基板收納部12設置於基板供給模塊100A,而將基板收納模塊100D設為與基板供給模塊100A相同的模塊。The
<基板研削模塊100B(研削機構)>
其次,對基板研削模塊100B(研削機構)進行詳細敘述。<
具體而言,基板研削模塊100B如圖1~圖3所示,包括:將基板W加以保持的多個平臺2、使多個平臺2分別進行直線往復移動的多個平臺移動部3、對基板W進行粗研削的至少一個粗研削部4、以及對基板W進行精研削的至少一個精研削部5;並且在多個平臺2的每一個上,粗研削部4及精研削部5構成為能夠移動。此外,本實施方式中,是包括兩個平臺2以及兩個平臺移動部3的結構。Specifically, as shown in FIGS. 1 to 3 , the
各平臺2將基板W吸附保持,在其上表面形成有用以吸附基板W的多數個吸附孔(未圖示)。此外,多數個吸附孔連接於抽吸泵VP。本實施方式的平臺2是與俯視長方形狀的基板W對應而形成俯視長方形狀。Each
各平臺移動部3使平臺2沿著一方向(Y方向)而在規定的範圍內進行直線往復移動。另外,各平臺移動部3能夠與其他平臺移動部3獨立地使平臺2進行直線往復移動。具體而言,各平臺移動部3於在Y方向上設定於近前側的第一位置P、與在Y方向上設定於深處側的第二位置Q之間使平臺2進行直線往復移動。此處,第一位置P是進行基板W的接收及交接的位置,但也可設定為與進行基板W的接收及交接的位置不同的位置。Each
本實施方式的各平臺移動部3是以平臺2的長邊方向與平臺2的往復移動方向(Y方向)一致的方式使平臺2移動的結構。另外,各平臺移動部3為了達成高的研削精度,理想為不包括使平臺2旋轉的機構。兩個平臺移動部3並排設置於X方向,各平臺移動部3包括:沿著Y方向而設置的Y方向軌道、在此Y方向軌道上滑動且固定有平臺2的Y方向滑件、以及將此Y方向滑件驅動的Y方向驅動部(例如,滾珠螺桿及伺服馬達)。此外,Y方向驅動部藉由利用後述的控制部9來控制,使得平臺2沿著Y方向軌道而直線往復移動。Each
本實施方式中,粗研削部4及精研削部5相對於多個平臺2(多個平臺移動部3)的每一個而設置有至少一個。具體而言,本實施方式中,與其中一個平臺2對應而設置有一個粗研削部4及一個精研削部5,且與另一個平臺2對應而設置有一個粗研削部4及一個精研削部5。In the present embodiment, at least one of the
各粗研削部4在利用所對應的平臺移動部3的基板W的移動範圍內移動,來對基板W的上表面進行粗研削。此粗研削部4是包括粗研削用研磨石41的橫軸型的研削部,且設定為使粗研削用研磨石41旋轉的主軸42的旋轉軸相對於平檯面而平行。此粗研削用研磨石41形成圓板形狀,其外側周面成為用於研削的使用面。Each rough
各精研削部5在利用所對應的平臺移動部3的基板W的移動範圍內移動,來對基板W進行精研削。此精研削部5是包括精研削用研磨石51的縱軸型的研削部,且設定為使精研削用研磨石51旋轉的主軸52的旋轉軸相對於平檯面而垂直。此處,精研削用研磨石51是較粗研削用研磨石41而言孔更細的研磨石。另外,精研削用研磨石51形成圓環形狀或圓板形狀,其軸方向的一端面成為用於研削的使用面。進而,精研削用研磨石51具有大於基板W的寬度尺寸的直徑。Each
具體而言,各粗研削部4及各精研削部5構成為在將利用平臺移動部3的平臺2的往復移動方向(Y方向)橫切的方向上移動。本實施方式中,各粗研削部4及各精研削部5構成為在第一位置P與第二位置Q之間,在與Y方向正交的X方向上移動。Specifically, each rough grinding
