TW202126429A - Grinding mechanism and grinding apparatus - Google Patents

Grinding mechanism and grinding apparatus Download PDF

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Publication number
TW202126429A
TW202126429A TW109145538A TW109145538A TW202126429A TW 202126429 A TW202126429 A TW 202126429A TW 109145538 A TW109145538 A TW 109145538A TW 109145538 A TW109145538 A TW 109145538A TW 202126429 A TW202126429 A TW 202126429A
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grinding
rough
substrate
fine
belt
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TW109145538A
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Chinese (zh)
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TWI771836B (en
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高森雄大
高橋和宏
花坂周邦
渡辺創
礒野早織
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日商Towa股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/02Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor involving a reciprocatingly-moved work-table
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B21/00Machines or devices using grinding or polishing belts; Accessories therefor
    • B24B21/008Machines comprising two or more tools or having several working posts
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/005Feeding or manipulating devices specially adapted to grinding machines
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/02Frames; Beds; Carriages

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Grinding Of Cylindrical And Plane Surfaces (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

The present invention enables a uniform flatness to be obtained during rough grinding and finishing grinding of a grinding object, and is provided with a plurality of tables 2 that hold planar grinding objects W, at least one rough grinding unit 4 that performs rough grinding on the grinding object W, and at least one finishing grinding unit 5 that performs finishing grinding on the grinding object W, wherein the rough grinding unit 4 and the finishing grinding unit 5 are able to be moved to each of the plurality of tables 2.

Description

研削機構及研削裝置Grinding mechanism and grinding device

本發明有關於一種研削機構及研削裝置。The invention relates to a grinding mechanism and a grinding device.

在對例如樹脂密封基板等研削對象物進行研削的情況下,存在於粗研削之後進行精研削的情況。In the case of grinding an object to be ground, such as a resin-sealed substrate, there is a case in which finish grinding is performed after rough grinding.

而且,以前考慮粗研削及精研削利用分別不同的研削裝置來進行,或者在如專利文獻1所示的包括兩個平臺的半導體帶式研磨機中,在其中一個平臺上進行粗研削,且在另一個平臺上進行精研削。 [現有技術文獻] [專利文獻]Moreover, it has been considered that rough grinding and fine grinding are performed using separate grinding devices, or in a semiconductor belt grinder including two stages as shown in Patent Document 1, rough grinding is performed on one of the stages, and Fine grinding is carried out on another platform. [Prior Art Literature] [Patent Literature]

[專利文獻1]日本專利第6181799號公報[Patent Document 1] Japanese Patent No. 6181799

[發明所要解決的問題] 然而,在利用不同的研削裝置來進行粗研削及精研削的情況、以及如專利文獻1那樣在不同的平臺上進行粗研削及精研削的情況中的任一情況下,均需要在粗研削後將研削對象物移載至另一平臺。如此一來,需要在移載後的平臺上再次進行對準。即便對準,在移載前後平臺的水平度也不完全相同,因此對固定於平臺上來研削的研削對象物的平坦度造成影響,導致粗研削時的研削對象物的平坦度與精研削時的研削對象物的平坦度改變。其結果為,存在研削精度變差的擔憂。尤其在研削對象物薄(例如,5 mm以下、1 mm以下)的情況下,此平坦度(研削精度)的問題重大。[The problem to be solved by the invention] However, in either the case of using different grinding devices to perform rough grinding and fine grinding, and the case of performing rough grinding and fine grinding on different platforms as in Patent Document 1, it is necessary to perform the rough grinding after the rough grinding. Transfer the grinding object to another platform. As a result, the alignment needs to be performed again on the platform after the transfer. Even if it is aligned, the levelness of the platform is not exactly the same before and after the transfer, so it affects the flatness of the grinding object fixed on the platform for grinding, resulting in the flatness of the grinding object during rough grinding and that during fine grinding. The flatness of the grinding object changes. As a result, there is a concern that the grinding accuracy will deteriorate. Especially when the grinding object is thin (for example, 5 mm or less, 1 mm or less), the problem of flatness (grinding accuracy) is serious.

因此,本發明的主要課題為在對研削對象物的粗研削及精研削中使平坦度一定。Therefore, the main subject of the present invention is to make the flatness constant in the rough grinding and the fine grinding of the grinding object.

[解決問題的技術手段] 即,本發明的研削機構包括:多個平臺,將板狀的研削對象物加以保持;至少一個粗研削部,對所述研削對象物進行粗研削;以及至少一個精研削部,對所述研削對象物進行精研削;並且在所述多個平臺的每一個上,所述粗研削部及所述精研削部構成為能夠移動。 本發明的研削裝置,包括所述研削機構。[Technical means to solve the problem] That is, the grinding mechanism of the present invention includes: a plurality of platforms for holding a plate-shaped grinding object; at least one rough grinding portion for rough grinding the grinding object; and at least one fine grinding portion for grinding the object The object is subjected to fine grinding; and on each of the plurality of platforms, the rough grinding portion and the fine grinding portion are configured to be movable. The grinding device of the present invention includes the grinding mechanism.

[發明的效果] 根據如上所述而構成的本發明,能夠在多個平臺的每一個中使粗研削及精研削的平坦度一定。[Effects of the invention] According to the present invention configured as described above, the flatness of rough grinding and fine grinding can be constant in each of the plurality of platforms.

其次,關於本發明,舉例來進一步進行詳細說明。但,本發明不受以下說明所限定。Next, the present invention will be described in further detail with an example. However, the present invention is not limited by the following description.

本發明的研削機構如上所述,特徵在於包括:多個平臺,將板狀的研削對象物加以保持;至少一個粗研削部,對所述研削對象物進行粗研削;以及至少一個精研削部,對所述研削對象物進行精研削;並且在所述多個平臺的每一個上,所述粗研削部及所述精研削部構成為能夠移動。 若為此種研削機構,則在多個平臺的每一個上,粗研削部及精研削部構成為能夠移動,因此能夠以在各平臺上保持有研削對象物的狀態來進行粗研削及精研削這兩者。由此,不需要將研削對象物移載至不同的平臺,不需要在不同平臺上再次對準,能夠在多個平臺的每一個中使粗研削及精研削的平坦度一定。其結果為,能夠藉由將多個研削對象物同時進行研削而提高處理量(處理能力),並且能夠提高各平臺中的研削對象物的研削精度。As described above, the grinding mechanism of the present invention is characterized by including: a plurality of platforms for holding a plate-shaped grinding object; at least one rough grinding portion for rough grinding the grinding object; and at least one fine grinding portion, The grinding target is subjected to fine grinding; and on each of the plurality of platforms, the rough grinding portion and the fine grinding portion are configured to be movable. With this type of grinding mechanism, the rough grinding section and the fine grinding section are configured to be movable on each of the multiple platforms, so that rough grinding and fine grinding can be performed while holding the grinding target on each platform Both. Therefore, there is no need to transfer the grinding object to a different platform, and there is no need to realign it on a different platform, and the flatness of rough grinding and fine grinding can be kept constant in each of a plurality of platforms. As a result, it is possible to increase the throughput (processing capacity) by grinding a plurality of grinding objects at the same time, and it is possible to improve the grinding accuracy of the grinding objects on each platform.

各平臺中,為了設為與其他平臺獨立地進行粗研削及精研削這兩者的結構,所述粗研削部及所述精研削部理想為與所述多個平臺分別對應而設置有多個。In each platform, in order to be configured to perform both rough grinding and fine grinding independently from other platforms, it is desirable that the rough grinding part and the fine grinding part are provided in plural corresponding to the plural platforms. .

兩個平臺中,在其中一個平臺上進行粗研削時,在另一個平臺上進行精研削的情況(在兩個平臺上不在相同的時機進行粗研削或精研削的情況)下,不需要與兩個平臺分別對應而設置粗研削部及精研削部。因此,為了簡化結構,所述粗研削部或所述精研削部中的至少一者理想為在至少兩個所述平臺中共用。In the two platforms, when rough grinding is performed on one of the platforms, and fine grinding is performed on the other platform (in the case that rough grinding or fine grinding is not performed on the two platforms at the same timing), there is no need to compare with the two platforms. Each platform is provided with a rough grinding and cutting part corresponding to each other. Therefore, in order to simplify the structure, at least one of the rough grinding part or the fine grinding part is desirably shared in at least two of the platforms.

本發明的研削機構中,作為使多個平臺移動的具體實施方式,考慮研削機構還包括多個平臺移動部,所述平臺移動部設置於所述多個平臺的每一個上,且使所述平臺沿著一方向而在規定的範圍內進行直線往復移動。 此結構中,作為所述粗研削部及所述精研削部的具體移動形態,考慮所述粗研削部及所述精研削部在將利用所述平臺移動部的所述平臺的往復移動方向橫切的方向上移動。較佳為考慮,所述粗研削部及所述精研削部在與所述平臺的往復移動方向正交的方向上移動。In the grinding mechanism of the present invention, as a specific embodiment of moving multiple platforms, it is considered that the grinding mechanism further includes a plurality of platform moving parts, the platform moving parts are provided on each of the multiple platforms, and the The platform reciprocates linearly within a prescribed range in one direction. In this structure, as the specific movement form of the rough grinding portion and the fine grinding portion, it is considered that the rough grinding portion and the fine grinding portion are horizontally in the reciprocating direction of the platform using the platform moving portion. Move in the direction of cut. It is preferable to consider that the rough grinding part and the fine grinding part move in a direction orthogonal to the reciprocating movement direction of the platform.

粗研削由於研削量增多,故而粗研削用研磨石的堵塞成為問題。因此,所述粗研削部理想為包括粗研削用研磨石的橫軸型的研削部。此外,橫軸型的研削部是研磨石的旋轉軸相對於平檯面而平行的研削方式。 若為此結構,則能夠減少粗研削用研磨石的堵塞。As the amount of rough grinding increases, clogging of the grindstone for rough grinding becomes a problem. Therefore, the rough grinding part is desirably a horizontal axis type grinding part including a grinding stone for rough grinding. In addition, the horizontal axis type grinding part is a grinding method in which the rotation axis of the grinding stone is parallel to the table surface. With this structure, clogging of the grindstone for rough grinding can be reduced.

