TW202124093A - Grinding mechanism and grinding apparatus - Google Patents
Grinding mechanism and grinding apparatus Download PDFInfo
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- TW202124093A TW202124093A TW109145555A TW109145555A TW202124093A TW 202124093 A TW202124093 A TW 202124093A TW 109145555 A TW109145555 A TW 109145555A TW 109145555 A TW109145555 A TW 109145555A TW 202124093 A TW202124093 A TW 202124093A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/02—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor involving a reciprocatingly-moved work-table
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B21/00—Machines or devices using grinding or polishing belts; Accessories therefor
- B24B21/008—Machines comprising two or more tools or having several working posts
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/005—Feeding or manipulating devices specially adapted to grinding machines
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/02—Frames; Beds; Carriages
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
Description
本發明有關於一種研削機構及研削裝置。The invention relates to a grinding mechanism and a grinding device.
在對例如樹脂密封基板等研削對象物進行研削的情況下,存在於粗研削之後進行精研削的情況。In the case of grinding an object to be ground, such as a resin-sealed substrate, there is a case in which finish grinding is performed after rough grinding.
而且,以前考慮粗研削及精研削利用分別不同的研削裝置來進行,或者在如專利文獻1所示的包括兩個平臺的半導體帶式研磨機中,在其中一個平臺上進行粗研削,且在另一個平臺上進行精研削。
[現有技術文獻]
[專利文獻]Moreover, it has been considered that rough grinding and fine grinding are performed using separate grinding devices, or in a semiconductor belt grinder including two stages as shown in
[專利文獻1]日本專利第6181799號公報[Patent Document 1] Japanese Patent No. 6181799
[發明所要解決的問題]
然而,在利用不同的研削裝置來進行粗研削及精研削的情況、以及如專利文獻1那樣在不同的平臺上進行粗研削及精研削的情況中的任一情況下,均需要在粗研削後將研削對象物移載至另一平臺。如此一來,需要在移載後的平臺上再次進行對準。即便對準,在移載前後平臺的水平度也不完全相同,因此對固定於平臺上來研削的研削對象物的平坦度造成影響,導致粗研削時的研削對象物的平坦度與精研削時的研削對象物的平坦度改變。其結果為,存在研削精度變差的擔憂。尤其在研削對象物薄(例如,5 mm以下、1 mm以下)的情況下,此平坦度(研削精度)的問題重大。[The problem to be solved by the invention]
However, in either the case of using different grinding devices to perform rough grinding and fine grinding, and the case of performing rough grinding and fine grinding on different platforms as in
因此,本發明的主要課題為在對研削對象物的粗研削及精研削中使平坦度一定。Therefore, the main subject of the present invention is to make the flatness constant in the rough grinding and the fine grinding of the grinding object.
[解決問題的技術手段] 即,本發明的研削機構包括:平臺,將板狀的研削對象物加以保持;平臺移動部,使所述平臺沿著一方向而在規定的範圍內進行直線往復移動;粗研削部,在利用所述平臺移動部的所述研削對象物的移動範圍內移動,對所述研削對象物進行粗研削;以及精研削部,在利用所述平臺移動部的所述研削對象物的移動範圍內移動,對所述研削對象物進行精研削。 本發明的研削裝置,包括所述研削機構。[Technical means to solve the problem] That is, the grinding mechanism of the present invention includes: a platform for holding a plate-shaped grinding object; a platform moving part for making the platform linearly reciprocate within a predetermined range in one direction; and a rough grinding part for using The stage moving part moves within the moving range of the grinding target to perform rough grinding on the grinding target; and the fine grinding part moves within the moving range of the grinding target using the stage moving part , Perform fine grinding on the grinding object. The grinding device of the present invention includes the grinding mechanism.
[發明的效果] 根據如上所述而構成的本發明,能夠在對研削對象物的粗研削及精研削中使平坦度一定。[Effects of the invention] According to the present invention constituted as described above, it is possible to make the flatness constant in the rough grinding and the fine grinding of the grinding object.
其次,關於本發明,舉例來進一步進行詳細說明。但,本發明不受以下說明所限定。Next, the present invention will be described in further detail with an example. However, the present invention is not limited by the following description.