而且,本實施方式的基板研削模塊100B包括門型的支撐部6,以能夠移動的方式支撐各粗研削部4及各精研削部5。此支撐部6如圖2及圖3所示,包括:設置於兩個平臺2(兩個平臺移動部3)的兩側的一對腳部61、以及架設於一對腳部61的連結梁部62;並且各粗研削部4及各精研削部5以能夠移動的方式支撐於此連結梁部62。連結梁部62在第一位置P與第二位置Q之間沿著X方向而設置。本實施方式中為如下結構:在連結梁部62的近前側支撐兩個粗研削部4,且在連結梁部62的深處側支撐兩個精研削部5。藉由此結構,對兩個基板W進行粗研削或精研削的Y方向的位置成為相同位置。其結果為,在每個平臺2上,能夠使由於連結梁部62的撓曲等而受到的粗研削的不均相同,且能夠使由於連結梁部62的撓曲等而受到的精研削的不均相同。Moreover, the board|
此處,在連結梁部62與各粗研削部4之間,如圖2所示,設置有粗研削部移動部7,且在連結梁部62與各精研削部5之間,如圖3所示,設置有精研削部移動部8。此外,圖1中,未圖示出粗研削部移動部7及精研削部移動部8。Here, between the connecting
粗研削部移動部7使各粗研削部4在X方向上移動,例如,在連結梁部62中包括:沿著X方向而設置的X方向軌道、沿著此X方向軌道而移動的X方向滑件、以及將此X方向滑件驅動的X方向驅動部。X方向滑件及X方向驅動部是與兩個粗研削部4分別對應而設置。此外,X方向軌道在兩個粗研削部4中通用,但也可分別對應而設置。各X方向驅動部是由後述的控制部9來控制,各粗研削部4相互獨立地沿著X方向而移動。The rough grinding
另外,粗研削部移動部7設為能夠使各粗研削部4在Z方向上移動的結構,在連結梁部62中包括:沿著Z方向而設置的Z方向軌道、沿著此Z方向軌道而移動的Z方向滑件、以及將此Z方向滑件進行驅動的Z方向驅動部。Z方向軌道、Z方向滑件及Z方向驅動部是與兩個粗研削部4分別對應而設置。各Z方向驅動部是由後述的控制部9來控制,各粗研削部4相互獨立地沿著Z方向而移動。In addition, the rough grinding
精研削部移動部8使各精研削部5在X方向上移動,例如,連結梁部62中包括:沿著X方向而設置的X方向軌道、沿著此X方向軌道而移動的X方向滑件、以及將此X方向滑件進行驅動的X方向驅動部。X方向滑件及X方向驅動部是與兩個精研削部5分別對應而設置。此外,X方向軌道在兩個精研削部5中通用,但也可分別對應而設置。各X方向驅動部是由後述的控制部9來控制,各精研削部5相互獨立地沿著X方向而移動。The fine-grinding
另外,精研削部移動部8設為使各精研削部5在Z方向上移動的結構,連結梁部62中包括:沿著Z方向而設置的Z方向軌道、沿著此Z方向軌道而移動的Z方向滑件、以及將此Z方向滑件進行驅動的Z方向驅動部。Z方向軌道、Z方向滑件及Z方向驅動部是與兩個精研削部5分別對應而設置。各Z方向驅動部是由後述的控制部9來控制,各精研削部5相互獨立地沿著Z方向而移動。In addition, the fine grinding
所述結構中,藉由控制部9對各部進行控制,而對保持於多個平臺2的基板W分別進行粗研削及精研削。In the above-described configuration, each part is controlled by the
以下,著眼於一個平臺2,對保持於此平臺2的基板W的粗研削及精研削進行說明。Hereinafter, focusing on one
控制部9在對各基板W進行粗研削的情況下,如圖4的(A)所示,使粗研削部4在基板W的移動範圍內移動,以規定的順序進行粗研削。When performing rough grinding on each substrate W, the
控制部9對平臺移動部3進行控制而使基板W進行直線往復移動,並且對粗研削部移動部7進行控制而使粗研削部4在X方向上移動,由此對基板W的上表面整體進行粗研削。例如,控制部9使平臺2直線移動至少一次,而將基板W的所需部位沿著長邊方向進行粗研削,然後,使粗研削部4在X方向上錯開,粗研削部4對準未研削部分,使平臺2直線移動至少一次,而將基板W的所需部位沿著長邊方向進行粗研削。藉由反復進行所述操作,而將基板W的上表面整體進行粗研削。The