另外,所述精研削部理想為包括精研削用研磨石的縱軸型的研削部。此外,縱軸型的研削部是研磨石的旋轉軸相對於平檯面而垂直的研削方式。 若為此結構,則能夠進行高精度的研削,研削麵積大而能夠提高生產性。In addition, the fine grinding part is desirably a longitudinal axis type grinding part including a grinding stone for fine grinding. In addition, the vertical axis type grinding part is a grinding method in which the rotation axis of the grinding stone is perpendicular to the table surface. With this structure, high-precision grinding can be performed, the grinding area is large, and productivity can be improved.

根據研削對象物的種類,粗研削用研磨石或精研削用研磨石的堵塞的問題變大。另外,還存在如例如僅使銅配線部或焊接部露出的研削對象物等那樣對研削精度的要求不太高的研削對象物。在如上所述的研削對象物的情況下,若使用粗研削用研磨石或精研削用研磨石,則運轉成本增大。 為了適當解決此問題,所述粗研削部或所述精研削部理想為使用無端帶狀的研削帶的帶式研削型的研削部。與粗研削用研磨石或精研削用研磨石相比,研削帶廉價,能夠實現大幅度的成本下降。另外,研削帶與粗研削用研磨石或精研削用研磨石相比,交換作業也容易。Depending on the type of the grinding object, the problem of clogging of the grinding stone for rough grinding or the grinding stone for fine grinding becomes greater. In addition, there are also objects to be polished, such as objects that only expose copper wiring portions or soldered portions, and the like that do not require a high degree of accuracy in polishing. In the case of the grinding object as described above, if the grinding stone for rough grinding or the grinding stone for fine grinding is used, the running cost increases. In order to appropriately solve this problem, the rough grinding part or the fine grinding part is desirably a belt grinding type grinding part using an endless belt-shaped grinding belt. Compared with grinding stones for rough grinding or grinding stones for fine grinding, grinding belts are inexpensive and can achieve a significant cost reduction. In addition, the grinding belt is easier to exchange than a grinding stone for rough grinding or a grinding stone for fine grinding.

為了能夠選擇與研削對象物的種類相應的研削形態,提高研削機構的通用性,所述粗研削部理想為構成為能夠以包括粗研削用研磨石的橫軸型的研削部以及使用無端帶狀的研削帶的帶式研削型的研削部的形式來進行變更,所述精研削部理想為構成為能夠以包括精研削用研磨石的縱軸型的研削部以及使用無端帶狀的研削帶的帶式研削型的研削部的形式來進行變更。In order to be able to select a grinding form corresponding to the type of object to be ground, and to improve the versatility of the grinding mechanism, the rough grinding part is ideally configured to be able to use a horizontal shaft type grinding part including a grinding stone for rough grinding and an endless belt shape. The form of the belt grinding type grinding part of the grinding belt is changed. The finishing grinding part is ideally configured to be able to use a longitudinal axis type grinding part including a grinding stone for finishing grinding and an endless belt-shaped grinding belt. The form of the belt grinding type grinding section is changed.

為了藉由穩定地支撐粗研削部及精研削部而提高研削精度,理想為還包括夾持所述多個平臺而設置的一對腳部、以及架設於所述一對腳部的連結梁部,並且所述粗研削部及所述精研削部以能夠移動的方式支撐於所述連結梁部。In order to improve the grinding accuracy by stably supporting the rough grinding portion and the fine grinding portion, it is desirable to further include a pair of legs provided to sandwich the plurality of platforms, and a connecting beam portion erected on the pair of legs And the rough grinding part and the fine grinding part are movably supported by the connecting beam part.

此處,所述連結梁部中,理想為在近前側支撐所述粗研削部或所述精研削部中的一者,且在深處側支撐所述粗研削部或所述精研削部中的另一者。若為此結構,則在每個平臺上,能夠使由於連結梁部的撓曲等而受到的粗研削的不均相同,且能夠使由於連結梁部的撓曲等而受到的精研削的不均相同。Here, in the connecting beam portion, it is desirable to support one of the rough grinding portion or the fine grinding portion on the near side, and to support the rough grinding portion or the fine grinding portion on the deep side The other one. With this structure, the unevenness of the rough grinding due to the deflection of the connecting beam can be made uniform for each platform, and the unevenness of the fine grinding due to the deflection of the connecting beam can be reduced. All the same.

除此以外,為了提高研削機構的通用性,理想為除了所述粗研削部及所述精研削部以外,還包括使用無端帶狀的研削帶的帶式研削部,並且在所述多個平臺的每一個上,所述帶式研削部構成為能夠移動。In addition, in order to improve the versatility of the grinding mechanism, it is desirable that in addition to the rough grinding part and the fine grinding part, a belt-type grinding part using an endless belt-shaped grinding belt is also included, and the multiple platforms On each of the above, the belt grinding part is configured to be movable.

為了抑制由毛刺所引起的研削不良,或者提高研削對象物的品質,研削機構理想為還包括進行所述研削對象物的去毛刺的去毛刺部,並且在所述多個平臺的每一個上,所述去毛刺部構成為能夠移動。In order to suppress grinding defects caused by burrs or improve the quality of the grinding object, it is desirable that the grinding mechanism further includes a deburring part that performs deburring of the grinding object, and on each of the plurality of platforms, The deburring part is configured to be movable.

另外,包括所述研削機構的研削裝置也為本發明的一形態。In addition, a grinding device including the grinding mechanism is also an aspect of the present invention.

<本發明的一實施方式> 以下,參照圖式來對本發明的研削裝置的一實施方式進行說明。此外,關於以下所示的任一圖,為了容易理解,而適當省略或者誇張地示意性描畫。關於同一構成元件,標注同一符號而適當省略說明。<One embodiment of the present invention> Hereinafter, an embodiment of the grinding apparatus of the present invention will be described with reference to the drawings. In addition, in order to facilitate understanding of any of the drawings shown below, it is appropriately omitted or exaggerated and schematically depicted. Regarding the same constituent elements, the same reference numerals are attached, and the description is appropriately omitted.

以下的說明中,作為板狀的研削對象物,以經樹脂密封的基板(密封完畢基板)為一例來進行說明。基板例如可列舉:玻璃環氧基板、陶瓷基板、樹脂基板、金屬基板等一般的基板以及引線框架等。除此以外,板狀的研削對象物也可為基板以外的對象。In the following description, as a plate-shaped object to be ground, a resin-sealed substrate (sealed substrate) will be described as an example. Examples of the substrate include general substrates such as glass epoxy substrates, ceramic substrates, resin substrates, and metal substrates, lead frames, and the like. In addition, the plate-shaped grinding object may be an object other than the substrate.

<研削裝置100的整體結構> 本實施方式的研削裝置100藉由對密封完畢基板W(以下簡稱為“基板W”)的表面進行平面研削,來進行基板W的高度調整(厚度調整)、或者搭載於基板W的電子零件的散熱性的提高等基板的改良。<The overall structure of the grinding device 100> The grinding apparatus 100 of the present embodiment performs planar grinding of the surface of the sealed substrate W (hereinafter referred to as "substrate W") to adjust the height (thickness adjustment) of the substrate W, or perform adjustment of the electronic components mounted on the substrate W. Improvement of substrates such as improved heat dissipation.

具體而言,研削裝置100如圖1所示,包括:供給基板W的基板供給模塊100A、對基板W進行研削的基板研削模塊100B、對經研削的基板W進行洗滌的基板洗滌模塊100C、以及將經研削的基板W加以收納的基板收納模塊100D,來分別作為構成元件。各構成元件100A~100D能夠分別相對於其他構成元件而相互拆裝,且能夠更換。另外,在各模塊100A~100D間的基板W的移動是利用基板搬送機構100E和/或機械臂(未圖示)來進行。本實施方式的研削裝置100整體的動作是利用包括後述控制部9的控制機器CTL來控制。Specifically, as shown in FIG. 1, the grinding apparatus 100 includes a substrate supply module 100A that supplies a substrate W, a substrate grinding module 100B that grinds the substrate W, a substrate cleaning module 100C that cleans the ground substrate W, and The substrate storage modules 100D in which the ground substrate W is stored are used as constituent elements. The respective constituent elements 100A to 100D can be detached from and detached from other constituent elements, and can be replaced. In addition, the movement of the substrate W between the respective modules 100A to 100D is performed by the substrate transport mechanism 100E and/or a robot arm (not shown). The overall operation of the grinding apparatus 100 of the present embodiment is controlled by a control device CTL including a control unit 9 described later.

基板供給模塊100A供給研削前的基板W(研削前基板)。具體而言,基板供給模塊100A包括供給基板W的研削前基板供給部11。The substrate supply module 100A supplies the substrate W before grinding (substrate before grinding). Specifically, the substrate supply module 100A includes a pre-grinding substrate supply unit 11 that supplies the substrate W.

基板研削模塊100B對由基板搬送機構100E和/或機械臂(未圖示)來搬送的基板W的表面進行平面研削,具體而言,基板研削模塊100B進行粗研削及精研削這兩者。詳情將於後述。The substrate grinding module 100B performs planar grinding on the surface of the substrate W conveyed by the substrate conveying mechanism 100E and/or the robot arm (not shown). Specifically, the substrate grinding module 100B performs both rough grinding and fine grinding. The details will be described later.

基板洗滌模塊100C對利用基板研削模塊100B來研削的基板W(研削完畢基板)進行洗滌。具體而言,基板洗滌模塊100C包括:旋轉式的洗滌部13,利用例如水等洗滌液來對經研削的基板W進行洗滌;以及乾燥部14,使經洗滌的基板W乾燥。除此以外,在基板洗滌模塊100C,也可設置有包括用以判斷基板W的優劣的相機的檢查部15。此外,此檢查部15也可與基板洗滌模塊100C分開而作為檢查模塊來設置。The substrate cleaning module 100C cleans the substrate W (grounded substrate) ground by the substrate grinding module 100B. Specifically, the substrate washing module 100C includes a rotary washing unit 13 for washing the ground substrate W with a washing liquid such as water, and a drying unit 14 for drying the washed substrate W. In addition to this, the substrate cleaning module 100C may be provided with an inspection unit 15 including a camera for judging the quality of the substrate W. In addition, the inspection unit 15 may be separated from the substrate washing module 100C and provided as an inspection module.