本發明的研削機構如上所述,特徵在於包括:平臺,將板狀的研削對象物加以保持;平臺移動部,使所述平臺沿著一方向而在規定的範圍內進行直線往復移動;粗研削部,在利用所述平臺移動部的所述研削對象物的移動範圍內移動,對所述研削對象物進行粗研削;以及精研削部,在利用所述平臺移動部的所述研削對象物的移動範圍內移動,對所述研削對象物進行精研削。 若為此種研削機構,則粗研削部及精研削部分別在利用平臺移動部的研削對象物的移動範圍內移動而進行研削對象物的研削,因此能夠以在一個平臺上保持有研削對象物的狀態下進行粗研削及精研削。由此,不需要將研削對象物移載至不同的平臺,不需要在不同的平臺上再次對準,能夠在對於研削對象物的粗研削及精研削中使平坦度一定。其結果為,能夠提高研削對象物的研削精度。除此以外,粗研削部及精研削部中,由於平臺的移動範圍通用,故而能夠減小研削機構的覆蓋區(設置面積)。As described above, the grinding mechanism of the present invention is characterized by including: a platform for holding a plate-shaped grinding object; a platform moving part for causing the platform to linearly reciprocate within a predetermined range in one direction; and rough grinding Part, which moves within the range of movement of the grinding object using the platform moving part to perform rough grinding on the grinding object; Move within the moving range to perform fine grinding on the grinding object. With this type of grinding mechanism, the rough grinding part and the fine grinding part respectively move within the moving range of the grinding target using the platform moving part to grind the grinding target. Therefore, the grinding target can be held on one platform. In the state of rough grinding and fine grinding. Therefore, there is no need to transfer the grinding target to a different platform, and there is no need to re-align on a different platform, and it is possible to make the flatness constant in the rough grinding and fine grinding of the grinding target. As a result, the grinding accuracy of the grinding object can be improved. In addition, in the rough grinding part and the fine grinding part, since the moving range of the platform is common, the coverage area (installation area) of the grinding mechanism can be reduced.
作為所述粗研削部及所述精研削部的具體移動形態,考慮所述粗研削部及所述精研削部在將利用所述平臺移動部的所述平臺的往復移動方向橫切的方向上移動。較佳為考慮,所述粗研削部及所述精研削部在與所述平臺的往復移動方向正交的方向上移動。As a specific movement form of the rough grinding portion and the fine grinding portion, it is considered that the rough grinding portion and the fine grinding portion are in a direction transverse to the reciprocating movement direction of the platform using the platform moving portion move. It is preferable to consider that the rough grinding part and the fine grinding part move in a direction orthogonal to the reciprocating movement direction of the platform.
粗研削由於研削量增多,故而粗研削用研磨石的堵塞成為問題。因此,所述粗研削部理想為包括粗研削用研磨石的橫軸型的研削部。此外,橫軸型的研削部是研磨石的旋轉軸相對於平檯面而平行的研削方式。 若為此結構,則能夠減少粗研削用研磨石的堵塞。As the amount of rough grinding increases, clogging of the grindstone for rough grinding becomes a problem. Therefore, the rough grinding part is desirably a horizontal axis type grinding part including a grinding stone for rough grinding. In addition, the horizontal axis type grinding part is a grinding method in which the rotation axis of the grinding stone is parallel to the table surface. With this structure, clogging of the grindstone for rough grinding can be reduced.
另外,所述精研削部理想為包括精研削用研磨石的縱軸型的研削部。此外,縱軸型的研削部是研磨石的旋轉軸相對於平檯面而垂直的研削方式。 若為此結構,則能夠進行高精度的研削,研削麵積大而能夠提高生產性。In addition, the fine grinding part is desirably a longitudinal axis type grinding part including a grinding stone for fine grinding. In addition, the vertical axis type grinding part is a grinding method in which the rotation axis of the grinding stone is perpendicular to the table surface. With this structure, high-precision grinding can be performed, the grinding area is large, and productivity can be improved.
根據研削對象物的種類,粗研削用研磨石或精研削用研磨石的堵塞的問題變大。另外,還存在如例如僅使銅配線部或焊接部露出的研削對象物等那樣對研削精度的要求不太高的研削對象物。在如上所述的研削對象物的情況下,若使用粗研削用研磨石或精研削用研磨石,則運轉成本增大。 為了適當解決此問題,所述粗研削部或所述精研削部理想為使用無端帶狀的研削帶的帶式研削型的研削部。與粗研削用研磨石或精研削用研磨石相比,研削帶廉價,能夠實現大幅度的成本下降。另外,研削帶與粗研削用研磨石或精研削用研磨石相比,交換作業也容易。Depending on the type of the grinding object, the problem of clogging of the grinding stone for rough grinding or the grinding stone for fine grinding becomes greater. In addition, there are also objects to be polished, such as objects that only expose copper wiring portions or soldered portions, and the like that do not require a high degree of accuracy in polishing. In the case of the grinding object as described above, if the grinding stone for rough grinding or the grinding stone for fine grinding is used, the running cost increases. In order to appropriately solve this problem, the rough grinding part or the fine grinding part is desirably a belt grinding type grinding part using an endless belt-shaped grinding belt. Compared with grinding stones for rough grinding or grinding stones for fine grinding, grinding belts are inexpensive and can achieve a significant cost reduction. In addition, the grinding belt is easier to exchange than a grinding stone for rough grinding or a grinding stone for fine grinding.
為了能夠選擇與研削對象物的種類相應的研削形態,提高研削機構的通用性,所述粗研削部理想為構成為能夠以包括粗研削用研磨石的橫軸型的研削部以及使用無端帶狀的研削帶的帶式研削型的研削部的形式來進行變更,所述精研削部理想為構成為能夠以包括精研削用研磨石的縱軸型的研削部以及使用無端帶狀的研削帶的帶式研削型的研削部的形式來進行變更。In order to be able to select a grinding form corresponding to the type of object to be ground, and to improve the versatility of the grinding mechanism, the rough grinding part is ideally configured to be able to use a horizontal shaft type grinding part including a grinding stone for rough grinding and an endless belt shape. The form of the belt grinding type grinding part of the grinding belt is changed. The finishing grinding part is ideally configured to be able to use a longitudinal axis type grinding part including a grinding stone for finishing grinding and an endless belt-shaped grinding belt. The form of the belt grinding type grinding section is changed.