所述粗研削中,控制部9對粗研削部4的Z方向的位置進行反饋控制,來調整基板W的粗研削量。In the rough grinding, the
具體而言,控制部9基於來自與基板W接觸的一個或多個接觸感測器10(參照圖1)的檢測信號,以基板W的厚度達到規定的目標值的方式,對粗研削部4的Z方向的位置進行反饋控制。接觸感測器10是與各平臺2對應而設置。此處,基板W的厚度可根據平臺上表面的Z方向的位置與基板上表面的Z方向的位置之差來求出,也可基於根據研削前的基板上表面的Z方向的位置與研削後的基板上表面的Z方向的位置來求出的研削量而求出。此外,檢測基板W的厚度或研削量的感測器除了接觸感測器以外,也可為光學式感測器等其他方式的位移感測器。Specifically, the
控制部9在粗研削後對基板W進行精研削的情況下,如圖4的(B)所示,使精研削部5在基板W的移動範圍內移動,以規定的順序進行精研削。When performing fine grinding on the substrate W after rough grinding, the
控制部9對精研削部移動部8進行控制,將精研削部5的精研削用研磨石51配置於與基板W接觸的位置,對平臺移動部3進行控制而使基板W直線移動,由此對基板W的上表面整體進行精研削。例如,控制部9對精研削部移動部8進行控制,在精研削用研磨石51配置於與基板W的寬度方向整體接觸的位置後,對平臺移動部3進行控制而使基板W直線移動至少一次,將基板W沿著長邊方向進行精研削。The
所述精研削中,控制部9對精研削部5的Z方向的位置進行反饋控制,來調整基板W的精研削量。具體而言,控制部9基於來自與基板W接觸的接觸感測器10的檢測信號,以基板W的厚度達到規定的目標值的方式,對精研削部5的Z方向的位置進行反饋控制。此處,基板W的厚度可根據平臺上表面的Z方向的位置與基板上表面的Z方向的位置之差來求出,也可基於根據研削前的基板上表面的Z方向的位置與研削後的基板上表面的Z方向的位置來求出的研削量而求出。In the above-mentioned fine grinding, the
此處,當將保持於兩個平臺2的基板W進行粗研削及精研削時,各粗研削部4及各精研削部5構成為不會相互干擾。本實施方式中,如圖2所示,設置為兩個粗研削部4(橫軸型的研削部)的粗研削用研磨石41在內側彼此相向且主軸42位於外側。Here, when rough grinding and fine grinding are performed on the substrates W held by the two
另外,控制部9在各平臺2中,當粗研削部4或精研削部5中的一者對基板W進行研削時,使粗研削部4或精研削部5中的另一者退避至與其他平臺2相反的一側(外側)。由此,不會阻礙在其他平臺2上進行研削的研削部4、研削部5的移動。除此以外,還可設為如下結構:在粗研削部4或精研削部5中的一者對基板W進行研削時,使粗研削部4或精研削部5中的另一者藉由在Z方向上升而退避。In addition, in each
<研削方法>
其次,對利用本實施方式的研削裝置100的研削方法的一例進行說明。此例中假定如下情況:在兩個平臺2中同時進行粗研削,然後同時進行精研削。<Grinding method>
Next, an example of a grinding method using the grinding
首先,基板搬送機構100E自基板收納模塊100A的研削前基板供給部11接收基板W,且依序搬送至基板研削模塊100B的兩個平臺2。此處,平臺2將所搬送的基板W吸附而保持。