基板收納模塊100D將利用基板洗滌模塊100C來洗滌,且利用基板搬送機構100E和/或機械臂(未圖示)來搬送的基板W加以收納。具體而言,基板收納模塊100D包括將基板W加以收納的研削完畢基板收納部12。此外,也可藉由將研削完畢基板收納部12設置於基板供給模塊100A,而將基板收納模塊100D設為與基板供給模塊100A相同的模塊。The substrate storage module 100D stores the substrate W that is cleaned by the substrate cleaning module 100C and is transported by the substrate transport mechanism 100E and/or the robot arm (not shown). Specifically, the substrate storage module 100D includes a ground substrate storage portion 12 that stores the substrate W. In addition, the substrate storage module 100D may be the same module as the substrate supply module 100A by installing the ground substrate storage section 12 in the substrate supply module 100A.

<基板研削模塊100B(研削機構)> 其次,對基板研削模塊100B(研削機構)進行詳細敘述。<Substrate grinding module 100B (grinding mechanism)> Next, the substrate grinding module 100B (grinding mechanism) will be described in detail.

具體而言,基板研削模塊100B如圖1~圖3所示,包括:將基板W加以保持的多個平臺2、使多個平臺2分別進行直線往復移動的多個平臺移動部3、對基板W進行粗研削的至少一個粗研削部4、以及對基板W進行精研削的至少一個精研削部5;並且在多個平臺2的每一個上,粗研削部4及精研削部5構成為能夠移動。此外,本實施方式中,是包括兩個平臺2以及兩個平臺移動部3的結構。Specifically, as shown in FIGS. 1 to 3, the substrate grinding module 100B includes: a plurality of stages for holding the substrate W; At least one rough grinding part 4 for rough grinding and at least one fine grinding part 5 for finishing the substrate W; and on each of the plurality of platforms 2, the rough grinding part 4 and the fine grinding part 5 are configured to be able to move. In addition, in this embodiment, it is a structure including two platforms 2 and two platform moving parts 3.

各平臺2將基板W吸附保持,在其上表面形成有用以吸附基板W的多數個吸附孔(未圖示)。此外,多數個吸附孔連接於抽吸泵VP。本實施方式的平臺2是與俯視長方形狀的基板W對應而形成俯視長方形狀。Each platform 2 sucks and holds the substrate W, and a plurality of suction holes (not shown) for sucking the substrate W are formed on the upper surface thereof. In addition, a plurality of adsorption holes are connected to the suction pump VP. The stage 2 of the present embodiment is formed in a rectangular shape in a plan view corresponding to a substrate W having a rectangular shape in a plan view.

各平臺移動部3使平臺2沿著一方向(Y方向)而在規定的範圍內進行直線往復移動。另外,各平臺移動部3能夠與其他平臺移動部3獨立地使平臺2進行直線往復移動。具體而言,各平臺移動部3於在Y方向上設定於近前側的第一位置P、與在Y方向上設定於深處側的第二位置Q之間使平臺2進行直線往復移動。此處,第一位置P是進行基板W的接收及交接的位置,但也可設定為與進行基板W的接收及交接的位置不同的位置。Each stage moving part 3 makes the stage 2 linearly reciprocate within a predetermined range along one direction (Y direction). In addition, each platform moving part 3 can make the platform 2 linearly reciprocate independently of the other platform moving parts 3. Specifically, each stage moving portion 3 linearly reciprocates the stage 2 between a first position P set on the near side in the Y direction and a second position Q set on the deep side in the Y direction. Here, the first position P is a position where the substrate W is received and delivered, but it may be set to a position different from the position where the substrate W is received and delivered.

本實施方式的各平臺移動部3是以平臺2的長邊方向與平臺2的往復移動方向(Y方向)一致的方式使平臺2移動的結構。另外,各平臺移動部3為了達成高的研削精度,理想為不包括使平臺2旋轉的機構。兩個平臺移動部3並排設置於X方向,各平臺移動部3包括:沿著Y方向而設置的Y方向軌道、在此Y方向軌道上滑動且固定有平臺2的Y方向滑件、以及將此Y方向滑件驅動的Y方向驅動部(例如,滾珠螺桿及伺服馬達)。此外,Y方向驅動部藉由利用後述的控制部9來控制,使得平臺2沿著Y方向軌道而直線往復移動。Each platform moving part 3 of this embodiment is a structure which moves the platform 2 so that the longitudinal direction of the platform 2 and the reciprocating direction (Y direction) of the platform 2 may correspond. In addition, in order to achieve high grinding accuracy, each stage moving part 3 preferably does not include a mechanism for rotating the stage 2. The two platform moving parts 3 are arranged side by side in the X direction, and each platform moving part 3 includes: a Y-direction rail arranged along the Y-direction, a Y-direction slider that slides on the Y-direction rail and is fixed with the platform 2, and The Y-direction drive unit (for example, ball screw and servo motor) driven by the Y-direction slider. In addition, the Y-direction drive unit is controlled by the control unit 9 described later so that the stage 2 linearly reciprocates along the Y-direction rail.

本實施方式中,粗研削部4及精研削部5相對於多個平臺2(多個平臺移動部3)的每一個而設置有至少一個。具體而言,本實施方式中,與其中一個平臺2對應而設置有一個粗研削部4及一個精研削部5,且與另一個平臺2對應而設置有一個粗研削部4及一個精研削部5。In this embodiment, at least one of the rough grinding part 4 and the fine grinding part 5 is provided with respect to each of a some stage 2 (a plurality of stage moving parts 3). Specifically, in this embodiment, one rough grinding part 4 and one fine grinding part 5 are provided corresponding to one of the platforms 2, and one rough grinding part 4 and one fine grinding part are provided corresponding to the other platform 2. 5.

各粗研削部4在利用所對應的平臺移動部3的基板W的移動範圍內移動,來對基板W的上表面進行粗研削。此粗研削部4是包括粗研削用研磨石41的橫軸型的研削部,且設定為使粗研削用研磨石41旋轉的主軸42的旋轉軸相對於平檯面而平行。此粗研削用研磨石41形成圓板形狀,其外側周面成為用於研削的使用面。Each rough grinding part 4 moves within the movement range of the substrate W by the corresponding stage moving part 3 to roughly grind the upper surface of the substrate W. This rough grinding part 4 is a horizontal axis type grinding part including the grinding stone 41 for rough grinding, and is set so that the rotation axis of the main shaft 42 which rotates the grinding stone 41 for rough grinding may be parallel with respect to a table surface. This grindstone 41 for rough grinding is formed in the shape of a disc, and the outer peripheral surface becomes a use surface for grinding.

各精研削部5在利用所對應的平臺移動部3的基板W的移動範圍內移動,來對基板W進行精研削。此精研削部5是包括精研削用研磨石51的縱軸型的研削部,且設定為使精研削用研磨石51旋轉的主軸52的旋轉軸相對於平檯面而垂直。此處,精研削用研磨石51是較粗研削用研磨石41而言孔更細的研磨石。另外,精研削用研磨石51形成圓環形狀或圓板形狀,其軸方向的一端面成為用於研削的使用面。進而,精研削用研磨石51具有大於基板W的寬度尺寸的直徑。Each fine grinding part 5 moves within the movement range of the substrate W by the corresponding stage moving part 3 to perform fine grinding of the substrate W. This lapping part 5 is a longitudinal-axis type lapping part including the grindstone 51 for lapping, and it is set so that the rotation axis of the main shaft 52 which rotates the grindstone 51 for lapping may be perpendicular|vertical with respect to a table surface. Here, the grinding stone 51 for fine grinding is a grinding stone with a finer hole than the grinding stone 41 for rough grinding. In addition, the grindstone 51 for lapping is formed in a ring shape or a disc shape, and one end surface in the axial direction becomes a use surface for grinding. Furthermore, the grindstone 51 for lapping has a diameter larger than the width dimension of the board|substrate W. As shown in FIG.

具體而言,各粗研削部4及各精研削部5構成為在將利用平臺移動部3的平臺2的往復移動方向(Y方向)橫切的方向上移動。本實施方式中,各粗研削部4及各精研削部5構成為在第一位置P與第二位置Q之間,在與Y方向正交的X方向上移動。Specifically, each rough grinding portion 4 and each fine grinding portion 5 are configured to move in a direction transverse to the reciprocating movement direction (Y direction) of the stage 2 using the stage moving portion 3. In the present embodiment, each rough grinding part 4 and each fine grinding part 5 are configured to move between the first position P and the second position Q in the X direction orthogonal to the Y direction.

而且,本實施方式的基板研削模塊100B包括門型的支撐部6,以能夠移動的方式支撐各粗研削部4及各精研削部5。此支撐部6如圖2及圖3所示,包括:設置於兩個平臺2(兩個平臺移動部3)的兩側的一對腳部61、以及架設於一對腳部61的連結梁部62;並且各粗研削部4及各精研削部5以能夠移動的方式支撐於此連結梁部62。連結梁部62在第一位置P與第二位置Q之間沿著X方向而設置。本實施方式中為如下結構:在連結梁部62的近前側支撐兩個粗研削部4,且在連結梁部62的深處側支撐兩個精研削部5。藉由此結構,對兩個基板W進行粗研削或精研削的Y方向的位置成為相同位置。其結果為,在每個平臺2上,能夠使由於連結梁部62的撓曲等而受到的粗研削的不均相同,且能夠使由於連結梁部62的撓曲等而受到的精研削的不均相同。In addition, the substrate grinding module 100B of the present embodiment includes a gate-shaped support portion 6 to support each rough grinding portion 4 and each fine grinding portion 5 in a movable manner. As shown in Figures 2 and 3, the supporting part 6 includes: a pair of legs 61 arranged on both sides of the two platforms 2 (two platform moving parts 3), and a connecting beam erected on the pair of legs 61 Section 62; and each rough grinding portion 4 and each fine grinding portion 5 are movably supported by this connecting beam portion 62. The connecting beam portion 62 is provided along the X direction between the first position P and the second position Q. The present embodiment has a structure in which the two rough grinding parts 4 are supported on the near side of the connecting beam part 62 and the two fine grinding parts 5 are supported on the deep side of the connecting beam part 62. With this structure, the positions in the Y direction at which the two substrates W are subjected to rough grinding or fine grinding become the same position. As a result, the unevenness of rough grinding due to the deflection of the connecting beam portion 62 and the like can be made uniform for each platform 2, and the fine grinding due to the deflection and the like of the connecting beam portion 62 can be made uniform. Not all the same.