具體而言,研削機構包括:粗研削部移動部,使所述粗研削部移動;精研削部移動部,使所述精研削部移動;以及控制部,對所述粗研削部移動部及所述精研削部移動部進行控制。 在此結構中,為了有控制地使兩個研削部不會相互干擾,所述控制部理想為:當所述粗研削部或所述精研削部中的一者對所述研削對象物進行研削時,使所述粗研削部或所述精研削部中的另一者退避至所述研削對象物的移動範圍外。Specifically, the grinding mechanism includes: a rough grinding part moving part to move the rough grinding part; a fine grinding part moving part to move the fine grinding part; and a control part to control the rough grinding part moving part and the The moving part of the fine grinding and cutting part is controlled. In this structure, in order to prevent the two grinding parts from interfering with each other in a controlled manner, the control part is desirably: when one of the rough grinding part or the fine grinding part grinds the grinding object At this time, the other of the rough grinding part or the fine grinding part is retracted to the outside of the movement range of the grinding object.
為了藉由穩定地支撐粗研削部及精研削部來提高研削精度,研削機構理想為還包括:一對腳部,設置於所述平臺移動部的兩側;以及連結梁部,架設於所述一對腳部;並且所述粗研削部及所述精研削部以能夠移動的方式支撐於所述連結梁部。In order to improve the grinding accuracy by stably supporting the rough grinding part and the fine grinding part, the grinding mechanism desirably further includes: a pair of legs arranged on both sides of the platform moving part; and a connecting beam part erected on the A pair of legs; and the rough grinding portion and the fine grinding portion are movably supported by the connecting beam portion.
此處,為了使粗研削部及精研削部在結構上不會相互干擾,理想為在所述連結梁部,在近前側支撐所述粗研削部或所述精研削部中的一者,且在深處側支撐所述粗研削部或所述精研削部中的另一者。Here, in order to prevent the rough grinding portion and the fine grinding portion from interfering with each other structurally, it is desirable to support one of the rough grinding portion or the fine grinding portion on the near side at the connecting beam portion, and The other of the rough grinding part or the fine grinding part is supported on the deep side.
除此以外,為了提高研削機構的通用性,理想為除了所述粗研削部及所述精研削部以外,還包括使用無端帶狀的研削帶的帶式研削部,所述帶式研削部在利用所述平臺移動部的所述研削對象物的移動範圍內移動。In addition, in order to improve the versatility of the grinding mechanism, in addition to the rough grinding part and the fine grinding part, it is desirable to include a belt grinding part using an endless belt-shaped grinding belt. Move within the moving range of the grinding target by the platform moving part.
為了抑制由毛刺引起的研削不良,或者提高研削對象物的品質,研削機構理想為還包括去毛刺部,所述去毛刺部在利用所述平臺移動部的所述研削對象物的移動範圍內移動,進行所述研削對象物的去毛刺。In order to suppress grinding defects caused by burrs, or to improve the quality of the grinding object, the grinding mechanism preferably further includes a deburring part that moves within the movement range of the grinding target by the platform moving part , Deburring of the grinding object is performed.
另外,包括所述研削機構的研削裝置也為本發明的一形態。In addition, a grinding device including the grinding mechanism is also an aspect of the present invention.
<本發明的一實施方式> 以下,參照圖式來對本發明的研削裝置的一實施方式進行說明。此外,關於以下所示的任一圖,為了容易理解,而適當省略或誇張地示意性描畫。關於同一構成元件,標注同一符號而適當省略說明。<One embodiment of the present invention> Hereinafter, an embodiment of the grinding apparatus of the present invention will be described with reference to the drawings. In addition, with regard to any of the drawings shown below, for ease of understanding, the schematic drawing is appropriately omitted or exaggerated. Regarding the same constituent elements, the same reference numerals are attached, and the description is appropriately omitted.
以下的說明中,作為板狀的研削對象物,以經樹脂密封的基板(密封完畢基板)為一例來進行說明。基板例如可列舉:玻璃環氧基板、陶瓷基板、樹脂基板、金屬基板等一般的基板以及引線框架等。除此以外,板狀的研削對象物也可為基板以外的對象。In the following description, as a plate-shaped object to be ground, a resin-sealed substrate (sealed substrate) will be described as an example. Examples of the substrate include general substrates such as glass epoxy substrates, ceramic substrates, resin substrates, and metal substrates, lead frames, and the like. In addition, the plate-shaped grinding object may be an object other than the substrate.