本實施方式中,為了達成高的研削精度,平臺移動部3不包括使平臺2旋轉的機構。因此,研削裝置100包括排列機構,使基板搬送機構100E的基板W的朝向與平臺移動部3的基板W的朝向(參照圖1)一致。排列機構例如可為基板搬送機構100E所包括的旋轉機構,或者也可為一邊使基板W的朝向適當旋轉,一邊使基板W自基板搬送機構100E移動至平臺2的機械臂等搬送機構。First, the
然後,與各平臺2對應的粗研削部4移動至規定的研削位置,並且平臺移動部3使平臺2進行直線往復移動而進行基板W的粗研削。在此粗研削中,基於接觸感測器10的檢測信號,以基板W的厚度達到規定的目標值的方式,對粗研削部4的Z方向的位置進行反饋控制。Then, the
粗研削結束後,粗研削部4退避至平臺2的移動範圍外。而且,與各平臺2對應的精研削部5移動至規定的研削位置,並且平臺移動部3使平臺2進行直線往復移動而進行經粗研削的基板W的精研削。在此精研削中,基於接觸感測器10的檢測信號,以基板W的厚度達到規定的目標值的方式,對精研削部5的Z方向的位置進行反饋控制。After the rough grinding is completed, the rough
精研削結束後,基板搬送機構100E和/或機械臂(未圖示)將基板W依序搬送至基板洗滌模塊100C。經此基板洗滌模塊100C進行洗滌及檢查的基板W利用基板搬送機構100E和/或機械臂(未圖示)而搬送至基板收納模塊100D的研削完畢基板收納部12。After finishing grinding, the
作為其他的研削方法,還考慮:以在其中一個平臺2上進行粗研削時,在另一個平臺2上進行精研削的方式,在兩個平臺2上交替進行粗研削及精研削等,在兩個平臺2上錯開研削時機。另外,作為其他的研削方法,還考慮在各平臺2上獨立地進行粗研削及精研削。As another grinding method, it is also considered that rough grinding is performed on one table 2 and fine grinding is performed on the other table 2, and rough grinding and fine grinding are alternately performed on both tables 2, and the two tables 2 are used for rough grinding. The grinding timing is staggered on each
在這些情況下,各平臺2上的粗研削及精研削的順序與以上所述相同,但基板搬送機構100E和/或機械臂(未圖示)在每次精研削結束時,將此經精研削的基板W搬送至基板洗滌模塊100C,並且將研削前的基板W自研削前基板供給部11搬送至未保持有基板W的平臺2。In these cases, the sequence of rough grinding and fine grinding on each
<本實施方式的效果>
根據本實施方式的研削裝置100,在多個平臺2的每一個上,粗研削部4及精研削部5構成為能夠移動,因此能夠在各平臺2上保持有基板W的狀態下進行粗研削及精研削這兩者。由此,不需要將基板W移載至不同的平臺,不需要在不同的平臺上再次對準,能夠在多個平臺2的每一個上使粗研削及精研削的平坦度一定。其結果為,能夠藉由對多個基板W同時進行研削,來提高處理量(處理能力),並且提高各平臺2上的基板W的研削精度。<Effects of the present embodiment>
According to the
<其他的變形實施方式> 此外,本發明並不限定於所述實施方式。<Other variant embodiments> In addition, this invention is not limited to the said embodiment.