此處,在連結梁部62與各粗研削部4之間,如圖2所示,設置有粗研削部移動部7,且在連結梁部62與各精研削部5之間,如圖3所示,設置有精研削部移動部8。此外,圖1中,未圖示出粗研削部移動部7及精研削部移動部8。Here, between the connecting beam portion 62 and each rough grinding portion 4, as shown in FIG. 2, a rough grinding portion moving portion 7 is provided, and between the connecting beam portion 62 and each fine grinding portion 5, as shown in FIG. As shown, a fine grinding and cutting part moving part 8 is provided. In addition, in FIG. 1, the rough grinding part moving part 7 and the fine grinding part moving part 8 are not shown in figure.

粗研削部移動部7使各粗研削部4在X方向上移動,例如,在連結梁部62中包括:沿著X方向而設置的X方向軌道、沿著此X方向軌道而移動的X方向滑件、以及將此X方向滑件驅動的X方向驅動部。X方向滑件及X方向驅動部是與兩個粗研削部4分別對應而設置。此外,X方向軌道在兩個粗研削部4中通用,但也可分別對應而設置。各X方向驅動部是由後述的控制部9來控制,各粗研削部4相互獨立地沿著X方向而移動。The rough grinding portion moving portion 7 moves each rough grinding portion 4 in the X direction. For example, the connecting beam portion 62 includes an X direction rail provided along the X direction, and an X direction moving along the X direction rail. A slider, and an X-direction drive unit that drives the X-direction slider. The X-direction slider and the X-direction drive part are provided corresponding to the two rough grinding parts 4, respectively. In addition, the X-direction rails are common to the two rough grinding parts 4, but they may be provided in correspondence with each other. Each X-direction drive unit is controlled by a control unit 9 described later, and each rough grinding unit 4 moves in the X direction independently of each other.

另外,粗研削部移動部7設為能夠使各粗研削部4在Z方向上移動的結構,在連結梁部62中包括:沿著Z方向而設置的Z方向軌道、沿著此Z方向軌道而移動的Z方向滑件、以及將此Z方向滑件進行驅動的Z方向驅動部。Z方向軌道、Z方向滑件及Z方向驅動部是與兩個粗研削部4分別對應而設置。各Z方向驅動部是由後述的控制部9來控制,各粗研削部4相互獨立地沿著Z方向而移動。In addition, the rough grinding portion moving portion 7 is configured to be capable of moving each rough grinding portion 4 in the Z direction, and the connecting beam portion 62 includes a Z direction rail provided along the Z direction, and a rail along the Z direction. The moving Z-direction slider and the Z-direction drive unit that drives the Z-direction slider. The Z-direction rail, the Z-direction slider, and the Z-direction drive part are provided corresponding to the two rough grinding parts 4, respectively. Each Z direction drive unit is controlled by a control unit 9 described later, and each rough grinding unit 4 moves in the Z direction independently of each other.

精研削部移動部8使各精研削部5在X方向上移動,例如,連結梁部62中包括:沿著X方向而設置的X方向軌道、沿著此X方向軌道而移動的X方向滑件、以及將此X方向滑件進行驅動的X方向驅動部。X方向滑件及X方向驅動部是與兩個精研削部5分別對應而設置。此外,X方向軌道在兩個精研削部5中通用,但也可分別對應而設置。各X方向驅動部是由後述的控制部9來控制,各精研削部5相互獨立地沿著X方向而移動。The lapping section moving section 8 moves each lapping section 5 in the X direction. For example, the connecting beam section 62 includes an X-direction rail provided along the X-direction, and an X-direction slide that moves along the X-direction rail. And an X-direction drive unit that drives this X-direction slider. The X-direction slider and the X-direction drive unit are provided in correspondence with the two lapping parts 5, respectively. In addition, the X-direction rails are common to the two lapping parts 5, but they may be provided in correspondence with each other. Each X-direction drive unit is controlled by a control unit 9 described later, and each fine grinding unit 5 moves in the X direction independently of each other.

另外,精研削部移動部8設為使各精研削部5在Z方向上移動的結構,連結梁部62中包括:沿著Z方向而設置的Z方向軌道、沿著此Z方向軌道而移動的Z方向滑件、以及將此Z方向滑件進行驅動的Z方向驅動部。Z方向軌道、Z方向滑件及Z方向驅動部是與兩個精研削部5分別對應而設置。各Z方向驅動部是由後述的控制部9來控制,各精研削部5相互獨立地沿著Z方向而移動。In addition, the lapping section moving section 8 is configured to move each lapping section 5 in the Z direction, and the connecting beam section 62 includes a Z-direction rail provided along the Z direction and moving along the Z-direction rail. The Z-direction slider and the Z-direction drive unit that drives the Z-direction slider. The Z-direction rail, the Z-direction slider, and the Z-direction drive part are provided corresponding to the two fine grinding parts 5, respectively. Each Z-direction drive unit is controlled by a control unit 9 described later, and each fine grinding unit 5 moves in the Z direction independently of each other.

所述結構中,藉由控制部9對各部進行控制,而對保持於多個平臺2的基板W分別進行粗研削及精研削。In the above configuration, the control unit 9 controls each unit, and the substrates W held on the plurality of stages 2 are respectively subjected to rough grinding and fine grinding.

以下,著眼於一個平臺2,對保持於此平臺2的基板W的粗研削及精研削進行說明。Hereinafter, focusing on one stage 2, the rough grinding and finishing grinding of the substrate W held on this stage 2 will be described.

控制部9在對各基板W進行粗研削的情況下,如圖4的(A)所示,使粗研削部4在基板W的移動範圍內移動,以規定的順序進行粗研削。When performing rough grinding on each substrate W, the control unit 9 moves the rough grinding portion 4 within the movement range of the substrate W as shown in FIG. 4(A) to perform rough grinding in a predetermined order.

控制部9對平臺移動部3進行控制而使基板W進行直線往復移動,並且對粗研削部移動部7進行控制而使粗研削部4在X方向上移動,由此對基板W的上表面整體進行粗研削。例如,控制部9使平臺2直線移動至少一次,而將基板W的所需部位沿著長邊方向進行粗研削,然後,使粗研削部4在X方向上錯開,粗研削部4對準未研削部分,使平臺2直線移動至少一次,而將基板W的所需部位沿著長邊方向進行粗研削。藉由反復進行所述操作,而將基板W的上表面整體進行粗研削。The control unit 9 controls the stage moving unit 3 to linearly reciprocate the substrate W, and controls the rough grinding unit moving unit 7 to move the rough grinding unit 4 in the X direction, thereby affecting the entire upper surface of the substrate W. Perform rough grinding. For example, the control unit 9 moves the stage 2 linearly at least once, and rough-grinds the desired part of the substrate W along the longitudinal direction, and then staggers the rough-grinding portion 4 in the X direction, and the rough-grinding portion 4 is aligned with the For the grinding part, the stage 2 is moved linearly at least once, and the required part of the substrate W is rough-cut along the longitudinal direction. By repeating the above operation, the entire upper surface of the substrate W is rough-ground.

所述粗研削中,控制部9對粗研削部4的Z方向的位置進行反饋控制,來調整基板W的粗研削量。In the rough grinding, the control unit 9 performs feedback control on the position of the rough grinding unit 4 in the Z direction to adjust the rough grinding amount of the substrate W.

具體而言,控制部9基於來自與基板W接觸的一個或多個接觸感測器10(參照圖1)的檢測信號,以基板W的厚度達到規定的目標值的方式,對粗研削部4的Z方向的位置進行反饋控制。接觸感測器10是與各平臺2對應而設置。此處,基板W的厚度可根據平臺上表面的Z方向的位置與基板上表面的Z方向的位置之差來求出,也可基於根據研削前的基板上表面的Z方向的位置與研削後的基板上表面的Z方向的位置來求出的研削量而求出。此外,檢測基板W的厚度或研削量的感測器除了接觸感測器以外,也可為光學式感測器等其他方式的位移感測器。Specifically, based on the detection signal from one or more touch sensors 10 (see FIG. 1) in contact with the substrate W, the control unit 9 performs the rough grinding on the rough grinding unit 4 so that the thickness of the substrate W reaches a predetermined target value. The position in the Z direction is feedback controlled. The touch sensor 10 is provided corresponding to each platform 2. Here, the thickness of the substrate W can be obtained from the difference between the position in the Z direction on the upper surface of the stage and the position in the Z direction on the upper surface of the substrate, or it can be based on the difference between the position in the Z direction on the upper surface of the substrate before grinding and the position after grinding The position of the upper surface of the substrate in the Z direction is obtained by the obtained grinding amount. In addition, the sensor for detecting the thickness or the grinding amount of the substrate W may be a displacement sensor of other types such as an optical sensor, in addition to a contact sensor.

控制部9在粗研削後對基板W進行精研削的情況下,如圖4的(B)所示,使精研削部5在基板W的移動範圍內移動,以規定的順序進行精研削。When the control unit 9 performs fine grinding on the substrate W after rough grinding, as shown in FIG. 4(B), the fine grinding unit 5 moves within the movement range of the substrate W and performs fine grinding in a predetermined order.