<研削裝置100的整體結構>
本實施方式的研削裝置100藉由對密封完畢基板W(以下簡稱為“基板W”)的表面進行平面研削,來進行基板W的高度調整(厚度調整)、或者搭載於基板W的電子零件的散熱性的提高等基板的改良。<The overall structure of the
具體而言,研削裝置100如圖1所示,包括:收納基板W的基板收納模塊100A、對基板W進行研削的基板研削模塊100B、對經研削的基板W進行洗滌的基板洗滌模塊100C,來分別作為構成元件。各構成元件100A~100C能夠分別相對於其他構成元件而相互拆裝,且能夠更換。另外,在各模塊100A~100C間的基板W的移動是利用基板搬送機構100D和/或機械臂(未圖示)來進行。本實施方式的研削裝置100整體的動作是利用包括後述控制部9的控制機器CTL來控制。Specifically, as shown in FIG. 1, the
基板收納模塊100A供給研削前的基板W(研削前基板),並且收納研削後的基板W(研削完畢基板)。具體而言,基板收納模塊100A包括:供給研削前基板W的研削前基板供給部11、以及收納研削完畢基板W的研削完畢基板收納部12。此外,也可使用通用的零件(例如雜誌架)來構成研削前基板供給部11以及研削完畢基板收納部12。The
基板研削模塊100B對利用基板搬送機構100D來搬送的基板W的表面進行平面研削,具體而言,基板研削模塊100B進行粗研削及精研削這兩者。詳情將於後述。The
基板洗滌模塊100C對利用基板研削模塊100B來研削的研削完畢基板W進行洗滌。本實施方式的研削裝置100中,基板W藉由機械臂(未圖示),自基板研削模塊100B的平臺2被搬送至基板洗滌模塊100C,且洗滌。具體而言,基板洗滌模塊100C包括:洗滌部13,對研削完畢基板W噴射例如水等洗滌液來洗滌基板;以及乾燥部14,使經洗滌的研削完畢基板乾燥。除此以外,在基板洗滌模塊100C,也可設置用以判斷研削完畢基板W的優劣的檢查部15。此外,此檢查部15也可與基板洗滌模塊100C分開而作為檢查模塊來設置。The
利用此基板洗滌模塊100C來洗滌的研削完畢基板W藉由機械臂(未圖示)及基板搬送機構100D而搬送至基板收納模塊100A,收納於研削完畢基板收納部12。The polished substrate W cleaned by this
<基板研削模塊100B(研削機構)>
其次,對基板研削模塊100B(研削機構)進行詳細敘述。<
具體而言,基板研削模塊100B如圖1及圖2所示,包括:平臺2,將基板W加以保持;平臺移動部3,使平臺2進行直線往復移動;粗研削部4,對基板W進行粗研削;以及精研削部5,對基板W進行精研削。Specifically, the
平臺2將基板W吸附保持,且在其上表面形成有用以吸附基板W的多數個吸附孔(未圖示)。此外,多數個吸附孔連接於抽吸泵VP。本實施方式的平臺2與俯視長方形狀的基板W對應而形成俯視長方形狀。The
平臺移動部3使平臺2沿著一方向(Y方向)而在規定的範圍內進行直線往復移動。具體而言,平臺移動部3於在Y方向上設定於近前側的第一位置P、與在Y方向上設定於深處側的第二位置Q之間使平臺2進行直線往復移動。此處,第一位置P是進行基板W的接收及交接的位置,但也可設定為與進行基板W的接收及交接的位置不同的位置。
為了達成高的研削精度,平臺移動部3較佳為不包括使平臺2旋轉的機構。在此情況下,研削裝置100包括排列機構,使基板搬送機構100D的基板W的朝向與平臺移動部3的基板W的朝向(參照圖1)一致。排列機構例如可為基板搬送機構100D所包括的旋轉機構,或者也可為一邊使基板W的朝向適當旋轉,一邊使基板W自基板搬送機構100D移動至平臺2的機械臂等搬送機構。The
本實施方式的平臺移動部3是以平臺2的長邊方向與平臺2的往復移動方向(Y方向)一致的方式使平臺2移動的結構。例如,平臺移動部3包括:沿著Y方向而設置的Y方向軌道、在此Y方向軌道上滑動且固定有平臺2的Y方向滑件、以及將此Y方向滑件驅動的Y方向驅動部。此外,Y方向驅動部藉由利用後述的控制部9來控制,而使得平臺2沿著Y方向軌道而直線往復移動。The
粗研削部4在利用平臺移動部3的基板W的移動範圍內移動,對基板W的上表面進行粗研削。此粗研削部4是包括粗研削用研磨石41的橫軸型的研削部,且設定為使粗研削用研磨石41旋轉的主軸42的旋轉軸相對於平檯面而平行。此粗研削用研磨石41形成圓板形狀,其外側周面成為用於研削的使用面。The rough
精研削部5在利用平臺移動部3的基板W的移動範圍內移動,對基板W進行精研削。此精研削部5是包括精研削用研磨石51的縱軸型的研削部,設定為使精研削用研磨石51旋轉的主軸52的旋轉軸相對於平檯面而垂直。此處,精研削用研磨石51是較粗研削用研磨石41而言孔更細的研磨石。另外,精研削用研磨石51形成圓環形狀或圓板形狀,其軸方向的一端面成為用於研削的使用面。進而,精研削用研磨石51具有大於基板W的寬度尺寸的直徑。The lapping
具體而言,粗研削部4及精研削部5構成為在將利用平臺移動部3的平臺2的往復移動方向(Y方向)橫切的方向上移動。本實施方式中,粗研削部4及精研削部5構成為在第一位置P與第二位置Q之間,在與Y方向正交的X方向上移動。Specifically, the