例如,如圖5的(A)及圖5的(B)所示,也可設為將粗研削部4或精研削部5中的至少一者在至少兩個平臺2中共用的結構。例如,如圖5的(A)所示,也可設為在兩個平臺2的每一個上設置粗研削部4,將一個精研削部5在兩個平臺2上共用的結構。另外,如圖5的(B)所示,也可設為將一個粗研削部4及一個精研削部5在兩個平臺2上共用的結構,從而在兩個平臺2上交替進行粗研削及精研削。進而,雖未圖示,但也可設為在兩個平臺2的每一個上設置精研削部5,而將一個粗研削部4在兩個平臺2上共用的結構。For example, as shown in FIGS. 5(A) and 5(B) , at least one of the rough grinding
另外,連結梁部62中,也可將兩個粗研削部4中的一者設置於近前側且將另一者設置於深處側,將兩個精研削部中的一者設置於近前側且將另一者設置於深處側。若為此結構,則在兩個平臺2上同時進行粗研削的情況、或者同時進行精研削的情況下,能夠使粗研削部4彼此、或者精研削部5彼此在結構上不會相互干擾。In addition, in the connecting
進而,除了所述實施方式以外,也可如圖6所示,設置去毛刺部16,所述去毛刺部16在利用平臺移動部3的基板W的移動範圍內移動而進行基板W的去毛刺。關於此去毛刺部16,考慮與粗研削部4及精研削部5同樣,以能夠移動的方式支撐於連結梁部62。作為去毛刺部16,考慮例如包括刷毛。此處,在設置去毛刺部16的情況下,藉由與在兩個平臺2上共用粗研削部4或精研削部5的結構加以組合,能夠使其配置容易。另外,去毛刺部16能夠在兩個平臺2上共用。Furthermore, in addition to the above-described embodiment, as shown in FIG. 6 , a
所述實施方式的粗研削部4使用粗研削用研磨石41,精研削部5使用精研削用研磨石51,但如圖7所示,粗研削部4或精研削部5也可為使用無端帶狀的研削帶171的帶式研削型的研削部(以下為帶式研削部17)。此外,研削帶171將在表面附著有研磨粒的帶狀的研磨布紙的兩端接合而形成帶狀。與粗研削用研磨石41或精研削用研磨石51相比,研削帶171廉價,能夠實現大幅度的成本下降。另外,研削帶171與粗研削用研磨石41或精研削用研磨石51相比,交換作業也容易。進而,帶式研削部17在對如下的研削對象物進行研削的情況、或將研削對象物所形成的毛刺去除的情況等下有效,所述研削對象物如在利用粗研削用研磨石41或精研削用研磨石51時堵塞的問題變得顯著的基板W、或例如僅使銅配線部或焊接部露出的基板W等那樣,對研削精度的要求不太高。In the above-described embodiment, the rough
此帶式研削部17包括:利用主軸172的驅動軸173而旋轉驅動的驅動輪174、接觸輪175、以及環掛於這些輪174、175的無端帶狀的研削帶171。此外,也可包括對研削帶171賦予張力的張力輪176。這些各零件172~176由基體構件170所支撐。The
另外,此帶式研削部17如圖8所示,包括以使研削帶171的一部分露出的方式來覆蓋研削帶171的覆蓋體177。覆蓋體177的下壁部177a(與基板W相向的壁面)形成平面形狀,且在此下壁部177a形成有用以使研削帶171露出的開口部177H。此處,由於覆蓋體177的下壁部177a形成與基板W相向的平面形狀,故而自外部供給的水等研削液在形成於下壁部177a的下表面與基板W的上表面之間的空間中流動,高效地供給至研削部分。In addition, as shown in FIG. 8 , this
另外,在覆蓋體177的下壁部177a或者與此下壁部177a相連的側壁部177b的下側部分,形成有用以將進入至覆蓋體177的內部的研削液排出至外部的排出孔177c。此外,在粗研削部4及精研削部5,也可與帶式研削部17同樣,設置以這些研磨石41、51的一部分露出的方式來覆蓋的覆蓋體。Further, in the
另外,除了將粗研削部4或者精研削部5設為帶式研削部17的結構以外,基板研削模塊100B(研削機構)除了包括粗研削部4及精研削部5以外,也可還包括使用無端帶狀的研削帶171的帶式研削部17。此帶式研削部17在多個平臺2的每一個上構成為能夠移動,且考慮與粗研削部4及精研削部5同樣,以能夠移動的方式支撐於連結梁部62。In addition to the configuration in which the