控制部9對精研削部移動部8進行控制,將精研削部5的精研削用研磨石51配置於與基板W接觸的位置,對平臺移動部3進行控制而使基板W直線移動,由此對基板W的上表面整體進行精研削。例如,控制部9對精研削部移動部8進行控制,在精研削用研磨石51配置於與基板W的寬度方向整體接觸的位置後,對平臺移動部3進行控制而使基板W直線移動至少一次,將基板W沿著長邊方向進行精研削。The control unit 9 controls the lapping section moving section 8, arranges the lapping stone 51 of the lapping section 5 at a position in contact with the substrate W, and controls the stage moving section 3 to move the substrate W linearly, thereby The entire upper surface of the substrate W is polished. For example, the control unit 9 controls the lapping part moving part 8, and after the lapping stone 51 for lapping and grinding is placed in contact with the entire width direction of the substrate W, it controls the stage moving part 3 to move the substrate W linearly at least Once, the substrate W is polished along the longitudinal direction.

所述精研削中,控制部9對精研削部5的Z方向的位置進行反饋控制,來調整基板W的精研削量。具體而言,控制部9基於來自與基板W接觸的接觸感測器10的檢測信號,以基板W的厚度達到規定的目標值的方式,對精研削部5的Z方向的位置進行反饋控制。此處,基板W的厚度可根據平臺上表面的Z方向的位置與基板上表面的Z方向的位置之差來求出,也可基於根據研削前的基板上表面的Z方向的位置與研削後的基板上表面的Z方向的位置來求出的研削量而求出。In the finishing grinding, the control unit 9 performs feedback control on the position of the finishing grinding unit 5 in the Z direction to adjust the finishing grinding amount of the substrate W. Specifically, based on the detection signal from the touch sensor 10 in contact with the substrate W, the control unit 9 performs feedback control on the Z direction position of the lapping section 5 so that the thickness of the substrate W reaches a predetermined target value. Here, the thickness of the substrate W can be obtained from the difference between the position in the Z direction on the upper surface of the stage and the position in the Z direction on the upper surface of the substrate, or it can be based on the difference between the position in the Z direction on the upper surface of the substrate before grinding and the position after grinding The position of the upper surface of the substrate in the Z direction is obtained by the obtained grinding amount.

此處,當將保持於兩個平臺2的基板W進行粗研削及精研削時,各粗研削部4及各精研削部5構成為不會相互干擾。本實施方式中,如圖2所示,設置為兩個粗研削部4(橫軸型的研削部)的粗研削用研磨石41在內側彼此相向且主軸42位於外側。Here, when the substrates W held on the two stages 2 are subjected to rough grinding and finish grinding, each rough grinding portion 4 and each fine grinding portion 5 are configured so as not to interfere with each other. In this embodiment, as shown in FIG. 2, the grinding stones 41 for rough grinding, which are provided as two rough grinding parts 4 (horizontal-shaft type grinding parts), face each other on the inside and the main shaft 42 is located on the outside.

另外,控制部9在各平臺2中,當粗研削部4或精研削部5中的一者對基板W進行研削時,使粗研削部4或精研削部5中的另一者退避至與其他平臺2相反的一側(外側)。由此,不會阻礙在其他平臺2上進行研削的研削部4、研削部5的移動。除此以外,還可設為如下結構:在粗研削部4或精研削部5中的一者對基板W進行研削時,使粗研削部4或精研削部5中的另一者藉由在Z方向上升而退避。In addition, the control unit 9 in each platform 2, when one of the rough grinding portion 4 or the fine grinding portion 5 grinds the substrate W, the other one of the rough grinding portion 4 or the fine grinding portion 5 is retracted to and The opposite side (outside) of the other platform 2. Thereby, the movement of the grinding part 4 and the grinding part 5 which grind on the other platform 2 is not hindered. In addition to this, it is also possible to set the structure as follows: when one of the rough grinding portion 4 or the fine grinding portion 5 grinds the substrate W, the other of the rough grinding portion 4 or the fine grinding portion 5 is Ascend in the Z direction and retreat.

<研削方法> 其次,對利用本實施方式的研削裝置100的研削方法的一例進行說明。此例中假定如下情況:在兩個平臺2中同時進行粗研削,然後同時進行精研削。<Grinding method> Next, an example of a grinding method using the grinding device 100 of this embodiment will be described. In this example, it is assumed that the rough grinding is performed on the two platforms 2 at the same time, and then the fine grinding is performed at the same time.

首先,基板搬送機構100E自基板收納模塊100A的研削前基板供給部11接收基板W,且依序搬送至基板研削模塊100B的兩個平臺2。此處,平臺2將所搬送的基板W吸附而保持。 本實施方式中,為了達成高的研削精度,平臺移動部3不包括使平臺2旋轉的機構。因此,研削裝置100包括排列機構,使基板搬送機構100E的基板W的朝向與平臺移動部3的基板W的朝向(參照圖1)一致。排列機構例如可為基板搬送機構100E所包括的旋轉機構,或者也可為一邊使基板W的朝向適當旋轉,一邊使基板W自基板搬送機構100E移動至平臺2的機械臂等搬送機構。First, the substrate conveying mechanism 100E receives the substrate W from the pre-grinding substrate supply unit 11 of the substrate storage module 100A, and sequentially conveys the substrate W to the two stages 2 of the substrate grinding module 100B. Here, the platform 2 sucks and holds the transferred substrate W. In this embodiment, in order to achieve high grinding accuracy, the stage moving part 3 does not include a mechanism for rotating the stage 2. Therefore, the grinding apparatus 100 includes an arranging mechanism to match the orientation of the substrate W of the substrate transport mechanism 100E with the orientation of the substrate W of the stage moving part 3 (refer to FIG. 1 ). The arrangement mechanism may be, for example, a rotation mechanism included in the substrate transport mechanism 100E, or a transport mechanism such as a robot arm that moves the substrate W from the substrate transport mechanism 100E to the stage 2 while appropriately rotating the orientation of the substrate W.

然後,與各平臺2對應的粗研削部4移動至規定的研削位置,並且平臺移動部3使平臺2進行直線往復移動而進行基板W的粗研削。在此粗研削中,基於接觸感測器10的檢測信號,以基板W的厚度達到規定的目標值的方式,對粗研削部4的Z方向的位置進行反饋控制。Then, the rough grinding part 4 corresponding to each stage 2 moves to a predetermined grinding position, and the stage moving part 3 linearly reciprocates the stage 2 to perform rough grinding of the substrate W. In this rough grinding, based on the detection signal of the touch sensor 10, the position of the rough grinding part 4 in the Z direction is feedback controlled so that the thickness of the substrate W reaches a predetermined target value.

粗研削結束後,粗研削部4退避至平臺2的移動範圍外。而且,與各平臺2對應的精研削部5移動至規定的研削位置,並且平臺移動部3使平臺2進行直線往復移動而進行經粗研削的基板W的精研削。在此精研削中,基於接觸感測器10的檢測信號,以基板W的厚度達到規定的目標值的方式,對精研削部5的Z方向的位置進行反饋控制。After the rough grinding is finished, the rough grinding part 4 is retracted to the outside of the moving range of the platform 2. Then, the fine grinding part 5 corresponding to each stage 2 moves to a predetermined grinding position, and the stage moving part 3 linearly reciprocates the stage 2 to perform fine grinding of the rough-ground substrate W. In this lapping, based on the detection signal of the touch sensor 10, the position of the lapping section 5 in the Z direction is feedback controlled so that the thickness of the substrate W reaches a predetermined target value.

精研削結束後,基板搬送機構100E和/或機械臂(未圖示)將基板W依序搬送至基板洗滌模塊100C。經此基板洗滌模塊100C進行洗滌及檢查的基板W利用基板搬送機構100E和/或機械臂(未圖示)而搬送至基板收納模塊100D的研削完畢基板收納部12。After finishing grinding, the substrate transport mechanism 100E and/or the robot arm (not shown) sequentially transports the substrate W to the substrate washing module 100C. The substrate W cleaned and inspected by the substrate cleaning module 100C is transported to the ground substrate storage section 12 of the substrate storage module 100D by the substrate transport mechanism 100E and/or the robot arm (not shown).

作為其他的研削方法,還考慮:以在其中一個平臺2上進行粗研削時,在另一個平臺2上進行精研削的方式,在兩個平臺2上交替進行粗研削及精研削等,在兩個平臺2上錯開研削時機。另外,作為其他的研削方法,還考慮在各平臺2上獨立地進行粗研削及精研削。As another grinding method, it is also considered: when rough grinding is performed on one of the platforms 2, fine grinding is performed on the other platform 2, and rough grinding and fine grinding are alternately performed on the two platforms 2. The grinding timing is staggered on each platform 2. In addition, as another grinding method, it is also considered to perform rough grinding and fine grinding independently on each platform 2.

在這些情況下,各平臺2上的粗研削及精研削的順序與以上所述相同,但基板搬送機構100E和/或機械臂(未圖示)在每次精研削結束時,將此經精研削的基板W搬送至基板洗滌模塊100C,並且將研削前的基板W自研削前基板供給部11搬送至未保持有基板W的平臺2。In these cases, the order of rough grinding and fine grinding on each platform 2 is the same as described above, but the substrate transfer mechanism 100E and/or the robot arm (not shown) will perform the fine grinding every time the finishing grinding is finished. The ground substrate W is conveyed to the substrate washing module 100C, and the pre-grinding substrate W is conveyed from the pre-grinding substrate supply unit 11 to the stage 2 on which the substrate W is not held.