而且,本實施方式的基板研削模塊100B包括門型的支撐部6,以能夠移動的方式支撐粗研削部4及精研削部5。此支撐部6如圖2所示,包括:設置於平臺移動部3的兩側的一對腳部61、以及架設於一對腳部61的連結梁部62,並且粗研削部4及精研削部5以能夠移動的方式支撐於此連結梁部62。連結梁部62在第一位置P與第二位置Q之間中沿著X方向而設置。本實施方式中為如下結構:在連結梁部62的深處側支撐粗研削部4及精研削部5這兩者。Furthermore, the
此處,在連結梁部62與粗研削部4之間,如圖2所示,設置有粗研削部移動部7,且在連結梁部62與精研削部5之間設置有精研削部移動部8。此外,圖1中,未圖示出粗研削部移動部7及精研削部移動部8。Here, between the connecting
粗研削部移動部7使粗研削部4在X方向上移動,例如,在連結梁部62中包括:沿著X方向而設置的X方向軌道、沿著此X方向軌道而移動的X方向滑件、以及將此X方向滑件進行驅動的X方向驅動部。此X方向驅動部是由後述的控制部9來控制,粗研削部4沿著X方向而移動。The rough grinding
另外,粗研削部移動部7設為能夠使粗研削部4在Z方向上移動的結構,連結梁部62中包括:沿著Z方向而設置的Z方向軌道、沿著此Z方向軌道而移動的Z方向滑件、以及將此Z方向滑件進行驅動的Z方向驅動部。此Z方向驅動部是由後述的控制部9來控制,粗研削部4沿著Z方向而移動。In addition, the rough grinding
精研削部移動部8使精研削部5在X方向上移動,例如,連結梁部62中包括:沿著X方向而設置的X方向軌道、沿著此X方向軌道而移動的X方向滑件、以及將此X方向滑件進行驅動的X方向驅動部。此X方向驅動部是由後述的控制部9來控制,精研削部5沿著X方向而移動。此外,粗研削部移動部7與精研削部移動部8的X方向軌道也可設為通用。The lapping
另外,精研削部移動部8設為使精研削部5在Z方向上移動的結構,連結梁部62中包括:沿著Z方向而設置的Z方向軌道、沿著此Z方向軌道而移動的Z方向滑件、以及將此Z方向滑件進行驅動的Z方向驅動部。此Z方向驅動部是由後述的控制部9來控制,精研削部5沿著Z方向而移動。In addition, the lapping
所述結構中,藉由控制部9對各部進行控制,而進行基板W的粗研削及精研削。In the above configuration, the
具體而言,控制部9在對基板W進行粗研削的情況下,如圖3的(A)所示,使粗研削部4在基板W的移動範圍內移動,以規定的順序進行粗研削。Specifically, when rough grinding the substrate W, the
控制部9對平臺移動部3進行控制而使基板W進行直線往復移動,並且對粗研削部移動部7進行控制而使粗研削部4在X方向上移動,由此對基板W的上表面整體進行粗研削。例如,控制部9使平臺2直線移動至少一次,而將基板W的所需部位沿著長邊方向進行粗研削,然後,使粗研削部4在X方向上錯開,粗研削部4對準未研削部分,使平臺2直線移動至少一次,而將基板W的所需部位沿著長邊方向進行粗研削。藉由反復進行所述操作,而將基板W的上表面整體進行粗研削。The
所述粗研削中,控制部9對粗研削部4的Z方向的位置進行反饋控制,來調整基板W的粗研削量。In the rough grinding, the
具體而言,控制部9基於來自與基板W接觸的一個或多個接觸感測器10(參照圖1)的檢測信號,以所述基板W的厚度達到規定的目標值的方式,對粗研削部4的Z方向的位置進行反饋控制。此處,基板W的厚度可根據平臺上表面的Z方向的位置與基板上表面的Z方向的位置之差來求出,也可基於根據研削前的基板上表面的Z方向的位置與研削後的基板上表面的Z方向的位置來求出的研削量而求出。此外,檢測基板W的厚度或研削量的感測器除了接觸感測器以外,也可為光學式感測器等其他方式的位移感測器。Specifically, based on the detection signals from one or more touch sensors 10 (refer to FIG. 1) in contact with the substrate W, the
另一方面,控制部9在粗研削後對基板W進行精研削的情況下,如圖3的(B)所示,使精研削部5在基板W的移動範圍內移動,以規定的順序進行精研削。On the other hand, when the
控制部9對精研削部移動部8進行控制,將精研削部5的精研削用研磨石51配置於與基板W接觸的位置,對平臺移動部3進行控制而使基板W直線移動,由此對基板W的上表面整體進行粗研削。例如,控制部9對精研削部移動部8進行控制,在精研削用研磨石51設為與基板W的寬度方向整體接觸的位置後,對平臺移動部3進行控制而使基板W直線移動至少一次,將基板W沿著長邊方向進行精研削。The
所述精研削中,控制部9對精研削部5的Z方向的位置進行反饋控制,來調整基板W的精研削量。具體而言,控制部9基於來自與基板W接觸的接觸感測器10的檢測信號,以所述基板W的厚度達到規定的目標值的方式,對精研削部5的Z方向的位置進行反饋控制。此處,基板W的厚度可根據平臺上表面的Z方向的位置與基板上表面的Z方向的位置之差來求出,也可基於根據研削前的基板上表面的Z方向的位置與研削後的基板上表面的Z方向的位置來求出的研削量而求出。In the finishing grinding, the