除此以外,粗研削部4也可構成為能夠以包括粗研削用研磨石41的橫軸型的研削部以及使用無端帶狀的研削帶171的帶式研削型的研削部的形式來進行變更,精研削部5也可構成為能夠以包括精研削用研磨石51的縱軸型的研削部以及使用無端帶狀的研削帶171的帶式研削型的研削部的形式來進行變更。藉由使它們能夠變更,能夠選擇與基板W的種類相應的研削形態,從而能夠提高基板研削模塊100B(研削機構)的通用性。In addition to this, the
在此情況下,如圖9所示,也可構成為:相對於粗研削部4及精研削部5中的Z方向移動部的Z方向滑件18,使用附屬構件19a、附屬構件19b來安裝。例如,粗研削部4經由粗研削部4用的附屬構件19a而安裝於Z方向滑件。另外,精研削部5經由精研削部5用的附屬構件19b而安裝於Z方向滑件18。此外,圖9中,已示出帶式研削部17不使用附屬構件而安裝於Z方向滑件18的例子,但也可使用帶式研削部用的附屬構件來安裝於Z方向滑件18。藉由如上所述,使用與各研削部4、5對應的附屬構件19a、附屬構件19b,粗研削部4(橫軸型)與帶式研削部17成為能夠相互變更,精研削部5(縱軸型)與帶式研削部17成為能夠相互變更。圖9中,由於將粗研削部4、精研削部5及Z方向移動部的Z方向滑件18設為通用,故而能夠將粗研削部4(橫軸型)、精研削部5(縱軸型)及帶式研削部17相互變更。除此以外,也可將橫軸型的主軸42與帶式研削部17的主軸172設為通用,構成為相對於此通用的主軸而能夠將粗研削用研磨石41與研削帶171相互變更。In this case, as shown in FIG. 9 , the Z-
進而,除了所述實施方式以外,還可設置包括較精研削部5的精研削用研磨石51而言孔更細的研磨用研磨石的研磨研削部。此研磨研削部在多個平臺2的每一個上構成為能夠移動,考慮與粗研削部4及精研削部5同樣,以能夠移動的方式支撐於連結梁部62。Furthermore, in addition to the said embodiment, the grinding|polishing grinding part which consists of the grinding|polishing grindstone with a finer hole than the grinding|polishing
所述實施方式中是將兩個平臺2並列配置的結構,但也可為將三個以上的平臺2並列配置的結構。In the above-described embodiment, two
在所述實施方式中,是利用多個平臺2來對一種研削對象物W進行研削的結構,但也可藉由使在多個平臺2的每一個上進行研削的研削對象物W的種類不同,而設為對多種研削對象物W進行研削的結構。在此情況下,與各平臺2對應而設置的粗研削部4及精研削部5是根據各研削對象物W的種類來選擇。In the above-described embodiment, the plurality of
另外,所述實施方式的粗研削部4為橫軸型的研削部,但也可設為縱軸型的研削部。另一方面,所述實施方式的精研削部5為縱軸型的研削部,但也可設為橫軸型的研削部。另外,藉由利用例如粗研削用研磨石及精研削用研磨石來更換安裝於研削部的主軸的研磨石,能夠將粗研削部及精研削部設為各種配置。In addition, although the rough
另外,也可在各研削部與研削部移動部之間設置使研削部旋轉的旋轉部。此旋轉部使研削部的旋轉軸旋轉90度,能夠利用縱軸型及橫軸型來切換。In addition, a rotating part that rotates the grinding part may be provided between each grinding part and the grinding part moving part. This rotating part rotates the rotation axis of the grinding part by 90 degrees, and can be switched between the vertical axis type and the horizontal axis type.
除此以外,所述實施方式的支撐部6為門型,但也可為包括一個腳部以及自此腳部延伸的梁部的懸臂型。In addition to this, the
除此以外,本發明並不限定於所述實施方式,當然能夠在不脫離其主旨的範圍內進行各種變形。In addition to this, the present invention is not limited to the above-described embodiment, and it goes without saying that various modifications can be made within a range that does not deviate from the gist.