<本實施方式的效果> 根據本實施方式的研削裝置100,在多個平臺2的每一個上,粗研削部4及精研削部5構成為能夠移動,因此能夠在各平臺2上保持有基板W的狀態下進行粗研削及精研削這兩者。由此,不需要將基板W移載至不同的平臺,不需要在不同的平臺上再次對準,能夠在多個平臺2的每一個上使粗研削及精研削的平坦度一定。其結果為,能夠藉由對多個基板W同時進行研削,來提高處理量(處理能力),並且提高各平臺2上的基板W的研削精度。<Effects of this embodiment> According to the grinding apparatus 100 of the present embodiment, the rough grinding portion 4 and the fine grinding portion 5 are configured to be movable on each of the plurality of stages 2, so that rough grinding can be performed while the substrate W is held on each stage 2. And intensive grinding of both. Therefore, there is no need to transfer the substrate W to a different platform, and there is no need to realign it on a different platform, and the flatness of rough grinding and fine grinding can be kept constant on each of the plurality of platforms 2. As a result, by grinding a plurality of substrates W at the same time, the throughput (processing capacity) can be improved, and the grinding accuracy of the substrate W on each stage 2 can be improved.

<其他的變形實施方式> 此外,本發明並不限定於所述實施方式。<Other modified embodiments> In addition, this invention is not limited to the said embodiment.

例如,如圖5的(A)及圖5的(B)所示,也可設為將粗研削部4或精研削部5中的至少一者在至少兩個平臺2中共用的結構。例如,如圖5的(A)所示,也可設為在兩個平臺2的每一個上設置粗研削部4,將一個精研削部5在兩個平臺2上共用的結構。另外,如圖5的(B)所示,也可設為將一個粗研削部4及一個精研削部5在兩個平臺2上共用的結構,從而在兩個平臺2上交替進行粗研削及精研削。進而,雖未圖示,但也可設為在兩個平臺2的每一個上設置精研削部5,而將一個粗研削部4在兩個平臺2上共用的結構。For example, as shown in FIG. 5(A) and FIG. 5(B), at least one of the rough grinding part 4 or the fine grinding part 5 may be a structure in which at least two platforms 2 are shared. For example, as shown in (A) of FIG. 5, a rough grinding part 4 may be provided on each of the two platforms 2, and one fine grinding part 5 may be shared on the two platforms 2. In addition, as shown in FIG. 5(B), a structure in which one rough grinding part 4 and one fine grinding part 5 are shared on two platforms 2 can also be used, so that rough grinding and grinding are alternately performed on the two platforms 2 Fine grinding. Furthermore, although not shown in the figure, it is also possible to provide a structure in which the fine grinding part 5 is provided on each of the two platforms 2 and one rough grinding part 4 is shared on the two platforms 2.

另外,連結梁部62中,也可將兩個粗研削部4中的一者設置於近前側且將另一者設置於深處側,將兩個精研削部中的一者設置於近前側且將另一者設置於深處側。若為此結構,則在兩個平臺2上同時進行粗研削的情況、或者同時進行精研削的情況下,能夠使粗研削部4彼此、或者精研削部5彼此在結構上不會相互干擾。In addition, in the connecting beam portion 62, one of the two rough grinding portions 4 may be provided on the near side and the other may be provided on the deep side, and one of the two fine grinding portions may be provided on the near side. And set the other one on the deep side. With this structure, when rough grinding is performed on the two platforms 2 at the same time or when fine grinding is performed simultaneously, it is possible to prevent the rough grinding parts 4 or the fine grinding parts 5 from interfering with each other structurally.

進而,除了所述實施方式以外,也可如圖6所示,設置去毛刺部16,所述去毛刺部16在利用平臺移動部3的基板W的移動範圍內移動而進行基板W的去毛刺。關於此去毛刺部16,考慮與粗研削部4及精研削部5同樣,以能夠移動的方式支撐於連結梁部62。作為去毛刺部16,考慮例如包括刷毛。此處,在設置去毛刺部16的情況下,藉由與在兩個平臺2上共用粗研削部4或精研削部5的結構加以組合,能夠使其配置容易。另外,去毛刺部16能夠在兩個平臺2上共用。Furthermore, in addition to the above-mentioned embodiment, as shown in FIG. 6, a deburring part 16 may be provided that moves within the moving range of the substrate W by the platform moving part 3 to perform deburring of the substrate W. . Regarding this deburring part 16, it is considered that, like the rough grinding part 4 and the fine grinding part 5, it is movably supported by the connection beam part 62. As the deburring part 16, it is considered to include, for example, bristles. Here, when the deburring part 16 is provided, it can be easily arranged by combining it with a structure in which the rough grinding part 4 or the fine grinding part 5 is shared on the two platforms 2. In addition, the deburring part 16 can be shared on the two platforms 2.

所述實施方式的粗研削部4使用粗研削用研磨石41,精研削部5使用精研削用研磨石51,但如圖7所示,粗研削部4或精研削部5也可為使用無端帶狀的研削帶171的帶式研削型的研削部(以下為帶式研削部17)。此外,研削帶171將在表面附著有研磨粒的帶狀的研磨布紙的兩端接合而形成帶狀。與粗研削用研磨石41或精研削用研磨石51相比,研削帶171廉價,能夠實現大幅度的成本下降。另外,研削帶171與粗研削用研磨石41或精研削用研磨石51相比,交換作業也容易。進而,帶式研削部17在對如下的研削對象物進行研削的情況、或將研削對象物所形成的毛刺去除的情況等下有效,所述研削對象物如在利用粗研削用研磨石41或精研削用研磨石51時堵塞的問題變得顯著的基板W、或例如僅使銅配線部或焊接部露出的基板W等那樣,對研削精度的要求不太高。The rough grinding part 4 of the above embodiment uses the grind stone 41 for rough grinding, and the fine grinding part 5 uses the grind stone 51 for fine grinding. However, as shown in FIG. The belt grinding type grinding part of the belt grinding belt 171 (hereinafter referred to as the belt grinding part 17). In addition, the grinding belt 171 joins both ends of a belt-shaped abrasive cloth paper with abrasive grains attached to the surface to form a belt shape. Compared with the grinding stone 41 for rough grinding or the grinding stone 51 for fine grinding, the grinding belt 171 is inexpensive, and can achieve a significant cost reduction. In addition, compared with the grinding stone 41 for rough grinding or the grinding stone 51 for fine grinding, the grinding belt 171 is easy to replace|exchange. Furthermore, the belt-type grinding section 17 is effective in the case of grinding the following grinding object, or removing burrs formed by the grinding object, such as the grinding stone 41 for rough grinding or When the grinding stone 51 for polishing is polished, the problem of clogging becomes significant, or, for example, the substrate W in which only the copper wiring portion or the soldering portion is exposed, the grinding accuracy is not too high.

此帶式研削部17包括:利用主軸172的驅動軸173而旋轉驅動的驅動輪174、接觸輪175、以及環掛於這些輪174、175的無端帶狀的研削帶171。此外,也可包括對研削帶171賦予張力的張力輪176。這些各零件172~176由基體構件170所支撐。This belt-type grinding unit 17 includes a driving wheel 174 rotatably driven by a driving shaft 173 of a main shaft 172, a contact wheel 175, and an endless belt-shaped grinding belt 171 that is looped around these wheels 174 and 175. In addition, a tension wheel 176 for applying tension to the grinding belt 171 may also be included. These parts 172 to 176 are supported by the base member 170.

另外,此帶式研削部17如圖8所示,包括以使研削帶171的一部分露出的方式來覆蓋研削帶171的覆蓋體177。覆蓋體177的下壁部177a(與基板W相向的壁面)形成平面形狀,且在此下壁部177a形成有用以使研削帶171露出的開口部177H。此處,由於覆蓋體177的下壁部177a形成與基板W相向的平面形狀,故而自外部供給的水等研削液在形成於下壁部177a的下表面與基板W的上表面之間的空間中流動,高效地供給至研削部分。In addition, as shown in FIG. 8, this belt-type grinding section 17 includes a covering body 177 that covers the grinding belt 171 so that a part of the grinding belt 171 is exposed. The lower wall portion 177 a (the wall surface facing the substrate W) of the covering body 177 is formed in a planar shape, and the lower wall portion 177 a here is formed with an opening 177H for exposing the grinding tape 171. Here, since the lower wall portion 177a of the covering body 177 is formed in a planar shape facing the substrate W, the grinding fluid such as water supplied from the outside is formed in the space between the lower surface of the lower wall portion 177a and the upper surface of the substrate W. Medium flow, efficiently supplied to the grinding part.

另外,在覆蓋體177的下壁部177a或者與此下壁部177a相連的側壁部177b的下側部分,形成有用以將進入至覆蓋體177的內部的研削液排出至外部的排出孔177c。此外,在粗研削部4及精研削部5,也可與帶式研削部17同樣,設置以這些研磨石41、51的一部分露出的方式來覆蓋的覆蓋體。In addition, the lower wall portion 177a of the covering body 177 or the lower side portion of the side wall portion 177b connected to the lower wall portion 177a is formed with a discharge hole 177c for discharging the grinding liquid that has entered the covering body 177 to the outside. In addition, in the rough grinding part 4 and the fine grinding part 5, similarly to the belt grinding part 17, a covering body which covers so that a part of these grindstones 41 and 51 may be exposed may be provided.

另外,除了將粗研削部4或者精研削部5設為帶式研削部17的結構以外,基板研削模塊100B(研削機構)除了包括粗研削部4及精研削部5以外,也可還包括使用無端帶狀的研削帶171的帶式研削部17。此帶式研削部17在多個平臺2的每一個上構成為能夠移動,且考慮與粗研削部4及精研削部5同樣,以能夠移動的方式支撐於連結梁部62。In addition, in addition to the structure in which the rough grinding section 4 or the fine grinding section 5 is configured as the belt type grinding section 17, the substrate grinding module 100B (grinding mechanism) may include the rough grinding section 4 and the fine grinding section 5, and may also include the use of The belt-type grinding portion 17 of the endless belt-shaped grinding belt 171. This belt grinding part 17 is configured to be movable on each of the plurality of platforms 2, and it is considered that it is movably supported by the connecting beam part 62 in the same way as the rough grinding part 4 and the fine grinding part 5.