此處,所述控制中,控制部9在粗研削部4或精研削部5中的一者對基板W進行研削時,使粗研削部4或精研削部5中的另一者退避至基板W的移動範圍外(參照圖3)。此處,為了使其退避至移動範圍外,除了使其在規定的退避位置停止以外,還包括位於不會阻礙在移動範圍內進行研削的粗研削部4或精研削部5的移動的位置。例如,控制部9使粗研削部4或精研削部5中的一者移動至移動範圍外的退避位置而停止後,使粗研削部4或精研削部5中的另一者移動至移動範圍內而開始研削。Here, in the above-mentioned control, when one of the rough grinding
<本實施方式的效果>
根據本實施方式的研削裝置100,粗研削部4及精研削部5分別在利用平臺移動部3的基板W的移動範圍內移動而進行基板W的研削,因此能夠以在一個平臺2上保持有基板W的狀態下進行粗研削及精研削。由此,不需要將基板W移載至不同的平臺,不需要在不同的平臺上再次對準,能夠在對基板W的粗研削及精研削中使平坦度一定。其結果為,能夠提高基板W的研削精度。<Effects of this embodiment>
According to the
另外,在粗研削部4及精研削部5中,由於平臺2的移動範圍通用,故而能夠減小基板研削模塊100B(研削機構)的覆蓋區。本實施方式中,由於形成俯視長方形狀的平臺2的往復移動方向與平臺2的長邊方向一致,故而能夠使研削機構的寬度方向的覆蓋區小型化。In addition, in the rough
<其他的變形實施方式> 此外,本發明並不限定於所述實施方式。<Other modified embodiments> In addition, this invention is not limited to the said embodiment.
例如,如圖4所示,連結梁部62中,也可設為如下結構:在近前側支撐粗研削部4或精研削部5中的一者,且在深處側支撐粗研削部4或精研削部5中的另一者。若為此結構,則能夠構成為使粗研削部4與精研削部5在物理上不會相互干擾。另外,粗研削部移動部7及精研削部移動部8配置於連結梁部62的兩側,能夠增大它們的設計的自由度。For example, as shown in FIG. 4, the connecting
另外,除了所述實施方式以外,也可如圖5所示,設置去毛刺部16,所述去毛刺部16在利用平臺移動部3的基板W的移動範圍內移動而進行基板W的去毛刺的去毛刺部16。關於此去毛刺部16,考慮與粗研削部4及精研削部5同樣,以能夠移動的方式支撐於連結梁部62。作為去毛刺部16,考慮例如包括刷毛。此外,圖5中,去毛刺部16支撐於連結梁部62的近前側,但也可支撐於深處側。In addition, in addition to the above-mentioned embodiment, as shown in FIG. 5, a
所述實施方式的粗研削部4使用粗研削用研磨石41,精研削部5使用精研削用研磨石51,但如圖6所示,粗研削部4或精研削部5也可為使用無端帶狀的研削帶171的帶式研削型的研削部(以下為帶式研削部17)。此外,研削帶171將在表面附著有研磨粒的帶狀的研磨布紙的兩端接合而形成帶狀。與粗研削用研磨石41或精研削用研磨石51相比,研削帶171廉價,能夠實現大幅度的成本下降。另外,研削帶171與粗研削用研磨石41或精研削用研磨石51相比,交換作業也容易。進而,帶式研削部17在對如下的研削對象物進行研削的情況、或將研削對象物所形成的毛刺去除的情況等下有效,所述研削對象物如在利用粗研削用研磨石41或精研削用研磨石51時堵塞的問題變得顯著的基板W、或例如僅使銅配線部或焊接部露出的基板W等那樣,對研削精度的要求不太高。The rough
此帶式研削部17包括:利用主軸172的驅動軸173而旋轉驅動的驅動輪174、接觸輪175、以及環掛於這些輪174、175的無端帶狀的研削帶171。此外,也可包括對研削帶171賦予張力的張力輪176。這些各零件172~176由基體構件170所支撐。This belt-
另外,此帶式研削部17如圖7所示,包括以使研削帶171的一部分露出的方式來覆蓋研削帶171的覆蓋體177。覆蓋體177的下壁部177a(與基板W相向的壁面)形成平面形狀,且在此下壁部177a形成有用以使研削帶171露出的開口部177H。此處,由於覆蓋體177的下壁部177a形成與基板W相向的平面形狀,故而自外部供給的水等研削液在形成於下壁部177a的下表面與基板W的上表面之間的空間中流動,高效地供給至研削部分。In addition, as shown in FIG. 7, this belt-
另外,在覆蓋體177的下壁部177a或者與此下壁部177a相連的側壁部177b的下側部分,形成有用以將進入至覆蓋體177的內部的研削液排出至外部的排出孔177c。此外,在粗研削部4及精研削部5,也可與帶式研削部17同樣,設置以這些研磨石41、51的一部分露出的方式來覆蓋的覆蓋體。In addition, the
另外,除了將粗研削部4或者精研削部5設為帶式研削部17的結構以外,基板研削模塊100B(研削機構)除了包括粗研削部4及精研削部5以外,也可還包括使用無端帶狀的研削帶171的帶式研削部17。此帶式研削部17構成為能夠在利用平臺移動部3的基板W的移動範圍內移動,且考慮與粗研削部4及精研削部5同樣,以能夠移動的方式支撐於連結梁部62。In addition, in addition to the structure in which the