2:平臺
3:平臺移動部
4:粗研削部
5:精研削部
6:支撐部
7:粗研削部移動部
8:精研削部移動部
9:控制部
10:接觸感測器
11:研削前基板供給部
12:研削完畢基板收納部
13:洗滌部
14:乾燥部
15:檢查部
16:去毛刺部
17:帶式研削部
18:Z方向滑件
19a、19b:附屬構件
41:粗研削用研磨石
42:主軸
51:精研削用研磨石
52:主軸
61:一對腳部
62:連結梁部
100:研削裝置
100A:基板供給模塊
100B:基板研削模塊(研削機構)
100C:基板洗滌模塊
100D:基板收納模塊
100E:基板搬送機構
170:基體構件
171:研削帶
172:主軸
173:驅動軸
174:驅動輪
175:接觸輪
176:張力輪
177:覆蓋體
177a:下壁部
177b:側壁部
177c:排出孔
177H:開口部
CTL:控制機器
P:第一位置
Q:第二位置
VP:抽吸泵
W:板狀的研削對象物(密封完畢基板、基板)2: Platform
3: Platform Moving Department
4: Rough grinding department
5: Fine grinding department
6: Support part
7: Rough grinding part moving part
8: Fine grinding part moving part
9: Control Department
10: Touch sensor
11: Substrate supply section before grinding
12: Grinding completed board storage part
13: Washing Department
14: Drying section
15: Inspection Department
16: Deburring Department
17: Belt Grinding Department
18: Z-
圖1是示意性表示本發明的研削裝置的一實施方式的結構的俯視圖。 圖2是示意性表示所述實施方式的研削機構的結構的正視圖(自近前側來看的圖)。 圖3是示意性表示所述實施方式的研削機構的結構的背視圖(自深處側來看的圖)。 圖4是示意性表示所述實施方式的(A)進行粗研削的狀態、(B)進行精研削的狀態的俯視圖。 圖5是示意性表示本發明的研削裝置中(A)將精研削部共用的情況、(B)將粗研削部及精研削部共用的情況下的結構的俯視圖。 圖6是示意性表示本發明的研削裝置的變形實施方式的結構的俯視圖。 圖7是示意性表示變形實施方式的帶式研削部的結構的正視圖及側視圖。 圖8是表示帶式研削部中的套管的結構的示意圖。 圖9是示意性表示粗研削部、精研削部及帶式研削部的在Z方向滑件上的安裝結構的圖。FIG. 1 is a plan view schematically showing the configuration of one embodiment of the grinding apparatus of the present invention. FIG. 2 is a front view (viewed from the front side) schematically showing the structure of the grinding mechanism of the embodiment. 3 is a rear view (viewed from the deep side) schematically showing the structure of the grinding mechanism of the embodiment. 4 is a plan view schematically showing (A) a state in which rough grinding is performed and (B) a state in which fine grinding is performed in the embodiment. 5 is a plan view schematically showing the configuration of the grinding apparatus according to the present invention (A) in a case where a fine grinding part is used in common, and (B) a case in which a rough grinding part and a fine grinding part are used in common. 6 is a plan view schematically showing the configuration of a modified embodiment of the grinding apparatus of the present invention. 7 is a front view and a side view schematically showing the structure of a belt grinding section according to a modified embodiment. FIG. 8 is a schematic diagram showing the structure of a sleeve in the belt grinding section. FIG. 9 is a diagram schematically showing a mounting structure of a rough grinding part, a finishing grinding part, and a belt grinding part on a slider in the Z direction.