除此以外,粗研削部4也可構成為能夠以包括粗研削用研磨石41的橫軸型的研削部以及使用無端帶狀的研削帶171的帶式研削型的研削部的形式來進行變更,精研削部5也可構成為能夠以包括精研削用研磨石51的縱軸型的研削部以及使用無端帶狀的研削帶171的帶式研削型的研削部的形式來進行變更。藉由使它們能夠變更,能夠選擇與基板W的種類相應的研削形態,從而能夠提高基板研削模塊100B(研削機構)的通用性。In addition, the rough grinding part 4 may be configured to be able to be modified in the form of a horizontal axis type grinding part including a grinding stone 41 for rough grinding and a belt type grinding part using an endless belt-shaped grinding belt 171. The fine grinding part 5 may be configured to be capable of being modified in the form of a longitudinal axis type grinding part including the grinding stone 51 for fine grinding and a belt type grinding part using an endless belt-shaped grinding belt 171. By enabling them to be changed, a grinding form corresponding to the type of substrate W can be selected, and the versatility of the substrate grinding module 100B (grinding mechanism) can be improved.

在此情況下,如圖9所示,也可構成為:相對於粗研削部4及精研削部5中的Z方向移動部的Z方向滑件18,使用附屬構件19a、附屬構件19b來安裝。例如,粗研削部4經由粗研削部4用的附屬構件19a而安裝於Z方向滑件。另外,精研削部5經由精研削部5用的附屬構件19b而安裝於Z方向滑件18。此外,圖9中,已示出帶式研削部17不使用附屬構件而安裝於Z方向滑件18的例子,但也可使用帶式研削部用的附屬構件來安裝於Z方向滑件18。藉由如上所述,使用與各研削部4、5對應的附屬構件19a、附屬構件19b,粗研削部4(橫軸型)與帶式研削部17成為能夠相互變更,精研削部5(縱軸型)與帶式研削部17成為能夠相互變更。圖9中,由於將粗研削部4、精研削部5及Z方向移動部的Z方向滑件18設為通用,故而能夠將粗研削部4(橫軸型)、精研削部5(縱軸型)及帶式研削部17相互變更。除此以外,也可將橫軸型的主軸42與帶式研削部17的主軸172設為通用,構成為相對於此通用的主軸而能夠將粗研削用研磨石41與研削帶171相互變更。In this case, as shown in FIG. 9, it may be configured such that the Z-direction slider 18 of the Z-direction moving part in the rough grinding part 4 and the fine grinding part 5 is mounted using the accessory member 19a and the accessory member 19b. . For example, the rough grinding part 4 is attached to the Z-direction slider via an accessory member 19a for the rough grinding part 4. In addition, the fine grinding part 5 is attached to the Z-direction slider 18 via an accessory member 19 b for the fine grinding part 5. In addition, in FIG. 9, an example in which the belt-type grinding part 17 is attached to the Z-direction slider 18 without using an accessory member has been shown, but an accessory member for the belt-type grinding part may also be used to be attached to the Z-direction slider 18. As described above, by using the auxiliary members 19a and 19b corresponding to the respective grinding parts 4, 5, the rough grinding part 4 (horizontal axis type) and the belt grinding part 17 can be changed mutually, and the fine grinding part 5 (longitudinal) Shaft type) and belt grinding part 17 are mutually changeable. In FIG. 9, since the rough grinding part 4, the fine grinding part 5, and the Z-direction slider 18 of the Z-direction moving part are made common, the rough grinding part 4 (horizontal axis type) and the fine grinding part 5 (vertical axis) Type) and belt grinding section 17 are mutually changed. In addition to this, the horizontal axis type main shaft 42 and the main shaft 172 of the belt grinding unit 17 may be used in common, and the grinding stone 41 for rough grinding and the grinding belt 171 may be mutually changed with respect to this common main shaft.

進而,除了所述實施方式以外,還可設置包括較精研削部5的精研削用研磨石51而言孔更細的研磨用研磨石的研磨研削部。此研磨研削部在多個平臺2的每一個上構成為能夠移動,考慮與粗研削部4及精研削部5同樣,以能夠移動的方式支撐於連結梁部62。Furthermore, in addition to the above-mentioned embodiment, a grinding and grinding part including a grinding stone for grinding having a finer hole than the grinding stone 51 for grinding and grinding of the grinding part 5 may be provided. This grinding and grinding part is configured to be movable on each of the plurality of platforms 2, and it is considered that it is supported by the connecting beam part 62 in a movable manner like the rough grinding part 4 and the fine grinding part 5.

所述實施方式中是將兩個平臺2並列配置的結構,但也可為將三個以上的平臺2並列配置的結構。In the above-described embodiment, the two platforms 2 are arranged in parallel, but it may be a structure in which three or more platforms 2 are arranged in parallel.

在所述實施方式中,是利用多個平臺2來對一種研削對象物W進行研削的結構,但也可藉由使在多個平臺2的每一個上進行研削的研削對象物W的種類不同,而設為對多種研削對象物W進行研削的結構。在此情況下,與各平臺2對應而設置的粗研削部4及精研削部5是根據各研削對象物W的種類來選擇。In the above-mentioned embodiment, it is a structure in which a plurality of stages 2 are used to grind one kind of grinding object W. However, it is also possible to use different types of grinding targets W to be ground on each of the plural stages 2 , And set it as a structure in which a plurality of types of grinding objects W are ground. In this case, the rough grinding part 4 and the fine grinding part 5 provided corresponding to each stage 2 are selected according to the type of each grinding target W. As shown in FIG.

另外,所述實施方式的粗研削部4為橫軸型的研削部,但也可設為縱軸型的研削部。另一方面,所述實施方式的精研削部5為縱軸型的研削部,但也可設為橫軸型的研削部。另外,藉由利用例如粗研削用研磨石及精研削用研磨石來更換安裝於研削部的主軸的研磨石,能夠將粗研削部及精研削部設為各種配置。In addition, the rough grinding part 4 of the said embodiment is a horizontal axis type grinding part, but it can also be set as a vertical axis type grinding part. On the other hand, the fine grinding part 5 of the above-mentioned embodiment is a vertical axis type grinding part, but it may be a horizontal axis type grinding part. In addition, by replacing the grind stone attached to the spindle of the grinding part with a grind stone for rough grinding and a grind stone for fine grinding, the rough grinding part and the fine grinding part can be arranged in various configurations.

另外,也可在各研削部與研削部移動部之間設置使研削部旋轉的旋轉部。此旋轉部使研削部的旋轉軸旋轉90度,能夠利用縱軸型及橫軸型來切換。In addition, a rotating part that rotates the grinding part may be provided between each grinding part and the grinding part moving part. This rotation part rotates the rotation axis of the grinding part by 90 degrees, and can be switched between the vertical axis type and the horizontal axis type.

除此以外,所述實施方式的支撐部6為門型,但也可為包括一個腳部以及自此腳部延伸的梁部的懸臂型。In addition to this, the support portion 6 of the above-described embodiment is a door type, but it may also be a cantilever type including one leg and a beam extending from the leg.

除此以外,本發明並不限定於所述實施方式,當然能夠在不脫離其主旨的範圍內進行各種變形。In addition to this, the present invention is not limited to the above-mentioned embodiments, and of course various modifications can be made without departing from the spirit thereof.

2:平臺 3:平臺移動部 4:粗研削部 5:精研削部 6:支撐部 7:粗研削部移動部 8:精研削部移動部 9:控制部 10:接觸感測器 11:研削前基板供給部 12:研削完畢基板收納部 13:洗滌部 14:乾燥部 15:檢查部 16:去毛刺部 17:帶式研削部 18:Z方向滑件 19a、19b:附屬構件 41:粗研削用研磨石 42:主軸 51:精研削用研磨石 52:主軸 61:一對腳部 62:連結梁部 100:研削裝置 100A:基板供給模塊 100B:基板研削模塊(研削機構) 100C:基板洗滌模塊 100D:基板收納模塊 100E:基板搬送機構 170:基體構件 171:研削帶 172:主軸 173:驅動軸 174:驅動輪 175:接觸輪 176:張力輪 177:覆蓋體 177a:下壁部 177b:側壁部 177c:排出孔 177H:開口部 CTL:控制機器 P:第一位置 Q:第二位置 VP:抽吸泵 W:板狀的研削對象物(密封完畢基板、基板)2: platform 3: Platform Mobile Department 4: Rough grinding department 5: Fine grinding and cutting department 6: Support 7: Rough grinding part moving part 8: Fine grinding and cutting department moving department 9: Control Department 10: Touch sensor 11: Substrate supply department before grinding 12: After grinding, the substrate storage section 13: Washing part 14: Dry part 15: Inspection Department 16: Deburring Department 17: Belt grinding department 18: Slider in Z direction 19a, 19b: accessory components 41: Grinding stone for rough grinding 42: Spindle 51: Grinding stone for fine grinding 52: Spindle 61: A pair of feet 62: connecting beam 100: Grinding device 100A: Substrate supply module 100B: Substrate grinding module (grinding mechanism) 100C: Substrate washing module 100D: substrate storage module 100E: substrate transport mechanism 170: base member 171: Grinding Belt 172: Spindle 173: drive shaft 174: drive wheel 175: Contact Wheel 176: Tension Wheel 177: Cover Body 177a: Lower wall 177b: Side wall 177c: discharge hole 177H: opening CTL: control the machine P: First position Q: Second position VP: Suction pump W: Plate-shaped grinding object (sealed substrate, substrate)

圖1是示意性表示本發明的研削裝置的一實施方式的結構的俯視圖。 圖2是示意性表示所述實施方式的研削機構的結構的正視圖(自近前側來看的圖)。 圖3是示意性表示所述實施方式的研削機構的結構的背視圖(自深處側來看的圖)。 圖4是示意性表示所述實施方式的(A)進行粗研削的狀態、(B)進行精研削的狀態的俯視圖。 圖5是示意性表示本發明的研削裝置中(A)將精研削部共用的情況、(B)將粗研削部及精研削部共用的情況下的結構的俯視圖。 圖6是示意性表示本發明的研削裝置的變形實施方式的結構的俯視圖。 圖7是示意性表示變形實施方式的帶式研削部的結構的正視圖及側視圖。 圖8是表示帶式研削部中的套管的結構的示意圖。 圖9是示意性表示粗研削部、精研削部及帶式研削部的在Z方向滑件上的安裝結構的圖。FIG. 1 is a plan view schematically showing the structure of an embodiment of the grinding apparatus of the present invention. Fig. 2 is a front view (a view seen from the near side) schematically showing the structure of the grinding mechanism of the embodiment. Fig. 3 is a rear view (a view viewed from the deep side) schematically showing the structure of the grinding mechanism of the embodiment. 4 is a plan view schematically showing (A) a state where rough grinding is performed and (B) a state where fine grinding is performed in the embodiment. 5 is a plan view schematically showing the structure of the grinding device of the present invention (A) when the fine grinding part is shared, and (B) when the rough grinding part and the fine grinding part are shared. Fig. 6 is a plan view schematically showing the configuration of a modified embodiment of the grinding apparatus of the present invention. Fig. 7 is a front view and a side view schematically showing the structure of a belt grinding part of a modified embodiment. Fig. 8 is a schematic diagram showing the structure of the sleeve in the belt grinding section. Fig. 9 is a diagram schematically showing the mounting structure of the rough grinding portion, the fine grinding portion, and the belt grinding portion on the Z-direction slider.