除此以外,粗研削部4也可構成為能夠以包括粗研削用研磨石41的橫軸型的研削部以及使用無端帶狀的研削帶171的帶式研削型的研削部的形式來進行變更,精研削部5也可構成為能夠以包括精研削用研磨石51的縱軸型的研削部以及使用無端帶狀的研削帶171的帶式研削型的研削部的形式來進行變更。藉由使它們能夠變更,能夠選擇與基板W的種類相應的研削形態,從而能夠提高基板研削模塊100B(研削機構)的通用性。In addition, the rough
在此情況下,如圖8所示,也可構成為:相對於粗研削部4及精研削部5中的Z方向移動部的Z方向滑件18,使用附屬構件19a、附屬構件19b來安裝。例如,粗研削部4經由粗研削部4用的附屬構件19a而安裝於Z方向滑件。另外,精研削部5經由精研削部5用的附屬構件19b而安裝於Z方向滑件18。此外,圖8中,已示出帶式研削部17不使用附屬構件而安裝於Z方向滑件18的例子,但也可使用帶式研削部用的附屬構件來安裝於Z方向滑件18。藉由如上所述,使用與各研削部4、5對應的附屬構件19a、附屬構件19b,粗研削部4(橫軸型)與帶式研削部17成為能夠相互變更,且精研削部5(縱軸型)與帶式研削部17成為能夠相互變更。圖8中,由於將粗研削部4、精研削部5及Z方向移動部的Z方向滑件18設為通用,故而能夠將粗研削部4(橫軸型)、精研削部5(縱軸型)及帶式研削部17相互變更。除此以外,也可將橫軸型的主軸42與帶式研削部17的主軸172設為通用,構成為相對於此通用的主軸而能夠將粗研削用研磨石41與研削帶171相互變更。In this case, as shown in FIG. 8, it may be configured such that the Z-
進而,除了所述實施方式以外,還可設置包括較精研削部5的精研削用研磨石51而言孔更細的研磨用研磨石的研磨研削部。此研磨研削部構成為能夠在利用平臺移動部3的基板W的移動範圍內移動,考慮與粗研削部4及精研削部5同樣,以能夠移動的方式支撐於連結梁部62。Furthermore, in addition to the above-mentioned embodiment, a grinding and grinding part including a grinding stone for grinding having a finer hole than the grinding
而且,除了所述實施方式以外,還可設置包括較精研削部5的精研削用研磨石51而言孔更細的研磨用研磨石的研磨部。此研磨部考慮與粗研削部4及精研削部5同樣,以能夠移動的方式支撐於連結梁部62。Moreover, in addition to the above-mentioned embodiment, a polishing part including a polishing grindstone having a finer hole than the polishing
另外,所述實施方式的粗研削部4為橫軸型的研削部,但也可設為縱軸型的研削部。另一方面,所述實施方式的精研削部5為縱軸型的研削部,但也可設為橫軸型的研削部。In addition, the rough
另外,也可在各研削部與研削部移動部之間設置使研削部旋轉的旋轉部。此旋轉部使研削部的旋轉軸旋轉90度,能夠利用縱軸型及橫軸型來切換。In addition, a rotating part that rotates the grinding part may be provided between each grinding part and the grinding part moving part. This rotation part rotates the rotation axis of the grinding part by 90 degrees, and can be switched between the vertical axis type and the horizontal axis type.
除此以外,所述實施方式的支撐部6為門型,但也可為包括一個腳部以及自此腳部延伸的梁部的懸臂型。In addition to this, the
所述實施方式中,基板W自基板收納模塊100A供給,經研削、洗滌後再次收納於基板收納模塊100A,但供給基板的模塊(供給模塊)、與在研削、洗滌後收納基板的模塊(收納模塊)也可分開設置,例如,供給模塊與收納模塊也可設置於相向的位置。In the above embodiment, the substrate W is supplied from the
除此以外,本發明並不限定於所述實施方式,當然能夠在不脫離其主旨的範圍內進行各種變形。In addition to this, the present invention is not limited to the above-mentioned embodiments, and of course various modifications can be made without departing from the spirit thereof.