2:平臺2: Platform
3:平臺移動部3: Platform Moving Department
4:粗研削部4: Rough grinding department
5:精研削部5: Fine grinding department
6:支撐部6: Support part
9:控制部9: Control Department
10:接觸感測器10: Touch sensor
11:研削前基板供給部11: Substrate supply section before grinding
12:研削完畢基板收納部12: Grinding completed board storage part
13:洗滌部13: Washing Department
14:乾燥部14: Drying section
15:檢查部15: Inspection Department
41:粗研削用研磨石41: Grinding stone for rough grinding
42:主軸42: Spindle
51:精研削用研磨石51: Grinding stone for fine grinding
52:主軸52: Spindle
100:研削裝置100: Grinding device
100A:基板供給模塊100A: Substrate supply module
100B:基板研削模塊(研削機構)100B: Substrate grinding module (grinding mechanism)
100C:基板洗滌模塊100C: Substrate cleaning module
100D:基板收納模塊100D: Substrate storage module
100E:基板搬送機構100E: Substrate transfer mechanism
CTL:控制機器CTL: Control Machine
P:第一位置P: first position
Q:第二位置Q: The second position
VP:抽吸泵VP: suction pump
W:板狀的研削對象物(密封完畢基板、基板)W: Plate-shaped grinding object (sealed substrate, substrate)
Claims (5)
Applications Claiming Priority (4)
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JP2019-233681 | 2019-12-25 | ||
JP2019233681 | 2019-12-25 | ||
JP2020-092991 | 2020-05-28 | ||
JP2020092991A JP7341101B2 (en) | 2019-12-25 | 2020-05-28 | Grinding mechanism and grinding device |
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TW202126429A TW202126429A (en) | 2021-07-16 |
TWI771836B true TWI771836B (en) | 2022-07-21 |
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JP (1) | JP7341101B2 (en) |
KR (1) | KR102494209B1 (en) |
SG (1) | SG10202012561YA (en) |
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KR102543850B1 (en) * | 2023-02-20 | 2023-06-14 | 홍운기 | Automatic deburr removal device for metal molded products |
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JPS50140986A (en) * | 1974-04-27 | 1975-11-12 | ||
JPH079313A (en) * | 1993-06-30 | 1995-01-13 | Sumitomo Heavy Ind Ltd | Compound grinder |
JP2001025944A (en) * | 1999-07-13 | 2001-01-30 | Sumitomo Heavy Ind Ltd | Two-head type surface grinding machine |
US20030126727A1 (en) * | 2001-03-01 | 2003-07-10 | Takahiro Tozawa | Method and apparatus for machining joint face of work |
US20040235391A1 (en) * | 2002-08-21 | 2004-11-25 | Grivna Howard W. | Material removal monitor |
JP2005117065A (en) * | 2004-12-24 | 2005-04-28 | Ibiden Co Ltd | Sealing method of electronic component |
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JPS55101365A (en) * | 1979-01-23 | 1980-08-02 | Citizen Watch Co Ltd | Belt grinding machine for machining wrist watch case |
JP2562989B2 (en) * | 1990-09-10 | 1996-12-11 | アミテック株式会社 | Grinding machine |
JPH07276222A (en) * | 1994-04-06 | 1995-10-24 | Fujitsu Ltd | Polishing device and polishing method using this device |
JP6181799B1 (en) | 2016-04-01 | 2017-08-16 | ソウ テクノロジー カンパニー、リミテッド | Semiconductor strip grinder |
KR101976042B1 (en) * | 2017-08-25 | 2019-05-07 | 최충호 | Apparatus for removing burr |
-
2020
- 2020-05-28 JP JP2020092991A patent/JP7341101B2/en active Active
- 2020-12-14 KR KR1020200174585A patent/KR102494209B1/en active IP Right Grant
- 2020-12-15 SG SG10202012561YA patent/SG10202012561YA/en unknown
- 2020-12-22 TW TW109145538A patent/TWI771836B/en active
Patent Citations (6)
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JPS50140986A (en) * | 1974-04-27 | 1975-11-12 | ||
JPH079313A (en) * | 1993-06-30 | 1995-01-13 | Sumitomo Heavy Ind Ltd | Compound grinder |
JP2001025944A (en) * | 1999-07-13 | 2001-01-30 | Sumitomo Heavy Ind Ltd | Two-head type surface grinding machine |
US20030126727A1 (en) * | 2001-03-01 | 2003-07-10 | Takahiro Tozawa | Method and apparatus for machining joint face of work |
US20040235391A1 (en) * | 2002-08-21 | 2004-11-25 | Grivna Howard W. | Material removal monitor |
JP2005117065A (en) * | 2004-12-24 | 2005-04-28 | Ibiden Co Ltd | Sealing method of electronic component |
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SG10202012561YA (en) | 2021-07-29 |
KR102494209B1 (en) | 2023-02-06 |
KR20210082356A (en) | 2021-07-05 |
JP7341101B2 (en) | 2023-09-08 |
JP2021102257A (en) | 2021-07-15 |
TW202126429A (en) | 2021-07-16 |
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