2:平臺2: platform

3:平臺移動部3: Platform Mobile Department

4:粗研削部4: Rough grinding department

5:精研削部5: Fine grinding and cutting department

6:支撐部6: Support

9:控制部9: Control Department

10:接觸感測器10: Touch sensor

11:研削前基板供給部11: Substrate supply department before grinding

12:研削完畢基板收納部12: After grinding, the substrate storage section

13:洗滌部13: Washing part

14:乾燥部14: Dry part

15:檢查部15: Inspection Department

41:粗研削用研磨石41: Grinding stone for rough grinding

42:主軸42: Spindle

51:精研削用研磨石51: Grinding stone for fine grinding

52:主軸52: Spindle

100:研削裝置100: Grinding device

100A:基板供給模塊100A: Substrate supply module

100B:基板研削模塊(研削機構)100B: Substrate grinding module (grinding mechanism)

100C:基板洗滌模塊100C: Substrate washing module

100D:基板收納模塊100D: substrate storage module

100E:基板搬送機構100E: substrate transport mechanism

CTL:控制機器CTL: control the machine

P:第一位置P: First position

Q:第二位置Q: Second position

VP:抽吸泵VP: Suction pump

W:板狀的研削對象物(密封完畢基板、基板)W: Plate-shaped grinding object (sealed substrate, substrate)

Claims (12)

一種研削機構,包括: 多個平臺,將板狀的研削對象物加以保持; 至少一個粗研削部,對所述研削對象物進行粗研削;以及 至少一個精研削部,對所述研削對象物進行精研削;並且 在所述多個平臺的每一個上,所述粗研削部及所述精研削部構成為能夠移動。A kind of research institute, including: Multiple platforms to hold plate-shaped grinding objects; At least one rough grinding part for rough grinding the grinding object; and At least one fine grinding and grinding part for fine grinding and grinding the object to be ground; and On each of the plurality of platforms, the rough grinding portion and the fine grinding portion are configured to be movable. 如請求項1所述的研削機構,其中 所述粗研削部及所述精研削部在所述多個平臺的每一個上設置有至少一個。The research institution described in claim 1, wherein At least one of the rough grinding part and the fine grinding part is provided on each of the plurality of platforms. 如請求項1所述的研削機構,其中 所述粗研削部或所述精研削部中的至少一者在至少兩個所述平臺中共用。The research institution described in claim 1, wherein At least one of the rough grinding part or the fine grinding part is shared in at least two of the platforms. 如請求項1所述的研削機構,還包括: 多個平臺移動部,設置於所述多個平臺的每一個上,使所述平臺沿著一方向而在規定的範圍內進行直線往復移動;並且 所述粗研削部及所述精研削部在將利用所述平臺移動部的所述平臺的往復移動方向橫切的方向上移動。The research institutes as described in claim 1, further including: A plurality of platform moving parts are provided on each of the plurality of platforms, so that the platform moves linearly reciprocatingly within a prescribed range along a direction; and The rough grinding part and the fine grinding part move in a direction transverse to the reciprocating movement direction of the platform using the platform moving part. 如請求項1至請求項4中任一項所述的研削機構,其中 所述粗研削部是包括粗研削用研磨石的橫軸型的研削部,且 所述精研削部是包括精研削用研磨石的縱軸型的研削部。The research institution according to any one of claims 1 to 4, wherein The rough grinding part is a horizontal axis type grinding part including a grinding stone for rough grinding, and The lapping part is a longitudinal axis type lapping part including a grinding stone for lapping. 如請求項1至請求項4中任一項所述的研削機構,其中 所述粗研削部或所述精研削部是使用無端帶狀的研削帶的帶式研削型的研削部。The research institution according to any one of claims 1 to 4, wherein The rough grinding part or the fine grinding part is a belt grinding type grinding part using an endless belt-shaped grinding belt. 如請求項1至請求項4中任一項所述的研削機構,其中 所述粗研削部構成為能夠以包括粗研削用研磨石的橫軸型的研削部以及使用無端帶狀的研削帶的帶式研削型的研削部的形式來進行變更,且 所述精研削部構成為能夠以包括精研削用研磨石的縱軸型的研削部以及使用無端帶狀的研削帶的帶式研削型的研削部的形式來進行變更。The research institution according to any one of claims 1 to 4, wherein The rough grinding part is configured to be able to be changed in the form of a horizontal shaft type grinding part including a grinding stone for rough grinding and a belt grinding type grinding part using an endless belt-shaped grinding belt, and The configuration of the fine grinding part can be changed in the form of a longitudinal axis type grinding part including a grinding stone for fine grinding and a belt grinding part using an endless belt-shaped grinding belt. 如請求項1至請求項4中任一項所述的研削機構,還包括: 一對腳部,夾持所述多個平臺而設置;以及 連結梁部,架設於所述一對腳部;並且 所述粗研削部及所述精研削部以能夠移動的方式支撐於所述連結梁部。The research institution described in any one of claim 1 to claim 4, further including: A pair of feet are arranged to clamp the plurality of platforms; and The connecting beam is erected on the pair of legs; and The rough grinding part and the fine grinding part are movably supported by the connecting beam part. 如請求項1至請求項4中任一項所述的研削機構,還包括: 一對腳部,夾持所述多個平臺而設置;以及 連結梁部,架設於所述一對腳部; 所述粗研削部及所述精研削部以能夠移動的方式支撐於所述連結梁部,並且 所述連結梁部中,在近前側支撐所述粗研削部或所述精研削部中的一者,且在深處側支撐所述粗研削部或所述精研削部中的另一者。The research institution described in any one of claim 1 to claim 4, further including: A pair of feet are arranged to clamp the plurality of platforms; and The connecting beam part is erected on the pair of feet; The rough grinding portion and the fine grinding portion are movably supported by the connecting beam portion, and In the connecting beam portion, one of the rough grinding portion or the fine grinding portion is supported on the near side, and the other of the rough grinding portion or the fine grinding portion is supported on the deep side. 如請求項1至請求項4中任一項所述的研削機構,其中 除了所述粗研削部及所述精研削部以外,還包括使用無端帶狀的研削帶的帶式研削部;並且 在所述多個平臺的每一個上,所述帶式研削部構成為能夠移動。The research institution according to any one of claims 1 to 4, wherein In addition to the rough grinding part and the fine grinding part, it also includes a belt-type grinding part using an endless belt-shaped grinding belt; and On each of the plurality of platforms, the belt grinding part is configured to be movable. 如請求項1至請求項4中任一項所述的研削機構,還包括: 去毛刺部,進行所述研削對象物的去毛刺;並且 在所述多個平臺的每一個上,所述去毛刺部構成為能夠移動。The research institution described in any one of claim 1 to claim 4, further including: The deburring part performs deburring of the grinding object; and On each of the plurality of platforms, the deburring part is configured to be movable. 一種研削裝置,包括如請求項1至請求項11中任一項所述的研削機構。A grinding device includes the grinding mechanism according to any one of claim 1 to claim 11.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI834238B (en) * 2021-08-11 2024-03-01 南韓商瑞宇科技股份有限公司 Semiconductor strip grinding apparatus

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102543850B1 (en) * 2023-02-20 2023-06-14 홍운기 Automatic deburr removal device for metal molded products

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50140986A (en) * 1974-04-27 1975-11-12
JPS55101365A (en) * 1979-01-23 1980-08-02 Citizen Watch Co Ltd Belt grinding machine for machining wrist watch case
JP2562989B2 (en) * 1990-09-10 1996-12-11 アミテック株式会社 Grinding machine
JP3099029B2 (en) * 1993-06-30 2000-10-16 住友重機械工業株式会社 Combined grinding machine
JPH07276222A (en) * 1994-04-06 1995-10-24 Fujitsu Ltd Polishing device and polishing method using this device
JP2001025944A (en) * 1999-07-13 2001-01-30 Sumitomo Heavy Ind Ltd Two-head type surface grinding machine
JP3746432B2 (en) * 2001-03-01 2006-02-15 株式会社牧野フライス製作所 Bonding surface processing method and apparatus
US6913512B2 (en) * 2002-08-21 2005-07-05 Howard W. Grivna Material removal monitor
JP3751631B2 (en) * 2004-12-24 2006-03-01 イビデン株式会社 Electronic component sealing method
JP6181799B1 (en) 2016-04-01 2017-08-16 ソウ テクノロジー カンパニー、リミテッド Semiconductor strip grinder
KR101976042B1 (en) * 2017-08-25 2019-05-07 최충호 Apparatus for removing burr

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI834238B (en) * 2021-08-11 2024-03-01 南韓商瑞宇科技股份有限公司 Semiconductor strip grinding apparatus

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