2:平臺
3:平臺移動部
4:粗研削部
5:精研削部
6:支撐部
7:粗研削部移動部
8:精研削部移動部
9:控制部
10:接觸感測器
11:研削前基板供給部
12:研削完畢基板收納部
13:洗滌部
14:乾燥部
15:檢查部
16:去毛刺部
17:帶式研削部
18:Z方向滑件
19a、19b:附屬構件
41:粗研削用研磨石
42:主軸
51:精研削用研磨石
52:主軸
61:一對腳部
62:連結梁部
100:研削裝置
100A:基板收納模塊
100B:基板研削模塊(研削機構)
100C:基板洗滌模塊
100D:基板搬送機構
170:基體構件
171:研削帶
172:主軸
173:驅動軸
174:驅動輪
175:接觸輪
176:張力輪
177:覆蓋體
177a:下壁部
177b:側壁部
177c:排出孔
177H:開口部
CTL:控制機器
P:第一位置
Q:第二位置
VP:抽吸泵
W:板狀的研削對象物(密封完畢基板、基板)2: platform
3: Platform Mobile Department
4: Rough grinding department
5: Fine grinding and cutting department
6: Support
7: Rough grinding part moving part
8: Fine grinding and cutting department moving department
9: Control Department
10: Touch sensor
11: Substrate supply department before grinding
12: After grinding, the substrate storage section
13: Washing part
14: Dry part
15: Inspection Department
16: Deburring Department
17: Belt grinding department
18: Slider in
圖1是示意性表示本發明的研削裝置的一實施方式的結構的俯視圖。 圖2是示意性表示所述實施方式的研削機構的結構的背視圖。 圖3是示意性表示所述實施方式的(A)進行粗研削的狀態、(B)進行精研削的狀態的俯視圖。 圖4是示意性表示本發明的研削裝置的變形實施方式的結構的俯視圖。 圖5是示意性表示本發明的研削裝置的變形實施方式的結構的俯視圖。 圖6是示意性表示變形實施方式的帶式研削部的結構的正視圖及側視圖。 圖7是表示帶式研削部中的套管的結構的示意圖。 圖8是示意性表示粗研削部、精研削部及帶式研削部的在Z方向滑件上的安裝結構的圖。FIG. 1 is a plan view schematically showing the structure of an embodiment of the grinding apparatus of the present invention. Fig. 2 is a rear view schematically showing the structure of the grinding mechanism of the embodiment. 3 is a plan view schematically showing (A) a state where rough grinding is performed and (B) a state where fine grinding is performed in the embodiment. Fig. 4 is a plan view schematically showing the configuration of a modified embodiment of the grinding apparatus of the present invention. Fig. 5 is a plan view schematically showing the configuration of a modified embodiment of the grinding apparatus of the present invention. Fig. 6 is a front view and a side view schematically showing the structure of a belt grinding part of a modified embodiment. Fig. 7 is a schematic diagram showing the structure of the sleeve in the belt grinding section. Fig. 8 is a diagram schematically showing the mounting structure of the rough grinding portion, the fine grinding portion, and the belt grinding portion on the Z-direction slider.
2:平臺2: platform
3:平臺移動部3: Platform Mobile Department
4:粗研削部4: Rough grinding department
5:精研削部5: Fine grinding and cutting department
6:支撐部6: Support
41:粗研削用研磨石41: Grinding stone for rough grinding
42:主軸42: Spindle
51:精研削用研磨石51: Grinding stone for fine grinding
52:主軸52: Spindle
P:第一位置P: First position
Q:第二位置Q: Second position
W:板狀的研削對象物(密封完畢基板、基板)W: Plate-shaped grinding object (sealed substrate, substrate)
Claims (11)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
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JP2019-233690 | 2019-12-25 | ||
JP2019233690 | 2019-12-25 | ||
JP2020-093004 | 2020-05-28 | ||
JP2020093004A JP2021102258A (en) | 2019-12-25 | 2020-05-28 | Grinding mechanism and grinding device |
Publications (1)
Publication Number | Publication Date |
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TW202124093A true TW202124093A (en) | 2021-07-01 |
Family
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Application Number | Title | Priority Date | Filing Date |
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TW109145555A TW202124093A (en) | 2019-12-25 | 2020-12-22 | Grinding mechanism and grinding apparatus |
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JP (1) | JP2021102258A (en) |
KR (1) | KR20210082357A (en) |
SG (1) | SG10202012651TA (en) |
TW (1) | TW202124093A (en) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
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US6181799B1 (en) | 1995-09-02 | 2001-01-30 | New Transducers Limited | Greetings or the like card |
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2020
- 2020-05-28 JP JP2020093004A patent/JP2021102258A/en active Pending
- 2020-12-15 KR KR1020200175089A patent/KR20210082357A/en not_active Application Discontinuation
- 2020-12-16 SG SG10202012651TA patent/SG10202012651TA/en unknown
- 2020-12-22 TW TW109145555A patent/TW202124093A/en unknown
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Publication number | Publication date |
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JP2021102258A (en) | 2021-07-15 |
KR20210082357A (en) | 2021-07-05 |
SG10202012651TA (en) | 2021-07-29 |
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